CN104034923A - Self-adaptive test clamp for separate-type LED device - Google Patents
Self-adaptive test clamp for separate-type LED device Download PDFInfo
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- CN104034923A CN104034923A CN201410275448.4A CN201410275448A CN104034923A CN 104034923 A CN104034923 A CN 104034923A CN 201410275448 A CN201410275448 A CN 201410275448A CN 104034923 A CN104034923 A CN 104034923A
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- led
- electrode
- gathering sill
- movable rod
- test board
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Abstract
A self-adaptive test clamp for a separate-type LED device comprises a test table, clamping blocks, electrode ejector pins and a guide rail, wherein the clamping blocks and the electrode ejector pins are symmetrically distributed on two sides of a mounting seat, the upper ends of the clamping blocks and the electrode ejector pins penetrate a first guiding groove and extend out of the test table, the lower ends of the clamping blocks are butted against the guide rail, a second guiding groove is formed in the guide rail, the lower ends of the electrode ejector pins penetrate the second guiding groove and are hinged to first movable connection rods, the first movable rods are hinged with second movable rods, two fixed connection rods are symmetrically arranged on the mounting seat and hinged to the middles of the second movable connection rods, an extension spring is arranged between the two electrode ejector pins, first compression springs sleeve the lower ends of the electrode ejector pins, one ends of the first compression springs are butted against the guide rail while the other ends of the same are butted against the first movable connection rods, and a second compression spring is arranged between the two second movable connection rods. By means of linkage among a hand-operated rod, the first movable connection rods, the second movable connection rods, the clamping blocks and the electrode ejector pins, the clamping blocks and the electrode ejector pins are adapt to clamping requirements of LEDs of different types.
Description
Technical field
The present invention relates to test fixture, in particular for the fixture of LED integrating sphere measurement.
Background technology
Widespread use along with LED, the specification of LED product and model are also in continuous increase, the frock of at present LED being carried out to photoelectric properties test is tailored version, and the test fixture of the corresponding a kind of style of a kind of LED product of model, is difficult to general between the LED test fixture of different model.This kind of situation caused very large trouble to the test of LED, this just requires the LED product of a kind of model of the every production of LED manufacturing enterprise will buy the test fixture of this kind of model of a set of special test, this has not only increased equipment investment fund to enterprise, has improved production cost; And generalized case test fixture is all given birth to according to test products, this will cause a kind of LED of new model may cannot not carry out to it test of photoelectric properties because there is no test fixture when just developing, thereby also cannot promptly and accurately draw the performance index of this new product.
Summary of the invention
Technical matters to be solved by this invention is to provide a kind of LED discrete part adaptive testing fixture, and highly versatile can be suitable for the integrating sphere measurement of the LED discrete part of different model, and simple and quick.
For solving the problems of the technologies described above, technical scheme of the present invention is: a kind of LED discrete part adaptive testing fixture, comprise test board, two fixture blocks, two electrode thimbles and be located at the guide rail of described test board below, centre position, described test board bottom is provided with mount pad, and described fixture block and electrode thimble are symmetrically distributed in described mount pad both sides, described test board is provided with corresponding described electrode thimble place and is provided with the first gathering sill, and the upper end of described fixture block and electrode thimble is through described the first gathering sill and stretch out test board, the lower end of described fixture block and described guide rail offset, described guide rail is provided with the second gathering sill, the lower end of described electrode thimble is through described the second gathering sill and be articulated with an A with the upper end of the first movable rod, the upper end of the lower end of described the first movable rod and the second movable rod is articulated with a B, the lower end of described the second movable rod and one end of hand lever are fixedly connected on a C, on described mount pad, be arranged with two stationary links, one end of described stationary links is fixedly connected with mount pad, the other end and described the second movable rod are articulated with a D, described pin joint D is located between pin joint B and point of fixity C, between two described electrode thimbles, be provided with extension spring, the lower end cover of described electrode thimble has the first Compress Spring, described first Compress Spring one end and guide rail offset, and the other end and the first movable rod offset, and between two described the second movable rods, are provided with the second Compress Spring, described fixture block is provided with the 3rd gathering sill, and described electrode thimble is located in described the 3rd gathering sill, described electrode thimble is provided with stopper, and the diameter of described stopper is greater than the 3rd gathering sill diameter.Under normal condition, extension spring is in extended state, and it has pulling force to the fixture block of both sides and electrode thimble, makes two symmetrical fixture blocks have clamping force; The first Compress Spring and the second Compress Spring, in compressive state, make the first movable rod and the second movable rod in tensioned state.Principle of work of the present invention: inwardly push hand lever with hand, two hand lever relative displacements are also further compressed the second Compress Spring, because the second movable rod and stationary links are articulated with a D, when hand lever drives the second movable rod lower end to move, the second movable rod is rotated counterclockwise around pin joint D; The rotation of the second movable rod can drive again the first movable rod lower end to move, and in the second movable rod rotary course, the first movable rod takes the lead in moving downward under the effect of the first Compress Spring, and electrode thimble is pulled downwards; Stopper on electrode thimble and fixture block offset in the time of can not moving down again, continue extruding hand lever, outwards move with the lower end of the first movable rod the upper end of the second movable rod, the first movable rod pulls out fixture block when outwards moving together with electrode thimble, fixture block moves along the first gathering sill, electrode thimble moves along the second gathering sill, finally makes fixture block laterally open the size that certain width adapts to LED device, under electrode thimble retraction test board now; LED is placed on to the centre of two fixture blocks, remove the extruding to hand lever, under the effect of extension spring and the second Compress Spring, fixture block resets, under the effect of the first Compress Spring, electrode thimble can not move in fixture block reseting procedure, and hand lever, the second movable rod, the first movable rod reset; After two fixture blocks clamp LED, the second Compress Spring overcomes the resistance of the first Compress Spring, and electrode thimble is moved upward, and further compresses the first Compress Spring; Electrode thimble stretches out test board in electrical contact with LED electrode again, and energising can be tested LED.In whole motion process, while unclamping LED, electrode thimble, always prior to fixture block motion, guarantees first power-off; While clamping LED electrode thimble always fixture block reset finish after setting in motion, guarantee that LED takes the lead in contacting and under the effect of the first Compress Spring, having enough friction force to overcome the elastic force of the built-in spring of thimble and be close to all the time heat sinkly with heat sink, guarantee the heat radiation in test process.Test fixture of the present invention can any model of self-adaptation LED.
As improvement, described fixture block is L-shaped, comprises clamping part and guide part, and described clamping part stretches out described test board, and described the 3rd gathering sill is located in described guide part.Electrode thimble can move up and down along the 3rd gathering sill, and electrode thimble also can move inside and outside the second gathering sill, thereby realizes moving up and down and side-to-side movement of electrode thimble.
As improvement, the distance between described electrode thimble and clamping part is L1, and the distance between LED external diameter and LED electrode is L2, L1=L2.Because LED electrode and LED external diameter distance is fixed, as long as electrode thimble moves together with fixture block, fix the distance between the two, fixture block clamps behind LED external diameter edge, and electrode thimble must be aimed at LED electrode.
As improvement, two clamping part formation jaws are tapered, and when clamping part clamps after LED, taper jaws has the trend of downward extruding LED, prevents that LED from departing from the clamping of fixture block.
As improvement, on described mount pad, corresponding described extension spring place is provided with through hole, and described extension spring is located in described through hole.
As improvement, described hand lever is for being horizontally disposed with.
As improvement, described mount pad top is provided with heat sink, and described heat sink and test board are affixed.Because LED time can generate heat in test, and the performance of LED can be subject to the impact of high temperature, the present invention arrange heat sink after, the heat Quick diffusing that can produce LED, reduces the impact of temperature factor on test result.
As improvement, described pin joint D is positioned at the centre position of the second movable rod.
As improvement, the height that described fixture block stretches out test board is greater than the height that electrode thimble stretches out test board.
As improvement, described the first gathering sill, the second gathering sill and the 3rd gathering sill are strip.
The beneficial effect that the present invention compared with prior art brought is:
The present invention utilizes the linkage between hand lever, the second movable rod, the first movable rod, fixture block and electrode thimble, and the LED that realizes fixture block and electrode thimble self-adaptation different model clamps demand; In addition, utilize the effect of extension spring, the first Compress Spring and the second Compress Spring, hand lever, the second movable rod, the first movable rod, fixture block and electrode thimble can be resetted successively, and then can make fixture repeated work, and easy to operate.
Accompanying drawing explanation
Fig. 1 is structural representation of the present invention.
Fig. 2 is the connection diagram between each connecting rod under normal condition.
Fig. 3 is the end face stereographic map of Fig. 2.
Fig. 4 is the bottom isometric view of Fig. 2.
Fig. 5 is the state intention that the present invention contacts with fixture block at stopper.
Fig. 6 is the stereographic map of Fig. 5.
Fig. 7 is that the present invention is in the view of limit of sports record position.
Fig. 8 is the stereographic map of Fig. 7.
Embodiment
Below in conjunction with Figure of description, the invention will be further described.
As shown in Figure 1, a kind of LED discrete part adaptive testing fixture, comprises circular test board 1, two fixture blocks 2, two electrode thimbles 3 and is located at the guide rail 4 of described test board 1 below.Described test board 1 centre position, bottom is provided with mount pad 8, and that described mount pad 8 tops are provided with is heat sink (not indicating), described be heat sinkly affixed with test board 1; Or whole mount pad 8 is as heat sink, and heat-sinking capability is better; Because LED time can generate heat in test, and the performance of LED can be subject to the impact of high temperature, the present invention arrange heat sink after, the heat Quick diffusing that can produce LED, reduces the impact of temperature factor on test result.Described fixture block 2 and electrode thimble 3 are symmetrically distributed in described mount pad 8 both sides; Described fixture block 2 is L-shaped, comprise clamping part 21 and guide part 22, described clamping part 21 stretches out described test board 1, is provided with the 3rd gathering sill (not indicating) in described guide part 22, described electrode thimble 3 is located in described the 3rd gathering sill, and electrode thimble 3 can move up and down along the 3rd gathering sill; Described electrode thimble 3 is provided with stopper 31, and the width of described stopper 31 is greater than the 3rd gathering sill diameter, and when stopper 31 is displaced downwardly to guide part 22 upper end, owing to being stopped, electrode thimble 3 can not continue to move down.Distance between described electrode thimble 3 and clamping part 21 is L1, distance between LED external diameter and LED electrode is L2, L1=L2, because LED electrode and LED external diameter distance is fixed, as long as electrode thimble 3 moves together with fixture block 2, fix the distance between the two, fixture block 2 clamps behind LED external diameter edge, and electrode thimble 3 must be aimed at LED electrode; Two clamping part 21 formation jaws are tapered, and when clamping part 21 clamps after LED, taper jaws has the trend of downward extruding LED, prevents that LED from departing from the clamping of fixture block 2.Described test board 1 is provided with the first gathering sill 12 that corresponding described electrode thimble 3 places are provided with strip, the clamping part 21 of described fixture block 2 and the upper end of electrode thimble 3 are through described the first gathering sill 12 and stretch out test board 1, and the height that described fixture block 2 stretches out test board 1 is greater than the height that electrode thimble 3 stretches out test board 1.The lower end of described fixture block 2 and described guide rail 4 offset, described guide rail 4 is provided with the second gathering sill 13 of strip, the lower end of described electrode thimble 3 is through described the second gathering sill 13 and be articulated with an A with the upper end of the first movable rod 5, the upper end of the lower end of described the first movable rod 5 and the second movable rod 6 is articulated with a B, the inner of the lower end of described the second movable rod 6 and horizontally disposed hand lever 7 is fixedly connected on a C, on described mount pad 8, be arranged with two stationary links 10, one end of described stationary links 10 is fixedly connected with mount pad 8, the other end and described the second movable rod 6 are articulated with a D, described pin joint D is located at pin joint B and point of fixity C centre position, balance more when the second movable rod 6 is rotated around pin joint D.Between two described electrode thimbles 3, be provided with extension spring 14, on described mount pad 8, corresponding described extension spring 14 places are provided with through hole 15, and described extension spring 14 is located in described through hole 15.The lower end cover of described electrode thimble 3 has the first Compress Spring 11, and described first Compress Spring 11 one end and guide rail 4 offset, and the other end and the first movable rod 5 offset, and between two described the second movable rods 6, are provided with the second Compress Spring 9.As shown in Figures 2 to 4, under normal condition, extension spring 14 is in extended state, and it has pulling force to the fixture block 2 of both sides and electrode thimble 3, makes two symmetrical fixture blocks 2 have clamping force; The first Compress Spring 11 and the second Compress Spring 9, in compressive state, make the first movable rod 5 and the second movable rod 6 in tensioned state.
Principle of work of the present invention: as shown in Figure 5,6, with hand, inwardly push hand lever 7, two hand lever 7 relative displacements are also further compressed the second Compress Spring 9, because the second movable rod 6 is articulated with a D with stationary links 10, when hand lever 7 drives the second movable rod 6 lower ends to move, the second movable rod 6 is rotated counterclockwise around pin joint D; The rotation of the second movable rod 6 can drive again the first movable rod 5 lower ends to move, and in the second movable rod 6 rotary courses, the first movable rod 5 takes the lead in moving downward under the effect of the first Compress Spring 11, and electrode thimble 3 is pulled downwards; As shown in Figure 7,8, stopper 31 on electrode thimble 3 offsets in the time of can not moving down with fixture block 2 again, continue extruding hand lever 7, outwards move with the lower end of the first movable rod 5 upper end of the second movable rod 6, the first movable rod 5 pulls out fixture block 2 when outwards moving together with electrode thimble 3, fixture block 2 moves along the first gathering sill 12, electrode thimble 3 moves along the second gathering sill 13, finally make fixture block 2 laterally open the size that certain width adapts to LED device, electrode thimble 3 retraction test board now 1 time; LED is placed on to the centre of two fixture blocks 2, remove the extruding to hand lever 7, under the effect of extension spring 14 and the second Compress Spring 9, fixture block 2 resets, under the effect of the first Compress Spring 11, electrode thimble 3 can not move in fixture block 2 reseting procedures, and hand lever 7, the second movable rod 6, the first movable rod 5 reset; After two fixture blocks 2 clamp LED, the second Compress Spring 9 overcomes the resistance of the first Compress Spring 11, and electrode thimble 3 is moved upward, and further compresses the first Compress Spring 11; Electrode thimble 3 stretches out test board in electrical contact with LED electrode again, and energising can be tested LED.In whole motion process, while unclamping LED, electrode thimble 3, always prior to fixture block 2 motions, guarantees first power-off; While clamping LED electrode thimble 3 always fixture block 2 reset finish after setting in motion, guarantee that LED takes the lead in contacting and under the effect of the first Compress Spring 11, having enough friction force to overcome the elastic force of the built-in spring of thimble and be close to all the time heat sinkly with heat sink, guarantee the heat radiation in test process.Test fixture of the present invention can any model of self-adaptation LED.
The present invention utilizes the linkage between hand lever 7, the second movable rod 6, the first movable rod 5, fixture block 2 and electrode thimble 3, and the LED that realizes fixture block 2 and electrode thimble 3 self-adaptation different models clamps demand; In addition, utilize the effect of extension spring 14, the first Compress Spring 11 and the second Compress Spring 9, hand lever 7, the second movable rod 6, the first movable rod 5, fixture block 2 and electrode thimble 3 can be resetted successively, and then can make fixture repeated work, and easy to operate.
Claims (10)
1. a LED discrete part adaptive testing fixture, it is characterized in that: comprise test board, two fixture blocks, two electrode thimbles and be located at the guide rail of described test board below, centre position, described test board bottom is provided with mount pad, and described fixture block and electrode thimble are symmetrically distributed in described mount pad both sides, described test board is provided with corresponding described electrode thimble place and is provided with the first gathering sill, and the upper end of described fixture block and electrode thimble is through described the first gathering sill and stretch out test board, the lower end of described fixture block and described guide rail offset, described guide rail is provided with the second gathering sill, the lower end of described electrode thimble is through described the second gathering sill and be articulated with an A with the upper end of the first movable rod, the upper end of the lower end of described the first movable rod and the second movable rod is articulated with a B, the lower end of described the second movable rod and one end of hand lever are fixedly connected on a C, on described mount pad, be arranged with two stationary links, one end of described stationary links is fixedly connected with mount pad, the other end and described the second movable rod are articulated with a D, described pin joint D is located between pin joint B and point of fixity C, between two described electrode thimbles, be provided with extension spring, the lower end cover of described electrode thimble has the first Compress Spring, described first Compress Spring one end and guide rail offset, and the other end and the first movable rod offset, and between two described the second movable rods, are provided with the second Compress Spring, described fixture block is provided with the 3rd gathering sill, and described electrode thimble is located in described the 3rd gathering sill, described electrode thimble is provided with stopper, and the diameter of described stopper is greater than the 3rd gathering sill diameter.
2. a kind of LED discrete part adaptive testing fixture according to claim 1, is characterized in that: described fixture block is L-shaped, and comprise clamping part and guide part, described clamping part stretches out described test board, and described the 3rd gathering sill is located in described guide part.
3. a kind of LED discrete part adaptive testing fixture according to claim 2, is characterized in that: the distance between described electrode thimble and clamping part is L1, and the distance between LED external diameter and LED electrode is L2, L1=L2.
4. a kind of LED discrete part adaptive testing fixture according to claim 2, is characterized in that: two clamping part formation jaws are tapered.
5. a kind of LED discrete part adaptive testing fixture according to claim 1, is characterized in that: on described mount pad, corresponding described extension spring place is provided with through hole, and described extension spring is located in described through hole.
6. a kind of LED discrete part adaptive testing fixture according to claim 1, is characterized in that: described hand lever is for being horizontally disposed with.
7. a kind of LED discrete part adaptive testing fixture according to claim 1, is characterized in that: described mount pad top is provided with heat sink, and described heat sink and test board are affixed.
8. a kind of LED discrete part adaptive testing fixture according to claim 1, is characterized in that: described pin joint D is positioned at the centre position of the second movable rod.
9. a kind of LED discrete part adaptive testing fixture according to claim 1, is characterized in that: the height that described fixture block stretches out test board is greater than the height that electrode thimble stretches out test board.
10. a kind of LED discrete part adaptive testing fixture according to claim 1, is characterized in that: described the first gathering sill, the second gathering sill and the 3rd gathering sill are strip.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410275448.4A CN104034923B (en) | 2014-06-19 | 2014-06-19 | Self-adaptive test clamp for separate-type LED device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410275448.4A CN104034923B (en) | 2014-06-19 | 2014-06-19 | Self-adaptive test clamp for separate-type LED device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104034923A true CN104034923A (en) | 2014-09-10 |
| CN104034923B CN104034923B (en) | 2017-01-11 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410275448.4A Expired - Fee Related CN104034923B (en) | 2014-06-19 | 2014-06-19 | Self-adaptive test clamp for separate-type LED device |
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| Country | Link |
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| CN (1) | CN104034923B (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107192538A (en) * | 2017-06-29 | 2017-09-22 | 湖北申安亚明照明科技有限公司 | A kind of integrating sphere fixture |
| CN109623689A (en) * | 2018-10-31 | 2019-04-16 | 邵东智能制造技术研究院有限公司 | A kind of gum cover positioning device of tiger pliers |
| CN113996552A (en) * | 2021-10-25 | 2022-02-01 | 深圳市广达电子材料有限公司 | Electronic material electrical property detection equipment |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101093230A (en) * | 2007-07-10 | 2007-12-26 | 重庆大学 | Clamp in use for testing LED |
| US20110228273A1 (en) * | 2010-03-22 | 2011-09-22 | Lg Innotek Co., Ltd. | Testing apparatus for testing light emitting diode lamp and method for operating the same |
| KR20120091921A (en) * | 2011-02-10 | 2012-08-20 | 주식회사 프로텍 | Jig unit for testing led chip |
| CN203259626U (en) * | 2013-06-06 | 2013-10-30 | 歌尔声学股份有限公司 | General LED test clamp |
-
2014
- 2014-06-19 CN CN201410275448.4A patent/CN104034923B/en not_active Expired - Fee Related
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101093230A (en) * | 2007-07-10 | 2007-12-26 | 重庆大学 | Clamp in use for testing LED |
| US20110228273A1 (en) * | 2010-03-22 | 2011-09-22 | Lg Innotek Co., Ltd. | Testing apparatus for testing light emitting diode lamp and method for operating the same |
| KR20120091921A (en) * | 2011-02-10 | 2012-08-20 | 주식회사 프로텍 | Jig unit for testing led chip |
| CN203259626U (en) * | 2013-06-06 | 2013-10-30 | 歌尔声学股份有限公司 | General LED test clamp |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107192538A (en) * | 2017-06-29 | 2017-09-22 | 湖北申安亚明照明科技有限公司 | A kind of integrating sphere fixture |
| CN109623689A (en) * | 2018-10-31 | 2019-04-16 | 邵东智能制造技术研究院有限公司 | A kind of gum cover positioning device of tiger pliers |
| CN113996552A (en) * | 2021-10-25 | 2022-02-01 | 深圳市广达电子材料有限公司 | Electronic material electrical property detection equipment |
| CN113996552B (en) * | 2021-10-25 | 2024-01-12 | 浙江方圆电气设备检测有限公司 | Electronic material electrical property detection equipment |
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| Publication number | Publication date |
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| CN104034923B (en) | 2017-01-11 |
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