CN103424601A - Voltage detecting circuit - Google Patents
Voltage detecting circuit Download PDFInfo
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- CN103424601A CN103424601A CN2013103666306A CN201310366630A CN103424601A CN 103424601 A CN103424601 A CN 103424601A CN 2013103666306 A CN2013103666306 A CN 2013103666306A CN 201310366630 A CN201310366630 A CN 201310366630A CN 103424601 A CN103424601 A CN 103424601A
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Abstract
The invention provides a voltage detecting circuit which comprises a voltage division circuit, an isolating circuit, a comparison voltage generation circuit and a comparison circuit. A sample voltage signal after power supply voltage division is transmitted to the comparison voltage generation circuit through the isolating circuit, and two comparison voltage signals are generated in the comparison voltage generation circuit and are compared by the comparison circuit to output a logic signal, so that power supply voltage is detected. In the voltage detecting circuit, a reference voltage generation circuit does not need to be additionally added, the voltage detecting circuit is simple in structure and overcomes the shortcoming that a traditional voltage detecting circuit is affected by factors such as accuracy of reference voltage provided by the outside world and the matching degree of ratios of divider resistors, and a trip point of the comparison circuit of the voltage detecting circuit cannot be affected by current and temperature in the divider resistors and is only related to the power supply voltage, so that detecting accuracy of the voltage detecting circuit is improved.
Description
Technical field
The present invention relates to integrated circuit fields, particularly a kind of voltage detecting circuit.
Background technology
In integrated circuit (IC) system, when the supply voltage of introducing from chip exterior is not enough, can cause chip to work normally.Therefore, generally meeting detect supply voltage and export corresponding logical signal at a voltage detecting circuit of chip internal increase and make chip enter corresponding state, to ensure chip, works normally.
Voltage detecting circuit of the prior art is all generally to utilize comparator circuit directly supply voltage to be compared with reference voltage, thereby show that corresponding logical signal realizes that the detection of voltage makes system enter corresponding state.
Please refer to Fig. 1, it is existing a kind of voltage detecting circuit, in bleeder circuit 102, supply voltage VDD is through resistance R 1, the R2 dividing potential drop, voltage sampling signal VIN after dividing potential drop is sent to the in-phase input end of comparer 103, and the reference voltage V REF that reference voltage generating circuit 101 produces is sent to the inverting input of comparer 103, then compare VIN and VREF and output logic signal by comparer 103, export control signal MRK by latch 104 afterwards, thereby realize the detection to supply voltage.
Voltage detecting circuit as above, the precision that the precision of the reference voltage detected value that the ratio of divider resistance R1, R2 and reference voltage generating circuit produce detects voltage detecting circuit all has a great impact.Make this voltage detecting circuit there is high accuracy of detection, reference voltage with high accurancy and precision and the divider resistance ratio of high accurancy and precision need to be provided.Yet, even reach under sufficiently high precision conditions at reference voltage, the ratio of divider resistance is owing to being subject to technique, thereby the mistake that the impact of the factors such as environment temperature causes coupling also can have influence on the precision of testing circuit.Therefore, how solving not high this deficiency of detection precision of voltage detecting circuit, is that those skilled in the art have problem to be solved now.
Summary of the invention
The object of the present invention is to provide a kind of voltage detecting circuit, to solve voltage detecting circuit in prior art, be subject to the external world that the impact of the matching degree of the precision of reference voltage and divider resistance ratio is provided, cause the not high problem of precision detected when detecting supply voltage.
For solving the problems of the technologies described above, the invention provides a kind of voltage detecting circuit, described voltage detecting circuit comprises: the bleeder circuit connected successively, buffer circuit, comparative voltage produce circuit and comparator circuit;
Described bleeder circuit, obtain for supply voltage being carried out to dividing potential drop the sample voltage that characterizes supply voltage;
Described buffer circuit, for receiving the mirror image voltage of described sample voltage generation one and described sample voltage equivalence, and the described comparative voltage of current direction of simultaneously isolating in described bleeder circuit produces circuit;
Described comparative voltage produces circuit, for receiving described mirror image voltage, and produces the first voltage and second voltage as two comparative voltages;
Described comparator circuit, for receiving two comparative voltages of described the first voltage and second voltage, and produce a logical signal.
Optionally, in described voltage detecting circuit, described bleeder circuit comprises the first resistance and the second resistance, and described the first resistance and the second resistance are connected in series between supply voltage and ground, and the voltage of described the first resistance and the second resistance connecting place is described sample voltage.
Optionally, in described voltage detecting circuit, described buffer circuit is an operational amplifier, its in-phase input end is connected with the second resistance connecting place with described the first resistance, for receiving described sample voltage, output terminal is connected to the inverting input of described operational amplifier, and the voltage of described operational amplifier output terminal is described mirror image voltage.
Optionally, in described voltage detecting circuit, described comparative voltage produces circuit and consists of the first branch road and the second branch circuit parallel connection, and two branch circuit parallel connection node one ends are connected with described buffer circuit output terminal, other end ground connection.
Optionally, in described voltage detecting circuit, described the first branch road comprises: one the 3rd resistance and one first triode, wherein, one end of described the 3rd resistance is connected with the collector of described the first triode, and the other end is connected with the output terminal of described operational amplifier, and the base stage of described the first triode is connected with its collector, emitter is connected to ground, and the voltage at described the 3rd resistance and described the first triode connected node place is described the first voltage;
Described the second branch road comprises: one the 4th resistance, one the 5th resistance and one second triode, wherein, one end of described the 4th resistance is connected with the output terminal of described operational amplifier, the other end is connected with an end of described the 5th resistance, the other end of described the 5th resistance is connected with the collector of described the second triode, the base stage of described the second triode is connected with its collector, and emitter is connected to ground, and the voltage at described the 4th resistance and described the 5th resistance connected node place is described second voltage.
Optionally, in described voltage detecting circuit, described the first triode and the second triode are all NPN type triode.
Optionally, in described voltage detecting circuit, the emitter area of described the second triode is greater than the emitter area of described the first triode.
Optionally, in described voltage detecting circuit, described comparator circuit is a comparer, the in-phase input end of described comparer is connected with the junction of the first triode with the 3rd resistance in described the first branch road, for receiving described the first voltage, the inverting input of described comparer is connected with the 5th resistance joint with the 4th resistance in described the second branch road, for receiving described second voltage.
Optionally, in described voltage detecting circuit, also comprise a phase inverter, described phase inverter is connected with the output terminal of described comparer, the logical signal produced for accepting comparer, and produce a under-voltage locking signal.
Optionally, in described voltage detecting circuit, described phase inverter is schmitt inverter.
Voltage detecting circuit provided by the present invention, be transferred to comparative voltage by the sample voltage signal by after the supply voltage dividing potential drop through a buffer circuit and produce circuit, and produce in circuit and produce two comparative voltage signals at comparative voltage, export a logical signal by two voltage comparison signals of a comparator circuit comparison again, thereby realized the detection to supply voltage.In voltage detecting circuit of the present invention, without the extra reference voltage generating circuit that adds, simple in structure, and the trip point of its comparator circuit is not subject to electric current in divider resistance and the impact of temperature, only relevant with supply voltage, overcome the conventional voltage testing circuit and be subject to the external world that the impact of the matching degree factor of reference voltage precision and divider resistance ratio is provided, thereby improved the precision that voltage detecting circuit detects.In addition, this circuit also can be realized the detection to different voltages by the ratio of adjusting two divider resistances, is easy to be applied in different circuit.
The accompanying drawing explanation
Fig. 1 is the structural representation of existing voltage detecting circuit;
Fig. 2 is the schematic diagram of the voltage detecting circuit of preferred embodiment of the present invention
Embodiment
Voltage detecting circuit the present invention proposed below in conjunction with the drawings and specific embodiments is described in further detail.According to the following describes and claims, advantages and features of the invention will be clearer.It should be noted that, accompanying drawing all adopts very the form of simplifying and all uses non-ratio accurately, only in order to convenient, the purpose of the aid illustration embodiment of the present invention lucidly.
The present invention is a kind of voltage detecting circuit, be transferred to comparative voltage by the sample voltage signal by after the supply voltage dividing potential drop through a buffer circuit and produce circuit, and produce in circuit and produce two comparative voltage signals at comparative voltage, export a logical signal by two voltage comparison signals of a comparator circuit comparison again, thereby realized the detection to supply voltage.The voltage detecting circuit that the present invention is designed, without the extra reference voltage generating circuit that adds, simple in structure, and the trip point of its comparator circuit is not subject to electric current in divider resistance and the impact of temperature, only relevant with supply voltage, overcome the conventional voltage testing circuit and be subject to the external world that the impact of the matching degree factor of reference voltage precision and divider resistance ratio is provided, and then solved the not high shortcoming of precision that voltage detecting circuit detects.
Below in conjunction with accompanying drawing and preferred embodiment, the invention will be further described.
Please refer to Fig. 2, the structural representation of its voltage detecting circuit that is preferred embodiment of the present invention.As shown in Figure 2, described voltage detecting circuit comprises: the bleeder circuit 20 connected successively, buffer circuit 21, comparative voltage produce circuit 22 and comparator circuit 23.
Described bleeder circuit 20 is comprised of the first resistance R a and the second resistance R b, for supply voltage VDD being obtained to the sample voltage that characterizes supply voltage.Wherein, described the first resistance R a and the second resistance R b are connected in series between supply voltage VDD and ground, and supply voltage VDD is carried out to dividing potential drop, output one supply voltage sample voltage V1 after dividing potential drop.
Described buffer circuit 21 is comprised of an operational amplifier OP1, for receiving the mirror image voltage V2 of described sample voltage V1 generation one and described sample voltage V1 equivalence, and the described comparative voltage of current direction of simultaneously isolating in described bleeder circuit 20 produces circuit 22.Wherein, described operational amplifier OP1 in-phase input end is connected with the second resistance R b junction with the first resistance R a described in described bleeder circuit 20, for receiving described sample voltage V1, the output terminal of operational amplifier OP1 is connected to the inverting input of operational amplifier OP1, and the voltage of operational amplifier output terminal is described mirror image voltage V2.
Described comparative voltage produces circuit 22 and consists of the first branch road and the second branch circuit parallel connection, for receiving described mirror image voltage V2, and produces the first voltage Va and second voltage Vb as two comparative voltages.Wherein, two branch circuit parallel connection node one ends are connected with described buffer circuit 21 output terminals, for receiving described mirror image voltage V2, other end ground connection.Described the first branch road comprises: the 3rd resistance R 1 and the first triode Q1, wherein, one end of described the 3rd resistance R 1 is connected with its collector with the base stage of described the first triode Q1, emitter is connected to ground, and described the 3rd resistance R 1 is described the first voltage Va with the voltage that described the first triode connected node place produces; Described second circuit comprises: the 4th resistance R 2, the 5th resistance R 3 and the second triode Q2, wherein, one end of described the 4th resistance R 2 is connected with the output terminal of described operational amplifier OP1, the other end is connected with described the 5th resistance R 3, the other end of described the 5th resistance R 3 is connected with the collector of described the second triode Q2, the base stage of described the second triode is connected with its collector, emitter is connected to ground, and described the 4th resistance R 2 is described second voltage Vb with the voltage that described the 5th resistance R 3 connected node places produce.Wherein, described the first triode Q1 and the second triode Q2 are NPN type triode, and the emitter area of the second triode Q2 is greater than the emitter area of the first triode Q1, preferably, the emitter area of described the second triode Q2 is 8:1 with the ratio of the emitter area of described the first triode Q1.
Described comparator circuit 23 is comprised of a comparator C MP1, for receiving described the first voltage Va and two comparative voltages of second voltage Vb, and produces a logical signal.Wherein, the in-phase input end of described comparator C MP1 is connected with the junction of the first triode Q1 with the 3rd resistance R 1 in described the first branch road, for receiving described the first voltage Va, the inverting input of described comparator C MP1 is connected with the 5th resistance R 3 junctions with the 4th resistance R 2 in described the second branch road, for receiving described second voltage Vb.Produce a logical signal through described comparator C MP1, according to this logical signal, can judge the described state of supply voltage, thereby realized the testing goal to supply voltage.
In order to produce a under-voltage locking signal UVLO, the voltage detecting circuit of the present embodiment also comprises a phase inverter.In order to export, under-voltage locking signal UVLO is to prevent false triggering more accurately, and described phase inverter is preferably schmitt inverter ST1.Described schmitt inverter ST1 is connected to receive described logical signal with the output terminal of comparator C MP1 and produces a under-voltage locking signal UVLO.Can judge according to described under-voltage locking signal UVLO whether supply voltage reaches the threshold voltage that makes the chip normal operation.
At this, described voltage detecting circuit is realized the principle of voltage detecting: when Va=Vb,
Now, VBE1=VBE2+IbR3 (2)
Wherein, Vbe1, Vbe2 are respectively the first triode Q1, the second triode Q2 basis set and emitter both end voltage.
By formula (2), obtained:
Wherein,
K is Boltzmann constant, and q is electron charge, and T is absolute temperature, and n is the second triode Q2 and the ratio of the first triode Q1 emitter area, gets n=8:1 herein.
In conjunction with formula (1), (2), (3), obtain:
Now,
Because comparative voltage produces the base stage of the first triode Q1 in circuit 22 and the second triode Q2 and emitter voltage VBE1 and VBE2, it is all negative temperature coefficient, because both emitter area are more definite than, VBE1-VBE2 is positive temperature coefficient (PTC) voltage this moment, can guarantee that by the value that the 4th resistance R 2, the 5th resistance R 3 suitably are set formula (5) right-hand member presents zero-temperature coefficient voltage, be defined as Vbg, thereby the trip point that can guarantee comparator C MP1 is not subject to the impact of temperature, this state of Va=Vb not Yin Wendu variation and change.
Now,
Therefore, when
The time, during Va=Vb, comparator C MP1 is in trip point generation saltus step, and saltus step occurs in the under-voltage locking signal UVLO of output, can obtain thus
Can be used as the threshold voltage of chip power supply power supply.
Described operational amplifier OP1 has higher input impedance, can stop in bleeder circuit 20 the current direction comparative voltage that flows through the first resistance R a and the second resistance R b to produce circuit 22, avoided making this state of Va=Vb to change with the variation of the electric current in the first resistance R a and the second resistance R b, therefore, the change that has guaranteed this state of Va=Vb is only relevant with the variation of supply voltage VDD, makes this voltage detecting circuit have very high precision.
Work as supply voltage
The time, corresponding Va>Vb, output under-voltage locking signal UVLO is 1, shows that supply voltage is lower than the threshold voltage that makes the chip normal operation, chip quits work;
Work as supply voltage
The time, corresponding Va>Vb, output under-voltage locking signal UVLO is 0, shows that supply voltage reaches the threshold voltage that makes the chip normal operation, the chip normal operation.
Therefore can pass through the residing state of under-voltage locking signal UVLO, just can know that whether supply voltage VDD now now reaches the threshold voltage value that makes the chip normal operation, has realized the testing goal to supply voltage.
To sum up, voltage detecting circuit provided by the invention, be transferred to comparative voltage by the sample voltage signal by after the supply voltage dividing potential drop through a buffer circuit and produce circuit, and produce in circuit and produce two comparative voltage signals at comparative voltage, export a logical signal by two voltage comparison signals of a comparator circuit comparison again, finally produce the under-voltage locking signal, thereby realized the detection to supply voltage.In voltage detecting circuit of the present invention, without the extra reference voltage generating circuit that adds, simple in structure, and the trip point of its comparator circuit is not subject to electric current in divider resistance and the impact of temperature, only relevant with supply voltage, overcome the conventional voltage testing circuit and be subject to the external world that the impact of the matching degree factor of reference voltage precision and divider resistance ratio is provided, thereby improved the precision that voltage detecting circuit detects.
Foregoing description is only the description to preferred embodiment of the present invention, and not to any restriction of the scope of the invention, any change, modification that the those of ordinary skill in field of the present invention is done according to above-mentioned disclosure, all belong to the protection domain of claims.
Claims (10)
1. a voltage detecting circuit, is characterized in that, comprising: the bleeder circuit connected successively, buffer circuit, comparative voltage produce circuit and comparator circuit;
Described bleeder circuit, obtain for supply voltage being carried out to dividing potential drop the sample voltage that characterizes supply voltage;
Described buffer circuit, for receiving the mirror image voltage of described sample voltage generation one and described sample voltage equivalence, and the described comparative voltage of current direction of simultaneously isolating in described bleeder circuit produces circuit;
Described comparative voltage produces circuit, for receiving described mirror image voltage, and produces the first voltage and second voltage as two comparative voltages;
Described comparator circuit, for receiving two comparative voltages of described the first voltage and second voltage, and produce a logical signal.
2. voltage detecting circuit as claimed in claim 1, it is characterized in that, described bleeder circuit comprises the first resistance and the second resistance, and described the first resistance and the second resistance are connected in series between supply voltage and ground, and the voltage of described the first resistance and the second resistance connecting place is described sample voltage.
3. voltage detecting circuit as claimed in claim 1, it is characterized in that, described buffer circuit is an operational amplifier, its in-phase input end is connected with the second resistance connecting place with described the first resistance, for receiving described sample voltage, output terminal is connected to the inverting input of described operational amplifier, and the voltage of described operational amplifier output terminal is described mirror image voltage.
4. voltage detecting circuit as claimed in claim 1, is characterized in that, described comparative voltage produces circuit and consists of the first branch road and the second branch circuit parallel connection, and two branch circuit parallel connection node one ends are connected with described buffer circuit output terminal, other end ground connection.
5. voltage detecting circuit as claimed in claim 4, it is characterized in that, described the first branch road comprises: one the 3rd resistance and one first triode, wherein, one end of described the 3rd resistance is connected with the collector of described the first triode, and the other end is connected with the output terminal of described operational amplifier, and the base stage of described the first triode is connected with its collector, emitter is connected to ground, and the voltage at described the 3rd resistance and described the first triode connected node place is described the first voltage;
Described the second branch road comprises: one the 4th resistance, one the 5th resistance and one second triode, wherein, one end of described the 4th resistance is connected with the output terminal of described operational amplifier, the other end is connected with an end of described the 5th resistance, the other end of described the 5th resistance is connected with the collector of described the second triode, the base stage of described the second triode is connected with its collector, and emitter is connected to ground, and the voltage at described the 4th resistance and described the 5th resistance connected node place is described second voltage.
6. voltage detecting circuit as claimed in claim 5, is characterized in that, described the first triode and the second triode are all NPN type triode.
7. voltage detecting circuit as claimed in claim 5, is characterized in that, the emitter area of described the second triode is greater than the emitter area of described the first triode.
8. voltage detecting circuit as claimed in claim 7, it is characterized in that, described comparator circuit is a comparer, the in-phase input end of described comparer is connected with the junction of the first triode with the 3rd resistance in described the first branch road, for receiving described the first voltage, the inverting input of described comparer is connected with the 5th resistance joint with the 4th resistance in described the second branch road, for receiving described second voltage.
9. voltage detecting circuit as claimed in claim 8, is characterized in that, also comprises a phase inverter, and described phase inverter is connected with the output terminal of described comparer, the logical signal produced for accepting comparer, and produce a under-voltage locking signal.
10. voltage detecting circuit as claimed in claim 9, is characterized in that, described phase inverter is schmitt inverter.
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| CN106482850A (en) * | 2016-11-25 | 2017-03-08 | 北京兆芯电子科技有限公司 | Temperature-detecting device and temperature checking method |
| CN107894526A (en) * | 2017-11-10 | 2018-04-10 | 北京深思数盾科技股份有限公司 | A kind of battery voltage detector, method and information safety devices |
| CN108664073A (en) * | 2017-03-31 | 2018-10-16 | 中芯国际集成电路制造(上海)有限公司 | A kind of detection circuit |
| CN109245206A (en) * | 2018-09-17 | 2019-01-18 | 上海空间电源研究所 | A kind of high-voltage lithium ion battery group charging control signal generation circuit |
| CN110333457A (en) * | 2018-03-28 | 2019-10-15 | 上海汽车集团股份有限公司 | A kind of power battery voltage sample circuit, dynamical system and new-energy automobile |
| WO2021253704A1 (en) * | 2020-06-17 | 2021-12-23 | 苏州纳芯微电子股份有限公司 | Under-voltage protection circuit |
| CN113945856A (en) * | 2021-10-15 | 2022-01-18 | 成都思瑞浦微电子科技有限公司 | Power supply voltage UVLO detection circuit based on floating power supply domain |
| CN117849420A (en) * | 2024-03-08 | 2024-04-09 | 上海昇贻半导体科技有限公司 | Heavy current protection circuit in photoelectric TIA circuit |
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| CN117849420A (en) * | 2024-03-08 | 2024-04-09 | 上海昇贻半导体科技有限公司 | Heavy current protection circuit in photoelectric TIA circuit |
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