CN103995275A - 辐射探测器和医学诊断系统 - Google Patents
辐射探测器和医学诊断系统 Download PDFInfo
- Publication number
- CN103995275A CN103995275A CN201410047367.9A CN201410047367A CN103995275A CN 103995275 A CN103995275 A CN 103995275A CN 201410047367 A CN201410047367 A CN 201410047367A CN 103995275 A CN103995275 A CN 103995275A
- Authority
- CN
- China
- Prior art keywords
- detector
- radiation detector
- electrode
- voltage potential
- semiconductor layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000005855 radiation Effects 0.000 title claims abstract description 40
- 239000004065 semiconductor Substances 0.000 claims abstract description 39
- 230000005684 electric field Effects 0.000 claims abstract description 11
- 239000000523 sample Substances 0.000 claims description 3
- 238000001514 detection method Methods 0.000 abstract description 2
- 238000000034 method Methods 0.000 description 3
- 238000002603 single-photon emission computed tomography Methods 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 2
- 239000002800 charge carrier Substances 0.000 description 2
- 238000004590 computer program Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 2
- MARUHZGHZWCEQU-UHFFFAOYSA-N 5-phenyl-2h-tetrazole Chemical compound C1=CC=CC=C1C1=NNN=N1 MARUHZGHZWCEQU-UHFFFAOYSA-N 0.000 description 1
- QWUZMTJBRUASOW-UHFFFAOYSA-N cadmium tellanylidenezinc Chemical compound [Zn].[Cd].[Te] QWUZMTJBRUASOW-UHFFFAOYSA-N 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000003745 diagnosis Methods 0.000 description 1
- 230000005764 inhibitory process Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000001465 metallisation Methods 0.000 description 1
- 238000005316 response function Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 238000003325 tomography Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/085—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors the device being sensitive to very short wavelength, e.g. X-ray, Gamma-rays
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14665—Imagers using a photoconductor layer
- H01L27/14676—X-ray, gamma-ray or corpuscular radiation imagers
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Measurement Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Nuclear Medicine (AREA)
Abstract
Description
Claims (11)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102013202630.7A DE102013202630B4 (de) | 2013-02-19 | 2013-02-19 | Strahlungsdetektor und medizinisches Diagnosesystem |
DE102013202630.7 | 2013-02-19 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN103995275A true CN103995275A (zh) | 2014-08-20 |
CN103995275B CN103995275B (zh) | 2018-08-03 |
Family
ID=51263859
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201410047367.9A Active CN103995275B (zh) | 2013-02-19 | 2014-02-11 | 辐射探测器和医学诊断系统 |
Country Status (3)
Country | Link |
---|---|
US (1) | US9472704B2 (zh) |
CN (1) | CN103995275B (zh) |
DE (1) | DE102013202630B4 (zh) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102014204042A1 (de) * | 2014-03-05 | 2015-09-10 | Siemens Aktiengesellschaft | Verfahren zur Ansteuerung eines Röntgendetektors und zugehörige Steuereinheit |
WO2017085118A1 (en) | 2015-11-19 | 2017-05-26 | Koninklijke Philips N.V. | Method of pixel volume confinement |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6034373A (en) * | 1997-12-11 | 2000-03-07 | Imrad Imaging Systems Ltd. | Semiconductor radiation detector with reduced surface effects |
EP1788410A1 (en) * | 2005-11-17 | 2007-05-23 | Hitachi, Ltd. | Radiological imaging apparatus and transmission imaging method |
WO2010073189A1 (en) * | 2008-12-22 | 2010-07-01 | Koninklijke Philips Electronics N.V. | Radiation detector with improved charge collection and minimized leakage currents |
CN101858983A (zh) * | 2009-04-06 | 2010-10-13 | 皇家飞利浦电子股份有限公司 | 具有多个电极系统的辐射探测器 |
CN101918860A (zh) * | 2007-11-06 | 2010-12-15 | 皇家飞利浦电子股份有限公司 | 间接辐射检测器 |
Family Cites Families (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5237197A (en) * | 1989-06-26 | 1993-08-17 | University Of Hawaii | Integrated VLSI radiation/particle detector with biased pin diodes |
US6037595A (en) * | 1995-10-13 | 2000-03-14 | Digirad Corporation | Radiation detector with shielding electrode |
US5677539A (en) * | 1995-10-13 | 1997-10-14 | Digirad | Semiconductor radiation detector with enhanced charge collection |
US6169287B1 (en) * | 1997-03-10 | 2001-01-02 | William K. Warburton | X-ray detector method and apparatus for obtaining spatial, energy, and/or timing information using signals from neighboring electrodes in an electrode array |
US6011265A (en) * | 1997-10-22 | 2000-01-04 | European Organization For Nuclear Research | Radiation detector of very high performance |
US6621084B1 (en) * | 1998-09-24 | 2003-09-16 | Elgems Ltd. | Pixelated photon detector |
JP4127444B2 (ja) * | 1999-03-30 | 2008-07-30 | 富士フイルム株式会社 | 放射線固体検出器 |
DE112006001584T5 (de) * | 2005-06-16 | 2008-05-29 | Ii-Vi Inc. | Energie unterscheidendes Streuabbildungssystem |
US7453068B2 (en) * | 2005-07-06 | 2008-11-18 | Ge Medical Systems Israel, Ltd. | Method and apparatus of detecting ionizing radiation |
CA2541256A1 (en) * | 2006-02-22 | 2007-08-22 | Redlen Technologies Inc. | Shielding electrode for monolithic radiation detector |
US7977643B2 (en) * | 2008-01-14 | 2011-07-12 | Irving Weinberg | Radiation detector assembly, radiation detector, and method for radiation detection |
JP5185003B2 (ja) * | 2008-07-25 | 2013-04-17 | 浜松ホトニクス株式会社 | 放射線検出器 |
US20110233418A1 (en) * | 2008-12-05 | 2011-09-29 | Bae Systems Plc | Radiation detector |
EP2491425A2 (en) * | 2009-10-19 | 2012-08-29 | Brookhaven Science Associates LLC | 3d-trench electrode detectors |
US8405038B2 (en) * | 2009-12-30 | 2013-03-26 | General Electric Company | Systems and methods for providing a shared charge in pixelated image detectors |
DE102011108876B4 (de) * | 2011-07-28 | 2018-08-16 | Technische Universität Dresden | Direktwandelnder Röntgendetektor mit Strahlenschutz für die Elektronik |
CN103765244B (zh) * | 2011-08-30 | 2016-06-29 | 皇家飞利浦有限公司 | 光子计数探测器 |
JP6251683B2 (ja) * | 2011-11-09 | 2017-12-20 | コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. | 放射線検出装置、放射線検出方法、画像化システム |
US9000389B2 (en) * | 2011-11-22 | 2015-04-07 | General Electric Company | Radiation detectors and methods of fabricating radiation detectors |
US20130161523A1 (en) * | 2011-12-23 | 2013-06-27 | General Electric Company | Radiation detector with voltage-biased focus grid |
-
2013
- 2013-02-19 DE DE102013202630.7A patent/DE102013202630B4/de active Active
-
2014
- 2014-01-29 US US14/166,886 patent/US9472704B2/en active Active
- 2014-02-11 CN CN201410047367.9A patent/CN103995275B/zh active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6034373A (en) * | 1997-12-11 | 2000-03-07 | Imrad Imaging Systems Ltd. | Semiconductor radiation detector with reduced surface effects |
EP1788410A1 (en) * | 2005-11-17 | 2007-05-23 | Hitachi, Ltd. | Radiological imaging apparatus and transmission imaging method |
CN101918860A (zh) * | 2007-11-06 | 2010-12-15 | 皇家飞利浦电子股份有限公司 | 间接辐射检测器 |
WO2010073189A1 (en) * | 2008-12-22 | 2010-07-01 | Koninklijke Philips Electronics N.V. | Radiation detector with improved charge collection and minimized leakage currents |
CN101858983A (zh) * | 2009-04-06 | 2010-10-13 | 皇家飞利浦电子股份有限公司 | 具有多个电极系统的辐射探测器 |
Non-Patent Citations (1)
Title |
---|
陈峰 等: "几种常用辐射探测器对医用X射线防护监测适用性的讨论", 《中国辐射卫生》 * |
Also Published As
Publication number | Publication date |
---|---|
US9472704B2 (en) | 2016-10-18 |
CN103995275B (zh) | 2018-08-03 |
DE102013202630B4 (de) | 2017-07-06 |
US20140231944A1 (en) | 2014-08-21 |
DE102013202630A1 (de) | 2014-08-21 |
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TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20220125 Address after: Erlangen Patentee after: Siemens Healthineers AG Address before: Munich, Germany Patentee before: SIEMENS AG |
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TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20240902 Address after: German Phu F Haim Patentee after: Siemens Medical AG Country or region after: Germany Address before: Erlangen Patentee before: Siemens Healthineers AG Country or region before: Germany |