CN103927967A

CN103927967A - Plasma display panel scanning method

Info

Publication number: CN103927967A
Application number: CN201410093876.5A
Authority: CN
Inventors: 符松; 周宇恒; 蔡静; 李雪荣
Original assignee: Sichuan COC Display Devices Co Ltd
Current assignee: Sichuan COC Display Devices Co Ltd
Priority date: 2014-03-14
Filing date: 2014-03-14
Publication date: 2014-07-16

Abstract

The invention provides a plasma display panel scanning method. The method includes the concrete steps that a frame is separated according to odd number chip areas and even number chip areas, the separated chip areas are scanned through a progressive scanning method and an interlaced scanning method respectively. Thus, the probability that because power consumption and temperature rise exceed the specifications, the frame turns into a special frame, and the display effect is affected can be greatly reduced.

Description

A kind of Plasmia indicating panel scan method

Technical field

The present invention relates to a kind of Plasmia indicating panel scan method, particularly relate to a kind of a kind of scan method of plasma panel in the situation that adopting interlacing, progressive scan mode all can not meet power consumption and temperature rise specification that be applicable to.

Background technology

Plasmia indicating panel, in the time of HF voltage guiding discharge, discharge gas produces vacuum ultraviolet, is between interlayer, to form light-emitting phosphor, and display frame.The advantage of plasma display panel device is that color rendition degree is high, and can be manufactured goes out large scale and high resolving power.

For the gray level of concrete manifestation image, by being divided into several subfields, a frame drives plasma display panel device, and each subfield has the different umber of pulses that maintains.Each subfield is divided into the preparatory stage for evenly producing electric discharge, for selecting the address period of discharge cell, for according to the demonstration phase that maintains of discharge count amount concrete manifestation gray level.

For example, in the time of 256 gray level display images, the frame period corresponding to 1/60 second (16.67ms) is divided into 8 subfields, selects corresponding subfield by input gray grade in address period, corresponding subfield maintenance phase electric discharge is lighted.

As shown in Figure 1, described plasma scope comprises, for the addressing electrode of executive address operation, for carrying out scanning and keeping the scan electrode of operation, the auxiliary electrode of auxiliary discharge.

In the time of scanning chip and the electric discharge of addressing chip controls, form different discharge order by different scan modes, can affect the temperature rise of power and the device of display panel.

Summary of the invention

The technical problem to be solved in the present invention is to provide a kind of PDP display at each row of routine and lines by line scan and cannot meet power consumption and the device temperature scan method requiring.

The technical solution used in the present invention is as follows: a kind of Plasmia indicating panel scan method, concrete grammar is: a frame picture is come according to odd chip region and even chip region disconnecting, the chip area of separating is adopted and lined by line scan and two kinds of different scan methods of staggered scanning.

As preferably, first lined by line scan in odd chip region, then dual numbers chip area carries out staggered scanning.

As preferably, first staggered scanning is carried out in odd chip region, then dual numbers chip area is lined by line scan.

As preferably, first dual numbers chip area is lined by line scan, then staggered scanning is carried out in odd chip region.

As preferably, first dual numbers chip area carries out staggered scanning, then is lined by line scan in odd chip region.

As preferably, described method also comprises, judges the described scan method that a frame picture is come according to odd chip region and even chip region disconnecting, whether can meet product power consumption and temperature rise specification requirement, be output scanning, otherwise adopt the mode that reduces electric discharge subfield to scan.

Compared with prior art, the invention has the beneficial effects as follows: can greatly reduce picture because of power consumption and temperature rise ultra-specification enter that special frame affects display effect may.

Brief description of the drawings

Fig. 1 is the composition schematic diagram of Plasmia indicating panel sparking electrode.

Fig. 2 is the zone of action schematic diagram of the each chip of plasm TV of eight scanning chips.

Fig. 3 is in eight subfield situations, the subfield figure of normal mode.

Fig. 4 is in eight subfield situations, the subfield figure under special pattern.Under this pattern, can affect image quality.

Fig. 5 is progressive scan mode schematic diagram.

Fig. 6 is interlace mode schematic diagram.

Fig. 7 only has in the situation of two scanning chip scanning 16 row, a subfield address period schematic diagram when frame picture separates scanning.N scanning chip scanning m market condition is similar.

Embodiment

In order to make object of the present invention, technical scheme and advantage clearer, below in conjunction with drawings and Examples, the present invention is further elaborated.Should be appreciated that specific embodiment described herein, only in order to explain the present invention, is not intended to limit the present invention.

Disclosed arbitrary feature in this instructions (comprising any accessory claim, summary and accompanying drawing), unless narration especially all can be replaced by other equivalences or the alternative features with similar object.,, unless narration especially, each feature is an example in a series of equivalences or similar characteristics.

Specific embodiment one

As shown in Figures 2 and 3, a kind of Plasmia indicating panel scan method, concrete grammar is: a frame picture is come according to odd chip region and even chip region disconnecting, the chip area of separating is adopted and lined by line scan and two kinds of different scan methods of staggered scanning.

First lined by line scan in odd chip region, then dual numbers chip area carries out staggered scanning.

Described method also comprises, judge the described scan method that a frame picture is come according to odd chip region and even chip region disconnecting, whether can meet product power consumption and temperature rise specification requirement, be output scanning, otherwise adopt the mode that reduces electric discharge subfield to scan.

The different power consumptions and the temperature rise that produce according to different scanning mode, in the prior art, all can not meet product specification requirement line by line time, select to separate scan mode with interlacing, can not meet the demands if separate scan mode, selects to enter special pattern.

As shown in Figure 4, so-called special pattern, refers to the scan mode (interlacing or progressive scan mode) that does not change picture, adopts the mode that reduces electric discharge subfield to reduce electric current and power consumption, as accompanying drawing 4, has only shown 6 subfields above.

Plasma display apparatus taking physical resolution as 1024*768 is example.Scanning chip one has 8, controls 96 row for every.When occurring that the addressing electric current of a width picture and power consumption are in the time adopting line by line situation about all exceeding standard with staggered scanning, one frame picture is come according to odd chip region and even chip region disconnecting, first odd chip region is adopted to the demonstration of lining by line scan, dual numbers chip area adopts staggered scanning to show again, and so far a frame picture disply is complete.Can greatly reduce like this probability that enters special frame because electric current is excessive.Be elaborated below.

First, introduce interlacing, progressive scan mode.

Be illustrated in figure 1 and line by line scan.In address period, scan electrode is pressed row 1,2,3 .... scan line by line; Every scanning a line, the IO mouth of addressing electrode is according to working as level of previous row content refresh.Addressing total current size is mainly determined by number of unit and the addressing IO mouth upset number of times of the selected electric discharge of address period.The selected discharge cell number of address period is more, and addressing total current will be larger; Addressing electrode IO mouth voltage is 57V, and IO upset energy consumption is high, so addressing voltage upset number of times can directly affect addressing total current size.To same picture, address discharge electric current is basically identical, but main electric current is produced by IO upset.Therefore select suitable scan mode very important.For example, to interlacing dot interlace signal, all data of its all adjacent lines are all just in time contrary, and it can cause every scanning a line, and all addressing electrode IO will carry out once inside out, and upset power consumption is very large.If this picture is changed to scan mode, as shown in Figure 3, pressing 1,2,3 .... the scanning sequency of row is revised as by 2,4,6 ... ..768,1,3 ... .767 capable staggered scanning order, addressing electrode IO only once overturning in the 768th line scanning to the 1 row, and upset number of times is few.And for a width picture, odd chip region is progressive signal, even chip region is interlace signal, adopts so to separate the scan mode number of times that will make to overturn and significantly reduce, and the overall current of display device and power also can significantly reduce.

8 chips are numbered 1 – 8 from top to bottom, as shown in Figure 2, by its by number odd even be divided into two groups.As shown in Figure 5, be numbered the chip of odd number, separate viewing area, adopts progressive scan mode; As shown in Figure 6, be numbered the chip of even number, separate viewing area, adopts interlace mode.On time, first the scanning of odd chip viewing area is shown, then the scanning of dual numbers chip viewing area shows.

On sweep waveform, a son similar accompanying drawing 7 of arrangement of every line scanning phase after the match.First to the row of lining by line scan from top to bottom, arrange successively sweep waveform.Line by line scan after end, then to interleaved row, according to first odd-numbered line even number line again, arrange sweep waveform.So far, waveform sweep time of a subfield of a frame picture arranges complete.

Specific embodiment two

Be with the difference of specific embodiment one, first staggered scanning carried out in odd chip region, then dual numbers chip area is lined by line scan.

Specific embodiment three

Be with the difference of specific embodiment one, first dual numbers chip area is lined by line scan, then staggered scanning is carried out in odd chip region.

Specific embodiment four

Be with the difference of specific embodiment one, first dual numbers chip area carries out staggered scanning, then is lined by line scan in odd chip region.

Claims

1. a Plasmia indicating panel scan method, concrete grammar is: a frame picture is come according to odd chip region and even chip region disconnecting, the chip area of separating is adopted and lined by line scan and two kinds of different scan methods of staggered scanning.

2. scan method according to claim 1, first lines by line scan to odd chip region, then dual numbers chip area carries out staggered scanning.

3. scan method according to claim 1, first carries out staggered scanning to odd chip region, then dual numbers chip area is lined by line scan.

4. scan method according to claim 1, first dual numbers chip area is lined by line scan, then staggered scanning is carried out in odd chip region.

5. scan method according to claim 1, first dual numbers chip area carries out staggered scanning, then is lined by line scan in odd chip region.

6. according to the scan method one of claim 1 to 5 Suo Shu, described method also comprises, judge the described scan method that a frame picture is come according to odd chip region and even chip region disconnecting, whether can meet product power consumption and temperature rise specification requirement, be output scanning, otherwise adopt the mode that reduces electric discharge subfield to scan.