CN103576029A - Device for testing aging of automotive electronic product - Google Patents

Device for testing aging of automotive electronic product Download PDF

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Publication number
CN103576029A
CN103576029A CN201310541624.XA CN201310541624A CN103576029A CN 103576029 A CN103576029 A CN 103576029A CN 201310541624 A CN201310541624 A CN 201310541624A CN 103576029 A CN103576029 A CN 103576029A
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China
Prior art keywords
area network
local area
controller local
chip microcomputer
aging
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Pending
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CN201310541624.XA
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Chinese (zh)
Inventor
季雪峰
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Yanfeng Visteon Automotive Electronics Co Ltd
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Yanfeng Visteon Automotive Electronics Co Ltd
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Priority to CN201310541624.XA priority Critical patent/CN103576029A/en
Publication of CN103576029A publication Critical patent/CN103576029A/en
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Abstract

The invention discloses a device for testing aging of an automotive electronic product. The device for testing the aging of the automotive electronic product comprises an upper computer, a controller local area network and at least one aging testing fixture, wherein a proximity sensor and a relay are arranged in each fixture, each proximity sensor is connected with a single-chip microcomputer, each single-chip microcomputer is connected with the control end of a corresponding relay, the single-chip microcomputers are connected with the controller local area network, and the upper computer is connected with the controller local area network. According to the device for testing the aging of the automotive electronic product, the single-chip microcomputers transmit signals of the proximity sensors to the upper computer and send electrifying commands of the upper computer to the relays to be executed; the single-chip microcomputers are connected with an AC-and-DC power conversion module to detect the output voltage of the product in real time and send the output voltage of the product to the upper computer immediately; the upper computer can be connected to a computer integrated making system so that tested products can not be omitted during production and aging data of the products can be inquired. The device for testing the aging of the automotive electronic product has the advantages that the detect that the output voltage of the product can not be detected in real time in the aging testing process of the automotive electronic product in the prior art is overcome and the technical problem that the computer integrated making system (CIMS) can not be connected with an existing device for testing the aging of the automotive electronic product is solved.

Description

A kind of automobile electronics ageing tester
Technical field:
The present invention relates to electricity field, relate in particular to product in electronic product assembly line power on burin-in process technology, particularly a kind of automobile electronics ageing tester.
Background technology:
In industrial circle, electronic product assembly line need to power up product aging, to find the defect after the aging of product.In prior art, in the burn-in test process of automobile electronics, only access fictitious load and power supply, by the time after aging end, flow to lower station station again the output voltage of test products whether meet design requirement, therefore for gap, lost efficacy or the product that lost efficacy of working long hours cannot detect the defect of output voltage.In addition, the ageing tester of existing automobile electronics adopts single station working method, can not network, so cannot access CIMS system (computer integrated manufacturing system), can there is the product that is missed test so in process of production, also cannot inquire the data of the aging of product.
Summary of the invention:
The object of the present invention is to provide a kind of automobile electronics ageing tester, described this automobile electronics ageing tester will solve in the burn-in test process of automobile electronics in prior art the defect of testing product output voltage in real time, cannot access the technical matters of CIMS system.
This automobile electronics ageing tester of the present invention, comprise a host computer ,Yi Ge controller local area network and at least one aging testing jig, wherein, in aging testing jig described in any one, be all provided with separately a proximity transducer and a relay, proximity transducer described in any one is all connected with a single-chip microcomputer separately, described single-chip microcomputer is connected with the control end of described relay, single-chip microcomputer is connected with described controller local area network, and described host computer is connected with controller local area network.
Further, host computer consists of computing machine, described computing machine includes serial communication interface, is connected with controller local area network's adapter on described serial communication interface, and described controller local area network's adapter is connected in controller local area network's bus.
Further host computer is connected with a computer integrated manufacturing system.
Further single-chip microcomputer Yu Yige controller local area network transceiver connects, and described transceiver Yu Yige controller local area network of controller local area network adapter connects ,Gai controller local area network adapter and is connected with controller local area network bus.
Further on single-chip microcomputer, be connected with address selection switch.
Further single-chip microcomputer is connected with an AC/DC power transfer module.
Further single-chip microcomputer is connected with three color signal indicator elments.
Further host computer is connected with display.
Principle of work of the present invention is: single-chip microcomputer has adopted the F550 series of Silicon company, and this single-chip microcomputer has the A/D function of 12, can be used for detecting the output voltage of automobile electronics.This single-chip microcomputer is the also integrated simultaneously bus controller of the CAN 2.0B of controller local area network, interconnected for multimode.The UART mouth that single-chip microcomputer has also can be realized the communication with automobile electronics, can control the running status of automobile electronics and the output of port voltage.Host computer adopts and grinds magnificent 810 industrial computers, the operating system of Windows XP and the Labview test development platform of American National instrument of operation Microsoft, for detection of the ageing state of automobile electronics and the collection of test data and judge whether data meet predefined area requirement, and the corresponding status indicator lamp that makes an immediate response.After testing software operation, wait for the scanning input of the product ID bar code of operator, once there be input product sequence number, system can records series number and is called corresponding test profile, wait for that operator puts into aging testing jig simultaneously, once having product puts into, the output terminal that is arranged on the proximity transducer in aging testing jig has Voltage-output, single-chip microcomputer detects after the variation of proximity transducer output end voltage, the message that transmission has an aging testing jig address is to CAN(controller local area network) in bus, the CAN address card connecting by computer serial ports end receives product and puts into after the message of which tool, testing software sends to the message of product connection power supply on CAN bus, the singlechip control panel cartoon of corresponding address is crossed pilot relay and is powered on to product, and the message that transmission executes is on CAN bus, CAN address card receives after the message that product powered on, testing software sends the message of AD sampling on CAN bus, the AD of the singlechip control panel card start-up corresponding ports of corresponding address measures, and the form with message sends in CAN bus by the value measuring, CAN address card receives after AD measurement data, compare judgement with predefined scope, if undesirable words will stop burn-in test, meet the requirements and just continue burn-in test, until the digestion time of setting arrives.After test finishes, testing software judges whether product meets first in first out requirement, as do not meet first in first out requirement and continue to wait for, satisfactory words generate testing journal sheet, upload to CIMS system (computer integrated manufacturing system), prompting operator can take out product, completes whole burn-in test.Certainly in foregoing process, simultaneity factor is inputted in the scanning of waiting for the product ID bar code of operator again, so realize asynchronous test at whole test process.For the ease of operation and the observation of operator, on system interface and tool, show product test state simultaneously, as: test, show yellow.Test crash, shows red.Test is passed through, and shows green.And at tool end, test shutdown switch is installed again, as the product at burn-in test, presses at any time stop button, product stops rapidly test.
The present invention and prior art are compared, and its effect is actively with obvious.The present invention arranges separately single-chip microcomputer, proximity transducer and relay in each aging testing jig, on single-chip microcomputer, connect CAN communication module, and utilize CAN bus to be connected with host computer, utilize single-chip microcomputer to host computer, to transmit the signal of proximity transducer, and the instruction that powers on of host computer is sent to relay execution.Single-chip microcomputer connects AC/DC power transfer module, the output voltage of testing product in real time, and immediately send to host computer.Host computer can be accessed by computer integrated manufacturing system, in production run, can not omit test products, can inquire about the data that inquire the aging of product.Solve in prior art in the burn-in test process of automobile electronics the defect of testing product output voltage in real time, cannot access the technical matters of CIMS system.
Accompanying drawing explanation:
Fig. 1 is the schematic diagram of a kind of automobile electronics ageing tester of the present invention.
Fig. 2 is the schematic diagram of the single-chip microcomputer in a kind of automobile electronics ageing tester of the present invention.
Embodiment:
Embodiment 1:
As depicted in figs. 1 and 2, a kind of automobile electronics ageing tester of the present invention, comprise a host computer 1, Yi Ge controller local area network 2 and at least one aging testing jig 3, wherein, in aging testing jig 3 described in any one, be all provided with separately a proximity transducer 4 and a relay 5, proximity transducer 4 described in any one is all connected with a single-chip microcomputer 6 separately, described single-chip microcomputer 6 is connected with the control end of described relay 5, single-chip microcomputer 6 is connected with described controller local area network 2, described host computer 1 is connected with controller local area network 2.
Further, host computer 1 consists of computing machine, described computing machine includes serial communication interface, is connected with controller local area network's adapter 7 on described serial communication interface, and described controller local area network's adapter 7 is connected in controller local area network's bus.
Further host computer 1 is connected with a computer integrated manufacturing system (not shown).
Further single-chip microcomputer 6 Yu Yige controller local area network transceivers 8 connect, and described controller local area network's transceiver 8 Yu Yige controller local area network adapters 9 connect ,Gai controller local area network adapters 9 and are connected with controller local area network 2 buses.
Further on single-chip microcomputer 6, be connected with address selection switch 12.
Further single-chip microcomputer 6 is connected with an AC/DC power transfer module 10.
Further single-chip microcomputer 6 is connected with three color signal indicator elments 11.
Further host computer 1 is connected with display.
The principle of work of the present embodiment is: single-chip microcomputer 6 adopts the F550 series of Silicon company, and this single-chip microcomputer 6 has the A/D function of 12, can be used for detecting the output voltage of automobile electronics.This single-chip microcomputer 6 is the also integrated simultaneously bus controller of the 2CAN 2.0B of controller local area network, interconnected for multimode.The UART mouth that single-chip microcomputer 6 has also can be realized the communication with automobile electronics, can control the running status of automobile electronics and the output of port voltage.Host computer 1 adopts and grinds magnificent 810 industrial computers, the operating system of Windows XP and the Labview test development platform of American National instrument of operation Microsoft, for detection of the ageing state of automobile electronics and the collection of test data and judge whether data meet predefined area requirement, and the corresponding status indicator lamp that makes an immediate response.After testing software operation, wait for the scanning input of the product ID bar code of operator, once there be input product sequence number, system can records series number and is called corresponding test profile, wait for that operator puts into aging testing jig 3 simultaneously, once having product puts into, the output terminal that is arranged on the proximity transducer 4 in aging testing jig 3 has Voltage-output, single-chip microcomputer 6 detects after the variation of proximity transducer 4 output end voltages, the message that transmission has aging testing jig 3 addresses is to CAN(controller local area network 2) in bus, the CAN address card connecting by computer serial ports end receives product and puts into after the message of which tool, testing software sends to the message of product connection power supply on CAN bus, single-chip microcomputer 6 Control cards of corresponding address power on to product by pilot relay 5, and the message that transmission executes is on CAN bus, CAN address card receives after the message that product powered on, testing software sends the message of AD sampling on CAN bus, the AD that single-chip microcomputer 6 Control cards of corresponding address start corresponding ports measures, and the form with message sends in CAN bus by the value measuring, CAN address card receives after AD measurement data, compare judgement with predefined scope, if undesirable words will stop burn-in test, meet the requirements and just continue burn-in test, until the digestion time of setting arrives.After test finishes, testing software judges whether product meets first in first out requirement, as do not meet first in first out requirement and continue to wait for, satisfactory words generate testing journal sheet, upload to CIMS system (computer integrated manufacturing system), prompting operator can take out product, completes whole burn-in test.Certainly in foregoing process, simultaneity factor is inputted in the scanning of waiting for the product ID bar code of operator again, so realize asynchronous test at whole test process.For the ease of operation and the observation of operator, on system interface and tool, show product test state simultaneously, as: test, show yellow.Test crash, shows red.Test is passed through, and shows green.And at tool end, test shutdown switch is installed again, as the product at burn-in test, presses at any time stop button, product stops rapidly test.

Claims (8)

1. an automobile electronics ageing tester, comprise a host computer ,Yi Ge controller local area network and at least one aging testing jig, it is characterized in that: in the aging testing jig described in any one, be all provided with separately a proximity transducer and a relay, proximity transducer described in any one is all connected with a single-chip microcomputer separately, described single-chip microcomputer is connected with the control end of described relay, single-chip microcomputer is connected with described controller local area network, and described host computer is connected with controller local area network.
2. a kind of automobile electronics ageing tester as claimed in claim 1, it is characterized in that: host computer consists of computing machine, described computing machine includes serial communication interface, on described serial communication interface, be connected with controller local area network's adapter, described controller local area network's adapter is connected in controller local area network's bus.
3. a kind of automobile electronics ageing tester as claimed in claim 1, is characterized in that: host computer is connected with a computer integrated manufacturing system.
4. a kind of automobile electronics ageing tester as claimed in claim 1, it is characterized in that: single-chip microcomputer Yu Yige controller local area network transceiver connects, described transceiver Yu Yige controller local area network of controller local area network adapter connects ,Gai controller local area network adapter and is connected with controller local area network bus.
5. a kind of automobile electronics ageing tester as claimed in claim 1, is characterized in that: on single-chip microcomputer, be connected with address selection switch.
6. a kind of automobile electronics ageing tester as claimed in claim 1, is characterized in that: single-chip microcomputer is connected with an AC/DC power transfer module.
7. a kind of automobile electronics ageing tester as claimed in claim 1, is characterized in that: single-chip microcomputer is connected with three color signal indicator elments.
8. a kind of automobile electronics ageing tester as claimed in claim 1, is characterized in that: host computer is connected with display.
CN201310541624.XA 2013-11-05 2013-11-05 Device for testing aging of automotive electronic product Pending CN103576029A (en)

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107064775A (en) * 2017-04-20 2017-08-18 北京品驰医疗设备有限公司 A kind of system that distributed reliability test is carried out to printed circuit board (PCB)
CN108387257A (en) * 2018-02-01 2018-08-10 深圳市矗能科技有限公司 A kind of method of ageing system slave ID distribution
CN108958214A (en) * 2018-05-24 2018-12-07 广东戈兰玛汽车系统有限公司 Multi-load channel electron controller aging off-line detection system
CN112230583A (en) * 2020-10-27 2021-01-15 厦门鑫玥创益教育科技有限公司 Master control board installation method based on Scratch program

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Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107064775A (en) * 2017-04-20 2017-08-18 北京品驰医疗设备有限公司 A kind of system that distributed reliability test is carried out to printed circuit board (PCB)
CN108387257A (en) * 2018-02-01 2018-08-10 深圳市矗能科技有限公司 A kind of method of ageing system slave ID distribution
CN108958214A (en) * 2018-05-24 2018-12-07 广东戈兰玛汽车系统有限公司 Multi-load channel electron controller aging off-line detection system
CN112230583A (en) * 2020-10-27 2021-01-15 厦门鑫玥创益教育科技有限公司 Master control board installation method based on Scratch program
CN112230583B (en) * 2020-10-27 2021-07-20 厦门鑫玥创益教育科技有限公司 Master control board installation method based on Scratch program

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Application publication date: 20140212