CN103676942B - Vehicle electronics product microinterrupt test system - Google Patents
Vehicle electronics product microinterrupt test system Download PDFInfo
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- CN103676942B CN103676942B CN201310737425.6A CN201310737425A CN103676942B CN 103676942 B CN103676942 B CN 103676942B CN 201310737425 A CN201310737425 A CN 201310737425A CN 103676942 B CN103676942 B CN 103676942B
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- microinterrupt
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Abstract
The invention discloses a kind of vehicle electronics product microinterrupt test system, calculation process is carried out with widely used MCU microprocessors, selected according to user, generate respective waveforms, the microinterrupt pulse signal of respective cycle, and by the corresponding pole of speed-sensitive switch unit output to tested electronic product, this can extremely be accordingly positive pole, negative pole or positive and negative polarities.As microinterrupt pulse signal is by MCU microprocessors rather than analog circuit generation, therefore, this test system has the advantages that high reliability, low cost, sequential are accurate, it is convenient and simple for structure to debug.
Description
Technical field
The present invention relates to automotive engineering field tests, more particularly to a kind of vehicle electronics product microinterrupt test system.
Background technology
In vehicle-mounted electronic product work, when automobile miscellaneous equipment device starts or when working, such as attachment means, point
The equipment such as fiery device, vehicle lamp assembly device, Wiping device, power windows, in the moment opened, as starting current is larger, make
There is a decline in short-term or the pulse of short interruptions, also referred to as microinterrupt pulse in main power voltage, and it may cause
Occurs the reduction of performance because of the decline of power supply or microinterrupt in the equipment of other normal works in same electric power system
Or the failure of function.By substantial amounts of it is demonstrated experimentally that above-mentioned automobile equipment can produce interruption on startup, on main power source
, from 1 microsecond to the short interruptions pulse that 500 milliseconds of amplitude is not waited, its power is bigger for Shi Changyue, and the duration of short interruptions may
It is longer, so as to aggravate to cause miscellaneous equipment hydraulic performance decline or out-of-work probability.
It is well known that when any power apparatus start, cause the result that voltage transient declines be it is inevitable, in order that
Each equipment can normal work it is same power supply branch road under, it is necessary to make miscellaneous equipment that there is microinterrupt negative pulse certain
Capacity of resisting disturbance, weighs whether miscellaneous equipment has jamproof ability, it is necessary to simulate in automobile power supply system, various shapes
Microinterrupt pulse signal under state.In standard, generally the wherein several representative values of choosing are used as measurement reference frame, such as standard
Interrupted using 10 microseconds in 28401NDS respectively, 100 microseconds are interrupted, 5 milliseconds of interruptions, 50 milliseconds of interruptions, 300 milliseconds of interruptions are used as allusion quotation
The measured value of type, this five typical values have covered common adapter in automobile circuit, relay, ignition system substantially
Deng the pulse signal given birth to by device busy moment, this five representative values are also the standard survey that current most of depots recommend
Examination waveform.
However, not yet occurring at present the pulse generation test equipment of conformance with standard requirement in industry to produce above-mentioned five allusion quotations
Type pulse signal.
The content of the invention
Based on above-mentioned situation, the present invention proposes a kind of vehicle electronics product microinterrupt test system, with simulate it is micro- in
Disconnected pulse signal, to carry out microinterrupt test.For this purpose, the scheme that the present invention is adopted is as follows：
A kind of vehicle electronics product microinterrupt test system,
Including MCU microprocessors, polarity switched cell, positive pole speed-sensitive switch unit and negative switch switch unit；
Signal waveform and signal period that the MCU processors are selected according to user, export corresponding microinterrupt pulse letter
Number, the microinterrupt pulse signal meets the relevant criterion in automobile industry, and the signal waveform and signal period are directed to tested
Vehicle electronics product applies the waveform of microinterrupt pulse signal and cycle,
The positive-negative polarity that the polarity switched cell is selected according to user, control the positive pole speed-sensitive switch unit with it is described
One of negative pole speed-sensitive switch unit works or while work；
The positive pole speed-sensitive switch unit connects the positive pole of test vehicle electronic product, to MCU processors output
Microinterrupt pulse signal is processed, and enables to drive test vehicle electronic product；
The negative pole speed-sensitive switch unit connects the negative pole of test vehicle electronic product, to MCU processors output
Microinterrupt pulse signal is processed, and enables to drive test vehicle electronic product.
Vehicle electronics product microinterrupt test system of the present invention, is carried out at computing with widely used MCU microprocessors
Reason, selects according to user, generates respective waveforms, the microinterrupt pulse signal of respective cycle, and is exported to by speed-sensitive switch unit
The corresponding pole of tested electronic product, this can extremely be accordingly positive pole, negative pole or positive and negative polarities.Waveshape signal is that establishing criteria will
Ask, generated using timing and the interrupt function of MCU microprocessors.After waveshape signal is via polarity switching conversion, output
To high-speed switching circuit, be 13.5 volts by high-speed switching circuit final output voltage, electric current be 30 amperes of waveshape signal extremely
Test product power end.As microinterrupt pulse signal is by MCU microprocessors rather than analog circuit generation, therefore, this
Test system has the advantages that high reliability, low cost, sequential are accurate, it is convenient and simple for structure to debug.
Description of the drawings
Fig. 1 is the waveform diagram of the microinterrupt pulse signal that standard is required；
Fig. 2 is the electrical block diagram of vehicle electronics product microinterrupt test system of the present invention；
Fig. 3 is the circuit theory diagrams of vehicle electronics product microinterrupt test system of the present invention；
Fig. 4 is circuit theory diagrams of the vehicle electronics product microinterrupt test system of the present invention comprising microprocessor chip.
Specific embodiment
In order that the objects, technical solutions and advantages of the present invention become more apparent, it is below in conjunction with drawings and Examples, right
The present invention is described in further detail.It should be appreciated that specific embodiment described herein is only to explain this
It is bright, do not limit protection scope of the present invention.
Vehicle electronics product microinterrupt test system of the present invention, including it is MCU microprocessors, polarity switched cell, just high
Fast switch element and negative switch switch unit.
Signal waveform and signal period that the MCU processors are selected according to user, export corresponding microinterrupt pulse letter
Number, the microinterrupt pulse signal meets the relevant criterion in automobile industry, and the signal waveform and signal period are directed to tested
Vehicle electronics product applies the waveform of microinterrupt pulse signal and cycle.
The positive-negative polarity that the polarity switched cell is selected according to user, control the positive pole speed-sensitive switch unit with it is described
One of negative pole speed-sensitive switch unit works or while work.
The positive pole speed-sensitive switch unit connects the positive pole of test vehicle electronic product, to MCU processors output
Microinterrupt pulse signal is processed, and enables to drive test vehicle electronic product.
The negative pole speed-sensitive switch unit connects the negative pole of test vehicle electronic product, to MCU processors output
Microinterrupt pulse signal is processed, and enables to drive test vehicle electronic product.
Wherein, the relevant criterion in automobile industry includes that much, by taking 28401NDS standards as an example, the standard is with 10 microseconds
Disconnected, 100 microseconds are interrupted, the microinterrupt pulse signals of 5 milliseconds of interruptions, 50 milliseconds of interruptions and 300 milliseconds of interruptions are used as typical pulse
Signal.Fig. 1 show the schematic diagram of the pulse signal waveform that the standard is required, the rising edge duration of five kinds of pulse signal waveforms,
The parameters such as trailing edge duration, voltage interruption duration have concrete regulation in a standard.
As a preferred embodiment, as shown in Fig. 2 this test system is except cutting including MCU microprocessors 2, polarity
Change outside unit 9, positive pole speed-sensitive switch unit 7 and negative switch switch unit 8, can also be respectively or all including electric voltage reverse-connection
Protection location 1, voltage conversion unit 3, push-button unit 4, display unit 5 and buzzer unit 6.
The electric voltage reverse-connection protection location, connects the both positive and negative polarity of input power, for preventing input power incorrect polarity from leading
The situation for causing this test system destroyed, to increase safety.
The voltage conversion unit, changes to the voltage of input power, is for example described MCU microprocessors of other each units
Device, polarity switched cell, positive pole speed-sensitive switch unit and negative switch switch unit provide suitable work and driving power supply.
It is described including push-button unit, including 11 buttons of K1～K11 are respectively：
K1:10 microsecond microinterrupt impulse push keys；
K2:100 microsecond microinterrupt impulse push keys；
K3:5 milliseconds of microinterrupt impulse push keys；
K4:100 milliseconds of microinterrupt impulse push keys；
K5：300 milliseconds of microinterrupt impulse push keys；
K6:The microinterrupt pulse period adds button；
K7：The microinterrupt pulse period subtracts button；
K8：Microinterrupt pulse test stops key；
K9:Positive pole applies microinterrupt impulse push key；
K10：Negative pole applies microinterrupt impulse push key；
K11：Apply microinterrupt impulse push key during positive and negative electrodes in same,
Five key interlocks of K1～K5, one of button are pressed, and other four buttons fail.Microinterrupt pulse week
Phase can be adjusted between 0～99 by K6, K7.
The button operation of the push-button unit receive user, generates push button signalling and exports to the MCU microprocessors, institute
MCU microprocessors parsing push button signalling is stated, signal waveform, signal period, positive-negative polarity that user selects is drawn, and whether is stopped
Only test.
The display unit, the MCU microprocessors send the test rest period number of microinterrupt pulse signal to institute
State display unit to be shown.
The buzzer unit, under the control of the MCU microprocessors, sends initialization prompt tone, key prompting voice,
And test completes warning.
Fig. 3 show a preferred embodiment of this test system circuit diagram, and Fig. 4 show this test system comprising MCU
The circuit diagram of chip details.
The operating instruction of this test system is presented herein below：
Start：This test system is correctly connected power supply, after connection, system is initialized, buzzing after the completion of initialization
Device unit can send " ticking --- " sound, and D5LED lamps are lighted, output voltage to being devices under, into standby mode, until aobvious
Show that unit shows number of pulses 00.
Pulse applies polarity switching：Before the test begins, first strobe pulse needs the polarity for applying, if will be to positive electrical
Source line end carries out microinterrupt test, presses K9 keys, and circuit automatically switches to positive pole, such as will carry out microinterrupt test to negative pole, press
Lower K10 keys, circuit automatically switch to negative pole, such as will carry out microinterrupt test simultaneously to both positive and negative polarity, press K11 keys.Circuit is automatic
Positive and negative electrode is switched to while carrying out microinterrupt test.
Test：After the polarity that strobe pulse applies, number of pulses key K6 is pressed, after keying in the waveform cycle cycle, then pressed
Under corresponding pulse key（K1-K5）, select to need the waveform of output, initially enter pulse output services state, while umber of pulse
Amount display screen meeting simultaneous display pulse cycle quantity, volume residual, so as to operator's Real Time Observation.After test terminates, buzzing
Device unit sends " ticking --- " sound, points out test to terminate.In test process, system has fool-proof design, 5 impulse push keys
Interlocking, if after pressing pulse key K1, other buttons fail, after only pressing cancel key or waiting end-of-pulsing, ability
Other pulse keys are operated.Key pulse quantitative value were it not for, all buttons fail.
This test system design maximum electric current is preferably 30 amperes, can meet the test need of conventional vehicle-mounted product completely
Ask.
To sum up, the main technical points of this test system are to produce microinterrupt pulse signal, and Jing with MCU processors
Exported by high-speed switching circuit.With high reliability, low-cost design, precisely, debugging is convenient, the characteristics of simple for structure for sequential.
Embodiment described above only expresses the several embodiments of the present invention, and its description is more concrete and detailed, but and
Therefore the restriction to the scope of the claims of the present invention can not be interpreted as.It should be pointed out that for one of ordinary skill in the art
For, without departing from the inventive concept of the premise, some deformations and improvement can also be made, these belong to the guarantor of the present invention
Shield scope.Therefore, the protection domain of patent of the present invention should be defined by claims.
Claims (8)
1. a kind of vehicle electronics product microinterrupt test system, it is characterised in that
Including MCU microprocessors, polarity switched cell, positive pole speed-sensitive switch unit and negative pole speed-sensitive switch unit；
Signal waveform and signal period that the MCU processors are selected according to user, export corresponding microinterrupt pulse signal, should
Microinterrupt pulse signal meets the relevant criterion in automobile industry, and the signal waveform and signal period are directed to test vehicle electricity
Sub- product applies the waveform of microinterrupt pulse signal and cycle, and the relevant criterion in automobile industry includes 28401NDS standards；
The positive-negative polarity that the polarity switched cell is selected according to user, controls the positive pole speed-sensitive switch unit and the negative pole
One of speed-sensitive switch unit works or while work；
The positive pole speed-sensitive switch unit connects the positive pole of test vehicle electronic product, to MCU processors output it is micro- in
Disconnected pulse signal is processed, and enables to drive test vehicle electronic product；
The negative pole speed-sensitive switch unit connects the negative pole of test vehicle electronic product, to MCU processors output it is micro- in
Disconnected pulse signal is processed, and enables to drive test vehicle electronic product；
Also include display unit；
The MCU microprocessors send the test rest period number of microinterrupt pulse signal to the display unit and are shown
Show.
2. vehicle electronics product microinterrupt test system according to claim 1, it is characterised in that
The waveform of microinterrupt pulse signal includes that 10 microseconds are interrupted, 100 microseconds are interrupted, 5 milliseconds of interruptions, 50 milliseconds of interruptions and 300
The microinterrupt pulse signal that millisecond interrupts.
3. vehicle electronics product microinterrupt test system according to claim 1 and 2, it is characterised in that
Also include electric voltage reverse-connection protection location, for preventing input power incorrect polarity circuit to be destroyed.
4. vehicle electronics product microinterrupt test system according to claim 1 and 2, it is characterised in that
Also include voltage conversion unit, the voltage of input power is changed, is the MCU microprocessors, polarity switching list
Unit, positive pole speed-sensitive switch unit and negative switch switch unit offer work and driving power supply.
5. vehicle electronics product microinterrupt test system according to claim 1 and 2, it is characterised in that
Also include push-button unit, including 11 buttons of K1～K11, be respectively：
K1:10 microsecond microinterrupt impulse push keys；
K2:100 microsecond microinterrupt impulse push keys；
K3:5 milliseconds of microinterrupt impulse push keys；
K4:100 milliseconds of microinterrupt impulse push keys；
K5：300 milliseconds of microinterrupt impulse push keys；
K6:The microinterrupt pulse period adds button；
K7：The microinterrupt pulse period subtracts button；
K8：Microinterrupt pulse test stops key；
K9:Positive pole applies microinterrupt impulse push key；
K10：Negative pole applies microinterrupt impulse push key；
K11：Apply microinterrupt impulse push key during positive and negative electrodes in same,
The button operation of the push-button unit receive user, generates push button signalling and exports to the MCU microprocessors, described
Whether MCU microprocessors parse push button signalling, draw signal waveform, signal period, positive-negative polarity that user selects, and stop
Test.
6. vehicle electronics product microinterrupt test system according to claim 1 and 2, it is characterised in that
Also include buzzer unit, under the control of the MCU microprocessors, send initialization prompt tone, key prompting voice, with
And test completes warning.
7. vehicle electronics product microinterrupt test system according to claim 5, it is characterised in that
Five key interlocks of K1～K5, one of button are pressed, and other four buttons fail.
8. vehicle electronics product microinterrupt test system according to claim 1 and 2, it is characterised in that
The electric current of this test system out-put supply is 30 amperes to the maximum, and voltage is 13.5 volts.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310737425.6A CN103676942B (en) | 2013-12-26 | 2013-12-26 | Vehicle electronics product microinterrupt test system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310737425.6A CN103676942B (en) | 2013-12-26 | 2013-12-26 | Vehicle electronics product microinterrupt test system |
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| Publication Number | Publication Date |
|---|---|
| CN103676942A CN103676942A (en) | 2014-03-26 |
| CN103676942B true CN103676942B (en) | 2017-04-05 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201310737425.6A Active CN103676942B (en) | 2013-12-26 | 2013-12-26 | Vehicle electronics product microinterrupt test system |
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Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109976301B (en) * | 2017-12-28 | 2021-08-06 | 汕头比亚迪实业有限公司 | Multi-channel high-speed signal interruption tester |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2559523Y (en) * | 2002-07-25 | 2003-07-09 | 缪立循 | Antitheft alarmer for vehicle |
| CN101238007A (en) * | 2005-08-08 | 2008-08-06 | 丰田自动车株式会社 | Power supply device for vehicle |
| CN201654206U (en) * | 2010-04-20 | 2010-11-24 | 襄樊双金电器成套设备有限公司 | Simulation tester for axle-drive power supply system for railway vehicle |
-
2013
- 2013-12-26 CN CN201310737425.6A patent/CN103676942B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2559523Y (en) * | 2002-07-25 | 2003-07-09 | 缪立循 | Antitheft alarmer for vehicle |
| CN101238007A (en) * | 2005-08-08 | 2008-08-06 | 丰田自动车株式会社 | Power supply device for vehicle |
| CN201654206U (en) * | 2010-04-20 | 2010-11-24 | 襄樊双金电器成套设备有限公司 | Simulation tester for axle-drive power supply system for railway vehicle |
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| CN103676942A (en) | 2014-03-26 |
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Address after: 511400 150, No. 8, Qishan Road, Shiqi Town, Panyu District, Guangzhou City, Guangdong Province Patentee after: Radio and TV Measurement and Testing Group Co.,Ltd. Address before: 510656 Guangdong city of Guangzhou province Whampoa Avenue Tianhe District Xiping Yun Road No. 163 Patentee before: GUANGZHOU GRG METROLOGY & TEST Co.,Ltd. |
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