CN103674317B - Detachable cathode test device - Google Patents

Detachable cathode test device Download PDF

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Publication number
CN103674317B
CN103674317B CN201210332955.8A CN201210332955A CN103674317B CN 103674317 B CN103674317 B CN 103674317B CN 201210332955 A CN201210332955 A CN 201210332955A CN 103674317 B CN103674317 B CN 103674317B
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CN
China
Prior art keywords
pad
clamping ring
electrode assemblie
cathode
bell cover
Prior art date
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Application number
CN201210332955.8A
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Chinese (zh)
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CN103674317A (en
Inventor
黄俊杰
黄浩
曹鸣坤
张金贵
李宗超
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kunshan national electronic Polytron Technologies Inc
Original Assignee
KUNSHAN GUOLI VACUUM ELECTRIC CO Ltd
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Priority to CN201210332955.8A priority Critical patent/CN103674317B/en
Publication of CN103674317A publication Critical patent/CN103674317A/en
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Abstract

The invention discloses a kind of Detachable cathode test device, comprise quartz bell cover, back up pad, gas outlet and electrode assemblie, described quartz bell cover to be detachably located on described back up pad upper side and to be formed one for the accommodating seal cavity treating thermometric cathode-workpiece, and described gas outlet and electrode assemblie to be fixedly arranged on respectively in described back up pad and to be communicated with described seal cavity.This Detachable cathode test device can be reused, and reduces product development cost.<!--1-->

Description

Detachable cathode test device
Technical field
The present invention relates to a kind of Detachable cathode test device, this device can be recycled and reused for electron tube hot cathode temperature and electric performance test test.
Background technology
At present, the known hot cathode temp measuring method of electrovacuum industry electron tube has two kinds.Method one, glaze experiment diode inside is connected thermopair and is drawn the temperature by professional instrument, the electric potential difference of measurement being converted into measurement by pin.The method advantage is the impact can identifying cathode material and technique anticathode emitting performance and life-span.Shortcoming is exactly that the local temperature that can only be confined to single-point or multiple spot is measured, and be secondly exactly that cathode for electron tube design temperature needs then will reset when adjusting experiment diode, process seems comparatively complicated.Method two, dress simulates sample pipe envelope glass window leucoscope and carries out temperature survey, the scope of the method measuring tempeature is confined to the visual range of view window, and when electronic tubular construction is more complicated, cost is higher, the waste needing adjustment cathode temperature design dress to simulate sample pipe cost is apparent.
Summary of the invention
In order to overcome above-mentioned defect, the invention provides a kind of Detachable cathode test device, this device can be reused, and reduces product development cost.
The present invention in order to the technical scheme solving its technical matters and adopt is: a kind of Detachable cathode test device, comprise quartz bell cover, back up pad, gas outlet and electrode assemblie, described quartz bell cover to be detachably located on described back up pad upper side and to be formed one for the accommodating seal cavity treating thermometric cathode-workpiece, and described gas outlet and electrode assemblie to be fixedly arranged on respectively in described back up pad and to be communicated with described seal cavity.
As a further improvement on the present invention, described electrode assemblie comprises screw rod, the first clamping ring, porcelain tube and the second clamping ring, described porcelain tube is sheathed on the periphery of described screw rod lower end by the first clamping ring, and this screw rod upper end is fixedly arranged in described back up pad by the second clamping ring.
As a further improvement on the present invention, described back up pad comprises upper backup pad and lower supporting plate, and this upper and lower back up pad is fixedly connected with, and is provided with waterpipe between this upper and lower back up pad, and the entrance and exit of this waterpipe is all arranged on described lower supporting plate.
As a further improvement on the present invention, between described quartz bell cover and upper backup pad, O-ring seal is provided with.
The invention has the beneficial effects as follows: a kind of test unit being used in electron tube hot cathode temperature and electric performance test can be provided, can be connected with exhaust station, structure easy accessibility, and can Reusability, for electron tube development bring great convenience while also save cost.
Accompanying drawing explanation
Fig. 1 is structural representation of the present invention.
By reference to the accompanying drawings, make the following instructions:
1---quartz bell cover 2---gas outlet
3---electrode assemblie 4---cathode-workpiece
5---seal cavity 6---screw rod
7---first clamping ring 8---porcelain tube
9---second clamping ring 10---upper backup pad
11---lower supporting plate 12---waterpipe
13---O-ring seal
Embodiment
By reference to the accompanying drawings, elaborate to the present invention, but protection scope of the present invention is not limited to following embodiment, the simple equivalence namely in every case done with the present patent application the scope of the claims and description changes and modifies, and all still belongs within patent covering scope of the present invention.
As shown in Figure 1, a kind of Detachable cathode test device, comprise quartz bell cover 1, back up pad, gas outlet 2 and electrode assemblie 3, quartz bell cover to be detachably located on back up pad upper side and to be formed one for the accommodating seal cavity 5 treating thermometric cathode-workpiece 4, and described gas outlet and electrode assemblie to be fixedly arranged on respectively in described back up pad and to be communicated with described seal cavity.Wherein, quartz bell cover is that resistant to elevated temperatures quartz glass is made, and gas outlet is connected with exhaust station, and whole device is except the removably connecting of quartz bell cover and back up pad, and other connect everywhere soldering can be adopted to carry out connection sealing.Adopt leucoscope by transparency silica glass anticathode thermometric during test, thermometric position and angle can change.This device is applicable to the thermometric test of different cathode constructions, can also be applicable to the electric performance test test relevant to cathode temperature.In a word, this device convenient disassembly, can reuse, economic environmental protection.
Preferably, described electrode assemblie comprises screw rod 6, first clamping ring 7, porcelain tube 8 and the second clamping ring 9, described porcelain tube is sheathed on the periphery of described screw rod lower end by the first clamping ring, and this screw rod upper end is fixedly arranged in described back up pad by the second clamping ring.During use, first screw rod, the first clamping ring, porcelain tube and the second clamping ring composition can be welded into electrode assemblie, then this electrode assemblie is fixed in back up pad by modes such as solderings.
Preferably, described back up pad comprises upper backup pad 10 and lower supporting plate 11, and this upper and lower back up pad is fixedly connected with, and is provided with waterpipe 12 between this upper and lower back up pad, and the entrance and exit of this waterpipe is all arranged on described lower supporting plate.When needs cool, by passing into recirculated water in waterpipe, whole device is cooled.
Preferably, between described quartz bell cover and upper backup pad, O-ring seal 13 is provided with.

Claims (1)

1. a Detachable cathode test device, it is characterized in that: comprise quartz bell cover (1), back up pad, gas outlet (2) and electrode assemblie (3), described quartz bell cover to be detachably located on described back up pad upper side and to be formed one for the accommodating seal cavity (5) treating thermometric cathode-workpiece (4), and described gas outlet and electrode assemblie to be fixedly arranged on respectively in described back up pad and to be communicated with described seal cavity; Described electrode assemblie comprises screw rod (6), the first clamping ring (7), porcelain tube (8) and the second clamping ring (9), described porcelain tube is sheathed on the periphery of described screw rod lower end by the first clamping ring, and this screw rod upper end is fixedly arranged in described back up pad by the second clamping ring; Described back up pad comprises upper backup pad (10) and lower supporting plate (11), this upper and lower back up pad is fixedly connected with, and waterpipe (12) is provided with between this upper and lower back up pad, the entrance and exit of this waterpipe is all arranged on described lower supporting plate; O-ring seal (13) is provided with between described quartz bell cover and upper backup pad.
CN201210332955.8A 2012-09-11 2012-09-11 Detachable cathode test device Active CN103674317B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201210332955.8A CN103674317B (en) 2012-09-11 2012-09-11 Detachable cathode test device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201210332955.8A CN103674317B (en) 2012-09-11 2012-09-11 Detachable cathode test device

Publications (2)

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CN103674317A CN103674317A (en) 2014-03-26
CN103674317B true CN103674317B (en) 2016-04-06

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Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN86102538A (en) * 1986-10-29 1988-09-21 华东师范大学 A kind of plasma anodic process and method
CN1069777A (en) * 1991-08-21 1993-03-10 南开大学 A kind of device of arc vapor-phase deposition
US6014203A (en) * 1998-01-27 2000-01-11 Toyo Technologies, Inc. Digital electron lithography with field emission array (FEA)
CN201741658U (en) * 2010-07-08 2011-02-09 中国电子科技集团公司第十二研究所 Full metal diode for detecting cathode performance
CN201838597U (en) * 2010-09-11 2011-05-18 安徽华东光电技术研究所 Testing diode for traveling wave tube cathode
CN202720073U (en) * 2012-09-11 2013-02-06 昆山国力真空电器有限公司 Removable cathode test apparatus
CN202888117U (en) * 2012-08-09 2013-04-17 安徽华东光电技术研究所 Cathode air-intake structure and travelling wave tube with the same

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN86102538A (en) * 1986-10-29 1988-09-21 华东师范大学 A kind of plasma anodic process and method
CN1069777A (en) * 1991-08-21 1993-03-10 南开大学 A kind of device of arc vapor-phase deposition
US6014203A (en) * 1998-01-27 2000-01-11 Toyo Technologies, Inc. Digital electron lithography with field emission array (FEA)
CN201741658U (en) * 2010-07-08 2011-02-09 中国电子科技集团公司第十二研究所 Full metal diode for detecting cathode performance
CN201838597U (en) * 2010-09-11 2011-05-18 安徽华东光电技术研究所 Testing diode for traveling wave tube cathode
CN202888117U (en) * 2012-08-09 2013-04-17 安徽华东光电技术研究所 Cathode air-intake structure and travelling wave tube with the same
CN202720073U (en) * 2012-09-11 2013-02-06 昆山国力真空电器有限公司 Removable cathode test apparatus

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
真空微波器件排气过程中烘烤温度对阴极温度的影响;刘燕文等;《真空电子技术》;20070531(第5期);第59-62页 *
阴极蒸发动态测试研究;阴生毅等;《真空科学与技术学报》;20060228;第26卷(第1期);第70-73页 *

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PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
CB03 Change of inventor or designer information

Inventor after: Huang Junjie

Inventor after: Huang Hao

Inventor after: Cao Mingkun

Inventor after: Zhang Jingui

Inventor after: Li Zongchao

Inventor before: Huang Junjie

COR Change of bibliographic data
C14 Grant of patent or utility model
GR01 Patent grant
CP03 Change of name, title or address

Address after: 215301 West Lake Road, Kunshan Development Zone, Jiangsu, China, No. 28, No.

Patentee after: Kunshan national electronic Polytron Technologies Inc

Address before: 215301 Kunshan, Jiangsu Development Zone, the Yangtze River Road, No. 179, No.

Patentee before: Kunshan Guoli Vacuum Electric Co., Ltd.

CP03 Change of name, title or address