CN103901064A - Ray emission device, imaging system and inspection method - Google Patents
Ray emission device, imaging system and inspection method Download PDFInfo
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- CN103901064A CN103901064A CN201210581453.9A CN201210581453A CN103901064A CN 103901064 A CN103901064 A CN 103901064A CN 201210581453 A CN201210581453 A CN 201210581453A CN 103901064 A CN103901064 A CN 103901064A
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Abstract
The invention relates to a ray emission device. The ray emission device comprises a ray source for emitting rays, and a rotating mechanism, wherein the rotating mechanism can rotate around a rotating axis, a part of the rotating mechanism can rotate around the ray source and is provided with an opening for the passing of the rays, and the opening of the rotating mechanism comprises a slit. Compared with prior art, the ray emission device provided by the invention has the advantages that a transmission image and a back scattering image can be formed simultaneously by scanning once, and back scattering and transmission imaging technologies are integrated, so that substances with low atomic number can be effectively identified, deep items can be well identified, and both the scanning speed and the identification capability for the items are improved.
Description
Technical field
The present invention relates to a kind of ray emission device, imaging system and inspection method.
Background technology
Transmission imaging technology is suitable for the monitoring that requirement high-penetrability, high-space resolution etc. require, and it is sensitiveer to high density and high atomic number material, slightly poor to low-density, low atomic number substance sensitive degree.
By backscattering technique imaging, can survey the structure of checking matter, make low-density, low atomic number material, as explosive, detonator etc., in image background, highlight.Especially being applicable to surface has the dangerous material monitoring of certain shelter.
Backward scattering and transmission imaging, as the widespread use of independent scanning system, still need to carry out backward scattering and transmission imaging system and method simultaneously.
Summary of the invention
The object of this invention is to provide ray emission device, imaging system and inspection method, carry out thus backward scattering and transmission imaging simultaneously.
According to an aspect of the present invention, the invention provides a kind of ray emission device, this ray emission device comprises: the radiographic source that sends ray; And rotating mechanism, this rotating mechanism can rotate around rotation, and the part of this rotating mechanism can be rotated around radiographic source, and the part of this rotating mechanism has the opening that can make ray pass through, and the described opening of this rotating mechanism comprises slit.
According to an aspect of the present invention, the described part of described rotating mechanism is annulus.
According to an aspect of the present invention, described slit roughly at grade.
According to an aspect of the present invention, described plane is substantially vertical with the rotation of rotating mechanism.
According to an aspect of the present invention, described ray emission device also comprises the ray guidance device being connected with radiographic source, this ray guidance device has the ray import being connected with radiographic source, and the ray outlet that ray is penetrated from this ray guidance device, the described part of described rotating mechanism can be rotated in the ray outlet of this ray guidance device in the described ray outlet with respect to described ray guidance device.
According to an aspect of the present invention, described opening comprises two isolated described slits in a circumferential direction.
According to an aspect of the present invention, described opening is also included in the described part of rotating mechanism and described slit isolated form of a stroke or a combination of strokes ray beam hole in a circumferential direction.
According to an aspect of the present invention, the beam by ray guidance device, radiographic source being sent is formed as fan-ray beam.
According to an aspect of the present invention, described ray guidance device is arranged between the described part of described radiographic source and described rotating mechanism.
According to an aspect of the present invention, the invention provides a kind of imaging system, described imaging system comprises: above-mentioned ray emission device; And the detector of the ray sending for detection of ray emission device.
According to an aspect of the present invention, described detector is the backward scattering detector for detection of ray backward scattering ray of scattering on inspected object of described ray emission device transmitting; And for detection of at least one in the transmission detectors transmitting of described ray emission device, that see through the ray after inspected object.
According to an aspect of the present invention, the invention provides a kind of inspection method, described inspection method comprises: form fan-ray beam, this fan-ray beam is increased to predetermined fan angle from zero degree segment angle gradually.
According to an aspect of the present invention, in the time that this fan-ray beam reaches predetermined fan angle, utilize transmission detectors to receive through the described fan-ray beam after inspected object and see through data to obtain.
According to an aspect of the present invention, described inspection method also comprises: be increased to the process of predetermined fan angle from zero degree segment angle gradually at this fan-ray beam, utilize the backward scattering ray of backward scattering detector reception fan-ray beam scattering on inspected object to obtain backward scattering data or backscatter signal.
According to an aspect of the present invention, described predetermined fan angle is maximum segment angle.
According to an aspect of the present invention, described inspection method also comprises: make fan-ray beam be reduced to zero degree segment angle from predetermined fan angle gradually, and utilize the backward scattering ray of backward scattering detector reception fan-ray beam scattering on inspected object to obtain backward scattering data or backscatter signal.
According to an aspect of the present invention, described inspection method also comprises: before forming fan-ray beam, form form of a stroke or a combination of strokes beam; And utilize the backward scattering ray of backward scattering detector reception form of a stroke or a combination of strokes beam scattering on inspected object to obtain backward scattering data or backscatter signal.
According to an aspect of the present invention, described inspection method also comprises: form form of a stroke or a combination of strokes beam; And utilize the backward scattering ray of backward scattering detector reception form of a stroke or a combination of strokes beam scattering on inspected object to obtain backward scattering data or backscatter signal.
According to an aspect of the present invention, one row of inspected object are examined the material information in a region in region, deduct and remove the backscatter signal that remaining region, a described region obtains from the plurality of region and obtain by be examined backscatter signal that multiple regions region, that comprise a described region obtain from row.
According to an aspect of the present invention, in the time that this fan-ray beam is increased to predetermined fan angle from zero degree segment angle gradually, on inspected object, produce N inspection area, the range of exposures of fan-ray beam extends to N inspection area from the first inspection area, described inspection method comprises: during in the first inspection area, utilize backward scattering detector to obtain the backscatter signal S of the material information that represents the first inspection area in the range of exposures of fan-ray beam
1; During in the first i-1 inspection area, inspection area to the, utilize backward scattering detector to receive from the backward scattering ray of the first inspection area to the i-1 inspection area scattering to produce backscatter signal S in the range of exposures of fan-ray beam
i-1; During in the first i inspection area, inspection area to the, utilize backward scattering detector to receive from the backward scattering ray of the first inspection area to the i inspection area scattering to produce backscatter signal S in the range of exposures of fan-ray beam
i; And by backscatter signal S
ideduct backscatter signal S
i-1obtain the material information that represents i inspection area, wherein i equals 2 to N natural number.
According to an aspect of the present invention, in the time that this fan-ray beam is reduced to zero degree segment angle from predetermined fan angle gradually, on inspected object, produce N inspection area, the range of exposures of fan-ray beam is reduced to the first inspection area gradually from the first N inspection area, inspection area to the, described inspection method comprises: during in the first i inspection area, inspection area to the, utilize backward scattering detector to receive from the backward scattering ray of the first inspection area to the i inspection area scattering to produce backscatter signal S in the range of exposures of fan-ray beam
i; During in the first i-1 inspection area, inspection area to the, utilize backward scattering detector to receive from the backward scattering ray of the first inspection area to the i-1 inspection area scattering to produce backscatter signal S in the range of exposures of fan-ray beam
i-1; By backscatter signal S
ideduct backscatter signal S
i-1obtain the material information that represents i inspection area; And during in the first inspection area, utilize backward scattering detector to obtain the backscatter signal S of the material information that represents the first inspection area in the range of exposures of fan-ray beam
1, wherein i equals 2 to N natural number.
According to an aspect of the present invention, described inspection method also comprises: backward scattering data are processed, wherein by backward scattering data are processed, judged on inspected object, whether there are prohibited items according to result.By transmission data is processed, judge in inspected object, whether there are prohibited items according to result.
The present invention, by formation flying spot and the fladellum at interval, makes scanning system single pass form transmission image and backscatter images simultaneously, can effectively solve the sensitivity of low atomic number material, can solve well again the monitoring of deep layer article.
Accompanying drawing explanation
Fig. 1 is the schematic isometric according to imaging system of the present invention, and wherein fan-ray beam is through slit transmitting.
Fig. 2 is the schematic isometric according to imaging system of the present invention, and wherein form of a stroke or a combination of strokes beam is through the transmitting of form of a stroke or a combination of strokes ray beam hole.
Fig. 3 is according to the schematic diagram of the position relationship of the slit of the rotating mechanism of imaging system of the present invention and form of a stroke or a combination of strokes ray beam hole.
Fig. 4 is according to the schematic diagram of the position relationship of two of the rotating mechanism of imaging system of the present invention slits.
Fig. 5 (a) and Fig. 5 (b) are respectively the schematic diagram of backscatter signal amplitude P of the present invention before and after backward scattering subtracts shadow processing, and wherein horizontal ordinate represents the time, and ordinate represents signal amplitude P.
Fig. 6 is according to the schematic diagram of the ray emission device of imaging system of the present invention.
Fig. 7 a to Fig. 7 d shows the schematic diagram that subtracts shadow processing of backscatter signal according to an embodiment of the invention.
Embodiment
Below in conjunction with the drawings and the specific embodiments, the present invention will be further described.
As shown in Figure 1-2, imaging system 100 according to the present invention comprises: ray emission device 102; For receiving the backward scattering detector 4 of ray backward scattering ray of scattering on inspected object that described ray emission device 102 launches; And for receiving the transmission detectors 5 that described ray emission device 102 is that launch, see through the ray after inspected object.Backward scattering detector 4 can be flat panel detector, and transmission detectors 5 can be detector array.Imaging system 100 can be carried out backward scattering and transmission imaging simultaneously.
As shown in Fig. 1-4,6, ray emission device 102 according to the present invention comprises: the radiographic source 3 such as X-ray machine that sends ray; The ray guidance device 2 being connected with radiographic source 3, this ray guidance device 2 has the ray import being connected with radiographic source 3, and the ray outlet that ray is penetrated from this ray guidance device; And rotating mechanism 1, this rotating mechanism 1 has the annulus 11 that can rotate, and the inside surface of this annulus 11 covers the ray outlet of this ray guidance device 2, and this annulus 11 has the opening that can make ray pass through.Ray guidance device 2 is formed by radiation shielding material and can be collimating apparatus.If the ray that radiographic source 3 sends, through collimation, can save ray guidance device 2.Rotating mechanism can not comprise annulus, and as selection, rotating mechanism also can comprise the part of other shape, for example, only comprise a part for annulus.
As shown in Figure 1,2,3, 4, described radiographic source 3 is roughly at the rotation center C of described rotating mechanism.For example, the target spot of radiographic source 3 is roughly at rotation center C.Radiographic source 3 is arranged in frame 6.Can control as required radiographic source 3 sends ray and stops divergent-ray.
As shown in Figure 1, 2, described opening comprise the slit 13 that arranges along the circumferencial direction of described annulus 11 and with slit 13 isolated form of a stroke or a combination of strokes ray beam hole 14 in a circumferential direction.Slit can be fan-ray beam seam.Slit 13 can be roughly in one plane.As shown in Figure 3, form of a stroke or a combination of strokes ray beam hole 14 has center line, and described center line is by the rotation center C of described annulus, and described slit 14 is with respect to described center line symmetry.
As shown in Figure 4, as selection, described opening comprise two along the circumferencial direction setting of described annulus 11 and on the circumferencial direction of described annulus 11 isolated slit 13.The segment angle of two slits 13 can be not more than 90 degree.Each in two slits 13 is roughly with respect to the straight line symmetry of the rotation center C by described annulus 11.
As shown in Figure 1-2, described ray guidance device 2 can have roughly fan shape.Be a fan-ray beam by ray guidance device 2 by beam shape.Described ray guidance device 2 is arranged between described radiographic source 3 and the annular section 11 of described rotating mechanism 1.Between described ray guidance device 2 and described rotating mechanism 1, form labyrinth structure, to prevent that ray is from revealing between described ray guidance device 2 and described rotating mechanism 1.For example, the fan-shaped shield of described ray guidance device 2 and the rotating shield of described rotating mechanism 1 adopt the shielding design of non-contacting labyrinth, guarantee that ray do not reveal.The slit of the fan-shaped seam on the fan-shaped shield of ray guidance device 2 and the annular section 11 of rotating mechanism 1 is in same plane.
In the time that imaging system 100 is moved, the annular section 11 of motor 12 driven rotary mechanisms rotates, in scanning process, radiographic source 3 discharges the ray of certain energy, by fan ray guidance device 2, beam is formed as to fan-ray beam, in the time that the annular section 11 of rotating mechanism forwards position as shown in Figure 1 to, discharges fan-ray beam 15 to passage, the positional information of feeding back by location sensitive switch, detector array 5 acquisition of transmission information.
The relative motion of annular section 11 and fan ray guidance device 2, fan-ray beam 15 is expanded into whole covering of the fan gradually by initial single-point, covering of the fan diminishes gradually subsequently, to finally there is no ray, also be to expand to gradually overall exposure from a direction according to the order of sequence and be subject to according to object in passage 15, and fade away from another direction.The signal that 4 each moment of flat panel detector collect, it is the current shape fan-ray beam irradiating object back scattered information of reflection, if the signals collecting time enough in fast or passage object move when slower, it is overlay information that the signal that front and back collect has major part, be the shadow that the latter has the former, the information that both differ is subject to the information according to object after reflecting fan-ray beam expansion.
Fig. 5 (a) and Fig. 5 (b) are respectively the schematic diagram of backscatter signal amplitude P of the present invention before and after backward scattering subtracts shadow processing, and wherein horizontal ordinate represents the time, and ordinate represents signal amplitude P.As shown in Fig. 5 (a) and Fig. 5 (b), process the backward scattering information forming with position signalling by subtraction algorithm.Particularly, Fig. 5 (a) is the schematic diagram that does not carry out the signal amplitude P of subtraction algorithm processing, and Fig. 5 (b) is the schematic diagram of processing the subtraction algorithm signal after treatment obtaining by adjacent signals amplitude P is subtracted each other.
In the time that fan-ray beam is expanded gradually by the segment angle of 0 angle, flat panel detector 4 gathers the backward scattering information of fan-ray beam, processes the backward scattering information forming with position signalling by subtraction algorithm.The annular section 11 of rotating mechanism continues rotation, gradually narrowed down to after 0 degree segment angle by the fan-shaped contention of maximum at fan-ray beam, the form of a stroke or a combination of strokes ray beam hole 14 of rotating mechanism 1 discharges form of a stroke or a combination of strokes beam 16, as shown in Figure 2, flat panel detector 4 gathers the backward scattering information of form of a stroke or a combination of strokes beam, by the position feedback additional position signal of rotating mechanism.The annular section of rotating mechanism rotates a circle like this, and detector array 5 and flat panel detector 4 obtain respectively transmission information and backward scattering information, generate respectively transmission image and backscatter images.
As shown in Figure 4, while adopting slit 13, adopt slit 13 and " subtracting shadow processing " can obtain backscatter images.Can, according to actual requirement, adopt a slit 13, or multiple slit 13, or adopt a slit 13 and a form of a stroke or a combination of strokes ray beam hole 14.
In the present invention, fan ray guidance device 2 is connected with radiographic source 3, forms the fan-ray beam of certain width, and the fan-shaped subtended angle of fan-ray beam is determined by the height of the monitored thing of need; It is that the center of circle is rotated that rotating mechanism is shown greatly radiographic source, one side of rotating mechanism has slit, the fan-shaped subtended angle of slit can be not more than the fan-shaped subtended angle of fan ray guidance device, opposite side has transmission aperture, between rotating mechanism and fan ray guidance device, form labyrinth structure, neither hinder the rotation of rotating mechanism, can guarantee that again ray only penetrates from slit or the transmission aperture of rotating mechanism, rotating mechanism often rotates a circle, and just can form once complete fan-ray beam and a string continuous flying spot hot spot; Rotating mechanism location sensitive switch feeds back the position of rotation of rotating mechanism at any time to host computer; Flat panel detector gathers backward scattering ray signal, can arrange some flat panel detectors, and flat panel detector changes into positional information by time sequence information; The dead ahead of linear array detector in line, is made up of the form of a stroke or a combination of strokes detector of longitudinally arranging, and gathers through transmission signal after monitored thing, forms transmission image.Rotating mechanism often rotates a circle, and linear array detector just gathers a row transmission signal, and flat panel detector gathers a row flying spot backscatter signal, forms transmission and backscatter images.In the time that slit goes out to restraint, by sequential control, can gather a series of backscatter signals, and obtain more backscatter images by subtracting shadow processing simultaneously.
The following describes according to inspection method of the present invention.
In step 11, form fan-ray beam, this fan-ray beam is increased to predetermined fan angle from zero degree segment angle gradually, be increased to the process of predetermined fan angle from zero degree segment angle gradually at this fan-ray beam, can utilize the backward scattering ray of backward scattering detector reception fan-ray beam scattering on inspected object to obtain backscatter signal.Described predetermined fan angle can be maximum segment angle.Obviously, can in the time of predetermined fan angle, make radiographic source stop sending ray.
In step 13, in the time that this fan-ray beam reaches predetermined fan angle, utilize transmission detectors to receive through the described fan-ray beam after inspected object and see through data to obtain.
In step 15, make fan-ray beam be reduced to zero degree segment angle from predetermined fan angle gradually, and utilize the backward scattering ray of backward scattering detector reception fan-ray beam scattering on inspected object to obtain backward scattering data or backscatter signal.For example, can make rotating mechanism reversing, make fan-ray beam be reduced to zero degree segment angle from predetermined fan angle gradually.
In step 17, form form of a stroke or a combination of strokes beam; And utilize the backward scattering ray of backward scattering detector reception form of a stroke or a combination of strokes beam scattering on inspected object to obtain backward scattering data or backscatter signal.As selection, can, before forming fan-ray beam, form form of a stroke or a combination of strokes beam; And utilize the backward scattering ray of backward scattering detector reception form of a stroke or a combination of strokes beam scattering on inspected object to obtain backward scattering data or backscatter signal.
In step 19, backward scattering data are processed, judge on inspected object, whether there are prohibited items according to result, and transmission data is processed judge in inspected object, whether there are prohibited items according to result.
As shown in Fig. 7 a, 7b, 7c, 7d and with reference to Fig. 1,3, in the time that fan-ray beam 15 is increased to predetermined fan angle from zero degree segment angle gradually, on inspected object 25, produce N inspection area P
1to P
n, the range of exposures of fan-ray beam 15 is from the first inspection area P
1extend to N inspection area P
n, described inspection method also comprises: in the range of exposures of fan-ray beam 15 in the first inspection area P
1time, utilize backward scattering detector 4 to obtain and represent the first inspection area P
1the backscatter signal S of material information
1; In the range of exposures of fan-ray beam 15 in the first inspection area P
1to i-1 inspection area P
i-1time, utilize backward scattering detector 4 to receive from the first inspection area P
1to i-1 inspection area P
i-1the backward scattering ray 21 of scattering is to produce backscatter signal S
i-1; In the range of exposures of fan-ray beam 15 in the first inspection area P
1to i inspection area P
i-1time, utilize backward scattering detector 4 to receive from the first inspection area P
1to i inspection area P
ithe backward scattering ray 21 of scattering is to produce backscatter signal S
i; And by backscatter signal S
ideduct backscatter signal S
i-1obtain and represent i inspection area P
imaterial information, wherein i equals 2 to N natural number.
As shown in Fig. 7 a, 7b, 7c, 7d and with reference to Fig. 1,3, in the time that this fan-ray beam 15 is reduced to zero degree segment angle from predetermined fan angle gradually, on inspected object 25, produce N inspection area P
1to P
n, the range of exposures of fan-ray beam 15 is from the first inspection area P
1to N inspection area P
nbe reduced to gradually the first inspection area P
1, described inspection method also comprises: in the range of exposures of fan-ray beam 15 in the first inspection area P
1to i inspection area P
itime, utilize backward scattering detector 4 to receive from the first inspection area P
1to i inspection area P
ithe backward scattering ray 21 of scattering is to produce backscatter signal S
i; In the range of exposures of fan-ray beam 15 in the first inspection area P
1to i-1 inspection area P
i-1time, utilize backward scattering detector 4 to receive from the first inspection area P
1to i-1 inspection area scattering P
i-1the backward scattering ray of scattering is to produce backscatter signal S
i-1; By backscatter signal S
ideduct backscatter signal S
i-1obtain and represent i inspection area P
imaterial information; And in the range of exposures of fan-ray beam 15 in the first inspection area P
1time, utilize backward scattering detector 4 to obtain and represent the first inspection area P
1the backscatter signal S of material information
1, wherein i equals 2 to N natural number.
Therefore, obviously except the first inspection area P
1outside, one row of inspected object are examined the material information in a region in region, deduct and remove the backscatter signal that remaining region, a described region obtains from the plurality of region and obtain by be examined backscatter signal that multiple regions region, that comprise a described region obtain from row.
Describe backward scattering in detail below in conjunction with Fig. 7 a, 7b, 7c, 7d and subtract shadow processing.
As shown in Figure 7a and with reference to Fig. 1,3, in the time that annular section 11 rotates with angular velocity omega, the ray that radiographic source 3 sends forms beam 15 by the slit 13 of annulus 11, and beam 15 is radiated at position or the region P of object 25
1upper, now, from position or the region P of object 25
1the backward scattering ray 25 of scattering is received by backward scattering detector 4, produces thus backscatter signal S
1, now can be not from transmission detectors 5 picked up signal.Backscatter signal S
1represent position or the region P of object
1material information.
As shown in Figure 7b and with reference to Fig. 1,3, in the time that annular section 11 continues rotation with angular velocity omega, the ray that radiographic source 3 sends forms beam 15 by the slit 13 of annulus 11, now slit 13 increases with the lap of ray guidance device 2, therefore beam 15 broadens, and beam 15 is radiated at position or the region P of object 25
1and P
2upper, now, from position or the region P of object 25
1and P
2the backward scattering ray 25 of scattering is received by backward scattering detector 4, produces thus backscatter signal S
2, now can be not from transmission detectors 5 picked up signal.Backscatter signal S
2deduct backscatter signal S
1the signal S obtaining
2-S
1represent position or the region P of object
2material information.
As shown in Figure 7 c and with reference to Fig. 1,3, in the time that annular section 11 continues rotation with angular velocity omega, the ray that radiographic source 3 sends forms beam 15 by the slit 13 of annulus 11, now slit 13 further increases with the lap of ray guidance device 2, therefore beam 15 further broadens, and beam 15 is radiated at position or the region P of object 25
1, P
2and P
3upper, now, from position or the region P of object 25
1, P
2and P
3the backward scattering ray 25 of scattering is received by backward scattering detector 4, produces thus backscatter signal S
3, now can be not from transmission detectors 5 picked up signal.Backscatter signal S
3deduct backscatter signal S
2the signal S obtaining
3-S
2represent position or the region P of object
3material information.
Repeat said process until for example slit 13 reaches predetermined value with the lap of ray guidance device 2, for example, reach maximal value or a peaked part, as shown in Fig. 7 d and with reference to Fig. 1,3, beam 15 is radiated at position or the region P of object 25
1, P
2, P
3p
nupper, now, from position or the region P of object 25
1, P
2, P
3p
nthe backward scattering ray 25 of scattering is received by backward scattering detector 4, produces thus backscatter signal S
n, now transmission detectors 5 can receive the transmitted ray 23 by object, produces thus perspective signal TS
1.Backscatter signal S
ndeduct backscatter signal S
n-1the signal S obtaining
n-S
n-1represent position or the region P of object
nmaterial information.
By said method, can obtain a row material information from top to bottom of object 25, and in position or region P
n, projection radiation covers transmission detectors 5, can obtain thus a row transmission information.
Along with annular section 11 is with angular velocity omega rotation, object 25 moves up in the side perpendicular to ray surface with respect to ray surface, thereby obtains whole backscatter signals and whole transmission signal of object 25.
Claims (21)
1. a ray emission device, comprising:
Send the radiographic source of ray; And
Rotating mechanism, this rotating mechanism can rotate around rotation, and the part of this rotating mechanism can be rotated around radiographic source, and the part of this rotating mechanism has the opening that can make ray pass through, and the described opening of this rotating mechanism comprises slit.
2. ray emission device according to claim 1, the described part of wherein said rotating mechanism is annulus.
3. ray emission device according to claim 1, wherein said slit roughly at grade.
4. ray emission device according to claim 3, wherein said plane is substantially vertical with the rotation of rotating mechanism.
5. ray emission device according to claim 1, also comprise the ray guidance device being connected with radiographic source, this ray guidance device has the ray import being connected with radiographic source, and the ray outlet that ray is penetrated from this ray guidance device, the described part of described rotating mechanism can be rotated in the ray outlet of this ray guidance device in the described ray outlet with respect to described ray guidance device.
6. ray emission device according to claim 1, wherein said opening comprises two isolated described slits in a circumferential direction.
7. ray emission device according to claim 1, wherein said opening is also included in the described part of rotating mechanism and described slit isolated form of a stroke or a combination of strokes ray beam hole in a circumferential direction.
8. ray emission device according to claim 5, the beam wherein by ray guidance device, radiographic source being sent is formed as fan-ray beam.
9. ray emission device according to claim 5, wherein said ray guidance device is arranged between the described part of described radiographic source and described rotating mechanism.
10. an imaging system, comprising:
Ray emission device according to claim 1; And
For receiving the detector of the ray that ray emission device sends.
11. imaging systems according to claim 10, wherein said detector is the backward scattering detector of the ray backward scattering ray of scattering on inspected object for receiving described ray emission device transmitting; And for receiving at least one of the transmission detectors transmitting of described ray emission device, that see through the ray after inspected object.
12. 1 kinds of inspection methods, comprising:
Form fan-ray beam, this fan-ray beam is increased to predetermined fan angle from zero degree segment angle gradually.
13. inspection methods according to claim 12, wherein
In the time that this fan-ray beam reaches predetermined fan angle, utilize transmission detectors to receive through the described fan-ray beam after inspected object and see through data to obtain.
14. inspection methods according to claim 12, also comprise:
Be increased to the process of predetermined fan angle from zero degree segment angle gradually at this fan-ray beam,
Utilize the backward scattering ray of backward scattering detector reception fan-ray beam scattering on inspected object to obtain backscatter signal.
15. inspection methods according to claim 12, wherein
Described predetermined fan angle is maximum segment angle.
16. according to the inspection method described in claim 12 or 14, also comprises:
Make fan-ray beam be reduced to zero degree segment angle from predetermined fan angle gradually, and
Utilize the backward scattering ray of backward scattering detector reception fan-ray beam scattering on inspected object to obtain backward scattering data.
17. inspection methods according to claim 12, also comprise:
Before forming fan-ray beam, form form of a stroke or a combination of strokes beam; And
Utilize the backward scattering ray of backward scattering detector reception form of a stroke or a combination of strokes beam scattering on inspected object to obtain backscatter signal.
18. according to the inspection method described in claim 12 or 16, also comprises:
Form form of a stroke or a combination of strokes beam; And
Utilize the backward scattering ray of backward scattering detector reception form of a stroke or a combination of strokes beam scattering on inspected object to obtain backscatter signal.
19. according to the inspection method described in claim 14 or 16, wherein:
One row of inspected object are examined the material information in a region in region, deduct and remove the backscatter signal that remaining region, a described region obtains from the plurality of region and obtain by be examined backscatter signal that multiple regions region, that comprise a described region obtain from row.
20. inspection methods according to claim 14, wherein;
In the time that this fan-ray beam is increased to predetermined fan angle from zero degree segment angle gradually, on inspected object, produce N inspection area, the range of exposures of fan-ray beam extends to N inspection area from the first inspection area,
Described inspection method comprises:
During in the first inspection area, utilize backward scattering detector to obtain the backscatter signal S of the material information that represents the first inspection area in the range of exposures of fan-ray beam
1;
During in the first i-1 inspection area, inspection area to the, utilize backward scattering detector to receive from the backward scattering ray of the first inspection area to the i-1 inspection area scattering to produce backscatter signal S in the range of exposures of fan-ray beam
i-1;
During in the first i inspection area, inspection area to the, utilize backward scattering detector to receive from the backward scattering ray of the first inspection area to the i inspection area scattering to produce backscatter signal S in the range of exposures of fan-ray beam
i; And
By backscatter signal S
ideduct backscatter signal S
i-1obtain the material information that represents i inspection area,
Wherein i equals 2 to N natural number.
21. inspection methods according to claim 16, wherein;
In the time that this fan-ray beam is reduced to zero degree segment angle from predetermined fan angle gradually, on inspected object, produce N inspection area, the range of exposures of fan-ray beam is reduced to the first inspection area gradually from the first N inspection area, inspection area to the,
Described inspection method comprises:
During in the first i inspection area, inspection area to the, utilize backward scattering detector to receive from the backward scattering ray of the first inspection area to the i inspection area scattering to produce backscatter signal S in the range of exposures of fan-ray beam
i;
During in the first i-1 inspection area, inspection area to the, utilize backward scattering detector to receive from the backward scattering ray of the first inspection area to the i-1 inspection area scattering to produce backscatter signal S in the range of exposures of fan-ray beam
i-1;
By backscatter signal S
ideduct backscatter signal S
i-1obtain the material information that represents i inspection area; And
During in the first inspection area, utilize backward scattering detector to obtain the backscatter signal S of the material information that represents the first inspection area in the range of exposures of fan-ray beam
1,
Wherein i equals 2 to N natural number.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210581453.9A CN103901064B (en) | 2012-12-27 | 2012-12-27 | Ray emission device, imaging system and inspection method |
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|---|---|---|---|
| CN201210581453.9A CN103901064B (en) | 2012-12-27 | 2012-12-27 | Ray emission device, imaging system and inspection method |
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| CN103901064A true CN103901064A (en) | 2014-07-02 |
| CN103901064B CN103901064B (en) | 2017-05-10 |
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| CN201210581453.9A Active CN103901064B (en) | 2012-12-27 | 2012-12-27 | Ray emission device, imaging system and inspection method |
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