CN103869117A - Waveform detection method and oscilloscope - Google Patents

Waveform detection method and oscilloscope Download PDF

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Publication number
CN103869117A
CN103869117A CN201210539554.XA CN201210539554A CN103869117A CN 103869117 A CN103869117 A CN 103869117A CN 201210539554 A CN201210539554 A CN 201210539554A CN 103869117 A CN103869117 A CN 103869117A
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China
Prior art keywords
waveform
cover
surveyed area
waveform cover
information
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CN201210539554.XA
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CN103869117B (en
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张霞
游宇
王悦
王铁军
李维森
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Rigol Technologies Inc
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Rigol Technologies Inc
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Abstract

The invention relates to the test measurement technical field, and especially relates to a waveform detection method and an oscilloscope; the method comprises the following steps: inputting boundary positional information of at least one detection area on the oscilloscope; obtaining waveform information of a presently displayed tested waveform; generating at least one detection area according to the boundary positional information, and generating a waveform shield used for waveform detection in the detection area according to the waveform information; in the detection area, the waveform shield is employed to detect whether the waveform information of the tested waveform is in a scope limited by the waveform shield or not. Through the method and the oscilloscope, the detection area is freely arranged on a lower computer like the oscilloscope, so a lower hardware source can be employed to realize flexible arrangement of the detection area.

Description

A kind of wave test method and oscillograph
Technical field
The present invention relates to thermometrically technical field, relate in particular to a kind of wave test method and oscillograph.
Background technology
MASK test is a kind of method of wave test, and it specifically hides a upper waveform cover (MASK) to waveform, if can't see waveform after the upper waveform cover of cover, and so just correct (PASS/GO), otherwise be exactly wrong (FAIL/NO GO).
The method that realizes in the prior art MASK test is a lot, wherein mainly comprises based on wave test, and another kind is to detect based on grating.
Way based on wave test is, waveform and the waveform cover (MASK) of input are compared, and drops on waveform within MASK just correct, otherwise mistake.Relatively referring to by the edge of the value of waveform and MASK (top and bottom) relatively here.
The method detecting based on grating is, based on the screen that shows a frame waveform, need to analyze the Wave data in whole screen, and be not only the upper lower limb of Mask by test module.In like manner, also need MASK to cover on screen, see that waveform is exactly FAIL, can't see waveform is exactly PASS.
Detecting and carry out after drawing waveforms based on grating, is that drawing waveforms carries out before based on wave test.
Existing MASK test is all that the full time zone of the time shaft (T) based on whole waveform generates MASK, that is to say the scope (MASK) of user on can only designated magnitude axle (Y), and scope on cannot fixed time axle (T).Even if some MASK based on grating can realize axle ineffective time equally by the setting of MASK, but this assignment procedure trouble very, almost cannot on desk-top oscillograph, directly carry out, often need to set this MASK by host computer, and then import on desk-top oscillograph.
Summary of the invention
The embodiment of the present invention needs and host computer exchanges data frequently while utilizing MASK detection waveform in order to solve in prior art, cause the burden of the communication resource, and can not detect targetedly a certain section of waveform, make to detect inflexible problem, a kind of wave test method and oscillograph are provided especially.
Wherein, a kind of wave test method that the embodiment of the present invention provides, comprises,
On oscillograph, input the boundary position information of at least one surveyed area;
Obtain the shape information of the tested waveform of current demonstration;
According to described at least one surveyed area of boundary position Information generation, and in described surveyed area, generate the waveform cover for wave test according to described shape information;
Whether the shape information that detects described tested waveform according to described waveform cover in described surveyed area is in described waveform cover limited range.
According to method described in the embodiment of the present invention further aspect, described surveyed area can comprise hough transform region, triangle detection region, circle detection region, polygon detecting region.
According to another further aspect of method described in the embodiment of the present invention, according to described at least one surveyed area of boundary position Information generation, and the waveform cover MASK generating in described surveyed area according to described shape information for wave test further comprises, by the adjustment to waveform cover horizontal amplitude and vertical size, adjust the shape of described waveform cover.
According to another further aspect of method described in the embodiment of the present invention, also comprise: obtain the dot information showing in screen after the translation of waveform cover according to translation instruction, utilize described dot information to generate the waveform cover after translation.
The embodiment of the present invention also provides a kind of oscillograph with wave test function,
Comprise input block, shape information acquiring unit, waveform cover generation unit, detecting unit;
Described input block, for inputting the boundary position information of at least one surveyed area;
Described shape information acquiring unit, for obtaining shape information;
Described waveform cover generation unit for according to described at least one surveyed area of boundary position Information generation, and generates the waveform cover for wave test in described surveyed area according to described shape information;
Described detecting unit, whether correct for detect described waveform according to described waveform cover in described surveyed area.
According to an oscillographic further aspect described in the embodiment of the present invention, also comprise adjustment unit, for sending the regulated value of waveform cover to described waveform cover generation unit, in order to adjust the shape of described waveform cover, wherein said regulated value comprises described waveform cover horizontal amplitude and vertical size.
According to oscillographic another further aspect described in the embodiment of the present invention, also comprise translation unit, be the dot information showing in screen after the translation of waveform cover by translation instruction transformation, send described dot information to waveform cover generation unit, in order to generate the waveform cover after translation.
By method and the oscillograph of the embodiment of the present invention, at the cofree surveyed area that arranges of for example oscillograph of slave computer, realizing surveyed area flexibly with lower hardware resource sets, then in surveyed area, generate waveform cover, for a certain section of waveform of accurate detection, realize cost lower, do not need the cooperation of host computer, avoided the wasting of resources of mass data transmission.
Accompanying drawing explanation
Accompanying drawing described herein is used to provide a further understanding of the present invention, forms the application's a part, does not form limitation of the invention.In the accompanying drawings:
The process flow diagram of a kind of wave test method that Fig. 1 provides for the embodiment of the present invention;
Figure 2 shows that a kind of oscillographic structural representation with wave test function of the embodiment of the present invention;
Figure 3 shows that the particular flow sheet of a kind of wave test method of the embodiment of the present invention;
Figure 4 shows that the embodiment of the present invention carries out the schematic diagram of waveform cover translation;
Figure 5 shows that the method flow diagram that embodiment of the present invention multistage waveform cover detects;
Figure 6 shows that the schematic diagram of embodiment of the present invention multistage waveform cover.
Embodiment
For making object, technical scheme and the advantage of the embodiment of the present invention clearer, below in conjunction with embodiment and accompanying drawing, the embodiment of the present invention is described in further details.At this, schematic description and description of the present invention is used for explaining the present invention, but not as a limitation of the invention.
The process flow diagram of a kind of wave test method providing for the embodiment of the present invention as Fig. 1.
Comprise step 101, on oscillograph, input the boundary position information of at least one surveyed area.
Wherein can be by adjusting level, vertical cursor limited boundary position.
Step 102, obtains the shape information of the tested waveform of current demonstration.Wherein, the display data on the screen that shape information is waveform.
Step 103 according to described at least one surveyed area of boundary position Information generation, and generates the waveform cover (MASK) for wave test in described surveyed area according to described shape information.
Whether correct step 104, detect described waveform according to described waveform cover in described surveyed area.
Wherein, described surveyed area can comprise hough transform region, triangle detection region, and circle detection region, polygon detecting region etc., described boundary position information comprises the coordinate that limits described surveyed area, for example triangle can be the coordinate on three summits; Circular central coordinate of circle and the radius that can be arranged by user determined boundary position information.
Described boundary information further comprises, the starting point on fixed time axle and the coordinate of terminal, the starting point of designated magnitude axle and the coordinate of terminal.
In described step 103, according to user, horizontal amplitude and vertical size that arrange or system default, expand take described shape information as benchmark, generates the waveform cover (MASK) for wave test in described surveyed area.Described step 103 also comprises, user can also pass through the adjustment to waveform cover horizontal amplitude and vertical size, adjusts the shape of described waveform cover.
According to the above embodiments, can be using described waveform cover as waveform cover described in an integral translation, be the dot information showing in screen after the translation of waveform cover by translation instruction transformation, utilize described dot information to generate the waveform cover after translation.
Pass through above-described embodiment, by at the cofree surveyed area that arranges of for example oscillograph of slave computer, realizing surveyed area flexibly with lower hardware resource sets, then in surveyed area, generate waveform cover, for a certain section of waveform of accurate detection, realize cost lower, do not need the cooperation of host computer, avoided the wasting of resources of mass data transmission.
Be illustrated in figure 2 a kind of oscillographic structural representation with wave test function of the embodiment of the present invention.
Comprise input block 201, shape information acquiring unit 202, waveform cover generation unit 203, detecting unit 204.
Described input block 201, for inputting the boundary position information of at least one surveyed area.
Described shape information acquiring unit 202, for obtaining shape information.
Described waveform cover generation unit 203 for according to described at least one surveyed area of boundary position Information generation, and generates the waveform cover for wave test in described surveyed area according to described shape information.
Described detecting unit 204, whether correct for detect described waveform according to described waveform cover in described surveyed area.
Also comprise adjustment unit 205, by inputting adjusted value to described adjustment unit 205, send the regulated value of waveform cover to described waveform cover generation unit 203, in order to adjust the shape of described waveform cover, wherein said regulated value comprises described waveform cover horizontal amplitude and vertical size.
Also comprise translation unit 206, as a whole for described waveform cover is done, waveform cover described in translation, is the dot information showing in screen after the translation of waveform cover by translation instruction transformation, send described dot information to waveform cover generation unit 203, in order to generate the waveform cover after translation.
Pass through above-described embodiment, by at slave computer, the cofree surveyed area that arranges of for example oscillograph, realizing surveyed area flexibly with lower hardware resource sets, then in surveyed area, generate waveform cover, for a certain section of waveform of accurate detection, realize cost lower, do not need the cooperation of host computer, avoided the wasting of resources of mass data transmission.
Be illustrated in figure 3 the particular flow sheet of a kind of wave test method of the embodiment of the present invention.
Step 301, user is by the boundary position information in the key-press input hough transform region on oscillograph, boundary position information comprises the coordinate on 4 summits, hough transform region in this example,, A on the time shaft of horizontal direction and the coordinate of B, the C of vertical direction and the coordinate of D, determine position and the size of surveyed area.
Certainly, user can input the boundary position information of multiple surveyed areas in this example, to determine multiple surveyed areas, or surveyed area can also be set as to the pattern of full frame detection, that is, surveyed area is whole screen scope.
Step 302, obtains the shape information in screen, and for example waveform of the current demonstration of oscillograph is sinusoidal wave or is the waveform of other shape.
Step 303, according to the boundary position information of described surveyed area, generates hough transform region in the relevant position of oscillograph screen.
Step 304, identify the shape of described sine wave in described hough transform region, in described hough transform region, generate waveform cover as basis take this sine wave shape,, on the basis of the waveform in described hough transform region, the horizontal amplitude arranging according to user and vertical size generate a waveform cover with certain width, and the shape of this waveform cover is consistent with the shape of the waveform in described hough transform region.
Step 305, the horizontal amplitude and the vertical size that call adjustment unit adjusting waveform cover by button, in the time regulating described horizontal amplitude, described waveform cover will stretch along horizontal direction, in the time regulating described vertical size, described waveform cover will stretch along vertical direction.
The information that waveform after described stretching is covered on to the point showing in oscillograph screen sends oscillographic waveform cover generation unit to, in order to regenerate the waveform cover after stretching, the described point that sends waveform cover generation unit to can both uniquely be determined this position in screen, and there is identification information, for example can utilize 0 or 255 to represent that the point of this waveform cover is positioned at outside described surveyed area, during for other value, it is the up-and-down boundary of waveform cover, for example, within this value 200 represents that the point of this waveform cover is positioned at described surveyed area, generate the waveform cover of this position.In the time of detection waveform, according to Wave data with described in be positioned at the comparison of the waveform cover of surveyed area, obtain testing result.
Step 306, calls waveform cover described in translation unit translation by translation button, and this translation in this example can be as shown in Figure 4, and four summits of surveyed area are A, B, C, D, and described waveform cover is moved horizontally to the right as an entirety.
Similar in the concrete operations of translation waveform cover and step 305 in this step, translation unit obtains the parameters such as moving direction, displacement according to translation instruction, go out the information of the point showing after the translation of waveform cover in oscillograph screen according to described calculation of parameter, send the information of described point to waveform generation unit, waveform generation unit is according to the Information generation waveform cover of point, and the information of these points equally also can represent by the value of 0-255.In addition,, according to the parameter being obtained by translation instruction, information translation unit will be reorientated the current location in wave test region, along with the mobile waveform surveyed area of waveform cover is also moving.For example screen laterally has 700 pixels, surveyed area be laterally 300th o'clock to the 400th point, 10 points of waveform cover along continuous straight runs transverse shifting, in described waveform cover translation instruction, the position of waveform cover point is and increases by 10 points to the right.
Above-mentioned steps 305 and step 306 not necessarily occur in each embodiment, and order in no particular order, are certain concrete example in this example, should not serve as limitation of the invention.
The order of above-mentioned steps 301 and 302 in no particular order, is certain concrete example in this example, should not serve as limitation of the invention.
Step 307, the continuous shape information of obtaining tested waveform, often obtains a frame shape information, judges whether the shape information in described surveyed area there will be outside the span of described waveform cover defined, if exceeded, enter prompting user failure, otherwise prompting user success.
Be illustrated in figure 5 the method flow diagram that embodiment of the present invention multistage waveform cover detects.
Step 501, user is by the boundary position information in the key-press input hough transform region on oscillograph, and boundary position information comprises the coordinate on 12Ge summit, 3 hough transform regions in this example.
Step 502, obtains the shape information in screen, and for example the waveform of the current demonstration of oscillograph as shown in Figure 6.
Step 503, according to the boundary position information of described surveyed area, generates hough transform region in the relevant position of oscillograph screen.
Step 504, identify the shape of described waveform in described hough transform region, in described hough transform region, generate waveform cover as basis take this waveform,, on the basis of the waveform in described hough transform region, generate a waveform cover with certain width, the shape of this waveform cover is consistent with the shape of the waveform in described hough transform region.
Three surveyed areas of multiple waveform covers are respectively A, B, C, respectively the level of surveyed area and upright position are recorded and pass to waveform cover generation unit.Waveform cover generation unit can generate a complete MASK according to the positional information of surveyed area and current shape information, and this MASK is the up-to-date waveform cover after three surveyed area restrictions.The coboundary of multiple waveform covers and the starting point of lower boundary and terminal are respectively, region A(aAd, aAd ', aAt, aAt '), region B(bBd, bBd ', bBt, bBt '), region C(cCd, cCd ', cCt, cCt '), wherein the coordinate of aAd is (aX0, aYd0), the coordinate of aAd ' is (aX1, aYdn), the coordinate of aAt is (aX0, aYt0), the coordinate of aAt ' is (aX1, aYtn), the coordinate of aBd is (bX0, bYd0), the coordinate of bBd ' is (bX1, bYdn), the coordinate of bBt is (bX0, bYt0), the coordinate of bBt ' is (bX1, bYtn), the coordinate of cCd is (cX0, cYd0), the coordinate of cCd ' is (cX1, cYdn), the coordinate of cCt is (cX0, cYt0), the coordinate of cCt ' is (cX1, cYtn).The up-and-down boundary value of waveform cover is as follows:
700 points of waveform cover upper boundary values:
……aYt0,aYt1,aYt2,aYt3~~~~~~~aYtn……bYt0,bYt?1,bYt2~~~~~bYtn……cYt0,cYt1,cYt2,cYt3~~~~cYtn……
700 points of waveform cover lower border value:
……aYd0,aYd1,aYd2,aYd3~~~~~~aYdn……bYd0,bYd1,bYd2~~~~bYdn……cYd0,cYd1,cYd2,cYd3~~~~cYdn……
Wherein ... represent the point of non-waveform cover, ~ representing abridged coordinate points between waveform cover coordinate points, the some sum of the point of the non-waveform cover in coboundary and waveform cover is 700, the some sum of the point of the non-waveform cover of lower boundary and waveform cover is also 700.
Described waveform cover generation unit generates waveform cover according to waveform cover coordinate points.
Step 505, judges whether the Wave data in described surveyed area there will be outside the span of described waveform cover defined, if exceeded, enters prompting user failure, otherwise prompting user success.
For example, as any point P on waveform, the horizontal level of this point is 200, is bYt0 if then check in the 200th data in waveform cover upper boundary values, and in waveform cover lower border value, the 200th data are bYd0,, if bYd0<P<bYt0, illustrates that this data point passes through, and starts to test next data point, otherwise directly exit, what determine this waveform is unsuccessfully by test result.
Pass through above-described embodiment, by at the cofree surveyed area that arranges of for example oscillograph of slave computer, realizing surveyed area flexibly with lower hardware resource sets, then in surveyed area, generate waveform cover, for a certain section of waveform of accurate detection, realize cost lower, do not need the cooperation of host computer, avoided the wasting of resources of mass data transmission.
Above-described specific embodiment; object of the present invention, technical scheme and beneficial effect are further described; institute is understood that; the foregoing is only specific embodiments of the invention; the protection domain being not intended to limit the present invention; within the spirit and principles in the present invention all, any modification of making, be equal to replacement, improvement etc., within all should being included in protection scope of the present invention.

Claims (7)

1. a wave test method, is characterized in that comprising,
On oscillograph, input the boundary position information of at least one surveyed area;
Obtain the shape information of the tested waveform of current demonstration;
According to described at least one surveyed area of boundary position Information generation, and in described surveyed area, generate the waveform cover for wave test according to described shape information;
Whether the shape information that detects described tested waveform according to described waveform cover in described surveyed area is in described waveform cover limited range.
2. method according to claim 1, is characterized in that, described surveyed area can comprise hough transform region, triangle detection region, circle detection region, polygon detecting region.
3. method according to claim 1, it is characterized in that, according to described at least one surveyed area of boundary position Information generation, and the waveform cover MASK generating in described surveyed area according to described shape information for wave test further comprises, by the adjustment to waveform cover horizontal amplitude and vertical size, adjust the shape of described waveform cover.
4. method according to claim 1, is characterized in that, also comprises: obtain the dot information showing in screen after the translation of waveform cover according to translation instruction, utilize described dot information to generate the waveform cover after translation.
5. there is an oscillograph for wave test function, it is characterized in that comprising,
Input block, shape information acquiring unit, waveform cover generation unit, detecting unit;
Described input block, for inputting the boundary position information of at least one surveyed area;
Described shape information acquiring unit, for obtaining shape information;
Described waveform cover generation unit for according to described at least one surveyed area of boundary position Information generation, and generates the waveform cover for wave test in described surveyed area according to described shape information;
Described detecting unit, whether correct for detect described waveform according to described waveform cover in described surveyed area.
6. oscillograph according to claim 5, it is characterized in that, also comprise adjustment unit, for the regulated value of waveform cover being sent to described waveform cover generation unit, in order to adjust the shape of described waveform cover, wherein said regulated value comprises described waveform cover horizontal amplitude and vertical size.
7. oscillograph according to claim 5, is characterized in that, also comprises translation unit, is the dot information showing in screen after the translation of waveform cover by translation instruction transformation, sends described dot information to waveform cover generation unit, in order to generate the waveform cover after translation.
CN201210539554.XA 2012-12-13 2012-12-13 A kind of waveforms detection method and oscillograph Active CN103869117B (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113449264A (en) * 2020-03-27 2021-09-28 中国移动通信集团设计院有限公司 Method and device for monitoring waveform edge

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CN1289047A (en) * 1999-09-14 2001-03-28 特克特朗尼克公司 Method for time-marking of waveshape edge of input signals
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JPS6449971A (en) * 1987-08-19 1989-02-27 Nec Corp Pulse mask system used for oscilloscope
JPH0599965A (en) * 1991-10-14 1993-04-23 Nec Corp Pulse wave shape measuring system
CN1289047A (en) * 1999-09-14 2001-03-28 特克特朗尼克公司 Method for time-marking of waveshape edge of input signals
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Publication number Priority date Publication date Assignee Title
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CN113449264B (en) * 2020-03-27 2023-08-15 中国移动通信集团设计院有限公司 Waveform edge monitoring method and device

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