CN103955057B - A kind of relevance imaging system - Google Patents
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- CN103955057B CN103955057B CN201410125688.6A CN201410125688A CN103955057B CN 103955057 B CN103955057 B CN 103955057B CN 201410125688 A CN201410125688 A CN 201410125688A CN 103955057 B CN103955057 B CN 103955057B
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Abstract
The invention provides a kind of relevance imaging system, treat imaging object for utilizing thermal light source and carry out relevance imaging, comprise: thing arm light path, be wherein provided with first barrel of detector and object to be imaged, the total distribution of light intensity signal S in first barrel of detector sample contents arm light path after object to be imaged
m; First reference arm light path, is wherein provided with the reference detector device of the distribution of light intensity distributed intelligence of sampling first reference arm light path; Reference detector device comprises at least one reference detector unit, multiple reference detectors with spatial resolving power that each reference detector unit comprises time schedule controller and controlled by it, under time schedule controller controls, multiple reference detector can carry out exposing to sample successively.The present invention adopts multiple reference detector rapid alternation in chronological order, makes exposure frame per second can superposition, breaches the restriction of existing reference detector in sample rate, thus substantially increases sample rate, shorten imaging time.
Description
Technical field
The present invention relates to optical field imaging technology, particularly relate to a kind of relevance imaging system.
Background technology
Relevance imaging technology (also claim " ghost " imaging) is a kind of double velocity correlation characteristic based on thermo-optical field or Quantum Light Fields, to a kind of technology that object information is rebuild in non-localized.According to the difference of light field statistical property, relevance imaging have quantum imaging and thermo-optical relevance imaging point, but the two imaging results realized is consistent.Because thermal light source (such as sunshine) and our daily life are closely bound up, research direction trends towards the relevance imaging technology based on thermal light source.In recent years, relevance imaging technology based on thermal light source obtains fast development, be different from traditional lens imaging or camera technique, the relevance imaging technology of thermal light source has unique advantage, such as, can the imaging without lens, and not by the impact of atmospheric turbulence or other scattering medium, can still obtain object imaging clearly when atmospheric turbulence, cloud and mist block, this is that traditional classical imaging cannot be accomplished.Relevance imaging technology is in national defence, military affairs, remote sensing, and there is important potential using value in the field such as communication, biomedicine, is that conventional lenses imaging technique institute is irreplaceable.
The weak point of relevance imaging technology, be then that the data volume of reconstruction required for image is large, be about 10
4the magnitude of sampling, and current camera exposure frame per second is lower, be generally 60 frames per second, contradiction between the two becomes the bottleneck realizing real time correlation imaging.
Summary of the invention
An object of the present invention is to provide the relevance imaging system that a kind of sample rate is high, imaging time is fast.
The present invention's further object is to provide a kind of practical relevance imaging system.
Especially, the invention provides a kind of relevance imaging system, treat imaging object for utilizing thermal light source and carry out relevance imaging, comprising:
Thing arm light path, is provided with first barrel of detector and described object to be imaged in described thing arm light path, described first barrel of detector is for the total distribution of light intensity signal S in described thing arm light path of sampling after described object to be imaged
m, m represents sampling order;
First reference arm light path, is provided with the reference detector device of the distribution of light intensity distributed intelligence for described first reference arm light path of sampling in described first reference arm light path;
Wherein, described reference detector device comprises at least one reference detector unit, multiple reference detectors with spatial resolving power that reference detector unit described in each comprises time schedule controller and controlled by described time schedule controller; Wherein, under described time schedule controller controls, described multiple reference detector can carry out exposing to carry out described sampling successively.
Further, described in each, reference detector unit also comprises: beam splitting arrangement, and for separating multiple sub-reference path arranged side by side from described first reference arm light path, reference detector described in each is arranged in corresponding described sub-reference path.
Further, also comprise:
Second reference arm light path, is provided with second barrel of detector in described second reference arm light path, for total distribution of light intensity signal R of described second reference arm light path of sampling
m; With
Threshold value construction unit, for according to described total distribution of light intensity signal S
mwith total distribution of light intensity signal R
mratio signal T
m(S
m/ R
m) predetermined sampling number M
0mean value T
odetermine for described ratio signal T
mupper threshold value T
o +with lower threshold value T
o -, wherein, T
o +> T
o> T
o -;
Wherein, described reference detector device is arranged to only at described ratio signal T
mbe greater than described upper threshold value T
o +when or described ratio signal T
mbe less than described lower threshold value T
o -when carry out described sampling.
Further, described threshold value construction unit comprises:
First divider, for receiving the described total distribution of light intensity signal S from described first barrel of detector
mwith the described total distribution of light intensity signal R from described second barrel of detector
m, and produce described ratio signal T
m;
Totalizer, for described predetermined sampling number M
0described ratio signal T
madd up;
Second divider, for according to the accumulation result of described totalizer and described predetermined sampling number M
0obtain described mean value T
o; With
Discr., for according to described mean value T
ogenerate described upper threshold value T
o +with described lower threshold value T
o -, by described ratio signal T
mwith described upper threshold value T
o +with lower threshold value T
o -compare, and only at described ratio signal T
mbe greater than described upper threshold value T
o +time or described ratio signal T
mbe less than described lower threshold value T
o -time send an exposure trigger pip to described reference detector device, carry out described sampling to trigger described reference detector device.
Further, described threshold value construction unit also comprises:
Count comparator, for described ratio signal T
msampling number count, to obtain described ratio signal T
msampling order m, and by described sampling order m and described predetermined sampling number M
0compare;
Wherein, described predetermined sampling number M is not more than at described sampling order m
0when, from the described ratio signal T of described first divider
mbe admitted to described totalizer; Further, described sampling order m is greater than described predetermined sampling number M
0when, from the described ratio signal T of described first divider
mbe admitted to described Discr..
Further, at least one reference detector unit described comprises the first reference detector unit and the second reference detector unit;
Wherein, at described ratio signal T
mbe greater than described upper threshold value T
o +time, the reference detector that described exposure trigger pip triggers in described first reference detector unit exposes; At described ratio signal T
mbe less than described lower threshold value T
o -time, the reference detector that described exposure trigger pip triggers in described second reference detector unit exposes.
Further, described upper threshold value T
o +with described lower threshold value T
o -be set as T respectively
0 +=(1+ α) T
0and T
0 -=(1-α) T
0, wherein α is customized parameter and 0< α <1.
Further, the image matrix data of described first reference detector unit and described second reference detector unit sampling gained sends into different computer memory address A and computer memory address B respectively.
Further, when the image matrix data quantity that computer memory address A and computer memory address B receives is M, the image matrix data that both receive subtracted each other and carries out cumulative summation to subtracting each other result, carrying out image procossing to obtain rebuilding image to cumulative summed result by computer system.
Further, described multiple reference detector is arranged as the CCD(chargecoupleddevice with spatial resolving power, charge coupled cell) or CMOS(complementarymetaloxidesemiconductor, complementary metal oxide semiconductor (CMOS)) face array camera.
The preferred embodiments of the present invention are based on following design: by obtaining the intensity ratio of first barrel of detector and second barrel of detector, estimate distribution of light intensity fluctuation mean value, according to described Intensity Fluctuation mean value, set two Intensity thresholds, and corresponding with it two voltage thresholds, when higher than upper threshold value or lower than lower threshold value, trigger reference detector exposure sampling.
Instant invention overcomes the restriction that in traditional association formation method, reference detector sample rate is slow, adopt multiple reference detector rapid alternation in chronological order, make exposure frame per second can superposition, breach the restriction of existing reference detector in sample rate, thus substantially increase sample rate, shorten imaging time.
Invention increases the efficiency of sampling, one is that hits can greatly reduce, and two is do not re-use matrix correlation multiplying in prior art in calculating and use matrix plus and minus calculation, saves computing time.Both combinations, make the quasi real-time imaging that can realize second-time in theory, breach the restriction that existing device can not realize high-speed sampling and can not meet real time correlation imaging, relevance imaging is made to have qualitative leap on imaging time, the image of the relevance imaging obtained combines with specific image procossing mode, makes relevance imaging technology in image quality or imaging time all close to practical.
According to hereafter by reference to the accompanying drawings to the detailed description of the specific embodiment of the invention, those skilled in the art will understand above-mentioned and other objects, advantage and feature of the present invention more.
Accompanying drawing explanation
Hereinafter describe specific embodiments more of the present invention with reference to the accompanying drawings by way of example, and not by way of limitation in detail.Reference numeral identical in accompanying drawing denotes same or similar parts or part.In accompanying drawing:
Fig. 1 is the schematic structure arrangenent diagram of relevance imaging system according to an embodiment of the invention;
Fig. 2 is the schematic structure composition diagram of the first reference detector unit shown in Fig. 1;
Fig. 3 is the schematic structure composition diagram of the second reference detector unit shown in Fig. 1;
Fig. 4 is the schematic workflow diagram of relevance imaging system according to an embodiment of the invention.
Embodiment
Fig. 1 is the schematic structure arrangenent diagram of relevance imaging system according to an embodiment of the invention.Relevance imaging system in Fig. 1 can comprise thing arm light path OA, the first reference arm light path RA1 and the second reference arm light path RA2.First barrel of detector 45 and object to be imaged 3 can be had in thing arm light path OA.First barrel of detector 45 is for the total distribution of light intensity signal S in the described thing arm light path OA that samples after described object 3 to be imaged
m.In first reference arm light path RA1, there is reference detector device, for the distribution of light intensity distributed intelligence of the described first reference arm light path RA1 that samples.Reference detector device can have multiple reference detector unit.In the embodiment shown in fig. 1, reference detector device has the first reference detector unit 15 and the second reference detector unit 16.In other embodiments, reference detector device can also arrange more or less reference detector unit.Second reference arm light path RA2 has second barrel of detector 78 and threshold value construction unit.Second barrel of detector 78 is for total distribution of light intensity signal R of the described second reference arm light path RA2 that samples
m.Threshold value construction unit can comprise the first divider 9, count comparator 10, totalizer 11, second divider 12 and Discr. 13.
Contrast Fig. 1 and Fig. 4, the light that thermal light source 1 sends can be divided into 1:(N through non-polarizing beamsplitter 2
0-1) two light beams of light intensity ratio, N
0for being more than or equal to the natural number of 2.Wherein, the 1/N that separates of beam splitter 2
0light beam enters into thing arm light path OA, and through object 3 to be imaged.Can be through also can being pass through with reflected version with Transmissive versions through the light of object 3 to be imaged.Then collect the light through object 3 to be imaged with lens 4 and converged to point probe 5.Point probe 5 can be such as photodiode.Lens 4 and point probe 5 together constitute first barrel of detector 45.First barrel of detector 45 obtains total distribution of light intensity signal S of the light of object 3 to be imaged transmission or reflection
m, m represents sampling order.
The intensity separated by beam splitter 2 is (N
0-1)/N
0another light beam enter non-polarizing beamsplitter 6 and be divided into the equal two light beams of light intensity according to 1:1.A branch of light beam that beam splitter 6 separates enters into the second reference arm light path RA2, and is received by barrel detector of second wherein 78, obtains total distribution of light intensity signal R of the light beam entering the second reference arm light path RA2
m.Similarly, m represents sampling order.Here second barrel of detector 78 can be made up of lens 7 and point probe 8.
Another light beams that beam splitter 6 separates enters into the first reference arm light path RA1, and the distribution of light intensity distributed intelligence of this light path of being sampled by the reference detector device be arranged in the first reference arm light path RA1.In the embodiment shown in fig. 1, this reference detector device comprises the first reference detector unit 15 and the second reference detector unit 16 be arranged in parallel.For this reason, 1:1 beam splitter 14 can be set in this first reference arm light path RA1.The two-beam speed separated by beam splitter 14 enters the first reference detector unit 15 and the second reference detector unit 16 respectively through port one 4a and port one 4b.
First reference detector unit 15 and the second reference detector unit 16 is each forms by multiple reference detector, multiple reference detector can accelerate the speed obtaining image matrix data.Each reference detector all has spatial resolving power, it can be such as the camera of CCD, CMOS camera or other type any, as a citing, CCD can be EMCCD(electronicmultiplyingchargecoupleddevice, electron multiplying charge coupled apparatus).Multiple reference detector is CCD, CMOS face array camera, or the face array camera of other type any.In order to realize relevance imaging, the lens 7 in each reference detector of the first reference detector unit 15 and the second reference detector unit 16 inside and second barrel of detector 78 should be ensured, equal to the distance of thermal light source 1 with object 3 to be imaged.Second barrel of detector 78 1 aspect improves speed of detection, is used for selectivity trigger reference detector assembly on the other hand, reduces the exposure frequency of reference detector device.
By the total distribution of light intensity signal S from first barrel of detector 45
mwith the total distribution of light intensity signal R from second barrel of detector 78
minput divider 9, by the ratio signal T produced
m=S
m/ R
msend into count comparator 10 pending.Count comparator 10 is for correlative value signal T
msampling number m count, and by described sampling order m and predetermined sampling number M
0compare.Predetermined sampling number M
0count comparator 10 can be pre-deposited, simultaneously also stored in the second divider 12.M
0artificially can set, such as, can set M
0=500.As m≤M
0time, count comparator 10 allows ratio signal T
mtotalizer 11 is exported to from port one 0a.Totalizer 11 adds up M
0secondary, finally obtain accumulated value
this accumulated value is through pre-depositing predetermined sampling number M
0second divider 12 of value obtains mean value
namely
second divider 12 exports mean value T again
oto Discr. 13.Work as m>M
0time, count comparator 10 makes ratio signal T
mdirectly export Discr. 13 to by port one 0b.
The mean value T that Discr. 13 inputs according to the second divider 12
osetting dual threshold, wherein upper threshold value T
o +for T
0 +=(1+ α) T
0, lower threshold value T
o -for T
0 -=(1-α) T
0, 0< α <1.α is wherein customized parameter, and such as α can value be 0.25.When the port one 0b of count comparator 10 is every M
0secondary sampling constantly exports ratio signal T
mto Discr. 13, if Discr. 13 compares its value be greater than upper threshold voltage T
o +, i.e. T
m>T
o +, Discr. 13 exports trigger pip through port one 3a, triggers one of them reference detector exposure in the first reference detector unit 15.If Discr. 13 compares its value be less than threshold voltages, i.e. T
m<T
o -, Discr. 13 exports trigger pip through port one 3b, triggers one of them reference detector exposure in the second reference detector unit 16.The setting of two threshold values and triggering, make reference detector expose at every turn contained by contain much information, the image matrix data of acquisition is more efficient, thus improves the efficiency of sampling, reduces hits.The image matrix data of collection is exported to different computer memory address A and the computer memory address B of computing machine 17 by the reference detector of the first reference detector unit 15 and the second reference detector unit 16 inside respectively.Computer memory address A and computer memory address B can be register different in computing machine 17.The principle of work of the first reference detector unit 15 and the second reference detector unit 16 is hereafter describing in detail.
The image matrix data that computer memory address A and computer memory address B receives by computing machine 17, records matrix data quantity N respectively
+and N
-.By the process to imaging noise, the image quality of high s/n ratio, high-contrast can be obtained.Particularly, N is worked as
+=N
-time, inner for computer memory address A corresponding image matrix data is deducted the inner corresponding image matrix data of computer memory address B by computing machine 17, obtains new image matrix data, does cumulative summation.Above process can adopt graphic system GPU video card parallel computation accelerated reconstruction, also can adopt custom-designed ASIC circuit board.For the image matrix data obtained, computing machine 17 completes the normalization of data, enhancing and display translation simultaneously, now can obtain the reconstruction image of object 3 to be imaged.
Generally, in each reference detector unit 15 or 16 such as the beam splitting arrangement of various beam splitter separates multiple sub-reference path arranged side by side from the first reference arm light path, each reference detector is arranged in corresponding described sub-reference path.Particularly, contrast Fig. 2 and Fig. 3 to illustrate in the structural arrangement and workflow of the first reference detector unit 15 and the second reference detector unit 16:
As shown in Figure 2, in the first reference detector unit 15, from the light beam of port one 4a, press 1:N beam splitting through beam splitter BSa1, light beam 1/ (N+1) by port a1 to reference detector Da1.Another part light beam N/ (N+1), presses 1:(N-1 through beam splitter BSa2) beam splitting, export reference detector Da2 to by port a2.The rest may be inferred, until N light beams is divided into two bundles by 1:1 beam splitter BSan, wherein a light beam exports reference detector Dan to by an port, and another light beam enters reference detector Da (n+1).All reference detectors in first reference detector unit 15 control by the first time schedule controller, by Da1, Da2 ..., the order of Dan and Da (n+1) exposes successively, and capable of circulationly samples.In first reference detector unit 15, after each reference detector exposure, gained image matrix data all exports the first hub to, can by the unified computer memory address A inputing to computing machine 17 of USB transmission technology.By multiple reference detector rapid alternation in chronological order, make the exposure frame per second of reference detector can superposition, overcome the lower restriction causing sample rate slow of reference detector exposure frame per second.
As shown in Figure 3, in the second reference detector unit 16, from the light beam of port one 4b, press 1:N beam splitting through beam splitter BSb1, light beam 1/ (N+1) by port b1 to reference detector Db1.Another part light beam N/ (N+1), through beam splitter BSb1 by 1:(N-1) beam splitting exports reference detector Db2 to by port b2.The rest may be inferred, until N light beams is divided into two bundles by 1:1 beam splitter BSbn, exports reference detector Dbn to by port bn, and another part light beam enters reference detector Db (n+1).All reference detectors in second reference detector unit 16 are controlled by the second time schedule controller, by Db1, Db2 ..., Dbn and Db (n+1) order, expose successively, and capable of circulationly to sample.After each reference detector exposure in second reference detector unit 16, gained image matrix data all exports the second hub to, can by the unified computer memory address B inputing to computing machine 17 of USB transmission technology.In first reference detector unit 15 and the second reference detector unit 16, the setting of time schedule controller and multiple reference detector, substantially increases sampling rate.
Signal I will be obtained after the first reference detector unit 15 and the exposure of the second reference detector unit 16 of trigger exposure
r (m)(i, j) (i, j represent pixel coordinate).By signal I
r (m)(i, j) is stored in the corresponding computer memory address A and computer memory address B of computing machine 17.The limited memory of general computer memory, assuming that can realize at most M sampling.Computing machine counting M time, the image matrix data quantity making computer memory address A and computer memory address B corresponding is equal, image matrix data corresponding for computer memory address A is deducted image matrix data corresponding to computer memory address B, i.e. I
r (m+)(i, j)-I
r (m-)(i, j), I
r (m+)(i, j) is computer memory address A image matrix data, I
r (m-)(i, j) is the image matrix data in computer memory address B, can obtain the reconstructed image data of object 3 to be imaged like this.Calculate and subtract each other the cumulative of result, namely
by computer programming, also hardware implementing can be passed through.This step can utilize Graphics Processing Unit GPU video card parallel calculating method to accelerate.By computer system to result
carry out image procossing, as normalization, image enhaucament, gray-scale value equalization, mean filter etc., obtain rebuilding image Δ T
(1).If image quality can not meet the demands, then return and the internal memory of dump storage address A and computer memory address B, recalculate and obtain new reconstruction image Δ T
(2), rebuild image with the last time and carry out image addition and be averaging, be i.e. (Δ T
(1)+ Δ T
(2))/2.By this image noise reduction and iterative process, can guarantee to obtain the high reconstruction image of quality.
Be appreciated that in other embodiments, reference detector device also can only have an above-mentioned reference detector unit 15 or 16.In this case, Discr. 13 can according to T
m>T
o +or T
m<T
o -both of these case provides corresponding distinguishing signal to computing machine 17, and computing machine 17 can expose the image matrix data that obtains respectively stored in different computer memory address A or B according to this distinguishing signal with reference to detector cells 15 or 16.Now, the beam splitter 14 in Fig. 1 can also be omitted.
Being further appreciated that can not have the second reference arm light path RA2 in the relevance imaging method of other type, does not that is need in its algorithm to gather aforesaid total distribution of light intensity signal R
m.In this case, set in its first reference arm light path RA1 reference detector device still can adopt single or multiple reference detector unit of the present invention to sample.Now, the beam splitter 6 in Fig. 1 can also be omitted.In addition, the setting of two threshold values and triggering, make reference detector expose at every turn contained by contain much information, thus improve sampling efficiency, reduce hits, be an important content of the present invention.
Although embodiments of the invention only list the form that light source is thermal light source, relevance imaging system of the present invention be equally applicable to light field obey the natural light of thermo-optical statistical distribution or the imaging scheme of artificial counterfeit thermal light source and have between light source and reference detector, lensless imaging scheme.
Relevance imaging system of the present invention at least has following advantage:
1. the present invention may be used for all relevance imaging technology of upgrading, and particularly can utilize the true thermal light source of various classics or counterfeit thermal light source and improve the speed of relevance imaging based on the compute associations imaging technique of computing machine modulated beam of light space distribution.
2. instant invention overcomes the restriction that in traditional association formation method, reference detector sample rate is slow, adopt multiple reference detector rapid alternation in chronological order, make exposure frame per second can superposition, breach the restriction of existing reference detector in sample rate, thus substantially increase sample rate, shorten imaging time.
3. invention increases the efficiency of sampling.Hits can greatly reduce first; Two is do not re-use matrix correlation multiplying in calculating, and saves computing time; Both combinations, make the quasi real-time imaging that can realize second-time in theory, breach the restriction that existing device can not realize high-speed sampling and can not meet real time correlation imaging, relevance imaging is made to have qualitative leap on imaging time, the image of the relevance imaging obtained combines with specific image procossing mode, makes relevance imaging technology in image quality or imaging time all close to practical.
4. confirm through experiment, imaging signal to noise ratio (S/N ratio) of the present invention is high, and not by the impact of environment, antijamming capability is strong.
5. difference relevance imaging technology and normalization relevance imaging technology, in imaging signal to noise ratio (S/N ratio) compared with traditional association imaging, have the raising of the order of magnitude, therefore have very strong application, this imaging system limits without algorithm image size.The present invention integrates difference relevance imaging and normalization relevance imaging had superiority, and all advantages of time of having drawn corresponding difference relevance imaging, imaging signal to noise ratio (S/N ratio) has the raising of the order of magnitude relative to existing relevance imaging technology, particularly to the object Be very effective of multi-level gray scale, and algorithm is relatively simple, simultaneously insensitive to neighbourhood noise, antijamming capability is strong.
So far, those skilled in the art will recognize that, although multiple exemplary embodiment of the present invention is illustrate and described herein detailed, but, without departing from the spirit and scope of the present invention, still can directly determine or derive other modification many or amendment of meeting the principle of the invention according to content disclosed by the invention.Therefore, scope of the present invention should be understood and regard as and cover all these other modification or amendments.
Claims (9)
1. a relevance imaging system, treat imaging object (3) for utilizing thermal light source (1) and carry out relevance imaging, comprising:
Thing arm light path, be provided with first barrel of detector (45) and described object to be imaged (3) in described thing arm light path, described first barrel of detector (45) is for the total distribution of light intensity signal S in described thing arm light path of sampling after described object to be imaged (3)
m, m represents sampling order;
First reference arm light path, is provided with the reference detector device of the distribution of light intensity distributed intelligence for described first reference arm light path of sampling in described first reference arm light path; Wherein, described reference detector device comprises at least one reference detector unit (15,16), multiple reference detectors with spatial resolving power that reference detector unit described in each (15,16) comprises time schedule controller and controlled by described time schedule controller; Wherein, under described time schedule controller controls, described multiple reference detector can carry out exposing to carry out described sampling successively;
Second reference arm light path, is provided with second barrel of detector (78) in described second reference arm light path, for total distribution of light intensity signal R of described second reference arm light path of sampling
m; With
Threshold value construction unit, for according to described total distribution of light intensity signal S
mwith total distribution of light intensity signal R
mratio signal T
m(S
m/ R
m) predetermined sampling number M
0mean value T
odetermine for described ratio signal T
mupper threshold value T
o +with lower threshold value T
o -, wherein, T
o +> T
o> T
o -;
Wherein, described reference detector device is arranged to only at described ratio signal T
mbe greater than described upper threshold value T
o +when or described ratio signal T
mbe less than described lower threshold value T
o -when carry out described sampling.
2. relevance imaging system according to claim 1, wherein,
Described in each, reference detector unit also comprises: beam splitting arrangement, and for separating multiple sub-reference path arranged side by side from described first reference arm light path, reference detector described in each is arranged in corresponding described sub-reference path.
3. relevance imaging system according to claim 1, wherein, described threshold value construction unit comprises:
First divider (9), for receiving the described total distribution of light intensity signal S from described first barrel of detector
mwith the described total distribution of light intensity signal R from described second barrel of detector (78)
m, and produce described ratio signal T
m;
Totalizer (11), for described predetermined sampling number M
0described ratio signal T
madd up;
Second divider (12), for according to the accumulation result of described totalizer and described predetermined sampling number M
0obtain described mean value T
o; With
Discr. (13), for according to described mean value T
ogenerate described upper threshold value T
o +with described lower threshold value T
o -, by described ratio signal T
mwith described upper threshold value T
o +with lower threshold value T
o -compare, and only at described ratio signal T
mbe greater than described upper threshold value T
o +time or described ratio signal T
mbe less than described lower threshold value T
o -time send an exposure trigger pip to described reference detector device, carry out described sampling to trigger described reference detector device.
4. relevance imaging system according to claim 3, wherein, described threshold value construction unit also comprises:
Count comparator (10), for described ratio signal T
msampling number count, to obtain described ratio signal T
msampling order m, and by described sampling order m and described predetermined sampling number M
0compare;
Wherein, described predetermined sampling number M is not more than at described sampling order m
0when, from the described ratio signal T of described first divider (9)
mbe admitted to described totalizer (11); Further, described sampling order m is greater than described predetermined sampling number M
0when, from the described ratio signal T of described first divider (9)
mbe admitted to described Discr. (13).
5. the relevance imaging system according to claim 3 or 4, wherein,
Described at least one reference detector unit (15,16) comprises the first reference detector unit (15) and the second reference detector unit (16);
Wherein, at described ratio signal T
mbe greater than described upper threshold value T
o +time, the reference detector that described exposure trigger pip triggers in described first reference detector unit (15) exposes; At described ratio signal T
mbe less than described lower threshold value T
o -time, the reference detector that described exposure trigger pip triggers in described second reference detector unit (16) exposes.
6. the relevance imaging system according to any one of claim 3-4, wherein,
Described upper threshold value T
o +with described lower threshold value T
o -be set as T respectively
0 +=(1+ α) T
0and T
0 -=(1-α) T
0, wherein α is customized parameter and 0 < α < 1.
7. relevance imaging system according to claim 5, wherein,
The image matrix data of described first reference detector unit (15) and described second reference detector unit (16) sampling gained sends into different computer memory address A and computer memory address B respectively.
8. relevance imaging system according to claim 7, wherein,
When the image matrix data quantity that computer memory address A and computer memory address B receives is M, the image matrix data that both receive subtracted each other and carries out cumulative summation to subtracting each other result, carrying out image procossing to obtain rebuilding image to cumulative summed result by computer system.
9. relevance imaging system according to claim 1, wherein,
Described multiple reference detector is arranged as CCD or the CMOS face array camera with spatial resolving power.
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| CN104484879B (en) * | 2014-12-19 | 2017-05-17 | 南京理工大学 | Method for estimating number of optimal orders |
| CN107192684A (en) * | 2016-03-14 | 2017-09-22 | 热映光电股份有限公司 | Gas concentration arrangement for detecting and its method for detecting |
| CN106154284B (en) * | 2016-06-17 | 2017-11-14 | 北京航空航天大学 | A kind of monochromatic light arm relevance imaging method compensated to atmospheric turbulance |
| CN110308614B (en) * | 2018-03-20 | 2021-04-27 | 中国科学院物理研究所 | Method and apparatus for X-ray intensity correlated imaging |
| CN108469685B (en) * | 2018-05-17 | 2020-08-25 | 辽宁大学 | Super-resolution associated imaging system and imaging method |
| CN109814128B (en) * | 2019-01-23 | 2020-08-11 | 北京理工大学 | High-resolution rapid imaging system and method combining time flight and associated imaging |
| CN109859135B (en) * | 2019-01-31 | 2021-05-07 | 北京邮电大学 | Image enhancement processing method applied to associated imaging |
| CN109724534B (en) * | 2019-02-01 | 2020-05-05 | 吉林大学 | Threshold selection method and device for iterative correlation imaging |
| CN110285755B (en) * | 2019-07-10 | 2021-05-25 | 吉林大学 | Device and method for screening correlated imaging sampling data |
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