CN103528547B - A kind of device and method measuring electron linear accelerator focal spot size - Google Patents

A kind of device and method measuring electron linear accelerator focal spot size Download PDF

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CN103528547B
CN103528547B CN201310488864.8A CN201310488864A CN103528547B CN 103528547 B CN103528547 B CN 103528547B CN 201310488864 A CN201310488864 A CN 201310488864A CN 103528547 B CN103528547 B CN 103528547B
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collimator
detector
accelerator
collimating slit
focal spot
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CN103528547A (en
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周日峰
周亚玲
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Chongqing University
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Chongqing University
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Abstract

The invention discloses a kind of method measuring electron linear accelerator focal spot size, including step one: placing with two collimating slit collimators at accelerator focus f dead ahead, two collimating slits are symmetrical arranged;Article two, collimating slit and collimator center line angle are β, the axis of symmetry of two collimating slits and accelerator beam center superposition;End at two collimating slits is respectively mounted a detector;Step 2: mobile collimator and detector, it was observed that when detector numerical value changes suddenly, now collimator position will be designated as 2;Step 3: continue to move to collimator and detector at same direction, observes that, when detector numerical value changes suddenly, now collimator position is designated as position 3 again;Step 4: measure the spacing S of collimator position 2 and position 323, and the angle β of collimating slit;Step 5: the size of computation accelerator focus f.The present invention passes through transversal scanning mode, observes the change of detector numerical value, measures collimator displacement, thus calculating focal spot size size.

Description

A kind of device and method measuring electron linear accelerator focal spot size
Technical field
The present invention relates to radiographic source field, particularly to a kind of device and method measuring electron linear accelerator focal spot size.
Background technology
Electron linear accelerator has ray energy height, penetration power is strong, close rate is big, focus is little, detection essence is high, the detection speed feature such as faster, is widely used in the large-sized objects such as Large Steel iron castings, pressure vessel, container, solid propellant rocket and carries out nondestructive inspection and quality evaluation.Meet the special Non-Destructive Testing demand of the Large-Scale Equipment of the industries such as Aero-Space, defence and military and transportation, Ferrous Metallurgy, geology, oil, it is the requisite important means of quality and safety ensureing these specialities, there is huge social value and using value.
The size of the focus of electron linear accelerator, is one of the key technical index of electron linear accelerator.Its geometric unsharpness to radiography, realtime imaging, and the spatial resolution of industry CT has material impact.Focal spot size is more little, and the geometric unsharpness of generation is also more little, and image is more clear.Electron linear accelerator focal spot size measuring method mainly has pinhole imaging system method, line penetrameter method and gap method.It is gap method or title " sandwich " method through what commonly use.But owing to accelerator ray energy is high, focus is little, all there is very big error in currently used measuring method, it is difficult to meets measurement requirement.
Using " sandwich " in standard GB/T20129-2006 is utilize thickness for h1Copper sheet or lead flake and thickness be h2The alternate length that builds up of sheet be about " sandwich " of 300mm, with steel plate clamp, constitute sandwich-type focus measurement apparatus.During measurement, lamination block is placed in the X ray delivery outlet of accelerator, close proximity to target.When X ray is through lamination block, Copper Foil is by blocking radiation, ray passes through from the narrow slit that sheet is corresponding, make to be placed on the light reaching the film of the folded block other end, film after exposure, will appear from several secret note, and the part by central authorities is more black, the blackness on both sides is less, takes the blackness secret note number n more than the blackness 50% of central authorities.By formula f=n × (h1+h2), calculate focus f size.
From above-mentioned measuring method, " sandwich " method measurement result, being vulnerable to the inhomogeneities of accelerator field of radiation, exposure time, the quality that develops photographic film, lamination and the distance of accelerator focus, personnel and the impact of many masters, objective factor such as visually misread, therefore measurement error is very big.
Summary of the invention
In view of this, the invention discloses a kind of device utilizing angle shifting method to measure electron linear accelerator focal spot size, also disclose a kind of measuring method utilizing said apparatus to measure.This device mode by transversal scanning, observes the change of detector numerical value, measures the distance that collimator moves, thus calculating the size of focal spot size.
An object of the present invention is achieved through the following technical solutions: a kind of device measuring electron linear accelerator focal spot size, including the collimator with the first collimating slit, the end of described first collimating slit arranges a detector, the angle of the first collimating slit and collimator is β, described collimator makes the principal ray that accelerator sends be passed through by collimating slit, in order to detector gathers incident photon;Described detector collection is by the ray photons of collimating slit and converts thereof into measurable signal, for measuring the intensity of ray.
Further, being additionally provided with the second collimating slit on described collimator, it is β that the end of the second collimating slit arranges the angle of a detector, the second collimating slit and collimator, described second collimating slit and the first collimating slit are symmetrical arranged, the axis of symmetry of two collimating slits and accelerator beam center superposition.
Further, described collimator is made by plumbous, tungsten or tungsten alloy.
Further, described first collimating slit and the second collimating slit are less than or equal to 0.2mm.
The two of the purpose of the present invention are to provide a kind of method utilizing said apparatus to measure electron linear accelerator focal spot size, comprise the following steps:
Step one: place collimator at accelerator focus dead ahead;
Step 2: mobile collimator and detector, it was observed that when detector numerical value changes suddenly, the position of now collimator is designated as 2;
Step 3: continue to move to collimator and detector at same direction, it was observed that when detector numerical value changes suddenly, now accurate
The position of straight device is designated as position 3;
Step 4: measure the distance S between position 2 and the position 3 of collimator23, and the angle β of collimating slit and collimator;
Step 5: by formula f=tan β × S23The size of computation accelerator focus.
Further, described collimator is made by plumbous, tungsten or tungsten alloy.
Further, described collimating slit is less than or equal to 0.2mm.
Advantageous Effects:
1. the present invention need not use light reaching the film, reduces film unmanageable error in the step such as exposing, develop a film so that measurement result is more accurate.
2. the present invention mode by transversal scanning, observes the change of detector numerical value, measures the distance that collimator moves, thus calculating the size of focal spot size.
3. avoid the inhomogeneities of accelerator field of radiation, lamination and the distance of accelerator focus, personnel in " sandwich " method and the impact of many masters, objective factor such as visually misread.
Accompanying drawing explanation
In order to make the object, technical solutions and advantages of the present invention clearly, below in conjunction with accompanying drawing, the present invention is described in further detail, wherein:
Fig. 1 is the measuring principle figure measuring electron linear accelerator focal spot size;
Fig. 2 is the counting diagram of detector.
Detailed description of the invention
Below with reference to accompanying drawing, the preferred embodiments of the present invention are described in detail;Should be appreciated that preferred embodiment is only for illustrating the present invention, rather than in order to limit the scope of the invention.
A kind of device measuring electron linear accelerator focal spot size, including collimator 2, described collimator is with the first collimating slit 1, this collimating slit traverse collimator, the end of the first collimating slit arranges a detector 3, the angle of the first collimating slit and collimator is β, and described collimator makes the principal ray that accelerator sends be passed through by collimating slit, in order to detector gathers incident photon;Described detector collection is by the ray photons of collimating slit and converts thereof into measurable signal, for measuring the intensity of ray.
As the improvement to the present embodiment, described collimator is additionally provided with the second collimating slit 4, two collimating slits is set and can be further ensured that the accurate of measurement.
End at the second collimating slit arranges a detector, and the angle of the second collimating slit and collimator is β, and described second collimating slit and the first collimating slit are symmetrical arranged, the axis of symmetry of two collimating slits and accelerator beam center superposition.
Described first collimating slit and the second collimating slit are less than or equal to 0.2mm.Described collimator is made by plumbous, tungsten or tungsten alloy.
A kind of method utilizing said apparatus to measure electron linear accelerator focal spot size, comprises the following steps:
Step one: place collimator at accelerator focus dead ahead;
Step 2: mobile collimator and detector, it was observed that when detector numerical value changes suddenly, the position of now collimator is designated as 2;
Step 3: continue to move to collimator and detector at same direction, it was observed that when detector numerical value changes suddenly, now the position of collimator is designated as position 3;
Step 4: measure the distance S between position 2 and the position 3 of collimator23, and the angle β of collimating slit and collimator;
Step 5: by formula f=tan β × S23The size of computation accelerator focus.
The present invention need not use light reaching the film, reduces film unmanageable error in the step such as exposing, develop a film so that measurement result is more accurate.Owing to accelerator focal spot size is general all smaller, direct scanning survey can make scanning accuracy be difficult to control to, and error is big;The present invention mode by transversal scanning, observes the change of detector numerical value, measures the distance that collimator moves, thus calculating the size of focal spot size.Avoid the inhomogeneities of accelerator field of radiation, lamination and the distance of accelerator focus, personnel in " sandwich " method and the impact of many masters, objective factor such as visually misread.
The foregoing is only the preferred embodiments of the present invention, be not limited to the present invention, it is clear that the present invention can be carried out various change and modification without deviating from the spirit and scope of the present invention by those skilled in the art.So, if these amendments of the present invention and modification belong within the scope of the claims in the present invention and equivalent technologies thereof, then the present invention is also intended to comprise these change and modification.

Claims (3)

1. the method measuring electron linear accelerator focal spot size, the device measuring electron linear accelerator focal spot size used includes the collimator with the first collimating slit, the end of described first collimating slit arranges a detector, the angle of the first collimating slit and collimator is β, described collimator makes the principal ray that accelerator sends be passed through by collimating slit, in order to detector gathers incident photon;Described detector collection is by the ray photons of collimating slit and converts thereof into measurable signal, for measuring the intensity of ray, it is characterised in that: comprise the following steps:
Step one: place collimator at accelerator focus dead ahead;
Step 2: mobile collimator and detector, it was observed that when detector numerical value changes suddenly, the position of now collimator is designated as 2;
Step 3: continue to move to collimator and detector at same direction, it was observed that when detector numerical value changes suddenly, now the position of collimator is designated as position 3;
Step 4: measure the distance S between position 2 and the position 3 of collimator23, and the angle β of the first collimating slit and collimator;
Step 5: by formula f=tan β × S23The size of computation accelerator focus.
2. a kind of method measuring electron linear accelerator focal spot size according to claim 1, it is characterised in that: described collimator is made by plumbous, tungsten or tungsten alloy.
3. a kind of method measuring electron linear accelerator focal spot size according to claim 2, it is characterised in that: described first collimating slit is less than or equal to 0.2mm.
CN201310488864.8A 2013-10-17 2013-10-17 A kind of device and method measuring electron linear accelerator focal spot size Active CN103528547B (en)

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JPS59218907A (en) * 1983-05-27 1984-12-10 Jeol Ltd Measuring method by electronic beam
EP2051633A2 (en) * 2006-08-09 2009-04-29 Koninklijke Philips Electronics N.V. Focal spot size measurement with a movable edge located in a beam-shaping device
SE532723C2 (en) * 2007-05-03 2010-03-23 Lars Lantto Device for generating X-rays with great real focus and needs-adapted virtual focus
CN102901741B (en) * 2012-09-28 2015-07-15 貊梁 X-ray flying-spot scanning generator
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