CN103542810A - Electrode alignment coincidence rate detector and electrode alignment coincidence rate calculation method - Google Patents

Electrode alignment coincidence rate detector and electrode alignment coincidence rate calculation method Download PDF

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Publication number
CN103542810A
CN103542810A CN201310455522.6A CN201310455522A CN103542810A CN 103542810 A CN103542810 A CN 103542810A CN 201310455522 A CN201310455522 A CN 201310455522A CN 103542810 A CN103542810 A CN 103542810A
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China
Prior art keywords
electrode
shooting head
scan camera
camera shooting
coincidence factor
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Pending
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CN201310455522.6A
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Chinese (zh)
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刘洋
范永良
李新亮
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Sichuan COC Display Devices Co Ltd
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Sichuan COC Display Devices Co Ltd
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Priority to CN201310455522.6A priority Critical patent/CN103542810A/en
Publication of CN103542810A publication Critical patent/CN103542810A/en
Pending legal-status Critical Current

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Abstract

The invention provides an electrode alignment coincidence rate detector and an electrode alignment coincidence rate calculation method. According to the method, a part under check is automatically imaged, and an image is calculated; accordingly, the problem that since, for a long time, checking with eyes is high in misjudgment rate and processed products are provided with no actuate data for supervision, the product quality is uncontrollable is solved; progressive adversity caused by inaccuracy in manual checking and poor alignment of client televisions is avoided effectively; inspection of coincidence rate is higher in level; credibility of company products is improved.

Description

A kind of electrode contraposition coincidence factor pick-up unit and computing method
Technical field
The present invention relates to a kind of electrode contraposition coincidence factor pick-up unit and computing method, particularly relate to a kind of device and computing method that are applicable to plasma panel (PDP) SCAN electrode and the involutory rear coincidence factor detection of soft board electrode.
Background technology
Bonding operation in Plasmia indicating panel mainly completes being connected of screen addressing electrode (ADD) and senior one-tenth semi-conductor chip (TCP) electrode and SCAN electrode and flexible printed circuit (FPC), yet due to the narrow feature of PDP electrode width, from current industry, see that can't process the directly realization portion of being connected by equipment overlaps completely, so it is just very necessary to increase a kind of device calculating for electrode coincidence factor after bonding.
It is ripe that current plasma panel manufacturing technology has been tending towards, in production, also reach mass-produced condition, yet aspect the inspection of SCAN and FPC electrode coincidence factor or the method confirmed of original artificial naked eyes, under this method, allow people remove to estimate the fine rule of a width 110 microns of left and right and do not possess checking ability completely, at the bottom of the bad recall rate of generation.From current industry circle: what extensively adopt is directly to process by equipment the product that coincidence factor is high process, after completing, without inspection, the equipment that must guarantee under this method has high-precision working ability and must have the abnormal automatic monitoring method before a set of contraposition processing.Can not guarantee that in this manner converted products 100% is qualified, and the manufacturing cost of equipment is high, if accidentally equipment occurs abnormal, so in product processing coincidence factor problem just cannot monitor, bad can not discovery in time, once batch flows out to client Shou Zhongjianggei company, bring irremediable loss.
In view of above deficiency, just need a set of device of SCAN and FPC automated imaging that can make also can process the method that calculates coincidence factor between electrode to image.
Summary of the invention
The technical problem to be solved in the present invention is to provide a kind of electrode contraposition coincidence factor pick-up unit and computing method.
The technical solution used in the present invention is as follows: a kind of electrode contraposition coincidence factor pick-up unit, it is characterized in that: comprise the scan camera shooting head being connected with computing machine, described scan camera shooting head is arranged at next side on electrode, for electrode is aligned and coincided to detection scan camera shooting, and result is transferred to computing machine.
As preferably, also comprise liquid crystal projection apparatus, for light filling that scan camera shooting head is made a video recording.
As preferably, described liquid crystal projection apparatus is Halogen lamp LED.
As preferably, also comprise positioning shooting head; On chip with electrode, be provided with anchor point, for positioning shooting head, chip accurately located.
As preferably, described liquid crystal projection apparatus is arranged at the opposite side of the chip electrode relative with scan camera shooting head.
As preferably, described scan camera shooting head meets can differentiate 70 microns of live width demands.
As preferably, described positioning shooting head has two at least.
As preferably, two positioning shooting heads lay respectively at the rear and front end of chip.
A kind of electrode contraposition coincidence factor computing method: the electrode based on described device aligns and coincides and detects scan process result, the circular step of coincidence factor is: first according to scanning result, calculate electrode detection width value W, again according to formula: coincidence factor=1-(W-b)/b*100%, draw the coincidence factor of each electrode, wherein, b is electrode datum width value.
As preferably, the circular of described electrode detection width value W value is: W=[M*X*N*Y-a (M*N)]/M*X=N (XY-a)/X, wherein M and N represent that respectively a pixel is long and wide, X and Y represent respectively the long and wide number of pixel in region, and a represents the number of the point that do not overlap.
Compared with prior art, the invention has the beneficial effects as follows: the present invention adopts a kind of method that is examined position automated imaging and figure is calculated, having solved for a long time the high and converted products of artificial visual check False Rate monitors without accurate data, make product quality have not controlled problem, effectively avoid the inaccurate and client's TV of hand inspection to occur that bad the carrying out property causing of contraposition is bad, strengthen and align and coincide rate insolation level, improve company's product image degree.
Accompanying drawing explanation
Fig. 1 is the wherein principle of device schematic diagram of an embodiment of the present invention.
Fig. 2 is the scanning process schematic diagram in embodiment illustrated in fig. 1.
The electrode coincidence situation map of Fig. 3 for scanning by scan camera shooting head.
Fig. 4 extracts the coincidence factor schematic diagram calculation drawing through processing after electrode coincidence scintigram in dotted line frame in Fig. 3.
embodiment
In order to make object of the present invention, technical scheme and advantage clearer, below in conjunction with drawings and Examples, the present invention is further elaborated.Should be appreciated that specific embodiment described herein, only in order to explain the present invention, is not intended to limit the present invention.
Disclosed all features in this instructions, except the feature of mutual eliminating, all can combine by any way.
Disclosed arbitrary feature in this instructions (comprising any accessory claim, summary and accompanying drawing), unless narration especially all can be replaced by other equivalences or the alternative features with similar object.That is,, unless narration especially, each feature is an example in a series of equivalences or similar characteristics.
As shown in Figure 1, a kind of electrode contraposition coincidence factor pick-up unit, comprises the scan camera shooting head 2 being connected with computing machine, and described scan camera shooting head 2 is arranged at next side on electrode 11, for electrode 11 is aligned and coincided to detection scan camera shooting, and result is transferred to computing machine.
To needing the region (can comprise a little or line) of imaging in detecting, what this specific embodiment was related is the imaging of a line, as Fig. 1 shows, is needing to increase a scan camera shooting head above the region of imaging.
Described scan camera shooting head meets can differentiate 70 microns of live width demands, meets general electrode scanning resolution demand.
Also comprise liquid crystal projection apparatus 3, for light fillings that scan camera shooting head 2 is made a video recording.
Described liquid crystal projection apparatus 3 is arranged at the opposite side of the chip electrode 11 relative with scan camera shooting head 1.Correspondingly, in this specific embodiment, be arranged at the chip electrode 11 relative with scan camera shooting head 1 below for scan camera shooting head 1.
Described liquid crystal projection apparatus 3 is Halogen lamp LED.Due to the high-luminance light transmissive product that Halogen lamp LED sends, make camera shoot the image that can identify, in this specific embodiment, adopt one by Halogen lamp LED as liquid crystal projection apparatus 3.
Also comprise positioning shooting head 4; On chip 1 with electrode 11, be provided with anchor point 12, for 4 pairs of chips 1 of positioning shooting head, accurately locate.
Described positioning shooting head 4 has two at least.
Two positioning shooting heads 4 lay respectively at the rear and front end of chip.
In this specific embodiment, first by two positioning shooting heads 4 of rear and front end, two anchor points 12 finding in visual range are proofreaied and correct location, prevent image slanting in line sweep moving process.
In this specific embodiment, move and present image by diagramatic way with the speed of 10800mm/min in the mode of line sweep through automatic imaging device in the SCAN limit of PDP screen, as shown in Figure 2, scan camera shooting head 2 liquid crystal projection apparatus 3 are fixing, according to direction shown in Fig. 2 arrow, scan camera shooting head 2 is motionless, and driven by motor chip 1 moves forward and backward.
The figure of shooting can be uploaded to computer, as shown in Figure 3, then image is processed, the result after processing as shown in Figure 4.Result after image in dotted line frame in Fig. 3 is processed is as shown in Fig. 4 dotted line frame, and wherein dotted line frame internal oblique line is partly black pixel point, and white circle is white pixel point.
The computing method of figure are the images displaying in black and white mode presenting with gray scale number percent by device, the pixel embodying by black in certain region (or white), calculates in this way area and calculates coincidence factor with an intrinsic formula.
A kind of electrode contraposition coincidence factor computing method: the electrode 11 based on described device aligns and coincides and detects scan process result, the circular step of coincidence factor is: first according to scanning result, calculate electrode detection width value W, again according to formula: coincidence factor=1-(W-b)/b*100%, draw the coincidence factor of each electrode, wherein, b is electrode datum width value.
The computing method of described W value are: W=[M*X*N*Y-a (M*N)]/M*X=N (XY-a)/X, wherein M and N represent that respectively pixel is long and wide, and X and Y represent that respectively the pixel in region grows and wide number, and a represents the number of the point that do not overlap.
In this specific embodiment, a represents white pixel point number, thereby according to above-mentioned computing method, draws the coincidence factor of actual each electrode, according to coincidence factor, is judging modulation strategy, improves the quality of products.

Claims (10)

1. an electrode contraposition coincidence factor pick-up unit, it is characterized in that: comprise the scan camera shooting head (2) being connected with computing machine, described scan camera shooting head (2) is arranged at upper next side of electrode (11), for electrode (11) is aligned and coincided to detection scan camera shooting, and result is transferred to computing machine.
2. device according to claim 1, is characterized in that: also comprise liquid crystal projection apparatus (3), for light filling that scan camera shooting head (2) is made a video recording.
3. device according to claim 2, is characterized in that: described liquid crystal projection apparatus (3) is Halogen lamp LED.
4. device according to claim 1, is characterized in that: also comprise positioning shooting head (4); On chip (1) with electrode (11), be provided with anchor point (12), for positioning shooting head (2), chip (1) accurately located.
5. according to the device described in claim 2 or 3, it is characterized in that: described liquid crystal projection apparatus (3) is arranged at the opposite side of the chip electrode (11) relative with scan camera shooting head (2).
6. device according to claim 1, is characterized in that: described scan camera shooting head (2) meets can differentiate 70 microns of live width demands.
7. device according to claim 4, is characterized in that: described positioning shooting head (4) has two at least.
8. device according to claim 7, is characterized in that: two positioning shooting heads (4) lay respectively at the rear and front end of chip (1).
9. electrode contraposition coincidence factor computing method: the electrode based on described device (11) aligns and coincides and detects scan process result, the circular step of coincidence factor is: first according to scanning result, calculate electrode detection width value W, again according to formula: coincidence factor=1-(W-b)/b*100%, draw the coincidence factor of each electrode, wherein, b is electrode datum width value.
10. device according to claim 1, it is characterized in that: the circular of described electrode detection width value W value is: W=[M*X*N*Y-a (M*N)]/M*X=N (XY-a)/X, wherein M and N represent that respectively a pixel is long and wide, X and Y represent respectively the long and wide number of pixel in region, and a represents the number of the point that do not overlap.
CN201310455522.6A 2013-09-30 2013-09-30 Electrode alignment coincidence rate detector and electrode alignment coincidence rate calculation method Pending CN103542810A (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107726986A (en) * 2017-11-29 2018-02-23 广东嘉铭智能科技有限公司 A kind of vision inspection apparatus and its visible detection method for electrode welding inspection

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JP2001283935A (en) * 2000-03-30 2001-10-12 Sony Corp Inspection method of battery sealing structured and battery-sealing structure inspection device
JP2003344020A (en) * 2002-05-30 2003-12-03 Furukawa Battery Co Ltd:The Inspection method for baglike separator
CN201335683Y (en) * 2009-01-22 2009-10-28 杭州电子科技大学 On-line image acquisition device
KR20100107867A (en) * 2009-03-27 2010-10-06 한국영상기술(주) Apparatus and method for measuring line width of bonding electrode
CN202119399U (en) * 2011-06-23 2012-01-18 杭州古思科技有限公司 Device for detecting position of SMD resistor on substrate
CN102914266A (en) * 2012-11-15 2013-02-06 深圳市华星光电技术有限公司 Line width measuring device
CN103292703A (en) * 2012-02-24 2013-09-11 天津三星电机有限公司 Chip capacitor electrode width measuring method based on Labview

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001283935A (en) * 2000-03-30 2001-10-12 Sony Corp Inspection method of battery sealing structured and battery-sealing structure inspection device
JP2003344020A (en) * 2002-05-30 2003-12-03 Furukawa Battery Co Ltd:The Inspection method for baglike separator
CN201335683Y (en) * 2009-01-22 2009-10-28 杭州电子科技大学 On-line image acquisition device
KR20100107867A (en) * 2009-03-27 2010-10-06 한국영상기술(주) Apparatus and method for measuring line width of bonding electrode
CN202119399U (en) * 2011-06-23 2012-01-18 杭州古思科技有限公司 Device for detecting position of SMD resistor on substrate
CN103292703A (en) * 2012-02-24 2013-09-11 天津三星电机有限公司 Chip capacitor electrode width measuring method based on Labview
CN102914266A (en) * 2012-11-15 2013-02-06 深圳市华星光电技术有限公司 Line width measuring device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107726986A (en) * 2017-11-29 2018-02-23 广东嘉铭智能科技有限公司 A kind of vision inspection apparatus and its visible detection method for electrode welding inspection

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Application publication date: 20140129