CN103411648A - Anti-interference probe box - Google Patents

Anti-interference probe box Download PDF

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Publication number
CN103411648A
CN103411648A CN2013103476513A CN201310347651A CN103411648A CN 103411648 A CN103411648 A CN 103411648A CN 2013103476513 A CN2013103476513 A CN 2013103476513A CN 201310347651 A CN201310347651 A CN 201310347651A CN 103411648 A CN103411648 A CN 103411648A
Authority
CN
China
Prior art keywords
probe
box body
interference
box
probes
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN2013103476513A
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Chinese (zh)
Inventor
许重瑾
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SUZHOU ZHENGBU MACHINE MANUFACTURING CO LTD
Original Assignee
SUZHOU ZHENGBU MACHINE MANUFACTURING CO LTD
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SUZHOU ZHENGBU MACHINE MANUFACTURING CO LTD filed Critical SUZHOU ZHENGBU MACHINE MANUFACTURING CO LTD
Priority to CN2013103476513A priority Critical patent/CN103411648A/en
Publication of CN103411648A publication Critical patent/CN103411648A/en
Pending legal-status Critical Current

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Abstract

The invention discloses an anti-interference probe box. The anti-interference probe box comprises a box body; the lower end of the box body is provided with a plurality of probes; the upper end of every probe is arranged in the box body; the lower end of every probe extends downward and out of the box body; a baffle is arranged between every two adjacent probes. According to the anti-interference probe box, every two adjacent probes are separated by the baffle, so that deposited impurities of the probe portions which extend out of the box body are also separated by the baffles so as to avoid the interference of the impurities and prevent the probes from feeding back wrong detecting information due to wrong connection.

Description

A kind of anti-interference probe box
Technical field
The present invention relates to a kind of probe box, particularly a kind of anti-interference probe box that prevents that a plurality of probes from making a mistake and detecting because of long-pending silt impurity generation interference.
Background technology
For detection of the probe box of water level, detect and judge water level by immersion energising between probe and probe; Because probe is under water for a long time, the impurity in water can amass to become silted up and stretch out on the part of probe box at probe, when the long-pending silt of the impurity between probe and probe is too much, probe is connected each other by mistake, and send wrong detection information.
Summary of the invention
Technical matters for above-mentioned existence the objective of the invention is: proposed a kind of anti-interference probe box that prevents that a plurality of probes from making a mistake and detecting because of long-pending silt impurity generation interference.
Technical solution of the present invention is achieved in that a kind of anti-interference probe box, comprises box body; The lower end of described box body is provided with a plurality of probes; The upper end of described each probe all is arranged in box body; The lower end of described each probe is all stretched out box body downwards; Between described every two adjacent probes, be provided with baffle plate.
Preferably, on the box body between described every two adjacent probes, be provided with baffle plate groove; Described baffle plate is arranged in baffle plate groove.
Due to the utilization of technique scheme, the present invention compared with prior art has following advantages:
Anti-interference probe box of the present invention, separate by baffle plate between every two adjacent probes, and therefore, the part that probe stretches out box body is amassed the impurity become silted up and also by baffle plate, separated, and has avoided the interference of impurity, prevents that probe from connecting the detection information of feedback error because of mistake.
The accompanying drawing explanation
Below in conjunction with accompanying drawing, technical solution of the present invention is described further:
Accompanying drawing 1 is the cut-open view of a kind of anti-interference probe box of the present invention;
Wherein: 1, box body; 2, probe; 3, baffle plate; 4, baffle plate groove.
Embodiment
Below in conjunction with accompanying drawing, the present invention is described.
Accompanying drawing 1 is a kind of anti-interference probe box of the present invention, comprises box body 1; The lower end of described box body 1 is provided with a plurality of probes 2; The upper end of described each probe 2 all is arranged in box body 1; The lower end of described each probe 2 is all stretched out box body 1 downwards; On box body 1 between described every two adjacent probes 2, be provided with baffle plate groove 4; In described each baffle plate groove 4, be provided with dismountable baffle plate 3.
Due to the utilization of technique scheme, the present invention compared with prior art has following advantages:
Anti-interference probe box of the present invention, between every two adjacent probes 2, separate by baffle plate 3, therefore, the part that probe 2 stretches out box body 1 is amassed the impurity become silted up and also by baffle plate 3, is separated, avoided the interference of impurity, prevented that probe 2 from connecting the detection information of feedback error because of mistake.
Above-described embodiment only is explanation technical conceive of the present invention and characteristics; its purpose is to allow the person skilled in the art can understand content of the present invention and be implemented; can not limit the scope of the invention with this; all equivalences that Spirit Essence is done according to the present invention change or modify, and all should be encompassed in protection scope of the present invention.

Claims (2)

1. an anti-interference probe box, comprise box body (1); The lower end of described box body (1) is provided with a plurality of probes (2); The upper end of described each probe (2) all is arranged in box body (1); The lower end of described each probe (2) is all stretched out box body (1) downwards; It is characterized in that: between described every two adjacent probes (2), be provided with baffle plate (3).
2. anti-interference probe box according to claim 1, is characterized in that: be provided with baffle plate groove (4) on the box body (1) between described every two adjacent probes (2); Described baffle plate (3) is arranged in baffle plate groove (4).
CN2013103476513A 2013-08-12 2013-08-12 Anti-interference probe box Pending CN103411648A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2013103476513A CN103411648A (en) 2013-08-12 2013-08-12 Anti-interference probe box

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2013103476513A CN103411648A (en) 2013-08-12 2013-08-12 Anti-interference probe box

Publications (1)

Publication Number Publication Date
CN103411648A true CN103411648A (en) 2013-11-27

Family

ID=49604675

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2013103476513A Pending CN103411648A (en) 2013-08-12 2013-08-12 Anti-interference probe box

Country Status (1)

Country Link
CN (1) CN103411648A (en)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020100319A1 (en) * 2001-01-29 2002-08-01 Advanced Semiconductor Engineering Inc. Measuring device of the surface level of liquid
CN1912633A (en) * 2005-08-09 2007-02-14 陈文祺 Semiconductor test plate structure for preventing noise interference
CN102472644A (en) * 2009-07-09 2012-05-23 恩德莱斯和豪瑟尔测量及调节技术分析仪表两合公司 Measuring device comprising a measuring probe and a fastening device
CN102980626A (en) * 2012-11-23 2013-03-20 苏州优德通力电气有限公司 Air resistance induction box
CN203455048U (en) * 2013-08-12 2014-02-26 苏州市正步机器制造有限公司 Anti-interference probe box

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020100319A1 (en) * 2001-01-29 2002-08-01 Advanced Semiconductor Engineering Inc. Measuring device of the surface level of liquid
CN1912633A (en) * 2005-08-09 2007-02-14 陈文祺 Semiconductor test plate structure for preventing noise interference
CN102472644A (en) * 2009-07-09 2012-05-23 恩德莱斯和豪瑟尔测量及调节技术分析仪表两合公司 Measuring device comprising a measuring probe and a fastening device
CN102980626A (en) * 2012-11-23 2013-03-20 苏州优德通力电气有限公司 Air resistance induction box
CN203455048U (en) * 2013-08-12 2014-02-26 苏州市正步机器制造有限公司 Anti-interference probe box

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PB01 Publication
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RJ01 Rejection of invention patent application after publication

Application publication date: 20131127

RJ01 Rejection of invention patent application after publication