CN104049222B - Circuit for testing multiple LEDs - Google Patents
Circuit for testing multiple LEDs Download PDFInfo
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- CN104049222B CN104049222B CN201310082792.7A CN201310082792A CN104049222B CN 104049222 B CN104049222 B CN 104049222B CN 201310082792 A CN201310082792 A CN 201310082792A CN 104049222 B CN104049222 B CN 104049222B
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- switch pipe
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Abstract
The invention belongs to the field of testing circuits and especially relates to a circuit for testing multiple LEDs. According to the circuit for testing multiple LEDs, the circuit comprises a plurality of testing sub units which are orderly in series connection with a power supply and the ground, when a tested LED in a testing sub unit reaches a life limit to be extinguished, a first switch tube which is in parallel connection with the tested LED is switched on, the formation of a loop continues, an aging test continues, the test of other tested LEDs is not affected, and according to the circuit, under the allowance of a current source condition, infinite LEDs can be tested.
Description
Technical field
The invention belongs to test circuit field, the more particularly, to a kind of circuit of the multiple led of test.
Background technology
Lamp lighting is seen everywhere inside modern society, and the light fixture using in all trades and professions has different purposes, led
As new type light source, it has energy-saving and environmental protection, efficient feature, and technology is ripe and is applied to every field.
When LED lamp design and manufacture, LED lamp will be tested, to check quality and the property of product
Can, burn-in test is carried out to LED lamp, but human and material resources can be caused when carrying out burn-in test greatly to waste.
Content of the invention
The purpose of the embodiment of the present invention be to provide a kind of circuit of the multiple led of test it is intended to solve carry out now aging
The problem that human and material resources greatly waste can be caused when test.
The embodiment of the present invention is achieved in that a kind of circuit of the multiple led of test, the circuit of the multiple led of described test
Including multiple test subelements being sequentially connected in series in power supply and ground, described test subelement includes:
Tested led, current-limiting resistance r1, light sensitive diode d1, first switch pipe and second switch pipe；
The anode of described tested led is the input of test subelement, and the negative electrode of described tested led is that test is single
The outfan of unit, the high potential of described first switch pipe terminates the anode of described tested led, the low electricity of described first switch pipe
Position terminates the negative electrode of described tested led, and described current-limiting resistance r1 is connected to anode and the first switch pipe of described tested led
Control end between, the control of described first switch pipe terminates the hot end of second switch pipe, described second switch pipe low
Potential end is grounded, and the anode of described light sensitive diode d1 connects the anode of described tested led, the negative electrode of described light sensitive diode d1
Connect the control end of described second switch pipe.
In embodiments of the present invention, the circuit testing multiple led includes the multiple test being sequentially connected in series on power supply and ground
Unit, when the tested led in wherein certain test subelement reaches lifetime limitation and extinguishes, in parallel with tested led the
One switching tube conducting, continuously forms loop, proceeds burn-in test, and do not affect the test of other tested led, this circuit
Under the permission of constant-current source condition, infinite multiple led can be tested.
Brief description
Fig. 1 is the circuit structure diagram of the circuit of the multiple led of test that first embodiment of the invention provides；
Fig. 2 is the circuit structure diagram of the circuit of the multiple led of test that second embodiment of the invention provides；
Fig. 3 is the circuit structure diagram of the circuit of the multiple led of test that third embodiment of the invention provides.
Specific embodiment
In order that the objects, technical solutions and advantages of the present invention become more apparent, below in conjunction with drawings and Examples, right
The present invention is further elaborated.It should be appreciated that specific embodiment described herein is only in order to explain the present invention, and
It is not used in the restriction present invention.
Fig. 1 shows the circuit structure of the circuit of the multiple led of test that first embodiment of the invention provides, for the ease of saying
Bright, illustrate only the part related to the embodiment of the present invention, details are as follows.
A kind of circuit of the multiple led of test, the circuit of the multiple led of described test includes multiple being sequentially connected in series on power supply and ground
Test subelement 100, described test subelement 100 include:
Tested led, current-limiting resistance r1, light sensitive diode d1, first switch pipe 101 and second switch pipe 102；
The anode of described tested led is the input of test subelement 100, and the negative electrode of described tested led is test
The outfan of subelement 100, the high potential of described first switch pipe 101 terminates the anode of described tested led, and described first opens
The electronegative potential closing pipe 101 terminates the negative electrode of described tested led, and described current-limiting resistance r1 is connected to the sun of described tested led
Between the control end of pole and first switch pipe 101, the control of described first switch pipe 101 terminates the high electricity of second switch pipe 102
Position end, the cold end ground connection of described second switch pipe 102, the anode of described light sensitive diode d1 connects described tested led's
Anode, the negative electrode of described light sensitive diode d1 connects the control end of described second switch pipe 102.
As one embodiment of the invention, described first switch pipe 101 adopts npn audion q1, described npn audion
The base stage of q1 is the control end of first switch pipe 101, the height of the current collection extremely first switch pipe 101 of described npn audion q1
Potential end, the cold end of the transmitting extremely first switch pipe 101 of described npn audion q1.
As one embodiment of the invention, described second switch pipe 102 adopts npn audion q2, described npn audion
The base stage of q2 is the control end of second switch pipe 102, the height of the current collection extremely second switch pipe 102 of described npn audion q2
Potential end, the cold end of the transmitting extremely second switch pipe 102 of described npn audion q2.
Fig. 2 shows the circuit structure of the circuit of the multiple led of test that second embodiment of the invention provides, for the ease of saying
Bright, illustrate only the part related to the embodiment of the present invention, details are as follows.
As one embodiment of the invention, described first switch pipe 101 adopts N-shaped mos pipe q3, the grid of described N-shaped mos pipe q3
The control end of extremely first switch pipe 101, the drain electrode of described N-shaped mos pipe q3 is the hot end of first switch pipe 101, described n
The source electrode of type mos pipe q3 is the cold end of first switch pipe 101.
As one embodiment of the invention, described second switch pipe 102 adopts N-shaped mos pipe q4, the grid of described N-shaped mos pipe q4
The control end of extremely second switch pipe 102, the drain electrode of described N-shaped mos pipe q4 is the hot end of second switch pipe 102, described n
The source electrode of type mos pipe q4 is the cold end of second switch pipe 102.
Certainly in an alternative embodiment of the invention, described first switch pipe 101 and second switch pipe 102 can also be adopted respectively
Managed and npn audion with N-shaped mos, Fig. 3 shows the electricity of the circuit of the multiple led of test that third embodiment of the invention provides
Line structure, for convenience of description, illustrate only the part related to the embodiment of the present invention, described first switch pipe 101 and second
Switching tube 102 is respectively adopted N-shaped mos pipe q3 and npn audion q2.
Being respectively adopted N-shaped mos pipe q3 and npn audion q2 with first switch pipe 101 and second switch pipe 102 below is
The operation principle of the circuit of the example explanation multiple led of test:
Regulate the electric current of constant-current source according to the design parameter of tested led, connect led and light, light sensitive diode d1 connects
The light received from led is in the conduction state, and Npn triode q2 turns on, and the grid of N-shaped mos pipe q3 is dragged down, N-shaped mos pipe q3 cuts
Only；When indivedual led are illuminated to lifetime limitation, led goes out, corresponding light sensitive diode d1 cut-off, corresponding npn audion q2
Cut-off, corresponding N-shaped mos pipe q3 conducting, whole loop will not disconnect because of the extinguishing of indivedual led.
In embodiments of the present invention, in embodiments of the present invention, the circuit testing multiple led includes multiple being sequentially connected in series
Power supply and the test subelement on ground, when the tested led that wherein certain is tested in subelement reaches lifetime limitation and extinguishes, with quilt
Test led first switch pipe conducting in parallel, continuously forms loop, proceeds burn-in test, and it is tested not affect other
The test of led, this circuit, under the permission of constant-current source condition, can test infinite multiple led.
The foregoing is only presently preferred embodiments of the present invention, not in order to limit the present invention, all essences in the present invention
Any modification, equivalent and improvement made within god and principle etc., should be included within the scope of the present invention.
Claims (5)
1. a kind of circuit of the multiple led of test is it is characterised in that the circuit of the multiple led of described test includes multiple being sequentially connected in series
In the test subelement of power supply and ground, described test subelement includes:
Tested led, current-limiting resistance r1, light sensitive diode d1, first switch pipe and second switch pipe；
The anode of described tested led is the input of test subelement, and the negative electrode of described tested led is test subelement
Outfan, the high potential of described first switch pipe terminates the anode of described tested led, the cold end of described first switch pipe
Connect the negative electrode of described tested led, described current-limiting resistance r1 is connected to the anode of described tested led and the control of first switch pipe
Between end processed, the control of described first switch pipe terminates the hot end of second switch pipe, the electronegative potential of described second switch pipe
End ground connection, the anode of described light sensitive diode d1 connects the anode of described tested led, and the negative electrode of described light sensitive diode d1 meets institute
State the control end of second switch pipe；
Regulate the electric current of constant-current source according to the design parameter of tested led, connect led and light, light sensitive diode d1 receives
In the conduction state from the light of led, second switch pipe turns on, and the control end of first switch pipe is dragged down, and first switch pipe ends；
When indivedual led are illuminated to lifetime limitation, led goes out, corresponding light sensitive diode d1 cut-off, corresponding second switch pipe cut-off,
Corresponding first switch pipe conducting, whole loop will not disconnect because of the extinguishing of indivedual led.
2. the circuit of the multiple led of test as claimed in claim 1 is it is characterised in that described first switch pipe adopts npn three
Pole pipe q1, the base stage of described npn audion q1 is the control end of first switch pipe, the colelctor electrode of described npn audion q1
For the hot end of first switch pipe, the cold end of the transmitting extremely first switch pipe of described npn audion q1.
3. the circuit of the multiple led of test as claimed in claim 1 is it is characterised in that described second switch pipe adopts npn three
Pole pipe q2, the base stage of described npn audion q2 is the control end of second switch pipe, the colelctor electrode of described npn audion q2
For the hot end of second switch pipe, the cold end of the transmitting extremely second switch pipe of described npn audion q2.
4. the circuit of the multiple led of test as claimed in claim 1 is it is characterised in that described first switch pipe adopts N-shaped mos
The grid of pipe q3, described N-shaped mos pipe q3 is the control end of first switch pipe, and the drain electrode of described N-shaped mos pipe q3 is first switch
The hot end of pipe, the source electrode of described N-shaped mos pipe q3 is the cold end of first switch pipe.
5. the circuit of the multiple led of test as claimed in claim 1 is it is characterised in that described second switch pipe adopts N-shaped mos
The grid of pipe q4, described N-shaped mos pipe q4 is the control end of second switch pipe, and the drain electrode of described N-shaped mos pipe q4 is second switch
The hot end of pipe, the source electrode of described N-shaped mos pipe q4 is the cold end of second switch pipe.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310082792.7A CN104049222B (en) | 2013-03-15 | 2013-03-15 | Circuit for testing multiple LEDs |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310082792.7A CN104049222B (en) | 2013-03-15 | 2013-03-15 | Circuit for testing multiple LEDs |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104049222A CN104049222A (en) | 2014-09-17 |
| CN104049222B true CN104049222B (en) | 2017-02-01 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201310082792.7A Active CN104049222B (en) | 2013-03-15 | 2013-03-15 | Circuit for testing multiple LEDs |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN104049222B (en) |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW201105981A (en) * | 2009-08-14 | 2011-02-16 | Inventec Corp | Power signal detection module |
| CN202077502U (en) * | 2010-11-19 | 2011-12-21 | 宁波龙源照明电器有限公司 | Solar LED (Light-Emitting Diode) light trap |
| CN102594300A (en) * | 2011-01-12 | 2012-07-18 | 富泰华工业（深圳）有限公司 | Light-operated signal generating circuit |
| CN102721937A (en) * | 2011-03-30 | 2012-10-10 | 海洋王照明科技股份有限公司 | Aging test fixture of LED |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7554073B2 (en) * | 2007-01-22 | 2009-06-30 | Avago Technologies Ecbu Ip (Singapore) Pte. Ltd. | High linearity CMOS ambient light sensor |
-
2013
- 2013-03-15 CN CN201310082792.7A patent/CN104049222B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW201105981A (en) * | 2009-08-14 | 2011-02-16 | Inventec Corp | Power signal detection module |
| CN202077502U (en) * | 2010-11-19 | 2011-12-21 | 宁波龙源照明电器有限公司 | Solar LED (Light-Emitting Diode) light trap |
| CN102594300A (en) * | 2011-01-12 | 2012-07-18 | 富泰华工业（深圳）有限公司 | Light-operated signal generating circuit |
| CN102721937A (en) * | 2011-03-30 | 2012-10-10 | 海洋王照明科技股份有限公司 | Aging test fixture of LED |
Also Published As
| Publication number | Publication date |
|---|---|
| CN104049222A (en) | 2014-09-17 |
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