CN103398667B - The quick measurement mechanism of a kind of plane deformation based on optical principle and method - Google Patents

Abstract

The invention provides the quick measurement mechanism of a kind of plane deformation based on optical principle, comprise NI-G plate and digital camera that four are cross-shaped arrangement, four NI-G plates comprise the first NI-G plate and the second NI-G plate of two panels horizontally set, and the 3rd NI-G plate that longitudinally arranges of two panels and the 4th NI-G plate, every sheet NI-G plate all offers a bolt slot, be provided with a bolt in bolt slot, bolt can slide along bolt slot; First NI-G plate is fixedly installed the first lateral marker thing and the second lateral marker thing, the second NI-G plate is fixedly installed the 3rd lateral marker thing; 3rd NI-G plate is fixedly installed first longitudinal mark and second longitudinal mark, the 4th NI-G plate is fixedly installed the 3rd longitudinal mark.The present invention repeatedly can measure the distortion of planar structure at diverse location, has simple to operate, with low cost, high temperature resistant and precision high; The present invention also provides the quick measuring method of a kind of plane deformation based on optical principle simultaneously.

Description

The quick measurement mechanism of a kind of plane deformation based on optical principle and method

Technical field

The invention belongs to field of optical measurements, be specifically related to the quick measurement mechanism of a kind of plane deformation based on optical principle and method.

Background technology

Distortion is the ubiquitous phenomenon of nature, and it refers to that deformable body is under various load action, and its shape, size and location are in the change of time domain and spatial domain.In engineering field, can not work the mischief when deflection is no more than certain limit; If exceed the permissible value that deformable body can bear, then may cause serious disaster.Therefore, regular deformation measurement is carried out to structure and seem extremely important.

At present, foil gauge is modal deformation measurement instrument, but generally there are following three shortcomings in foil gauge: 1, temperature variation causes foil gauge sensitive grid resistance variations, material for test different from the linear expansion coefficient of sensitive grid material, and both all can produce additional strain, cause larger measuring error; 2, the range of foil gauge is limited, has larger non-linear under large sstrain; 3, the output signal of foil gauge is fainter, and under complex environment, antijamming capability is poor.

Summary of the invention

The present invention is directed to above-mentioned the deficiencies in the prior art, provide the quick measurement mechanism of a kind of plane deformation based on optical principle, repeatedly can measure the distortion of planar structure at diverse location, have simple to operate, with low cost, high temperature resistant and precision high; Invention also provides the quick measuring method of a kind of plane deformation based on optical principle.

The present invention is achieved through the following technical solutions:

The quick measurement mechanism of a kind of plane deformation based on optical principle, it is characterized in that, comprise NI-G plate and digital camera that four are cross-shaped arrangement, described four NI-G plates comprise the first NI-G plate and the second NI-G plate of two panels horizontally set, and the 3rd NI-G plate that longitudinally arranges of two panels and the 4th NI-G plate, every sheet NI-G plate all offers a bolt slot, and be provided with a bolt in described bolt slot, described bolt can slide along bolt slot; The bottom of described bolt is fixed on object under test;

Described first NI-G plate is fixedly installed the first lateral marker thing and the second lateral marker thing, the second NI-G plate is fixedly installed the 3rd lateral marker thing; The central point of the first lateral marker thing, the second lateral marker thing and the 3rd lateral marker thing is positioned on same horizontal straight line; Second lateral marker thing is between the first lateral marker thing and the 3rd lateral marker thing;

Described 3rd NI-G plate is fixedly installed first longitudinal mark and second longitudinal mark, the 4th NI-G plate is fixedly installed the 3rd longitudinal mark; The central point of first longitudinal mark, second longitudinal mark and the 3rd longitudinal mark is positioned on same longitudinal straight line; Second longitudinal mark is between first longitudinal mark and the 3rd longitudinal mark; Described horizontal straight line is mutually vertical with longitudinal straight line.

The further setting of the present invention is, described first lateral marker thing, the second lateral marker thing, the 3rd lateral marker thing, first longitudinal mark, second longitudinal mark and the 3rd longitudinal mark are silicon nitride, and described silicon nitride is welded on NI-G plate.

The present invention also provides the quick measuring method of a kind of plane deformation based on optical principle simultaneously, comprises the following steps:

(1) will be arranged on object under test in the quick measurement mechanism of the plane deformation based on optical principle according to claim 1, between the first NI-G plate and the second NI-G plate of two panels horizontally set, leave spacing, between the 3rd NI-G plate that two panels is longitudinally arranged and the 4th NI-G plate, leave spacing;

(2) after installation, carry out first time shooting with digital camera to four NI-G plates, gained image is as reference image; Remember that the distance between the first lateral marker thing and the second lateral marker thing central point is n _xindividual pixel, the distance between the first lateral marker thing and the 3rd lateral marker thing central point is m _xindividual pixel; Distance between first longitudinal mark and second longitudinal mark central point is n _yindividual pixel, the distance between first longitudinal mark and the 3rd longitudinal mark central point is m _yindividual pixel;

When observing for the first time,

Actual range between first lateral marker thing and the 3rd lateral marker thing central point is

Actual range between first longitudinal mark and the 3rd longitudinal mark central point is

Wherein, N _xbe the actual range between the first lateral marker thing and the second lateral marker thing central point, N _yit is the actual range between first longitudinal mark and second longitudinal mark central point;

(3) between object under test deformation phases, carry out regularly or irregularly observing to four NI-G plates; Carry out i-th time observation time, i be greater than 1 positive integer;

Remember that the distance between the first lateral marker thing and the second lateral marker thing central point is n ' _xindividual pixel, the distance between the first lateral marker thing and the 3rd lateral marker thing central point is m ' _xindividual pixel; Distance between first longitudinal mark and second longitudinal mark central point is n ' _yindividual pixel, the distance between first longitudinal mark and the 3rd longitudinal mark central point is m ' _yindividual pixel;

During i-th observation,

Actual range between first lateral marker thing and the 3rd lateral marker thing central point is

Actual range between first longitudinal mark and the 3rd longitudinal mark central point is

(4) obtain when i-th observation, the deflection of object under test is:

Deflection on x direction is: ${\mathrm{\Δx}}_i=l_x^{\′}-l_x=N_x(\frac{m_x^{\′}}{n_x^{\′}}-\frac{m_x}{n_x})$

Deflection on y direction is: ${\mathrm{\Δy}}_i=l_y^{\′}-l_y=N_y(\frac{m_y^{\′}}{n_y^{\′}}-\frac{m_y}{n_y})$

Object under test total deformation is: ${\mathrm{\ΔL}}_i=\sqrt{N_x^2{(\frac{m_x^{\′}}{n_x^{\′}}-\frac{m_x}{m_x})}^2+N_y^2{(\frac{m_y^{\′}}{n_y^{\′}}-\frac{m_y}{m_y})}^2}.$

The quick measurement mechanism of plane deformation based on optical principle of the present invention and method, repeatedly can measure the distortion of planar structure at diverse location, have simple to operate, with low cost, high temperature resistant and precision high; Utilize the quick measurement mechanism of this plane deformation to take multiple measurements determinand, the change along with the time can be obtained, the deformation rule of object under test.The permissible deformation value that deformation values and object can bear is compared, thus the security performance of structure is effectively assessed.

Accompanying drawing explanation

Fig. 1 is the structural drawing of the quick measurement mechanism of the plane deformation based on optical principle of the present invention.

Embodiment

Below in conjunction with the drawings and specific embodiments, the present invention will be further described in detail.

As shown in Figure 1, the invention provides the quick measurement mechanism of a kind of plane deformation based on optical principle, comprise NI-G plate and digital camera that four are cross-shaped arrangement, because NI-G material has stable chemical property, significantly not expand with heat and contract with cold phenomenon, when measuring, NI-G plate self does not deform.

Described four NI-G plates comprise the first NI-G plate 1 and the second NI-G plate 2 of two panels horizontally set, and the 3rd NI-G plate 3 that longitudinally arranges of two panels and the 4th NI-G plate 4, every sheet NI-G plate all offers a bolt slot 11, one bolt 12 is installed in described bolt slot 11, described bolt 12 can slide along bolt slot 11, and is fixed in any one position.The bottom of described bolt 12 is fixed on object under test; Four NI-G plates are mutually in 90 ° of angles.

Described first NI-G plate 1 is fixedly installed on the first lateral marker thing 5 and the second lateral marker thing 6, second NI-G plate 2 and is fixedly installed the 3rd lateral marker thing 7; The central point of the first lateral marker thing 5, second lateral marker thing 6 and the 3rd lateral marker thing 7 is positioned on same horizontal straight line; Second lateral marker thing 6 is between the first lateral marker thing 5 and the 3rd lateral marker thing 7;

Described 3rd NI-G plate 3 is fixedly installed on first longitudinal mark 8 and second longitudinal mark the 9, four NI-G plate 4 and is fixedly installed the 3rd longitudinal mark 10; The central point of the first longitudinal mark 9 of longitudinal mark 8, second and the 3rd longitudinal mark 10 is positioned on same longitudinal straight line; Second longitudinal mark 9 is between first longitudinal mark 8 and the 3rd longitudinal mark 10; Described horizontal straight line is mutually vertical with longitudinal straight line.

Described first lateral marker thing 5, second lateral marker thing 6, the 3rd lateral marker thing 7, the first longitudinal mark 9 of longitudinal mark 8, second and the 3rd longitudinal mark 10 are silicon nitride, described silicon nitride is welded on NI-G plate, and silicon nitride can provide good optical measurement effect under light illumination.

Two mark 5 and 6 central point distances in the present embodiment on the first NI-G plate 1 are set to 3mm, and two marks 8 on the 3rd NI-G plate 3 and 9 central points distance are also set to 3mm.

The present invention also provides the quick measuring method of a kind of plane deformation based on optical principle simultaneously, comprises the following steps:

(1) will be arranged on object under test in the quick measurement mechanism of the above-mentioned plane deformation based on optical principle, laterally reserving certain distance between two NI-G plates, longitudinally also reserved certain distance between two NI-G plates, distance is estimation according to measuring targets deflection and selectes; Between two NI-G plates, the object of reserved certain distance is that if reserved distance is less, along with the drawdown deformation of object under test, two NI-G plates will contact, thus cannot carry out deformation measurement in order to prevent the deflection when object under test from being negative value.

(2) after installation, carry out first time shooting with digital camera to four NI-G plates, gained image is as reference image; Remember that the distance between the first lateral marker thing and the second lateral marker thing central point is n _xindividual pixel, the distance between the first lateral marker thing and the 3rd lateral marker thing central point is m _xindividual pixel; Distance between first longitudinal mark and second longitudinal mark central point is n _yindividual pixel, the distance between first longitudinal mark and the 3rd longitudinal mark central point is m _yindividual pixel;

First time observation:

Actual range between first lateral marker thing and the 3rd lateral marker thing central point:

Actual range between first longitudinal mark and the 3rd longitudinal mark central point: wherein, N _xbe the actual range between the first lateral marker thing and the second lateral marker thing central point, N _yit is the actual range between first longitudinal mark and second longitudinal mark central point;

(3) between object under test deformation phases, carry out regularly or irregularly observing to four NI-G plates; Carry out i-th time observation time (i be greater than 1 positive integer), remember that the distance between the first lateral marker thing and the second lateral marker thing central point is n ' _xindividual pixel, the distance between the first lateral marker thing and the 3rd lateral marker thing central point is m ' _xindividual pixel; Distance between first longitudinal mark and second longitudinal mark central point is n ' _yindividual pixel, the distance between first longitudinal mark and the 3rd longitudinal mark central point is m ' _yindividual pixel;

I-th observation:

Actual range between first lateral marker thing and the 3rd lateral marker thing central point:

Actual range between first longitudinal mark and the 3rd longitudinal mark central point:

(4) obtain when i-th observation, the deflection of object under test is:

Deflection on x direction is: ${\mathrm{\Δx}}_i=l_x^{\′}-l_x=N_x(\frac{m_x^{\′}}{n_x^{\′}}-\frac{m_x}{n_x})$

Deflection on y direction is: ${\mathrm{\Δy}}_i=l_y^{\′}-l_y=N_y(\frac{m_y^{\′}}{n_y^{\′}}-\frac{m_y}{n_y})$

Object under test total deformation is: ${\mathrm{\ΔL}}_i=\sqrt{N_x^2{(\frac{m_x^{\′}}{n_x^{\′}}-\frac{m_x}{n_x})}^2+N_y^2{(\frac{m_y^{\′}}{n_y^{\′}}-\frac{m_y}{n_y})}^2}$

N in the present embodiment _x=N _y=3mm, n _x=n _y=n, n ' _x=n ' _y=n ' then

Deflection on x direction is: ${\mathrm{\Δx}}_i=l_x^{\′}-l_x=3(\frac{m_x^{\′}}{n^{\′}}-\frac{m_x}{n})$

Deflection on y direction is: ${\mathrm{\Δy}}_i=l_y^{\′}-1_y=3(\frac{m_y^{\′}}{n^{\′}}-\frac{m_y}{n})$

Object under test total deformation is: ${\mathrm{\ΔL}}_i=3\sqrt{{(\frac{m_x^{\′}}{n^{\′}}-\frac{m_x}{n})}^2+{(\frac{m_y^{\′}}{n^{\′}}-\frac{m_y}{n})}^2}$

It is apparent to one skilled in the art that the present invention can change into various ways, and such change is not thought and departed from the scope of the present invention.All like this to the apparent amendment of the technician in described field, by be included in this claim scope within.

Claims (3)

1. the quick measurement mechanism of the plane deformation based on optical principle, it is characterized in that, comprise NI-G plate and digital camera that four are cross-shaped arrangement, described four NI-G plates comprise the first NI-G plate and the second NI-G plate of two panels horizontally set, and the 3rd NI-G plate that longitudinally arranges of two panels and the 4th NI-G plate, every sheet NI-G plate all offers a bolt slot, and be provided with a bolt in described bolt slot, described bolt can slide along bolt slot; The bottom of described bolt is fixed on object under test;

Described first NI-G plate is fixedly installed the first lateral marker thing and the second lateral marker thing, the second NI-G plate is fixedly installed the 3rd lateral marker thing; The central point of the first lateral marker thing, the second lateral marker thing and the 3rd lateral marker thing is positioned on same horizontal straight line; Second lateral marker thing is between the first lateral marker thing and the 3rd lateral marker thing;

Described 3rd NI-G plate is fixedly installed first longitudinal mark and second longitudinal mark, the 4th NI-G plate is fixedly installed the 3rd longitudinal mark; The central point of first longitudinal mark, second longitudinal mark and the 3rd longitudinal mark is positioned on same longitudinal straight line; Second longitudinal mark is between first longitudinal mark and the 3rd longitudinal mark; Described horizontal straight line is mutually vertical with longitudinal straight line.

2. according to the plane deformation quick measurement mechanism of claim 1 based on optical principle, it is characterized in that, described first lateral marker thing, the second lateral marker thing, the 3rd lateral marker thing, first longitudinal mark, second longitudinal mark and the 3rd longitudinal mark are silicon nitride, and described silicon nitride is welded on NI-G plate.

3., based on the quick measuring method of plane deformation of optical principle, it is characterized in that, comprise the following steps:

(1) will be arranged on object under test in the quick measurement mechanism of the plane deformation based on optical principle according to claim 1, between the first NI-G plate and the second NI-G plate of two panels horizontally set, leave spacing, between the 3rd NI-G plate that two panels is longitudinally arranged and the 4th NI-G plate, leave spacing;

(2) after installation, carry out first time shooting with digital camera to four NI-G plates, gained image is as reference image; Remember that the distance between the first lateral marker thing and the second lateral marker thing central point is n _xindividual pixel, the distance between the first lateral marker thing and the 3rd lateral marker thing central point is m _xindividual pixel; Distance between first longitudinal mark and second longitudinal mark central point is n _yindividual pixel, the distance between first longitudinal mark and the 3rd longitudinal mark central point is m _yindividual pixel;

When observing for the first time,

Actual range between first lateral marker thing and the 3rd lateral marker thing central point is

Actual range between first longitudinal mark and the 3rd longitudinal mark central point is

Wherein, N _xbe the actual range between the first lateral marker thing and the second lateral marker thing central point, N _yit is the actual range between first longitudinal mark and second longitudinal mark central point;

(3) between object under test deformation phases, carry out regularly or irregularly observing to four NI-G plates; When carrying out i-th observation, _ifor being greater than the positive integer of 1;

Remember that the distance between the first lateral marker thing and the second lateral marker thing central point is n ' _xindividual pixel, the distance between the first lateral marker thing and the 3rd lateral marker thing central point is m ' _xindividual pixel; Distance between first longitudinal mark and second longitudinal mark central point is n ' _yindividual pixel, the distance between first longitudinal mark and the 3rd longitudinal mark central point is m ' _yindividual pixel;

During i-th observation,

Actual range between first lateral marker thing and the 3rd lateral marker thing central point is

Actual range between first longitudinal mark and the 3rd longitudinal mark central point is

(4) obtain when i-th observation, the deflection of object under test is:

Deflection on x direction is: ${\mathrm{\Δx}}_i=l_x^{\′}-l_x=N_x(\frac{m_x^{\′}}{n_x^{\′}}-\frac{m_x}{n_x})$

Deflection on y direction is: ${\mathrm{\Δy}}_i=l_y^{\′}-l_y=N_y(\frac{m_y^{\′}}{n_y^{\′}}-\frac{m_y}{n_y})$

Object under test total deformation is: ${\mathrm{\ΔL}}_i=\sqrt{N_x^2{(\frac{m_x^{\′}}{n_x^{\′}}-\frac{m_x}{n_x})}^2+N_y^2{(\frac{m_y^{\′}}{n_y^{\′}}-\frac{m_y}{n_y})}^2}.$