CN103645049A - Low-temperature storage testing method for AMT system - Google Patents

Abstract

The invention belongs to the technical field of AMT-system temperature environment testing of a motor vehicle and specifically provides a low-temperature storage testing method for an AMT system. Test samples are put into a test box with a temperature which is a test-room temperature and then the temperature is adjusted to a temperature which complies with related norm and stipulation; function tests are perfomred on test method requirements of a non-electrified-state sample and a test sample which needs to operate when electrified; the test samples are tested under a non-work state and high-airflow-velocity circulation is adopted; the test takes the temperature as a main test point and tests the AMT system of a test object under test conditions that environment temperature is 25+-5 DEG C, AC power voltage is 220+- 2V50Hz, AC power voltage is 380+- 2V50Hz and the barometric pressure value is a local work barometric pressure. The test mainly tests aspects of hardware and mechanical mechanism of the AMT system so that it is ensured that the AMT system is capable of working normally after being stored at a set low temperature for a specific time.

Description

A kind of AMT system hypothermia storage test method

Technical field

The invention belongs to motor vehicle AMT system temperature environmental test technical field, be specifically related to a kind of AMT system hypothermia storage test method.

Background technology

AMT system temperature environmental test is mainly to detect those to require the equipment that all will switch on and move under whole temperature environment.Temperature environment test will reach following main experimental object:

A) test findings instructs the design improvement of AMT system product;

B) only limit to the ability for determining that element, equipment or other products are used, move, transport or store under low temperature environment.

Low tempertaure storage test objective:

This test method is used for carrying out the low-temperature test of AMT system product, assembly or components and parts test specimen, and test specimen is placed the long enough time to reach temperature stabilization under cryogenic conditions.

Summary of the invention

The object of this invention is to provide a kind of AMT system hypothermia storage test method.

For this reason, the invention provides a kind of AMT system hypothermia storage test method, described test method is:

Examination fine horse sample is put in the chamber that people's temperature is testing laboratory's temperature, then temperature is adjusted to meet related specifications regulation be progressively warming up to-40 ± 2 ℃ of temperature; When non-power status test specimen temperature reach stable after, under this condition, be exposed to 72 ± 2 hours of regulation.The test specimen that need to switch on and move during for test, should reach in test specimen temperature stable rear energising after 2 hours, carry out as required Function detection, the line item of going forward side by side;

Test auspicious product tests under off working state;

This test adopts the circulation of high gas flow speed;

Described test condition is:

A) environment temperature is 25 ± 5 ℃;

B) AC supply voltage 220 ± 2V50Hz;

C) AC supply voltage 380 ± 2V50Hz;

D) the local working air pressure of standard atmospheric pressure.

Above-mentioned test condition is specially:

A) environment temperature is 25 ℃;

B) AC supply voltage 220V50Hz;

C) AC supply voltage 380V50Hz;

D) the local working air pressure of standard atmospheric pressure.

Above-mentioned testing equipment requires:

Described chamber model is: GDW/LX-010L, and its performance index are as follows:

A) temperature range :-40 ℃ ~+150 ℃;

B) temperature fluctuation: ± 0.5 ℃;

C) temperature uniformity: ± 2 ℃;

D) rate of temperature fall: 0.7 ℃ ~ 1 ℃;

E) heating rate: 2 ℃ ~ 3 ℃;

F) noise: Db < 65;

G) power supply: AC380V/50Hz;

H) working size: 1000 * 1000 * 1000.

Beneficial effect of the present invention: this AMT system hypothermia storage test method provided by the invention, described test method is:

Test specimen is put in the chamber that people's temperature is testing laboratory's temperature, then temperature is adjusted to meet related specifications regulation be progressively warming up to-40 ± 2 ℃ of temperature; When non-power status test specimen temperature reach stable after, under this condition, be exposed to 72 ± 2 hours of regulation.The test specimen that need to switch on and move during for test, should reach in test specimen temperature stable rear energising after 2 hours, carry out as required Function detection, the line item of going forward side by side;

Test auspicious product tests under off working state;

This test adopts the circulation of high gas flow speed;

Described test condition is:

A) environment temperature is 25 ± 5 ℃;

B) AC supply voltage 220 ± 2V50Hz;

C) AC supply voltage 380 ± 2V50Hz;

D) the local working air pressure of standard atmospheric pressure.

This test is to using temperature as main considering a little, and checked object AMT system is tested, and test condition is 25 ± 5 ℃ of environment temperatures; AC supply voltage 220 ± 2V50Hz; AC supply voltage 380 ± 2V50Hz; Atmospheric pressure value is local working air pressure.This test is tested mainly for its hardware and mechanical mechanism aspect, has guaranteed that AMT system can normally work after setting low tempertaure storage certain hour.

Embodiment

Embodiment 1:

An AMT system hypothermia storage test method, described test method is:

Test specimen is put in the chamber that people's temperature is testing laboratory's temperature, then temperature is adjusted to meet related specifications regulation be progressively warming up to-40 ± 2 ℃ of temperature; When non-power status test specimen temperature reach stable after, under this condition, be exposed to 72 ± 2 hours of regulation.The test specimen that need to switch on and move during for test, should reach in test specimen temperature stable rear energising after 2 hours, carry out as required Function detection, the line item of going forward side by side;

Test auspicious product tests under off working state;

This test adopts the circulation of high gas flow speed;

Described test condition is:

A) environment temperature is 25 ± 5 ℃;

B) AC supply voltage 220 ± 2V50Hz;

C) AC supply voltage 380 ± 2V50Hz;

D) the local working air pressure of standard atmospheric pressure.

This test is to using temperature as main considering a little, and checked object AMT system is tested, and test condition is 25 ± 5 ℃ of environment temperatures; AC supply voltage 220 ± 2V50Hz; AC supply voltage 380 ± 2V50Hz; Atmospheric pressure value is local working air pressure.This test is tested mainly for its hardware and mechanical mechanism aspect, has guaranteed that AMT system can normally work after setting low tempertaure storage certain hour.

This test scope of application

This test program is applicable to the temperature environment test of the AMT system product that Shaanxi Guoli Information Technology Co. Ltd. designs and develops, and it has stipulated testing requirements and necessary test routine.

The object of this test program is the foundation that AMT system temperature environmental stress lost efficacy.

Reference to standard and file

GB2423.1-2008 electric and electronic product environmental test test A: low-temperature test method

GB2423.2-2008 electric and electronic product environmental test test B: hot test method

GB/T2423.22-2008 electric and electronic product environmental test part 2: test method test N: temperature variation (GB/T 2423. 22-2002, IEC 60068-2-14:1984, IDT)

GB/T2424.1-1989 electric and electronic product environmental test high temperature low-temperature test guide rule (GB/T 2424.1-2005, IEC 60068-3-1:I974, IDT)

GB/T2424.5-1989 electric and electronic product environmental test temperature test chamber confirming performance (GB/T 2424.5-2006, IEC 60068-3-5: 2001, IDT)

IEC 60721 (all parts) environmental baseline classification

The collection of test figure, record and processing requirements

Test figure authenticity is test figure, field data, and recorded data must reflect the actual state of Data Collection object strictly according to the facts, particularly for the description of fault, must be true, and can not be concealed and unreported.For opportunity, reason, the phenomenon of the failure of system fault in different tests process and the impact causing thereof etc., all should record faithfully.

The authenticity of data is prerequisites of its correctness, only has carried out record and description strictly according to the facts by the trystate of pilot system, just contributes to accurate decision problem, can not data be inferred, be guessed and accept or reject with subjective will.Due to the restriction of technical merit and other condition, the true record of fault is not equal to accurate recording, it needs further to analyze and judgement.

Continuity is the basic demand to reliability data.For each test, answer the process of all event events and experience in complete documentation process of the test, as the start each time of system (equipment), unused time, fault-time, termination working time etc.

In order to make full use of reliability data, system is carried out to reliability assessment, requiring collected reliability data to try one's best may be complete, the i.e. generation to certain breakdown maintenance (maintenance) event, comprising that the relevant device of system after fault or parts send repaiies, scraps and fall the various situations such as function use and all should carry out detailed record, so just be conducive to the reliability of system to carry out multianalysis and comprehensive assessment, be also conducive to system to formulate better monitoring and maintenance measure.

Test mass safeguard measure

A) development group determines AMT system product parameter and function and works out detection record list; Test figure analysis is reached a conclusion.

B) testing crew is determined the integrity of testing equipment and within the school inspection phase; By testing program, implement test; Process of the test checks and records (data recording will be asked for an interview to the 12nd chapter) to product; To breaking down in process of the test, should maintain the original state, pending fault analysis recovers trystate after also getting rid of afterwards.

C) quality control officer should participate in the establishment of test program, determines process of the test control point, the authenticity of check test data, accuracy, continuity, integrality.

D) testing equipment should be in the phase be examined in school, and testing software version is latest edition (extracted from software administration storehouse by quality control officer, and bound by testing crew).

Stop or time-out test condition

Stop or suspend test condition stopping or suspending test condition in process of the test as while there is one of following situations, should submit a report asking for the leader of co-director approval, request stops or suspends test, proceeds test after improving again.

A) in process of the test, there is critical failure, as electric component energising short circuit or the situation such as do not work;

B) components and parts damage frequently, cause test normally to go on;

C) other situations.

Be subject to the last processing of trial product

AMT system temperature environmental test is day to day tests, should process according to certified products, and product is marked to (participating in production code member, * * * * * * month * * day what test) in detail after the product testing of participating in the experiment.By storehouse, according to product, depositing related request processes.

Embodiment 2:

On the basis of embodiment 1, described test condition is specially:

A) environment temperature is 25 ℃;

B) AC supply voltage 220V50Hz;

C) AC supply voltage 380V50Hz;

D) the local working air pressure of standard atmospheric pressure.

Described testing equipment requires:

Described chamber model is: GDW/LX-010L, and its performance index are as follows:

A) temperature range :-40 ℃ ~+150 ℃;

B) temperature fluctuation: ± 0.5 ℃;

C) temperature uniformity: ± 2 ℃;

D) rate of temperature fall: 0.7 ℃ ~ 1 ℃;

E) heating rate: 2 ℃ ~ 3 ℃;

F) noise: Db < 65;

G) power supply: AC380V/50Hz;

H) working size: 1000 * 1000 * 1000.

More than exemplifying is only to illustrate of the present invention, does not form the restriction to protection scope of the present invention, within the every and same or analogous design of the present invention all belongs to protection scope of the present invention.

Claims (3)

1. an AMT system hypothermia storage test method, is characterized in that: described test method is:

Test specimen is put in the chamber that people's temperature is testing laboratory's temperature, then temperature is adjusted to meet related specifications regulation be progressively warming up to-40 ± 2 ℃ of temperature; When non-power status test specimen temperature reach stable after, under this condition, be exposed to 72 ± 2 hours of regulation, the test specimen of the operation of need to switching on during for test, should reach in test specimen temperature stable rear energising after 2 hours, carry out as required Function detection, the line item of going forward side by side;

Test auspicious product tests under off working state;

This test adopts the circulation of high gas flow speed;

Described test condition is:

A) environment temperature is 25 ± 5 ℃;

B) AC supply voltage 220 ± 2V50Hz;

C) AC supply voltage 380 ± 2V50Hz;

D) the local working air pressure of standard atmospheric pressure.

2. a kind of AMT system hypothermia storage test method as claimed in claim 1, is characterized in that: described test condition is specially:

A) environment temperature is 25 ℃;

B) AC supply voltage 220V50Hz;

C) AC supply voltage 380V50Hz;

D) the local working air pressure of standard atmospheric pressure.

3. a kind of AMT system hypothermia storage test method as claimed in claim 1, is characterized in that:

Described testing equipment requires:

Described chamber model is: GDW/LX-010L, and its performance index are as follows:

A) temperature range :-40 ℃ ~+150 ℃;

B) temperature fluctuation: ± 0.5 ℃;

C) temperature uniformity: ± 2 ℃;

D) rate of temperature fall: 0.7 ℃ ~ 1 ℃;

E) heating rate: 2 ℃ ~ 3 ℃;

F) noise: Db < 65;

G) power supply: AC380V/50Hz;

H) working size: 1000 * 1000 * 1000.