CN103604514B - The measuring method of a kind of particle temperature δ v - Google Patents

Abstract

The invention provides the measuring method of a kind of particle temperature δ v, for the measurement of fluidized bed endoparticle temperature, it is characterized in that, with laser as light source, be radiated on the particle in fluidized bed after being spread by concavees lens, the speckle of dynamic fluctuation is produced, with imaging device with unit exposure time T in far field ₀to speckle continuous imaging, obtaining a series of time shutter is T ₀speckle image; Speckle image is inputted computer, and computer is by unit exposure time T ₀speckle image convert unit exposure time T to ₀grey scale pixel value, unit exposure time T ₀grey scale pixel value through calculating the time dependent curve of particle temperature δ v.According to the measuring method of a kind of particle temperature δ v provided by the invention, spatial and temporal resolution can be made to reach Microsecond grade and nanoscale.

Description

The measuring method of a kind of particle temperature δ v

Technical field

The present invention relates to the measuring method of a kind of particle temperature δ v, particularly relating to a kind of is light source with laser, adopts line-scan digital camera imaging, measures the method for fluidized bed endoparticle temperature.

Background technology

Fluidized bed is suspended among the fluid of motion by a large amount of solid particle, thus make particle have some appearance features of fluid, and the movement of particles Shaoxing opera in fluidized bed is strong, and fluid effect is better.According to the particle velocity in fluidized bed, fluidized bed can be divided into: high-velocity fluidized bed, low speed circulating fluidized bed and high low speed mixed fluidized bed.

Particle temperature (granulartemperature, < δ v>) be used to characterize the active degree of fluidized bed endoparticle random motion, by using for reference the analytical approach of dense gas kinetic molecular theory heterogeneous, comparable for the thermal motion of particle random motion and gas molecule, particle is described owing to colliding the random pulse caused with particle temperature, the size of particle temperature illustrates the power of particle speed pulsation, and it is defined as:

$<\mathrm{\&delta;v}>=\sqrt{\frac{1}{m}\underset{i=1}{\overset{m}{\mathrm{\&Sigma;}}}{(v_i-\stackrel{\&OverBar;}{v})}^2}$

Wherein m is total particle number, v _ibe i-th particle, for the average velocity of whole movement of particles.Particle temperature is higher, then illustrate that movement of particles Shaoxing opera is strong, the fluid effect between particle is better.

The method that current particle temperature is measured mainly contains: digital image method, positron genetic method, magnetic resonance imaging method, but the spatial and temporal resolution of these methods all can only reach Millisecond and grade, only can meet the needs that low speed circulating fluidized bed particle temperature is measured.In some grain flow medication chemistry industry, mining industry research, often need the high-velocity fluidized bed using particle high-speed motion, these traditional methods just cannot meet the measurement of now particle temperature.Therefore, how measuring particle temperature is high-velocity fluidized bed and high low speed mixed fluidized bed in use problem demanding prompt solution.

Summary of the invention

The object of the invention is to the disappearance and the deficiency that overcome conventional art, a kind of particle temperature measuring method of high-spatial and temporal resolution is provided, to meet the needs of high-velocity fluidized bed and high low speed mixed fluidized bed.

For solving the problems of the technologies described above, the technical solution used in the present invention is: the measuring method of a kind of particle temperature δ v, and for the measurement of fluidized bed endoparticle temperature, it is characterized in that, measuring method comprises the following steps:

1) use laser as light source, be radiated on the particle in fluidized bed after being spread by concavees lens, produce the speckle of dynamic fluctuation in far field;

2) use imaging device with unit exposure time T ₀to speckle continuous imaging, assembly picture number be greater than 10000 even number K, obtaining a series of time shutter is T ₀speckle image;

3) speckle image is inputted computer, computer is by unit exposure time T ₀speckle image convert unit exposure time T to ₀grey scale pixel value;

4) unit exposure time T ₀grey scale pixel value through calculating the time dependent situation of particle temperature δ v.

The measuring method of a kind of particle temperature δ v provided by the present invention can also have such feature: wherein, the line-scan digital camera of imaging device to be pixel quantity be N, the assembly picture number of speckle continuous imaging is K, K is even number, be preferably greater than the even number of 10000, N is 1024.

The measuring method of a kind of particle temperature δ v provided by the present invention can also have such feature: wherein, by unit exposure time T ₀under grey scale pixel value stored in matrix x:

$x=\left[\begin{array}{cccc}{x}_{11}& x_{12}& \&CenterDot;\&CenterDot;\&CenterDot;& x_{1N}\\ x_{21}& x_{22}& \&CenterDot;\&CenterDot;\&CenterDot;& x_{2N}\\ \&CenterDot;& & & \\ \&CenterDot;& & & \\ \&CenterDot;& & & \\ x_{K1}& x_{K2}& \&CenterDot;\&CenterDot;\&CenterDot;& x_{\mathrm{KN}}\end{array}\right]$

Wherein, each x _jirepresent the grey scale pixel value corresponding to each speckle image, i ∈ [1, N], j ∈ [1, K], N is pixel quantity, and K is assembly picture number,

Get the odd-numbered line in matrix x, form new matrix y:

$y=\left[\begin{array}{cccc}{y}_{11}& y_{12}& \&CenterDot;\&CenterDot;\&CenterDot;& y_{1N}\\ y_{21}& y_{22}& \&CenterDot;\&CenterDot;\&CenterDot;& y_{2N}\\ \&CenterDot;& & & \\ \&CenterDot;& & & \\ \&CenterDot;& & & \\ y_{P1}& y_{P2}& \&CenterDot;\&CenterDot;\&CenterDot;& y_{\mathrm{PN}}\end{array}\right]$

Wherein, P=K/2,

According to formula $V_1\left(T_0\right)=\left[\frac{{<I_l^2>}_{T_0}}{{<I_l>}_{T_0}^2}\right]-1,$ Wherein ${<I_l^2>}_{T_0}=\underset{i=1}{\overset{N}{\mathrm{\&Sigma;}}}\frac{y_{\mathrm{li}}^2}{N},$ ${<I_l>}_{T_0}^2={\left(\underset{i=1}{\overset{N}{\mathrm{\&Sigma;}}}\frac{y_{\mathrm{li}}}{N}\right)}^2,$ I ∈ [1, N], l ∈ [1, P], V _l(T ₀) for speckle image be T in the time shutter ₀time contrast angle value,

According to formula wherein, χ _iTfor the gray-scale value of i-th pixel when the time shutter is T, I _ibe the light intensity in i-th pixel, associate(d) matrix y,

Show that in matrix y, the time shutter is T ₀time l capable speckle image the mean value of light intensity square be:

${<I_l^2>}_{T_0}=\underset{i=1}{\overset{N}{\mathrm{\&Sigma;}}}\frac{y_{\mathrm{li}}^2}{N}=\underset{i=1}{\overset{N}{\mathrm{\&Sigma;}}}\frac{1}{N}[{\&Integral;}_0^{T_0}{\&Integral;}_0^{T_0}{I}_{\mathrm{li}}\left(t^{\&prime;}\right)I_{\mathrm{li}}\left(t^{\&prime;\&prime;}\right){\mathrm{dt}}^{\&prime;}{\mathrm{dt}}^{\&prime;\&prime;}/T_0^2],$

According to Siegert formula: < (I _i(t ') I _i(t ")) >=<I> ²{ 1+ β [g ₁(t '-t ")] ², wherein, β is system coefficient of coherence, g ₁t scattered optical field autocorrelation function that ()=exp (-4 π δ v/ λ) is particle, the scattered optical field autocorrelation function g of particle ₁t, in ()=exp (-4 π δ v/ λ) formula, δ v and particle temperature, λ is optical maser wavelength, then the time shutter is T ₀time l capable pixel the mean value of light intensity square be:

${<I_l^2>}_{T_0}={<I_l>}_{T_0}^2{\&Integral;}_0^{T_0}{\&Integral;}_0^{T_0}\{1+\mathrm{\&beta;}{\left[g_1(t^{\&prime;}-t^{\&prime;\&prime;})\right]}^2\}{\mathrm{dt}}^{\&prime;}{\mathrm{dt}}^{\&prime;\&prime;}/T_0^2,$

According to formula show that the speckle image of particle is T in the time shutter ₀time contrast angle value V _l(T ₀) be:

$V_l\left(T_0\right)=\mathrm{\&beta;}{\&Integral;}_0^{T_0}{\&Integral;}_0^{T_0}{\left[g_1(t^{\&prime;}-t^{\&prime;\&prime;})\right]}^2{\mathrm{dt}}^{\&prime;}{\mathrm{dt}}^{\&prime;\&prime;}/T_0^2=\mathrm{\&beta;}{\&Integral;}_0^{T_0}2(1-t/T_0){\left[g_1\left(t\right)\right]}^2\mathrm{dt}/T_0,$

Grey scale pixel value then in matrix y contrast angle value V _p(T ₀) time dependent matrix is:

V _P(T ₀)＝[V ₁(T ₀),V ₂(T ₀),...,V _P(T ₀)]。

Two row data every in matrix x are added, obtain twice time shutter 2T ₀under grey scale pixel value, form new matrix z:

$z=\left[\begin{array}{cccc}{z}_{11}& z_{12}& \&CenterDot;\&CenterDot;\&CenterDot;& z_{1N}\\ z_{21}& z_{22}& \&CenterDot;\&CenterDot;\&CenterDot;& z_{2N}\\ \&CenterDot;& & & \\ \&CenterDot;& & & \\ \&CenterDot;& & & \\ z_{Q1}& z_{Q2}& \&CenterDot;\&CenterDot;\&CenterDot;& z_{\mathrm{QN}}\end{array}\right]$

Wherein, z _jirepresent twice time shutter 2T ₀under grey scale pixel value, i ∈ [1, N], j ∈ [1, Q], Q=K/2, N are pixel quantity,

Through calculating, speckle image is 2T in the time shutter ₀time contrast angle value V _q(2T ₀) be:

$V_q\left({2T}_0\right)=\mathrm{\&beta;}{\&Integral;}_0^{{2T}_0}2(1-t/{2T}_0){\left[g_1\left(t\right)\right]}^2\mathrm{dt}/{2T}_0$

Grey scale pixel value then in matrix z contrast angle value V _q(2T ₀) time dependent matrix is:

Time shutter is T ₀time contrast angle value V _l(T ₀) with the time shutter be 2T ₀time contrast angle value V _q(2T ₀) time dependent function C (t) of ratio be:

$C\left(t\right)=\frac{V_q\left({2T}_0\right)}{V_l\left(T_0\right)}=\frac{{\&Integral;}_0^{{2T}_0}(1-t/{2T}_0){\left[g_1\left(t\right)\right]}^2\mathrm{dt}/2}{{\&Integral;}_0^{T_0}(1-t/T_0){\left[g_1\left(t\right)\right]}^2\mathrm{dt}},t={2T}_0,{4T}_0,...,{\mathrm{KT}}_0$

According to formula g ₁t ()=exp (-4 π δ v/ λ), λ is optical maser wavelength, if Φ=8 π T ₀/ λ, then C (t) can be reduced to:

$\begin{array}{c}C\left(t\right)=\frac{\exp [-4(4\mathrm{\&pi;\&delta;v}/\mathrm{\&lambda;})T_0]+4(4\mathrm{\&pi;\&delta;v}/\mathrm{\&lambda;})T_0-1}{4\exp [-2(4\mathrm{\&pi;\&delta;v}/\mathrm{\&lambda;})T_0]+8(4\mathrm{\&pi;\&delta;v}/\mathrm{\&lambda;})T_0-4}\\ =\frac{\exp (-2\mathrm{\&delta;v\&Phi;})+2\mathrm{\&delta;v\&Phi;}-1}{4\exp (-\mathrm{\&delta;v\&Phi;})+4\mathrm{\&delta;v\&Phi;}-4}\end{array}.$

According to matrix

V _P(T ₀)＝[V ₁(T ₀),V ₂(T ₀),...,V _P(T ₀)]

And matrix

By matrix V _q(2T ₀) divided by matrix V _p(T ₀), obtain function C (t),

Then, according to the time dependent situation of particle temperature δ v obtained.

The measuring method of a kind of particle temperature δ v provided by the present invention can also have such feature: by the time dependent situation of particle temperature δ v that obtains by low-pass filter filter away high frequency noise, the particle temperature δ v situation of change in time after the noise that is eliminated.

Invention effect and effect

According to a kind of particle temperature δ v measuring method that the present invention relates to, light source is done owing to adopting laser, therefore spatial resolution can reach number of wavelengths magnitude, owing to adopting the line-scan digital camera the fastest sampling time can reach 3 microseconds, there is measuring speed fast, the advantage that resolution is high, can meet the needs of high-velocity fluidized bed and the measurement of high low speed mixed fluidized bed particle temperature.

Accompanying drawing explanation

Fig. 1 is the measuring system theory diagram of particle temperature δ v involved in embodiment;

Fig. 2 is when in embodiment, the time shutter is 20 microsecond, the time dependent curve of particle speckle image contrast;

Fig. 3 is when in embodiment, the time shutter is 40 microsecond, the time dependent curve of particle speckle image contrast;

The time dependent curve of ratio of Fig. 4 is that in embodiment to be 40 microseconds and time shutter be the time shutter particle speckle image contrast of 20 microseconds;

Fig. 5 is the time dependent curve of particle temperature δ v in embodiment; And

Fig. 6 is Fig. 5 time dependent curve of particle temperature δ v after low-pass filter filter away high frequency noise.

Embodiment

Below in conjunction with accompanying drawing, of the present invention provided a kind of particle temperature δ v measuring method is illustrated.

Fig. 1 is the measuring system theory diagram of particle temperature δ v involved in embodiment.

As shown in Figure 1, wavelength is the laser that the semiconductor laser 10 of 532 nanometers is launched is after concavees lens 11 diffusion of 50 millimeters by focal length, be radiated on the particle in fluidized bed 12, speckle is produced in far field, along with particle random motion in fluidized bed, speckle also produces random fluctuation, and rear orientation light is after filtration after mating plate 13, and pixel N is that the linear array CCD camera 14 of 1024 is with unit exposure time T ₀=20 microseconds are to this dynamic speckle continuous imaging, and assembly picture number K is 100 ten thousand (corresponding Measuring Time is 20 seconds), and obtained 100 ten thousand speckle images are sent to computer 15 by linear array CCD camera 14, and computer 15 converts thereof into corresponding grey scale pixel value.

Fig. 2 is when in embodiment, the time shutter is 20 microsecond, the time dependent curve of particle speckle image contrast.

By obtained unit exposure time T ₀the grey scale pixel value of=20 microseconds is stored in matrix x:

$x=\left[\begin{array}{cccc}{x}_{11}& x_{12}& \&CenterDot;\&CenterDot;\&CenterDot;& x_{1N}\\ x_{21}& x_{22}& \&CenterDot;\&CenterDot;\&CenterDot;& x_{2N}\\ \&CenterDot;& & & \\ \&CenterDot;& & & \\ \&CenterDot;& & & \\ x_{K1}& x_{K2}& \&CenterDot;\&CenterDot;\&CenterDot;& x_{\mathrm{KN}}\end{array}\right]$

Here each x _jirepresent described grey scale pixel value, i ∈ [1,1024], j ∈ [1,1000000].

Get the odd-numbered line in matrix x, form new matrix y:

$y=\left[\begin{array}{cccc}{y}_{11}& y_{12}& \&CenterDot;\&CenterDot;\&CenterDot;& y_{1N}\\ y_{21}& y_{22}& \&CenterDot;\&CenterDot;\&CenterDot;& y_{2N}\\ \&CenterDot;& & & \\ \&CenterDot;& & & \\ \&CenterDot;& & & \\ y_{P1}& y_{P2}& \&CenterDot;\&CenterDot;\&CenterDot;& y_{\mathrm{PN}}\end{array}\right]$

Here P=500000.

Principle according to CCD camera is known, the gray-scale value x of each pixel _iTthis pixel at the strong integral result of time shutter T interior focusing, that is:

$x_{i,T}=\underset{0}{\overset{T}{\&Integral;}}{I}_i\left(t^{\&prime;}\right){\mathrm{dt}}^{\&prime;}/T---\left(1\right)$

Wherein, χ _iTfor the gray-scale value of i-th pixel when the time shutter is T, I _iit is the light intensity in i-th pixel.

According to formula (2)

$V_l\left(T_0\right)=\left[\frac{{<I_l^2>}_{T_0}}{{<I_l>}_{T_0}^2}\right]-1---\left(2\right)$

Wherein, i ∈ [1, N], l ∈ [1, P], V _l(T ₀) for speckle image be T in the time shutter ₀time contrast angle value,

In conjunction with formula (1) and formula (2), obtaining the time shutter is T ₀time matrix y in l capable described in the mean value of light intensity square of speckle image, i.e. formula (3):

${<I_l^2>}_{T_0}=\underset{i=1}{\overset{N}{\mathrm{\&Sigma;}}}\frac{y_{\mathrm{li}}^2}{N}=\underset{i=1}{\overset{N}{\mathrm{\&Sigma;}}}\frac{1}{N}[{\&Integral;}_0^{T_0}{\&Integral;}_0^{T_0}{I}_{\mathrm{li}}\left(t^{\&prime;}\right)I_{\mathrm{li}}\left(t^{\&prime;\&prime;}\right){\mathrm{dt}}^{\&prime;}{\mathrm{dt}}^{\&prime;\&prime;}/T_0^2]---\left(3\right)$

According to Siegert formula: < (I _i(t ') I _i(t ")) >=<I> ²{ 1+ β [g ₁(t '-t ")] ², in formula, β is system coefficient of coherence, g ₁t scattered optical field autocorrelation function that ()=exp (-4 π δ v/ λ) is particle, wherein, g ₁in (t)=exp (-4 π δ v/ λ) formula, δ v and particle temperature, λ is optical maser wavelength,

Then formula (3) can be reduced to formula (4):

${<I_l^2>}_{T_0}={<I_l>}_{T_0}^2{\&Integral;}_0^{T_0}{\&Integral;}_0^{T_0}\{1+\mathrm{\&beta;}{\left[g_1(t^{\&prime;}-t^{\&prime;\&prime;})\right]}^2\}{\mathrm{dt}}^{\&prime;}{\mathrm{dt}}^{\&prime;\&prime;}/T_0^2---\left(4\right)$

In conjunction with formula (2), obtaining speckle image in matrix y is T in the time shutter ₀time contrast angle value V _l(T ₀), i.e. formula (5):

$V_l\left(T_0\right)=\mathrm{\&beta;}{\&Integral;}_0^{T_0}{\&Integral;}_0^{T_0}{\left[g_1(t^{\&prime;}-t^{\&prime;\&prime;})\right]}^2{\mathrm{dt}}^{\&prime;}{\mathrm{dt}}^{\&prime;\&prime;}/T_0^2=\mathrm{\&beta;}{\&Integral;}_0^{T_0}2(1-t/T_0){\left[g_1\left(t\right)\right]}^2\mathrm{dt}/T_0---\left(5\right)$

Be T according to the particle speckle image calculated in the time shutter ₀angle value V is contrasted during=20 microsecond _l(T ₀), then the grey scale pixel value in matrix y contrast angle value V _p(T ₀) time dependent matrix is:

V _p(T ₀)=[V ₁(T ₀), V ₂(T ₀) ..., V _p(T ₀)], wherein P=500000.

During time shutter 20 microsecond, matrix V _p(T ₀) in speckle image contrast the time dependent situation of angle value and can be characterized by curve as shown in Figure 2.

Fig. 3 is when in embodiment, the time shutter is 40 microsecond, the time dependent curve of particle speckle image contrast.

By in matrix x, every two row data are added and obtain 2T ₀, namely the time shutter is the speckle image gray scale of 40 microseconds, forms new matrix z:

$z=\left[\begin{array}{cccc}{z}_{11}& z_{12}& \&CenterDot;\&CenterDot;\&CenterDot;& z_{1N}\\ z_{21}& z_{22}& \&CenterDot;\&CenterDot;\&CenterDot;& z_{2N}\\ \&CenterDot;& & & \\ \&CenterDot;& & & \\ \&CenterDot;& & & \\ z_{Q1}& z_{Q2}& \&CenterDot;\&CenterDot;\&CenterDot;& z_{\mathrm{QN}}\end{array}\right]$

Here each z _jirepresent the grey scale pixel value when time shutter is 40 microsecond, i ∈ [1, N], j ∈ [1, Q], Q=500000.

Through calculating, speckle image is 2T in the time shutter ₀time contrast angle value V _q(2T ₀) be:

$V_q\left({2T}_0\right)=\mathrm{\&beta;}{\&Integral;}_0^{{2T}_0}2(1-t/{2T}_0){\left[g_1\left(t\right)\right]}^2\mathrm{dt}/{2T}_0---\left(6\right)$

Every a line grey scale pixel value then in matrix z contrast angle value V _q(2T ₀) time dependent matrix is:

During time shutter 40 microsecond, matrix V _q(2T ₀) in the time dependent situation of speckle image contrast can be characterized by curve as shown in Figure 3.

The time dependent curve of ratio of Fig. 4 is that in embodiment to be 40 microseconds and time shutter be the time shutter particle speckle image contrast of 20 microseconds.

Function C (t) that changes than in time being calculated the particle speckle image contrast that the time shutter is respectively under 40 microseconds and 20 microseconds by formula (6) and (5) is:

$C\left(t\right)=\frac{V_q\left({2T}_0\right)}{V_l\left(T_0\right)}=\frac{{\&Integral;}_0^{{2T}_0}(1-t/{2T}_0){\left[g_1\left(t\right)\right]}^2\mathrm{dt}/2}{{\&Integral;}_0^{T_0}(1-t/T_0){\left[g_1\left(t\right)\right]}^2\mathrm{dt}}---\left(7\right)$

Here, t=2T ₀, 4T ₀..., KT ₀.

By g ₁(t)=exp (-4 π δ v/ λ) substitute into formula (7) and integration obtain particle speckle image contrast under 40 microseconds and 20 microseconds change function C (t) than in time, i.e. formula (8):

$\begin{array}{c}C\left(t\right)=\frac{\exp [-4(4\mathrm{\&pi;\&delta;v}/\mathrm{\&lambda;})T_0]+4(4\mathrm{\&pi;\&delta;v}/\mathrm{\&lambda;})T_0-1}{4\exp [-2(4\mathrm{\&pi;\&delta;v}/\mathrm{\&lambda;})T_0]+8(4\mathrm{\&pi;\&delta;v}/\mathrm{\&lambda;})T_0-4}\\ =\frac{\exp (-2\mathrm{\&delta;v\&Phi;})+2\mathrm{\&delta;v\&Phi;}-1}{4\exp (-\mathrm{\&delta;v\&Phi;})+4\mathrm{\&delta;v\&Phi;}-4}\end{array}---\left(8\right)$

Here Φ=8 π T ₀/ λ is by laser wavelength lambda and time shutter T ₀the known quantity determined.Function C (t) can be characterized by the time dependent curve of ratio of speckle image contrast as shown in Figure 4.

Fig. 5 is the time dependent curve of particle temperature δ v in embodiment.

By matrix V _q(2T ₀) divided by matrix V _p(T ₀), obtaining the time shutter is particle speckle image contrast C (t) under 40 microseconds and 20 microseconds, brings formula (8) into, the time dependent function of particle temperature δ v, can be characterized by the time dependent curve of particle temperature δ v as shown in Figure 5,

Fig. 6 is Fig. 5 time dependent curve of particle temperature δ v after low-pass filter filter away high frequency noise.

By the obtained time dependent curve of the particle temperature δ v low-pass filter filter away high frequency noise by frequency being 100Hz, obtain the time dependent curve of particle temperature δ v as shown in Figure 6.

Embodiment effect and effect

According to a kind of particle temperature δ v measuring method that the present embodiment provides, light source is done owing to adopting laser, therefore spatial resolution can reach number of wavelengths magnitude, owing to adopting linear array CCD camera, sampling time is 20 microseconds, there is higher resolution, high-velocity fluidized bed and high low speed mixed fluidized bed needs in use can be met, spatial and temporal resolution is brought up to Microsecond grade and nanoscale.

In addition, a kind of particle temperature δ v measuring method involved in the present invention, line-scan digital camera used can also replace with the imaging device that other can reach Microsecond grade imaging.

In addition, a kind of particle temperature δ v measuring method involved in the present invention, assembly picture number K also can be selected from other even numbers, preferably from the even number being greater than 10000.

In addition, a kind of particle temperature δ v measuring method involved in the present invention, the pixel quantity N of line-scan digital camera can also be selected from other pixel quantities.

Certainly a kind of particle temperature δ v measuring method involved in the present invention is not merely defined in the method in above-described embodiment.Above content be only the present invention conceive under basic explanation, and according to any equivalent transformation that technical scheme of the present invention is done, all should protection scope of the present invention be belonged to.

Claims (2)

1. a measuring method of particle temperature δ v, for the measurement of fluidized bed endoparticle temperature, is characterized in that, described measuring method comprises the following steps:

Step one: with laser as light source, be radiated on the particle in described fluidized bed by concavees lens after being spread, produces the speckle of dynamic fluctuation in far field;

Step 2: with imaging device with unit exposure time T ₀to the described speckle continuous imaging in step one, obtain a series of described unit exposure time T ₀under speckle image;

Step 3: by the described speckle image input computer in step 2, described computer is by described unit exposure time T ₀under described speckle image convert described unit exposure time T to ₀under grey scale pixel value;

Step 4: by the described unit exposure time T obtained in step 3 ₀under described grey scale pixel value through calculating, obtain the time dependent situation of described particle temperature δ v,

Wherein, the line-scan digital camera of described imaging device to be pixel quantity be N, N is 1024,

The assembly picture number of described speckle continuous imaging is K, and described K is even number,

By described unit exposure time T ₀under described grey scale pixel value stored in matrix x:

$x=\left[\begin{array}{cccc}{x}_{11}& x_{12}& ...& x_{1N}\\ x_{21}& x_{22}& ...& x_{2N}\\ .& & & \\ .& & & \\ .& & & \\ x_{K1}& x_{K2}& ...& x_{KN}\end{array}\right]$

Wherein, each x _jirepresent the described grey scale pixel value described in each corresponding to speckle image, i ∈ [1, N], j ∈ [1, K], N is described pixel quantity, and K is described assembly picture number,

Get the odd-numbered line in described matrix x, form new matrix y:

$y=\left[\begin{array}{cccc}{y}_{11}& y_{12}& ...& y_{1N}\\ y_{21}& y_{22}& ...& y_{2N}\\ .& & & \\ .& & & \\ .& & & \\ y_{P1}& y_{P2}& ...& y_{PN}\end{array}\right]$

Wherein, P=K/2,

According to formula $V_l\left(T_0\right)=\&lsqb;\frac{<I_l^2{>}_{T_0}}{<I_l{>}_{T_0}^2}\&rsqb;-1,$ Wherein $<I_l^2{>}_{T_0}=\underset{i=1}{\overset{N}{\&Sigma;}}\frac{y_{li}^2}{N},{\left(I_l\right)}_{T_0}^2={\left(\underset{i=1}{\overset{N}{\&Sigma;}}\frac{y_{li}}{N}\right)}^2,i\&Element;\&lsqb;1,N\&rsqb;,$ L ∈ [1, P], V _l(T ₀) for described speckle image be T in the described time shutter ₀time contrast angle value,

According to formula wherein, χ _iTfor the gray-scale value of i-th pixel when the time shutter is T, I _ibe the light intensity in i-th pixel, in conjunction with described matrix y,

Show that the described time shutter is T ₀in Shi Suoshu matrix y l capable described in the mean value of light intensity square of speckle image be:

$<I_l^2{>}_{T_0}=\underset{i=1}{\overset{N}{\&Sigma;}}\frac{y_{li}^2}{N}=\underset{i=1}{\overset{N}{\&Sigma;}}\frac{1}{N}\&lsqb;{\&Integral;}_0^{T_0}{\&Integral;}_0^{T_0}{I}_{li}\left(t^{\&prime;}\right)I_{li}\left(t^{\&prime;\&prime;}\right){\mathrm{dt}}^{\&prime;}{\mathrm{dt}}^{\&prime;\&prime;}/T_0^2\&rsqb;,$

According to Siegert formula: < (I _i(t') I _i(t ")) >=<I> ²{ 1+ β [g ₁(t'-t ")] ², wherein, β is system coefficient of coherence, g ₁t scattered optical field autocorrelation function that ()=exp (-4 π δ v/ λ) is particle, the scattered optical field autocorrelation function g of described particle ₁t, in ()=exp (-4 π δ v/ λ) formula, δ v and described particle temperature, λ is optical maser wavelength, then the described time shutter is T ₀time l capable pixel the mean value of light intensity square be:

$<I_l^2{>}_{T_0}=<I_l{>}_{T_0}^2{\&Integral;}_0^{T_0}{\&Integral;}_0^{T_0}\left\{1+\mathrm{\&beta;}{\&lsqb;g_1\left(t^{\&prime;}-t^{\&prime;\&prime;}\right)\&rsqb;}^2\right\}{\mathrm{dt}}^{\&prime;}{\mathrm{dt}}^{\&prime;\&prime;}/T_0^2,$

According to described formula show that speckle image described in described matrix y is T in the described time shutter ₀time described in contrast angle value V _l(T ₀) be:

$V_l\left(T_0\right)=\mathrm{\&beta;}{\&Integral;}_0^{T_0}{\&Integral;}_0^{T_0}{\&lsqb;g_1\left(t^{\&prime;}-t^{\&prime;\&prime;}\right)\&rsqb;}^2{\mathrm{dt}}^{\&prime;}{\mathrm{dt}}^{\&prime;\&prime;}/T_0^2=\mathrm{\&beta;}{\&Integral;}_0^{T_0}2(1-t/T_0){\&lsqb;g_1\left(t\right)\&rsqb;}^{2}dt/T_0,$

Angle value V is contrasted described in described grey scale pixel value then in described matrix y _p(T ₀) time dependent matrix is:

V _P(T ₀)＝[V ₁(T ₀),V ₂(T ₀),...,V _P(T ₀)]；

Wherein, two row data every in described matrix x are added, obtain twice time shutter 2T ₀under described grey scale pixel value, form new matrix z:

$z=\left[\begin{array}{cccc}{z}_{11}& z_{12}& ...& z_{1N}\\ z_{21}& z_{22}& ...& z_{2N}\\ .& & & \\ .& & & \\ .& & & \\ z_{Q1}& z_{Q2}& ...& z_{QN}\end{array}\right]$

Wherein, z _jirepresent described twice time shutter 2T ₀under grey scale pixel value, i ∈ [1, N], j ∈ [1, Q], Q=K/2, N are described pixel quantity,

Through calculating, described speckle image is 2T in the described time shutter ₀time described in contrast angle value V _q(2T ₀) be:

$V_q\left(2T_0\right)=\mathrm{\&beta;}{\&Integral;}_0^{2T_0}2(1-t/2T_0){\&lsqb;g_1\left(t\right)\&rsqb;}^{2}dt/2T_0$

Angle value V is contrasted described in described grey scale pixel value then in described matrix z _q(2T ₀) time dependent matrix is:

The described time shutter is T ₀time described in contrast angle value V _l(T ₀) with the described time shutter be 2T ₀time described in contrast angle value V _q(2T ₀) ratio in time t change function C (t) be:

$C\left(t\right)=\frac{V_q\left(2T_0\right)}{V_l\left(T_0\right)}=\frac{{\&Integral;}_0^{2T_0}(1-t/2T_0){\&lsqb;g_1\left(t\right)\&rsqb;}^{2}dt/2}{{\&Integral;}_0^{T_0}(1-t/T_0){\&lsqb;g_1\left(t\right)\&rsqb;}^{2}dt},t=2T_0,4T_0,\mathrm{...},{\mathrm{KT}}_0$

According to formula g ₁t ()=exp (-4 π δ v/ λ), λ is described optical maser wavelength, if Φ=8 π T ₀/ λ, then described C (t) can be reduced to:

$\begin{array}{c}C\left(t\right)=\frac{\exp \&lsqb;-4\left(4\mathrm{\&pi;}\mathrm{\&delta;}\mathrm{\&nu;}/\mathrm{\&lambda;}\right)T_0\&rsqb;+4\left(4\mathrm{\&pi;}\mathrm{\&delta;}\mathrm{\&nu;}/\mathrm{\&lambda;}\right)T_0-1}{4\exp \&lsqb;-2\left(4\mathrm{\&pi;}\mathrm{\&delta;}\mathrm{\&nu;}/\mathrm{\&lambda;}\right)T_0\&rsqb;+8\left(4\mathrm{\&pi;}\mathrm{\&delta;}\mathrm{\&nu;}/\mathrm{\&lambda;}\right)T_0-4}\\ =\frac{\exp \left(-2\mathrm{\&delta;}\mathrm{\&nu;}\mathrm{\&Phi;}\right)+2\mathrm{\&delta;}\mathrm{\&nu;}\mathrm{\&Phi;}-1}{4\exp \left(-\mathrm{\&delta;}\mathrm{\&nu;}\mathrm{\&Phi;}\right)+4\mathrm{\&delta;}\mathrm{\&nu;}\mathrm{\&Phi;}-4}\end{array}$

According to matrix

V _P(T ₀)＝[V ₁(T ₀),V ₂(T ₀),...,V _P(T ₀)]

And matrix

By described matrix V _q(2T ₀) divided by described matrix V _p(T ₀), obtain described function C (t),

Then, according to the time dependent situation of described particle temperature δ v obtained.

2. the measuring method of particle temperature δ v according to claim 1, is characterized in that:

Wherein, by the time dependent situation of described particle temperature δ v that obtains by low-pass filter filter away high frequency noise, the time dependent situation of described particle temperature δ v after the described noise that is eliminated.