CN103730168A - Method for detecting data storage apparatus - Google Patents
Method for detecting data storage apparatus Download PDFInfo
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- CN103730168A CN103730168A CN201210384062.8A CN201210384062A CN103730168A CN 103730168 A CN103730168 A CN 103730168A CN 201210384062 A CN201210384062 A CN 201210384062A CN 103730168 A CN103730168 A CN 103730168A
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Abstract
A detection method is used to detect the data storage correctness of a data storage apparatus, and comprises the following steps: firstly writing test data in the data storage apparatus, and simultaneously acquiring the test data written in the data storage apparatus; then, reading the write-in test data from the data storage apparatus, and simultaneously acquiring the test data read from the data storage apparatus; and then comparing the test data acquired in the write-in process and the test data acquired in the reading process and finding the difference, and determining the data storage correctness of the data storage apparatus based on the difference.
Description
Technical field
The present invention is relevant with detection method, refers in more detail a kind of method that detects data memory device.Background technology
Along with the progress of numeral science and technology, as also thereupon day by day prevailing in data memory devices such as memory card, Portable disk, hard disks.And above-mentioned data memory device in development, dispatch from the factory before or while keeping in repair, top priority is all first to confirm that whether the read-write capability of data memory device normal and correct.
In the technology of existing detection data memory device, normally first utilize a proving installation repetitive read-write test data to this data memory device, recycling logic analyser acquisition write to a certain fragment of this data memory device respectively test data, with data from respectively this data memory device reads, and recycle between data writing that computing machine comparison logic analyser captures and reading out data whether variant, to judge whether this data memory device can correctly carry out data storing.Yet, data source due to test signal, the non-computing machine by being connected with logic analysis is sent, often cause the obtained data of logic analyser sufficiently complete, cannot first notify in advance and obtain which kind of signal or when start acquiring signal, cause user cannot real-time synchronization and this data memory device compare.
In above-mentioned detection method, because when proving installation writes test data and read test data, logic analyser the test data that synchronous pick-up writes at every turn or reads exactly, and make testing staff when utilizing computing machine comparison signal, must expend the more time just can find out write with the test data reading in section in correspondence with each other, whether variantly then could compare again each corresponding section, not only process is time-consuming, and can strengthen the load of testing staff's work, and then the effect that detects operation is not cited.
Summary of the invention
The object of the present invention is to provide a kind of method that detects data memory device, to improve the defect existing in known technology.
For achieving the above object, the method for detection data memory device provided by the invention, uses for a computing machine and carries out, to detect the correctness of a data memory device storage data; The method includes the following step:
A, write test data to this data memory device, and start the test data that a logic analyser acquisition writes to this data memory device simultaneously;
B, this data memory device reads the test data writing in steps A certainly, and starts the test data that this logic analyser acquisition is read from this data memory device simultaneously;
C, the test data that captures of comparison steps A, and the test data that captures of step B between difference, and judge according to this correctness of this data memory device storage data.
The method of described detection data memory device, wherein, this data memory device has a plurality of storage areas; In steps A, write test data to predetermined one or more storage areas; In step B, from predetermined being somebody's turn to do or those storage area read test data.
The method of described detection data memory device, wherein, after repeated execution of steps A and step B mono-pre-determined number, then performs step C.
The method of described detection data memory device, wherein, in step C, the test data that can freely select arbitrary test data capturing inferior to steps A and corresponding step B to capture is carried out diversity ratio pair.
The method of described detection data memory device, wherein, in step C, shows the test data capturing in steps A and the test data capturing in step B on a display device.
The method of described detection data memory device, wherein, in step C, the test data that steps A is captured, and the test data that captures of step B between difference place, with different display modes, be shown on this display device.
The method of described detection data memory device, wherein, in step C, be the test data that captured with different color step display A, and the test data that captured of step B between difference place.
By design of the present invention, just can be in the test data that writes or read, the test data that synchronous pick-up writes at every turn or reads, and the time that can significantly reduce testing staff's comparison.
Accompanying drawing explanation
Fig. 1 is for being used the test macro Organization Chart of detection method of the present invention;
Fig. 2 is the process flow diagram of detection method of the present invention;
Fig. 3 discloses the test data deviation being captured and can mark with different colours.
Primary clustering symbol description in accompanying drawing:
10 computing machines; 12 transmission interfaces; 20 logic analysers; 30 data memory devices.
Embodiment
The method of detection data memory device provided by the invention, the test data that can synchronous pick-up writes at every turn or read, and the time that can significantly reduce testing staff's comparison.
The method of detection data memory device provided by the present invention, uses for a computing machine and carries out, to detect the correctness of a data memory device storage data; The method includes the following step:
A) write test data to this data memory device, and start the test data that a logic analyser acquisition writes to this data memory device simultaneously;
B) this data memory device reads the test data writing in steps A certainly, and starts the test data that this logic analyser acquisition is read from this data memory device simultaneously;
C) test data that captures of comparison steps A, and the test data that captures of step B between difference, and judge according to this correctness of this data memory device storage data.
According to above-mentioned design, this data memory device has a plurality of storage areas; In steps A, write test data to predetermined one or more storage areas; In step B, from predetermined being somebody's turn to do or those storage area read test data.
According to above-mentioned design, after repeated execution of steps A and step B mono-pre-determined number, then perform step C.
According to above-mentioned design, in step C, the test data that can freely select arbitrary test data capturing inferior to steps A and corresponding step B to capture is carried out diversity ratio pair.
According to above-mentioned design, in step C, also show the test data capturing in steps A and the test data capturing in step B on a display device.
According to above-mentioned design, in step C, the test data also steps A being captured, and the test data that captures of step B between difference place, with different display modes, be shown on this display device.
According to above-mentioned design, in step C, be the test data that captured with different color step display A, and the test data that captured of step B between difference place.
For being illustrated more clearly in the present invention, lift preferred embodiment and coordinate accompanying drawing to be described in detail as follows.
Whether correctly detection method provided by the invention, use for a test macro and detect a data memory device (as memory card, Portable disk, hard disk etc.) storage data.Refer to Fig. 1, this test macro includes a computing machine 10 and a logic analyser 20, this computing machine 10 is connected with this data memory device 30 by a transmission interface 12 (as USB, SATA etc.), and this logic analyser 20 connects this computing machine 10 and this transmission interface 12.In addition, in this data memory device 30, there are a plurality of storage areas.Refer to Fig. 2, this detection method is used for this computing machine 10 and is carried out, and includes the following step:
A) write test data to this data memory device 30, and acquisition writes to the test data of this data memory device 30;
In this step, when this computing machine 10 starts to write test data to a wherein storage area in this data memory device 30 by this transmission interface 12, just start the test data that this logic analyser 20 starts to write to from 12 acquisitions of this transmission interface this storage area simultaneously.
B) this data memory device 30 reads the test data writing in steps A certainly, and captures the test data reading from this data memory device 30;
In this step, this computing machine 10 starts to read when previous step writes the test data of this storage area by this transmission interface 12, just starts this logic analyser 20 simultaneously and starts the test data being read by this storage area from 12 acquisitions of this transmission interface.
C) test data that captures of comparison steps A, and the test data that captures of step B between difference, and judge according to this correctness of this data memory device storage data.
In this step, because in abovementioned steps A and B, this logic analyser 20 is all the mode to synchronize with this computing machine 10, acquisition writes and the test data reading, therefore, if if correct the storage data of data memory device 30, the test data capturing while reading, with originally write the test data that fashionable acquisition is arrived, can be all complete and identical data content.For example, when our data writing string 10010011 is during to this data memory device 30, to capture can be also 10010011 complete serial datas, can be because of not asynchronous and only have acquisition to partial content (as 0010011 or 10011 etc.); And when we are when this data memory device 30 reads the test data writing, if if correct the storage data of data memory device, what captured can be also 10010011 complete and identical serial datas.Thus, testing staff need to not look for corresponding data segments taking time, and the test data that can be directly capture by comparison steps A, and the test data that captures of step B between whether variant, the correctness in the time of just can learning rapidly this data memory device 30 storage data.
In addition, in this step, also on the screen of this computing machine 10, be shown in the test data that steps A captures and the test data capturing in step B simultaneously, and when the test data capturing when steps A, the test data capturing with step B are variant, also difference can be sentenced on the screen that different colours is shown in this computing machine 10 (as Fig. 3) to the operation so that testing staff can compare more quickly.Certainly, except utilizing the mode of different colours, also can utilize different fonts, different sizes or other different display modes to reach the object at mark difference place.
It is worth mentioning that, when detecting, also can repeated execution of steps A and step B pre-determined number after, then perform step C and compare, to detect this data memory device 30 through repetitive read-write repeatedly, also correct storage data whether.And when step C, the test data that also can freely select arbitrary test data capturing inferior to steps A and corresponding step B to capture is carried out diversity ratio pair, makes testing staff in comparing operation, can be convenient and flexible.
Should be noted that, the foregoing is only the better possible embodiments of the present invention, not as limit, in practical operation, also can be in same step, write test data to a plurality of storage areas in this data memory device 30 or all in storage area.In addition, except the framework of above-mentioned test macro, also can by detection method of the present invention, reach identical object with other instruments, and such as apply the equivalent method that instructions of the present invention and claim do and change, ought to be included within the scope of claim of the present invention.
Claims (7)
1. detect a method for data memory device, use for a computing machine and carry out, to detect the correctness of a data memory device storage data; The method includes the following step:
A, write test data to this data memory device, and start the test data that a logic analyser acquisition writes to this data memory device simultaneously;
B, this data memory device reads the test data writing in steps A certainly, and starts the test data that this logic analyser acquisition is read from this data memory device simultaneously;
C, the test data that captures of comparison steps A, and the test data that captures of step B between difference, and judge according to this correctness of this data memory device storage data.
2. detect as claimed in claim 1 the method for data memory device, wherein, this data memory device has a plurality of storage areas; In steps A, write test data to predetermined one or more storage areas; In step B, from predetermined being somebody's turn to do or those storage area read test data.
3. detect as claimed in claim 1 the method for data memory device, wherein, after repeated execution of steps A and step B mono-pre-determined number, then perform step C.
4. detect as claimed in claim 3 the method for data memory device, wherein, in step C, the test data that can freely select arbitrary test data capturing inferior to steps A and corresponding step B to capture is carried out diversity ratio pair.
5. detect as claimed in claim 1 the method for data memory device, wherein, in step C, show the test data capturing in steps A and the test data capturing in step B on a display device.
6. detect as claimed in claim 5 the method for data memory device, wherein, in step C, the test data that steps A is captured, and the test data that captures of step B between difference place, with different display modes, be shown on this display device.
7. detect as claimed in claim 6 the method for data memory device, wherein, in step C, be the test data that captured with different color step display A, and the test data that captured of step B between difference place.
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| CN201210384062.8A CN103730168A (en) | 2012-10-11 | 2012-10-11 | Method for detecting data storage apparatus |
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| CN1788207A (en) * | 2002-12-31 | 2006-06-14 | 孕龙科技股份有限公司 | Method for data analysing of programmable logic analysing device |
| CN101290805A (en) * | 2007-04-17 | 2008-10-22 | 株式会社瑞萨科技 | Semiconductor device and data processing system |
| CN101377748A (en) * | 2007-08-29 | 2009-03-04 | 英业达股份有限公司 | Method for checking reading and writing functions of memory device |
| CN102332306A (en) * | 2011-07-15 | 2012-01-25 | 桂林电子科技大学 | Embedded static random access memory (SRAM) test structure and test method based on institute of electrical and electronics engineers (IEEE) 1500 |
| US20120137185A1 (en) * | 2010-11-30 | 2012-05-31 | Advanced Micro Devices, Inc. | Method and apparatus for performing a memory built-in self-test on a plurality of memory element arrays |
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- 2012-10-11 CN CN201210384062.8A patent/CN103730168A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1788207A (en) * | 2002-12-31 | 2006-06-14 | 孕龙科技股份有限公司 | Method for data analysing of programmable logic analysing device |
| CN101290805A (en) * | 2007-04-17 | 2008-10-22 | 株式会社瑞萨科技 | Semiconductor device and data processing system |
| CN101377748A (en) * | 2007-08-29 | 2009-03-04 | 英业达股份有限公司 | Method for checking reading and writing functions of memory device |
| US20120137185A1 (en) * | 2010-11-30 | 2012-05-31 | Advanced Micro Devices, Inc. | Method and apparatus for performing a memory built-in self-test on a plurality of memory element arrays |
| CN102332306A (en) * | 2011-07-15 | 2012-01-25 | 桂林电子科技大学 | Embedded static random access memory (SRAM) test structure and test method based on institute of electrical and electronics engineers (IEEE) 1500 |
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Application publication date: 20140416 |