CN103454581A - Contactor performance testing equipment - Google Patents

Contactor performance testing equipment Download PDF

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Publication number
CN103454581A
CN103454581A CN2013103755691A CN201310375569A CN103454581A CN 103454581 A CN103454581 A CN 103454581A CN 2013103755691 A CN2013103755691 A CN 2013103755691A CN 201310375569 A CN201310375569 A CN 201310375569A CN 103454581 A CN103454581 A CN 103454581A
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CN
China
Prior art keywords
contactor
chip microcomputer
break
square wave
make
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN2013103755691A
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Chinese (zh)
Inventor
曹新忠
董超
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tianjin Santroll Electric Automobile Technology Co Ltd
Original Assignee
Tianjin Santroll Electric Automobile Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Tianjin Santroll Electric Automobile Technology Co Ltd filed Critical Tianjin Santroll Electric Automobile Technology Co Ltd
Priority to CN2013103755691A priority Critical patent/CN103454581A/en
Publication of CN103454581A publication Critical patent/CN103454581A/en
Pending legal-status Critical Current

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Abstract

The invention discloses contactor performance testing equipment. A first direct-current power supply, a first contactor contact and a second contactor contact form a serial loop. A second direct-current power supply carries out outputting in two ways to a sensing coil of a first contactor and a sensing coil of a second contactor respectively. A time relay outputs rectangular waves to a phase shifter which converts the input rectangular waves and outputs two ways of rectangular waves with phase difference, and the two ways of rectangular waves control connecting and cut-off states of current loops where the sensing coil of the first contactor and the sensing coil of the second contactor are placed respectively. A single chip microcomputer collects current and voltages parameters of the serial loop where the first contactor contact and the second contactor contact are placed. According to the contactor performance testing equipment, the shortcomings in the prior art are overcome, connecting and disconnecting of the double-contact serial loop are controlled through double ways, and meanwhile detecting control is carried out through the single chip microcomputer, and accordingly automatic testing is achieved, and testing result accuracy is improved.

Description

A kind of contactor performance test apparatus
Technical field
The invention belongs to the electron device testing field, be specifically related to a kind of equipment that is applicable to the contactor performance test.
Background technology:
For the performance test of contactor, main contents are break-make number of times under contactor " the charged disconnection of charged adhesive ", " the not charged disconnection of charged adhesive ", " the charged disconnection of not charged adhesive " above three kinds of duties.Traditional contactor testing apparatus can only meet a certain of above Detection of content, meet three kinds of test items if think simultaneously, need to adopt three kinds of different checkout equipments, and traditional contactor checkout equipment need artificially be added up for data and the result of contactor test, if equipment operation outage midway, can only estimate, cause number of times inaccurate, and in process of the test, if contactor produces adhesion, also often can not find in time have and have the risk of damaging power supply, therefore need to have the special messenger to keep an eye on.
Summary of the invention:
The objective of the invention is to overcome deficiency of the prior art, provide a kind of and control two contactor series loops by the two-way square wave, and detect control by single-chip microcomputer, thereby realize automatic test, many test items merge, and improve the contactor testing apparatus of the degree of accuracy of test result.Its technical scheme is:
Comprise the first direct supply, the second direct supply, the first contactor, the second contactor, the time relay, phase shifter, single-chip microcomputer.The contact of the contact of the first direct supply, the first contactor, the second contactor forms series loop; The second direct supply output two-way, export respectively the inductive coil of the first contactor, the inductive coil of the second contactor to; Time relay output square wave is to phase shifter, phase shifter transforms and is output as by the square wave of input the square wave that two-way has phase differential, and the two-way square wave is controlled respectively conducting and the cut-off state of the inductive coil place current return of the first contactor and the second contactor; Single-chip microcomputer gathers electric current and the voltage parameter of series loop at the place, contact of the first contactor and the second contactor.
The low-power direct supply that the first direct supply is high-power battery, described the second direct supply.
The loop at the inductive coil place of the first contactor, the second contactor is in series with the first transistor, transistor seconds separately, the square-wave signal of phase shifter exports the transistorized input utmost point to, base stage as grid or the triode of mosfet transistor, control transistorized break-make, further control the break-make in loop, place, the other the two poles of the earth of transistor, thereby control the break-make of the first contactor, the second contactor.
The low and high level of square wave of controlling the first contactor or the second contactor is every through a rising edge or negative edge, the on off operating mode of this contactor produces switching simultaneously, phase shifter guarantees that through phase shift the on off operating mode of two contactors can not change simultaneously by the square wave of time relay input, each contactor its inductive coil the square wave of process complete the conversion of break-make under controlling.
Single-chip microcomputer, by exporting the 3rd transistorized input utmost point to, is controlled the 3rd transistorized break-make, and the 3rd transistorized other the two poles of the earth and AC power and time relay formation series loop, the power supply state of single-chip microcomputer and then control time relay.
Single-chip microcomputer has the AD translation function, can carry out the conversion between digital signal and simulating signal.
Single-chip microcomputer exports display module and alarm module to, single-chip microcomputer is processed computing by voltage and the loop current signals at the contactor two ends that collect, detect in real time the first contactor and the second contactor on off operating mode, cumulative break-make number of times, and be presented on display module, when abnormal, by alarm module, carry out warning when the first contactor and the second contactor break-make.
Than traditional contactor testing apparatus, the present invention has significant advantage and beneficial effect, is embodied as:
(1) adopt a contactor to be measured and the series connection of test auxiliary contactor, and the square wave that has phase differential by two-way is controlled respectively two contactors, the break-make of test auxiliary contactor can control contactor to be measured inhale and and electriferous state while disconnecting, thereby make a contactor testing apparatus can complete the detection of three test items of " the charged disconnection of charged adhesive ", " the not charged disconnection of charged adhesive " to contactor to be measured, " the charged disconnection of not charged adhesive ".
(2) there is the warning function of contactor test failure, but and when fault automatic cut-off power, realize automatic test, and the test reliability.
(3) record test number (TN) by single-chip microcomputer, can there is the memory function of powering on, make test number (TN) more accurate.
(4) by setting the phase differential of two-way square wave, realize that electrifying timing sequence is optional, as required, can carry out the test event of contactor to be measured " the charged disconnection of charged adhesive ", " the not charged disconnection of charged adhesive ", " the charged disconnection of not charged adhesive ".
The accompanying drawing explanation
Fig. 1 is the structural drawing of contactor testing apparatus of the present invention;
Embodiment
Narrate the specific embodiment of the present invention below in conjunction with accompanying drawing; below in conjunction with accompanying drawing, the embodiment of the present invention is further described; below just exemplary about the description of embodiments of the present invention; the claimed theme be not meant to limit the present invention; the variation of other that also exist for embodiment described in the invention in the claim protection domain, all belong to the theme that will protect required for the present invention.
As shown in Figure 1,1 is the first direct supply, and 2 is the second direct supply, and 3 is the time relay, and 4 is phase shifter, 5 is single-chip microcomputer, and 6 is display module, and 7 is alarm module, and D1 is the first contactor, D2 is the second contactor, and T1 is the first transistor, and T2 is transistor seconds, and T3 is the 3rd transistor.
As shown in Figure 1, the low-power direct supply that the first direct supply (1) is high-power battery, described the second direct supply (2), the contact of the contact of the first direct supply (1), the first contactor D1, the second contactor D2 forms series loop; The second direct supply (2) output two-way, export respectively the inductive coil of the first contactor D1, the inductive coil of the second contactor D2 to; The time relay (3) output square wave is to phase shifter (4), it is identical but have the square wave of phase differential that phase shifter (4) transforms and be output as the two-way waveform by the square wave of input, and the two-way square wave is controlled respectively conducting and the cut-off state of the inductive coil place current return of the first contactor D1 and the second contactor D2.
The first contactor D1, the loop at the inductive coil place of the second contactor D2 is in series with the first transistor T1 separately, transistor seconds T2, the two-way square-wave signal of phase shifter output (4) mentioned above exports respectively the input utmost point of the first transistor T1 and transistor seconds T2 to, base stage as grid or the triode of mosfet transistor, control transistorized break-make, further control the break-make in loop, place, the other the two poles of the earth of transistor, the i.e. loop at the first contactor D1 and the second contactor D2 inductive coil place separately, thereby control the first contactor D1, the break-make of the second contactor D2.The first transistor D1 in the present embodiment and transistor seconds D2 are mosfet transistor, be the grid that the two-way square-wave signal of phase shifter (4) output exports respectively the first transistor T1 and transistor seconds T2 to, further control the break-make in transistorized source electrode and drain electrode loop, place.
Single-chip microcomputer (5) also gathers the current signal of place, the contact series loop of the voltage signal at two ends of contact of the first contactor D1 and the second contactor D2 and two contactors, in the present embodiment, A place and the B place terminal voltage at the two ends of the first contactor D1 that single-chip microcomputer gathers and the contact of the second contactor D2, and the C in this series loop goes out an electric current.The mode that gathers electric current is by the Hall current sensor collection, the mode that gathers voltage is that single-chip microcomputer is connected directly to the voltage acquisition point and is gathered, single-chip microcomputer (5) has the AD translation function, can carry out the conversion between digital signal and simulating signal, the simulating signal of the voltage and current that collects can be converted into to digital signal, and then calculate the electric potential difference at two ends of contact of two contactors and the electric current in loop, device place, and then draw conducting and the cut-off state in the first contactor D1 and the second loop, contactor D2 place.Single-chip microcomputer (5) is by exporting the input utmost point of the 3rd transistor T 3 to, base stage as grid or the triode of mosfet transistor, control the break-make of the 3rd transistor T 3, and other the two poles of the earth of the 3rd transistor T 3 and AC power and the time relay form series loop, the power supply state of single-chip microcomputer (5) and then control time relay 3, the time relay (3) is not if export square wave the first contactor D1 and the second not adhesive of contactor D2, thereby realizes the control of single-chip microcomputer (5) to the opening and closing of this contactor testing apparatus.The 3rd transistor T 3 in the present embodiment is triode, and single-chip microcomputer (5), by exporting the base stage of this triode to, is controlled the break-make in the loop, collector and emitter place of this triode.
The first contactor D1 and the second contactor D2 in this testing apparatus one be contactor to be measured, another is the subtest contactor, establishing the first contactor D1 in Fig. 1 is contactor to be measured, the second contactor D2 is the subtest contactor.If the sequence of states of the first contactor D1 and the second contactor D2 is (take two contactors as original state): the second contactor D1 adhesive, the first contactor D2 adhesive, the first contactor D1 disconnect, the second contactor D2 disconnects, and the test that contactor to be measured completes " the charged disconnection of charged adhesive " once; If the sequence of states of the first contactor D1 and the second contactor D2 is (take two contactors as original state): the second contactor D2 adhesive, the first contactor D1 adhesive, the second contactor D2 disconnect, the first contactor D1 disconnects, and the test that contactor to be measured completes " the not charged disconnection of charged adhesive " once; If the sequence of states of the first contactor D1 and the second contactor D2 is (take two contactors as original state): the first contactor D1 adhesive, the second contactor D2 adhesive, the second contactor D2 disconnect, the first contactor D1 disconnects, and the test that contactor to be measured completes " the not charged disconnection of not charged adhesive " once.The first contactor D1 is the subtest contactor, and when the second contactor D2 is contactor to be measured, test process in like manner.
The low and high level of square wave of controlling the first contactor D1 or the second contactor D2 is every through a rising edge or negative edge, the on off operating mode of this contactor produces switching simultaneously, phase shifter (4) guarantees that through phase shift the on off operating mode of two contactors can not change simultaneously by the square wave of the time relay (3) input, each contactor its inductive coil the square wave of process complete the conversion of break-make under controlling.This contactor testing apparatus is by number of times or the number of times of " the not charged disconnection of charged adhesive " or the break-make performance that draws contactor to be measured of " the charged disconnection of not charged adhesive " of " the charged disconnection of charged adhesive " testing contactor to be measured and can carry out.
Single-chip microcomputer (5) is connected to display module (6) and alarm module (7), voltage and the loop current signals at the two ends of the contact of two contactors that single-chip microcomputer (5) will collect are processed computing, detect in real time the electric potential difference between the first contactor D1 and the second contactor D2 place loop on off operating mode and two contactors, path of the every formation in loop, single-chip microcomputer record test numeral accumulates once and is stored, number of times is presented on display module (6) simultaneously, current test is specially " the not charged disconnection of charged adhesive ", " the charged disconnection of charged adhesive ", which of " the not charged disconnection of not charged adhesive " is pre-set by the time relay.Potential difference after the time through square wave period of change certain multiple (as 15 cycles) between constant or two contactors of loop on off operating mode is constant, mean that the first contactor D1 or the second contactor D2 break-make are abnormal, single-chip microcomputer (5) is carried out and is reported to the police by alarm module (7), single-chip microcomputer (5) is controlled the 3rd transistor T 3 cut-offs simultaneously, make to form and open circuit between the time relay (3) and AC power, and then break time relay power supply, thereby the contact of at least one in the first contactor D1 and the second contactor D2 is disconnected, place, the contact loop open circuit of two contactors, and then holding circuit.
Embodiments of the invention are example embodiment of the present invention; should be understood to is certain demonstrative example wherein in the protection domain of claims of the present invention; there is the directiveness effect that those skilled in the art is realized to corresponding technical scheme, but not limitation of the invention.

Claims (7)

1. a contact performance testing apparatus, it is characterized in that: comprising: the first direct supply, the second direct supply, the first contactor, the second contactor, the time relay, phase shifter, single-chip microcomputer is characterized in that: the contact of described the first direct supply, the first contactor, the contact of the second contactor form series loop; The second direct supply output two-way, export respectively the inductive coil of the first contactor, the inductive coil of the second contactor to; Time relay output square wave is to phase shifter, phase shifter transforms and is output as by the square wave of input the square wave that two-way has phase differential, and the two-way square wave is controlled respectively conducting and the cut-off state of the inductive coil place current return of the first contactor and the second contactor; Single-chip microcomputer gathers electric current and the voltage parameter of series loop at the place, contact of the first contactor and the second contactor.
2. contactor performance test apparatus according to claim 1, is characterized in that: the low-power direct supply that described the first direct supply is high-power battery, described the second direct supply.
3. contactor performance test apparatus according to claim 1, it is characterized in that: the loop at the inductive coil place of described the first contactor, the second contactor is in series with the first transistor, transistor seconds separately, the square-wave signal of phase shifter exports the transistorized input utmost point to, base stage as grid or the triode of mosfet transistor, control transistorized break-make, further control the break-make in loop, place, the other the two poles of the earth of transistor, thereby control the break-make of the first contactor, the second contactor.
4. according to claim 1 or contactor performance test apparatus claimed in claim 3, it is characterized in that: the low and high level of the square wave of described control the first contactor or the second contactor is every through a rising edge or negative edge, the on off operating mode of this contactor produces switching simultaneously, phase shifter guarantees that through phase shift the on off operating mode of two contactors can not change simultaneously by the square wave of time relay input, each contactor its inductive coil the square wave of process complete the conversion of break-make under controlling.
5. contactor performance test apparatus according to claim 1, it is characterized in that: single-chip microcomputer is by exporting the 3rd transistorized input utmost point to, control the 3rd transistorized break-make, and the 3rd transistorized other the two poles of the earth and AC power and the time relay form series loop, the power supply state of single-chip microcomputer and then control time relay.
6. according to claim 1 or contactor performance test apparatus claimed in claim 5, it is characterized in that: described single-chip microcomputer has the AD translation function, can carry out the conversion between digital signal and simulating signal.
7. contactor performance test apparatus according to claim 1, it is characterized in that: described single-chip microcomputer exports display module and alarm module to, single-chip microcomputer is processed computing by voltage and the loop current signals at the contactor two ends that collect, detect in real time the first contactor and the second contactor on off operating mode, cumulative break-make number of times, and be presented on display module, when abnormal, by alarm module, carry out warning when the first contactor and the second contactor break-make.
CN2013103755691A 2013-08-26 2013-08-26 Contactor performance testing equipment Pending CN103454581A (en)

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Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104237782A (en) * 2014-09-22 2014-12-24 力帆实业(集团)股份有限公司 Starting relay durability system with safety protection and fault reminding functions and test method
CN106199409A (en) * 2016-06-28 2016-12-07 苏州汇川技术有限公司 High voltage electric equipment catalyst adhesion detecting system and method
CN107015139A (en) * 2016-01-20 2017-08-04 法拉第未来公司 Detection using AC coupled to welding contactor
CN107479453A (en) * 2017-09-30 2017-12-15 四川长虹电器股份有限公司 Control system that is a kind of while controlling two contactors
CN111693854A (en) * 2020-06-24 2020-09-22 贵州天义电器有限责任公司 Circuit for simulating voltage drop and operation method thereof

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CN201845199U (en) * 2010-10-21 2011-05-25 南京德朔实业有限公司 Switching sequence detection circuit
CN202210140U (en) * 2011-06-08 2012-05-02 河北工业大学 Experimental device for life of alternating current contactor
CN103176081A (en) * 2013-03-01 2013-06-26 上海华欣民福电气科技有限公司 Vacuum contactor comprehensive performance test board and test method of vacuum contactor comprehensive performance

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Publication number Priority date Publication date Assignee Title
JPH09211089A (en) * 1996-01-30 1997-08-15 Mitsubishi Electric Corp Circuit breaker and testing device thereof
US20050012505A1 (en) * 2003-07-15 2005-01-20 Carrier Corporation Control of relay opening events
CN102047368A (en) * 2008-05-30 2011-05-04 矢崎总业株式会社 Relay controller
CN201845199U (en) * 2010-10-21 2011-05-25 南京德朔实业有限公司 Switching sequence detection circuit
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Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104237782A (en) * 2014-09-22 2014-12-24 力帆实业(集团)股份有限公司 Starting relay durability system with safety protection and fault reminding functions and test method
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CN107015139A (en) * 2016-01-20 2017-08-04 法拉第未来公司 Detection using AC coupled to welding contactor
CN107015139B (en) * 2016-01-20 2019-10-15 法拉第未来公司 Detection using AC coupled to welding contactor
CN106199409A (en) * 2016-06-28 2016-12-07 苏州汇川技术有限公司 High voltage electric equipment catalyst adhesion detecting system and method
CN106199409B (en) * 2016-06-28 2019-05-31 苏州汇川技术有限公司 High voltage electric equipment contactor adhesion detection system and method
CN107479453A (en) * 2017-09-30 2017-12-15 四川长虹电器股份有限公司 Control system that is a kind of while controlling two contactors
CN111693854A (en) * 2020-06-24 2020-09-22 贵州天义电器有限责任公司 Circuit for simulating voltage drop and operation method thereof

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Application publication date: 20131218