CN103575735A - Infrared diagnosis device and infrared diagnosis method of structure - Google Patents
Infrared diagnosis device and infrared diagnosis method of structure Download PDFInfo
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- CN103575735A CN103575735A CN201210268905.8A CN201210268905A CN103575735A CN 103575735 A CN103575735 A CN 103575735A CN 201210268905 A CN201210268905 A CN 201210268905A CN 103575735 A CN103575735 A CN 103575735A
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Abstract
The invention provides an infrared diagnosis device and an infrared diagnosis method of a structure, an infrared camera using a cheap thermal-type sensor is used, and even in a situation that the surface temperature of the structure being a low temperature of 5 DEG C below, a defect part of the structure can be simply identified. The infrared diagnosis device (1) of the structure is provided with the infrared camera (2) for infrared image shooting, a thermal image acquisition mechanism (31), a shutter image acquisition mechanism (32), a noise removal image acquisition mechanism (33) and a display device (4); the infrared camera (2) at least comprises an internal shutter (22) and the thermal-type sensor (23), the thermal image acquisition mechanism (31) acquires a thermal image which is shot when the internal shutter (22) is in an open state, the shutter image acquisition mechanism (32) acquires a shutter image which is shot when the internal shutter (22) is in a close state, the noise removal image acquisition mechanism (33) removes, by determination of the difference of the thermal image and the shutter image, noises based on infrared camera noises from the thermal image to obtain a noise removal image, and the display device (4) displays the noise removal image.
Description
Technical field
The present invention relates to the infrared diagnosis device and the diagnostic method that utilize infrared camera to diagnose the defect of the structures such as house, mansion, bridge, tunnel, relate in particular to infrared diagnosis device and infrared diagnosis method that the defects such as floating, peel off of brick and tile, plaster, concrete etc. is diagnosed.
Background technology
In recent years, in the structures such as house, mansion, bridge, tunnel, because of the floating, peel off etc. of brick and tile, plaster, concrete etc., can there is the problem that its part is peeled off.Accompany therewith, seek to establish a kind of non-destructive detection method that can check reliably the integrity of the outer wall materials such as brick and tile, plaster, concrete.
As the non-destructive detection method of outer wall, there is outer wall and estimate the adhesion test of investigation, outer wall ornament materials, sound out investigation, digital photos inspection, infrared inspection etc.Wherein, from the viewpoint of can be cheaply and precision highland inherent vice is diagnosed, infrared inspection is effective.Infrared inspection refers to, in the situation that there is defect in the inside of structure, heat conducting poor based on it, at it and perfect and produce temperature difference between portion, utilize this principle, by infrared view (heat picture), grasp the Temperature Distribution on structure surface, thus, carry out the gimmick of the extraction of defective locations.
In order to obtain this heat picture, use infrared camera.Infrared camera receives from the infrared ray of object structure radiation, and converts this infrared ray to electric signal by internal sensor, thereby obtains heat picture.This internal sensor, from large classification, has pattern of fever sensor and quantum type sensor.Thereby pattern of fever sensor receiving infrared-ray sensor temperature raises, the electrical properties that the temperature rising because of by each pixel of sensor is changed detects, and compares, though temperature resolution is low with quantum type sensor, but low price, so and owing at room temperature can using carrying convenience.On the other hand, the electron transfer phenomenon that the utilization of quantum type sensor produces because absorbing infrared ray, and the energy state of the electronics accompanying is with it changed and detected as electric signal, compare with pattern of fever sensor, detection sensitivity is high, and temperature resolution is high, but price is high, and due to needs cooling sensor, so be not easy to carry.From above viewpoint, in current outer wall checks, general use adopted price comparison cheaply and the infrared camera of the pattern of fever sensors such as microbolometer thermal sensor (microbolometer sensor) of carrying convenience.
But as mentioned above, pattern of fever sensor, compares with quantum type sensor, has the problem that temperature resolution is low.Here, the evaluation index as the sensor of infrared camera adopts NETD (Noise Equivalent Temperature Difference: noise equivalent temperature is poor).It also can be known as minimum temperature resolution, is worth less expression noise less, higher to the precision of temperature.NETD can be when the object of uniform temperature be carried out to instrumentation the standard deviation of temperature evaluate.The NETD as the infrared camera of the microbolometer thermal sensor of pattern of fever sensor of being equipped with selling on Vehicles Collected from Market is that (object is black matrix: 30 ℃ of temperature), can think and have measuring and can not bring the sensitivity of obstacle for carrying out the surface temperature of the inspection of concrete construction in 0.06 ℃～0.08 ℃ left and right.
But, in the situation that temperature degree is low outside, object is low temperature, infra-red intensity is low, the relative intensity of noise increases, and NETD increases, so, do not have sufficient temperature resolution to detect the defect of peeling off of concrete construction, in addition, be also created between defective part and normal portion and be difficult to generate the poor phenomenon of surface temperature, it is difficult that the observation based on infrared camera becomes.In order to solve such problem, consideration starts the method (for example TOHKEMY 2004-12454 communique) of observation after structure reaches optimal observation condition, or adopt the method (for example Japanese kokai publication hei 9-311029 communique) structure is heated by well heater, then or attempt utilizing method (such as Japanese kokai publication hei 5-312745 communique) that infrared ray heats structure etc.
As previously mentioned, outside temperature degree be in the situation of 5 ℃ of following low temperature, in the situation at cloudy day or inferior in the situation that the surface of the buildings on north is checked, in defective part with perfect that to be difficult to produce surface temperature between portion's (normal portion) poor, interact with the problem of above-mentioned noise, in the observation of carrying out at the infrared camera that has adopted cheap pattern of fever sensor, there is the problem that is difficult to accurately detect defect part.
In addition, in the observation of carrying out at the infrared camera that has adopted quantum type sensor, there are the following problems: infrared camera is very expensive, and also need device to carry out cooling sensor, maximization and Portability and power supply etc. are restricted, and are unsuitable for simple equipment, a large amount of mansion etc. being checked one by one.And, in the method starting after aforesaid, for example external environment condition reach the observation condition of the most applicable inspection of carrying out structure, exist Inspection to be subject to external environment condition restriction and can not advance according to plan the problem of operation, in addition, by well heater, heating, or irradiating in the mode that infrared ray heats and there is following problem: its power supply is being essential, device maximization itself, need in addition power supply etc., restricted by external environment condition.
Summary of the invention
The present invention makes in order to solve such problem, its object is to provide a kind of infrared diagnosis device and diagnostic method thereof of structure, utilization has adopted the infrared camera of cheap pattern of fever sensor, even in the situation that the cloudy day, at dusk time, outer temperature degree is low and to cause the surface temperature of structure be the low temperature 5 ℃ below, whether whether the surface that also can identify simply concrete structure, bridge pier, tunnel etc. perfect, produce and float or peel off etc. and cause becoming defective part.
At the infrared camera that passes through to use pattern of fever sensor in the past, when the temperature on structure surface is measured to detect defective part, be mansion towards north, under sunshine condition rugged environment or in the low situation of outer temperature degree, cannot accurately judge, inventor of the present invention makes great efforts research repeatedly to the above-mentioned reason that cannot accurately judge, result of study is found, this reason is, under such condition, not only the temperature difference of normal portion and defective part is little, and little by the detected infra-red intensity of infrared camera, so, the noise of sensor can show to obtain highly significant.
Can think instrumentation is exerted an influence and causes NETD to increase, in other words, the main cause that S/N is reduced is mainly following two noises.One is the electrical noise relevant to circuit, and another is the noise because of the inequality generation of the resistance of each pixel of sensor (area of section of supporting leg).These noises, in the situation that the object that the little surface temperature of radiant is low temperature, due to the resistance components changing than the detected infrared ray of reason sensor greatly, so show particularly significantly.The electrical noise relevant to first circuit is the short random noise of variable cycle.This noise can repeatedly be taken by the image to the same visual field, and removes by getting the summation averaging processing of its mean value.The noise that another inequality because of each pixel of sensor produces, because of the inequality of the area of section of the supporting leg of the infrared ray sensor in equipment, be that the inequality of resistance produces.It is compared with electrical noise, for macrocyclic noise, with the noise of the cyclical swing longer than frame frequency (frame rate), so, by processing for improving the summation averaging of random noise, cannot improve S/N.
Inventor of the present invention is through repeatedly making great efforts research, found that, macrocyclic noise based on this sensor, because the intrinsic structure of the structure of pattern of fever sensor etc., infrared camera is caused, as long as shutter image is taken closing under the state of inner shutter, in its image, long period noise will show in the mode of after image, and find, by removing this shutter image the heat picture obtaining from reference object thing, just can almost eliminate long period noise.It found that, even between the low pixel of temperature difference, in addition, even under the environment that temperature degree is low outside, also can identify exactly the temperature difference between pixel, even under the low temperature below 5 ℃, also can identify exactly normal portion and defective part.
The infrared diagnosis device of structure of the present invention, has: carry out the infrared camera of the shooting of infrared view, it at least has inner shutter and pattern of fever sensor; The heat picture that obtains the heat picture of taking under described inner shutter open mode obtains mechanism; Obtain the shutter Image Acquisition mechanism of the shutter image of taking under described inner shutter close state; Noise is removed Image Acquisition mechanism, it obtains noise image poor or that only consist of the noise contribution generating according to this shutter image poor that is obtained heat picture that mechanism obtains and the shutter image being obtained by described shutter Image Acquisition mechanism by described heat picture, removes the noise based on described infrared camera and obtains noise and remove image thus from described heat picture; To removed the noise that Image Acquisition mechanism obtains by described noise, remove the display device that image shows.
Here, heat picture obtains mechanism and shutter Image Acquisition mechanism, not only can obtain respectively the photographic images of 1 frame, and, can also take continuously the image of multiframe, in the situation that carrying out its summation averaging processing, the view data of also storing its each frame, and the view data that average treatment is obtained is respectively as thermographic image data, shutter view data and obtain.So in ，Ge mechanism, the attached arithmetical organ that is useful on storing mechanism and the average treatment of each data that obtain this image.In addition, about noise, remove Image Acquisition mechanism, attached too have storing mechanism and an arithmetical organ, can obtain noise repeatedly and remove image and carry out its summation averaging processing, in this case, carry out this average treatment and the last view data that obtains is that noise is removed image.
Described shutter Image Acquisition mechanism has: pixel average treatment mechanism, and its data to each pixel of the shutter image being obtained by described shutter Image Acquisition mechanism average processes and forms average treatment shutter image; And subtraction mechanism, it is from average treatment shutter image described in being stored in the shutter figure image subtraction described shutter Image Acquisition mechanism, obtain thus the described noise image that only shows the noise contribution causing because of described infrared camera, thus, owing to can being not limited to the variation ground of the environment such as temperature of sensor and only obtaining the information of noise, so preferably.
Described noise is removed Image Acquisition mechanism and is had summation averaging processing mechanism, its continuous several times is obtained the data by the resulting whole pixels of difference of described heat picture and described shutter image, and by these data repeatedly by average again after each pixel addition, thus, obtain described noise and remove image, this is the random noise entering in the calculation process stage owing to removing, so preferably.
Described display device is provided with span adjusting mechanism, it is adjusted temperature levels and temperature span, the tonal difference and/or the lightness that make to have in normal portion in predefined check point and defective part regulation are poor, even if this is due to small temperature difference, also can rely on vision to confirm reliably defective part, so preferably.
The infrared diagnosis method of structure of the present invention, it is characterized in that: by least thering is the infrared camera of inner shutter and pattern of fever sensor, open described inner shutter and take heat picture, with the shooting of described heat picture continuously, close the inside shutter of described infrared camera and take shutter image, from described heat picture, remove described shutter image or remove the noise image only being formed by the noise contribution forming by this shutter image, formation has been removed the noise of the noise based on described infrared camera and has been removed image, described noise is removed to image to be presented in display device, tonal difference by the shown image of this display device/or the poor differentiation of lightness show the defect part of image.
The shutter image of being taken by described infrared camera is preserved, and from this shutter figure image subtraction, the data of each pixel of described shutter image are averaged the average treatment shutter image of processing and obtaining, obtain thus described noise image, thereby also can remove image by this noise image is removed to form described noise from described heat picture.
Its summation averaging value is taken and obtained to the shooting of described heat picture and described shutter image continuously with the amount of multiframe respectively, thus, become respectively the data of heat picture and shutter image, owing to can removing random noise, so preferably.
Obtain continuously a plurality of described noises from described heat picture is removed described shutter image and remove image, and by the plurality of summation averaging, process to obtain described noise and remove image, this considers it is preferred from removing the angle of random noise.
To showing below of described display device, carry out: to there is tonal difference and/or the poor mode of lightness of regulation in the normal portion in predefined check point and defective part, adjust temperature levels and temperature span, with color, show to distinguish normal portion and defective part, thus, owing to can judging more accurately the difference of normal portion and defective part, so preferably.
The effect of invention
According to the present invention, by take infrared view under inner shutter close state, to obtain the temperature of each pixel that the pattern of fever sensor because of infrared camera causes uneven, by removing based on this uneven temperature difference from heat picture, being noise, can remove macrocyclic noise contribution, so, regardless of situation at sunshine, in addition, even if temperature degree is 5 ℃ of following causing in situation that heat sensitivity is low outside, also can improve the visuognosis of defective part, and obtain effective infrared view for inspection.Its result is, use has adopted the infrared camera with portability of cheap pattern of fever sensor, even also can detect simply more than 0.08 ℃ temperature difference under above-mentioned rugged surroundings, can detect very simply the defect part of concrete construction etc.
Accompanying drawing explanation
Fig. 1 means the block diagram of an embodiment of the infrared diagnosis device of structure of the present invention.
Fig. 2 is the process flow diagram of flow process of the infrared diagnosis method of explanation structure of the present invention.
Fig. 3 (a) means the block diagram of shutter image acquisition section of other embodiments of the infrared diagnosis device of structure of the present invention, and Fig. 3 (b) is that the noise of other embodiments of the infrared diagnosis method of explanation structure of the present invention is removed the process flow diagram of the flow process of processing section.
Fig. 4 means that the heat picture (Fig. 4 (a)), shutter image (Fig. 4 (b)) and the noise that utilize in the middle operation that the method shown in Fig. 2 diagnoses remove the key diagram of the example of image (Fig. 4 (c)).
Fig. 5 is for the process flow diagram of flow process of image analysis operation of the defective part extracting method of infrared diagnosis method of the present invention is described.
The explanation of Reference numeral
1 infrared diagnosis device
2 infrared cameras
3 information treatment parts
4 display device
21 lens
22 inner shutters
23 pattern of fever sensors
31 heat pictures obtain mechanism
31a summation averaging processing mechanism
32 shutter Image Acquisition mechanisms
32a summation averaging processing mechanism
Each pixel average treatment mechanism of 32b
32c subtraction mechanism
33 noises are removed Image Acquisition mechanism
33a summation averaging processing mechanism
41 span adjusting mechanisms
N long period noise
Embodiment
Below, limit is with reference to accompanying drawing, and limit is elaborated to infrared diagnosis device and the diagnostic method thereof of structure of the present invention.
The infrared diagnosis device 1 of structure of the present invention, as shown in the configuration example of the embodiment of one in Fig. 1, is provided with infrared camera 2, and it at least has inner shutter 22 and pattern of fever sensor 23, carries out the shooting of infrared view.And, as information treatment part 3, be provided with: the heat picture that obtains heat picture captured under inner shutter 22 open modes obtains mechanism 31; Obtain the shutter Image Acquisition mechanism 32 of shutter image captured under inner shutter 22 closed conditions; Noise is removed Image Acquisition mechanism 33, it is obtained by this heat picture and obtains the poor of the heat picture that mechanism 31 obtains and the shutter image being obtained by shutter Image Acquisition mechanism 32, from heat picture, remove thus the noise that infrared camera brings and obtain noise and remove image, this infrared diagnosis device 1 is by infrared camera 2, information treatment part 3 and show that this noise removes the display device 4 of image and form.
In the example shown in Fig. 1, at heat picture, obtain in mechanism 31, shutter Image Acquisition mechanism 32 dependency respectively and be provided with summation averaging processing mechanism 31a, 32a, for example 16 frames or 64 frame continuous shootings respectively, and the summation averaging that carries out each image is processed.In addition, at noise, remove in Image Acquisition mechanism 33 also dependency and be provided with summation averaging processing mechanism 33a, can be by processing the heat picture obtain from for example averaging by 64 frames, for example remove and average and process the shutter image obtaining by 64 frames, and and then the data of all pixels that obtain are thus obtained repeatedly continuously to (for example 8 times), by the summation averaging of the plurality of data, obtain noise and remove image.Like this, thereby the mean value by the data obtaining the data of a plurality of frames and repeatedly obtain obtains noise, remove image, thus, can access Temperature Distribution more accurately.But, also can be configured to, by each frame, take heat picture and shutter image, and using the subtracting each other as data once of heat picture and shutter image, obtain thus noise and remove image.
Diagnosis object as the infrared diagnosis device 1 of structure of the present invention is structure, such as the concrete structure that can enumerate the outer wall, tunnel, bridge pier etc. of house, mansion etc., though refer to from away from position also need the structure detecting such as to float, peel off to concrete.
Infrared camera 2 possesses the collector lens 21 that infrared ray is carried out to optically focused, and at least has: make the infrared ray blocking of the incident by collector lens 21 or the inside shutter 22 passing through; Infrared ray is converted to the pattern of fever sensor 23 of electric signal.That is, in the present invention, for the structure detection infrared ray with cheap, by the pattern of fever sensor 23 such as formations such as micro-metering bolometers (microbolometer), formed.This pattern of fever sensor 23, accepts infrared ray and sensor temperature rising, and the electrical properties of the resistance value changing rising because of component temperature etc. detects, and sends to not shown signal processing circuit as electric signal, as temperature information, is stored.This sensor forms as the mode of 320 * 240 pixels or 640 * 480 pixels with configuration example.
In information treatment part 3, only recorded main mechanism, in fact, be provided with storing mechanism, control gear etc. in each mechanism, the view data of obtaining is stored in storing mechanism, in addition, also comprises arithmetic processing circuit or microcomputer.
It is following mechanisms that heat picture obtains mechanism 31: opening under the state of inner shutter 22, by pattern of fever sensor 23, detecting the infrared ray by lens 21 optically focused, obtaining the heat picture of structure.Being attached to the summation averaging processing mechanism 31a that heat picture obtains mechanism 31 is the mechanism that carries out summation averaging processing to having taken the heat picture of predefined frame number.Therefore, though not shown, the view data of each captured frame is stored temporarily, after the shooting of regulation frame number finishes, carries out the summation averaging of data process in each pixel, obtains heat picture, and preserves this view data.Owing to carrying out like this summation averaging processing, thus can remove random noise, but this is not necessarily.
Shutter Image Acquisition mechanism 32 is following mechanisms: closing under the state of inner shutter 22, obtaining the formed shutter image of signal producing according in pattern of fever sensor 23.Also attached in this shutter Image Acquisition mechanism 32 have a summation averaging processing mechanism 32a,, to having taken the shutter image of predefined frame number, carries out summation averaging processing here.This frame number can be set 16 frames identical with the situation of heat picture or 64 frames etc. for.
Noise is removed Image Acquisition mechanism 33, though not shown, but there is computing processing sector, following mechanism: by obtaining by heat picture, obtain the poor of the heat picture that mechanism 31 obtains and the shutter image being obtained by shutter Image Acquisition mechanism 32, thereby and from heat picture, remove macrocyclic noise based on infrared camera and obtain noise and remove image.This computing is that the difference data that each pixel is obtained to its data by each pixel carries out.In the example shown in Fig. 1, at noise, remove dependency in Image Acquisition mechanism 33 and be provided with summation averaging processing mechanism 33a.This summation averaging processing mechanism 33a removes to having obtained the noise of predefined number of times the mechanism that image carries out summation averaging processing, and the random noise entering while carrying out calculating process that noise removes etc. in order to remove arranges.
In this example, using image captured under inner shutter 22 closed conditions as shutter image, from heat picture, removed, obtain thus noise and removed image, but can also be, using having removed background component, only the image of remaining noise contribution, as noise image, and is removed from heat picture, obtains thus noise and removes image.Here, if directly remove the data of shutter image from the data of heat picture, not only the data of noise contribution background component are also removed, and the noise that obtains the whole temperature lower than actual temperature of expression is removed image.On the other hand, if only remove the data of the noise image of noise contribution, obtain representing that the noise of actual temperature removes image.In the same visual field, if only defective part is carried out to visuognosis, as long as it is just enough the temperature difference of normal portion and defective part to be detected, so noise is removed image without representing actual temperature, as long as represent that relative temperature difference is just enough.But in the situation that want to investigate the temperature variation of the actual effect of structure before and after changing, noise is removed image need to represent the actual temperature that can compare before and after actual effect changes.
Owing to being such situation, as shown in Fig. 3 (a), in shutter Image Acquisition mechanism 32, be provided with each pixel average treatment 32b of mechanism and the 32c of subtraction mechanism, become the formation that can access the noise image that only has noise contribution.Each pixel average treatment 32b of mechanism is that the data of each pixel of the shutter image to being obtained by shutter Image Acquisition mechanism 32 average and obtain the mechanism of average treatment shutter image, and the 32c of subtraction mechanism is the mechanism of the shutter figure image subtraction average treatment shutter image from being obtained by shutter Image Acquisition mechanism 32.In the situation that using each pixel average treatment 32b of mechanism, the noise image obtaining by this mechanism is processed as shutter image.
Display device 4, comes normal portion and the defective part of display structure thing contrastively by the difference of tone, lightness, preferably can identify the difference of normal portion and defective part at a glance.Therefore, expectation is adjusted the tone corresponding with temperature variation, the difference of lightness according to the temperature difference of normal portion and defective part, and therefore expectation is provided for the span adjusting mechanism 41 of this object.Span adjusting mechanism 41 is so that be to have the mechanism that the tonal difference of regulation and/or the poor mode of lightness are adjusted temperature levels and span in normal portion and defective part at predefined check point.Here, check point refers to, by carrying out in advance outer wall range estimation investigation and souning out normal portion and the defective part that investigation is determined, become benchmark within the scope of image taking.In addition, the adjustment of temperature levels and temperature span can freely be adjusted, but the viewpoint from the difference of the normal portion of easy identification and defective part, for example using the GTG of n gray scale (gradation) (gray scale), (1 gray scale is black, n gray scale is for white) display noise removes in the situation of image, and the temperature-averaging value that is preferably adjusted to check point and is normal portion and defective part is that the temperature of n * 5/10 gray scale, normal portion is that the temperature of n * 2/10 gray scale, defective part is n * 8/10 gray scale.
Display device 4, so long as liquid crystal display etc. show the device of image, can be used various forms, to removed noise that Image Acquisition mechanism 33 obtains by noise, removes image and shows.
In the record of above-mentioned embodiment, the situation that infrared diagnosis device 1 forms respectively with infrared camera 2, information treatment part 3 and display device 4 is illustrated, also can be configured to these devices are all assembled in infrared camera 1, can also information treatment part 3 and display device 4 be structure as a whole by PC etc., and with between infrared camera 2, by cable, be connected, a part for information treatment part 3 and/or display device 4 can also be assembled into infrared camera 2.In addition, though not shown, such as the control gear of driving of inner shutter 22 etc., be also located in information treatment part 3, infrared camera 2, display device 4 etc.
Next, about using the infrared diagnosis method of the present invention of this infrared diagnosis device, with reference to Fig. 2, describe.As shown in Figure 2, first, under the open state of inner shutter 22 (S1), by heat picture, obtain the heat picture (S2) that structure is taken by mechanism 31.The shooting of this heat picture can be only 1 frame, but from removing the viewpoint of random noise, preferably takes continuously multiframe, the image of 16 or 64 frames for example, and gets its mean value.Therefore, take continuously heat picture until reach predefined frame number, and store this data, after reaching the frame number of regulation (Y of S3), by summation averaging processing mechanism 31a, the summation averaging that proceeds to the whole frames that obtain is so far processed (S4), obtains heat picture (S5).As do not reached regulation frame number (N of S3), return to the shooting that step S2 repeats heat picture again.Next, close inner shutter 22 (S6), by shutter Image Acquisition mechanism 32, take shutter image (S7).And, when not reaching predefined frame number (N of S8), return to step S7 to take continuously shutter image (S7).After reaching predefined frame number (Y of S8), by summation averaging processing mechanism 32a, the summation averaging that proceeds to the whole frames that obtain is so far processed (S9), obtains shutter image (S10).Then, by noise, remove Image Acquisition mechanism 33, heat-obtaining image and shutter image poor, carries out thus noise and removes processing (S11).Now, when the obtaining number of times and do not reach predefined number of times of poor data (N of S12), return to step S1, repeatedly carry out continuously the obtaining of the obtaining of heat picture, shutter image, noise is removed processing, after reaching the number of times of setting (Y of S12), by summation averaging processing mechanism 33a, proceed to so far and remove by noise the summation averaging processing (S13) of processing resulting data, obtain noise and remove image (S14).
In aforesaid example, the shooting of the shutter image by multiframe and summation averaging are processed to resulting shutter image to be removed from heat picture, obtain thus noise and remove image, but can also obtain the noise image that only has noise contribution according to shutter image, and this noise image is removed from heat picture, obtain thus noise and remove image.
With reference to Fig. 3 (b), this example is described.; after having obtained shutter image (S10); the data of each pixel of shutter image are averaged and processed and formation average treatment shutter image (S10a); from shutter figure image subtraction average treatment shutter image, can access thus the noise image (S10b) that only has the noise contribution causing because of infrared camera.Then, by remove this noise image from heat picture, carry out noise and remove processing (S11), afterwards, similarly carry out with the flow process of Fig. 2, thus, finally can access noise and remove image (S14 of Fig. 2).The noise obtaining is like this removed image and is compared with aforesaid example, represents Temperature Distribution more accurately.
In above-mentioned steps, the schematic diagram of the image obtaining in S5, S10 and S11 is shown in Figure 4.That is,, being obtained by heat picture in the heat picture that mechanism 31 obtains of S5, as shown in Fig. 4 (a), except subject is the heat picture of structure, also there is the long period noise N being illustrated by the broken lines.Next, because the surface temperature of inner shutter 22 is even, so, no matter whether must represent uniform Temperature Distribution, as shown in Fig. 4 (b), S10 pass through in shutter image that shutter Image Acquisition mechanism 32 obtains, all can there is in the mode of after image the long period noise N being illustrated by the broken lines.Long period noise N, change in time as described above, but owing to taking continuously heat picture and shutter image in the time shorter than the time of long period noise change, so, appear in an identical manner in two images.Therefore, S11 removes by noise the noise that Image Acquisition mechanism 33 obtains and removes image, only such shown in residual Fig. 4 (c), as the heat picture (noise is removed image) of the structure of subject.In the present invention, by such processing, alleviate long period noise, but simultaneously, by processing resulting image and carry out summation averaging processing repeatedly carrying out this, can further alleviate random noise.By above processing, can reduce NETD, as a result of, even under low-temperature region, other sunshine condition rugged environment, also can access the high heat picture of visuognosis of the defect of structure.
Below, about resulting noise, remove the analytic method of image, with reference to Fig. 5, describe.By above-mentioned operation, obtaining after noise removes image, by span adjusting mechanism 34, carrying out the extraction of the defective part of structure.After 34 startings of span adjusting mechanism, noise is removed image and in display device 4, is reproduced (S21).Now, though not shown, noise is removed image and not only as editor, with file, is saved, and also as backup, with file, is saved.Next, temperature levels and temperature span are adjusted, thereby so that show palette match and make normal portion and defective part in predefined check point can show brightly (S22) with the GTG of easily confirming temperature variation.Here, as mentioned above, check point refers to, is estimated investigation and is soundd out normal portion and the defective part that investigation is determined, become benchmark within the scope of image taking in advance by outer wall.In addition, the adjustment of temperature levels and temperature span can freely be adjusted, but the viewpoint from the difference of the normal portion of easy identification and defective part, at the GTG by n gray scale, (1 gray scale is black, n gray scale is for white) display noise removes in the situation of image, and the temperature-averaging value that is preferably adjusted to check point and is normal portion and defective part is that the temperature of n * 5/10 gray scale, normal portion is that the temperature of n * 2/10 gray scale, defective part is n * 8/10 gray scale.In addition, make in an embodiment image be shown as GTG, but also can carry out colour, show, can also be by the difference of tonal difference and/or the normal portion of the poor demonstration of lightness and defective part.From the noise showing like this, remove image, will produce equal with the temperature difference producing at check point or as defective part, extract (S23) than the part of its large temperature difference.Finally, generate the distribution plan (S24) of the defective part of extracting, thereby finish the diagnosis of defective part.
Claims (9)
1. an infrared diagnosis device for structure, is characterized in that having:
Carry out the infrared camera of the shooting of infrared view, it at least has inner shutter and pattern of fever sensor;
The heat picture that obtains the heat picture of taking under described inner shutter open mode obtains mechanism;
Obtain the shutter Image Acquisition mechanism of the shutter image of taking under described inner shutter close state;
Noise is removed Image Acquisition mechanism, it obtains noise image poor or that only consist of the noise contribution generating according to this shutter image poor that is obtained heat picture that mechanism obtains and the shutter image being obtained by described shutter Image Acquisition mechanism by described heat picture, removes the noise based on described infrared camera and obtains noise and remove image thus from described heat picture;
To removed the noise that Image Acquisition mechanism obtains by described noise, remove the display device that image shows.
2. the infrared diagnosis device of structure as claimed in claim 1, it is characterized in that: described shutter Image Acquisition mechanism has: pixel average treatment mechanism, its data to each pixel of the shutter image being obtained by described shutter Image Acquisition mechanism average processes and forms average treatment shutter image; And subtraction mechanism, it,, from average treatment shutter image described in being stored in the shutter figure image subtraction described shutter Image Acquisition mechanism, obtains the described noise image that only shows the noise contribution causing because of described infrared camera thus.
3. the infrared diagnosis device of structure as claimed in claim 1 or 2, it is characterized in that: described noise is removed Image Acquisition mechanism and had summation averaging processing mechanism, its continuous several times is obtained the data by the resulting whole pixels of difference of described heat picture and described shutter image, and by these data repeatedly by average again after each pixel addition, thus, obtain described noise and remove image.
4. the infrared diagnosis device of structure as claimed in claim 1 or 2, it is characterized in that: described display device is provided with span adjusting mechanism, it is adjusted temperature levels and temperature span, and the tonal difference and/or the lightness that make to have in normal portion in predefined check point and defective part regulation are poor.
5. an infrared diagnosis method for structure, is characterized in that:
By at least thering is the infrared camera of inner shutter and pattern of fever sensor, open described inner shutter and take heat picture,
With the shooting of described heat picture continuously, close the inside shutter of described infrared camera and take shutter image,
From described heat picture, remove described shutter image or remove the noise image only consisting of the noise contribution forming by this shutter image, formation has been removed the noise of the noise based on described infrared camera and has been removed image,
Described noise is removed to image and be presented in display device, by the tonal difference of the shown image of this display device, differentiate the defect part that shows image.
6. the infrared diagnosis method of structure as claimed in claim 5, it is characterized in that: preserve the shutter image of being taken by described infrared camera, and from this shutter figure image subtraction, the data of each pixel of described shutter image are averaged the average treatment shutter image of processing and obtaining, obtain thus described noise image, this noise image is removed from described heat picture, formed thus described noise and remove image.
7. the infrared diagnosis method of the structure as described in claim 5 or 6, it is characterized in that: its summation averaging value is taken and obtained to the shooting of described heat picture and described shutter image continuously with the amount of multiframe respectively, thus, become respectively the data of heat picture and shutter image.
8. the infrared diagnosis method of the structure as described in claim 5 or 6, it is characterized in that: obtain continuously a plurality of described noises from described heat picture is removed described shutter image and remove image, and by the plurality of summation averaging, process to obtain described noise and remove image.
9. the infrared diagnosis method of the structure as described in claim 5 or 6, it is characterized in that: to showing below of described display device, carry out: to there is tonal difference and/or the poor mode of lightness of regulation in the normal portion in predefined check point and defective part, adjust temperature levels and temperature span, with color, show to distinguish normal portion and defective part.
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