CN103868921A - Method for determining emissivity of key surface coating of weak target detection infrared camera - Google Patents

Method for determining emissivity of key surface coating of weak target detection infrared camera Download PDF

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CN103868921A
CN103868921A CN201410073596.8A CN201410073596A CN103868921A CN 103868921 A CN103868921 A CN 103868921A CN 201410073596 A CN201410073596 A CN 201410073596A CN 103868921 A CN103868921 A CN 103868921A
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stray light
emissivity
light
target detection
external stray
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阮宁娟
苏云
郭崇玲
吴立民
赵海博
胡斌
郑国宪
肖思
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Beijing Research Institute of Mechanical and Electrical Technology
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Abstract

一种弱目标探测红外相机关键表面涂层发射率确定方法,弱目标探测红外相机的杂散光有内杂散光和外杂散光之分。在选取关键表面的发射率时,抑制措施对内部杂散光和外部杂散光的影响是相互矛盾的,需要对红外光学遥感器的内部杂散光和外部杂散光采取综合抑制措施。该方法通过分析弱目标探测红外相机关键表面涂层发射率值改变时内部杂散光和外部杂散光的变化趋势,找出表面涂层发射率的最优值,使得该发射率同时满足内部杂散光和外部杂散光的综合抑制要求。

A method for determining the emissivity of a coating on a key surface of a weak target detection infrared camera. The stray light of the weak target detection infrared camera is divided into internal stray light and external stray light. When selecting the emissivity of key surfaces, the effects of suppression measures on internal stray light and external stray light are contradictory, and it is necessary to take comprehensive suppression measures for internal stray light and external stray light of infrared optical remote sensors. This method finds the optimal value of the surface coating emissivity by analyzing the change trend of internal stray light and external stray light when the emissivity value of the key surface coating of the weak target detection infrared camera changes, so that the emissivity satisfies the requirement of internal stray light at the same time. Combined suppression requirements with external stray light.

Description

一种弱目标探测红外相机关键表面涂层发射率确定方法A Method for Determining Emissivity of Key Surface Coatings of Infrared Cameras for Weak Target Detection

技术领域technical field

本发明涉及一种弱目标探测红外相机关键表面涂层发射率确定方法,主要应用于航空或者航天领域的弱目标探测红外相机的杂散辐射分析和抑制设计中。The invention relates to a method for determining the emissivity of a key surface coating of a weak target detection infrared camera, which is mainly used in the stray radiation analysis and suppression design of the weak target detection infrared camera in the field of aviation or spaceflight.

背景技术Background technique

对于一个工作状态下的弱目标探测红外相机,例如红外导引头相机或者天基红外预警相机,到达相机的红外探测器阵列上的杂散光可分为两大类:一类是相机物空间视场以外的杂散光,称为外部杂散光,杂散光源如太阳光和地气漫反射光;另一类是相机的光机系统自身在内部产生的热辐射,称为内部杂散光,杂散光源例如结构组件、透镜、反射镜等元件表面等,这部分杂散光是由系统自身的温度、发生热辐射表面的发射率和面积等因素决定的。在弱目标探测红外相机中,不管内部杂散光还是外部杂散光,若抑制效果不理想,都会造成对目标的误判或者虚警,极大影响对目标的探测效能。For a weak target detection infrared camera in a working state, such as an infrared seeker camera or a space-based infrared early warning camera, the stray light reaching the infrared detector array of the camera can be divided into two categories: one is the camera object space vision The stray light outside the field is called external stray light, and stray light sources such as sunlight and diffuse reflection light of the earth atmosphere; the other type is the thermal radiation generated by the camera's optical-mechanical system itself, called internal stray light, stray light Light sources such as structural components, lenses, mirrors and other component surfaces, etc., this part of stray light is determined by the temperature of the system itself, the emissivity and area of the surface where thermal radiation occurs, and other factors. In weak target detection infrared cameras, regardless of internal stray light or external stray light, if the suppression effect is not ideal, it will cause misjudgment or false alarm of the target, which greatly affects the detection efficiency of the target.

目前对红外相机光学系统杂散光水平的抑制措施主要包括三大类:第一部分为对杂散光的宏观结构控制,其主要措施采取诸如遮光罩、挡光环等方式;第二类为对杂散光的微观结构控制,其主要措施采取诸如表面微螺纹、表面粗糙度合理化等方案;第三类主要利用表面的涂层特性。At present, the suppression measures for the level of stray light in the infrared camera optical system mainly include three categories: the first part is the macroscopic structure control of stray light, and its main measures adopt methods such as hoods and light blocking rings; the second category is the control of stray light. For microstructure control, the main measures are such as surface microthreads, surface roughness rationalization, etc.; the third category mainly uses the coating characteristics of the surface.

根据普朗克定律,辐射源表面涂层的发射率增大,将增大辐射源自身产生的灰体辐射功率,从而增大了内部杂散光对系统分辨率的影响。然而,抑制外部杂散光时,通过对表面图黑色涂层,来尽量增加光辐射能的吸收、减少光辐射能的反射和改善表面的散射特性,但增大光谱吸收率同时也增大光谱发射率。因此,在选取表面涂层的发射率时,对部内杂散光和外部杂散光的抑制作用往往相互矛盾。According to Planck's law, the increase of the emissivity of the surface coating of the radiation source will increase the gray body radiation power generated by the radiation source itself, thus increasing the influence of internal stray light on the system resolution. However, when suppressing external stray light, black coating is applied to the surface to maximize the absorption of light radiation energy, reduce the reflection of light radiation energy and improve the scattering characteristics of the surface, but increasing the spectral absorption rate also increases the spectral emission Rate. Therefore, when selecting the emissivity of the surface coating, the suppression effects on internal stray light and external stray light are often contradictory.

发明内容Contents of the invention

本发明要解决的技术问题是:克服现有弱目标探测红外相机关键表面涂层发射率设计对内、外部杂光的抑制效果相互矛盾的现状,提供一种弱目标探测红外相机关键表面涂层发射率确定方法,通过分析弱目标探测红外相机关键表面涂层发射率值改变时内部杂散光和外部杂散光的变化趋势,找出表面涂层发射率的最优值,使得该发射率同时满足内部杂散光和外部杂散光的综合抑制要求。The technical problem to be solved by the present invention is to overcome the current situation that the emissivity design of the key surface coating of the existing weak target detection infrared camera has contradictory effects on the suppression of internal and external stray light, and provide a key surface coating of the weak target detection infrared camera The emissivity determination method is to find out the optimal value of the emissivity of the surface coating by analyzing the change trend of internal stray light and external stray light when the emissivity value of the key surface coating of the weak target detection infrared camera changes, so that the emissivity satisfies both Combined suppression requirements for internal stray light and external stray light.

本发明的技术解决方案是:一种弱目标探测红外相机关键表面涂层发射率确定方法,其特征在于实现步骤如下:The technical solution of the present invention is: a method for determining the emissivity of the key surface coating of a weak target detection infrared camera, which is characterized in that the implementation steps are as follows:

(1)找出针对内部杂散光和外部杂散光相同的关键表面;所述的内部杂散光指的是弱目标探测红外相机系统自身在内部产生的热辐射,杂散光源,例如结构组件、透镜、反射镜等元件表面,这部分杂散光是由相机自身的温度、发生热辐射元件的表面发射率和面积等因素决定的;所述的外部杂散光指的是弱目标探测红外相机物空间视场以外的杂散光,杂散光源如太阳光、地气漫反射光;通过对内部杂散光和外部杂散光的分析,分别找出与内、外部杂散光相关的所有关键表面,找出针对内部杂散光和外部杂散光两者相同的关键表面;所述的关键表面可能包括1个或者多于1个,若为1个关键表面,则进行下述步骤1次;若为多于1个,则根据关键表面的个数分别重复进行下述步骤;(1) Find the same key surface for internal stray light and external stray light; the internal stray light refers to the thermal radiation generated internally by the weak target detection infrared camera system itself, stray light sources, such as structural components, lenses , mirrors and other component surfaces, this part of the stray light is determined by factors such as the temperature of the camera itself, the surface emissivity and area of the heat radiation component; the external stray light refers to the object space vision of the weak target detection infrared camera Stray light outside the field, stray light sources such as sunlight and diffuse reflection light from the earth; through the analysis of internal stray light and external stray light, find out all the key surfaces related to internal and external stray light, and find out the Both stray light and external stray light have the same critical surface; the critical surface may include 1 or more than 1, if it is 1 critical surface, perform the following steps once; if it is more than 1, Repeat the following steps according to the number of key surfaces;

(2)将步骤(1)中所述关键表面设置不同的表面发射率值,发射率的上限和下限均取决于目前的工程实际,例如设置9个发射率由0.1~0.9,间隔为0.1,重新进行弱目标探测红外相机的内部杂散光和外部杂散光的分析,分别找出内部杂散光和外部杂散光随发射率变化而变化的趋势;(2) Set different surface emissivity values for the key surfaces mentioned in step (1). The upper and lower limits of the emissivity depend on the current engineering practice. For example, set 9 emissivity values from 0.1 to 0.9 with an interval of 0.1. Re-analyze the internal stray light and external stray light of the weak target detection infrared camera, and find out the trends of internal stray light and external stray light as the emissivity changes;

(3)若步骤(2)中所述的内部杂散光和外部杂散光随发射率变化而变化的趋势相同,则取反射率的最大值0.9;若步骤(2)中的内部杂散光和外部杂散光随发射率变化而变化的趋势不同,则分别计算不同发射率下内部杂散光和外部杂散光的权重值,将不同发射率下内部杂散光和外部杂散光的权重值加和,找出权重值加和最小时所对应的发射率值,该发射率值即为关键表面的发射率取值,此时即完成了弱目标探测红外相机杂散光的综合抑制。(3) If the internal stray light and external stray light described in step (2) have the same changing trend with the change of emissivity, then take the maximum value of reflectance as 0.9; if the internal stray light and external stray light in step (2) The trend of stray light changing with emissivity changes is different, the weight values of internal stray light and external stray light under different emissivity are calculated respectively, and the weight values of internal stray light and external stray light under different emissivity are summed to find out The emissivity value corresponding to the minimum sum of the weight value is the emissivity value of the key surface. At this time, the comprehensive suppression of the stray light of the weak target detection infrared camera is completed.

本发明与现有技术相比的有益效果是:The beneficial effect of the present invention compared with prior art is:

(1)本发明克服了现有弱目标探测红外相机关键表面涂层发射率设计对内、外部杂光的抑制效果相互矛盾的现状,通过分析弱目标探测红外相机关键表面涂层发射率值改变时内部杂散光和外部杂散光的变化趋势,找出表面涂层发射率的最优值,使得该发射率同时满足内部杂散光和外部杂散光的综合抑制要求。(1) The present invention overcomes the current situation that the emissivity design of the key surface coating of the weak target detection infrared camera has contradictory effects on the suppression of internal and external stray light. By analyzing the change of the emissivity value of the key surface coating of the weak target detection infrared camera According to the change trend of internal stray light and external stray light, the optimal value of surface coating emissivity is found, so that the emissivity can meet the comprehensive suppression requirements of internal stray light and external stray light at the same time.

(2)本发明所提出的表面涂层发射率设计方法体现了对弱目标探测红外相机内部杂散光和外部杂散光的综合分析和抑制的思想,将该方法应用到具体的弱目标探测红外相机杂散辐射分析中,可为相机提供最佳的杂散辐射抑制措施,对提高弱目标红外相机的探测效能具有重要的意义。(2) The surface coating emissivity design method proposed by the present invention embodies the idea of comprehensive analysis and suppression of internal stray light and external stray light of weak target detection infrared cameras, and applies this method to specific weak target detection infrared cameras In the analysis of stray radiation, it can provide the best stray radiation suppression measures for the camera, which is of great significance to improve the detection efficiency of weak target infrared cameras.

附图说明Description of drawings

图1为本发明关键表面涂层发射率设计方法的实现流程图。Fig. 1 is a flow chart of the implementation of the key surface coating emissivity design method of the present invention.

具体实施方式Detailed ways

本发明的具体实施方式如图1所示,主要分为以下三个步骤实施:The specific embodiment of the present invention is shown in Figure 1, mainly is divided into following three steps and implements:

步骤一,找出针对内、外部杂散光相同的关键表面。所述的内部杂散光指的是弱目标探测红外相机系统自身在内部产生的热辐射,杂散光源例如结构组件、透镜、反射镜等元件表面等,这部分杂散光是由相机自身的温度、发生热辐射元件的表面发射率和面积等因素决定的;所述的外部杂散光指的是弱目标探测红外相机物空间视场以外的杂散光,杂散光源如太阳光、地气漫反射光。通过对内部杂散光和外部杂散光的分析,分别找出与内、外部杂散光相关的所有关键表面,找出针对二者相同的关键表面。所述的关键表面可能包括1个或者多于1个,若为1个关键表面,则进行步骤二和步骤三1次;若为多于1个,则根据重复进行步骤二和步骤三,重复次数与关键表面个数相同。Step one, find out the same key surface for internal and external stray light. The internal stray light refers to the thermal radiation generated internally by the weak target detection infrared camera system itself, stray light sources such as the surface of components such as structural components, lenses, mirrors, etc., this part of stray light is caused by the temperature of the camera itself, It is determined by factors such as the surface emissivity and area of the thermal radiation element; the external stray light refers to the stray light outside the field of view of the object space of the weak target detection infrared camera, stray light sources such as sunlight, diffuse reflection light of the earth atmosphere . Through the analysis of internal stray light and external stray light, find out all key surfaces related to internal and external stray light respectively, and find out the same key surface for both. The said key surface may include 1 or more than 1, if it is 1 key surface, then perform step 2 and step 3 once; if it is more than 1, then repeat step 2 and step 3, repeat The number of times is the same as the number of key surfaces.

步骤二,将步骤一中所述关键表面设置不同的表面发射率值,发射率的上限和下限均取决于目前的工程实际,设置9个发射率由0.1~0.9,间隔为0.1,进行弱目标探测红外相机的内、外部杂散光的分析和计算,得到9个发射率下内、外杂散光的权重值,图2所示为对某弱目标红外相机的内、外部杂散光的计算结果,该图列出了内、外部杂散光随着表面涂层发射率的变化的权重值。Step 2. Set different surface emissivity values for the key surfaces mentioned in step 1. The upper and lower limits of the emissivity depend on the current engineering practice. Set 9 emissivity values from 0.1 to 0.9 with an interval of 0.1 for weak targets The analysis and calculation of the internal and external stray light of the detection infrared camera obtains the weight values of the internal and external stray light under 9 emissivity. Figure 2 shows the calculation results of the internal and external stray light of a weak target infrared camera. This graph lists the weights of internal and external stray light as a function of surface coating emissivity.

步骤三,寻找内、外部杂散光随发射率变化而变化的趋势,若步骤二中所述的内、外杂散光随发射率变化而变化的趋势相同,则取反射率的最大值0.9;若步骤(2)中的内、外杂散光随发射率变化而变化的趋势不同,则说明统一发射率的取值对内、外部杂散辐射的抑制效果是矛盾的,如表1所示,Step 3, look for the trend of internal and external stray light changing with the change of emissivity, if the trend of internal and external stray light changing with the change of emissivity described in step 2 is the same, then take the maximum value of reflectance 0.9; if In step (2), the internal and external stray light have different changing trends with emissivity changes, which means that the uniform emissivity value has contradictory effects on the suppression of internal and external stray radiation, as shown in Table 1.

表1不同发射率关键表面的内部杂散光和外部杂散光权重Table 1 Internal stray light and external stray light weights for critical surfaces with different emissivity

Figure BDA0000471431270000041
Figure BDA0000471431270000041

将不同发射率下内、外杂散光的权重值加和,找出权重值加和最小时所对应的发射率值,该发射率值即为关键表面的发射率取值,表1中该关键表面涂层发射率取0.7时,内、外部杂散光的权重值加和为最小值,此时,该弱目标探测红外相机杂散光的关键表面涂层发射率的最优值为0.7,该流程结束。Sum the weight values of internal and external stray light under different emissivity, and find out the emissivity value corresponding to the minimum sum of weight values. This emissivity value is the emissivity value of the key surface. The key in Table 1 When the emissivity of the surface coating is 0.7, the sum of the weight values of the internal and external stray light is the minimum value. At this time, the optimal value of the emissivity of the surface coating for this weak target to detect the stray light of the infrared camera is 0.7. The process Finish.

本发明未作详细描述的内容属本领域技术人员的公知技术。The contents not described in detail in the present invention belong to the well-known technology of those skilled in the art.

Claims (1)

1. a little less than, target detection infrared camera critical surfaces coating emissivity is determined a method, it is characterized in that performing step is as follows:
(1) find out the critical surfaces identical with external stray light for inner parasitic light; Described inside parasitic light refers to weak target detection infrared camera system from the heat radiation, the source of stray light that produce in inside, and this part parasitic light is to be determined by the temperature of camera self, the slin emissivity that hot radiant element occurs and area factor; Described external stray light refers to the parasitic light beyond weak target detection infrared camera object space visual field; By the analysis to inner parasitic light and external stray light, find out respectively all critical surfaces relevant to inside and outside portion parasitic light, find out the critical surfaces identical with external stray light for inner parasitic light; Described critical surfaces may comprise 1 or more than 1, if 1 critical surfaces is carried out following step (2) once; If more than 1, repeat respectively following step (2) according to the number of critical surfaces;
(2) critical surfaces described in step (1) is arranged to different slin emissivity values, the upper and lower bound of emissivity all depends on current engineering reality, 9 emissivity are set by 0.1~0.9, be spaced apart 0.1, re-start the inside parasitic light of weak target detection infrared camera and the analysis of external stray light, find out respectively the trend that inner parasitic light and external stray light change with emissivity;
(3) if the inside parasitic light described in step (2) is identical with the trend that external stray light changes with emissivity, get the maximal value 0.9 of reflectivity; If the inside parasitic light in step (2) is different with the trend that external stray light changes with emissivity, calculate respectively the weighted value of inner parasitic light and external stray light under different emissivity, the weighted value of inner parasitic light and external stray light under different emissivity is added and, find out that weighted value adds and hour corresponding emissivity value, this emissivity value is the emissivity value of critical surfaces, has now completed the comprehensive inhibition of weak target detection infrared camera parasitic light.
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CN103063312A (en) * 2012-12-29 2013-04-24 南京理工大学 Measuring system and method for measuring object emissivity

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103063312A (en) * 2012-12-29 2013-04-24 南京理工大学 Measuring system and method for measuring object emissivity

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Title
李岩等: "红外光学遥感器内杂散光和外杂散光的综合抑制研究", 《光学学报》, vol. 33, no. 9, 30 September 2013 (2013-09-30) *

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Application publication date: 20140618