CN104034989A - Capacitive touch sensor tester - Google Patents
Capacitive touch sensor tester Download PDFInfo
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- CN104034989A CN104034989A CN201410305651.1A CN201410305651A CN104034989A CN 104034989 A CN104034989 A CN 104034989A CN 201410305651 A CN201410305651 A CN 201410305651A CN 104034989 A CN104034989 A CN 104034989A
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Abstract
The invention relates to a capacitive touch sensor tester which comprises a DSP, a source program memorizer, a correcting interface, a static random memorizer, a first CPLD and a second CPLD. Signal output and feedback are achieved, the first CPLD is connected with a scanning card control interface, a power-down automatic memorizer and a communication circuit to achieve signal output and feedback, and the second CPLD is respectively connected with a DDS, a programmable amplifying circuit, a programmable I/V conversion circuit, an output selection switch and a digital-to-analog conversion D/A to achieve signal transmission. The DSP sends out measuring signals, signals obtained by measuring a tested object by a scanning card are transmitted to a programmable amplifier to be converted into voltage signals suitable for being measured, a main LFP low-pass circuit converts analog signals into digital signals through an ADC, impedance, inductance values, capacitance and the like with the high activity accuracy are processed through the DSP, testing is efficient and fast, and observation, metering and later analysis are facilitated.
Description
Technical field
The present invention relates to a kind of testing apparatus in electronic technology industry, especially relate to a kind of capacitance touching control sensor tester.
Background technology
In electronic technology field, along with being widely used of electronic product and components and parts, the technology of domestic electronic product and performance are also in constantly development and improve, the requirement of the detection technique of domestic relevant industries to components and parts is also improving constantly, particularly the performance need of himself technical parameter obtains reliable data when guaranteeing that components and parts use, at present, again components and parts are tested to most employing arm processor, can only detect single element, and measuring speed is slower, the numerical value of acquisition has deviation.
Summary of the invention
Technical matters to be solved by this invention is to provide a kind of can demonstration efficiently, accurately and fast so that the capacitance touching control sensor tester that late time data is analyzed.
The present invention solves the technical scheme that its technical matters takes: a kind of capacitance touching control sensor tester, comprise dsp processor, and the source program storage being connected with dsp processor, correction interface, static RAM, the one CPLD logical device and the 2nd CPLD logical device are realized output and the feedback of signal, described a CPLD logical device and scanning card control interface, power down automated storage and communicating circuit connect the output and the feedback that realize signal, described communicating circuit is connected the output and the feedback that realize signal with GPIB/RS2332 interface, the 2nd described CPLD logical device is connected and realizes signal transmission with Direct Digital Frequency Synthesizers DDS, programmable amplifying circuit, program control I/V change-over circuit, output selector switch and digital-to-analog conversion D/A respectively, signal is passed to main LFP low pass circuit by described Direct Digital Frequency Synthesizers DDS, described main LFP low pass circuit passes to signal respectively that output is program control sends out circuit and four groups of analog multipliers large, and signal is passed to respectively diode test constant pressure and flow output circuit and output programmable amplifying circuit by described digital-to-analog conversion D/A, described output selector switch receives signal selective reception diode test constant pressure and flow output circuit, output programmable amplifying circuit and the DCR constant-current circuit of the 2nd CPLD logical device, afterwards reception signal is passed to scanning card, the signal that described scanning card receives scanning card control interface and output selector switch detects detected material and the signal of detected material is passed to difference measurement circuit and program control I/V change-over circuit, and signal is passed to electronic selection switch by described difference measurement circuit, the signal that described program control I/V change-over circuit receives the 2nd CPLD logical device and scanning card passes to electronic selection switch, the signal after selecting is passed to programmable amplifying circuit by described electronic selection switch, and the signal that described programmable amplifying circuit receives the 2nd CPLD logical device and electronic selection switch output outputs to processing in four groups of analog multipliers, signal in analog multiplier feeds back to the 2nd CPLD logical device after passing to ADC analog-to-digital conversion device by a LFP low pass circuit.
Further, in order to facilitate output alarm signal, described dsp processor is connected with hummer.
Further, described dsp processor with start or stop to measure and send the control decision circuit of result of determination signal for controlling.
The invention has the beneficial effects as follows: after having adopted above-mentioned metering circuit, dsp processor sends measuring-signal, the signal that testee measures by scanning card is delivered to programmable amplifier and converts to the voltage signal of suitable measurement, by main LFP low pass circuit, the simulating signal of acquisition is converted into digital signal by ADC digital to analog converter again, and by the higher impedance of dsp processor processing activity accuracy, inductance value, electric capacity etc., test efficient quick, facilitates observation, metering and post analysis.
Brief description of the drawings
Fig. 1 is schematic block circuit diagram of the present invention;
Fig. 2 is the circuit diagram of dsp processor of the present invention;
Fig. 3 is the circuit diagram of source program storage of the present invention;
Fig. 4 is the circuit diagram of static RAM of the present invention;
Fig. 5 is the circuit diagram of correction interface of the present invention;
Fig. 6 is the circuit diagram of power down automated storage of the present invention;
Fig. 7 is the circuit diagram of scanning card control interface of the present invention;
Fig. 8 is diode test constant pressure and flow output circuit figure of the present invention;
Fig. 9 is the circuit diagram of Direct Digital Frequency Synthesizers DDS of the present invention;
Figure 10 is the main LFP low pass circuit of the present invention figure;
Figure 11 is difference measurement circuit diagram of the present invention;
Figure 12 is the program control I/V change-over circuit of the present invention figure.
Embodiment
Below in conjunction with accompanying drawing, the present invention is explained in detail.
A kind of capacitance touching control sensor tester as shown in Fig. 1～Figure 12, comprise dsp processor, and the source program storage being connected with dsp processor, correction interface, static RAM, a CPLD logical device and the 2nd CPLD logical device are realized output and the feedback of signal, a described CPLD logical device is connected with scanning card control interface, power down automated storage and communicating circuit the output and the feedback that realize signal, and described communicating circuit is connected the output and the feedback that realize signal with GPIB/RS2332 interface; The 2nd described CPLD logical device is connected and realizes signal transmission with Direct Digital Frequency Synthesizers DDS, programmable amplifying circuit, program control I/V change-over circuit, output selector switch and digital-to-analog conversion D/A respectively; Signal is passed to main LFP low pass circuit by described Direct Digital Frequency Synthesizers DDS, described main LFP low pass circuit passes to signal respectively that output is program control sends out circuit and four groups of analog multipliers large, and signal is passed to respectively diode test constant pressure and flow output circuit and output programmable amplifying circuit by described digital-to-analog conversion D/A; Described output selector switch receives signal selective reception diode test constant pressure and flow output circuit, output programmable amplifying circuit and the DCR constant-current circuit of the 2nd CPLD logical device, afterwards reception signal is passed to scanning card; The signal that described scanning card receives scanning card control interface and output selector switch detects detected material and the signal of detected material is passed to difference measurement circuit and program control I/V change-over circuit, and signal is passed to electronic selection switch by described difference measurement circuit; The signal that described program control I/V change-over circuit receives the 2nd CPLD logical device and scanning card passes to electronic selection switch, the signal after selecting is passed to programmable amplifying circuit by described electronic selection switch, and the signal that described programmable amplifying circuit receives the 2nd CPLD logical device and electronic selection switch output outputs to processing in four groups of analog multipliers; Signal in analog multiplier feeds back to the 2nd CPLD logical device after passing to ADC analog-to-digital conversion device by a LFP low pass circuit.
For can output alarm signal, described dsp processor be connected with hummer.
Described dsp processor with start or stop to measure and send the control decision circuit of result of determination signal for controlling.
Dsp processor sends measuring-signal, the signal that testee measures by scanning card is delivered to programmable amplifier and converts to the voltage signal of suitable measurement, by main LFP low pass circuit, the simulating signal of acquisition is converted into digital signal by ADC digital to analog converter again, and by the higher impedance of dsp processor processing activity accuracy, inductance value, electric capacity etc., test efficient quick, facilitates observation, metering and post analysis.
Dsp processor: be responsible for the control of the internal circuit of whole tester, comprise the control of all amplifying circuit gains; The selection of signalling channel; The setting of the amplitude output signal of Direct Digital Synthesis device DDS, phase place, frequency; The control of D/A conversion; The control of communicating circuit and various interface; The control of external signal input and output, dsp processor is also responsible for all parameter computings of tester simultaneously.
Source program storage: for depositing the source program of dsp processor.
Static RAM: for dsp processor high-speed cache.
The one CPLD logical device, the 2nd CPLD logical device: for being connected between dsp processor and each modular circuit.
Power down automated storage: for all set-point data of storage apparatus.
Scanning card control interface: for connecting scanning card switching channel.
Correction interface: for connecting external calibration equipment.
Communicating circuit and GPIB/RS2332 interface: for being connected with computing machine, to facilitate by this instrument of computer control.
Direct Digital Synthesis device DDS:DSP is by its output amplitude of data bus control, phase place, frequency, and reference frequency output can be from 20Hz to 1Mz, and this signal passes to main LFP low pass circuit.
LFP low pass circuit: this circuit filters out unwanted signal composition, delivers to output programmable amplifying circuit and four groups of analog multipliers by useful signal.
D/A digital-to-analog conversion: digital signal is converted into analog signal output to diode test constant pressure and flow output circuit and output programmable amplifying circuit.
Diode test constant pressure and flow output circuit: for output diode test voltage or electric current and export signal to output selector switch.
DCR constant-current circuit: be convenient to record accurate DC resistance for exporting fixing current value.
Output selector switch: receive the 2nd CPLD logical device signal and select diode test constant pressure and flow output circuit, output programmable amplifying circuit or DCR constant-current circuit Zhong mono-tunnel.
Output programmable amplifying circuit: the sine wave signal of Direct Digital Synthesis device output is amplified and export output selector switch to.
Scanning card: be mainly used in the switching of scan channel, receive the signal that a CPLD logical device sends by scanning card control interface and output selector switch, export difference measurement circuit and program control I/V change-over circuit to after testee is scanned.
Program control I/V change-over circuit: current signal is converted into voltage signal and is amplified, and dsp processor is according to the size control enlargement factor of signal amplitude.
Electronic selection switch: for selecting the selection of output signal of difference measurement circuit and program control I/V change-over circuit.
Programmable amplifying circuit: for current signal or voltage signal are converted into the voltage signal of a suitable measurement and export four groups of analog multipliers to.
Hummer: for output alarm signal.
When work, dsp processor passes through the 2nd CPLD logical device control Direct Digital Frequency Synthesizers DDS according to the test parameter of setting, digital-to-analog conversion D/A, program control I/V change-over circuit and programmable amplifying circuit, Direct Digital Frequency Synthesizers DDS output signal passes to output programmable amplifying circuit and four groups of analog multipliers by LFP low pass circuit, simultaneously, signal is passed to diode test constant pressure and flow output circuit and output programmable amplifying circuit by digital-to-analog conversion D/A, output selector switch receives the command signal of the 2nd CPLD logical device at diode test constant pressure and flow output circuit, output programmable amplifying circuit or DCR constant-current circuit select a road to receive signal, and signal is passed to scanning card, scanning card receives the command signal of scanning card control interface simultaneously and measured object is tested and exported to difference measurement circuit and program control I/V change-over circuit, electronic selection switch is selected a road as output signal to difference measurement circuit or program control I/V change-over circuit and is exported to the voltage signal that signal transforms into a suitable measurement by programmable amplifying circuit and export to four groups of analog multipliers, four groups of analog multipliers 0 ° of sine wave outputs respectively, 90 °, the signal of 180 ° and 270 ° also filters out unnecessary signal by a LFP low pass circuit and exports ADC digital-to-analogue converter to and simulating signal is converted into digital signal feeds back to dsp processor and process, obtain the parameter of measured object by computing, and show by display device.
It is emphasized that: be only preferred embodiment of the present invention above, not the present invention is done to any pro forma restriction, any simple modification, equivalent variations and modification that every foundation technical spirit of the present invention is done above embodiment, all still belong in the scope of technical solution of the present invention.
Claims (3)
1. a capacitance touching control sensor tester, it is characterized in that, comprise dsp processor, and the source program storage being connected with dsp processor, correction interface, static RAM, a CPLD logical device and the 2nd CPLD logical device are realized output and the feedback of signal, a described CPLD logical device is connected with scanning card control interface, power down automated storage and communicating circuit the output and the feedback that realize signal, and described communicating circuit is connected the output and the feedback that realize signal with GPIB/RS2332 interface; The 2nd described CPLD logical device is connected and realizes signal transmission with Direct Digital Frequency Synthesizers DDS, programmable amplifying circuit, program control I/V change-over circuit, output selector switch and digital-to-analog conversion D/A respectively; Signal is passed to main LFP low pass circuit by described Direct Digital Frequency Synthesizers DDS, described main LFP low pass circuit passes to signal respectively that output is program control sends out circuit and four groups of analog multipliers large, and signal is passed to respectively diode test constant pressure and flow output circuit and output programmable amplifying circuit by described digital-to-analog conversion D/A; Described output selector switch receives signal selective reception diode test constant pressure and flow output circuit, output programmable amplifying circuit and the DCR constant-current circuit of the 2nd CPLD logical device, afterwards reception signal is passed to scanning card; The signal that described scanning card receives scanning card control interface and output selector switch detects detected material and the signal of detected material is passed to difference measurement circuit and program control I/V change-over circuit, and signal is passed to electronic selection switch by described difference measurement circuit; The signal that described program control I/V change-over circuit receives the 2nd CPLD logical device and scanning card passes to electronic selection switch, the signal after selecting is passed to programmable amplifying circuit by described electronic selection switch, and the signal that described programmable amplifying circuit receives the 2nd CPLD logical device and electronic selection switch output outputs to processing in four groups of analog multipliers; Signal in analog multiplier feeds back to the 2nd CPLD logical device after passing to ADC analog-to-digital conversion device by a LFP low pass circuit.
2. capacitance touching control sensor tester according to claim 1, is characterized in that, described dsp processor is connected with hummer.
3. capacitance touching control sensor tester according to claim 1, is characterized in that, described dsp processor with start or stop to measure and send the control decision circuit of result of determination signal for controlling.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410305651.1A CN104034989B (en) | 2014-06-30 | 2014-06-30 | A kind of capacitance touching control sensor tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410305651.1A CN104034989B (en) | 2014-06-30 | 2014-06-30 | A kind of capacitance touching control sensor tester |
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| Publication Number | Publication Date |
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| CN104034989A true CN104034989A (en) | 2014-09-10 |
| CN104034989B CN104034989B (en) | 2017-06-06 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201410305651.1A Active CN104034989B (en) | 2014-06-30 | 2014-06-30 | A kind of capacitance touching control sensor tester |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107727938A (en) * | 2017-08-31 | 2018-02-23 | 广西电网有限责任公司电力科学研究院 | Capacitive/inductive automatically adjusts frequency conversion measurement apparatus and its measuring method |
| CN114089040A (en) * | 2021-11-01 | 2022-02-25 | 苏州茂鼎电子科技有限公司 | Multichannel high-precision LCR test system |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2308095Y (en) * | 1997-07-11 | 1999-02-17 | 济南艾诺仪器有限公司 | Intelligence safety property tester |
| JP2010226844A (en) * | 2009-03-23 | 2010-10-07 | Mitsuba Corp | Hall sensor abnormality detector and motor drive |
| CN202815125U (en) * | 2012-10-16 | 2013-03-20 | 南京因泰莱配电自动化设备有限公司 | State monitoring device for power transformer |
| CN203012023U (en) * | 2013-01-16 | 2013-06-19 | 苏州茂鼎电子科技有限公司 | A LCR tester |
| CN203981798U (en) * | 2014-06-30 | 2014-12-03 | 苏州茂鼎电子科技有限公司 | Capacitance touching control sensor tester |
-
2014
- 2014-06-30 CN CN201410305651.1A patent/CN104034989B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2308095Y (en) * | 1997-07-11 | 1999-02-17 | 济南艾诺仪器有限公司 | Intelligence safety property tester |
| JP2010226844A (en) * | 2009-03-23 | 2010-10-07 | Mitsuba Corp | Hall sensor abnormality detector and motor drive |
| CN202815125U (en) * | 2012-10-16 | 2013-03-20 | 南京因泰莱配电自动化设备有限公司 | State monitoring device for power transformer |
| CN203012023U (en) * | 2013-01-16 | 2013-06-19 | 苏州茂鼎电子科技有限公司 | A LCR tester |
| CN203981798U (en) * | 2014-06-30 | 2014-12-03 | 苏州茂鼎电子科技有限公司 | Capacitance touching control sensor tester |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107727938A (en) * | 2017-08-31 | 2018-02-23 | 广西电网有限责任公司电力科学研究院 | Capacitive/inductive automatically adjusts frequency conversion measurement apparatus and its measuring method |
| CN114089040A (en) * | 2021-11-01 | 2022-02-25 | 苏州茂鼎电子科技有限公司 | Multichannel high-precision LCR test system |
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| CN104034989B (en) | 2017-06-06 |
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