CN103630038A - Method for measuring thickness growth quantified values of aluminum alloy hard anodized films - Google Patents
Method for measuring thickness growth quantified values of aluminum alloy hard anodized films Download PDFInfo
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- CN103630038A CN103630038A CN201310669285.3A CN201310669285A CN103630038A CN 103630038 A CN103630038 A CN 103630038A CN 201310669285 A CN201310669285 A CN 201310669285A CN 103630038 A CN103630038 A CN 103630038A
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Abstract
The invention discloses a method for measuring thickness growth quantified values of aluminum alloy hard anodized films. The method includes detecting the sizes of pre-anodization outer circles; performing hard anodization on the outer circles; detecting the sizes of the post-anodization outer circles; computing thicknesses delta <0> and delta of the films according to a formula of delta <0>=delta <1>/2 and a formula of delta=delta <0>+delta <i>; detecting the thicknesses delta<2> of the films by the aid of a thickness gauge to obtain the thicknesses delta<2> of the films; or detecting the thicknesses of the films by a metallographic process, in other words, detecting the thicknesses of the films by means of a sectional microscopy, and accurately measuring the thicknesses delta<3> of the films by the aid of a metallographic microscope on sectional surfaces of manufactured ground segments; computing the thickness growth quantified values of the films according to a formula of delta<0>/(delta<2>or delta<3>). The delta<1> represents the thicknesses detected by a dial indicator, the delta<0> represents the thicknesses of parts, which grow towards the outsides of substrates, of the films, and the delta<i>represents the thicknesses of parts, which grow towards the insides of the substrates, of the films. The thickness growth quantified values of the films refer to quantified values of the thicknesses of the films and the thicknesses of the parts, which grow towards the outsides of the substrates, of the films. The method has the advantage that the specific quantified values can be acquired, so that consistency of the sizes of post-anodization workpieces and the computed preset sizes of the workpieces can be guaranteed.
Description
Technical field
The present invention relates to Treatment of Metal Surface protection works technical field, especially the measuring method to a kind of aluminum alloy hard anodic film layer thickness growth quantized value.
Background technology
At present, while carrying out hard anodized on aluminum alloy materials class workpiece, what adopt is anode electrochemical method, to pass through degreasing, washing, activation and to wash the clean lower drill traverse of 6061-T6 material type workpiece energising to enter in the solution of sulfuric acid+oxalic acid, workpiece is as anode, negative electrode adopts stereotype to make, and at-2～2 ℃ of temperature, carries out anodic oxidation, makes surface of the work generate thick layer and wear-resisting hard anodized rete.Workpiece hard anodized thicknesses of layers is toward the thicknesses of layers of direction growth in matrix and thicknesses of layers approximately equal toward matrix outgrowth in theory, but add man-hour actual, there is certain quantized value in thicknesses of layers and coating growth, before and after calculating hard anodized, be now to equate to get with the thickness toward matrix outgrowth toward the thickness of growing in matrix by rete during size, can cause so often not reaching the expectation size that calculating gets after anodization.Thereby during machining, need to consider this coating growth quantized value, find out a kind of measuring method of hard anodized thicknesses of layers growth quantized value, to obtain concrete quantized value, reach and calculate the expectation size getting after workpiece anodization guaranteeing, this be obtain that the rete expected in modern industrial technology field is continuous, smooth, adhesion is good, color is even, without rete and the wear-resisting rete of loosening.
Summary of the invention
The object of the invention is to overcome above-mentioned shortcoming and provide a kind ofly can obtain concrete quantized value, with the measuring method of the aluminum alloy hard anodic film layer thickness growth quantized value of the expectation consistent size that guarantees to get with calculating after workpiece anodization.
The measuring method of a kind of aluminum alloy hard anodic film layer thickness growth quantized value of the present invention, comprises the following steps:
(1) detect the front excircle dimension of anodization
At 20～21 ℃ of temperature of constant temperature, with clock gauge, detect size, coarse instrument detects smooth finish, surface smoothness 0.4;
(2) hard anodized
Thicknesses of layers requires at 46～55 μ m, and conventional method is carried out hard anodized;
(3) excircle dimension after detection anodization
Under 20～21 ℃ of environment temperatures of constant temperature, with clock gauge, detect excircle dimension;
The absolute value of the forward and backward dimension difference of measuring workpieces is thicknesses of layers toward the twice of matrix outgrowth; That is: toward the thicknesses of layers of matrix outgrowth: δ o=δ 1 ÷ 2
Wherein: δ 1 is clock gauge detection thickness;
Thicknesses of layers δ=δ o+ δ i
Wherein: δ o is toward matrix outgrowth thickness; δ i is toward growth thickness in matrix.
(4) thicknessmeter detects thicknesses of layers, and recording thicknesses of layers is δ 2;
Or metallographic method detects thicknesses of layers: with the micro-detection thicknesses of layers in cross section, on the abrasive disc cross section making, by means of metaloscope, most accurately measure thicknesses of layers δ 3;
Thicknesses of layers growth quantized value (i.e. thicknesses of layers and the thicknesses of layers quantized value of past matrix outgrowth): δ o/(δ 2 or δ 3).
The measuring method of above-mentioned a kind of aluminum alloy hard anodic film layer thickness growth quantized value, wherein: for preventing that the impact of superficial film thickness evenness from detecting error, at piece surface, make to detect thickness position mark, detect size and thickness measure all at same position, dimensional measurement position, hard anodized front and back, thicknessmeter measuring position, metallographic method detection position are all at same place.
The present invention compared with prior art, there is obvious beneficial effect, as can be known from the above technical solutions: the present invention is according to matrix surface situation, adopt the method that after the front excircle dimension detection of hard anodized, hard anodized, excircle dimension detects, thicknessmeter is measured thicknesses of layers (or metallographic method detection thicknesses of layers), draw aluminum alloy hard anodic film layer thickness increment, be the relation existing between thicknesses of layers increment and thicknesses of layers: δ o/ δ (δ o be rete to matrix outgrowth amount, δ is thicknesses of layers).According to this quantized value, substituting 0.5 this coefficient in prior art (being to equate with the thickness of past matrix outgrowth toward the thickness of growing in matrix by rete during size before and after hard anodized) calculates, can guarantee the expectation consistent size getting with calculating after workpiece anodization, thereby obtain that expected rete is continuous, smooth, adhesion is good, color is even, without loose rete and wear-resisting rete.
The specific embodiment of the present invention is provided in detail by following examples.
Embodiment
Below in conjunction with example, describe the present invention, further explain and illustrate technical scheme feature of the present invention.
embodiment 1:
A measuring method for aluminium alloy 6061-T6 hard anodized thicknesses of layers growth quantized value, comprises the following steps:
(1) finishing cylindrical
Workpiece numerical-controlled is machined to smooth finish 0.4,16 of workpiece quantity;
(2) detect the front size of cylindrical anodization
Coarse instrument detects cylindrical luminosity and is 0.4, the outside micrometer that is 0.001 by precision place 24h at 21 ℃ of temperature after detects cylindrical ф 32.986 ㎜ physical sizes, the measured value of 2 points of every record, 2 of diverse location points on same workpiece, and on part, marked in measuring position, measured value the results are shown in Table 1:
Size measured value before table 1 workpiece hard anodized
(3) hard anodized:
Acetone oil removing: object is to guarantee that matrix size does not change in hard anodized pre-treatment, is convenient to collect the accuracy of data.
Flowing cool water soaks piece surface.
Hard anodized:
Hard anodized tank liquor preparation: with deionized water make-up tank liquid, add the water that needs volume in tank liquor, then add sulfuric acid (180-280g/L)+oxalic acid (20-30g/L), it is fully dissolved.
Hard anodized: adopt galvanostatic method, current density 0.5～1A/dm2, carries out hard anodized at low temperature-2～0 ℃.
(4) size after the anodization of detection cylindrical
The outside micrometer that is 0.001 by precision place 24h at 21 ℃ of temperature after detects cylindrical ф 32.9 ㎜ physical sizes, the measured value of 2 points of every record, and check point is the mark of anode pre-test size, measured value the results are shown in Table 2:
Size measured value after table 2 workpiece hard anodized
(5) thicknessmeter detects cylindrical thicknesses of layers
With eddy current thickness meter, detect thicknesses of layers, every excircle of workpiece is measured point (the position mark before anodization that wherein has 2 points) thicknesses of layers and the record of co-located, and on part, is marked in measuring position, and measured value the results are shown in Table 3:
Table 3 hard anodized thicknesses of layers measured value (thicknessmeter detection)
Metallographic method detects cylindrical thicknesses of layers:
With the micro-detection thicknesses of layers in cross section, on the abrasive disc cross section making, by means of metaloscope, most accurately measure thicknesses of layers.In thicknessmeter measurement size position, (2 of mark location point places before anodization) adopt metallographic method to detect thicknesses of layers, 4 measured values of each location point place record, and metallographic method detects thicknesses of layers in Table 4:
Table 4 hard anodized thicknesses of layers measured value (metallographic method detection)
By clock gauge detect, thicknessmeter detects and metallographic method detects thicknesses of layers, utilizes statistics as table 5:
Table 5 adopts distinct methods to detect thicknesses of layers situation
Thicknesses of layers δ=δ o+ δ i
Wherein: δ o is toward matrix outgrowth thickness; δ i is toward growth thickness in matrix.
By table 5 thicknesses of layers mean value:
Thicknesses of layers toward matrix outgrowth: δ o=δ 1 ÷ 2=38.7 ÷ 2=19.4 μ m
Thicknesses of layers and thicknesses of layers quantized value toward matrix outgrowth: δ o/ δ (referring to δ 2 or δ 3)=19.4/47.2=0.411
That is: δ o=0.411 δ (formula-1)
Or
By clock gauge, detect that thickness δ 1 detects thickness δ 2(with thicknessmeter or metallographic method detects thickness δ 3) difference: △ δ=δ 2-δ 1(or δ 3-δ 1)=8.5.
By table 5 thicknesses of layers maximal value:
Thicknesses of layers toward matrix outgrowth: δ o=δ 1 ÷ 2=41.5 ÷ 2=20.8 μ m
Thicknesses of layers and thicknesses of layers quantized value toward matrix outgrowth: δ o/δ (referring to δ 2 or δ 3)=20.8/51.7=0.40
That is: δ o=0.40 δ (formula-2)
Or
By clock gauge, detect that thickness δ 1 detects thickness δ 2(with thicknessmeter or metallographic method detects thickness δ 3) difference: △ δ=δ 2-δ 1(or δ 3-δ 1)=10.3(or 10.2).
By table 5 thicknesses of layers minimum value:
Thicknesses of layers toward matrix outgrowth: δ o=δ 1 ÷ 2=34 ÷ 2=17 μ m
Thicknesses of layers and thicknesses of layers quantized value toward matrix outgrowth: δ o/δ (referring to δ 2 or δ 3)=17/43.7=0.38
That is: δ o=0.38 δ (formula-3)
Or
By clock gauge, detect that thickness δ 1 detects thickness δ 2(with thicknessmeter or metallographic method detects thickness δ 3) difference: △ δ=δ 2-δ 1(or δ 3-δ 1)=9.7.
As known from the above: material 6061-T6 hard anodized rete is half of hard anodized front and back change in size amount toward matrix outgrowth amount, be δ o=δ/2, by this workpiece result of implementation, from (formula-1), (formula-2) and (formula-3) are found out, rete is less than half of thicknesses of layers toward the thicknesses of layers of matrix outgrowth, be about 40% of thicknesses of layers, be that (this relation can prove that aluminium alloy 6061-T6 hard anodized coating growth amount and thicknesses of layers exist certain relation to δ o=0.40 δ, not workpiece hard anodized thicknesses of layers is in theory toward the thicknesses of layers of direction growth in matrix and thicknesses of layers approximately equal toward matrix outgrowth).
embodiment 2:
A measuring method for aluminium alloy 6061-T6 hard anodized thicknesses of layers growth quantized value, comprises the following steps:
(1) finishing cylindrical
Workpiece numerical-controlled is machined to smooth finish 0.4,16 of workpiece quantity;
(2) detect the front size of cylindrical anodization
Coarse instrument detects cylindrical luminosity and is 0.4, the outside micrometer that is 0.001 by precision place 24h at 21 ℃ of temperature after detects cylindrical ф 32.981 ㎜ physical sizes, the measured value of 2 points of every record, 2 of diverse location points on same workpiece, and on part, marked in measuring position, measured value the results are shown in Table 6:
Size measured value before table 6 workpiece hard anodized
(3) hard anodized:
Acetone oil removing: object is to guarantee that matrix size does not change in hard anodized pre-treatment, is convenient to collect the accuracy of data.
Flowing cool water soaks piece surface.
Hard anodized:
Hard anodized tank liquor preparation: with deionized water make-up tank liquid, add the water that needs volume in tank liquor, then add sulfuric acid (180-280g/L)+oxalic acid (20-30g/L), it is fully dissolved.
Hard anodized: adopt galvanostatic method, current density 0.5～1A/dm2, carries out hard anodized at low temperature-2～0 ℃.
(4) size after the anodization of detection cylindrical
The outside micrometer that is 0.001 by precision place 24h at 21 ℃ of temperature after detects cylindrical ф 32.9 ㎜ physical sizes, the measured value of 2 points of every record, and check point is the mark of anode pre-test size, measured value the results are shown in Table 7:
Size measured value after table 7 workpiece hard anodized
(5) thicknessmeter detects cylindrical thicknesses of layers
With eddy current thickness meter, detect thicknesses of layers, every excircle of workpiece is measured point (the position mark before anodization that wherein has 2 points) thicknesses of layers and the record of 8 diverse locations, and on part, is marked in measuring position, and measured value the results are shown in Table 8:
Table 8 hard anodized thicknesses of layers measured value (thicknessmeter detection)
Metallographic method detects cylindrical thicknesses of layers: with the micro-detection thicknesses of layers in cross section, on the abrasive disc cross section making, by means of metaloscope, most accurately measure thicknesses of layers.In thicknessmeter measurement size position, (2 of mark location point places before anodization) adopt metallographic method to detect thicknesses of layers, 4 measured values of each location point place record, and metallographic method detects thicknesses of layers in Table 9:
Table 9 hard anodized thicknesses of layers measured value (metallographic method detection)
By clock gauge detect, thicknessmeter detects and metallographic method detects thicknesses of layers, utilizes statistics in Table 10:
Table 10 adopts distinct methods to detect thicknesses of layers situation
Thicknesses of layers: δ=δ o+ δ i
Wherein: δ o is toward matrix outgrowth thickness; δ i is toward growth thickness in matrix.
By table 10 thicknesses of layers mean value:
Thicknesses of layers toward matrix outgrowth: δ o=δ 1 ÷ 2=36.6 ÷ 2=18.3 μ m
Thicknesses of layers and thicknesses of layers quantized value toward matrix outgrowth: δ o/δ (referring to δ 2 or δ 3)=18.3/49(or 48.9)=0.374
That is: δ o=0.374 δ (formula-4)
Or
By clock gauge, detect that thickness δ 1 detects thickness δ 2(with thicknessmeter or metallographic method detects thickness δ 3) difference: △ δ=δ 2-δ 1(or δ 3-δ 1)=10.2 or 10.1.
By table 10 thicknesses of layers maximal value:
Thicknesses of layers toward matrix outgrowth: δ o=δ 1 ÷ 2=42 ÷ 2=21 μ m
Thicknesses of layers and thicknesses of layers quantized value toward matrix outgrowth: δ o/δ (referring to δ 2 or δ 3)=21/52.9(or 52.7)=0.40
That is: δ o=0.40 δ (formula-5)
Or
By clock gauge, detect that thickness δ 1 detects thickness δ 2(with thicknessmeter or metallographic method detects thickness δ 3) difference: △ δ=δ 2-δ 1(or δ 3-δ 1)=12.5(or 12.4).
By table 10 thicknesses of layers minimum value:
Thicknesses of layers toward matrix outgrowth: δ o=δ 1 ÷ 2=35 ÷ 2=17.5 μ m
Thicknesses of layers and thicknesses of layers quantized value toward matrix outgrowth: δ o/δ (referring to δ 2 or δ 3)=17.5/45.2(or 45)=0.38
That is: δ o=0.38 δ (formula-6)
Or
By clock gauge, detect that thickness δ 1 detects thickness δ 2(with thicknessmeter or metallographic method detects thickness δ 3) difference: △ δ=δ 2-δ 1(or δ 3-δ 1)=5.8(or 5.9).
From above: material 6061-T6 hard anodized rete is half of change in size amount before and after hard anodized toward matrix outgrowth amount, be that δ o=δ/2 are by this workpiece result of implementation, from (formula-4), (formula-5) and (formula-6) are found out, rete is less than half of thicknesses of layers toward the thicknesses of layers of matrix outgrowth, be about 40% of thicknesses of layers, be that (this relation can prove that aluminium alloy 6061-T6 hard anodized coating growth amount and thicknesses of layers exist certain relation to δ o=0.40 δ, not workpiece hard anodized thicknesses of layers is in theory toward the thicknesses of layers of direction growth in matrix and thicknesses of layers approximately equal toward matrix outgrowth).
The above, it is only preferred embodiment of the present invention, not the present invention is done to any pro forma restriction, any technical solution of the present invention content that do not depart from, any simple modification, equivalent variations and the modification above embodiment done according to technical spirit of the present invention, all still belong in the scope of technical solution of the present invention.
Claims (3)
1. a measuring method for aluminum alloy hard anodic film layer thickness growth quantized value, comprises the following steps:
(1) detect the front excircle dimension of anodization
At 20～21 ℃ of temperature of constant temperature, with clock gauge, detect size, coarse instrument detects smooth finish;
(2) hard anodized
Thicknesses of layers requires at 46～55 μ m, and conventional method is carried out hard anodized;
(3) excircle dimension after detection anodization
Under 20～21 ℃ of environment temperatures of constant temperature, with clock gauge, detect excircle dimension;
The absolute value of the forward and backward dimension difference of measuring workpieces is thicknesses of layers toward the twice of matrix outgrowth, the thicknesses of layers of past matrix outgrowth: δ o=δ 1 ÷ 2
Wherein: δ 1 is clock gauge detection thickness;
Thicknesses of layers δ=δ o+ δ i
Wherein: δ o is toward matrix outgrowth thickness; δ i is toward growth thickness in matrix;
(4) thicknessmeter detects thicknesses of layers, and recording thicknesses of layers is δ 2;
Or metallographic method detects thicknesses of layers: with the micro-detection thicknesses of layers in cross section, on the abrasive disc cross section making, by means of metaloscope, most accurately measure thicknesses of layers δ 3;
Thicknesses of layers growth quantized value: δ o/ δ 2 or δ o/ δ 3.
2. the measuring method of a kind of aluminum alloy hard anodic film layer thickness growth quantized value as claimed in claim 1, wherein: at piece surface, make to detect thickness position mark, before and after hard anodized, dimensional measurement position, thicknessmeter measuring position, metallographic method detection position are all at same place.
3. the measuring method of a kind of aluminum alloy hard anodic film layer thickness growth quantized value as claimed in claim 1 or 2, wherein: surface smoothness 0.4.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN105509608A (en) * | 2015-11-27 | 2016-04-20 | 沈阳飞机工业（集团）有限公司 | Method for accurately measuring thickness of plated layer under production condition |
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| JP2003347191A (en) * | 2002-05-24 | 2003-12-05 | Dainippon Screen Mfg Co Ltd | Substrate treatment device and method of measuring thickness of film |
| CN101133300B (en) * | 2005-09-26 | 2010-09-08 | 杰富意钢铁株式会社 | Method for measuring surface layer oxide film thickness of galvanized steel plate |
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| CN105509608A (en) * | 2015-11-27 | 2016-04-20 | 沈阳飞机工业（集团）有限公司 | Method for accurately measuring thickness of plated layer under production condition |
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Application publication date: 20140312 |