CN103368640A - Improved system of expanding optical module digital diagnostic monitoring - Google Patents
Improved system of expanding optical module digital diagnostic monitoring Download PDFInfo
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Abstract
The invention discloses an improved system of expanding optical module digital diagnostic monitoring. The improved system comprises an optical receiving submodule, an optical emission submodule, a limiting amplifier, a laser driver, a micro controller, a digital potentiometer, a storage unit, a sampling module and a switch module, wherein the laser driver is used for providing driving current for the optical emission submodule; the switch module comprises a field-effect transistor; the sampling module comprises a first sampling resistor and a second sampling resistor; the micro controller is also used for detecting input voltage; when the input voltage reaches a set threshold value, the switch module is controlled to be on; the sampling module outputs the composite resistance value of the first sampling resistor and the second sampling resistor; at the moment, the monitoring range of expanding optical module digital diagnosis is a first power range; when the input voltage is lower than the set threshold valve, the switch module is controlled to be off; the sampling module outputs the resistance value of the first sampling resistor; and at the moment, the monitoring range of expanding optical module digital diagnosis is a second power range. Therefore, the original monitoring range can be expanded, and the monitoring precision is improved.
Description
Technical field
The present invention relates to optical module improvement technology, particularly relate to a kind of system that improves expansion optical module digital diagnostic monitoring scope and precision.
Background technology
Optical module is divided into DDM(digital diagnostic monitoring, numerical diagnostic) function and without two kinds of DDM functions, have the DDM function and namely be called the intelligent optical module.Utilize intelligentized optical module, temperature, supply power voltage, the laser bias current that network management unit can the Real-Time Monitoring transceiver module and transmit and receive luminous power.The measurement of these parameters can help network management unit to find out the position of breaking down in the optical fiber link, simplifies maintenance work, improves the reliability of system.
DDM scheme commonly used is divided again two kinds of hardware and microcontrollers, and wherein hardware plan is used simple but lacked flexibility, and the microcontroller scheme need to be write corresponding software it is configured just and can uses, and is that flexibility is good based on the great advantage of software.General all with the microcontroller scheme as Research foundation.
In SFF-8472MSA, standard the detailed content of digital diagnosis function and relevant SFF-8472, comprise range ability, quantization resolution, error requirements etc.
5 parameters that SFF-8472 regulation DDM must monitor:
5 parameters all need carry out analog-to-digital conversion by the ADC of microcontroller becomes the 16bit numerical chracter, so range is 0～65535.Wherein received optical power, utilizing emitted light power, laser bias current all need outside input analog voltage to carry out sample conversion to the ADC of microcontroller; Supply voltage and temperature are generally finished sampling and input ADC by the built-in transducer of microcontroller.
In the practical application, utilizing emitted light power, laser bias current, supply voltage, these 4 parameter scopes of temperature have only accounted for the sub-fraction in the gamut, so be easy to satisfy the requirement of range and error.And the scope of received optical power is usually very wide, for example 155M PIN+TIA receiving sensitivity from-3 to-33dBm is very common.But the microcontroller that optical module is commonly used in the industry is the C8051F33X series of Silicon Laboratories, and its ADC only has 10bit, and " full scale offset error " maximum has reached ± 15LSB.That is to say that in ideal conditions range is 0～1023, can only satisfy-3～-33dBm(1000 doubly) ± quantisation depth of 3dB.But consider offset error, the poorest actual usable range just only has 15～1023,1023/15=68.2 doubly, if satisfy quantization error＜± 3dB, corresponding operable reference optical power is 18.3dB only, does not obviously reach the total power monitoring requirement.
Because above-mentioned reason, it is not up to standard always to have a certain proportion of product DDM detection error in the production process, usually needs to change microcontroller or sampling resistor, thereby has affected production efficiency and increased the product unsteadiness.
Summary of the invention
Based on this, provide a kind of expansion optical module digital diagnostic monitoring improved system that microcontroller just can improve monitoring range and precision of avoiding changing.
A kind of expansion optical module digital diagnostic monitoring improved system comprises: light-receiving secondary module, light emission secondary module, limiting amplifier, be used for providing laser driver, microcontroller and digital regulation resistance, the memory cell of drive current to described smooth emission secondary module; Also comprise sampling module and switch module;
Described light-receiving secondary module is connected with described limiting amplifier and described microcontroller respectively, described memory cell is connected with described microcontroller, described digital regulation resistance is connected with described laser driver and described microcontroller respectively, and described laser driver also is connected with described smooth emission secondary module;
Described microcontroller comprises ADC interface and I
2The C controller; Described ADC interface is connected with the output of described sampling module, and the input of described sampling module is connected with the output of described light-receiving secondary module, described I
2The input of C controller is connected with the output of described limiting amplifier, described I
2The output of C controller is connected with described memory cell;
Described switch module comprises field effect transistor, described sampling module comprises the first sampling resistor and the second sampling resistor, the control end of described field effect transistor switches output interface with the signal of described microcontroller and is connected, described the second sampling resistor is connected with described field effect transistor, described the first sampling resistor is parallel to described the second sampling resistor and described field effect transistor two ends, described the first sampling resistor be connected the common port of the second sampling resistor and be connected with described ADC interface;
Described microcontroller when described input voltage reaches setting threshold, is controlled described switch module conducting for detection of the ADC input voltage, and described sampling module is exported the compound electric resistance of the first sampling resistor and the second sampling resistor; When described input voltage is lower than setting threshold, control described switch module cut-off, described sampling module is exported the resistance value of the first sampling resistor.
Among embodiment, also comprise filtration module therein, described filtration module comprises filter capacitor, and described filter capacitor is in parallel with described the first sampling resistor.
Among embodiment, the input voltage range of described ADC interface is 0-2.4V therein.
Among embodiment, the resistance value of described the first sampling resistor is 100k Ω therein, and the resistance value of described the second sampling resistor is 5k Ω.
Among embodiment, the setting threshold of described input voltage is 2.4V therein.
Among embodiment, described field effect transistor is the NMOS pipe therein.
Among embodiment, the model of described microcontroller is C8051F330 therein.
Above-mentioned expansion optical module digital diagnostic monitoring improved system is by increasing the second sampling resistor and switch module between the ADC of microcontroller interface and light-receiving secondary module; Switch module ends when the ADC of microcontroller input voltage is lower than setting threshold, thereby the control sampling module is exported the first sampling resistor, and expand the numerical diagnostic monitoring range of optical module this moment is the first power bracket.Conducting when switch module is greater than or equal to setting threshold at microcontroller ADC input voltage, thereby control sampling module output compound sampling resistance, expand the numerical diagnostic monitoring range of optical module this moment is the second power bracket.Therefore can increase original monitoring range, and improve the monitoring precision.
Description of drawings
Fig. 1 is the module map of expansion optical module digital diagnostic monitoring improved system;
Fig. 2 is the sampling section circuit theory diagrams of photogenerated current signal;
Fig. 3 is the input of ADC interface and the switching signal output schematic diagram of microcontroller;
Fig. 4 is the monitoring error chart before improving;
Fig. 5 is the monitoring error chart after improving.
Embodiment
As shown in Figure 1, for expanding the module map of optical module digital diagnostic monitoring improved system.
A kind of expansion optical module digital diagnostic monitoring improved system comprises: light-receiving secondary module 110, light emission secondary module 120, limiting amplifier 130, be used for providing laser driver 150, microcontroller 140 and digital regulation resistance 170, the memory cell 160 of drive current to described smooth emission secondary module; Also comprise sampling module 180 and switch module 190.
Described light-receiving secondary module 110 is connected with described limiting amplifier 130 and described microcontroller 140 respectively, described memory cell 160 is connected with described microcontroller 140, described digital regulation resistance 170 is connected with described laser driver 150 and described microcontroller 140 respectively, and described laser driver 150 also is connected with described smooth emission secondary module 120.
Described microcontroller 140 comprises ADC interface 142 and I
2C controller 144; Described ADC interface 142 is connected with the output of described sampling module 180, and the input of described sampling module 180 is connected with the output of described light-receiving secondary module 110, described I
2The input of C controller 144 is connected with the output of described limiting amplifier 130, described I
2The output of C controller 144 is connected with described memory cell 160.
Please in conjunction with Fig. 2 and Fig. 3.Described switch module 190 comprises field effect transistor, described sampling module 180 comprises the first sampling resistor and the second sampling resistor, the control end of described field effect transistor switches output interface with the signal of described microcontroller 140 and is connected, described the second sampling resistor is connected with described field effect transistor, described the first sampling resistor is parallel to described the second sampling resistor and described field effect transistor two ends, described the first sampling resistor be connected the common port of the second sampling resistor and be connected with described ADC interface 142, the RXPOWER that namely obtains from 110 samplings of light-receiving secondary module outputs to ADC interface 142 through this common port.
Described microcontroller 140 when described input voltage reaches setting threshold, is controlled described switch module 190 conductings also for detection of input voltage, and described sampling module is exported the compound electric resistance of the first sampling resistor and the second sampling resistor; When described input voltage is lower than setting threshold, control described switch module 190 cut-offs, described sampling module is exported the resistance value of the first sampling resistor.
The signal of telecommunication of light emission secondary module 120 inputs one constant bit rate is launched the modulated light signal of respective rate through driving chip processing rear drive semiconductor laser (LD) or the light-emitting diode (LED) of inside, its inside makes the optical signal power of output keep stable with the luminous power automatic control circuit.Light-receiving secondary module 110 is to be converted to the signal of telecommunication by the optical detection diode behind the light signal input module of a constant bit rate.The signal of telecommunication of output phase code rate behind preamplifier.
The effect of optical module is exactly opto-electronic conversion, and transmitting terminal converts the signal of telecommunication to light signal, and after transmitting by optical fiber, receiving terminal converts light signal to the signal of telecommunication again.
Limiting amplifier 130 is used for the signal of telecommunication of light-receiving secondary module 110 outputs is carried out exporting to the next stage circuit behind the limited range enlargement.Limiting amplifier 130 can suppress the at a slow speed variation of data signal amplitude, and amplitude that also can Inhibitory signal comparatively fast changes.There is not the time constant problem in the gain-controlled amplifier.The basic structure of limiting amplifier 130 comprises a series of differential amplification unit and a DC feedback loop.The nonlinear device of current amplifier and so on is usually used in limiting amplifier 130.When adopting field effect transistor to consist of differential amplifier, its basic circuit form is source-coupled FET logical circuit.
Memory cell 160 is used for storage I
2The signal of C controller output and pass through I
2The C bus is to the next stage circuit output signal.
Digital regulation resistance 170 is by I
2C controller, EEPROM, digital resistance form.Numeral resistance is the important component part of digital regulation resistance, and it passes through I by microcontroller
2The C bus is set its corresponding resistance value, and EEPROM is used for the storage set point.
Expansion optical module digital diagnostic monitoring improved system also comprises filtration module, and described filtration module comprises filter capacitor, and described filter capacitor is in parallel with described the first sampling resistor.
The input voltage range of described ADC interface is 0-2.4V.
The resistance value of the first sampling resistor is 100k Ω, and the resistance value of described the second sampling resistor is 5k Ω.
The setting threshold of input voltage is 2.4V.
Field effect transistor is the NMOS pipe.
The model of microcontroller is C8051F330.
The circuit theory of sampling module 180: the received optical power pilot signal is derived from the photogenerated current signal (RSSI) of photodiode, is converted into voltage parameter input ADC on sampling resistor.Adopt the sampling resistor of high and low two resistances to switch to realize high and low two ranges by condition, behind switching range, automatically multiply by the resistance multiplying power and obtain real ADC value, quantified precision in the time of can guaranteeing low light guarantees that also the high light time can not exceed the specified input voltage range of ADC.
The ADC input voltage range of at first recognizing the F33x series of microcontroller 140 is: 0～2.4V, 10bit, i.e. 1LSB=2.4V/1024 ≈ 2.34mV.The offset error of general the poorest 15LSB, if satisfy ± the 3dB error requirements, the corresponding quantized value of initial input signal can not be less than 15LSB, be 15*2.34mV=35mV, come thus to determine required low wide resistance sampling resistor RL 〉=35mV/Ipin (L), determine little resistance sampling resistor RH≤2.4V/Ipin (H) that high light is required according to ADC maximum input voltage 2.4V and Ipin (H) in addition.
According to several the 155Mbps ROSA(light receiving elements of taking a sample test at random) received optical power and RSSI output current, confirm that the linearity is good, kept fixing responsiveness in the whole available light power bracket, and according to current value and error expected＜± 3dB, the first sampling resistor RL=100K, the second sampling resistor RH=5K have been determined, the combination multiplying power is 21 times, but in theory two range continuous sampling exponent number=68*21=1428, i.e. 31.5dB scopes.
Based on above-mentioned all embodiment, the operation principle of expansion optical module digital diagnostic monitoring improved system is as follows:
The digital diagnosis function of optical module is by 5 parameter signals input ADC interfaces 142, quantize and the algorithm calibration after deposit memory cell 160 in, host computer is read by the SFF-8472 agreement according to the value of storage and is converted to corresponding analog quantity numerical value.
The electric current that the Imon pin of light-receiving secondary module ROSA flows out and received luminous power proportional (responsiveness and coupling efficiency by PIN/APD determine), current signal produces pressure drop through filter capacitor C33 filtering at the first sampling resistor R25.This voltage is sent into the ADC interface as RX POWER signal and generate the magnitude of power that meets the SFF-8472 agreement after quantification and computing.Because the first sampling resistor R25 value is larger, so very faint electric current just can produce enough voltage signals.
Microcontroller 140 detects the ADC input voltage in real time, when this voltage is no more than 2.4V, switching signal output (SWITCH OUT) is output as the low level of LOW to field effect transistor N-MOSFET gate pole, not conducting of field effect transistor, so the sampling resistor of the first sampling resistor R25 during as low light is responsible for from Pmin to＜this section of Pmax power bracket.
When increasing along with received optical power, when the ADC input voltage of microcontroller 140 reached 2.4V, switching signal output (SWITCH OUT) was output as the high level of HI to field effect transistor N-MOSFET gate pole, field effect transistor conducting.The second sampling resistor R26 and entry loop, combined resistance are 100K//5K=4.76K, and resistance is kept to 1/21 of former 100K.In the identical situation of electric current, sampled voltage is also reduced to 2.4V/21=114.3mV, the value that ADC interface 142 quantizes is also corresponding to reduce 21 times, so need simultaneously the ADC value is taken advantage of the memory cell 160 of restoring behind 21 the algorithm, received optical power just can continue to increase like this, just can be saturated until again reach 2.4V, this section working range is that Pmin*21 is to Pmax*21.
For fear of causing IO output concussion at switching point because voltage floats, so need software to increase back stagnant condition, be set to stagnant coefficient 10% time in the present embodiment, but steady operation.For preventing the secondary misoperation, when the control switching is output as HI, even the ADC input voltage reaches 2.4V again, also no longer carry out change action and quantize multiplying power processing.
Please in conjunction with the test result chart of Fig. 4 and Fig. 5.By the SFP module of above-mentioned expansion optical module digital diagnostic monitoring improved system design, actual measurement RX POWER monitoring range calculates basically identically with theoretical, can reach-33～-2dBm, and precision is better than expection, reached ± 1dB.
Above-mentioned expansion optical module digital diagnostic monitoring improved system is by increasing sampling module 180 and switch module 190 between the ADC of microcontroller 140 interface 142 and light-receiving secondary module 110; Switch module 190 ends when the output voltage of microcontroller 140 is lower than setting threshold, thus control sampling module 180 outputs the first sampling resistor, and expand the numerical diagnostic monitoring range of optical module this moment is the first power bracket.Conducting when switch module 190 is greater than or equal to setting threshold at microcontroller 140 output voltages, thereby the compound sampling resistance of control sampling module 180 output the first sampling resistors and the second sampling resistor, expand the numerical diagnostic monitoring range of optical module this moment is the second power bracket.Therefore can increase original monitoring range, and improve the monitoring precision.
The above embodiment has only expressed several execution mode of the present invention, and it describes comparatively concrete and detailed, but can not therefore be interpreted as the restriction to claim of the present invention.Should be pointed out that for the person of ordinary skill of the art without departing from the inventive concept of the premise, can also make some distortion and improvement, these all belong to protection scope of the present invention.Therefore, the protection range of patent of the present invention should be as the criterion with claims.
Claims (8)
1. expansion optical module digital diagnostic monitoring improved system comprises: light-receiving secondary module, light emission secondary module, limiting amplifier, be used for providing laser driver, microcontroller and digital regulation resistance, the memory cell of drive current to described smooth emission secondary module; It is characterized in that, also comprise sampling module and switch module;
Described light-receiving secondary module is connected with described limiting amplifier and described microcontroller respectively, described memory cell is connected with described microcontroller, described digital regulation resistance is connected with described laser driver and described microcontroller respectively, and described laser driver also is connected with described smooth emission secondary module;
Described microcontroller comprises ADC interface and I
2The C controller; Described ADC interface is connected with the output of described sampling module, and the input of described sampling module is connected with the output of described light-receiving secondary module, described I
2The input of C controller is connected with the output of described limiting amplifier, described I
2The output of C controller is connected with described memory cell;
Described switch module comprises field effect transistor, described sampling module comprises the first sampling resistor and the second sampling resistor, the control end of described field effect transistor switches output interface with the signal of described microcontroller and is connected, described the second sampling resistor is connected with described field effect transistor, described the first sampling resistor is parallel to described the second sampling resistor and described field effect transistor two ends, described the first sampling resistor be connected the common port of the second sampling resistor and be connected with described ADC interface;
Described microcontroller when described input voltage reaches setting threshold, is controlled described switch module conducting also for detection of input voltage, and described sampling module is exported the compound electric resistance of the first sampling resistor and the second sampling resistor; When described input voltage is lower than setting threshold, control described switch module cut-off, described sampling module is exported the resistance value of the first sampling resistor.
2. expansion optical module digital diagnostic monitoring improved system according to claim 1 is characterized in that also comprise filtration module, described filtration module comprises filter capacitor, and described filter capacitor is in parallel with described the first sampling resistor.
3. expansion optical module digital diagnostic monitoring improved system according to claim 1 is characterized in that the input voltage range of described ADC interface is 0-2.4V.
4. expansion optical module digital diagnostic monitoring improved system according to claim 1 is characterized in that the resistance value of described the first sampling resistor is 100k Ω, and the resistance value of described the second sampling resistor is 5k Ω.
5. expansion optical module digital diagnostic monitoring improved system according to claim 1 is characterized in that the setting threshold of described input voltage is 2.4V.
6. expansion optical module digital diagnostic monitoring improved system according to claim 1 is characterized in that described microcontroller is also for detection of temperature.
7. expansion optical module digital diagnostic monitoring improved system according to claim 1 is characterized in that, described field effect transistor is the NMOS pipe.
8. expansion optical module digital diagnostic monitoring improved system according to claim 1 is characterized in that the model of described microcontroller is C8051F330.
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| CN106849890A (en) * | 2016-12-26 | 2017-06-13 | 北京航天易联科技发展有限公司 | A kind of optical fiber security signal collection conditioning amplifying circuit |
| CN107231190A (en) * | 2017-07-21 | 2017-10-03 | 东莞铭普光磁股份有限公司 | A kind of optical power monitoring circuit and method |
| CN111835429A (en) * | 2020-08-04 | 2020-10-27 | 国家电网有限公司信息通信分公司 | Optical module, method for correcting transmitting optical power of optical module and controller |
| CN112511221A (en) * | 2020-10-30 | 2021-03-16 | 武汉联特科技股份有限公司 | Method and equipment for improving receiving and reporting monitoring power range of optical module |
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