CN103902421B - A kind of enterprise EDA design platform running environment basic property method of testing - Google Patents

A kind of enterprise EDA design platform running environment basic property method of testing Download PDF

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CN103902421B
CN103902421B CN201410124575.4A CN201410124575A CN103902421B CN 103902421 B CN103902421 B CN 103902421B CN 201410124575 A CN201410124575 A CN 201410124575A CN 103902421 B CN103902421 B CN 103902421B
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data
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CN103902421A (en
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徐君怡
江石根
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SUZHOU HUAXIN MICROELECTRONICS CO Ltd
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SUZHOU HUAXIN MICROELECTRONICS CO Ltd
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Abstract

The invention discloses a kind of enterprise EDA design platform running environment basic property method of testing, it comprises the steps: 1) the basic read operation of platform running environment and write operation two be to bandwidth test;2) design operation testing throughput;3) IC design typical case application simulation test.Present invention performance in terms of helping customer analysis from the angle of microcosmic and understand some feature of file system, and test result is short and sweet.

Description

A kind of enterprise EDA design platform running environment basic property method of testing
Technical field
The present invention relates to a kind of enterprise EDA design platform running environment basic property method of testing.
Background technology
At present, the method not having a standard individually for the performance test methods of EDA design platform system, general class Also it is concentrated mainly on reference test method like the method for testing for system application platform performance, i.e. takes formulation to meet necessarily The method of theoretical validation rule, instrument and system, thus the related performance indicators of a certain class testing object is quantitatively surveyed Examination and can contrast test.Wherein, benchmark test can be divided into three kinds: microcosmic test, macro-test and tracking reappear method.
Microcosmic test mainly for treating that examining system some or multiple concrete operating characteristics are tested, its test load Generally it is made up of different types of operation, and verifies file system feature in a certain respect or in terms of some with this.It is excellent Point is can be from the performance in terms of the angle of microcosmic helps customer analysis and understands some feature of file system, and test result is succinct Understand;But weak point is: easily cause test coverage low, and the microcosmic on independent hardware is tested reflected performance and is difficult to Weigh the real work performance of total system comprehensively.
Macro-test is to treat that the real work load of examining system is treated the combination property of examining system and commented by simulation Estimate.It uses closing to reality load request as far as possible to carry out treating the Behavior modeling that examining system is applied.Its advantage is can be from similar reality The angle of load simulates the current demand of typicality;The most this method equally exist such as type single, load deviation, join Put the problems such as dumb.
Following the tracks of reproduction rule is by gathering the System Operation Log record to be measured under actual loading, and according to the lattice set Formula record is being followed the tracks of in file, then when test according to the track record followed the tracks of in file collected again to system to be measured System proposes read-write requests, and the true application behavior thus treating examining system carries out Performance Evaluation.
Summary of the invention
It is an object of the invention to provide a kind of enterprise EDA design platform running environment basic property method of testing, be used for Performance in terms of the angle of microcosmic helps customer analysis and understands some feature of file system, and test result is short and sweet.
For achieving the above object, present invention employs following technical scheme:
A kind of enterprise EDA design platform running environment basic property method of testing, it comprises the steps:
1) the basic read operation of platform running environment and write operation two are to bandwidth test, i.e. by can during board design The virtual scene of the multiple data-interfaces operation that can occur is tested;
2) design operation testing throughput, i.e. by the cross-circulation mode of operation number to EDA design platform running environment Test according to file operation handling capacity;
3) IC design typical case application simulation test, is i.e. tested by the structure extendible load module of multithreading Effective application performance of this platform running environment under enterprise practical IC design working condition.
Step 1) in read operation and write operation type be divided into:
Read operation: sequentially, at random, inverted order, jump, internal memory map;
Write operation: sequentially, at random, cover, internal memory map;
Read-write married operation;
Described order read operation is divided into: reads, read again, and " reading " is to read data file by order to carry out test performance, " reading again " It is to read data in file by secondary to carry out test performance;
The operation of described random write is to carry out test performance by random write file somewhere reference point of fetching data;
Described inverted order read operation is to read data file by inverted order to carry out test performance;
Described jump read operation is to read each reference point of data file by fixed interval jump to carry out test performance;
It is to read data file by internal memory mapping mechanism to carry out test performance that described internal memory maps read operation;
The operation of described sequential write is divided into: writing, rewrite, " writing " is to carry out test performance by sequential write data file, " rewriting " It is to carry out test performance by secondary write with data in file;
Described random writing operations is to carry out test performance by random writing data with existing file somewhere reference point data;
Described covering write operation is to carry out test performance by write with same position data in file;
It is to carry out test performance by internal memory mapping mechanism write data file that described internal memory maps write operation;
Described read-write married operation is by data file reads and writes random mixed size (Fn) equal to literary composition Minimum (the F of part amount of capacitymin), then stop test samsara, clear all test data file.
Preferably, described step 2) in include successively:
(f) configuration testing parameter;
G () service data files in batch generates operation, start test, record test time started (Tstart), and according to joining The concurrent quantity of documents put and file mean size parameter, sequential batch creates file, records random cross-circulation test behaviour Make time started (tstart);
H () runs random cross-circulation test operation, with configuration all types of design operation proportions as foundation, intersect at random Run different design operations;Its concrete operation step includes:
1. judge whether to need to run to read/add operation, if without running, turning to step 2., if operation need to be run Then generate certain random value according to read/write operation ratio, then judge this time to circulate the need of operation with this random value Read operation, the most then perform a read operation, otherwise, then perform once to add operation;
2. judge whether to need to run generation/clear operation, if without running, turning to step 3., if behaviour need to be run Whether make then to generate certain random value according to generation/clear operation ratio, then judging this time to circulate with this random value needs Run generation operation, the most then perform once to generate operation, otherwise, then perform a clear operation;
3. the number of run of design operation is accumulated once, it is judged that whether design operation number of run reaches initially to set Be worth, the most then the random cross-circulation operational phase designed terminates, and starts the batch delete step of test data file;Otherwise Turn to step 1..
I () runs batch documents clear operation, record random cross-circulation test operation end time (tend), then criticize Amount is removed all residue test data files and records test end time (Tend);
J () adds up every testing throughput index.
Particularly preferably, described handling capacity includes handle up total amount, in batches handling capacity and handling capacity of intersecting;Wherein, always handle up Amount includes that total amount is handled up in design and Generating Data File/removings is handled up total amount, and design total amount of handling up refers to operation in the unit interval Design operation number of times, design operation number of run (DAS) and the design operation elapsed time (t that i.e. user performsexpend) ratio Value, and design operation elapsed time (texpend) it is random cross-circulation test operation end time (tend) and random cross-circulation Test operation time started (tstart) difference, file generated/removing is handled up the file that total amount refers to generate/remove in the unit interval Total quantity (the F of data file generated in total quantity, i.e. test processbuild) and test cumulative time (Texpend) ratio, and Test cumulative time (Texpend) for testing end time (Tend) and test time started (Tstart) difference.
Handling capacity is made up of data file Mass production handling capacity, data file batch removing handling capacity in batches, wherein criticizes Amount generates handling capacity and refers to the data file quantity of Mass production, the concurrent quantity of documents i.e. configured in the unit interval (fbatch-build) and Mass production process cumulative time (talter1) ratio, and Mass production process cumulative time (talter1) it is Random cross-circulation test operation time started (tstart) and test time started (Tstart) difference;Batch removes handling capacity The data file quantity removed in batches in referring to the unit interval, the data file quantity that i.e. the files in batch removing stage is removed (fbatch-del) and batch reset procedure cumulative time (talter2) ratio, and batch reset procedure cumulative time (talter2) it is Test end time (Tend) and random cross-circulation test operation end time (tend) difference.
Read operation handling capacity when handling capacity of intersecting includes design operation crossing operation, testability when adding file operation Energy.
Preferably, described step 1) in include successively:
A () chooses test reference point, the generation rule of the data-interface running that statistical basis environment is real-time, builds test ginseng The I/O operation model of examination point;
B () configuration testing data file, with file size size (Fn), data block size (Bn) it is foundation, point all kinds of numbers of row According to file, and make the maximum (B of data block sizemax) less than or equal to the minimum (F of file size sizemin);
(c) initialization data, the generation of test file content, the selection of reference mode and generation and data to be written Distinguish and generate;
D () is run and is added up one and take turns testing process, start/stop test monitoring, according to each file size taking turns test Corresponding test operation, then record the read-write data volume in the statistical unit time, corresponding document is performed with data block size Size and data block size;
E () independently multiplication is gone forward one by one flow process, the generation of test file content, the selection of reference mode and generation and to be written The differentiation of data and generation, wherein:
If data block size (Bn) less than the maximum (B of data block sizemax), keep test data file capacity constant, And data block size (Bn) double, rebound step (d) starts next round test;
If data block size (Bn) less than the maximum (B of data block sizemax), file size size (Fn) hold less than file Minimum (the F of amount sizemin), then file size size (Fn) double, data block size (Bn) reset to the pole of data block size Little value (Bmin), rebound step (d) starts next round test;
If data block size (Bn) equal to the maximum (B of data block sizemax), file size handling capacity, generation file gulp down The amount of telling and removing file handling capacity, the file that wherein read operation handling capacity referred to during design operation crossing operation in the unit interval is read Take number of times, test process is i.e. read the number of times (f of fileread) and design operation elapsed time (texpend) ratio;Add file In handling capacity refers to the unit interval, file adds the number of times (f of written document in number of times, i.e. test processappend) disappear with design operation Time-consuming (texpend) ratio;Generate file handling capacity and refer in the unit interval in file generated number, i.e. test operating procedure Generating Data File sum (Fbuild) and the concurrent quantity of documents (f of configurationbatch-build) difference and design operation elapsed time (texpend) ratio;Remove file in file handling capacity refers to the unit interval and remove the file in number, i.e. test operating procedure Remove sum (frid) remove the data file quantity (f that removed of stage with files in batchbatch-del) difference disappear with design operation Time-consuming (texpend) ratio.
Preferably, described step 3) in include successively:
The load properties analysis of (k) IC design typical case application;
(I) initial simulation contact surface is formulated;
M () initial testing parameter is selected;
N () initial testing load is selected;
O () testing results flow process, monitors real-time testing process, Multi-thread synchronization controls and records the information of test operation.
Preferably, in step (o), testing results flow process includes:
(I) main thread test is run, and according to putting down under the initial circuit map file quantity specified, single project folder All circuit quantity and average circuit size allocation for test original document collection;
(II) testing results monitoring, opens multiple test emulation threads according to the concurrent thread number initially specified, and imitates EDA design platform server is simultaneously and concurrently accessed and the situation of circuit simulation by multiple terminals;
(III) multiple circuit simulation threads concurrently perform the operation set in simulation contact surface, are respectively removing history and imitate True wave file, run post-simulation process, generate simulation waveform file, read post-simulation wave file, to simulation document add Later stage emulates content, continuously performs the post-simulation operation of set point number;
(IV) while (III) step is carried out, all circuit simulation threads are monitored by main thread, until all of Emulation thread end of run.
Compared with prior art, the beneficial effects of the present invention is:
1. microcosmic is tested, extend the acquisition range of conventional readwrite tests reference point, significant increase test Efficient Coverage Rate.
2. simulation is treated to the test of examining system design operation handling capacity, formulated multi-level load configuration parameter, and Recycling cross mode of operation is taked to come the operation behavior in simulating reality application, significant increase test load and test result Referential and verity.
3., for the simulation test of typical case's application, take and simulate based on multithreading extensible load module building mode Treat the daily real work load of examining system, it is ensured that test process loads comparability and the extensibility of selection.
Accompanying drawing explanation
Fig. 1 is design operation in enterprise EDA design platform running environment basic property method of testing in the embodiment of the present invention The flow chart of testing throughput;
Fig. 2 is the flow chart of IC design typical case application simulation test in Fig. 1 embodiment;
Fig. 3 is the flow chart of multiple test post-simulation threads in Fig. 1 embodiment.
Detailed description of the invention
Below in conjunction with a preferred embodiment, technical scheme is further described.
A kind of enterprise EDA design platform running environment basic property method of testing involved by the preferred embodiment, its bag Include following steps:
1) the basic read operation of platform running environment and write operation two are to bandwidth test, i.e. by can during board design The virtual scene of the multiple data-interfaces operation that can occur is tested;
2) design operation testing throughput, i.e. by the cross-circulation mode of operation number to EDA design platform running environment Test according to file operation handling capacity;
3) IC design typical case application simulation test, is i.e. tested by the structure extendible load module of multithreading Effective application performance of this platform running environment under enterprise practical IC design working condition.
Described step 1) in include successively:
A () chooses test reference point, the generation rule that the data-interface needing statistical basis environment real-time operates, and contains reading Operation and write operation position select, the presence or absence of operation data, and thus build the I/O operation model of test reference point;This Bright choose read operation (sequentially, at random, inverted order, jump, internal memory map), write operation (sequentially, at random, cover, internal memory map), with And read-write married operation three class Access Model treats the read-write operation performance of examining system and tests;And thus devise 12 Test reference point tests the readwrite performance of EDA design platform running environment from different angles;As shown in table 1:
Table 1
As shown in table 1, read operation and write operation type are divided into:
Read operation: sequentially, at random, inverted order, jump, internal memory map;
Write operation: sequentially, at random, cover, internal memory map;
Read-write married operation;
Sequentially read operation is divided into: reads, read again, and " reading " is to read data file by order to carry out test performance, and " reading again " is logical Cross data in secondary reading file and carry out test performance;Random write operation is to be surveyed by random write file somewhere reference point of fetching data Examination performance;Inverted order read operation is to read data file by inverted order to carry out test performance;Jump read operation is to be jumped by fixed interval Read each reference point of data file and carry out test performance;It is to read data file by internal memory mapping mechanism to come that internal memory maps read operation Test performance;
Sequential write operation is divided into: writing, rewrite, " writing " is to carry out test performance by sequential write data file, and " rewriting " is logical Cross secondary write and carry out test performance with data in file;Random writing operations is by random writing data with existing file somewhere reference Point data carrys out test performance;Covering write operation is to carry out test performance by write with same position data in file;Internal memory maps Write operation is to carry out test performance by internal memory mapping mechanism write data file;Read-write married operation is by entering data file Test performance when row reads and writes random married operation.
B () configuration testing data file, before test run, needs nominative testing data file amount of capacity FnUpper Lower limit and data block size BnBound, wherein maximum B of data block sizemaxLess than or equal to file size size Minimum Fmin;The process of test then independently doubles according to the bound of set file size and data block size and passs Enter test, in order to reflect the file size of change and data block size for the impact of readwrite performance;
C () initialization data, completes data initialization according to the test file size of epicycle test, generates test file (including the generation of test file content, the selection of reference mode and generation and the differentiation of data to be written and generation);
D () is run and is added up one and take turns testing process, including starting/stop test monitoring, according to each file taking turns test Size and data block size perform corresponding test operation, then record the read-write data volume in the statistical unit time, corresponding File size and data block size;
E () independently multiplication is gone forward one by one flow process, the generation of test file content, the selection of reference mode and generation and to be written The differentiation of data and generation, wherein:
If data block size BnMaximum B less than data block sizemax, keep test data file capacity constant, and count According to block size BnDouble, rebound step (d) starts next round test;
If data block size BnMaximum B less than data block sizemax, file size size FnLess than file size size Minimum Fmin, then file size size FnDouble, data block size BnReset to minimum B of data block sizemin, rebound Step (d) starts next round test;
If data block size BnMaximum B equal to data block sizemax, file size size FnEqual to file size size Minimum Fmin, then stop test samsara, clear all test data file.
Described step 2) in include successively:
F () configuration testing parameter, such as table 2;
Configuration parameter title Briefly describe
Fmax, Fmin The maximum of file size size and minimum
Fa The number of test data file set
Da Subdirectory number
Bnr The data block size of read operation
Bnw The data block size of write operation
Read/add Read/add the mixed proportion of operation
Generate/remove The mixed proportion of generation/clear operation
Dr Design operation number of times
Table 2
G () service data files in batch generates operation, start test, record test time started Tstart, and according to configuration Concurrent quantity of documents and file mean size parameter, sequential batch create file, record random cross-circulation test operation Time started tstart
H () runs random cross-circulation test operation, this stage with configuration all types of design operation proportions as foundation, with The design operation that machine crossing operation is different;In single design operation circulates, as it is shown in figure 1, concrete steps include;
1. judge whether to need to run to read/add operation, if without running, turning to step 2., if operation need to be run Then generate certain random value according to read/write operation ratio, then judge this time to circulate the need of operation with this random value Read operation, the most then perform a read operation, otherwise, then perform once to add operation;
2. judge whether to need to run generation/clear operation, if without running, turning to step 3., if behaviour need to be run Whether make then to generate certain random value according to generation/clear operation ratio, then judging this time to circulate with this random value needs Run generation operation, the most then perform once to generate operation, otherwise, then perform a clear operation;
3. the number of run of design operation is accumulated once, it is judged that whether design operation number of run reaches initially to set Be worth, the most then the random cross-circulation operational phase designed terminates, and starts the batch delete step of test data file;Otherwise Turn to step 1..
I () runs batch documents clear operation, record random cross-circulation test operation end time (tend), then criticize Amount is removed all residue test data files and records test end time (Tend);
J () adds up every testing throughput index, the control point of test process is divided into four: test time started Tstart、 Test end time Tend, random cross-circulation test operation time started tstart, the random cross-circulation test operation end time tend
Test process also needs real time record and the quantity of more newly-generated data file, the quantity of the file that clears data, number According to reading times, the write number of times etc. of data file of file, then after test terminates, complete test according to above-mentioned data and refer to Target inductive statistics;The test index of design operation testing throughput is as shown in table 3:
During design operation crossing operation, the file reading times in the unit interval, i.e. reads the number of times of file in test process freadWith design operation elapsed time texpendRatio;Add file in file handling capacity refers to the unit interval and add number of times, i.e. The number of times f of written document in test processappendWith design operation elapsed time texpendRatio;Generate file handling capacity and refer to list Generating Data File sum F in file generated number in bit time, i.e. test operating procedurebuildConcurrent number of files with configuration Amount fbatch-buildDifference and design operation elapsed time texpendRatio;Remove file handling capacity and refer to file in the unit interval Remove the file in number, i.e. test operating procedure and remove sum fridThe data file removed with the files in batch removing stage Quantity fbatch-delDifference and design operation elapsed time texpendRatio.
Described step 3) in include successively:
The load properties analysis of (k) IC design typical case application;
In IC design, circuit diagram spectre post-simulation is extremely common a kind of system application, and Main Function is For user design circuit diagram carry out functionally with the analog simulation in performance so that designer can pass through computer virtual The mode changed realizes the checking for existing product circuit design achievement and the comparison with early stage design object;Circuit diagram Spectre post-simulation is generally of following features: simulation process length, simulation process generation data volume is big, processor occupancy is high Deng;
(I) initial simulation contact surface is formulated;
Including performed by the emulation thread type formulated in simulation test scene, emulation thread ratio and different emulation thread Action type;According to spectre post-simulation load properties, formulate a kind of post-simulation thread type, by multiple terminals also The spectre post-simulation thread sent out simulates the daily real running environment of EDA design platform;
Table 3
Total amount of handling up includes that total amount is handled up in design and Generating Data File/removing is handled up total amount, and design total amount of handling up refers to When the design operation number of run DAS that the design operation number of times run in unit interval, i.e. user perform consumes with design operation Between texpendRatio, and design operation elapsed time texpendFor random cross-circulation test operation end time tendWith at random Cross-circulation test operation time started tstartDifference, file generated/removing total amount of handling up refers to generate/remove in the unit interval Total number of files amount, i.e. total quantity F of data file generated in test processbuildWith test cumulative time TexpendRatio, And test cumulative time TexpendFor test end time TendWith test time started TstartDifference.
Handling capacity is made up of data file Mass production handling capacity, data file batch removing handling capacity in batches, wherein criticizes Amount generates handling capacity and refers to the data file quantity of Mass production, the concurrent quantity of documents f i.e. configured in the unit intervalbatch-build With Mass production process cumulative time talter1Ratio, and Mass production process cumulative time talter1Survey for random cross-circulation Examination operation time started tstartWith test time started TstartDifference;It is clear that batch removes batch in handling capacity refers to the unit interval The data file quantity removed, data file quantity f that i.e. the files in batch removing stage is removedbatch-delWith batch reset procedure Cumulative time talter2Ratio, and batch reset procedure cumulative time talter2For test end time TendFollow with intersecting at random Ring test operation end time tendDifference.
Read operation handling capacity when handling capacity of intersecting includes design operation crossing operation, add file handling capacity, generate literary composition Part handling capacity and removing file handling capacity, wherein read operation handling capacity refers to
M () initial testing parameter is selected;
Including performed by the emulation thread type formulated in simulation test scene, emulation thread ratio and different emulation thread Action type;According to spectre post-simulation load properties, formulate a kind of post-simulation thread type, by multiple terminals also The spectre post-simulation thread sent out simulates the daily real running environment of EDA design platform;
N () initial testing load is selected;
According to the load properties of circuit diagram spectre post-simulation application, can writing from memory with definition circuit figure spectre post-simulation Recognizing test load is: terminal initial quantity is eight, and concurrent thread number is two, components and parts door number average out to 10,000 contained by circuit diagram Door, single adds the data volume mean size 1,000 of circuit diagram content;
O () testing results flow process, monitors real-time testing process, Multi-thread synchronization controls and records the information of test operation;
Testing results flow process enters shown in Fig. 2-3, specifically includes:
(I) main thread test is run, and according to putting down under the initial circuit map file quantity specified, single project folder All circuit quantity and average circuit size allocation for test original document collection;
(II) testing results monitoring, opens multiple test emulation threads according to the concurrent thread number initially specified, and imitates EDA design platform server is simultaneously and concurrently accessed and the situation of circuit simulation by multiple terminals;
(III) multiple circuit simulation threads concurrently perform the operation set in simulation contact surface, are respectively removing history and imitate True wave file, run post-simulation process, generate simulation waveform file, read post-simulation wave file, to simulation document add Later stage emulates content, continuously performs the post-simulation operation of set point number;
(IV) while (III) step is carried out, all circuit simulation threads are monitored by main thread, until all of Emulation thread end of run.
(V) handle up the total amount (number completed according to the operation Information Statistics data file operation of real time record in test process According to file generated, the merging number of times removing, read and write, by calculate in test operating procedure file operation total degree divided by Test run total time obtains), (file data transfer total amount, by calculating number in test operating procedure for test overall system bandwidth Obtain total time divided by test according to transmission total amount) and processor or the cluster overall load rate (place shared by single file operation Reason device or cluster time, obtained divided by number of operations by the processor or the overall holding time of cluster calculating test run process Arrive).
Below it is only the concrete exemplary applications of the present invention, protection scope of the present invention is not constituted any limitation.All employings The technical scheme that equivalents or equivalence are replaced and formed, within the scope of all falling within rights protection of the present invention.

Claims (6)

1. an enterprise EDA design platform running environment basic property method of testing, it is characterised in that it comprises the steps:
1) the basic read operation of platform running environment and write operation two are to bandwidth test, i.e. may go out by during board design The virtual scene of existing multiple data-interfaces operation is tested;
2) design operation testing throughput, i.e. civilian to the data of EDA design platform running environment by cross-circulation mode of operation Part operation handling capacity is tested;
3) IC design typical case application simulation test, is i.e. tested in enterprise by the structure extendible load module of multithreading Effective application performance of this platform running environment under industry actual IC design working condition;
Wherein, described step 1) in include successively:
A () chooses test reference point, the generation rule of the data-interface running that statistical basis environment is real-time, builds test reference point I/O operation model;
B () configuration testing data file, with file size size (Fn), data block size (Bn) it is foundation, point row Various types of data literary composition Part, and make the maximum (B of data block sizemax) less than or equal to the minimum (F of file size sizemin);
(c) initialization data, the generation of test file content, the selection of reference mode and generation and the differentiation of data to be written And generation;
D () is run and is added up one and take turns testing process, start/stop test monitoring, according to each file size sum taking turns test Corresponding test operation, then record the read-write data volume in the statistical unit time, corresponding document size is performed according to block size And data block size;
(e) autonomous flow process of going forward one by one that doubles, the generation of test file content, the selection of reference mode and generation and data to be written Differentiation and generation.
Enterprise EDA design platform running environment basic property method of testing the most according to claim 1, it is characterised in that Described step 2) in include successively:
(f) configuration testing parameter;
G () service data files in batch generates operation, start test, record test time started (Tstart), and according to configuration Concurrent quantity of documents and file mean size parameter, sequential batch creates file, records random cross-circulation test operation and open Time beginning (tstart);
H () runs random cross-circulation test operation, with configuration all types of design operation proportions as foundation, random crossing operation Different design operations;
I () runs batch documents clear operation, record random cross-circulation test operation end time (tend), then batch is clear Except all residue test data files and record test end time (Tend);
J () adds up every testing throughput index.
Enterprise EDA design platform running environment basic property method of testing the most according to claim 1 and 2, its feature exists In, described handling capacity includes handle up total amount, in batches handling capacity and handling capacity of intersecting.
Enterprise EDA design platform running environment basic property method of testing the most according to claim 2, it is characterised in that In described step (h), run random cross-circulation test operation and include:
1. judge whether to need to run to read/add operation, if without running, turning to step 2., if operation need to be run, pressing Generate certain random value according to read/write operation ratio, then judge this time to circulate with this random value and read behaviour the need of running Make, the most then perform a read operation, otherwise, then perform once to add operation;
2. judge whether to need to run generation/clear operation, if without running, turning to step 3., if operation need to be run, Generate certain random value according to generation/clear operation ratio, then judge this time to circulate the need of fortune with this random value Row generates operation, the most then perform once to generate operation, otherwise, then perform a clear operation;
3. the number of run of design operation is accumulated once, it is judged that whether design operation number of run reaches initial set value, if It is that the random cross-circulation operational phase then designed terminates, starts the batch delete step of test data file;Otherwise turn to step The most 1..
Enterprise EDA design platform running environment basic property method of testing the most according to claim 1, it is characterised in that Described step 3) in include successively:
The load properties analysis of (k) IC design typical case application;
L () initial simulation contact surface is formulated;
M () initial testing parameter is selected;
N () initial testing load is selected;
O () testing results flow process, monitors real-time testing process, Multi-thread synchronization controls and records the information of test operation.
Enterprise EDA design platform running environment basic property method of testing the most according to claim 5, it is characterised in that In step (o), testing results flow process includes:
(I) main thread test is run, and according to the average electricity under the initial circuit map file quantity specified, single project folder Way amount and average circuit size allocation for test original document collection;
(II) testing results monitoring, opens multiple test emulation threads according to the concurrent thread number initially specified, imitates multiple EDA design platform server is simultaneously and concurrently accessed and the situation of circuit simulation by terminal;
(III) multiple circuit simulation threads concurrently perform the operation set in simulation contact surface, are respectively and remove history emulation ripple Shape file, run post-simulation process, generate simulation waveform file, read post-simulation wave file, to simulation document add the later stage Emulation content, continuously perform set point number post-simulation operation;
(IV) while (III) step is carried out, all circuit simulation threads are monitored by main thread, until all of emulation Thread end of run.
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