CN103592228B - A kind of detection method of tealeaves blade SPAD index - Google Patents
A kind of detection method of tealeaves blade SPAD index Download PDFInfo
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Abstract
The invention discloses a kind of detection method of tealeaves blade SPAD index, comprise the following steps: (1) gathers the single band spectrum picture of tealeaves blade to be measured six characteristic wave strong points; Described six characteristic wavelengths are respectively 409nm, 428nm, 496nm, 506nm, 530nm, 1000nm; (2) according to the gray-scale value of single band spectrum picture and the linear relationship of reflectivity, the single band spectrum picture in step (1) is converted into albedo image; (3) the SPAD index of each pixel in the albedo image of tealeaves blade is obtained according to formulae discovery.The present invention can detect spatially Arbitrary distribution tealeaves blade SPAD index simultaneously fast, obtains the space distribution information of tealeaves blade SPAD index.
Description
Technical field
The present invention relates to Tea Processing detection field, be specifically related to a kind of detection method of tealeaves blade SPAD index.
Background technology
Blade SPAD index is the characteristic index of reflection plant nitrogen level, has been used successfully to the evaluation of various plants nitrogen level.
Blade SPAD index is the display index of the SPAD-502 chlorophyll meter that Japanese KONICA MINOLTA company produces, and this chlorophyll meter, by measuring the absorptivity of leaf at 650nm and 940nm place, assesses the chlorophyllous relative content in leaf.Being inserted by blade during measurement accepts between window and measuring sonde, press measuring sonde, blade is clipped in be accepted between window and measuring sonde, detected the chlorophyll content of plant leaf blade by the transmitted spectrum measuring blade, this instrument has been widely used in the harmless quick diagnosis of Field Plants leaf chlorophyll.
Publication number a kind of cotton leaf assay method based on SPAD-502 that has been the disclosure of the invention of CN 103063601A, comprise the steps: that (1) measures period: in flower bud phase of cotton growth, initial bloom stage, full-bloom stage, flowering and boll-setting period, Shengjing Town, blow-of-cottons initial stage, the 6th day after fertilising, Beijing time 10:00-14:00 is selected to measure; (2) instrument calibration: carry out instrument calibration with SPAD-502 instrument calibration card before mensuration, reaching instrument SPAD value is the alignment requirements of 67.4 ± 3.0; (3) sample number is selected: within corresponding breeding time, random selecting 26,35,39,60,50,44 strain cotton respectively; (4) measure site to select: cotton topping before measurement falls 4 leaves, after pinching, survey 1 leaf, in the middle part of each sliver of cotton palmate decomposite leaf, choose 4 some SPAD instrument measure; (5) data processing: calculate SPAD value by weighted mean method in biometrical method.
The present invention judges the upgrowth situation of cotton by measuring the SPAD value obtained, instruct the fertilizing management in Cotton Production, but utilize the measurement range of SPAD-502 chlorophyll meter to be only 2x3mm size, the chlorophyll levels of whole plant leaf blade is indicated by the SPAD index measured within the scope of this small size, not only there is sampling error, and the SPAD value at blade each point place cannot be detected simultaneously, say nothing of and the SPAD index at canopy leaves each point place is detected simultaneously.
Summary of the invention
The invention provides a kind of detection method of tealeaves blade SPAD index, can detect fast the SPAD index of the spatially tealeaves blade of Arbitrary distribution simultaneously, obtain the space distribution information of tealeaves blade SPAD index.
A detection method for tealeaves blade SPAD index, comprises the following steps:
(1) the single band spectrum picture of tealeaves blade to be measured six characteristic wave strong points is gathered; Described six characteristic wavelengths are respectively 409nm, 428nm, 496nm, 506nm, 530nm, 1000nm;
(2) according to the gray-scale value of single band spectrum picture and the linear relationship of reflectivity, the single band spectrum picture in step (1) is converted into albedo image;
(3) the SPAD index of each pixel in the albedo image of tealeaves blade is calculated according to following formula;
Y
sPAD index=25.394997+18.703 λ
409+ 70.428 λ
428-93.194 λ
496-108.228 λ
506+ 198.616 λ
530-98.779 λ
1000
In formula: λ
arepresent in the albedo image of a nm characteristic wave strong point, the reflectivity of a certain pixel;
Y
sPAD indexrepresent the SPAD index at respective pixel point place.
As preferably, in described step (2), the obtaining step of the gray-scale value of single band spectrum picture and the linear relationship of reflectivity is as follows:
2-1, collection at least three pieces of diffuse reflection on-gauge plates are at the benchmark single band spectrum picture of six characteristic wave strong points, ask for the gray-scale value of every width benchmark single band image, within the scope of visible and near infrared spectrum, the diffuse reflection on-gauge plate adopted has reflectivity constant separately; Different diffuse reflection on-gauge plates has different reflectivity;
2-2, for each characteristic wavelength, the gray-scale value of corresponding benchmark single band image and reflectivity are carried out linear fit, obtains the linear relationship of gray-scale value and reflectivity.
As preferably, described diffuse reflection on-gauge plate is three ~ six pieces.
In each characteristic wave strong point, every block diffuse reflection on-gauge plate is a corresponding width single band image separately, the corresponding gray-scale value of every width single band image, with the gray-scale value of diffuse reflection on-gauge plate for independent variable, with the reflectivity of diffuse reflection on-gauge plate for dependent variable, linear fit obtains the relation of gray-scale value and reflectivity.
The number of diffuse reflection on-gauge plate is more, the relation of the gray-scale value that linear fit obtains and reflectivity is more accurate, corresponding consuming time also longer, preferably, described diffuse reflection on-gauge plate is three pieces, is respectively 99% diffuse reflection on-gauge plate, 75% diffuse reflection on-gauge plate and 2% diffuse reflection on-gauge plate.
99% diffuse reflection on-gauge plate refers to: within the scope of whole visible and near infrared spectrum, and the reflectivity of diffuse reflection on-gauge plate is 99%.
75% diffuse reflection on-gauge plate refers to: within the scope of whole visible and near infrared spectrum, and the reflectivity of diffuse reflection on-gauge plate is 75%.
2% diffuse reflection on-gauge plate refers to: within the scope of whole visible and near infrared spectrum, and the reflectivity of diffuse reflection on-gauge plate is 2%.
Adopt 99% diffuse reflection on-gauge plate, 75% diffuse reflection on-gauge plate and 2% diffuse reflection on-gauge plate, at utmost cover the scope of reflectivity, make the linear relationship of gray-scale value and the reflectivity obtained more accurate.
The different diffuse reflection on-gauge plate acquisition gray-scale values at different characteristic wavelength place and the linear relationship of reflectivity is adopted to be respectively:
Y
409＝-511.5613+2.5807x
409；
Y
428＝-228.4777+1.1520x
428；
Y
496＝-41.8300+0.2095x
496；
Y
506＝-34.2242+2.7488x
506；
Y
530＝-23.6557+1.8932x
530；
Y
1000＝-71.3915+0.3584x
1000；
In formula: x
bfor the gray-scale value of b nm characteristic wave strong point;
Y
bfor the reflectivity of b nm characteristic wave strong point.
Compared with prior art, the present invention has following useful technique effect:
(1) simple, the inventive method realizes the quantitative of tealeaves SPAD index and positioning analysis by obtaining tealeaves at the spectrum picture of six characteristic wave strong points, this detection, without the need to directly contacting with sample, be nondestructive measurement completely, and the computing method of operating process and SPAD index is simple.
(2) quick, the method that the present invention proposes is based on the spectrum picture of six characteristic wave strong points, and image acquisition process is quick, and the spectrum picture acquisition time of a sample is less than 10 seconds, and measure while the pixel of tens thousand of, implementation space while of energy, detection speed is accelerated greatly.
(3) efficient, the method that the present invention proposes can realize the quantitative of tealeaves blade SPAD value and detection and localization simultaneously, is particularly useful in large area tea place, detects while the tealeaves SPAD value that on tea tree canopy, space distribution is different.
Accompanying drawing explanation
Fig. 1 is the single band spectrum picture of the tealeaves at the different characteristic wavelength place measured in embodiment 1 in the present invention;
Fig. 2 is the reflectivity of three pieces of diffuse reflection on-gauge plates and the graph of a relation of wavelength;
Fig. 3 is the single band spectrum pictures of three pieces of diffuse reflection on-gauge plates at different characteristic wavelength place;
Fig. 4 is the gray-scale values of three pieces of diffuse reflection on-gauge plates at different characteristic wavelength place;
Fig. 5 is the reflectivity at wavelength 506nm place and the linear relationship of gray-scale value;
Fig. 6 is the reflectivity at wavelength 530nm place and the linear relationship of gray-scale value;
Fig. 7 is the calculation process of the SPAD index of a pixel in the single band spectrum picture of tealeaves blade;
Fig. 8 is the distribution plan of tealeaves blade SPAD index;
Fig. 9 is the prediction SPAD index of 557 tealeaves blades and the graph of a relation of true SPAD index measured in embodiment 1;
Figure 10 is the prediction SPAD index of 557 tealeaves blades and the graph of a relation of true SPAD index measured in comparative example 1;
Figure 11 is the prediction SPAD index of 557 tealeaves blades and the graph of a relation of true SPAD index measured in comparative example 2.
Embodiment
Embodiment 1
First 1057 tealeaves blades are collected, the kind of tealeaves blade comprises 11 kind tealeaves such as turtledove hole, green cloud, chrysanthemum perfume, first adopt high spectrum image imaging system (ImSpector V10E, SpectralImaging Ltd., Oulu, Finland) scan the single band spectrum picture of each tealeaves blade six characteristic wave strong points respectively; Six characteristic wavelengths are respectively 409nm, 428nm, 496nm, 506nm, 530nm, 1000nm; The corresponding width single band spectrum picture in each wavelength place, as shown in Figure 1, then the SPAD-502 chlorophyll meter adopting Japanese KONICA MINOLTA company to produce measures the SPAD index of these 1057 samples respectively, and the statistics of the SPAD index of tealeaves blade is as shown in table 1.
When utilizing SPAD-502 chlorophyll meter to detect the SPAD index of tealeaves blade, each tealeaves blade is got 3 position measurement SPAD indexes at random, using the SPAD index of the average result of 3 positions as this tealeaves blade.
Table 1
According to the gray-scale value of single band spectrum picture and the linear relationship of reflectivity, each tealeaves blade is converted into albedo image at the single band spectrum picture of six characteristic wave strong points.
Wherein, the obtaining step of the gray-scale value of single band spectrum picture and the linear relationship of reflectivity is as follows:
2-1, collection three pieces of diffuse reflection on-gauge plates are at the benchmark single band spectrum picture of six characteristic wave strong points, ask for the gray-scale value of every width benchmark single band image, within the scope of whole visible and near infrared spectrum, the reflectivity that the diffuse reflection on-gauge plate adopted is corresponding is respectively 99%, 75% and 2%.
As shown in Figure 2, the reflectance curve of three pieces of diffuse reflection on-gauge plates within the scope of whole visible and near infrared spectrum, as can be seen from Fig. 2, three pieces of diffuse reflection on-gauge plate diffuse reflections within the scope of whole visible and near infrared spectrum are constant separately, for each block diffuse reflection on-gauge plate, the reflectivity at all wavelengths place is all identical.
As shown in Figure 3, in each characteristic wave strong point, gather the benchmark single band spectrum picture with the diffuse reflection on-gauge plate of different reflectivity, in Fig. 3, the corresponding reflectivity of R99 is the diffuse reflection on-gauge plate of 99%; The corresponding reflectivity of R75 is the diffuse reflection on-gauge plate of 75%; The corresponding reflectivity of R02 is the diffuse reflection on-gauge plate of 2%.
The corresponding gray-scale value of each width benchmark single band spectrum picture, as shown in Figure 4, three gray-scale values of each characteristic wave strong point are corresponding in turn to the benchmark single band spectrum picture that reflectivity is the diffuse reflection on-gauge plate of 99%, 75% and 2% from left to right.
2-2, for each characteristic wavelength, the gray-scale value of corresponding benchmark single band image and reflectivity are carried out linear fit, obtains the linear relationship of gray-scale value and reflectivity.
For each characteristic wavelength, there are three groups of corresponding gray-scale values and reflectance value, linear fit carried out to these three groups of gray-scale values and reflectance value, obtains the linear relationship of gray-scale value and reflectance value.
Such as, wavelength be the linear relationship of the gray-scale value at 506nm place and reflectivity as shown in Figure 5, wavelength be the linear relationship of the gray-scale value at 530nm place and reflectivity as shown in Figure 6, in Fig. 5, Fig. 6, the corresponding reflectivity of R99 is the diffuse reflection on-gauge plate of 99%; The corresponding reflectivity of R75 is the diffuse reflection on-gauge plate of 75%; The corresponding reflectivity of R2 is the diffuse reflection on-gauge plate of 2%.
The gray-scale value at different characteristic wavelength place set up and the linear relationship of reflectivity are respectively:
Y
409＝-511.5613+2.5807x
409；
Y
428＝-228.4777+1.1520x
428；
Y
496＝-41.8300+0.2095x
496；
Y
506＝-34.2242+2.7488x
506；
Y
530＝-23.6557+1.8932x
530；
Y
1000＝-71.3915+0.3584x
1000；
In formula: x
bfor the gray-scale value of b nm characteristic wave strong point;
Y
bfor the reflectivity of b nm characteristic wave strong point.
Based on the gray-scale value of six characteristic wave strong points and the relation of reflectivity, can the single band spectrum picture of a tealeaves blade to be measured (site on the corresponding tealeaves blade of each pixel difference in single band spectrum picture, each pixel has different gray-scale values) be converted to albedo image, the reflectivity that each pixel in albedo image is corresponding different.
1057 tealeaves blades are divided into two groups at random, and one group comprises 500 samples and is used as modeling collection, remaining 557 as forecast set, SPAD index statistics is as shown in table 2.
Table 2
For the tealeaves blade of 500 in forecast set, based on the albedo image of each tealeaves blade, the average reflectance of each tealeaves blade is obtained after average, the SPAD exponential sum average reflectance matching of each tealeaves blade is utilized to obtain the relation of SPAD index and average reflectance as shown in the formula shown in (I)
Y′=25.394997+18.703λ′
409+70.428λ′
428-93.194λ′
496-108.228λ′
506+
198.616λ′
530-98.779λ′
1000（I）
In formula (I): λ '
arepresent the average reflectance of the albedo image of a nm characteristic wave strong point;
Y ' represents the SPAD index at corresponding average reflectance place.
The formula (I) utilizing average reflectance and SPAD exponential fitting to obtain have expressed the relation of average reflectance and SPAD index, and formula (I) has also reacted the relation of each pixel place reflectivity and SPAD index, obtains formula (II) as follows according to formula (I):
Y
sPAD index=25.394997+18.703 λ
409+ 70.428 λ
428-93.194 λ
496-108.228 λ
506+ 198.616 λ
530-98.779 λ
1000(II)
In formula (II): λ
arepresent in the albedo image of a nm characteristic wave strong point, the reflectivity of a certain pixel;
Y
sPAD indexrepresent the SPAD index at respective pixel point place.
Reflectivity corresponding to each pixel in albedo image is substituted into the calculating carrying out SPAD index in formula (II), obtain the SPAD index at each pixel place in tealeaves leaf image to be measured, as shown in Figure 7, for the A pixel on albedo image, the reflectivity of A pixel is substituted into the SPAD index calculating A pixel in formula (II), and then draw the SPAD exponential distribution figure of tealeaves blade accordingly, obtain the SPAD exponential distribution information at tealeaves blade each point place, as shown in Figure 8.
The prediction SPAD index (substituted into by average reflectance in formula (I) and try to achieve) utilizing the inventive method to obtain the tealeaves crop leaf measuring of 557 in forecast set is illustrated in fig. 9 shown below with the distribution of the true SPAD index of sample utilizing SPAD-502 chlorophyll meter to detect, the coefficient of determination is 0.911, as can be seen from Fig. 9, the detection method that the present invention proposes to predict the outcome with the measured value of SPAD-502 chlorophyll meter be high correlation.
Comparative example 1
Choose six characteristic wavelengths, be respectively 408nm, 427nm, 495nm, 505nm, 529nm, 999nm, and set up the relation of SPAD index and reflectivity in the same manner as shown in the formula (III) based on these six characteristic wavelengths:
Y
sPAD index=18.069111-0.726 λ
408+ 88.029 λ
427-87.729 λ
495-100.446 λ
505+ 191.056 λ
529-101.822 λ
999(III)
In formula (III): λ
arepresent in the albedo image of a nm characteristic wave strong point, the reflectivity of a certain pixel;
Y
sPAD indexrepresent the SPAD index at respective pixel point place.
At six characteristic wavelength (408nm, 427nm, 495nm, 505nm, 529nm, 999nm) place obtains the single band spectrum picture of tealeaves blade, and calculates the SPAD index of tealeaves based on formula (III), be illustrated in fig. 10 shown below with the distribution of the true SPAD index of the sample utilizing SPAD-502 chlorophyll meter to detect, the coefficient of determination is 0.881.
Comparative example 2
Chooses six characteristic wavelengths, be respectively 410nm, 429nm, 497nm, 507nm, 531nm, 1001nm, and the relation setting up SPAD index and reflectivity based on these six characteristic wavelengths is in the same manner such as formula shown in (IV):
Y
sPAD index=18.327477+6.160 λ
410+ 74.459 λ
429-80.509 λ
497-107.221 λ
507+ 201.058 λ
531-102.811 λ
1001(IV)
In formula (IV): λ
arepresent in the albedo image of a nm characteristic wave strong point, the reflectivity of a certain pixel;
Y
sPAD indexrepresent the SPAD index at respective pixel point place.
At six characteristic wavelength (410nm, 429nm, 497nm, 507nm, 531nm, 1001nm) place obtains the single band spectrum picture of tealeaves blade, and calculates the SPAD index of tealeaves based on formula (IV), be illustrated in fig. 11 shown below with the distribution of the true SPAD index of the sample utilizing SPAD-502 chlorophyll meter to detect, the coefficient of determination is 0.865.
By the result of embodiment 1 and comparative example 1,2, whether selected characteristic wavelength accurately has material impact for detection SPAD index, the present invention, by choosing suitable characteristic wavelength, obtains the testing result that the coefficient of determination is very high, for carrying out the spatial distribution result of tealeaves SPAD index fast.
Claims (5)
1. a detection method for tealeaves blade SPAD index, is characterized in that, comprise the following steps:
(1) the single band spectrum picture of tealeaves blade to be measured six characteristic wave strong points is gathered; Described six characteristic wavelengths are respectively 409nm, 428nm, 496nm, 506nm, 530nm, 1000nm;
(2) according to the gray-scale value of single band spectrum picture and the linear relationship of reflectivity, the single band spectrum picture in step (1) is converted into albedo image;
(3) the SPAD index of each pixel in the albedo image of tealeaves blade is calculated according to following formula;
Y
sPAD index=25.394997+18.703 λ
409+ 70.428 λ
428-93.194 λ
496-108.228 λ
506+ 198.616 λ
530-98.779 λ
1000
In formula: λ
arepresent in the albedo image of a nm characteristic wave strong point, the reflectivity of a certain pixel;
Y
sPAD indexrepresent the SPAD index at respective pixel point place.
2. the detection method of tealeaves blade SPAD index as claimed in claim 1, is characterized in that, in described step (2), the obtaining step of the gray-scale value of single band spectrum picture and the linear relationship of reflectivity is as follows:
2-1, collection at least three pieces of diffuse reflection on-gauge plates are at the benchmark single band spectrum picture of six characteristic wave strong points, ask for the gray-scale value of every width benchmark single band image, within the scope of visible and near infrared spectrum, the diffuse reflection on-gauge plate adopted has reflectivity constant separately;
2-2, for each characteristic wavelength, the gray-scale value of corresponding benchmark single band image and reflectivity are carried out linear fit, obtains the linear relationship of gray-scale value and reflectivity.
3. the detection method of tealeaves blade SPAD index as claimed in claim 2, it is characterized in that, described diffuse reflection on-gauge plate is three ~ six pieces.
4. the detection method of tealeaves blade SPAD index as claimed in claim 3, it is characterized in that, described diffuse reflection on-gauge plate is three pieces, is respectively 99% diffuse reflection on-gauge plate, 75% diffuse reflection on-gauge plate and 2% diffuse reflection on-gauge plate.
5. the detection method of tealeaves blade SPAD index as claimed in claim 4, it is characterized in that, the gray-scale value at different characteristic wavelength place and the linear relationship of reflectivity are respectively:
Y
409＝-511.5613+2.5807x
409；
Y
428＝-228.4777+1.1520x
428；
Y
496＝-41.8300+0.2095x
496；
Y
506＝-34.2242+2.7488x
506；
Y
530＝-23.6557+1.8932x
530；
Y
1000＝-71.3915+0.3584x
1000；
In formula: x
bfor the gray-scale value of b nm characteristic wave strong point;
Y
bfor the reflectivity of b nm characteristic wave strong point.
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