CN103954947B - A kind of fault detection method of T/R assembly debugging instrument - Google Patents
A kind of fault detection method of T/R assembly debugging instrument Download PDFInfo
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- CN103954947B CN103954947B CN201410210847.2A CN201410210847A CN103954947B CN 103954947 B CN103954947 B CN 103954947B CN 201410210847 A CN201410210847 A CN 201410210847A CN 103954947 B CN103954947 B CN 103954947B
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- assembly
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/02—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S13/00
- G01S7/40—Means for monitoring or calibrating
- G01S7/4004—Means for monitoring or calibrating of parts of a radar system
Abstract
The invention discloses a kind of T/R assembly debugging instrument fault detection method, it is provided with single-chip microcomputer, EEPROM within single-chip microcomputer, the internal operation data of T/R assembly debugging instrument and display data on the screen can be stored, can the data to T/R assembly debugging instrument power-off or when breaking down preserve, the data preserved can be called when carrying out fault detect, circuit is carried out AD sampling by single-chip microcomputer simultaneously, the data variation of electric current is detected by the moment, the judgement of data can be carried out at any time, analysis circuit fault, pinpoint the problems in time, advantageously in the safety of instrument and protection, this method adopts single-chip microcomputer that whole workflow is detected, breakdown judge is more comprehensive.
Description
Technical field
The invention belongs to T/R module testing technical field, be specifically related to a kind of T/R assembly debugging instrument fault detection method.
Background technology
T/R is the abbreviation of TransmitterandReceiver.Referring to the part between video and antenna in a wireless transceiver system under T/R assembly ordinary meaning, namely T/R assembly one terminates antenna, and in termination, video processing unit constitutes a wireless transceiver system.
Connectors for Active Phased Array Radar technology is the mainstream technology of current radar.Along with the development of science and technology, its core component T/R assembly is had higher requirement by we in volume and electrical property and reliability.T/R assembly is the core of Connectors for Active Phased Array Radar.In radar system, therefore in a radar, there are thousands of even up to ten thousand T/R assemblies.
T/R assembly is mainly made up of complicated circuit systems such as phase shifter and attenuator, solid state power amplifier, amplitude limiter and low-noise amplifier, circulator, wave filter, logic drive circuit, amplifier power supplies.Technically cover the aspect such as microwave circuit, digital control circuit.In large-scale Connectors for Active Phased Array Radar, the quantity of T/R assembly is thousands of, and its performance directly affects the performance indications of radar antenna.Therefore, according to the requirement that radar is overall, developing performance, volume, weight, reliability etc., to meet the T/R assembly of index request particularly critical.T/R assembly is when batch production, quantity is big, test index is many, to processing, data volume is big, component control signal is numerous and diverse, so the quality of T/R assembly needs specific detecting instrument and detects, when testing simultaneously, if T/R assembly itself is defective in quality, it is also possible to carry out suitable debugging by test instrunment.
nullThe power supply module that existing T/R assembly debugging instrument does not carry，And T/R assembly needs the offer of DC source，The debugging of existing T/R assembly is accomplished by extra voltage source and provides voltage for T/R assembly，Although existing T/R assembly debugging instrument is with fault detection capability，But it is all based on the voltage after input、Electric current detects，The electric power thus supplied of external voltage source cannot be detected，Also the position broken down cannot just be found accurately，Additionally，T/R assembly is when testing，Each branch road or contact point are likely to abnormal conditions，The voltage of test instrunment and assembly input/output port and circuit well can not be carried out fault detect and warning by existing T/R assembly debugging instrument，Once the abnormal concrete position telling user appearance abnormal that also cannot be clear and definite occurs，Abnormal conditions cannot be made correct adjustment or lookup by another user，It is unfavorable for the carrying out of T/R module testing，Also it is unfavorable for the abnormal conditions of T/R assembly itself are made a look up and corrected.
Summary of the invention
The technical problem to be solved is: for the defect of prior art, a kind of T/R assembly debugging instrument fault detection method is provided, it is provided with single-chip microcomputer, EEPROM within single-chip microcomputer, the internal operation data of T/R assembly debugging instrument and display data on the screen can be stored, can the data to T/R assembly debugging instrument power-off or when breaking down preserve, the data preserved can be called when carrying out fault detect, circuit is carried out AD sampling by single-chip microcomputer simultaneously, the data variation of electric current is detected by the moment, the judgement of data can be carried out at any time, analysis circuit fault, pinpoint the problems in time, advantageously in the safety of instrument and protection, this method adopts single-chip microcomputer that whole workflow is detected, breakdown judge is more comprehensive.
The present invention solves above-mentioned technical problem by the following technical solutions:
A kind of T/R assembly debugging instrument fault detection method, T/R assembly debugging instrument includes power module, one-chip computer module, LCDs, shell, shell is provided with name and is called assembly, three buttons of power amplifier and the machine, power module has three voltage output ends, T/R assembly respectively to be tested provides three road voltages, wherein two-way outfan is connected with single-chip microcomputer each through assembly button, another road outfan is connected with single-chip microcomputer by power amplifier button, single-chip microcomputer is connected with power module and LCDs respectively, assembly button, the enable of power amplifier button and the machine button is controlled by one-chip computer module, the voltage that power module produces carries out voltage output via Single-chip Controlling assembly button and power amplifier button, circuit between power module and MOS switch is carried out AD sampling by single-chip microcomputer；
After T/R assembly debugging instrument breaks down, can failure judgement through the following steps:
Step one: first the LCDs of its each input/output port and T/R assembly debugging instrument is carried out Initialize installation by single-chip microcomputer；
Step 2: single-chip microcomputer reads the sampled data when debugging instrument power-off or fault that store in the sample register of EEPROM, and these data is compared with setting the data of storage in depositor, it is judged that whether sampled data has exception；
Step 3: data have exception, then illustrate that power module circuitry has exception, data are normal, whether single-chip microcomputer decision circuitry can normal power supply, circuit can not normal power supply, illustrate when power module outlet circuit abnormality, power amplifier and assembly are not all powered, send to enable to the machine button and control, and judge that whether sample circuit is normal；
Step 4: after the machine button is pressed, it is judged that whether power amplifier button is pressed, power amplifier button is pressed, then being closed by power amplifier button, power amplifier button is not pressed, and sample circuit is normal, assembly button is enabled, and whether the input/output port electric current of determination component, power data be normal；
Step 5: the machine button and assembly button are pressed, and power amplifier button is enabled, it is judged that whether power amplifier is normal.
Further prioritization scheme as the present invention, described power module includes AC and turns DC module, it is external power supply that AC turns the input of DC module, described AC turns the outfan of DC module and is connected with single-chip microcomputer, AC is turned the outfan of DC module and carries out AD sampling by single-chip microcomputer, and detection AC turns the exception of the input terminal voltage of DC module.
As the further prioritization scheme of the present invention, described the method by the AD sampling of single-chip microcomputer discovery circuit undercurrent, cross stream, under-voltage, overvoltage time, circuit can be cut off, T/R assembly debugging instrument is carried out hardware protection.
As the further prioritization scheme of the present invention, being provided with power resistor in the circuit of described T/R assembly debugging instrument, single-chip microcomputer can measure the magnitude of voltage at sample rate current place according to the value of power resistor.
Further prioritization scheme as the present invention, the outfan of described power module is additionally provided with hardware alarms circuit, described hardware alarms circuit includes operational amplifier, comparator, NAND gate and alarm, two inputs and two AD sampled points of operational amplifier are connected, the outfan of operational amplifier is connected with the input of comparator, and comparator, NAND gate and alarm are sequentially connected.
Further prioritization scheme as the present invention, the current value of two described AD sampled point collections draws the magnitude of voltage of this point after operational amplifier, the magnitude of voltage of this point and AC turn the comparison voltage pre-entered in DC module and compare, comparative result after the judgement of NAND gate, triggered alarm.
The present invention adopts above technical scheme compared with prior art, has following technical effect that
The first, it is provided with single-chip microcomputer, EEPROM within single-chip microcomputer, the internal operation data of T/R assembly debugging instrument and display data on the screen can be stored, the data to T/R assembly debugging instrument power-off or when breaking down can preserve, the data preserved can be called when carrying out fault detect；
The second, the multiple points in circuit are carried out AD sampling by single-chip microcomputer, and the data variation of electric current is detected by the moment, can carry out the judgement of data, analysis circuit fault at any time, pinpoint the problems in time, advantageously in the safety of instrument and protection；
3rd, this method adopts single-chip microcomputer that whole workflow is detected, and carries out tight logic anticipation, and analysis circuit is abnormal, and breakdown judge is more comprehensive.
Accompanying drawing explanation
Fig. 1, the present invention workflow schematic diagram；
Fig. 2, the present invention electrical block diagram；
Fig. 3, the present invention warning circuit schematic diagram.
Detailed description of the invention
Below in conjunction with accompanying drawing, technical scheme is described in further detail:
Disclosure one T/R assembly debugging instrument fault detection method, as shown in Figure 2, T/R assembly debugging instrument includes power module, one-chip computer module, LCDs, shell, shell is provided with name and is called assembly, three buttons of power amplifier and the machine, power module has three outfans, T/R assembly respectively to be tested provides three road voltages, wherein two-way outfan is connected with single-chip microcomputer each through assembly button, another road outfan is connected with single-chip microcomputer by power amplifier button, single-chip microcomputer is connected with power module and LCDs respectively, assembly button, the enable of power amplifier button and the machine button is controlled by one-chip computer module, the voltage that power module produces carries out voltage output via Single-chip Controlling assembly button and power amplifier button, circuit between power module and MOS switch is carried out AD sampling by single-chip microcomputer.
Detection process within T/R assembly debugging instrument is as shown in Figure 1:
Step one: after plug-in, first the LCDs of its each input/output port and T/R assembly debugging instrument is carried out Initialize installation by single-chip microcomputer, empties the display content in LCDs.
Step 2: be provided with setting depositor inside single-chip microcomputer, electric current and voltage data during storage T/R assembly debugging instrument normal operation store, during proper testing, the curtage value that AD is sampled by single-chip microcomputer and the standard value setting depositor contrast, it is used for judging T/R assembly debugging instrument circuit whether normal operation, to find T/R assembly debugging instrument internal fault or exception at any time, when carrying out T/R module testing, once the fault that can not investigate occurs, when cannot proceed proper testing, time-out can be shut down use, now the electric current of each node of circuit when breaking down and magnitude of voltage are recorded and store by the EEPROM in single-chip microcomputer.
After its input/output port and LCDs are initialized by single-chip microcomputer, single-chip microcomputer reads the sampled data when T/R assembly debugging instrument power-off or fault that store in the sample register of EEPROM, and these data are compared with setting the data of storage in depositor, judge whether sampled data has exception, if sampled data is abnormal, then account for voltage module for power supply circuit goes wrong, and should search from power supply hardware circuit；
nullStep 3: data are normal，Whether single-chip microcomputer decision circuitry can normal power supply，If circuit normal power supply，When output voltage normally exports，Determine that power amplifier and assembly are not all powered，Single-chip microcomputer sends to enable to the machine button and controls，The machine button can be pressed，The machine button can be pressed，Illustrate that the power supply of whole circuit can normally export，Power circuit is in normal operating conditions，Then，Single-chip microcomputer judges that whether sample circuit is normal，If sample circuit is out of joint，So the electric current of the sampled signal that single-chip microcomputer receives and voltage data are not just electric current during side circuit work and magnitude of voltage，Thus cause that single-chip microcomputer decision circuitry occurs in that fault，Actually sample circuit goes wrong, and the sampled data that causes is wrong to be caused，Therefore need to judge that whether sample circuit normal，If sample circuit is abnormal，Need nonetheless remain for carrying out trouble shoot from hardware circuit；
Step 4: sample circuit is without exception, the machine button is pressed, T/R assembly debugging instrument has normal voltage to export, judge whether power amplifier button is pressed, if power amplifier button is pressed, power amplifier button should be closed, power amplifier button is not pressed, and sample circuit is normal, assembly button is enabled by single-chip microcomputer, voltage can be switched to the input port of the component voltage of correspondence, whether the data of the voltage output end mouth that the voltage and current value of the voltage output end mouth of assembly is all compared determination component with standard value are normal, if data exception, the circuit malfunctions of the output port of assembly is described, circuit problem lookup can be carried out for this problem；
Step 5: the machine button and assembly button are pressed, power amplifier button is enabled by single-chip microcomputer, power amplifier required voltage can be switched to the output port of power amplifier voltage, the magnitude of voltage of the output port of power amplifier voltage and standard value are compared by single-chip microcomputer, judge that whether power amplifier is normal, if magnitude of voltage has exception, then illustrate that the voltage follower circuit of power amplifier has fault, it is necessary to make a look up from hardware circuit.
Further prioritization scheme as the present invention, described power module includes AC and turns DC module, it is external power supply that AC turns the input of DC module, described AC turns the outfan of DC module and is connected with single-chip microcomputer, AC is turned the outfan of DC module and carries out AD sampling by single-chip microcomputer, and detection AC turns the exception of the input terminal voltage of DC module.
Further prioritization scheme as the present invention; described the method is sampled by the AD of single-chip microcomputer; single-chip microcomputer is after carrying out voltage, current data contrast; discovery circuit undercurrent, cross stream, under-voltage, overvoltage time; single-chip microcomputer can cut off the power supply of whole circuit, and T/R assembly debugging instrument is carried out hardware protection.
Further prioritization scheme as the present invention; the circuit of described T/R assembly debugging instrument is provided with power resistor; single-chip microcomputer can measure the magnitude of voltage at sample rate current place according to the value of power resistor; pre-set programs in single-chip microcomputer; the resistance that the current value of sampling place is multiplied by power resistor can draw the magnitude of voltage of this tested point; the electric circuit inspection of the present invention both can obtain real-time current value, it is possible to obtains real-time voltage value, can comprehensively whole circuit be protected.
Further prioritization scheme as the present invention, the outfan of described power module is additionally provided with hardware alarms circuit, as shown in Figure 3, described hardware alarms circuit includes operational amplifier, comparator, NAND gate and alarm, two inputs and two AD sampled points of operational amplifier are connected, the outfan of operational amplifier is connected with the input of comparator, and comparator, NAND gate and alarm are sequentially connected.
Further prioritization scheme as the present invention, the current value of two described AD sampled point collections draws the magnitude of voltage of this point after operational amplifier, the magnitude of voltage of this point and AC turn the comparison voltage pre-entered in DC module and compare, comparative result is after the judgement of NAND gate, when magnitude of voltage is excessive, triggered alarm.
Above in conjunction with accompanying drawing, embodiments of the present invention are explained in detail, but the present invention is not limited to above-mentioned embodiment, in the ken that those of ordinary skill in the art possess, it is also possible to make a variety of changes under the premise without departing from present inventive concept.
Above example is only the technological thought that the present invention is described, it is impossible to limit protection scope of the present invention with this.Every technological thought proposed according to the present invention, and any change done on technical scheme basis, each fall within scope.
Claims (4)
1. a T/R assembly debugging instrument fault detection method, it is characterized in that: T/R assembly debugging instrument includes power module, one-chip computer module, LCDs, shell, shell is provided with name and is called assembly, three buttons of power amplifier and the machine, power module has three outfans, wherein two-way outfan is connected with single-chip microcomputer each through assembly button, another road outfan is connected with single-chip microcomputer by power amplifier button, single-chip microcomputer is connected with power module and LCDs respectively, assembly button, the enable of power amplifier button and the machine button is controlled by one-chip computer module, the voltage that power module produces carries out voltage output via Single-chip Controlling assembly button and power amplifier button, circuit between power module and MOS switch is carried out AD sampling by single-chip microcomputer；
Described fault detection method comprises the steps:
Step one: first the LCDs of its each input/output port and T/R assembly debugging instrument is carried out Initialize installation by single-chip microcomputer, empties the display content in LCDs；
Step 2: single-chip microcomputer reads the sampled data when debugging instrument power-off or fault that store in the sample register of EEPROM, and these data is compared with setting the data of storage in depositor, it is judged that whether sampled data has exception；
Step 3: data have exception, then illustrate that power module circuitry has exception, data are normal, whether single-chip microcomputer decision circuitry can normal power supply, circuit can not normal power supply, power module outlet circuit abnormality is described, when circuit normal power supply and power amplifier and assembly are not all powered, send to enable to the machine button and control, and judge that whether sample circuit is normal；
Step 4: after the machine button is pressed, it is judged that whether power amplifier button is pressed, power amplifier button is pressed, then being closed by power amplifier button, power amplifier button is not pressed, and sample circuit is normal, assembly button is enabled, and whether the input/output port electric current of determination component, power data be normal；
Step 5: the machine button and assembly button are pressed, and power amplifier button is enabled, it is judged that whether power amplifier is normal.
2. a kind of T/R assembly debugging instrument fault detection method as claimed in claim 1, it is characterized in that: described power module includes AC and turns DC module, it is external power supply that AC turns the input of DC module, described AC turns the outfan of DC module and is connected with single-chip microcomputer, AC is turned the outfan of DC module and carries out AD sampling by single-chip microcomputer, and detection AC turns the exception of the input terminal voltage of DC module.
3. a kind of T/R assembly debugging instrument fault detection method as claimed in claim 1; it is characterized in that: described the method by the AD of single-chip microcomputer sampling discovery circuit undercurrent, cross stream, under-voltage, overvoltage time; circuit can be cut off, whole T/R assembly debugging instrument is carried out hardware protection.
4. a kind of T/R assembly debugging instrument fault detection method as claimed in claim 1, it is characterised in that: being provided with power resistor in the circuit of described T/R assembly debugging instrument, single-chip microcomputer can measure the magnitude of voltage at sample rate current place according to the value of power resistor.
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| CN201410210847.2A CN103954947B (en) | 2014-05-19 | 2014-05-19 | A kind of fault detection method of T/R assembly debugging instrument |
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| CN201410210847.2A CN103954947B (en) | 2014-05-19 | 2014-05-19 | A kind of fault detection method of T/R assembly debugging instrument |
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| CN103954947B true CN103954947B (en) | 2016-07-06 |
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| CN105425220B (en) * | 2015-11-05 | 2017-12-15 | 中国船舶重工集团公司第七二四研究所 | A kind of digital T/R components transmitting-receiving conversion and reception cloth phase Method Of Time Measurement |
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| GB2259778A (en) * | 1991-09-17 | 1993-03-24 | Cossor Electronics Ltd | Testing radar antenna systems |
| CN201025557Y (en) * | 2006-12-22 | 2008-02-20 | 杭申控股集团有限公司 | Digital communication multi-function power measurement instrument with protective control |
| EP2221924A2 (en) * | 2009-02-24 | 2010-08-25 | Raytheon Company | Asymmetrically thinned active array TR module and antenna architecture |
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