CN103645431A - Quartz crystal oscillator performance test device - Google Patents
Quartz crystal oscillator performance test device Download PDFInfo
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- CN103645431A CN103645431A CN201310738959.0A CN201310738959A CN103645431A CN 103645431 A CN103645431 A CN 103645431A CN 201310738959 A CN201310738959 A CN 201310738959A CN 103645431 A CN103645431 A CN 103645431A
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Abstract
The invention relates to a quartz crystal oscillator performance test device, which is characterized by comprising a 12-V direct-current power supply, a multi-frequency oscillating circuit, a multiplying-voltage detection and filter circuit and a test result indication circuit, wherein the multi-frequency oscillating circuit consists of a tested crystal oscillator BC, a resistor R1, an NPN-type transistor BG1, a capacitor C1, a capacitor C2 and a resistor R2; the multiplying-voltage detection and filter circuit consists of a capacitor C3, two germanium diodes (D1 and D2) and an electrolytic capacitor C4; in the test result indication circuit, a positive electrode of a light emitting diode (LED) is connected with a negative electrode of the germanium diode D2, and a negative electrode of the LED is connected with circuit ground (GND). The quartz crystal oscillator performance test device can conveniently and accurately test whether quartz crystal oscillators in the circuits of different infrared remote controllers, flash discs, music player (MP3) and the like are damaged or not, and an electronic device can be rapidly and conveniently repaired by a technician.
Description
Technical field
The invention belongs to electronic devices and components technical field of measurement and test, is about a kind of quartz oscillator performance testing device.
Background technology
Quartz oscillator is often referred to as crystal oscillator, and it is to utilize the quartz crystal slice with piezoelectric effect to make.The used time of doing that this quartz crystal is subject to applied alternating field can produce mechanical vibration, and when the frequency of alternating electric field is identical with the natural frequency of quartz crystal, vibration just becomes very strong, the reaction of crystal resonance characteristic that Here it is.Utilize this specific character, available quartz oscillator replaces LC(coil and electric capacity) resonant tank, wave filter etc.Because quartz resonator has, volume is little, lightweight, reliability is high, frequency stability advantages of higher, and quartz oscillator is widely used in the electronic equipments such as televisor, video disc player, video recorder, wireless telecommunications system, electronic watch.
In electrical maintenance process, often run into the phenomenon of infrared remote controller functional failure.How to judge the quartz oscillator performance in infrared remote controller, with general multimeter, be difficult to judge whether quartz oscillator exists fault.It can survey frequency be 10kHz～100MHz crystal oscillator testing device that quartz oscillator performance testing device of the present invention utilizes several elements to make one, it is that technician is when maintenance, whether the quartz oscillator that can test easily and accurately in the circuit such as various infrared remote controllers, USB flash disk, MP3 damages, the quality of quartz oscillator performance is very clear, for promptly repairing electronic equipment, provides convenience.
Below describe quartz oscillator performance testing device of the present invention related relevant technologies content in implementation process in detail.
Summary of the invention
Goal of the invention and beneficial effect: in electrical maintenance process, often run into the phenomenon of the functional failure of infrared remote controller.How to judge the crystal oscillator performance in infrared remote controller, with general multimeter, be difficult to judge whether quartz oscillator exists fault.It can survey frequency be 10kHz～100MHz quartz oscillator proving installation that quartz oscillator performance testing device of the present invention utilizes several elements to make one, it is that technician is when maintenance, whether the quartz oscillator of can facilitate, accurately testing in the circuit such as various infrared remote controllers, USB flash disk, MP3 damages, the quality of quartz oscillator performance is very clear, for promptly repairing electronic equipment, provides convenience.
Circuit working principle: quartz oscillator performance testing device forms multi-frequency oscillation circuit by NPN transistor BG1 and Resistor-Capacitor Unit, the oscillating voltage of NPN transistor BG1 emitter output carries out after multiplication of voltage detection through capacitor C 3, germanium diode D1～D2, on obtaining on LED, just lower negative DC voltage, drives LED to light luminous; If tested quartz oscillator BC damages, because multi-frequency oscillation circuit cisco unity malfunction, multiplication of voltage detecting circuit will be without direct voltage output, so LED can not be lit.
Technical scheme: quartz oscillator performance testing device, it comprises 12V direct supply, multi-frequency oscillation circuit, multiplication of voltage detection and filtering circuit, test result indicating circuit, it is characterized in that:
Multi-frequency oscillation circuit: it is by tested quartz oscillator BC, resistance R 1, NPN transistor BG1, capacitor C 1, capacitor C 2 and resistance R 2 form, one end of the base stage connecting resistance R1 of NPN transistor BG1, one end of one end of capacitor C 1 and tested quartz oscillator BC, the anodal VCC of collector connection circuit of the other end of resistance R 1 and NPN transistor BG1, the emitter of the other end of capacitor C 1 and NPN transistor BG1 connects one end of capacitor C 2 and one end of resistance R 2, the other end connection circuit ground GND of the other end of the other end of tested quartz oscillator BC and capacitor C 2 and resistance R 2,
Multiplication of voltage detection and filtering circuit: it is comprised of 3,2 germanium diode D1～D2 of capacitor C and electrochemical capacitor C4, the emitter of NPN transistor BG1 connects the negative pole of germanium diode D1 and the positive pole of germanium diode D2 by capacitor C 3, the negative pole of germanium diode D2 connects the positive pole of electrochemical capacitor C4, the negative pole connection circuit ground GND of the positive pole of germanium diode D1 and electrochemical capacitor C4;
Test result indicating circuit: the positive pole of LED connects the negative pole of germanium diode D2, the negative pole connection circuit ground GND of LED;
The positive pole of 12V direct supply is connected with circuit anode VCC, and the negative pole of 12V direct supply is connected with circuit ground GND.
Accompanying drawing explanation
Accompanying drawing is the embodiment circuit working schematic diagram that the invention provides a quartz oscillator performance testing device.
Embodiment
According to quartz oscillator performance testing device circuit working schematic diagram shown in the drawings and accompanying drawing explanation, and according to annexation between components and parts in the each several part circuit described in summary of the invention, and the components and parts technical parameter described in embodiment requires and circuit production main points are implemented to realize the present invention, below in conjunction with embodiment, correlation technique of the present invention is further described.
The parameter of components and parts and selection requirement
BG1 is NPN transistor, and the model of selecting is 2SC9018, requires β >=160;
D1～D2 is germanium diode, and the model of selecting is 2AP10;
The resistance of resistance R 1 is 82K Ω, and the resistance of resistance R 2 is 1K Ω;
The capacity of capacitor C 1 is 30PF; The capacity of capacitor C 2 is 18PF; The capacity of capacitor C 3 is 3300PF;
C4 is electrochemical capacitor, and its capacity is 4.7 μ F/10V;
LED is light emitting diode, selects the common red light emitting diodes of diameter ￠ 5mm;
BC is tested quartz oscillator, and frequency is 10kHz～100MHz.
Circuit production main points, circuit debugging and using method
Because of the circuit structure of quartz oscillator performance testing device fairly simple, as long as the electronic devices and components performance of generally selecting is intact, and the components and parts annexation in accompanying drawing is welded to specifications, physical connection line and welding quality are after careful inspection is correct, and circuit of the present invention does not substantially need to carry out any debugging and can normally work;
Attention: on the make, two pins of tested quartz oscillator BC can not be at a distance of too near, otherwise oscillation amplitude will reduce greatly, likely causes LED not to be lit, thereby affects the test result of tested quartz oscillator BC.
Claims (1)
1. a quartz oscillator performance testing device, it comprises 12V direct supply, multi-frequency oscillation circuit, multiplication of voltage detection and filtering circuit, test result indicating circuit, it is characterized in that:
Described multi-frequency oscillation circuit is by tested quartz oscillator BC, resistance R 1, NPN transistor BG1, capacitor C 1, capacitor C 2 and resistance R 2 form, one end of the base stage connecting resistance R1 of NPN transistor BG1, one end of one end of capacitor C 1 and tested quartz oscillator BC, the anodal VCC of collector connection circuit of the other end of resistance R 1 and NPN transistor BG1, the emitter of the other end of capacitor C 1 and NPN transistor BG1 connects one end of capacitor C 2 and one end of resistance R 2, the other end connection circuit ground GND of the other end of the other end of tested quartz oscillator BC and capacitor C 2 and resistance R 2,
Described multiplication of voltage detection and filtering circuit are comprised of 3,2 germanium diode D1～D2 of capacitor C and electrochemical capacitor C4, the emitter of NPN transistor BG1 connects the negative pole of germanium diode D1 and the positive pole of germanium diode D2 by capacitor C 3, the negative pole of germanium diode D2 connects the positive pole of electrochemical capacitor C4, the negative pole connection circuit ground GND of the positive pole of germanium diode D1 and electrochemical capacitor C4;
In described test result indicating circuit, the positive pole of LED connects the negative pole of germanium diode D2, the negative pole connection circuit ground GND of LED;
The positive pole of described 12V direct supply is connected with circuit anode VCC, and the negative pole of 12V direct supply is connected with circuit ground GND.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310738959.0A CN103645431A (en) | 2013-12-28 | 2013-12-28 | Quartz crystal oscillator performance test device |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201310738959.0A CN103645431A (en) | 2013-12-28 | 2013-12-28 | Quartz crystal oscillator performance test device |
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| CN103645431A true CN103645431A (en) | 2014-03-19 |
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| CN201310738959.0A Pending CN103645431A (en) | 2013-12-28 | 2013-12-28 | Quartz crystal oscillator performance test device |
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Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1877984A (en) * | 2005-06-07 | 2006-12-13 | 日本电波工业株式会社 | Crystal oscillation circuit |
| CN1909362A (en) * | 2005-08-01 | 2007-02-07 | 爱普生拓优科梦株式会社 | Crystal oscillator |
| US7519484B2 (en) * | 2004-06-12 | 2009-04-14 | Texas Instruments Incorporated | Power supply monitor |
| CN201852950U (en) * | 2010-08-26 | 2011-06-01 | 刘家发 | Portable metal detection device |
| CN102647153A (en) * | 2011-02-21 | 2012-08-22 | 精工电子有限公司 | Method for determining design values for crystal oscillator circuit and electronic apparatus |
| CN103308785A (en) * | 2012-03-06 | 2013-09-18 | 海洋王（东莞）照明科技有限公司 | Crystal oscillation detection circuit and crystal oscillation detection device |
| CN203673033U (en) * | 2013-12-28 | 2014-06-25 | 黄月华 | Performance testing device for quartz crystal oscillator |
-
2013
- 2013-12-28 CN CN201310738959.0A patent/CN103645431A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7519484B2 (en) * | 2004-06-12 | 2009-04-14 | Texas Instruments Incorporated | Power supply monitor |
| CN1877984A (en) * | 2005-06-07 | 2006-12-13 | 日本电波工业株式会社 | Crystal oscillation circuit |
| CN1909362A (en) * | 2005-08-01 | 2007-02-07 | 爱普生拓优科梦株式会社 | Crystal oscillator |
| CN201852950U (en) * | 2010-08-26 | 2011-06-01 | 刘家发 | Portable metal detection device |
| CN102647153A (en) * | 2011-02-21 | 2012-08-22 | 精工电子有限公司 | Method for determining design values for crystal oscillator circuit and electronic apparatus |
| CN103308785A (en) * | 2012-03-06 | 2013-09-18 | 海洋王（东莞）照明科技有限公司 | Crystal oscillation detection circuit and crystal oscillation detection device |
| CN203673033U (en) * | 2013-12-28 | 2014-06-25 | 黄月华 | Performance testing device for quartz crystal oscillator |
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Application publication date: 20140319 |