CN103617773B - A kind of exoelectron test macro of media protection membrane material and method - Google Patents
A kind of exoelectron test macro of media protection membrane material and method Download PDFInfo
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- CN103617773B CN103617773B CN201310613018.4A CN201310613018A CN103617773B CN 103617773 B CN103617773 B CN 103617773B CN 201310613018 A CN201310613018 A CN 201310613018A CN 103617773 B CN103617773 B CN 103617773B
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Abstract
The exoelectron method of testing of a kind of media protection membrane material of the present invention, comprises at least one cycle period T for testing, and described cycle period T comprises the voltage carried out continuously successively as follows and applies the cycle, 1) excitation cycle T
s, 2) and latent period T
w, 3) and test period T
r; Detect and record the light signal produced by working gas discharge process in display unit in tested plasma display panel (PDP) in test period, the difference V of test voltage when simultaneously obtaining producing light signal between scan electrode Y and maintenance electrode X
d, by formula V
w=V
f-V
dcalculate the fields inside voltage V in display unit
w, according to V
wcalculate the quantity of exoelectron in display unit, complete the once test to media protection membrane material exoelectron.The exoelectron test macro of a kind of media protection membrane material for realizing described method of testing of the present invention, comprises driving circuit, photomultiplier, oscillograph, computing machine, control circuit and power circuit.
Description
Technical field
The present invention relates to the technical field utilizing gas discharge to measure small electronic, be specially a kind of exoelectron test macro and method of media protection membrane material.
Background technology
Media protection membrane material is with its high resistance sputtering, and the long-life, high secondary electron emission characteristic is widely used in the fields such as space, military project, image enhaucament, measurement.Wherein, the application of medium protection film in plasma scope (PDP, PlasmaDisplayPanel) is particularly important.The ultraviolet excitated fluorescent powder that PDP mainly utilizes gas discharge to produce is luminous, realizes the display of character and image.According to the difference of driving voltage and display unit, plasma scope is divided into direct current and AC discharge type.Current, alternating-current plasma display mainly adopts the seeking oil gas (ADS of three-electrode structure, AddressDisplaySeparate) driving method realizes full-color EL display, there is due to it features such as long-life, high reliability and lower manufacturing cost, become the main flow of plasma scope, below three electrode AC discharge type plasma scopes are called plasma scope (PDP).
In prior art, as shown in Figure 1, PDP is formed primarily of prebasal plate 1 and metacoxal plate 2 two parts.Prebasal plate 1 inside surface has the combination electrode that maintenance electrode X and scan electrode Y two is parallel and coplanar.Every bar combination electrode is again be made up of metal electrode and indium tin oxide transparency electrode.Between the combination electrode and gas discharge space of prebasal plate 1, also have one deck to adopt the transparent dielectric layer 3 of low glass powder sintering.Dielectric layer 3 serves isolation combination electrode and discharge space, suppresses the effect of discharge current.Have the medium protection film 4 of one deck magnesium oxide (MgO) material on dielectric layer 3 surface, medium protection film 4 mainly plays protective medium and electrode does not sputter by discharge ion, extends the effect in media operation life-span.Because the secondary electron yield on medium protection film 4 surface is higher, and the exoelectron of some can be provided.Medium protection film 4 also has the effect reducing operating voltage, shorten discharge delay, improve devices function stability.PDP metacoxal plate 2 is dispersed with addressing electrode A, rear plate dielectric layer 3, phosphor powder layer 6 and barrier 5 successively.
PDP sustain discharge mainly prolongs between the maintenance electrode X of the row arrangement that horizontal direction extends and scan electrode Y at prebasal plate 1 and carries out, change into visible ray after the vacuum ultraviolet (VUV) that electric discharge produces is absorbed by the phosphor powder layer 6 that metacoxal plate applies to transmit from prebasal plate, define display image.Addressing electrode A is the row arrangement being distributed in metacoxal plate 2 surface and prolonging vertical direction extension.Scan electrode Y, maintenance electrode X and addressing electrode A form a two-dimensional matrix, and each point of crossing of this matrix defines display unit (pixel), and plasma display panel (PDP) realizes the display of normal image by the discharge process of display unit.The discharging structure of this maintenance electrode X and scan electrode Y co-planar designs adds space and the electric discharge effective coverage of VUV radiation, has higher discharging gap consistance, and phosphor powder layer 6 can be avoided directly to be bombarded by VUV.Therefore, it is possible to improve display frame brightness uniformity, improve the luminescence efficiency of display screen.
As shown in Figure 2, PDP mainly comprises the elementary cells such as plasma display panel (PDP), control circuit, scan drive circuit, maintenance driving circuit, addressing waveforms generation circuit.In PDP course of normal operation, addressing waveforms produces circuit and provides given voltage V according to the control signal of control circuit to addressing electrode A
a.Scan drive circuit provides given voltage V to scan electrode Y
y.Maintain driving circuit and provide given voltage V to maintenance electrode X
x.
As shown in Figure 3, complete display cycle of ADS driving method by SF1 ~ SF10 totally 10 subfields form, each subfield is made up of preparatory stage (containing standard reset process t1 or Global reset process t2), address period (address procedures t3) and maintenance phase (maintenance process t4).In ADS driving method, between the preparatory stage, the voltage that maintenance electrode X and scan electrode Y applies makes display each discharge cell mesospore CHARGE DISTRIBUTION even, reaches consistent state.Address period, mainly selects to need luminous discharge cell and non-luminous discharge cell.Applied voltage waveform be applied in a certain order scan electrode Y and need on the addressing electrode A of luminous discharge cell.Maintenance period, is alternately applied to maintenance pulse on scan electrode Y and maintenance electrode X.Make in the display unit space of participation addressing, to produce the gas discharge excitated fluorescent powder continued luminous.
In prior art, PDP needs to use high Xe(xenon to improve luminescence efficiency) working gas of content, this makes increase the PDP discharge time (Td) adopting ADS driving method, and the electric discharge timing statistics (Ts) in address procedures is elongated.After address-time increases, holding time of image of display will correspondingly be reduced, directly the impact display contrast of image and brightness, and addressing also can be caused time serious inaccurate and maintain and misplace electricity, and serious obstruction shows image quality.Development particularly along with emerging display techniques such as 3D display and 4 times of high definitions more needs further to reduce PDP address-time.And improve addressing stability, reduce the exoelectron emission performance that address-time just needs amplified medium Protective coatings, study the media protection membrane material of high exoelectron emission characteristic to reduce the address-time of PDP.Accurately measuring of exoelectron is an important content in the research of medium protection film material behavior.In addition, also day by day come into one's own at the high exoelectron emission material in the field such as space science, electronic surveying, become the focus of research.At present, exoelectron test process mainly adopts direct method of testing.
In prior art, PDP exoelectron all adopts direct method of testing as shown in Figure 4, the scan electrode Y of whole for plasma display panel (PDP) display unit, addressing electrode A, maintenance electrode X are connected to together by this method of testing, then on scan electrode Y and maintenance electrode X, square wave is applied, the electric current on test addressing electrode A.Because addressing electrode A itself does not participate in electric discharge substantially; its electric current formed can be regarded as the electron emission that vacuum-ultraviolet light (VUV, Vacuumultraviolet) the exciting media Protective coatings due to gas discharge generation between maintenance electrode X and scan electrode Y produces.By this electric current after addressing electrode A extraction, current testing device is utilized to test, and using the exoelectron formation electric current of test result as this media protection membrane material, thus its exoelectron emission situation is judged.
In addition; medium protection film material surface secondary can also be suppressed by metal otter board to escaping Electronic Testing; promote that medium protection film produces the method for small exoelectron emission current to detect exoelectron emission current, its core also mainly tests electric current that exoelectron produces and in addition amplification detection.
But there is many weak points in the measurement that in prior art, these escape electric current.For high definition PDP, its display unit only has 0.81 × 0.27mm
2.During test, the exoelectron of each display unit forms electric current and is less than 2pA, even if linked together by most of display unit, the exoelectron of integrated circuit forms electric current and also only has several nA.The testing current of this nA rank needs professional equipment just can carry out, and these equipment are not only expensive, and the big current that the sustain discharge easily alternately changed by device itself produces affects, and constantly occurs current overload phenomenon alternately; Particularly escape electric current itself very little, and environment current noise is relatively large, test data is easily fallen into oblivion by neighbourhood noise, is difficult to be measured numerical value accurately.And the outer meeting resistance connecting large resistance on addressing electrode A that partial monopoly is mentioned, the method measuring exoelectron electric current by the pressure drop of resistance also can affect the accuracy of test result because of the precision of resistance own and distributed capacitance.
The test result deviation of the direct method of testing of existing exoelectron can produce certain impact for the application of deielectric-coating protective material, needs to find more accurate, practical method of testing to realize accurately measuring of display unit exoelectron.
Summary of the invention
For problems of the prior art, the invention provides a kind of exoelectron test macro and method of media protection membrane material, can testing cost be reduced, improve the accuracy of test result, realize medium protection film exoelectron emission performance and accurately measure.
The present invention is achieved through the following technical solutions:
The exoelectron method of testing of a kind of media protection membrane material of the present invention, comprises at least one cycle period T for testing, and described cycle period T comprises the voltage carried out continuously successively as follows and applies the cycle,
1) excitation cycle T
s; The maintenance electrode X and scan electrode Y of tested plasma display panel (PDP) are alternately applied to and comprise a discharge cycle T less
cexciting voltage, at a discharge cycle T
cinterior working gas at least completes single step of releasing electric process; Exciting voltage is not less than the firing voltage V in tested plasma display panel (PDP) needed for working gas electric discharge
f;
2) latent period T
w; At excitation cycle T
safter end, the applying voltage on maintenance electrode X and scan electrode Y is placed in and waits on voltage, wait for that voltage is less than the firing voltage V in tested plasma display panel (PDP) needed for working gas electric discharge
f; The life period of the exoelectron that the stand-by period produces when being not more than working gas electric discharge;
3) test period T
r; At latent period T
wafter end, maintenance electrode X and scan electrode Y apply the synchronous test voltage risen respectively, the difference V of the test voltage between scan electrode Y and maintenance electrode X
dincrease gradually and only produce one action process gas discharge;
Detect and record the light signal produced by working gas discharge process in display unit in tested plasma display panel (PDP), the difference V of test voltage when simultaneously obtaining producing light signal between scan electrode Y and maintenance electrode X
d, by formula V
w=V
f-V
dcalculate the fields inside voltage V in display unit
w, according to V
wcalculate the quantity of exoelectron in display unit, complete the once test to media protection membrane material exoelectron.
Preferably, the waveform of exciting voltage is one or more the combination in square wave, triangular wave, trapezoidal wave, multiple-pulse ripple, sine wave and exponential wave; The waveform of test voltage is one or more combinations in oblique wave, exponential wave, triangular wave, trapezoidal wave.
Preferably, the stand-by period is greater than 1ms.
Preferably, the scan electrode Y in tested plasma display panel (PDP) and maintenance electrode are shorted together respectively and apply voltage in succession, and addressing electrode A is shorted together ground connection setting.
Preferably, by the repeated test of repeatedly same cycle duration T, obtain the difference V of corresponding multiple test voltages respectively
d, average as the difference V of test voltage
dfinal testing result.
The exoelectron test macro of a kind of media protection membrane material for realizing method of testing of the present invention of the present invention, comprises driving circuit, photomultiplier, oscillograph, computing machine, control circuit and power circuit; Described driving circuit comprises to be executed alive scan drive circuit for providing and maintains driving circuit; Scan drive circuit and maintain driving circuit and be connected respectively on scan electrode Y in tested plasma display panel (PDP) and maintenance electrode X; Described photomultiplier is arranged on the image outgoing side of display unit front panel in tested plasma display panel (PDP), for the light signal produced by working gas discharge process in detection display unit, and light signal is converted to electric signal and is input in oscillograph; Described oscillograph is also carried in applying voltage signal on scan electrode Y and maintenance electrode X for testing correspondence; Described computing machine is used for setting and executes alive loading parameters, for receiving a road electric signal that oscillograph collects and two tunnels apply voltage signal, and for the calculating of signal data to specific output; Described control circuit is used for the loading parameters of computer export to be converted to switching signal, and together outputs in driving circuit with the switch control time sequence signal produced; Described power circuit is used for providing required voltage for driving circuit and control circuit.
Preferably, optics backup system is provided with between photomultiplier and the front panel of display unit, optics backup system comprises at least one group of eyepiece system, gathers in the target viewing area of target display unit or multiple display unit formation for making the sensing range of photomultiplier.
Further, in eyepiece system, superposition arranges optical filter.
Preferably, power circuit comprises pressure adjustable type D.C. regulated power supply.
Preferably, scan drive circuit comprises the circuit and square-wave applying voltage waveform control on scan electrode Y, upper slope circuit and lower slope circuit, and described maintenance driving circuit comprises on maintenance electrode X, apply voltage waveform control circuit and square-wave and slope circuit.
Compared with prior art, exoelectron method of testing of the present invention has following useful technique effect:
1., by being alternately applied to the exciting voltage on maintenance electrode and scan electrode in excitation cycle, making the working gas electric discharge between maintenance electrode and scan electrode produce VUV, and then generation exoelectron is excited to media protection membrane material; The exciting voltage comprising multiple discharge cycle can by the quantity of the continuous accumulation exoelectron of the electric discharge of each working gas, thus greatly reduce the difficulty of test of exoelectron, simultaneously can also by the adjustment to discharge cycle quantity, realize meeting different test demands, control the quantity of exoelectron, control accurately, applied widely.
2. there is the characteristic that there is cycle of cycle much smaller than exoelectron in the Wall charge being attached to medium protection film surface utilizing working gas to be formed because of electric discharge, the wait voltage lower than firing voltage applied in latent period, the Wall charge existed in latent period is progressively run off, and quantity reduces; Reduce to minimum by adjusting externally to be escaped by Wall charge in the display unit impact of Electronic Testing of stand-by period of latent period, greatly improve the accounting of exoelectron at working gas Space-charge, thus eliminate the harmful effect of Wall charge in test result, ensure that the accuracy of test result.
3. pass through executing alive control, realize the electric discharge of display unit working gas, thus generation light signal, utilize the detection to light signal, and corresponding light signal position draws the difference of the test voltage of scan electrode and maintenance electrode, thus the difference of the test voltage that can be calculated by fixing gas ignition voltage and collection obtains the magnitude of voltage of internal electric field, because the internal electric field after latent period is formed primarily of exoelectron, therefore, it is possible to obtain the quantity of exoelectron, test simple and convenient; What adopt in the present invention is that the collection of light signal by producing exoelectron is to judge the generation of process gas discharge, and then obtain the electric field of exoelectron generation, calculate the quantity of the electronics escaped, achieving the indirectly testing to escaping electronic surveying, avoiding and directly testing Instrumental to the impact of measuring accuracy; And due to directly test to as if light signal but not current signal; overcome the annihilation effect of environment current noise to exoelectron Weak current; realize the Measurement accuracy to exoelectron; practical high with test accuracy, can be good at applying in the medium protection film exoelectron measurement of various material under various circumstances.
Further, by the restriction to exciting voltage, reduce the operation easier of method of testing, simultaneously by the restriction to test voltage wave, test voltage can be met easily and synchronously rise, and the requirement that the difference of test voltage increases, reduce calculating and operation easier, improve testing efficiency.
Further, by the restriction of stand-by period lower limit, ensure that a large amount of losses of Wall charge, make being mainly of existence in display unit escape electric charge, thus better improve the accuracy of test.
Further, by test process, the short circuit of scan electrode, the short circuit of maintenance electrode, and the short circuit ground connection of addressing electrode, when ensure that test, exoelectron by the impact of external circuit, can not better improve the accuracy of test.
Further, by the algorithm of averaging after the difference repetitive measurement of test voltage, ensure that the correctness calculating data, avoid the randomness of image data, better improve the accuracy of test.
Test macro of the present invention, achieved by driving circuit and execute alive output in scan electrode and maintenance electrode different cycles, utilize photomultiplier realize in display unit because working gas discharges the collection of the faint optical signal sent and conversion, thus judge the generation of process gas discharge accurately, the synchronous test voltage by scan electrode during oscillograph collecting work gas discharge and maintenance electrode apply; Utilize computing machine to adjust correspondence in real time dynamically and execute alive loading parameters, realize the control to test process, the logical sequence of loading parameters is realized by control circuit, obtain switch control time sequence signal, realize scan drive circuit corresponding in driving circuit and the sequential control maintaining driving circuit; System highly versatile, equipment cost is low, realize simple, do not carry out the test directly exoelectron being formed to electric current, therefore the impact of equipment precision on test result is avoided, enhance accuracy and the practicality of exoelectron test, to overcome in prior art device current test specification and payload to the impact of test.
Further, by the setting of eyepiece system, test macro can be improved to the specific aim of optical signal detecting in display unit and accuracy, and ensure that light signal can not fallen into oblivion by outer signals by normal pickoff, thus reduce test error.
Further, utilize the optical filter superposing setting in eyepiece system, the optical filter that can also add respective wavelength in use before optical system, to filter the impact of surround lighting on test result, improves the sensitivity to optical signal detecting.
Further, by the restriction to circuit, better met control circuit and driving circuit to high pressure and low pressure and between the demand of conversion, ensure that the normal table of test macro runs.
Further, by scan drive circuit and the setting maintaining driving circuit, apply voltage when can better meet test to the demand of Waveform Control, improve the efficiency of test, reduce the difficulty of operation.
Accompanying drawing explanation
Fig. 1 is the horizontal section structural representation of plasma display panel (PDP) display unit in prior art.
Fig. 2 is the basic structure schematic diagram of PDP in prior art.
Fig. 3 is that in prior art, PDP adopts the subfield of ADS driving method to form time distribution map.
Fig. 4 is the direct method of testing schematic diagram of PDP exoelectron in prior art.
Fig. 5 of the present inventionly executes alive waveform schematic diagram.
Fig. 6 is test system structure block diagram of the present invention.
Fig. 7 is driving circuit block diagram of the present invention; 7a is scan drive circuit block diagram, and 7b is for maintaining driving circuit block diagram.
Fig. 8 is the connection diagram of display unit of the present invention and test macro.
Fig. 9 is display unit sparking voltage of the present invention and the schematic diagram of discharge time.
In figure: 1 is prebasal plate, 2 is metacoxal plate, and 3 is dielectric layer, and 4 is medium protection film, and 5 is barrier, and 6 is phosphor powder layer, and 7 is visible ray, and 8 is optics backup system, and X is maintenance electrode, and Y is scan electrode, and A is addressing electrode.
Embodiment
Below in conjunction with specific embodiment, the present invention is described in further detail, and the explanation of the invention is not limited.
The exoelectron method of testing of a kind of media protection membrane material of the present invention, as shown in Figure 5, it comprises at least one cycle period T for testing, and described cycle period T comprises the voltage carried out continuously successively as follows and applies the cycle,
1) excitation cycle T
s; The maintenance electrode X and scan electrode Y of tested plasma display panel (PDP) are alternately applied to and comprise a discharge cycle T less
cexciting voltage, at a discharge cycle T
cinterior working gas at least completes single step of releasing electric process; Exciting voltage is not less than the firing voltage V in tested plasma display panel (PDP) needed for working gas electric discharge
f; Thus the VUV gas discharge formed between maintenance electrode X and scan electrode Y for exciting exoelectron.
2) latent period T
w; At excitation cycle T
safter end, the applying voltage on maintenance electrode X and scan electrode Y is placed in and waits on voltage, wait for that voltage is less than the firing voltage V in tested plasma display panel (PDP) needed for working gas electric discharge
f; The life period of the exoelectron that the stand-by period produces when being not more than working gas electric discharge; Thus reduce medium protection film surface wall electric charge; strengthen the quantity of exoelectron in discharge space electric charge, wait for that voltage can select zero setting or one fixing can not cause on the fixed level position of electric discharge, in this preferred embodiment; as shown in Figure 5, to wait for that voltage selects zero setting.
3) test period T
r; At latent period T
wafter end, maintenance electrode X and scan electrode Y apply the synchronous test voltage risen respectively, the difference V of the test voltage between scan electrode Y and maintenance electrode X
dincrease gradually and only produce one action process gas discharge; Detect and record the light signal produced by working gas discharge process in display unit in tested plasma display panel (PDP), the difference V of test voltage when simultaneously obtaining producing light signal between scan electrode Y and maintenance electrode X
d, by formula V
w=V
f-V
dcalculate the fields inside voltage V in display unit
w, according to V
wcalculate the quantity of exoelectron in display unit, complete the once test to media protection membrane material exoelectron.Achieving and the exoelectron escaped in the discharge process of electron institute participation is measured, testing current of the prior art is become visible ray test, improving the accuracy of test by detecting the change of corresponding impressed voltage.
Method of testing ultimate principle of the present invention is, in display unit internal discharge process, and the firing voltage V needed for gas discharge
ffor impressed voltage and discharge space internal charge form internal electric field V
wsum.Voltage V needed for gas discharge
ffor certain value, applying impressed voltage corresponding on the time point of corresponding actual discharge generation VUV position on voltage, namely maintenance electrode X and scan electrode Y executes alive voltage difference V
d, and the inner fields inside voltage V because of exoelectron generation of display unit
w=V
f– V
d.Therefore, the difference V of test voltage in process gas discharge is calculated by test voltage added by the scan electrode on the position and corresponding applying voltage of test period internal cause working gas electric discharge generation VUV photon pulse and maintenance electrode
d, the namely impressed voltage of corresponding luminous point, and then internal electric field V can be calculated with firing voltage and impressed voltage
wmagnitude of voltage.Now internal electric field is formed primarily of exoelectron, obtains internal electric field V
wjust can obtain the size of exoelectron afterwards, realize exoelectron and measure.
In method of testing of the present invention, the structure mechanism of cycle period is: exoelectron derives from the Auger effect in electronics and hole compound nucleus process; the Auger electron that particularly 147nmVUV photon excitation produces to the band gap of medium protection film is launched; so exoelectron has the longer life-span; and quantity is by the impact of number of gas discharges; discharge time is more, and exoelectron quantity is also more.In the present invention, by discharge cycle T that adjustment cycle discharges
cnumber of times just can adjust the number of times of VUV photon excitation, and then increase effective Auger electron and launch, improve exoelectron quantity.Stand-by period before exoelectron and Wall charge are in test period before the time span changing latent period just can adjust and measure, after excitation cycle.The ion lifetime produced due to working gas circuit is very short, continues in time in latent period, and Wall charge will run off, and the exoelectron life-span is longer, after waiting process, the electric charge that can exist in display unit mainly exoelectron, thus improve the accuracy of measurement result.Avoid in measuring process, due to the negligible amounts of exoelectron own, the electric current formed is very little, by the problem that environment current noise is fallen into oblivion, the impact of extra electric field when working gas being discharged by measuring the internal electric field formed in the inner exoelectron accumulation of display unit, and then measure the quantity of exoelectron.
Preferably, the waveform of exciting voltage is one or more the combination in square wave, triangular wave, trapezoidal wave, multiple-pulse ripple, sine wave and exponential wave; The waveform of test voltage is oblique wave, and in this preferred embodiment, as shown in Figure 5, the waveform of exciting voltage is square wave, and the waveform of test voltage is oblique wave.
Preferably, the stand-by period is greater than 1ms, and after this stand-by period, Wall charge will run off in a large number, further improve the accounting escaping electric charge.When adopting method of testing of the present invention, scan electrode Y in tested plasma display panel (PDP) and maintenance electrode are shorted together respectively and apply voltage in succession, addressing electrode A is shorted together ground connection setting, during to ensure to test, exoelectron by the impact of external circuit, can not improve test accuracy.
Preferably, in order to ensure the correctness of data, by the repeated test of repeatedly same cycle duration T, obtain the difference V of corresponding multiple test voltages respectively
d, average as the difference V of test voltage
dfinal testing result.
The exoelectron test macro of a kind of media protection membrane material for realizing above-described method of testing of the present invention, as shown in Figure 6, it comprises driving circuit, photomultiplier, oscillograph, computing machine, control circuit and power circuit; Described driving circuit comprises to be executed alive scan drive circuit for providing and maintains driving circuit; Scan drive circuit and maintain driving circuit and be connected respectively on scan electrode Y in tested plasma display panel (PDP) and maintenance electrode X; Described photomultiplier is arranged on the image outgoing side of display unit front panel in tested plasma display panel (PDP), for the light signal produced by working gas discharge process in detection display unit, and light signal is converted to electric signal and is input in oscillograph; Described oscillograph is also carried in applying voltage signal on scan electrode Y and maintenance electrode X for testing correspondence; Described computing machine is used for setting and executes alive loading parameters, for receiving a road electric signal that oscillograph collects and two tunnels apply voltage signal, and for the calculating of signal data to specific output; Described control circuit is used for the loading parameters of computer export to be converted to switching signal, and together outputs in driving circuit with the switch control time sequence signal produced; Described power circuit is used for providing required voltage for driving circuit and control circuit.
Wherein, the loading parameters such as shape formation, cycle index, duration of alive waveform executed by computing machine needed for exoelectron test for arranging, simultaneously also by the discharge position of collection oscillograph transmission and the data of sparking voltage, form corresponding result of calculation, export with the form of report, thus draw for the assessment report to the performance test of medium protection film exoelectron emission; On the maintenance electrode that the applying voltage of the corresponding waveform that switch control time sequence that driving circuit utilizes control circuit to transmit realizes maintaining, scanning two-way driving circuit exports is loaded into display screen respectively and scan electrode; Oscillograph unit, for testing three road signals, wherein two-way preferably uses and high-voltage probe acquisition scans electrode and maintenance electrode executes alive waveform, analysis-driven circuit working state, another road adopts photomultiplier transit instrument to gather the discharge scenario of display unit in measuring period, scanning voltage data three circuit-switched data form discharge position and discharge after passing to Computer Analysis by interface time.Photomultiplier converts the faint light signal produced in process gas discharge to electric signal to judge the generation of process gas discharge, thus the difference of test voltage in accurate acquisition discharge process between maintenance electrode X and scan electrode Y.In use procedure, for each discharge cycle T of excitation cycle
ccycle Length and waveform rising edge, negative edge time span, and the time parameter of latent period all can carry out parameter adjustment by computing machine and realize corresponding sequential control by control circuit, realize the applying starting point of voltage waveform and the accurate control of end point.
At computing machine, the transmission applying voltage-drop loading correlation parameter is carried out to control circuit, the namely transmission of Waveform Control parameter, preferably can adopt parameter list form, comprise the cycling time of the on off state of each control signal, the duration of corresponding state and various periodic waveform.This parameter list can on-the-fly modify each signal and sequential thereof, to ensure that the display screen of different technical parameters can have the waveform adapted to it, realizes the Stability and veracity of test.And computing machine can increase the cycle index of excitation cycle as required to executing alive control, extend the time of latent period, the waveform slope of adjustment test period, realize combining the selection of the multiple waveforms such as square wave, index, triangle, increase exoelectron emission quantity, reduce Wall charge to the impact of test result.Meet method of testing to the requirement controlled, can carry out in real time, real time modifying can be carried out by the communication of computing machine and control circuit after computer interface parameter modification.
In this preferred embodiment, as shown in Figure 8, optics backup system is provided with between photomultiplier and the front panel of display unit, optics backup system comprises at least one group of eyepiece system, gathering in the target viewing area that target display unit or multiple display unit form for making the sensing range of photomultiplier, making light signal form millivolt magnitude voltage signals test through the focusing of the optics backup system 8 of photomultiplier front end, filtration, amplification.Preferably, in eyepiece system, superposition arranges optical filter to reduce the impact of surround lighting on test result.
In this preferred embodiment, power circuit adopts and comprises the adjustable D.C. regulated power supply that can provide low pressure and high pressure.Scan drive circuit comprises the circuit and square-wave applying voltage waveform control on scan electrode Y, upper slope circuit and lower slope circuit, and described maintenance driving circuit comprises on maintenance electrode X, apply voltage waveform control circuit and square-wave and slope circuit.
Concrete when utilizing method of testing of the present invention and described test macro to carry out the test of exoelectron.
As shown in Figure 5, be the cycle period T once tested, at excitation cycle T
sstage; working gas in display unit is caused to excite electric discharge by the exciting voltage of the alternately change applied on maintenance electrode X and scan electrode Y; this process gas discharge can produce a large amount of VUV photon, and VUV photon provides energy and the electronics of exciting media diaphragm solid surface defect capture escapes into discharge space formation exoelectron.Meanwhile, the Wall charge being attached to medium protection film surface can also be formed after gas ionization itself.In the process, on maintenance electrode X and scan electrode Y, alternately the discharge cycle T of periodically applying is carried out in change
cquantity determine the quantity that gas discharge produces Wall charge and exoelectron.Exciting voltage discharge cycle T
cmore, exoelectron is more, then more easily test, and therefore needs according to actual test case discharge cycle T
ccarry out dynamic conditioning.Concrete, excitation cycle adopts voltage magnitude V
s=200V, the single discharge cycle T used
cemploying dutycycle is the square wave formation of 50%, and the cycle is 20 μ s, discharge cycle T
cquantity be 50.
At latent period T
wstage, maintenance electrode X and scan electrode Y applies wait for voltage, wait for that operating at voltages gas electric discharge phenomena can not occur, because the cycle that exists of Wall charge will much smaller than exoelectron, along with the increase of stand-by period, Wall charge will progressively be passed, and quantity tails off, and exoelectron passes through at excitation cycle T
sinterior constantly compound-excitation process, have longer life period, its quantity does not have obvious change.Improve the content of exoelectron in test electronics by latent period, enhance the accuracy of test signal.Concrete, wait in latent period that voltage adopts the wait voltage on scan electrode Y and maintenance electrode X to be all set to 0V, whole latent period time T
w=5ms.
At test period T
rin the stage, maintenance electrode X and scan electrode Y applies difform oblique wave seat test voltage respectively, and the test voltage voltage magnitude wherein scan electrode Y applied is V
s+ V
r, the amplitude of the test voltage that maintenance electrode X applies is V
s, and use the reference position and voltage swing of discharging between photomultiplier transit instrument test scan electrode Y and maintenance electrode X.By testing the numerical value of the difference of test voltage and then the quantity of exoelectron can being calculated; Concrete, at test period T
r, it is V that the test voltage that scan electrode Y applies vertically rises to amplitude
safter, progressively rise to voltage V with slope 2V/ μ s
r, V
r=200V.After this, it is V that the voltage vertical that scan electrode Y applies drops to amplitude
s, then be down to 0V with slope 1.6V/ μ s, the test voltage that maintenance electrode X applies progressively rises to voltage magnitude for V with slope 1.4V/ μ s
s, on electrode Y to be scanned and maintenance electrode X, the test voltage amplitude that peaks respectively is V
s+ V
rand V
safter, maintenance electrode is down to 0V, under the waveform of this test voltage, completes a test period T
rtest process.
During test, the test macro of employing as shown in Figure 6, computing machine can adaptive testing system to the test of different medium Protective coatings; Power circuit provides the voltage needed for driving circuit and control circuit, can adopt pressure adjustable type heavy DC stabilized voltage supply; Concrete, control circuit adopts the logic control device with logical process and interface communication ability to realize, and output power device control signal is 14 tunnels, generate signal sequential minimum resolution be 25ns; Driving circuit is for the concrete described method of this preferred embodiment and requirements set, and as shown in Figure 7, scan drive circuit comprises structure: circuit and square-wave, upper slope circuit, lower slope circuit, maintains driving circuit and comprises circuit and square-wave and slope circuit.This driving circuit can produce the square wave required for applying voltage and oblique wave that propose in the embodiment of the present invention, the power device that driving circuit comprises all adopts ratings to be at least 150A and 300V, ratings is adopted to be 160A in this preferred embodiment, the High Speed I GBT of 350V or switch mosfet pipe, in order to meet the needs of actual waveform electric current, in partial circuit, these power devices carry out parallel connection use.Execute alive Waveform Control produced by control circuit whole, control circuit exports 14 road logical sequence signals altogether, control the switch controlling signal of QerH, QerL, QsusH, QsusL, QrampH, QpassH, QrampL, QpassL constant power device in the turntable driving shown in Fig. 7 and maintenance driving circuit respectively, the V in Fig. 5 and 7
s=200V, V
setup=200V, V
y=0V is high voltage direct current, is provided by power circuit unit, and executing alive waveform in the present embodiment in whole cycle period T is square wave and oblique wave combined waveform.
During test, the display unit syndeton of test macro and tested plasma display panel (PDP) as shown in Figure 8, photomultiplier is applied directly on the prebasal plate 1 of display unit by optics backup system 8, thus photomultiplier can test the faint light that the working gas electric discharge between maintenance electrode X and scan electrode Y produces, and light signal is converted to electric signal and form an electric impulse signal higher than neighbourhood noise.The photomultiplier used in this preferred embodiment can pick up nA level dark current, there is higher radiant sensitivity, the photon that can picking up in display unit discharges produces also is amplified to a millivolt magnitude voltage signals and is transferred to oscillograph, and the voltage signal of this rank normally can be identified by oscillograph.Can do not fallen into oblivion by outer signals by normal pickoff in order to ensure this VUV photon signal, the optical filter of respective wavelength can also be added to filter the impact of surround lighting on test result in the superposition of optics backup system in use, improve the sensitivity of signal.
The data corresponding relation obtained after test as shown in Figure 9, at test period T
rafter beginning, it is V that the test voltage that scan electrode Y applies vertically rises to amplitude
sthe test voltage that rear beginning and maintenance electrode apply continues synchronous rising with the oblique wave of Different Slope.Now, on scan electrode and maintenance electrode, alive voltage difference progressively increases, and exoelectron is at the electric charge V of display unit inner accumulation
wand the difference V of the test voltage applied
dsum reaches working gas firing voltage V
fafter, occur between two electrodes that dark discharge produces VUV photon.Now photomultiplier can test a luminous brightness peak, C point in the A point in this brightness corresponding diagram 9 scan electrode test voltage wave and maintenance electrode test voltage wave, the voltage V between test C point and A point
aCjust can calculate gas ignition voltage V
fwith voltage V
aCbetween pressure reduction, this pressure reduction primarily of exoelectron display unit inner space accumulation formed V
w.And the t Changing Pattern calculated between A point and measuring period starting point B can also study the impact of exoelectron on discharge stability.
According to the technical scheme of the embodiment of the present invention, be supplied to control circuit by the corresponding waveform parameter of computer installation and sequential relationship, and produce by control circuit the waveform that corresponding power device clock signal forms corresponding test voltage in the driving circuit.This method can realize comparatively flexibly, simply Waveform Control and generation, and according to actual displayed screen test needs, can execute the shape of waveform in alive discharge cycle, quantity and time span in dynamic conditioning excitation cycle.This employing optimum configurations controls the method that test waveform produces, under alive waveform is executed to research difference, namely under drive waveforms, the change of exoelectron emission performance and raising exoelectron emission quantity, increase test accuracy and have positive meaning.
In embodiments of the invention, measurement is mainly carried out round the voltage difference maintained between scan electrode when scanning and maintenance electrode oblique wave is formed dark discharge point, this voltage difference reflect excitation cycle formed exoelectron quantity number, although exoelectron lazy weight is to produce the electric current needed for conventional equipment test, the difference V of the test voltage applied when display unit inside can change electric discharge greatly
d.In addition; by optics backup system; the research of exoelectron emission can be concentrated on required concrete display unit or concrete region; acquired results can get rid of ambient noise interference; there is higher accuracy and signal to noise ratio (S/N ratio), research display screen medium protection film material exoelectron emission is had great importance.
Obviously, those skilled in the art should be understood that, the modules of foregoing invention or step can be realized by multiple relevant device, device, and they can be combined in a device inside or be distributed on the network of multiple device formation, are even solidified into circuit module to realize.Therefore, the present invention is not restricted to the combination of any specific hardware and software.
The present embodiment only gives the concrete example application of part, belongs to the preferred embodiment of the present invention, is not limited to the present invention.For those skilled in the art of relation technological researching, the present invention still has multiple change and change.All within by invention right; design different excitation cycles, latent period and relevant various deformation proving installation and the method for testing executed alive waveform and modify, be equal to the formation such as replacement, improvement in prior art of measuring period according to above-described embodiment, all should be encompassed among protection scope of the present invention.
Claims (10)
1. an exoelectron method of testing for media protection membrane material, comprises at least one for the cycle period T tested, it is characterized in that, described cycle period T comprises the voltage carried out continuously successively as follows and applies the cycle,
1) excitation cycle T
s; The maintenance electrode X and scan electrode Y of tested plasma display panel (PDP) are alternately applied to and comprise a discharge cycle T less
cexciting voltage, at a discharge cycle T
cinterior working gas at least completes single step of releasing electric process; Exciting voltage is not less than the firing voltage V in tested plasma display panel (PDP) needed for working gas electric discharge
f;
2) latent period T
w; At excitation cycle T
safter end, the applying voltage on maintenance electrode X and scan electrode Y is placed in and waits on voltage, wait for that voltage is less than the firing voltage V in tested plasma display panel (PDP) needed for working gas electric discharge
f; The life period of the exoelectron that the stand-by period produces when being not more than working gas electric discharge;
3) test period T
r; At latent period T
wafter end, maintenance electrode X and scan electrode Y apply the synchronous test voltage risen respectively, the difference V of the test voltage between scan electrode Y and maintenance electrode X
dincrease gradually and only produce one action process gas discharge;
Detect and record the light signal produced by working gas discharge process in display unit in tested plasma display panel (PDP), the difference V of test voltage when simultaneously obtaining producing light signal between scan electrode Y and maintenance electrode X
d, by formula V
w=V
f-V
dcalculate the fields inside voltage V in display unit
w, according to V
wcalculate the quantity of exoelectron in display unit, complete the once test to media protection membrane material exoelectron.
2. the exoelectron method of testing of a kind of media protection membrane material according to claim 1, is characterized in that, the waveform of described exciting voltage is one or more the combination in square wave, triangular wave, trapezoidal wave, multiple-pulse ripple, sine wave and exponential wave; The waveform of test voltage is one or more combinations in oblique wave, exponential wave, triangular wave, trapezoidal wave.
3. the exoelectron method of testing of a kind of media protection membrane material according to claim 1, it is characterized in that, the described stand-by period is greater than 1ms.
4. the exoelectron method of testing of a kind of media protection membrane material according to claim 1; it is characterized in that; scan electrode Y in described tested plasma display panel (PDP) and maintenance electrode are shorted together respectively and apply voltage in succession, and addressing electrode A is shorted together ground connection setting.
5. the exoelectron method of testing of a kind of media protection membrane material according to claim 1, is characterized in that, by the repeated test of repeatedly same cycle duration T, obtains the difference V of corresponding multiple test voltages respectively
d, average as the difference V of test voltage
dfinal testing result.
6. for realizing an exoelectron test macro for the media protection membrane material of method of testing as claimed in claim 1, it is characterized in that, comprise driving circuit, photomultiplier, oscillograph, computing machine, control circuit and power circuit;
Described driving circuit comprises to be executed alive scan drive circuit for providing and maintains driving circuit; Scan drive circuit and maintain driving circuit and be connected respectively on scan electrode Y in tested plasma display panel (PDP) and maintenance electrode X;
Described photomultiplier is arranged on the image outgoing side of display unit front panel in tested plasma display panel (PDP), for the light signal produced by working gas discharge process in detection display unit, and light signal is converted to electric signal and is input in oscillograph;
Described oscillograph is also carried in applying voltage signal on scan electrode Y and maintenance electrode X for testing correspondence;
Described computing machine is used for setting and executes alive loading parameters, for receiving a road electric signal that oscillograph collects and two tunnels apply voltage signal, and for the calculating of signal data to specific output;
Described control circuit is used for the loading parameters of computer export to be converted to switching signal, and together outputs in driving circuit with the switch control time sequence signal produced;
Described power circuit is used for providing required voltage for driving circuit and control circuit.
7. the exoelectron test macro of a kind of media protection membrane material according to claim 6; it is characterized in that; optics backup system is provided with between described photomultiplier and the front panel of display unit; optics backup system comprises at least one group of eyepiece system, gathers in the target viewing area of target display unit or multiple display unit formation for making the sensing range of photomultiplier.
8. the exoelectron test macro of a kind of media protection membrane material according to claim 7, is characterized in that, in described eyepiece system, superposition arranges optical filter.
9. the exoelectron test macro of a kind of media protection membrane material according to claim 6, is characterized in that, described power circuit adopts pressure adjustable type DC Steady voltage.
10. the exoelectron test macro of a kind of media protection membrane material according to claim 6; it is characterized in that; described scan drive circuit comprises the circuit and square-wave applying voltage waveform control on scan electrode Y, upper slope circuit and lower slope circuit, and described maintenance driving circuit comprises on maintenance electrode X, apply voltage waveform control circuit and square-wave and slope circuit.
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