CN104090174A - Method and device for integrated line parameter insulation and phase checking test - Google Patents
Method and device for integrated line parameter insulation and phase checking test Download PDFInfo
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Abstract
The invention discloses a method and a device for integrated line parameter insulation and phase checking test. The device comprises a high-voltage direct-current power supply module (1), a DC-DC module (2), a signal acquisition circuit (3), a control processing system (4), and a phase selection control circuit (5). The phase selection control circuit (5) can enable three phases of a line to be connected to terminals A, B and C of an instrument at a time during line insulation and phase checking, and during the whole process of insulation and phase checking, line phase checking can be completed only by operating the opposite side of the line to check whether the opposite side of the line is grounded. The device is characterized in that a single chip microcomputer can control driving voltage of a high-voltage direct-current power supply (11) so as to output multiple gears of test voltages; a phase selection control circuit (42) controls electrical connection between a phase to be tested and the high-voltage power supply; a multiple-sampling-resistance I/V conversion circuit (31) controlled by the single chip microcomputer is connected in series into a high-voltage direct-current test loop so as to realize intelligent multi-range switching in measurement; and an LCD display circuit (43) and a printing module (44) composed of a micro printer can respectively display test data through liquid crystal and print and output the test data.
Description
Technical field
The present invention relates to circuit nuclear phase instrument field, refer in particular to a kind of line parameter circuit value insulation, nuclear phase integrated test method for testing and device.
Technical background
New electric station grid connection, before new transformer station goes into operation, after project of transmitting and converting electricity enlarging, transformation or main equipment overhaul, nuclear phase test often will be done in the scene of putting into operation of being completed, i.e. and so-called phasing comprises Check Phase Sequence and checks phase place.Check Phase Sequence is mainly the normal work for generator, motor.In electrical production practice, before generator connecting in parallel with system, must do the test of Check Phase Sequence and phase place, phase sequence and phase place are not right, and generator cannot be grid-connected, and by force grid-connected meeting causes device damage, and the character of this type of accident is quite serious.In the transformation of electrical network, also often note keeping the original phase sequence of electrical network, with exempt from customs examination, user makes troubles.
Current domestic high-tension line nuclear phase all adopts wired mode, needs 4 people to carry out when nuclear phase, and a people assumes command, and two people wear insulating boot, wear insulating glove serves as nuclear phase person, people's instrument record.Nuclear phase work is carried out according to commanding's order, operation with high pressure person is fixed on high-voltage connection on insulation rod, length is suitable, while drawing hi-line contact high-tension electricity source point with insulation rod, coordination, two people correlate mutually, in order to avoid go wrong, this operation there is certain danger and operation steps more, easily cause maloperation.The present invention has studied a kind of line parameter circuit value insulation, nuclear phase integrated test method for testing and device to improve and to solve existing defect and the deficiency that only adopts megger nuclear phase to exist.Develop on a kind of A, B that once three-phase of circuit is connected to instrument in line insulation nuclear phase, C terminal, whether ground connection completes circuit nuclear phase in whole insulation nuclear phase process, only to need functional arrangement offside.
Summary of the invention
The present invention is directed to shortcoming and the deficiency of above-mentioned prior art, invent that a kind of volume is little, battery capacity is large, easy to carry, there is very strong data-handling capacity, the intelligent multi-function high-voltage digital Insulation Resistance Tester that can test the insulating property of all kinds of electrical equipments easily.
The technical solution used in the present invention is: in the time that tester presses start button, the current supply circuit conducting of accumulator and DC-DC module, by DC-DC module, whole device is powered, device is started working, first selected the test voltage that need to test by button by tester, after the instructions such as test event, thereby single-chip microcomputer is controlled high-voltage DC power supply output voltage according to tester's instruction by the driving voltage of controlling multi-way switch circuit control high-voltage DC power supply, the control of phase-controlled circuit will be measured and is conducted, make itself and circuit, protective resistance, I/V circuit forms test loop, then utilize by test voltage that high-voltage DC power supply provides, convert test loop current signal to this voltage signal by signal acquisition circuit and carry out importing single-chip microcomputer into after data processing, single-chip microcomputer is analyzed, is calculated it rapidly according to the signal receiving, then data result is sent to LCD display and shows and pass through and control the conducting between phase selection circuit judges high-voltage power supply and phase line, and point out successively tester whether by information printouts such as test figures, whether store this test data, then whether prompting is measured and is completed, and has tested and has continued not test phase, has tested after rear tester selects and has completed this test.
As a further improvement on the present invention:
Described DC-DC module is made up of 2 DC-DC conversion chips.Due to the be respectively+5V of supply voltage of the each electronic devices and components of whole electronic system kind of intelligent multifunctional high tension megger,-5V and+12V, therefore to be the needed voltage of system the 12V voltage transformation of accumulator output, in conversion, we select 2 DC-DC chips to realize the conversion of voltage, as long as add afterwards electric source filter circuit in conversion, just can realize the demand of each electronic devices and components to different power voltage.
In described high voltage direct current source module, in view of the battery capacity of intelligent multifunctional high tension megger can not be too little, at this, we select the accumulator of 12V as the power supply of high-voltage power supply, so just can ensure the requirement of system to battery capacity.High-voltage power module can, by input 12V DC voltage, carry out inversion, multiplication of voltage, the rectification conversion DC voltage of exportable 0 ~ 5000V afterwards to it.
Described multi-way switch circuit is made up of multiplexer (MUX, relay, 4 divider resistances; Described relay, by cut-offfing or closure signal of accepting that single-chip microcomputer sends, is controlled shutoff, the conducting of multi-way switch circuit; Described multiplexer (MUX can be by accepting the splitting signal of single-chip microcomputer, select voltage signal loop corresponding to conducting to import high voltage direct current source module into as driving voltage, thereby realize the function of the driving voltage control high-voltage DC power supply output voltage of inputting by Single-chip Controlling high-voltage DC power supply.
The forming by I/V change-over circuit, amplifying circuit, filtering circuit and A/D circuit of described signal acquisition circuit.I/V change-over circuit is made up of a standard sample resistance and relay, can be by the corresponding sampling circuit of Single-chip Controlling relay conducting; The sampling resistor of megohmmeter is generally little, the most of μ A of the electric current level of sampling resistor of flowing through, so what obtain after sampling resistor is very faint signal, the very large interference of on-the-spot also existence simultaneously, will select to the selection of amplifier the differential amplifier that antijamming capability is stronger, because existing zero point, floats by amplifying circuit. move and temperature drift, the progression amplifying is more, these two kinds of drifts are just larger on the impact of signal, here we select the adjustable amplifying circuit of one-level enlargement factor, follow according to measurement range difference and select different enlargement factors.Because the signal that obtains is also with more weak after amplifying, consider the how many and requirement of system to A/D speed of the pin of single-chip microcomputer simultaneously, in the A/D selection below, just select the A/D converter of 16 of low-speed serials.In order to reduce interference, amplifying the low-pass filter circuit adding between A/D, and can adjust by Single-chip Controlling the enlargement factor of A/D converter, thereby reaching the object of range extension simultaneously.
Described phase-controlled circuit [5] can be realized on A, B, the C terminal that once three-phase of circuit is connected to instrument in line insulation nuclear phase, and whether ground connection completes circuit nuclear phase in whole insulation nuclear phase process, only to need functional arrangement offside.
The present invention has following advantage:
The present invention can overcome deficiency and the shortcoming that electronic type megohmmeter exists in line insulation nuclear phase mostly in the past effectively; In the time measuring, both can complete the nuclear phase operation of three-phase by primary connection.Apparatus of the present invention have measuring principle simple, applied widely, operation safer, easy easy-to-use, Measuring Time is short, measurement result is accurate, be more suitable in work on the spot, and antijamming capability is strong, realize the features such as intelligent measuring, there is higher application value.
Brief description of the drawings
Fig. 1 is the hardware circuit principle schematic diagram of this device device;
Fig. 2 is the software flow schematic diagram of this device device;
Fig. 3 is the circuit theory schematic diagram of this device embodiment mesohigh direct supply;
Fig. 4 is the circuit theory schematic diagram of DC-DC module in this device embodiment;
Fig. 5 is I/V conversion, differential amplifier circuit principle schematic in this device embodiment;
Fig. 6 is A/D change-over circuit principle schematic in this device embodiment;
Fig. 7 is this device phase-controlled circuit theory diagrams;
Fig. 8 is the circuit theory schematic diagram of controlling disposal system in the embodiment of the present invention.
Embodiment
As shown in Figure 1, intelligent multifunctional high-voltage digital Insulation Resistance Tester of the present invention is mainly made up of high voltage direct current source module [1], DC-DC module [2], signal acquisition circuit [3], control disposal system [4].DC-DC module is made up of DC-DC chip [21], DC-DC chip [22], accumulator [20], by two DC-DC chips [21], [22] by the voltage transitions of accumulator [20] to the operating voltage of electronic system for electronic devices and components work; High voltage direct current source module [1] comprises high-voltage DC power supply [11] and protective resistance [12], can effectively ensure high-voltage DC power supply regulated output voltage by protective resistance [12], reduces voltage attenuation and provides protection for high-voltage DC power supply [11]; Signal acquisition circuit [3] comprises I/V change-over circuit [31], differential amplifier circuit [32], A/D change-over circuit [33], and this circuit transfers to single-chip microcomputer [40] for its analytical calculation after can and processing collecting test data; Controlling disposal system [4] is made up of one-chip computer module [40], Keysheet module [41], phase-controlled circuit [42], LCD display circuit [43], print module [44], by one-chip computer module [40], whole device is controlled and data analysis calculating, and can carry out corresponding test by Keysheet module [41] acceptance test personnel instruction, also can send test result to tester by LCD display circuit [43], print module [44].
Fig. 2 is the software flow schematic diagram of apparatus of the present invention.After the start of this device, system is carried out initialization setting, then waits for that tester is to selecting test phase; Then carry out work by Single-chip Controlling high-voltage DC power supply, by signal acquisition circuit, signal gathered and in earlier stage process and data are sent in single-chip microcomputer, by single-chip microcomputer, data are carried out closing high-voltage DC power supply to ensure test safety after analytical calculation, then by Single-chip Controlling, test result is shown by LCD, data are printed and whether stored to prompting whether successively, finally point out whether whether three-phase test completes, if "No" repeats above-mentioned testing procedure, if "Yes" finishes test.
Fig. 3 is high-voltage DC power supply [11] circuit diagram, and 13 is relay, and 14 is multiplexer (MUX.When the P0.0 of single-chip microcomputer sends relay [13] closed (single-chip microcomputer P0.0 can make it cut-off after relay [13] sends low level signal) after high level signal to relay [13], make L0 conducting L1; Then P1.0 and P1.1 send routing Continuity signal to multiplexer (MUX [14], work as P1.0=0, when P1.1=0, and L1 and L2 conducting, Vin and G both end voltage are 12V, now high-voltage DC power supply output voltage is 5000V; Work as P1.0=0, when P1.1=1, L1 and L3 conducting, Vin and G both end voltage are 6V, now high-voltage DC power supply output voltage is 2500V; Work as P1.0=1, when P1.1=0, L1 and L4 conducting, Vin and G both end voltage are 2.4V, now high-voltage DC power supply output voltage is 1000V; Work as P1.0=1, when P1.1=1, L1 and L5 conducting, Vin and G both end voltage are 1.2V, now high-voltage DC power supply output voltage is 500V; Can be carried out by single-chip microcomputer P0.0, P1.0, P1.1 the control of open and close, output voltage to high-voltage DC power supply by this module.
Fig. 4 is DC-DC module [2], and 21,22 is DC-DC chip.In the time that S1 is closed, 12V accumulator starts to DC-DC chip [21], [22] power supply, in the time accessing the voltage of 12V between the Vin of DC-DC chip [21] and GND, DC-DC chip [21]+outwards provide+5V(VCC is provided Vout, relative 0 end) voltage, outwards provide-5V(VEE is provided-Vout) operating voltage; In the time accessing the voltage of 12V between the Vin of DC-DC chip [22] and GND, DC-DC chip [21]+relative 0 end of outwards provide+12V(of Vout) voltage; Adopt after DC-DC chip can be by the 12V power source transition of accumulator stable+5V ,-5V and+12V voltage, for the electronic component of whole device provides reliable operating voltage, also there is very strong interference performance.
Fig. 5 is I/V change-over circuit [31], amplifying circuit [32], the 311st, and relay, the 322nd, differential amplifier.In I/V change-over circuit, R6 selects sample and close sampling by coordinating with relay [311] by single-chip microcomputer P0.1 pilot relay [311], by current signal I in test loop can be converted to the voltage signal U at resistance two ends at the sampling resistor R6 of test loop series connection, and being sent to differential amplifier [321], the signal U ＇ after differential amplifier [321] amplifies is imported into by OUT and in A/D change-over circuit, carries out digital-to-analog conversion.
Circuit shown in Fig. 6 is A/D change-over circuit [33], and wherein 331 is AD780 voltage reference chip, and 332 is AD7715 A/D converter, and Y1 provides clock signal for U4 work for 2.4576MHz crystal oscillator chip,
access single-chip microcomputer P1.2 mouth,
access single-chip microcomputer P1.3 mouth,
dOUTaccess single-chip microcomputer P1.4 mouth,
dINaccess single-chip microcomputer P1.5 mouth,
sCLKaccess single-chip microcomputer P1.6 mouth,
access single-chip microcomputer P1.7 mouth, thus the data access AIN+ that the OUT in Fig. 3 transmits imports in A/D converter [332] and carries out A/D conversion.Its principle of work is as follows: in the time that single-chip microcomputer P1.3 mouth sends low level signal, A/D converter [332] is started working, accept the serial clock signal being sent by A/D changeover control signal and the single-chip microcomputer P1.6 mouth of the transmission of single-chip microcomputer P1.5 mouth, according to control signal, AIN+ mouth data are carried out to corresponding A/D conversion, now
output becomes high level, and after A/D converts, A/D converter [332] passes through
send low level signal to single-chip microcomputer P1.2 mouth, represent current A/D conversion effectively, the low level signal that single-chip microcomputer [40] receives according to P1.2 mouth is sent and reads control signal to A/D converter [332] by P1.5 mouth, and A/D converter [332] receives reading after control signal of being sent by P1.5, by
dOUTsend A/D translation data to single-chip microcomputer P1.4 mouth, single-chip microcomputer sends high level signal by P1.3 mouth to A/D converter [332] after receiving the A/D switching signal of transmission, and it is quit work, and so far, one time A/D conversion work completes; When the A/D of single-chip microcomputer gained switching signal is excessive or when too small, can be controlled signal to by Single-chip Controlling P1.5 port transmission the DIN mouth of AD7715, adjust the signal amplification factor in A/D conversion, and repeat above-mentioned job step, thereby realize intelligent adjustment range, improved measuring accuracy.
The circuit that Figure 7 shows that apparatus of the present invention selects to control [5] schematic diagram.In figure, D101, D102, D103 are that model is the diode of IN4007; K101, K104, K107 are that model is the relay of SRS-05VDC-SL, and its coil voltage is the voltage that 5V can cut-off 24V; Q101, Q102, Q103 are that model is 9014 diode; K102, K103, K105, K106, K108, K109 are that model is the relay of HVR24-1A15-150, it controls voltage is 24V, can normally cut-off the voltage of 10kV, because line influence voltage may be larger, while being directly connected with circuit, adopt the relay series connection that two models are HVR24-1A15-150; HVOUT termination high-voltage power supply protective resistance output terminal, A, B, tri-terminals of C are respectively circuit three-phase terminal.In the time of three-phase line insulation nuclear phase, by the A of circuit one side, B, C three-phase line is respectively with the A that causes instrument, B, on tri-terminals of C, then notify staff by circuit offside A phase temporary grounding, the other side staff to be confirmed evacuates to behind safety zone, instrument control disposal system is opened internal high pressure power supply, then P3.4 is set high to level, relay K 101, K102, K103 closure, start the upper nuclear phase of A, now recording result is that 0 expression A phase phase sequence is correct, and then P3.4 is set low to level, disconnect relay K 101, 102, 103, announcement trunk offside staff takes off A phase temporary grounding, again P3.4 is set high to level, closing relay K101, K102, K103, test A insulate mutually, after having tested, P3.4 is set low to level, disconnect relay K 101, K102, K103, close again high-voltage power supply.Then carry out the insulation nuclear phase operation of B phase and C phase, its step is identical while operation mutually with A, here no longer narration.Complete the insulation nuclear phase of three-phase line by above operation, instrument end need not carry out thread-changing in operation, is only used in circuit offside and carries out ground connection and get ground wire both can completing, and has improved the efficiency of insulation nuclear phase.
Figure 8 shows that control disposal system [4] circuit theory diagrams of apparatus of the present invention.13 be relay, 14 shown in Fig. 3,311 for multiplexer (MUX, 332 for 16 A/D converters shown in Fig. 6,41 for keyboard control circuit, 421 for line phase-sequence detection selector switch, 441 for microprinting drive circuit, 431 for LCD liquid crystal display drive circuit, 40 be singlechip chip.Its specific works is as follows: after apparatus of the present invention power switch is opened, after tester operates test voltage by keyboard control circuit [41], by keyboard control circuit [41], tester's operational order is passed through to P3.0 ~ P3.3 port transmission to single-chip microcomputer, single-chip microcomputer is selected the output voltage of high-voltage DC power supply to multiplexer (MUX [14] transmission of control signals by P1.0 ~ P1.1 by received data, then to relay [13] signal transmission, high-voltage DC power supply is started working by P0.0 the high direct voltage of selected gear is provided to the external world, repeat to cut-off relay step in Fig. 7 brief introduction, in measurement in the processing of voltage and current signal, then select conducting by P0.1 pilot relay [331], sampled signal is extremely also amplified sampled signal by differential amplifier [321] by I/V circuit transmission, then A/D converter [332] is to carrying out A/D conversion and passing through P1.4 serial transmission to single-chip microcomputer [40] through differential amplifier [321] amplifying signal, after single-chip microcomputer [40] calculates these data, data result is transferred to speech chip [421] and LCD liquid crystal display drive circuit [431], thereby test result is exported to tester by demonstration, then whether single-chip microcomputer [40] prints to LCD liquid crystal display drive circuit [431] transmission Notes of Key Data tester, tester responds by keyboard control circuit [41], if "Yes", by test event, the data transmission such as test result to microprinting drive circuit [441] prints output, if "No", points out tester whether to carry out data storage, when tester selects after data storage, single-chip microcomputer [40] is stored in the data such as this test event, result in storer, after convenient, recall and consult, then whether single-chip microcomputer prompting three-phase operation completes, wait for that if do not complete tester carries out next step test, if complete this EO.
Claims (3)
1. line parameter circuit value insulation, nuclear phase integrated test method for testing and device, comprise high voltage direct current source module [1], DC-DC module [2], signal acquisition circuit [3], control disposal system [4], phase-controlled circuit [5]; It is characterized in that utilizing Single-chip Controlling high-voltage DC power supply [11] driving voltage to export many gears test voltage; Control the conducting that will test with high-voltage power supply by phase-controlled circuit [42]; By series connection in high voltage direct current test loop by monolithic processor controlled many sampling resistors value I/V change-over circuit [31] thus line insulation and circuit nuclear phase in realizing intelligent measure; LCD display circuit [43] and the print module [44] being made up of mini-printer can be by test data by liquid crystal display, printouts.
2. line parameter circuit value insulation according to claim 1, nuclear phase integrated test method for testing and device, can realize on A, B, the C terminal that once three-phase of circuit is connected to instrument in line insulation nuclear phase by its phase-controlled circuit [5], in whole insulation nuclear phase process, only need functional arrangement offside whether ground connection completes line insulation to measure and nuclear phase.
3. phase-controlled circuit according to claim 2 [5], because on-the-spot induced voltage may be too high, its phase selection turning circuit adopts the relay series connection that two models are HVR24-1A15-150.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201410227713.1A CN104090174A (en) | 2014-05-27 | 2014-05-27 | Method and device for integrated line parameter insulation and phase checking test |
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| CN201410227713.1A CN104090174A (en) | 2014-05-27 | 2014-05-27 | Method and device for integrated line parameter insulation and phase checking test |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107329007A (en) * | 2017-06-09 | 2017-11-07 | 国网上海市电力公司 | A kind of universal secondary nuclear phase instrument for transformer station |
| CN109342805A (en) * | 2018-11-21 | 2019-02-15 | 陕西电器研究所 | A kind of high-precision micro-ampere current detection circuit |
| CN109342878A (en) * | 2018-09-14 | 2019-02-15 | 国网山西省电力公司晋城供电公司 | A kind of Electrical Power Line Parameter detection auxiliary system based on Internet of Things |
| CN110794214A (en) * | 2019-11-11 | 2020-02-14 | 山东送变电工程有限公司 | Integrated testing device and method for integrated circuit parameter insulation |
-
2014
- 2014-05-27 CN CN201410227713.1A patent/CN104090174A/en active Pending
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107329007A (en) * | 2017-06-09 | 2017-11-07 | 国网上海市电力公司 | A kind of universal secondary nuclear phase instrument for transformer station |
| CN109342878A (en) * | 2018-09-14 | 2019-02-15 | 国网山西省电力公司晋城供电公司 | A kind of Electrical Power Line Parameter detection auxiliary system based on Internet of Things |
| CN109342805A (en) * | 2018-11-21 | 2019-02-15 | 陕西电器研究所 | A kind of high-precision micro-ampere current detection circuit |
| CN109342805B (en) * | 2018-11-21 | 2020-12-22 | 陕西电器研究所 | High-precision microampere current detection circuit |
| CN110794214A (en) * | 2019-11-11 | 2020-02-14 | 山东送变电工程有限公司 | Integrated testing device and method for integrated circuit parameter insulation |
| CN110794214B (en) * | 2019-11-11 | 2021-08-20 | 山东送变电工程有限公司 | Integrated testing device and method for integrated circuit parameter insulation |
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Application publication date: 20141008 |