CN103792708B - A kind of test adaptor mechanism - Google Patents
A kind of test adaptor mechanism Download PDFInfo
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- CN103792708B CN103792708B CN201410056519.1A CN201410056519A CN103792708B CN 103792708 B CN103792708 B CN 103792708B CN 201410056519 A CN201410056519 A CN 201410056519A CN 103792708 B CN103792708 B CN 103792708B
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Abstract
The present invention relates to a kind of test adaptor mechanism, it comprises base plate, test board, body base to be measured, body to be measured and changeover mechanism, and described test board and body base to be measured are arranged on base plate respectively, and described body to be measured can be placed on body base to be measured.When lower lock block of the present invention presses down, compact heap compresses hand block, make hand block press down pressing plate, pressing plate presses down and makes pressing plate projection compress top board, under the action of the spring, top board moves down, probe can be exposed above top board, thus make probes touch arrive detection faces, realize signal conduction, then data acquisition board image data is transferred to test board, realizes switching.The present invention adapts to Mulit-point Connection, solves probe and installs difficulty; Switching also solves test board and repeatedly plugs to produce and hold flimsy problem, the present invention be used for the function of LCD display, performance test and design a kind of need not the mechanism of direct engaged test plate just energy test circuit, it is simple to operate, convenient test.
Description
Technical field:
The present invention relates to a kind of test adaptor structural establishment field, relate in particular a kind of function for LCD display, performance test and design a kind of need not directly engaged test plate just can the mechanism of test circuit.
Background technology:
The function of LCD display, performance need test, general be all direct engaged test plate to test its circuit, in test process, run into that difficulty installed by probe, test board repeatedly plugs to produce and holds flimsy problem sometimes, bring a lot of inconveniences to test, too increase production cost.
Summary of the invention:
The object of the invention is for the deficiencies in the prior art part, a kind of test adaptor mechanism is provided, adapt to Mulit-point Connection, solve probe and difficulty is installed; Switching also solves test board and repeatedly plugs the flimsy problem of generation appearance.
Technology solution of the present invention is as follows:
A kind of test adaptor mechanism, it comprises base plate, test board, body base to be measured, body to be measured and changeover mechanism, and described test board and body base to be measured are arranged on base plate respectively, and described body to be measured can be placed on body base to be measured.
Described changeover mechanism comprises support column, lower plate fixed by probe, probe, web joint, data acquisition board, cushion block, rotating shaft, pressing plate, pressing plate projection, top board, cover plate, probe are fixed upper plate, reference column, spring, guidepost, hand block, cushion block a, compressed base, compact heap and lower lock block, described support column lower end is fixed on base plate, upper end is provided with probe and fixes lower plate, and the rear portion that lower plate fixed by described probe is connected to pressing plate by rotating shaft; Described probe is fixed bottom lower plate and is provided with a plate, on web joint, both sides fix a reference column respectively, be provided with data acquisition board in the middle of web joint, the upper front end of data acquisition board is provided with organizes probe more, and the rear end of data acquisition board is fixed on base plate by cushion block; Described probe is fixed and lower plate is provided with probe is fixed upper plate, and two reference columns are fixed upper plate from probe and passed, and described probe is fixed lower plate and is provided with two springs, and two springs are positioned at the both sides that upper plate fixed by probe; Described top board is arranged on probe by reference column and fixes above upper plate, and top board and probe are fixed between lower plate and linked together by spring; Described probe is fixed lower plate and probe from probe and is fixed upper plate and pass, and spring in its natural state probe is also in top board inside, and top board is provided with probe aperture at corresponding probe location place; Described top board top is installed with cover plate, and the front side of described pressing plate is provided with a pressing plate projection, and the top of pressing plate is connected to hand block; Described base plate is fixed wtih cushion block a, cushion block a is fixed wtih compression base, compress in base and compact heap is installed, compact heap and lower lock block link together, described compression base is provided with a cascaded surface, described hand block right end side inserts below compact heap, and be positioned at compress base cascaded surface above.
When described lower lock block presses down, compact heap compresses hand block, make hand block press down pressing plate, pressing plate presses down and makes pressing plate projection compress top board, under the action of the spring, top board moves down, probe can be exposed above top board, thus make probes touch arrive detection faces, realize signal conduction, then data acquisition board image data is transferred to test board, realizes switching.
As preferably, described pressing plate projection lower end is Semicircular arched structure.
As preferably, described probe is fixed lower plate and is provided with four guideposts, and guidepost and top board link together, and guidepost play the guiding role, and can ensure that top board steadily presses down.
As preferably, described pressing plate projection is positioned at the left side of cover plate, directly contacts top board and can not contact cover plate when pressing plate projection presses down.
Beneficial effect of the present invention is:
Top board of the present invention has probe aperture, is cover plate above probe aperture, and top board inside has probe to fix upper plate, and there is reference column the both sides that upper plate fixed by probe, and reference column fixes upper plate through probe, location top board; Upper plate both sides fixed by probe simultaneously spring, and top board and probe are fixed between lower plate certain gap, and inside is spring, and spring in its natural state probe is also in top board inside; Be connected with guidepost bottom top board, when pressing plate presses down, because hand block right end side inserts compact heap lower end, now probe can be exposed top board overlying contact to detection faces by the effect of pressing plate projection and spring by top board, realize signal conduction, then data acquisition board image data is transferred to test board, realizes switching.The present invention adapts to Mulit-point Connection, solves probe and installs difficulty; Switching also solves test board and repeatedly plugs the flimsy problem of generation appearance, and it is simple to operate, easy to use, and switching fast.
Accompanying drawing illustrates:
Below in conjunction with accompanying drawing, the present invention is described further:
Fig. 1 is structural representation of the present invention;
Fig. 2 is the front view of Fig. 1;
Fig. 3 is the vertical view of Fig. 1;
Fig. 4 is the left view of Fig. 1;
Fig. 5 is the structural representation of changeover mechanism of the present invention;
Fig. 6 is the structural representation of the hand block not comprising pressing plate in Fig. 5;
Fig. 7 is the structural representation not comprising cover plate in Fig. 6;
Fig. 8 is the structural representation not comprising top board in Fig. 7;
Fig. 9 is the structural representation that Fig. 8 does not comprise that upper plate fixed by probe;
Figure 10 is the structural representation that Fig. 9 does not comprise that probe fixes lower plate, guidepost and support column.
Embodiment:
Embodiment, see accompanying drawing 1 ~ 10, a kind of test adaptor mechanism, it comprises base plate 1, test board 2, body base 3 to be measured, body to be measured 4 and changeover mechanism I, described test board and body base to be measured are arranged on base plate respectively, and described body to be measured can be placed on body base to be measured;
Described changeover mechanism comprises support column 5, lower plate 6 fixed by probe, probe 7, web joint 8, data acquisition board 9, cushion block 10, rotating shaft 11, pressing plate 12, pressing plate projection 13, top board 14, cover plate 15, probe are fixed upper plate 16, reference column 17, spring 18, guidepost 19, hand block 20, cushion block a21, compressed base 22, compact heap 23 and lower lock block 24, described support column lower end is fixed on base plate, upper end is provided with probe and fixes lower plate, and the rear portion that lower plate fixed by described probe is connected to pressing plate by rotating shaft; Described probe is fixed bottom lower plate and is provided with a plate, on web joint, both sides fix a reference column respectively, be provided with data acquisition board in the middle of web joint, the upper front end of data acquisition board is provided with organizes probe more, and the rear end of data acquisition board is fixed on base plate by cushion block; Described probe is fixed and lower plate is provided with probe is fixed upper plate, and two reference columns are fixed upper plate from probe and passed, and described probe is fixed lower plate and is provided with two springs, and two springs are positioned at the both sides that upper plate fixed by probe; Described top board is arranged on probe by reference column and fixes above upper plate, and top board and probe are fixed between lower plate and linked together by spring; Described probe is fixed lower plate and probe from probe and is fixed upper plate and pass, and spring in its natural state probe is also in top board inside, and top board is provided with probe aperture at corresponding probe location place; Described top board top is installed with cover plate, and the front side of described pressing plate is provided with a pressing plate projection, and the top of pressing plate is connected to hand block; Described pressing plate projection lower end is Semicircular arched structure, and pressing plate projection is positioned at the left side of cover plate, directly contacts top board and can not contact cover plate when pressing plate projection presses down.
Described probe is fixed lower plate and is provided with four guideposts, and guidepost and top board link together, and guidepost play the guiding role, and can ensure that top board steadily presses down.
Described base plate is fixed wtih cushion block a, cushion block a is fixed wtih compression base, compress in base and compact heap is installed, compact heap and lower lock block link together, described compression base is provided with a cascaded surface, described hand block right end side inserts below compact heap, and be positioned at compress base cascaded surface above.
The course of work of the present invention: when described lower lock block presses down, compact heap compresses hand block, make hand block press down pressing plate, pressing plate presses down and makes pressing plate projection compress top board, under the action of the spring, top board moves down, probe can be exposed above top board, thus make probes touch arrive detection faces, realize signal conduction, then data acquisition board image data is transferred to test board, realizes switching.
Above-described embodiment is the specific descriptions of carrying out the present invention; just the present invention is further described; can not be interpreted as limiting the scope of the present invention, those skilled in the art makes some nonessential improvement according to the content of foregoing invention and adjustment all falls within protection scope of the present invention.
Claims (4)
1. a test adaptor mechanism, is characterized in that: it comprises base plate, test board, body base to be measured, body to be measured and changeover mechanism, and described test board and body base to be measured are arranged on base plate respectively, and described body to be measured can be placed on body base to be measured;
Described changeover mechanism comprises support column, lower plate fixed by probe, probe, web joint, data acquisition board, cushion block, rotating shaft, pressing plate, pressing plate projection, top board, cover plate, probe are fixed upper plate, reference column, spring, guidepost, hand block, cushion block a, compressed base, compact heap and lower lock block, described support column lower end is fixed on base plate, upper end is provided with probe and fixes lower plate, and the rear portion that lower plate fixed by described probe is connected to pressing plate by rotating shaft; Described probe is fixed bottom lower plate and is provided with a plate, on web joint, both sides fix a reference column respectively, be provided with data acquisition board in the middle of web joint, the upper front end of data acquisition board is provided with organizes probe more, and the rear end of data acquisition board is fixed on base plate by cushion block; Described probe is fixed and lower plate is provided with probe is fixed upper plate, and two reference columns are fixed upper plate from probe and passed, and described probe is fixed lower plate and is provided with two springs, and two springs are positioned at the both sides that upper plate fixed by probe; Described top board is arranged on probe by reference column and fixes above upper plate, and top board and probe are fixed between lower plate and linked together by spring; Described probe is fixed lower plate and probe from probe and is fixed upper plate and pass, and spring in its natural state probe is also in top board inside, and top board is provided with probe aperture at corresponding probe location place; Described top board top is installed with cover plate, and the front side of described pressing plate is provided with a pressing plate projection, and the top of pressing plate is connected to hand block; Described base plate is fixed wtih cushion block a, cushion block a is fixed wtih compression base, compress in base and compact heap is installed, compact heap and lower lock block link together, described compression base is provided with a cascaded surface, described hand block right end side inserts below compact heap, and be positioned at compress base cascaded surface above;
When described lower lock block presses down, compact heap compresses hand block, make hand block press down pressing plate, pressing plate presses down and makes pressing plate projection compress top board, under the action of the spring, top board moves down, probe can be exposed above top board, thus make probes touch arrive detection faces, realize signal conduction, then data acquisition board image data is transferred to test board, realizes switching.
2. a kind of test adaptor mechanism according to claim 1, is characterized in that: described pressing plate projection lower end is Semicircular arched structure.
3. a kind of test adaptor mechanism according to claim 1, is characterized in that: described probe is fixed lower plate and is provided with four guideposts, and guidepost and top board link together, and guidepost play the guiding role, can ensure that top board steadily presses down.
4. a kind of test adaptor mechanism according to claim 1, is characterized in that: described pressing plate projection is positioned at the left side of cover plate, directly contacts top board and can not contact cover plate when pressing plate projection presses down.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410056519.1A CN103792708B (en) | 2014-02-19 | 2014-02-19 | A kind of test adaptor mechanism |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410056519.1A CN103792708B (en) | 2014-02-19 | 2014-02-19 | A kind of test adaptor mechanism |
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| Publication Number | Publication Date |
|---|---|
| CN103792708A CN103792708A (en) | 2014-05-14 |
| CN103792708B true CN103792708B (en) | 2016-04-06 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410056519.1A Active CN103792708B (en) | 2014-02-19 | 2014-02-19 | A kind of test adaptor mechanism |
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| CN (1) | CN103792708B (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104360203B (en) * | 2014-11-26 | 2018-02-02 | 南京国睿微波器件有限公司 | A kind of test system of ferrite phase shifter |
| CN105549237B (en) * | 2016-03-01 | 2019-02-22 | 苏州华兴源创电子科技有限公司 | A kind of liquid crystal display panel detection automatic aligning mechanism |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2807290Y (en) * | 2005-06-25 | 2006-08-16 | 群康科技(深圳)有限公司 | Testing device for liquid crystal display |
| CN201765405U (en) * | 2010-05-18 | 2011-03-16 | 创维液晶器件(深圳)有限公司 | Liquid crystal module testing device and liquid crystal module tester |
| CN203759381U (en) * | 2014-02-19 | 2014-08-06 | 苏州博众精工科技有限公司 | Testing changeover mechanism |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004333990A (en) * | 2003-05-09 | 2004-11-25 | Hitachi High-Tech Electronics Engineering Co Ltd | Method and device for press-fitting substrate and joined substrate produced with press-fitting |
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2014
- 2014-02-19 CN CN201410056519.1A patent/CN103792708B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2807290Y (en) * | 2005-06-25 | 2006-08-16 | 群康科技(深圳)有限公司 | Testing device for liquid crystal display |
| CN201765405U (en) * | 2010-05-18 | 2011-03-16 | 创维液晶器件(深圳)有限公司 | Liquid crystal module testing device and liquid crystal module tester |
| CN203759381U (en) * | 2014-02-19 | 2014-08-06 | 苏州博众精工科技有限公司 | Testing changeover mechanism |
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| Publication number | Publication date |
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| CN103792708A (en) | 2014-05-14 |
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Address after: The Wujiang economic and Technological Development Zone West Road Wujiang District of Suzhou City, Jiangsu Province, No. 666 215200 Patentee after: Bo Seiko Polytron Technologies Inc Address before: The Wujiang economic and Technological Development Zone West Road Wujiang District of Suzhou City, Jiangsu Province, No. 666 215200 Patentee before: Suzhou Bozhong Precision Industry Technology Co., Ltd. |