CN103954239A - Three-dimensional measurement system and method - Google Patents
Three-dimensional measurement system and method Download PDFInfo
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- CN103954239A CN103954239A CN201410201655.5A CN201410201655A CN103954239A CN 103954239 A CN103954239 A CN 103954239A CN 201410201655 A CN201410201655 A CN 201410201655A CN 103954239 A CN103954239 A CN 103954239A
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Abstract
The invention discloses a three-dimensional measurement system and method. The three-dimensional measurement system comprises a binocular camera and an optical grating interference projector, wherein the binocular camera is calibrated through a two-dimensional calibration target, external parameters of the space between cameras and internal parameters of each camera are obtained, and therefore necessary parameters are provided for three-dimensional reconstruction; the optical grating interference projector is used for projecting light and shadow to an optical grating to generate interference lines, and then light and shadow are projected to a tested object. Laser is used as a light source, the periodic interference lines are generated through the optical grating, compared with the prior method, higher optical subdivision is achieved, higher measurement precision is achieved, a corresponding phase unwrapping algorithm and a three-dimensional registration algorithm without characteristic points are researched for the periodic lines, and the measurement system is higher in measurement precision, and more convenient to use.
Description
Technical field
The present invention relates to three-dimensional measurement technology, be specifically related to a kind of three-dimension measuring system and method.
Background technology
Along with the fast development of modern military science and technology, weaponry is to precise treatment, precision, intelligent direction development.More accurate and the complex structure of weapon component, traditional measuring method is difficult to meet the needs of development gradually, and the photoelectric technology of take has been applied in actual research work as basic vision measuring method.
Vision measurement system derives from photogrammetric and stereovision technique at first, and along with the development of computer technology, photogrammetric technology and computer technology combine and produced vision measurement technology.Stereo-picture method or stereoscopic vision mensuration, the vision computer theory that late nineteen seventies Marr foundes has produced tremendous influence to the development of stereovision technique, subsequently, stereovision technique has obtained developing rapidly and obtained application in military equipment development field.
In current point of density vision measuring method conventionally based on phase outline art principle; existing system adopts digital raster optical projection system to produce striped; some is low for the precision of its striped; thereby limited the further raising of its measuring accuracy; responsive to measuring thing surfacing, thus need manually to arrange that monumented point completes the splicing of 3-D view simultaneously.
According to measuring principle, need only the precision of the grating fringe that carries elevation information higher than required measuring accuracy, it just may realize measuring accuracy up to standard.
At present by the three-dimensional measurement technology of military research practical application, be divided into two classes: contact type measurement and non-contact measurement.Contact generally adopts three coordinate measuring machine, is still at present typical standard 3-D measuring apparatus, but expensive, speed slowly, when particularly body form is complicated, gauge head path planning is difficult for realizing.Due to the rise and development of computer vision and this new branch of science of image detection, the research of the three-dimensional detection technique of object Shape ' is concentrated on to non-contacting optical three-dimensional measurement aspect in recent years, conventional is summarized as follows:
Dimensional visual measurement technology based on structured light is the most frequently used in non-contact 3-D measuring technique.It is that the photogrammetric and triangulation principle of a kind of foundation is basis, has not only utilized image as information carrier but also has utilized the measuring technique of controllable light source.
Along with scientific and technical fast development, in order to meet new needs, the military hardware research unit of developed country applies to vision measurement technology in actual R&D work, and has obtained good effect.More domestic R&D institutions and company have also carried out the research of related fields, and have developed the product of oneself, but are remaining in a certain distance aspect measuring accuracy, anti-interference and Image Mosaics.At present its major obstacle further developing is the fineness of the grating fringe of projection, the accuracy of phase place calculation method with and the aspect such as antijamming capability.
Summary of the invention
The present invention is directed to the problems referred to above, a kind of three-dimension measuring system and method are provided.
According to an aspect of the present invention, provide a kind of three-dimension measuring system, having comprised:
Binocular camera: its function is demarcated it for adopting two dimension to demarcate target, obtains parameter outside the space between camera and two cameras intrinsic parameter separately, thereby provides necessary parameter for three-dimensionalreconstruction;
Grating interference projection arrangement: be projeced into measured object in order to shadow is projected after producing interference fringe on grating;
Described grating interference projection arrangement comprises laser instrument, the first spectroscope, the second spectroscope, grating, two lens combination, the first prism, the second prism, the first catoptron and the second catoptrons that lens form; Laser instrument is divided into two-way by spectroscope, after grating, through two lens projects, interference after the first prism, the second prism forms interference fringe respectively, then project after the first catoptron, after reflection, project again the second catoptron, then after secondary reflection, project on tested parts.
According to another aspect of the invention, provide a kind of method for three-dimensional measurement, comprised the following steps:
S1, adopts two dimension to demarcate target scaling method binocular camera is demarcated;
S2, the use of grating interference projection arrangement;
S3, the processing of non-simple sinusoidal cycle fringe phase unwrapping algorithm;
S4, sets up stereoscopic vision collinearity equation, resolves D coordinates value;
S5, processes without the 3-D view splicing of unique point.
Further, described step S1 is specially: adopt the classical two dimension based on plane target drone to demarcate target scaling method binocular camera is demarcated, adopt circular point shape to substitute traditional angle point shape scaling board to improve stated accuracy, by many experiments, provide the calibrating parameters of statistics; Obtain parameter outside the space between camera and two cameras intrinsic parameter separately, thereby provide necessary parameter for three-dimensionalreconstruction; Binocular camera system adopts the physical construction of adjustable viewing field size, thereby make binocular camera reach best visual field, overlaps.
Further, described step S2 is specially: the light beam that described grating interference projection arrangement produces laser instrument has been divided into light wave frequently after spectroscope, then after the polarizer, projects respectively and on grating, produces high-precision optical fine; Described grating interference projection arrangement projects certain raster image to unit under test surface, and grating obtains the profile modulation of unit under test the raster image of phase shifts; In order to overcome the problem of the precision of ubiquitous nonopiate error in this two paths of signals, non-constant amplitude error and DC level drift error effect measurement result, the Heydemann model of take is done error correction as basis, the circuit compensation module of design core, these three kinds of errors are carried out to dynamic compensation, and then realize high precision micron order interference wave, produce nanoscale optical fine.
Further, described step S3 is specially: in order to reach higher measuring accuracy and to realize high PSRR, adopt grating interference projection arrangement to produce striped, this striped does not possess the characteristic of simple sinusoidal ripple, therefore in order to realize phase unwrapping, wrap up in function, adopt the multistage any period ripple unwrapping algorithm based on Fourier formula, solve the current problem that is subject to sinusoidal wave restriction, thereby resolve the phase place of image, and then realize the coupling between image.
Further, described step S5 is specially: for existing 3-D view joining method, exist by artificial target and the large problem of operand, adopt new three-dimensional picture stitching algorithm, this algorithm be take virtual mark point as original point, take direction vector as search key element, do not need traditional artificial subsides point, utilize the characteristics of image of 3-D view self, realize the non-contacting splicing of the 3-D view without unique point, the three-dimensional plot that formation completes, realize three-dimensionalreconstruction, improve speed and the accuracy of search.
Advantage of the present invention:
1,, in order to reach high-precision optical fine, designed new grating interference system.The light beam that this system produces laser instrument has been divided into light wave frequently after spectroscope, then respectively through projecting after the polarizer and producing high-precision optical fine on grating.In this two paths of signals, ubiquity nonopiate error, non-constant amplitude error and DC level drift error, and the existence of these errors has seriously affected the precision of measurement result.In order to overcome these errors, produce stable interference, proposed take Heydemann model as basic error correcting method, designed the circuit compensation module of core, these three kinds of errors have been carried out to dynamic compensation, and then realized high precision micron order interference wave, even can produce nanoscale optical fine.
2, the cycle striped producing for polarization laser interference system, has proposed new any period ripple unwrapping algorithm.The micron striped of polarization laser interference system output exists periodically, but has been different from traditional simple sinusoidal ripple completely, and the unwrapping algorithm in current phase outline art is all based on simple sinusoidal ripple, and the algorithm by multifrequency heterodyne obtains phase value.Yet in order to reach higher measuring accuracy and to realize high PSRR, adopt polarization laser interference system to produce striped, this striped does not possess the characteristic of simple sinusoidal ripple, therefore in order to realize same phase unwrapping, wrap up in function, multistage any period ripple unwrapping algorithm based on Fourier formula has been proposed, solved the current problem that is subject to sinusoidal wave restriction, this algorithm has wide applicability simultaneously.
3, for existing 3-D view joining method, exist by artificial target and the large problem of operand, new three-dimensional picture stitching algorithm has been proposed, this algorithm be take virtual mark point as original point, take direction vector as search key element, has effectively improved speed and the accuracy of search.This algorithm does not need traditional artificial subsides point, can realize non-contacting 3-D view splicing.
Except object described above, feature and advantage, the present invention also has other object, feature and advantage.Below with reference to figure, the present invention is further detailed explanation.
Accompanying drawing explanation
The accompanying drawing that forms the application's a part is used to provide a further understanding of the present invention, and schematic description and description of the present invention is used for explaining the present invention, does not form inappropriate limitation of the present invention.
Fig. 1 is a kind of three-dimension measuring system structural representation of the present invention;
Fig. 2 is grating interference projection arrangement structural representation of the present invention;
Fig. 3 is a kind of method for three-dimensional measurement process flow diagram of the present invention.
Embodiment
In order to make object of the present invention, technical scheme and advantage clearer, below in conjunction with drawings and Examples, the present invention is further elaborated.Should be appreciated that specific embodiment described herein, only in order to explain the present invention, is not intended to limit the present invention.
Embodiment 1:
With reference to figure 1, a kind of three-dimension measuring system as shown in Figure 1, comprising:
Binocular camera: its function is demarcated it for adopting two dimension to demarcate target, obtains parameter outside the space between camera and two cameras intrinsic parameter separately, thereby provides necessary parameter for three-dimensionalreconstruction;
Grating interference projection arrangement: be projeced into measured object in order to shadow is projected after producing interference fringe on grating;
Described grating interference projection arrangement comprises laser instrument, the first spectroscope, the second spectroscope, grating, two lens combination, the first prism, the second prism, the first catoptron and the second catoptrons that lens form; Laser instrument is divided into two-way by spectroscope, after grating, through two lens projects, interference after the first prism, the second prism forms interference fringe respectively, then project after the first catoptron, after reflection, project again the second catoptron, then after secondary reflection, project on tested parts.
Embodiment 2:
With reference to figure 2, a kind of method for three-dimensional measurement as shown in Figure 2, comprises the following steps:
S1, adopts two dimension to demarcate target scaling method binocular camera is demarcated;
S2, the use of grating interference projection arrangement;
S3, the processing of non-simple sinusoidal cycle fringe phase unwrapping algorithm;
S4, sets up stereoscopic vision collinearity equation, resolves D coordinates value;
S5, processes without the 3-D view splicing of unique point.
Described step S1 is specially: adopt the classical two dimension based on plane target drone to demarcate target scaling method binocular camera is demarcated, adopt circular point shape to substitute traditional angle point shape scaling board to improve stated accuracy, provide the calibrating parameters of statistics by many experiments; Obtain parameter outside the space between camera and two cameras intrinsic parameter separately, thereby provide necessary parameter for three-dimensionalreconstruction; Binocular camera system adopts the physical construction of adjustable viewing field size, thereby make binocular camera reach best visual field, overlaps.
Described step S2 is specially: the light beam that described grating interference projection arrangement produces laser instrument has been divided into light wave frequently after spectroscope, then after the polarizer, projects respectively and on grating, produces high-precision optical fine; Described grating interference projection arrangement projects certain raster image to unit under test surface, and grating obtains the profile modulation of unit under test the raster image of phase shifts; In order to overcome the problem of the precision of ubiquitous nonopiate error in this two paths of signals, non-constant amplitude error and DC level drift error effect measurement result, the Heydemann model of take is done error correction as basis, the circuit compensation module of design core, these three kinds of errors are carried out to dynamic compensation, and then realize high precision micron order interference wave, produce nanoscale optical fine.
Described step S3 is specially: in order to reach higher measuring accuracy and to realize high PSRR, adopt grating interference projection arrangement to produce striped, this striped does not possess the characteristic of simple sinusoidal ripple, therefore in order to realize phase unwrapping, wrap up in function, the multistage any period ripple unwrapping algorithm of employing based on Fourier formula, solve the current problem that is subject to sinusoidal wave restriction, thereby resolve the phase place of image, and then realize the coupling between image.
In actual applications; some parts do not allow to arrange artificial target; therefore need research without the 3-D view Bonding Problem of unique point; existing method is conventionally based on ICP algorithm; the method exists search speed slow; easily be absorbed in the problems such as local smallest point, need to adopt new three-dimensional picture stitching algorithm.
Described step S5 is specially: for existing 3-D view joining method, exist by artificial target and the large problem of operand, adopt new three-dimensional picture stitching algorithm, this algorithm be take virtual mark point as original point, take direction vector as search key element, do not need traditional artificial subsides point, utilize the characteristics of image of 3-D view self, realize the non-contacting splicing of the 3-D view without unique point, the three-dimensional plot that formation completes, realizes three-dimensionalreconstruction, improves speed and the accuracy of search.
The present invention has adopted laser as light source, by the generation of optical grating execution cycle property interference fringe, with respect to method in the past, it has higher optical fine, therefore there is the measuring accuracy that can reach higher, simultaneously also for this periodic stripe has studied that corresponding phase unwrapping is wrapped up in algorithm and without the three-dimensional splicing algorithm of unique point, thereby make this measuring system measuring accuracy higher, use convenient simultaneously.
The foregoing is only preferred embodiment of the present invention, in order to limit the present invention, within the spirit and principles in the present invention not all, any modification of doing, be equal to replacement, improvement etc., within all should being included in protection scope of the present invention.
Claims (6)
1. a three-dimension measuring system, is characterized in that, comprising:
Binocular camera: its function is demarcated it for adopting two dimension to demarcate target, obtains parameter outside the space between camera and two cameras intrinsic parameter separately, thereby provides necessary parameter for three-dimensionalreconstruction;
Grating interference projection arrangement: be projeced into measured object in order to shadow is projected after producing interference fringe on grating;
Described grating interference projection arrangement comprises laser instrument, the first spectroscope, the second spectroscope, grating, two lens combination, the first prism, the second prism, the first catoptron and the second catoptrons that lens form; Laser instrument is divided into two-way by spectroscope, after grating, through two lens projects, interference after the first prism, the second prism forms interference fringe respectively, then project after the first catoptron, after reflection, project again the second catoptron, then after secondary reflection, project on tested parts.
2. a method for three-dimensional measurement, is characterized in that, comprises the following steps:
S1, adopts two dimension to demarcate target scaling method binocular camera is demarcated;
S2, the use of grating interference projection arrangement;
S3, the processing of non-simple sinusoidal cycle fringe phase unwrapping algorithm;
S4, sets up stereoscopic vision collinearity equation, resolves D coordinates value;
S5, processes without the 3-D view splicing of unique point.
3. method for three-dimensional measurement according to claim 2, it is characterized in that, described step S1 is specially: adopt the classical two dimension based on plane target drone to demarcate target scaling method binocular camera is demarcated, adopt circular point shape to substitute traditional angle point shape scaling board to improve stated accuracy, by many experiments, provide the calibrating parameters of statistics; Obtain parameter outside the space between camera and two cameras intrinsic parameter separately, thereby provide necessary parameter for three-dimensionalreconstruction; Binocular camera system adopts the physical construction of adjustable viewing field size, thereby make binocular camera reach best visual field, overlaps.
4. method for three-dimensional measurement according to claim 2, it is characterized in that, described step S2 is specially: the light beam that described grating interference projection arrangement produces laser instrument has been divided into light wave frequently after spectroscope, then after the polarizer, projects respectively and on grating, produces high-precision optical fine; Described grating interference projection arrangement projects certain raster image to unit under test surface, and grating obtains the profile modulation of unit under test the raster image of phase shifts; In order to overcome the problem of the precision of ubiquitous nonopiate error in this two paths of signals, non-constant amplitude error and DC level drift error effect measurement result, the Heydemann model of take is done error correction as basis, the circuit compensation module of design core, these three kinds of errors are carried out to dynamic compensation, and then realize high precision micron order interference wave, produce nanoscale optical fine.
5. method for three-dimensional measurement according to claim 2, it is characterized in that, described step S3 is specially: in order to reach higher measuring accuracy and to realize high PSRR, adopt grating interference projection arrangement to produce striped, this striped does not possess the characteristic of simple sinusoidal ripple, therefore in order to realize phase unwrapping, wraps up in function, the multistage any period ripple unwrapping algorithm of employing based on Fourier formula, solve the current problem that is subject to sinusoidal wave restriction, thereby resolve the phase place of image, and then realize the coupling between image.
6. method for three-dimensional measurement according to claim 2, it is characterized in that, described step S5 is specially: for existing 3-D view joining method, exist by artificial target and the large problem of operand, adopt new three-dimensional picture stitching algorithm, this algorithm be take virtual mark point as original point, take direction vector as search key element, do not need traditional artificial subsides point, utilize the characteristics of image of 3-D view self, realize the non-contacting splicing of the 3-D view without unique point, the three-dimensional plot that formation completes, realizes three-dimensionalreconstruction, improves speed and the accuracy of search.
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106123807A (en) * | 2016-06-30 | 2016-11-16 | 苏州图锐智能科技有限公司 | A kind of product 3D detecting system and corresponding method of detection |
| CN108151671A (en) * | 2016-12-05 | 2018-06-12 | 杭州先临三维科技股份有限公司 | A kind of 3 D digital imaging sensor, 3 D scanning system and its scan method |
| CN109141506A (en) * | 2018-06-28 | 2019-01-04 | 深圳奥比中光科技有限公司 | Multi-functional calibration system |
| CN109506589A (en) * | 2018-12-25 | 2019-03-22 | 东南大学苏州医疗器械研究院 | A kind of measuring three-dimensional profile method based on light field imaging |
| CN110793464A (en) * | 2019-10-17 | 2020-02-14 | 天津大学 | Large-field-of-view fringe projection vision three-dimensional measurement system and method |
| CN117405044A (en) * | 2023-12-13 | 2024-01-16 | 华东交通大学 | Workpiece three-dimensional measurement method and system based on multi-frequency polarization stripe technology |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH1183454A (en) * | 1997-09-10 | 1999-03-26 | Citizen Watch Co Ltd | Three-dimensional shape measuring device using grid pattern projection method |
| JP2004325096A (en) * | 2003-04-22 | 2004-11-18 | Fujitsu Ltd | Image processing method in lattice pattern projective method, image processor and measurement device |
| CN101089551A (en) * | 2007-07-11 | 2007-12-19 | 华中科技大学 | 3D measuring method based on two-dimensional code |
| CN102519394A (en) * | 2011-11-18 | 2012-06-27 | 东南大学 | High-adaptability three-dimensional measuring method based on color structured light |
| CN103115586A (en) * | 2013-02-05 | 2013-05-22 | 华南理工大学 | Micro three-dimensional sensing device based on laser interference fringes |
| CN203824531U (en) * | 2014-05-08 | 2014-09-10 | 青岛三友智控科技有限公司 | Three-dimensional measuring system |
-
2014
- 2014-05-08 CN CN201410201655.5A patent/CN103954239A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH1183454A (en) * | 1997-09-10 | 1999-03-26 | Citizen Watch Co Ltd | Three-dimensional shape measuring device using grid pattern projection method |
| JP2004325096A (en) * | 2003-04-22 | 2004-11-18 | Fujitsu Ltd | Image processing method in lattice pattern projective method, image processor and measurement device |
| CN101089551A (en) * | 2007-07-11 | 2007-12-19 | 华中科技大学 | 3D measuring method based on two-dimensional code |
| CN102519394A (en) * | 2011-11-18 | 2012-06-27 | 东南大学 | High-adaptability three-dimensional measuring method based on color structured light |
| CN103115586A (en) * | 2013-02-05 | 2013-05-22 | 华南理工大学 | Micro three-dimensional sensing device based on laser interference fringes |
| CN203824531U (en) * | 2014-05-08 | 2014-09-10 | 青岛三友智控科技有限公司 | Three-dimensional measuring system |
Non-Patent Citations (5)
| Title |
|---|
| 叶海加等: "双目CCD结构光三维测量系统中的立体匹配", 《光学 精密工程》 * |
| 楚兴春等: "大量程纳米级光栅干涉位移测量", 《光电工程》 * |
| 陆佩忠等: "视频全局运动参数估计的研究与进展", 《模式识别与人工智能》 * |
| 齐永岳等: "提高激光干涉测量系统精度的方法与途径", 《提高激光干涉测量系统精度的方法与途径》 * |
| 齐永岳等: "高精度激光干涉条纹细分系统", 《传感器与微系统》 * |
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106123807A (en) * | 2016-06-30 | 2016-11-16 | 苏州图锐智能科技有限公司 | A kind of product 3D detecting system and corresponding method of detection |
| CN106123807B (en) * | 2016-06-30 | 2018-09-07 | 苏州图锐智能科技有限公司 | A kind of product 3D detecting systems and corresponding method of detection |
| CN108151671A (en) * | 2016-12-05 | 2018-06-12 | 杭州先临三维科技股份有限公司 | A kind of 3 D digital imaging sensor, 3 D scanning system and its scan method |
| CN108151671B (en) * | 2016-12-05 | 2019-10-25 | 先临三维科技股份有限公司 | A kind of 3 D digital imaging sensor, 3 D scanning system and its scan method |
| CN109141506A (en) * | 2018-06-28 | 2019-01-04 | 深圳奥比中光科技有限公司 | Multi-functional calibration system |
| CN109506589A (en) * | 2018-12-25 | 2019-03-22 | 东南大学苏州医疗器械研究院 | A kind of measuring three-dimensional profile method based on light field imaging |
| CN109506589B (en) * | 2018-12-25 | 2020-07-28 | 东南大学苏州医疗器械研究院 | Three-dimensional profile measuring method based on structural light field imaging |
| CN110793464A (en) * | 2019-10-17 | 2020-02-14 | 天津大学 | Large-field-of-view fringe projection vision three-dimensional measurement system and method |
| CN110793464B (en) * | 2019-10-17 | 2021-08-20 | 天津大学 | Large-field-of-view fringe projection vision three-dimensional measurement system and method |
| CN117405044A (en) * | 2023-12-13 | 2024-01-16 | 华东交通大学 | Workpiece three-dimensional measurement method and system based on multi-frequency polarization stripe technology |
| CN117405044B (en) * | 2023-12-13 | 2024-02-27 | 华东交通大学 | Workpiece three-dimensional measurement method and system based on multi-frequency polarization stripe technology |
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Application publication date: 20140730 |