CN103885408A - Method and device for controlling operation of tested sample piece - Google Patents
Method and device for controlling operation of tested sample piece Download PDFInfo
- Publication number
- CN103885408A CN103885408A CN201410088172.9A CN201410088172A CN103885408A CN 103885408 A CN103885408 A CN 103885408A CN 201410088172 A CN201410088172 A CN 201410088172A CN 103885408 A CN103885408 A CN 103885408A
- Authority
- CN
- China
- Prior art keywords
- temperature
- current
- tested exemplar
- rate
- chamber internal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Classifications
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]
Landscapes
- Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
Abstract
The invention provides a method and device for controlling operation of a tested sample piece. The method comprises the steps of collecting the internal temperature values of a test box according to preset sampling frequency, acquiring a first temperature value and a second temperature value, calculating the current temperature change rate according to the first temperature value, the second temperature value and the sampling frequency, calculating the current temperature difference according to the first temperature value and a preset target temperature value, obtaining the current internal temperature state of the test box according to the temperature change rate and the current temperature difference, controlling the operation of the tested sample piece according to the internal temperature state of the text box, controlling the tested sample piece to be powered on when the internal temperature state of the test box is a stable state, and testing the tested sample piece when the internal temperature state of the test box is stable. In this way, the accuracy of normal operation parameters, obtained from testing, of the tested sample piece is improved, and the influence of temperature fluctuation of the text box on the operation parameter testing is avoided.
Description
Technical field
The present invention relates to automatic control technology field, particularly relate to a kind of method and apparatus of controlling tested exemplar operation.
Background technology
Automobile is made up of several thousand parts, the reliability of automobile electronic system in automobilism automobile is dispatched from the factory after safe operation have great significance.Therefore, need to carry out reliability testing to the parts in automobile electronic system.In the reliability testing of temperature variation type, in chamber, be provided with Temperature sampler and temperature regulator, the temperature of load simulation case (Load Box) acquisition test case, adopting PID(ratio (proportion), integration (integral), differential (derivative)) controller is to temperature regulator feedback control signal, thus the temperature of adjusting chamber.The temperature of the chamber gathering as Load Box reaches default probe temperature when interval, and Load Box powers on to immediately tested exemplar (Device Under Test, DUT), the normal operational factor of test DUT.In the temperature variation type reliability testing process of DUT, whether Load Box is used to provide DUT needed sensor signal and load in the time of operation, and detect DUT and normally work.
When those skilled in the art adopt said method control DUT operation, find that there is following shortcoming:
Load Box controls the powering on of DUT according to the temperature of gathered chamber, thereby realizes the temperature variation type reliability testing to DUT.But the temperature in chamber likely occurs temperature jitter in the time just reaching default probe temperature interval, the DUT operational factor that test obtains in temperature jitter is inaccurate compared with the normal parameter of moving of DUT, and error is large.
Summary of the invention
The invention provides a kind of method and apparatus of controlling tested exemplar operation, in the time that chamber internal temperature state is steady state (SS), controls tested exemplar and power on, test tested exemplar, avoid the impact of the operational factor of chamber temperature jitter on test.
A method of controlling tested exemplar operation, described method comprises:
The chamber internal temperature values gathering according to default sample frequency;
Obtain the first temperature value and the second temperature value, described the first temperature value is current gathered chamber internal temperature values, and described the second temperature value is that the last chamber internal temperature values gathering is as the second temperature value;
Calculate Current Temperatures rate of change according to described the first temperature value, described the second temperature value and described default sample frequency;
Calculate the current temperature difference according to described the first temperature value and default target temperature value;
Obtain current chamber internal temperature state according to described rate of temperature change and the described current temperature difference, according to the tested exemplar operation of described chamber internal temperature state control.
Optionally, describedly obtain current chamber internal temperature state according to described rate of temperature change and the described current temperature difference, draw together according to the tested exemplar running package of described chamber internal temperature state control:
When described rate of temperature change is in preset temperature rate of change interval, and the described current temperature difference is in the default temperature difference interval time, and current chamber internal temperature state is steady state (SS), controls tested exemplar and powers on, and tests tested exemplar;
When described rate of temperature change is not in preset temperature rate of change interval or the described current temperature difference not in the default temperature difference interval time, current chamber internal temperature state, for treating steady state (SS), is controlled tested exemplar and is powered on, the tested exemplar of delayed test;
When described rate of temperature change is not in preset temperature rate of change interval, and the described current temperature difference is also in the default temperature difference interval time, and current chamber internal temperature state is adjustment state, does not control tested exemplar and powers on, and does not test detected sample part.
Optionally, described method also comprises:
While testing tested exemplar, if described the first temperature value exceedes the highest default probe temperature or during lower than default minimum probe temperature, control tested exemplar power-off, send Fisrt fault information to chamber.
Optionally, described method also comprises:
While testing tested exemplar, if described rate of temperature change exceeds preset temperature rate of change interval, control tested exemplar power-off, send the second failure message to chamber.
Optionally, described method also comprises:
While testing tested exemplar, if receive the 3rd failure message that chamber sends, control tested exemplar power-off.
A device of controlling tested exemplar operation, described device comprises:
Collecting unit, for the chamber internal temperature values gathering according to default sample frequency;
Acquiring unit, for obtaining the first temperature value and the second temperature value, described the first temperature value is current gathered chamber internal temperature values, described the second temperature value is that the last chamber internal temperature values gathering is as the second temperature value;
The first computing unit, for calculating Current Temperatures rate of change according to described the first temperature value, described the second temperature value and described default sample frequency;
The second computing unit, for calculating the current temperature difference according to described the first temperature value and default target temperature value;
Control module, for obtaining current chamber internal temperature state according to described rate of temperature change and the described current temperature difference, according to the tested exemplar operation of described chamber internal temperature state control.
Optionally, described control module comprises:
First controls subelement, and for when described rate of temperature change is in preset temperature rate of change interval, and the described current temperature difference is in the default temperature difference interval time, and current chamber internal temperature state is steady state (SS), controls tested exemplar and powers on, and tests tested exemplar;
Second controls subelement, when described rate of temperature change is not in preset temperature rate of change interval or the described current temperature difference not in the default temperature difference interval time, current chamber internal temperature state, for treating steady state (SS), is controlled tested exemplar and is powered on, the tested exemplar of delayed test;
The 3rd controls subelement, when described rate of temperature change is not in preset temperature rate of change interval, and the described current temperature difference is also in the default temperature difference interval time, and current chamber internal temperature state is adjustment state, do not control tested exemplar and power on, do not test detected sample part.
Optionally, described device also comprises:
Fisrt fault control module, when testing tested exemplar, if described the first temperature value exceedes the highest default probe temperature or during lower than default minimum probe temperature, control tested exemplar power-off, sends Fisrt fault information to chamber.
Optionally, described device also comprises:
The second fail-safe control unit, when testing tested exemplar, if described rate of temperature change exceeds preset temperature rate of change interval, controls tested exemplar power-off, sends the second failure message to chamber.
Optionally, described device also comprises:
The 3rd fail-safe control unit, when testing tested exemplar, if receive the 3rd failure message that chamber sends, controls tested exemplar power-off.
As shown from the above technical solution, the present invention has following beneficial effect:
The invention provides a kind of method and apparatus of controlling tested exemplar operation, described method comprises: the chamber internal temperature values gathering according to default sample frequency; Obtain the first temperature value and the second temperature value, described the first temperature value is current gathered chamber internal temperature values, and described the second temperature value is that the last chamber internal temperature values gathering is as the second temperature value; Calculate Current Temperatures rate of change according to described the first temperature value, described the second temperature value and described sample frequency; Calculate the current temperature difference according to described the first temperature value and default target temperature value; Obtain current chamber internal temperature state according to described rate of temperature change and the described current temperature difference, according to the tested exemplar operation of described chamber internal temperature state control, in the time that chamber internal temperature state is steady state (SS), controlling tested exemplar powers on again, test tested exemplar, under stable chamber internal temperature state, tested exemplar is tested, improved the degree of accuracy of the normal operational factor of testing the tested exemplar obtaining, avoid the impact of chamber temperature jitter on test run parameter.
Brief description of the drawings
Fig. 1 is a kind of embodiment of the method one schematic flow sheet of controlling tested exemplar operation of the present invention;
Fig. 2 is that rate of temperature change of the present invention calculates schematic diagram;
Fig. 3 is that chamber internal temperature state of the present invention is steady state (SS) schematic diagram;
Fig. 4 is that chamber internal temperature state of the present invention is for treating steady state (SS) schematic diagram;
Fig. 5 is that chamber internal temperature state of the present invention is adjustment state schematic diagram;
Fig. 6 is a kind of embodiment of the method two process flow diagrams of controlling tested exemplar operation of the present invention;
Fig. 7 is a kind of device embodiment tri-structural representations of controlling tested exemplar operation of the present invention;
Fig. 8 is a kind of device embodiment tetra-structural representations of controlling tested exemplar operation of the present invention.
Embodiment
The invention discloses a kind of method and apparatus of controlling tested exemplar operation, under stable chamber internal temperature, tested exemplar is tested, improve the degree of accuracy of the normal operational factor of testing the tested exemplar obtaining.
Below the specific embodiment of the invention is elaborated.
Embodiment mono-
Fig. 1 is a kind of embodiment of the method one schematic flow sheet of controlling tested exemplar operation of the present invention, and described method comprises:
Step 101: the chamber internal temperature values gathering according to default sample frequency.
Temperature sensor is installed in chamber, chamber internal temperature values is uploaded in CAN bus.Load simulation case (Load Box) is according to default sample frequency acquisition test case internal temperature values CAN bus.In the time of specific implementation, chamber internal temperature values is passed through RS485 bus transfer to Load Box.
The default sample frequency of Load Box acquisition test case internal temperature values CAN bus can be set according to actual conditions, does not specifically limit here.Generally, the sample frequency of Load Box is very fast, can reflect as much as possible the true temperature situation in current chamber.
Step 102: obtain the first temperature value and the second temperature value, described the first temperature value is current gathered chamber internal temperature values, described the second temperature value is that the last chamber internal temperature values gathering is as the second temperature value.
Load Box according to default sample frequency along with time order and function order gathers tryoff internal temperature from CAN bus.Load Box is from current the gathered chamber internal temperature values of CAN bus as the first temperature value, and described the first temperature value reflects current chamber internal temperature values.The chamber internal temperature values that Load Box once gathered on CAN bus is described the first temperature value is as the second temperature value, the internal temperature of chamber when described the second temperature value reflects last acquisition test case internal temperature values.That is to say, the second temperature value and the first temperature value chamber internal temperature values for gathering successively from CAN bus according to time sequencing Load Box, gathers the second temperature value front, gathers the first temperature value rear.
Step 103: calculate Current Temperatures rate of change according to described the first temperature value, described the second temperature value and described default sample frequency.
Rate of temperature change f can adopt formula (1) to calculate, as shown in Figure 2:
Wherein, T
1be the first temperature value, T
2be the second temperature value, v is default sample frequency.Rate of temperature change f mainly can reflect the time dependent situation of current chamber internal temperature.
Step 104: calculate the current temperature difference according to described the first temperature value and default target temperature value.
Default target temperature value refers to the temperature value of tested exemplar in the time of normal operation, and current temperature difference T can adopt formula (2) to calculate:
ΔT=T
1-T
0 （2）
Wherein, T
1be the first temperature value, reflect current chamber internal temperature, T
0for target temperature value.
Here it should be noted that, described default target temperature value is relevant with tested exemplar, can specifically arrange according to the kind of tested exemplar.Described default target temperature value can arrange in chamber, and chamber is passed through CAN bus transfer to Load Box by default target temperature value; Described default target temperature value can, according to arranging as the case may be in the Load Box that do not coexist of tested exemplar, not add restriction in a day here yet.
Step 105: obtain current chamber internal temperature state according to described rate of temperature change and the described current temperature difference, according to the tested exemplar operation of described chamber internal temperature state control.
Described rate of temperature change can reflect the situation of chamber internal temperature shake, preset temperature rate of change interval is set and default target temperature value is set similar.Can in chamber, according to the kind of tested exemplar, preset temperature rate of change interval be set, then preset temperature rate of change interval is sent to Load Box by CAN bus; Can also directly at Load Box, preset temperature rate of change interval be set.In the time that described rate of temperature change is within preset temperature rate of change interval, (described rate of temperature change is less than the maximal value in described preset temperature rate of change interval, be greater than the minimum value in described preset temperature rate of change interval), represent chamber internal temperature rate of change in allowed limits.
The described current temperature difference can reflect the difference between goal-selling temperature when chamber internal temperature and tested exemplar normally move, and default temperature difference interval is set and default target temperature value is set similar.Can be in chamber according to the kind of tested exemplar, default temperature difference interval be set, then will preset temperature difference interval and be sent to Load Box by CAN bus; Can also directly at Load Box, default temperature difference interval be set.In the time that the described current temperature difference is within default temperature difference interval, (the described current temperature difference is less than the maximal value in described default temperature difference interval, be greater than the minimum value in described default temperature difference interval), represent that difference between chamber internal temperature values and default target temperature is in allowed limits.
As shown in Figure 3, when described rate of temperature change is in preset temperature rate of change interval, and the described current temperature difference is in the default temperature difference interval time, and current chamber internal temperature state is steady state (SS), controls tested exemplar and powers on, and tests tested exemplar.
Now, the shake of chamber internal temperature values is less, and the error of current chamber internal temperature values and default target temperature value in allowed limits, represent that now chamber internal temperature state is steady state (SS), meet the condition of testing tested exemplar operational factor, Load Box controls tested exemplar and powers on, and tests the operational factor of tested exemplar.Load Box sends upper electric control signal by CAN bus to chamber, and chamber powers on and starts test to tested exemplar.
In the operational factor process of the tested exemplar of test, Load Box sends the required sensor signal of the normal operation of the tested exemplar of simulation by CAN bus to chamber, and monitors the operating condition of tested exemplar.
As shown in Figure 4, when described rate of temperature change is not in preset temperature rate of change interval or the described current temperature difference not in the default temperature difference interval time, current chamber internal temperature state, for treating steady state (SS), is controlled tested exemplar and is powered on, the tested exemplar of delayed test.
When meet described rate of temperature change not in preset temperature rate of change interval and the described current temperature difference not in default temperature difference interval in when any one condition, represent that current chamber internal temperature state is for treating steady state (SS).Only meet described rate of temperature change in preset temperature rate of change interval time, the described current temperature difference is not in default temperature difference interval, represent the shake of now chamber internal temperature values in allowed limits, but chamber internal temperature values does not also reach the condition of the default target temperature value of the tested exemplar of test; Only meet the described current temperature difference in the default temperature difference interval time, described rate of temperature change is not in preset temperature rate of change interval, represent that now chamber internal temperature values reaches the condition of the goal-selling temperature value of the tested exemplar of test, but now chamber internal temperature shake is larger, the operational factor that is not suitable for testing tested exemplar.Now, need to wait for after chamber internal temperature value stabilization, more tested exemplar is tested.
As shown in Figure 5, when described rate of temperature change is not in preset temperature rate of change interval, and the described current temperature difference is also in the default temperature difference interval time, and current chamber internal temperature state is adjustment state, does not control tested exemplar and powers on, and does not test detected sample part.
Now, chamber internal temperature values is both unstable, in the scope also not fluctuating up and down at default target temperature value, can not test the operational factor of tested exemplar, after need to adjusting chamber internal temperature values, tests again.
As shown in the above, the present invention has following beneficial effect:
The chamber internal temperature values gathering according to default sample frequency; Obtain the first temperature value and the second temperature value, described the first temperature value is current gathered chamber internal temperature values, and described the second temperature value is that the last chamber internal temperature values gathering is as the second temperature value; Calculate Current Temperatures rate of change according to described the first temperature value, described the second temperature value and described sample frequency; Calculate the current temperature difference according to described the first temperature value and default target temperature value; Obtain current chamber internal temperature state according to described rate of temperature change and the described current temperature difference, according to the tested exemplar operation of described chamber internal temperature state control, in the time that chamber internal temperature state is steady state (SS), controlling tested exemplar powers on again, test tested exemplar, under stable chamber internal temperature state, tested exemplar is tested, improved the degree of accuracy of the normal operational factor of testing the tested exemplar obtaining, avoid the impact of chamber temperature jitter on test run parameter.
Embodiment bis-
Fig. 6 is a kind of embodiment of the method two process flow diagrams of controlling tested exemplar operation of the present invention, compared with embodiment mono-, while being also included in the tested exemplar of test, controls the power-off to tested exemplar while running into fault in embodiment bis-, and described method comprises:
Step 601: the chamber internal temperature values gathering according to default sample frequency.
Step 602: obtain the first temperature value and the second temperature value.
Described the first temperature value is current gathered chamber internal temperature values, and described the second temperature value is that the last chamber internal temperature values gathering is as the second temperature value.
Step 603: calculate Current Temperatures rate of change according to described the first temperature value, described the second temperature value and described default sample frequency.
Step 604: calculate the current temperature difference according to described the first temperature value and default target temperature value.
Step 605: obtain current chamber internal temperature state according to described rate of temperature change and the described current temperature difference.
Step 606: when described rate of temperature change is in preset temperature rate of change interval, and the described current temperature difference is in the default temperature difference interval time, and current chamber internal temperature state is steady state (SS), controls tested exemplar and powers on, and tests tested exemplar.
Step 607: when described rate of temperature change is not in preset temperature rate of change interval or the described current temperature difference not in the default temperature difference interval time, current chamber internal temperature state, for treating steady state (SS), is controlled tested exemplar and powered on, the tested exemplar of delayed test.
Step 608: when described rate of temperature change is not in preset temperature rate of change interval, and the described current temperature difference is also in the default temperature difference interval time, and current chamber internal temperature state is adjustment state, does not control tested exemplar and powers on, and does not test detected sample part.
Step 601 is similar with embodiment mono-to step 608, and the description of reference example one, repeats no more here.
Step 609: while testing tested exemplar, if described the first temperature value exceedes the highest default probe temperature or during lower than default minimum probe temperature, control tested exemplar power-off, send Fisrt fault information to chamber.
Because the first temperature value reflects current chamber internal temperature values, if the first temperature value exceedes the highest default probe temperature or during lower than default minimum temperature, represent that current chamber internal temperature values has exceeded the highest default probe temperature of tested exemplar or lower than default minimum temperature, tested exemplar cannot normally move under current chamber internal temperature, and the operational factor error of measured tested exemplar is large.
Now, Load Box sends power-off control signal by CAN bus to chamber, and tested exemplar power-off is given in chamber, stops the test to tested exemplar.Meanwhile, Load Box also sends Fisrt fault information by CAN bus to chamber, and the current chamber internal temperature values of notice chamber has exceeded the temperature range that can test tested exemplar.
Step 610: while testing tested exemplar, if described rate of temperature change exceeds preset temperature rate of change interval, control tested exemplar power-off, send the second failure message to chamber.
The jitter conditions of described rate of temperature change reflection chamber internal temperature, if chamber internal temperature jitter amplitude is excessive, described rate of temperature change can exceed preset temperature rate of change interval, now, the shake of chamber internal temperature can cause the test result error of operational factor of tested exemplar large.
Now, Load Box sends power-off control signal by CAN bus to chamber, and tested exemplar power-off is given in chamber, stops the test to tested exemplar.Meanwhile, Load Box also sends the second failure message by CAN bus to chamber, and the current chamber internal temperature of notice chamber rate of change has exceeded the preset temperature rate of change interval that can test tested exemplar.
Step 611: while testing tested exemplar, if receive the 3rd failure message that chamber sends, control tested exemplar power-off.
In the time that chamber is broken down, cannot proceed test to tested exemplar, chamber sends the 3rd failure message by CAN bus to Load Box, and Load Box sends power-off control signal by CAN bus to chamber, tested exemplar power-off is given in chamber, stops the test to tested exemplar.
As shown in the above, the present invention also has following beneficial effect:
In the process of sample being tested in chamber, in the time that the problems such as chamber internal temperature or the fault of chamber own cause tested exemplar normally to move, Load Box controls tested exemplar is carried out to power-off, stop tested exemplar to test, after pending fault is got rid of, then continue tested exemplar to test.The precision of the further like this operational factor that has improved the tested exemplar recording, can avoid causing cannot normally working to the tested exemplar of tested exemplar test process the operational factor that records inaccurate.
Embodiment tri-
Fig. 7 is a kind of device embodiment tri-structural representations of controlling tested exemplar operation of the present invention, and embodiment tri-is and the corresponding device of method described in embodiment mono-that described device comprises:
Collecting unit 701, for the chamber internal temperature values gathering according to default sample frequency.
Acquiring unit 702, for obtaining the first temperature value and the second temperature value, described the first temperature value is current gathered chamber internal temperature values, described the second temperature value is that the last chamber internal temperature values gathering is as the second temperature value.
The first computing unit 703, for calculating Current Temperatures rate of change according to described the first temperature value, described the second temperature value and described default sample frequency.
The second computing unit 704, for calculating the current temperature difference according to described the first temperature value and default target temperature value.
Similar with embodiment mono-herein, the description to method in reference example one, repeats no more here.
Embodiment tetra-
Fig. 8 is a kind of device embodiment tetra-structural representations of controlling tested exemplar operation of the present invention, and embodiment tetra-is and the corresponding device of method described in embodiment bis-that described device comprises:
Collecting unit 701, for the chamber internal temperature values gathering according to default sample frequency.
Acquiring unit 702, for obtaining the first temperature value and the second temperature value, described the first temperature value is current gathered chamber internal temperature values, described the second temperature value is that the last chamber internal temperature values gathering is as the second temperature value.
The first computing unit 703, for calculating Current Temperatures rate of change according to described the first temperature value, described the second temperature value and described default sample frequency.
The second computing unit 704, for calculating the current temperature difference according to described the first temperature value and default target temperature value.
Described control module 705 comprises:
First controls subelement 801, for when described rate of temperature change is in preset temperature rate of change interval, and the described current temperature difference is in the default temperature difference interval time, and current chamber internal temperature state is steady state (SS), control tested exemplar and power on, test tested exemplar;
Second controls subelement 802, when described rate of temperature change is not in preset temperature rate of change interval or the described current temperature difference not in the default temperature difference interval time, current chamber internal temperature state, for treating steady state (SS), is controlled tested exemplar and is powered on, the tested exemplar of delayed test;
The 3rd controls subelement 803, when described rate of temperature change is not in preset temperature rate of change interval, and the described current temperature difference is also in the default temperature difference interval time, and current chamber internal temperature state is adjustment state, do not control tested exemplar and power on, do not test detected sample part.
Here it should be noted that, first controls subelement 801, the second control subelement 802 and the 3rd control subelement 803 can adopt same control subelement in actual applications, also can adopt different control subelements, does not specifically limit here.
Fisrt fault control module 804, when testing tested exemplar, if described the first temperature value exceedes the highest default probe temperature or during lower than default minimum probe temperature, control tested exemplar power-off, sends Fisrt fault information to chamber.
The second fail-safe control unit 805, when testing tested exemplar, if described rate of temperature change exceeds preset temperature rate of change interval, controls tested exemplar power-off, sends the second failure message to chamber.
The 3rd fail-safe control unit 806, when testing tested exemplar, if receive the 3rd failure message that chamber sends, controls tested exemplar power-off.
Fisrt fault control module 804, the second fail-safe control unit 805 and the 3rd fail-safe control unit 806 can adopt same fail-safe control unit in actual applications, also can adopt different fail-safe control unit, specifically do not limit here.
The above is only the preferred embodiment of the present invention; it should be pointed out that for those skilled in the art, under the premise without departing from the principles of the invention; can also make some improvements and modifications, these improvements and modifications also should be considered as protection scope of the present invention.
Claims (10)
1. a method of controlling tested exemplar operation, is characterized in that, described method comprises:
The chamber internal temperature values gathering according to default sample frequency;
Obtain the first temperature value and the second temperature value, described the first temperature value is current gathered chamber internal temperature values, and described the second temperature value is that the last chamber internal temperature values gathering is as the second temperature value;
Calculate Current Temperatures rate of change according to described the first temperature value, described the second temperature value and described default sample frequency;
Calculate the current temperature difference according to described the first temperature value and default target temperature value;
Obtain current chamber internal temperature state according to described rate of temperature change and the described current temperature difference, according to the tested exemplar operation of described chamber internal temperature state control.
2. method according to claim 1, is characterized in that, describedly obtains current chamber internal temperature state according to described rate of temperature change and the described current temperature difference, draws together according to the tested exemplar running package of described chamber internal temperature state control:
When described rate of temperature change is in preset temperature rate of change interval, and the described current temperature difference is in the default temperature difference interval time, and current chamber internal temperature state is steady state (SS), controls tested exemplar and powers on, and tests tested exemplar;
When described rate of temperature change is not in preset temperature rate of change interval or the described current temperature difference not in the default temperature difference interval time, current chamber internal temperature state, for treating steady state (SS), is controlled tested exemplar and is powered on, the tested exemplar of delayed test;
When described rate of temperature change is not in preset temperature rate of change interval, and the described current temperature difference is also in the default temperature difference interval time, and current chamber internal temperature state is adjustment state, does not control tested exemplar and powers on, and does not test detected sample part.
3. method according to claim 1, is characterized in that, described method also comprises:
While testing tested exemplar, if described the first temperature value exceedes the highest default probe temperature or during lower than default minimum probe temperature, control tested exemplar power-off, send Fisrt fault information to chamber.
4. according to the method described in claim 1-3 any one, it is characterized in that, described method also comprises:
While testing tested exemplar, if described rate of temperature change exceeds preset temperature rate of change interval, control tested exemplar power-off, send the second failure message to chamber.
5. according to the method described in claim 1-3 any one, it is characterized in that, described method also comprises:
While testing tested exemplar, if receive the 3rd failure message that chamber sends, control tested exemplar power-off.
6. a device of controlling tested exemplar operation, is characterized in that, described device comprises:
Collecting unit, for the chamber internal temperature values gathering according to default sample frequency;
Acquiring unit, for obtaining the first temperature value and the second temperature value, described the first temperature value is current gathered chamber internal temperature values, described the second temperature value is that the last chamber internal temperature values gathering is as the second temperature value;
The first computing unit, for calculating Current Temperatures rate of change according to described the first temperature value, described the second temperature value and described default sample frequency;
The second computing unit, for calculating the current temperature difference according to described the first temperature value and default target temperature value;
Control module, for obtaining current chamber internal temperature state according to described rate of temperature change and the described current temperature difference, according to the tested exemplar operation of described chamber internal temperature state control.
7. device according to claim 6, is characterized in that, described control module comprises:
First controls subelement, and for when described rate of temperature change is in preset temperature rate of change interval, and the described current temperature difference is in the default temperature difference interval time, and current chamber internal temperature state is steady state (SS), controls tested exemplar and powers on, and tests tested exemplar;
Second controls subelement, when described rate of temperature change is not in preset temperature rate of change interval or the described current temperature difference not in the default temperature difference interval time, current chamber internal temperature state, for treating steady state (SS), is controlled tested exemplar and is powered on, the tested exemplar of delayed test;
The 3rd controls subelement, when described rate of temperature change is not in preset temperature rate of change interval, and the described current temperature difference is also in the default temperature difference interval time, and current chamber internal temperature state is adjustment state, do not control tested exemplar and power on, do not test detected sample part.
8. device according to claim 6, is characterized in that, described device also comprises:
Fisrt fault control module, when testing tested exemplar, if described the first temperature value exceedes the highest default probe temperature or during lower than default minimum probe temperature, control tested exemplar power-off, sends Fisrt fault information to chamber.
9. according to the device described in claim 6-8 any one, it is characterized in that, described device also comprises:
The second fail-safe control unit, when testing tested exemplar, if described rate of temperature change exceeds preset temperature rate of change interval, controls tested exemplar power-off, sends the second failure message to chamber.
10. according to the device described in claim 6-8 any one, it is characterized in that, described device also comprises:
The 3rd fail-safe control unit, when testing tested exemplar, if receive the 3rd failure message that chamber sends, controls tested exemplar power-off.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410088172.9A CN103885408B (en) | 2014-03-11 | 2014-03-11 | A kind of method and apparatus controlling the operation of tested exemplar |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410088172.9A CN103885408B (en) | 2014-03-11 | 2014-03-11 | A kind of method and apparatus controlling the operation of tested exemplar |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103885408A true CN103885408A (en) | 2014-06-25 |
| CN103885408B CN103885408B (en) | 2016-08-17 |
Family
ID=50954356
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410088172.9A Active CN103885408B (en) | 2014-03-11 | 2014-03-11 | A kind of method and apparatus controlling the operation of tested exemplar |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN103885408B (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106066209A (en) * | 2016-05-31 | 2016-11-02 | 郑州海威光电科技有限公司 | Temperature alarming determination methods based on infrared measurement of temperature monitoring system |
| CN107703796A (en) * | 2017-09-20 | 2018-02-16 | 深圳市帆泰检测技术有限公司 | television environment pressure test device and method |
| CN107943171A (en) * | 2017-11-29 | 2018-04-20 | 深圳市亿兆互联技术有限公司 | A kind of machine room's intelligence control system |
| CN116414162A (en) * | 2023-01-31 | 2023-07-11 | 江苏拓米洛高端装备股份有限公司 | Temperature control method and device for test box and test box |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1470966A (en) * | 2002-07-24 | 2004-01-28 | δ����ҵ��ʽ���� | Method for compensating deviation of test temperature |
| US20080255683A1 (en) * | 2007-04-13 | 2008-10-16 | Tokyo Electron Limited | Heat processing apparatus, method of automatically tuning control constants, and storage medium |
| CN101354429A (en) * | 2008-09-12 | 2009-01-28 | 北京圣涛平试验工程技术研究院有限责任公司 | Integrated circuit thermal vacuum test method |
| CN201795928U (en) * | 2010-08-20 | 2011-04-13 | 重庆仪表材料研究所 | Magnetorheological damper test stand capable of testing in low and high temperature environments |
| CN102288367A (en) * | 2010-06-17 | 2011-12-21 | Inpro汽车产业创新先进生产系统有限公司 | Method for non-destructive testing of at least partially open hollow components or system components for tightness in series production |
| CN103308340A (en) * | 2013-06-28 | 2013-09-18 | 北京航空航天大学 | Thermal test method and device of equipment compartment of stratospheric aerostat |
-
2014
- 2014-03-11 CN CN201410088172.9A patent/CN103885408B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1470966A (en) * | 2002-07-24 | 2004-01-28 | δ����ҵ��ʽ���� | Method for compensating deviation of test temperature |
| US20040019452A1 (en) * | 2002-07-24 | 2004-01-29 | Mirae Corporation | Methods for compensating for a test temperature deviation |
| US20080255683A1 (en) * | 2007-04-13 | 2008-10-16 | Tokyo Electron Limited | Heat processing apparatus, method of automatically tuning control constants, and storage medium |
| CN101354429A (en) * | 2008-09-12 | 2009-01-28 | 北京圣涛平试验工程技术研究院有限责任公司 | Integrated circuit thermal vacuum test method |
| CN102288367A (en) * | 2010-06-17 | 2011-12-21 | Inpro汽车产业创新先进生产系统有限公司 | Method for non-destructive testing of at least partially open hollow components or system components for tightness in series production |
| CN201795928U (en) * | 2010-08-20 | 2011-04-13 | 重庆仪表材料研究所 | Magnetorheological damper test stand capable of testing in low and high temperature environments |
| CN103308340A (en) * | 2013-06-28 | 2013-09-18 | 北京航空航天大学 | Thermal test method and device of equipment compartment of stratospheric aerostat |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106066209A (en) * | 2016-05-31 | 2016-11-02 | 郑州海威光电科技有限公司 | Temperature alarming determination methods based on infrared measurement of temperature monitoring system |
| CN106066209B (en) * | 2016-05-31 | 2018-09-28 | 郑州海威光电科技有限公司 | Temperature alarming judgment method based on infrared measurement of temperature monitoring system |
| CN107703796A (en) * | 2017-09-20 | 2018-02-16 | 深圳市帆泰检测技术有限公司 | television environment pressure test device and method |
| CN107943171A (en) * | 2017-11-29 | 2018-04-20 | 深圳市亿兆互联技术有限公司 | A kind of machine room's intelligence control system |
| CN116414162A (en) * | 2023-01-31 | 2023-07-11 | 江苏拓米洛高端装备股份有限公司 | Temperature control method and device for test box and test box |
Also Published As
| Publication number | Publication date |
|---|---|
| CN103885408B (en) | 2016-08-17 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN103885408A (en) | Method and device for controlling operation of tested sample piece | |
| CN104930660B (en) | Air condition monitoring method and monitoring device | |
| CN210433482U (en) | Magnetic resonance apparatus with cooling system monitoring | |
| EP3819616A1 (en) | Improving, detecting and indicating stability in an industrial temperature dry block calibrator | |
| CN111397171A (en) | Compressor frequency control method and device and air conditioner | |
| CN103970124B (en) | The online test method of process control loops multicycle vibration | |
| EP3591836A1 (en) | Processing device | |
| CN203178052U (en) | Blade vibration fatigue automatic test system | |
| CN104597934A (en) | Intelligent cooler control system and method for transformer | |
| CN102183947B (en) | Detection device for temperature-sensing thermal actuators | |
| CN106353681A (en) | Detecting device for automobile motor and transmission sensor | |
| CN104819500A (en) | Extractor hood as well as gas flow detection method, device and air speed control method | |
| CN103018780A (en) | Probe-type high-frequency-response liquid metal leakage detector | |
| CN107677440B (en) | Center zero control method and system of vibrating table | |
| CN107562088B (en) | Temperature controller for resistance measurement and temperature control method | |
| RU2014104154A (en) | SYSTEM AND METHOD OF CONTROL AC GENERATOR | |
| KR20140137387A (en) | Method and devices for operating a heatable exhaust sensor | |
| CN102539137A (en) | Detector and detection method for electromagnetic valve of automobile automatic transmission | |
| CN107562092B (en) | Programmable controllable temperature control circuit, method and medium | |
| CN114690620B (en) | Electronic load PID self-tuning method and system | |
| CN109375665A (en) | Temperature-controlling system and method | |
| CN202058035U (en) | A temperature-sensitive thermal actuator detection device | |
| CN103605356A (en) | Durability testing device for pure electric vehicle driving controller | |
| CN102607613B (en) | Fiber optical sensor wavelength demodulation equipment | |
| CN111141781B (en) | Test method and system for heat impedance of radiator |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |