CN103674848B - A kind of thin film alignment characteristic detection device and application thereof - Google Patents

A kind of thin film alignment characteristic detection device and application thereof Download PDF

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Publication number
CN103674848B
CN103674848B CN201310661774.4A CN201310661774A CN103674848B CN 103674848 B CN103674848 B CN 103674848B CN 201310661774 A CN201310661774 A CN 201310661774A CN 103674848 B CN103674848 B CN 103674848B
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film
thin film
fixed
characteristic
alignment characteristic
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CN103674848A (en
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张继中
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Southeast University
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Southeast University
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Abstract

The present invention relates to thin film alignment characteristic detection device, particularly film stretching degree and thin film alignment degree are undertaken contrasting the relation detected to understand between film stretching state and thin film alignment characteristic by apparatus of the present invention, thus characterize for material and provide basis with the design of thin film alignment characteristic correlation function device.This device by for fixed film film fixation kit (3), form for the linear measure longimetry assembly (2) and the carrying said modules support (1) that makes film can be positioned at spectrum path measuring film length; The present invention is first by film stretching degree and thin film alignment Characteristics Detection function integration to device, thus film stretching degree and thin film alignment characteristic can be detected simultaneously, therefore the error that the difference between operate miss, different film is introduced can not only be reduced, and make it can be applicable to some thin and the level of stretch of the film that intensity is more weak and detections of orientation characteristic, therefore contribute to the further development & application of functional orientation film.

Description

A kind of thin film alignment characteristic detection device and application thereof
Technical field
The invention belongs to sensor field, relate to the thin film alignment characteristic detection device relevant to film stretching degree.
Background technology
The orientation characteristic of film due to its comprise display, sensing and biomedical sector wide application prospect and be subject to the great attention of people.And in addition on the one hand, the research of people also shows that the stretching of film can affect the orientation characteristic of film, therefore inquire into relation between the level of stretch of film and the orientation characteristic of film due to its comprise show, the potential using value of sensory field and having great importance.
But the current people relation inquired between the level of stretch of film and the orientation characteristic of film all independently obtains the film of different stretch degree by elder generation, and then these films are passed through relevant polarization spectrum to detect the orientation characteristic of these films.And the detection carrying out associated orientation characteristic after independently obtaining the film of different stretch degree more not only introduces the otherness that operate miss and different film bring, the film quantity detected is needed greatly to increase, and for some intensity lower, thinner thus unworkable film, the detection of the relation between its level of stretch and orientation characteristic will become very difficult.For this reason the present invention propose first can the fixation kit of oriented film and film length measurement components with fixing film can be combined with the support that polarization spectrum light path is mated, thus the mode of near-online can detect the level of stretch of film and the orientation characteristic of film simultaneously, be therefore conducive to the further development & application of orientation function film.
Summary of the invention
Technical matters: the object of this invention is to provide a kind of device being applicable to simultaneously detect film stretching degree and orientation characteristic, be conducive to the relation between the level of stretch of convenience, the accurately same film of detection and orientation characteristic, be therefore conducive to the further development & application of orientation function film.
Technical scheme: a kind of thin film alignment characteristic detection device of the present invention by for fixed film film fixation kit, form for the linear measure longimetry assembly and the carrying said modules support that makes film can be positioned at spectrum path measuring film length; Wherein, the base in support is positioned at the bottommost of this device, and measurer and film stationary platform are fixed on support by platform fixed screw;
Stiff end in film fixation kit is positioned in film stationary platform, and mobile terminal is positioned at the top of stiff end, and testing film is between mobile terminal and stiff end; Main scale in linear measure longimetry assembly is vertically fixed in film stationary platform, and secondary chi is fixed on the side of main scale by secondary chi fixed screw, and the outer end of secondary chi is connected with mobile terminal.
Described polarization spectrum comprises polarized infrared spectrum, polarization Raman spectrum, polarized UV visible absorption spectra.
Described film is light penetrability film.
The using method of this device is as follows:
First by one end of the stiff end fixing test film of film fixation kit, and other one end of mobile terminal fixing test film adjust mobile terminal and make testing film open and flat fixing, now linear measure longimetry assembly measures testing film original length.This device is placed in spectrometer and regulates support that film is placed in spectrum light path and detect film original polarization spectrum, then mobile terminal extension test film is controlled, the length of the rear testing film that stretches is obtained by linear measure longimetry assembly, then detect the polarization spectrum of testing film after stretching further, repeat the change that said process can detect the level of stretch of film and the orientation characteristic of membraneous material simultaneously.
Beneficial effect: the present invention compared with prior art, has the following advantages:
The application is first by film stretching degree and thin film alignment Characteristics Detection function integration to device, thus film stretching degree and thin film alignment characteristic can be detected simultaneously, therefore the error that the difference between operate miss, different film is introduced can not only be reduced, and make it can be applicable to some thin and the level of stretch of the film that intensity is more weak and detections of orientation characteristic, therefore contribute to the further development & application of functional orientation film.
Accompanying drawing explanation
Fig. 1 is thin film alignment characteristic detection device schematic diagram.
1, support; Base 1a, measurer and film stationary platform 1b, platform fixed screw 1c,
2, linear measure longimetry assembly; Main scale 2a, secondary chi 2b, secondary chi fixed screw 2c,
3, film fixation kit; Mobile terminal 3a, stiff end 3b, testing film 3c.
Fig. 2 is dichroism comparison extensibility schematic diagram.
Embodiment
Below in conjunction with drawings and Examples, the present invention is further illustrated.
Fig. 1 gives the schematic diagram of thin film alignment characteristic detection device.This device is made up of support 1, linear measure longimetry assembly 2 and film fixation kit 3.Support 1 is by base 1a and be fixed on measurer on base by platform fixed screw 1c and film stationary platform 1b forms.Linear measure longimetry assembly 2 and film fixation kit 3 are fixed on support by measurer and film stationary platform.Linear measure longimetry assembly comprises fixing main scale 2a and slippage can form with the secondary chi 2b carrying out measuring on main scale, and secondary chi can be fixing on main scale by secondary chi fixed screw 2c.Film fixation kit is then made up of stiff end 3b, mobile terminal 3a and testing film 3c.Wherein stiff end to be positioned on measurer and film stationary platform 1b and opposed platforms maintains static, and mobile terminal is then connected with the secondary chi 2b in linear measure longimetry assembly 2 and fixes by secondary chi fixed screw 2c.
Before film 3c tests, first film one end is fixed on the stiff end 3b of film fixation kit, and the other one end of film is fixed on the 3a of mobile terminal, fixed open and flat for film by secondary chi fixed screw 2c fixed joint chi 2b after regulating mobile terminal 3a to make testing film 3c open and flat.Now can read the length before film stretching by the relative position of main scale 2a and secondary chi 2b.This device being placed in Intensity modulation adjusting base 1a position and measurer and the position of film stationary platform 1b on base makes testing film 3c be positioned in the light path of Intensity modulation, then detects the orientation characteristic that the parallel polarization spectrum of film and vertical polarization spectrum can learn the front film that do not stretch.Because polarized infrared spectrum is studying structure and the conformation of compound, the research of unimolecular film molecular assembly and arrangement, the bands of a spectrum of ownership compound of red external spectrum, the research of orderly, the orderly lax and fracture process of macromolecular material, be separated overlapping infrared band and be all widely used in biological chemistry and biophysics research, being namely introduced for IR polarized spectrum below.
Be called directional light when polarized light is parallel with the direction of film, the absorbance of its bands of a spectrum is designated as A .Otherwise be called vertical light, the absorbance of its bands of a spectrum is designated as A .The absorbance A of a certain bands of a spectrum and A ratio R be defined as the dichroic ratio of these bands of a spectrum.Can be expressed as:
R=A /A
When film sample be non-orderly time, R value is 1, and the degree of order more high r values is larger.
Unclamp secondary chi fixed screw 2c subsequently and fixed joint chi screw read the length of now film again after extension test film 3c to certain size.The extensibility S of testing film 3c can be obtained by following formula:
Length after S=(film stretching-film original length)/(film original length) * 100;
Stretched film parallel polarization infrared spectrum and vertical polarization infrared spectrum is detected to obtain the infrared dichroism ratio after film stretching further by Polarized infrared light spectrometer.Repeat the change that above-mentioned steps can obtain thin film alignment characteristic under different stretch rate.
Below in conjunction with embodiment, the present invention is further illustrated.
Embodiment one:
First obtain mean molecular weight be the fibre-grade PLA of 100,000 and be formulated as the trifluoroethanol solution that concentration is 20%, then be prepared as by electrostatic spinning technique the thickness be attached on aluminium foil and be about 20 microns, diameter is about the unordered polylactic acid nano fiber film of 300 nanometers.Shear above-mentioned film to long 1.2 centimetres wide 0.5 centimetre.This film is soaked in ethanol that from aluminium foil, peel off polylactic acid nano fiber film after 2 hours gently for subsequent use.The stiff end 3b of the film fixation kit 3 of thin film alignment characteristic detection device and mobile terminal 3a all will be stained with double faced adhesive tape and make stiff end with and mobile terminal spacing be 0.84 centimetre, then above-mentioned polylactic acid nano fiber film long end being separately fixed on the stiff end 3b of film fixation kit 3 and mobile terminal 3a and adjusting mobile terminal makes testing film 3c present the open and flat state of tensionless winkler foundation, and fixed joint chi fixed screw 2c moves to prevent mobile terminal subsequently.Now the original length of film is 0.84 centimetre.Then the thin film alignment characteristic detection device securing polylactic acid nano fiber film is placed in Polarized infrared light spectrometer, adjusting base 1a position and measurer and the position of film stationary platform 1b on base make film be positioned in the light path of Polarized infrared light spectrometer, then detect parallel polarization infrared spectrum and the vertical polarization infrared spectrum of film.And unclamp secondary chi fixed screw 2c to unordered polylactic acid nano fiber film stretching one segment distance after fix again and carry out polarized infrared spectrum and detect and can obtain parallel polarization infrared spectrum under unordered polylactic acid nano fiber film different stretch rate and vertical polarization infrared spectrum.The ratio of the parallel polarization infrared spectrum under different stretch rate and vertical polarization infrared spectrum and dichroism comparison extensibility are mapped and can be obtained Fig. 2.Therefrom can find out that unordered polylactic acid nano fiber film is positioned at the dichroic ratio of the COC on PLA main chain at 1089 wave number stretching vibrations close to 1, therefore present isotropic feature.When raising along with extensibility 1 1.5 and the extensibility that rise to when extensibility be 50% of COC when the dichroic ratio of 1089 wave number stretching vibrations then never stretches be positioned on PLA main chain is 100% 1.7, point out its orientation characteristic of raising along with unordered polylactic acid nano fiber film stretching rate to improve.Before the thin film alignment characteristic test device not using the application, due to nano-fiber film, not only softness but also therefore its stretching that is easy to rupture are difficult to measure on the impact of orientation characteristic.
Embodiment two:
First several times rotating speed is utilized to be that the roller of 3000 revs/min is collected and prepared thickness and be about the PLLA nano-fiber film that molecular weight that 6 micron-scales are about 250 nanometers is 100000 by orientation electrostatic spinning technique.Then the film of different batches is sampled respectively long 1.2 centimetres wide 0.5 centimetre and utilize the thin film alignment characteristic test device of the application to utilize polarized infrared spectrum to test on PLLA main chain COC the dichroic ratio of 1089 wave number stretching vibrations.Then make the dichroic ratio of the polarized infrared spectrum of the film of different batches COC1089 wave number stretching vibration on PLA main chain consistent by the fixing method that stretches when there are differences when between different batches.Subsequently the SLC-9023 liquid crystal material melting of Shijiazhuang Chengzhi Yonghua Display Materials Co., Ltd. is covered nano-fiber film, and remove bubble further in a vacuum and cover nano-fiber film completely to make liquid crystal material.This film can as polarizer display part.By stretching above, the consistent of dichroic ratio controlling nano-fiber film can improve the consistance of different batches nano-fiber film when being used for polarizer display part.

Claims (1)

1. detect a pick-up unit for film stretching degree and orientation characteristic simultaneously, it is characterized in that this device is by the film fixation kit (3) for fixed film, for measuring the linear measure longimetry assembly (2) of film length and carrying the support (1) that said modules makes film can be positioned at spectrum path and form; Wherein, the base (1a) in support (1) is positioned at this
The bottommost of device, measurer and film stationary platform (1b) are fixed on support (1) by platform fixed screw (1c);
Stiff end (3b) in film fixation kit (3) is positioned in measurer and film stationary platform (1b), and mobile terminal (3a) is positioned at the top of stiff end (3b), and testing film (3c) is positioned between mobile terminal (3a) and stiff end (3b); Main scale (2a) in linear measure longimetry assembly (2) is vertically fixed in measurer and film stationary platform (1b), and secondary chi (2b) is fixed on the side of main scale (2a) by secondary chi fixed screw (2c), and the outer end of secondary chi (2b) is connected with mobile terminal (3a); This device is placed in spectrometer;
Described testing film (3c) is light penetrability film.
CN201310661774.4A 2013-12-09 2013-12-09 A kind of thin film alignment characteristic detection device and application thereof Expired - Fee Related CN103674848B (en)

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CN107085003B (en) * 2017-05-02 2020-03-17 合肥工业大学 X-ray diffraction in-situ characterization method for film oriented crystal growth

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1198377A (en) * 1997-05-01 1998-11-11 三井化学株式会社 Equipment for making film by stretching and double refraction test method
CN101620052A (en) * 2009-07-29 2010-01-06 四川大学 Young's elastic modulus tester with vernier depth gauge
CN202177548U (en) * 2011-09-01 2012-03-28 汪玉 Young modulus instrument facilitating measuring length of to-be-detected metal wire

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1198377A (en) * 1997-05-01 1998-11-11 三井化学株式会社 Equipment for making film by stretching and double refraction test method
CN101620052A (en) * 2009-07-29 2010-01-06 四川大学 Young's elastic modulus tester with vernier depth gauge
CN202177548U (en) * 2011-09-01 2012-03-28 汪玉 Young modulus instrument facilitating measuring length of to-be-detected metal wire

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* Cited by examiner, † Cited by third party
Title
游标卡尺在测定金属杨氏模量中的应用;穆晓东等;《大学物理实验》;20130830;第26卷(第4期);全文 *

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