CN103293425A - Rapid aging test method for metalized power capacitor - Google Patents
Rapid aging test method for metalized power capacitor Download PDFInfo
- Publication number
- CN103293425A CN103293425A CN2013102672494A CN201310267249A CN103293425A CN 103293425 A CN103293425 A CN 103293425A CN 2013102672494 A CN2013102672494 A CN 2013102672494A CN 201310267249 A CN201310267249 A CN 201310267249A CN 103293425 A CN103293425 A CN 103293425A
- Authority
- CN
- China
- Prior art keywords
- test
- capacitor
- power capacitor
- voltage
- current
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Abstract
The invention relates to a rapid aging test method for a metalized power capacitor. The method includes the steps: measuring and recording a capacitance valve and a dissipation factor of the capacitor to be detected; calculating test voltage according to rated voltage of the capacitor; closing a control power switch and adjusting capacitor voltage to reach the test voltage by adjusting a voltage regulator; placing the capacitor to be detected in a drying oven, and adjusting the temperature of the drying oven to the preset temperature; setting over-current protection action current and over-voltage protection action voltage; setting preset test time and beginning a test; stopping a test device when the preset test time is over or equipment is faulted, and taking out the detected capacitor when the temperature of the drying oven falls to the normal temperature; and measuring the capacitance valve and the dissipation factor of the tested capacitor, and dissecting and observing local discharging and self-healing conditions of a metalized film of the capacitor. The test method effectively solves the problem that a capacitor aging test method in the prior art is complicated, poor in safety, long in test period, high in expense and high in energy consumption.
Description
Technical field
The present invention relates to a kind of metallization power capacitor quick aging test method, belong to electric and electronic technical field.
Background technology
Along with the high speed development of national economy, electricity needs increases day by day, and country will carry forward vigorously the construction of strong intelligent grid, has driven the fast development of electrotechnical instrument and meter industry simultaneously.The intelligent electric power electronic instrument constantly enlarges market share as instrument indispensable in the strong intelligent grid with its unique function.The development of strong intelligent grid, the exploitation of active demand new product, the metallization power capacitor is extensively quoted as the important devices in the intelligent grid.
The metallization power capacitor is a kind of in the metallic film capacitor, is to utilize the polypropylene films for electrical purposes to be medium, and allumen is attached to the electric power surface by the vacuum evaporation mode with it, forms electrode.Form capacitor by noninductive electrodeless coiling or lamination mode, the metallization power capacitor has withstand voltage height, high insulation resistance, impedance frequency characteristic good (less stray inductance), lower ESR(equivalent series resistance Equivalent Series Resistance), low loss tangent.Just because of the metallization power capacitor such characteristics are arranged, replaced the capacitor of original film and aluminium foil coiling, make small product size littler, ratio characteristic is better.
The metallization power capacitor is widely used in the middle of the power equipment, product quality is vital for power capacitor, so national standard (GB/T-12747-2004) has been stipulated the standard of " 1kV and following AC electric power systems self-healing shnt capacitor " delivery test and form test, standard code, every power capacitor must satisfy 6 tests, can dispatch from the factory.And the form test is 4 years routine tests once, and as the test of examination manufacturer material, design, technology, this test is generally undertaken by a national class research institute, and provides test report, can be used as product user's reference.Long (tested 2 months, and added and wait in line, obtain report etc., generally need six months), expense height of aging of product test period in the form test (a specification product needs about 100,000 yuan), the general user is beyond affordability.Though the power capacitor product that enterprise produces has passed through delivery test in factory,, the problem of product initial failure appears in regular meeting in the time of in the process that the user uses.Tracing it to its cause, is nothing but that material, design or production technology go wrong, and these problems wilfully are that a simple delivery test institute is indiscoverable.Capacitor aging testing method complexity in the prior art, do not carry out necessary relay protection yet, because quality the unknown of capacitor, fortuitous event appears easily in test, might the destructive test device during as superpotential or excess current even cause dangerous accident, there is bigger security risk; Existing test method is to test under the situation of normal temperature simultaneously, and the test period is long, the expense height, and energy consumption is big, uneconomical material benefit.
Summary of the invention
Technical matters to be solved by this invention is capacitor aging testing method complexity in the prior art, security is relatively poor, the test period is long, expense is high, energy consumption is big, thereby good, the consuming time weak point of a kind of security, metallization power capacitor quick aging test method that expense is low are provided.
For solving the problems of the technologies described above, the present invention is achieved by the following technical solutions:
A kind of metallization power capacitor quick aging test method comprises the steps:
S1: capacitance and the loss tangent of measuring and record detected metallization power capacitor;
S2: according to the rated voltage U of above-mentioned detected metallization power capacitor
NCalculate trial voltage U, U=kU
N, wherein k is the trial voltage coefficient, 1.5≤k≤1.75;
S3: closed test unit control power switch, regulate pressure regulator and make condenser voltage transfer to described trial voltage U;
S4: described detected metallization power capacitor is placed in the baking oven, described temperature of oven is transferred to preset temperature T, wherein 60 ℃≤T≤75 ℃;
S5: set the operation voltage of overvoltage protection according to described trial voltage, and set the action current of overcurrent protection according to the capacity of described detected metallization power capacitor;
S6: set default test period t, begin test;
S7: finish when presetting test period t, described test unit stops automatically, when treating that temperature of oven is down to normal temperature, take out described detected metallization power capacitor, or detected metallization power capacitor is damaged in default described test period t or during equipment failure, described test unit stops automatically, and shows failure cause, when treating that temperature of oven is down to normal temperature, take out described detected metallization power capacitor;
S8: capacitance and the loss tangent of measuring the described detected metallization power capacitor in test back, be analyzed with the data before the experiment, dissect described detected metallization power capacitor, observe the shelf depreciation of described detected power capacitor metalized film and the situation of self-healing.
The span of described voltage coefficient k is 1.6≤k≤1.65.
The span of described preset temperature T is 65 ℃≤T≤70 ℃.
The span of described default test period t is 45≤t≤50 hour.
Described trial voltage coefficient k=1.625, described preset temperature T=65 ℃.
Described Preset Time is 48 hours.
Among the described test procedure S2, described overvoltage protection also comprises the superpotential delay protection, and described overcurrent protection also comprises the excess current delay protection.
Described excess current delay protection comprises total current excess current delay protection, reactor excess current delay protection and capacitor excess current delay protection; Described superpotential delay protection is the overvoltage of capacitor delay protection.
Described test unit comprises:
The transformation module comprises transformer and pressure regulator, makes condenser voltage transfer to described trial voltage U by regulating pressure regulator;
Measurement metering protection module comprises that test period t metering units, access voltage measurement unit, condenser voltage measurement protected location, total current measurement protected location, reactor current measurement protected location, capacitor electrode flow measurement protected location, delay protection arrange unit and excess current, short-circuit current and superpotential indicating member;
Baking oven is used for providing the stationary temperature environment in process of the test, and metallization power capacitor to be measured is arranged in the described baking oven;
Control module is used for the control entire test.
Technique scheme of the present invention has the following advantages compared to existing technology:
(1) metallization power capacitor quick aging test method of the present invention comprises the steps: to measure and record capacitance and the loss tangent of detected metallization power capacitor; Rated voltage according to detected metallization power capacitor is calculated trial voltage; Closed experimental provision control power switch is regulated pressure regulator and is made condenser voltage transfer to described trial voltage; To be detected the metallization power capacitor and be placed in the described baking oven, temperature of oven will be transferred to preset temperature; Set the action current of overcurrent protection and the operation voltage of overvoltage protection; Set described default test period, begin test; When finishing default test period or equipment when breaking down, stop test unit, when treating that temperature of oven is down to normal temperature, take out detected metallization power capacitor; Measure the capacitance of the capacitor after testing, computed losses angle tangent value, the damaged condition of dissecting and observing capacitor electric power.Above-mentioned test method is by taking the measure of relay protection; security when having improved test; therefore can improve trial voltage; test more than trial voltage being increased to 1.6 times normal voltage; and provide higher test temperature by constant temperature oven; therefore effectively shorten test period, effectively avoided capacitor aging testing method complexity in the prior art, security is relatively poor, the test period is long, expense is high, energy consumption is big problem.
(2) metallization power capacitor quick aging test method of the present invention, be on the basis of traditional test method, trial voltage and test temperature have been improved simultaneously, test period was shortened to about 48 hours, shortened test period greatly, energy savings be the more important thing is production and the improvement of being convenient to subsequent product.
(3) metallization power capacitor quick aging test method of the present invention, when improving trial voltage, also increased the protection of excess current and superpotential action delay, the surge voltage that the overvoltage protection time-delay has effectively been avoided the instantaneous overvoltage that instantaneous voltage ripple of power network causes and produced when starting; The overcurrent protection time-delay has effectively been avoided surge current and has been started the excess current that moment produces, and has also improved the reliability height of test when improving experimental safe.
Description of drawings
Content of the present invention is easier clearly to be understood in order to make, and below in conjunction with accompanying drawing, the present invention is further detailed explanation, wherein,
Fig. 1 is the process flow diagram of metallization power capacitor quick aging test method of the present invention;
Fig. 2 is the structural representation of test unit of the present invention;
Fig. 3 is the main circuit electrical schematic diagram of test unit of the present invention;
Fig. 4 is the control circuit schematic diagram of test unit of the present invention;
Fig. 5 is the access voltage measurement unit circuit theory diagrams of test unit of the present invention;
Fig. 6 is that the condenser voltage of test unit of the present invention is measured the protected location circuit theory diagrams;
Fig. 7 is that the total current of test unit of the present invention is measured the protected location circuit theory diagrams;
Fig. 8 is that the reactor current of test unit of the present invention is measured the protected location circuit theory diagrams;
Fig. 9 is the capacitor electrode flow measurement protected location circuit theory diagrams of test unit of the present invention;
Figure 10 is the work indicating member circuit theory diagrams of test unit of the present invention;
Figure 11 is excess current and the superpotential indicating member circuit theory diagrams of test unit of the present invention.
Reference numeral is expressed as among the figure: 1-transformation module, 2-measures metering protection module, 3-control module, 4-constant temperature oven.
Embodiment
The process flow diagram of metallization power capacitor quick aging test method of the present invention as shown in Figure 1, it comprises the steps:
S1: capacitance and the loss tangent of measuring and record detected metallization power capacitor.
S2: according to the rated voltage U of detected metallization power capacitor
NCalculate trial voltage U, U=kU
N, wherein k is the trial voltage coefficient, 1.5≤k≤1.75.
In the present embodiment, described trial voltage coefficient k=1.625.
S3: closed test unit control power switch, regulate pressure regulator and make condenser voltage transfer to described trial voltage U.
S4: described detected metallization power capacitor is placed in the described baking oven, described temperature of oven is transferred to preset temperature T, wherein 60 ℃≤T≤75 ℃.
In the present embodiment, described preset temperature T=65 ℃.
S5: to the operation voltage of setting overvoltage protection, set the action current of overcurrent protection according to the capacity of described detected metallization power capacitor according to described trial voltage.
As other embodiment, described test procedure S2 also comprises the superpotential delay protection, and described overcurrent protection also comprises the excess current delay protection.Described excess current delay protection comprises total current excess current delay protection, reactor excess current delay protection and capacitor excess current delay protection; Described superpotential delay protection is the overvoltage of capacitor delay protection.Overvoltage protection time-delay is set to 10 seconds, the surge voltage of effectively having avoided the instantaneous overvoltage that instantaneous voltage ripple of power network causes and having produced when starting; The overcurrent protection time-delay is set to 2 seconds, has effectively avoided surge current and has started the excess current that moment produces, and has also improved the reliability of test unit when improving the test unit security.
S6: set default test period t, begin test.
Test period t is set at 48 hours under above-mentioned test condition.
S7: when finishing described default test period t, when treating that temperature of oven is down to normal temperature, take out described detected metallization power capacitor, detected metallization power capacitor is damaged in default described test period t or equipment failure constantly, stop test unit, and the demonstration failure cause, when treating that temperature of oven is down to normal temperature, take out described detected metallization power capacitor.
S8: capacitance and the loss tangent of measuring the described detected metallization power capacitor in test back, be analyzed with the data before the experiment, dissect described detected metallization power capacitor, observe the shelf depreciation of described detected power capacitor metalized film and the situation of self-healing.
As other embodiment, the span of described voltage coefficient k is 1.6≤k≤1.65, and the span of described preset temperature T is 65 ℃≤T≤70 ℃, and the span of described default test period t is 45≤t≤50 hour.Generally select test condition according to rated voltage, capacity, material, manufacturing process and the purposes of metallization power capacitor to be detected, set described default test period t by test condition.Repetition test by tens times proves, 0.1 times of the every raising of described trial voltage, and test period can reduce by half; 10 ℃ of the every raisings of test temperature, the aging test time of capacitor can reduce by half.
The purpose of aging test is the serviceable life of examination capacitor, and determine that the key problem in power capacitor serviceable life is the degree of shelf depreciation, when voltage surpasses 200VAC, if the material of power capacitor product and production technology go wrong, shelf depreciation will take place.The amount of shelf depreciation and voltage, temperature and time are in direct ratio, and voltage is more high, temperature is more high or service time is more long, and shelf depreciation is just more serious.Be 2 groups of 0.4kV15kvar metallization power capacitor quick aging test and according to the analysis data (each 4) of GB/T12747-2004 national standard aging test below, wherein 1#, 2#, 3# and 4# capacitor are a kind of production technology, and 5#, 6#, 7# and 8# capacitor are another kind of production technology:
Table 1650VAC, 65 ℃, 48h quick aging test data sheet:
The decline of electric capacity is respectively: 0.24%, 0.27%, 3.16% and 3.05%.
Table 2500VAC, 45 ℃, the conventional aging test record of 1500h:
The decline of electric capacity is respectively: 0.26%, 0.29%, 3.06% and 3.12%.
From 2 groups of tests as can be seen, the rising of the rising of the decline of the electric capacity of 1#, 2#, 5#, 6# and loss tangent and 3#, 4#, 7#, the decline of 8# electric capacity and loss tangent is on the same order of magnitude.
Again capacitor is dissected capacitor element, the outer ring of the element of 1#, 2#, 3#, 4# capacitor has only 5～7 circle shelf depreciations serious, and just normal substantially inward always afterwards, partial discharge phenomenon disappears, and face does not have the self-healing point substantially.And the outer ring of the element of 5#, 6#, 7#, 8# capacitor has 30～45 circle shelf depreciations serious, goes desultory shelf depreciation continuous more inside, until the back shelf depreciation just dies down about 400 circles, face does not have the self-healing point substantially yet.
Evidence, (production technology of 1#, 2#, 3#, 4# capacitor is identical for identical production technology, the production technology of 5#, 6#, 7#, 8# capacitor is identical), adopt GB/T12747-2004 aging test and quick aging test, the result of its test is the same substantially.
Above-mentioned test method is by taking the measure of relay protection; security when having improved test; therefore can improve trial voltage; test more than trial voltage being increased to 1.6 times normal voltage; and provide higher test temperature by constant temperature oven; therefore effectively shorten test period t, effectively avoided capacitor aging testing method complexity in the prior art, security is relatively poor, the test period is long, expense is high, energy consumption is big problem.
It is a kind of for the test unit of realizing metallization power capacitor quick aging test method that present embodiment also provides, extremely shown in Figure 11 as Fig. 2.
The structure of described test unit as shown in Figure 2, it comprises transformation module 1, measures metering protection module 2, control module 3, constant temperature oven 4.
Described transformation module 1 comprises transformer and pressure regulator, makes condenser voltage transfer to described trial voltage U by regulating pressure regulator.Described transformation module 1 comprises pressure regulator TYQ, transformer 1YH; The primary side of described pressure regulator TYQ and A.C. contactor 1QC transfer contact 1QC
1Common connect, described pressure regulator TYQ secondary side is connected with the primary side of described transformer 1YH, described transformer 1YH secondary side is connected with the metallization power capacitor that is detected.
Described measurement metering protection module 2 comprises that test period t metering units, access voltage measurement unit, condenser voltage measurement protected location, total current measurement protected location, reactor current measurement protected location, capacitor electrode flow measurement protected location, delay protection arrange unit and excess current, short-circuit current and superpotential indicating member.
As shown in Figure 3 and Figure 4, described test period t measuring unit comprises timer JSQ, described A.C. contactor 1QC transfer contact 1QC
3Described A.C. contactor 1QC transfer contact 1QC
3Common be connected described A.C. contactor 1QC transfer contact 1QC with the common port of control switch ZK
3Normally opened contact be connected with an end of described timer JSQ coil, the other end of described timer JSQ coil is connected with the zero line of described control power supply.
As Fig. 5 and shown in Figure 3, described access voltage measurement unit comprises voltage table 1V, is used for measuring the electrical source of power voltage that inserts, and described voltage table 1V is connected to the primary side terminals of described pressure regulator TYQ, and described electrical source of power is the alternating current of 380VAC.
As Fig. 6 and shown in Figure 3, described condenser voltage is measured protected location and is comprised voltage table 2V, voltage relay YJ, voltage transformer (VT) 2YH; Described voltage transformer (VT) 2YH primary side is connected to the secondary side of described transformer 1YH, one end of described voltage transformer (VT) 2YH secondary side is connected jointly with the end of the end of described voltage table 2V with described voltage relay YJ coil, and the other end of described voltage transformer (VT) 2YH secondary side is connected with the other end of described voltage table 2V with the other end of described voltage relay YJ coil and is connected jointly.
As shown in Figure 7, described total current is measured protected location and is comprised current transformer 1LHa, 1LHb, 1LHc, current relay 1DJ, 1DJ ', 1DJ 〞, current relay 4DJ, reometer 1A, described total current is measured protected location and respectively A, B, the C three-phase current of total current is carried out excess current measurement protection; Described current transformer 1LHa primary side is connected in the A phase connection of described pressure regulator TYQ primary side terminals, one end of the described current relay 1DJ ' coil of one termination of described current transformer 1LHa secondary side, the other end of the described current transformer 1LHa of another termination secondary side of described current relay 1DJ ' coil; The primary side of described mutual inductor 1LHb is connected in the B phase connection of primary side terminals of described pressure regulator TYQ, one end of described current transformer 1LHb secondary side is connected with an end of described current relay 1DJ coil, the other end of described current relay 1DJ coil is connected with the end of described reometer 1A, the other end of described reometer 1A is connected with an end of described current relay 4DJ coil, and the other end of described current relay 4DJ coil is connected with the other end of described current transformer 1LHb secondary side; Described current transformer 1LHc primary side is connected in the C phase connection of described pressure regulator TYQ primary side terminals, one end of the described current relay 1DJ of the one termination 〞 coil of described current transformer 1LHc secondary side, the other end of the described current transformer 1LHc of another termination secondary side of described current relay 1DJ 〞 coil.
As Fig. 3 and shown in Figure 8, described reactor current is measured protected location and is comprised reactor DKQ, current transformer 2LHb, current relay 2DJ, reometer 2A; The primary side of described mutual inductor 2LHb is connected in the B phase connection of described reactor DKQ terminals, one end of described mutual inductor 2LHb secondary side is connected with an end of described current relay 2DJ coil, one end of the 2DJ coil of described current relay and the end of described reometer 2A be connected, the other end of described reometer 2A is connected with the other end of described mutual inductor 2LHb secondary side.
As Fig. 3 and shown in Figure 9, described capacitor electrode flow measurement protected location comprises current transformer 3LHa, 3LHb, 3LHc, reometer 3A, 4A, 5A, current relay 3DJ, detected metallization power capacitor DRQ; The primary side of described current transformer 3LHa is connected in the A phase connection of detected metallization power capacitor DRQ terminals, A, B, C three-phase current to capacitor carries out excess current measurement protection respectively, secondary side one end of described current transformer 3LHa is connected with the end of described reometer 4A, and the other end of described reometer 4A is connected with an end of described current transformer 3LHa secondary side; The primary side of described current transformer 3LHb is connected in the B phase connection of detected described metallization power capacitor DRQ terminals, one end of the secondary side of described current transformer 3LHb is connected with an end of described current relay 3DJ coil, the other end of described current relay 3DJ coil is connected with the end of described reometer 3A, and the other end of described reometer 3A is connected with the other end of described current transformer 3LHb secondary side; The primary side of described current transformer 3HLc is connected in the C phase connection of described detected metallization power capacitor DRQ terminals, the end of the described reometer 5A of secondary one termination of described current transformer 3HLc, the other end of described reometer 5A is connected with the other end of described mutual inductor 3LHc secondary side.
As shown in Figure 4, described delay protection arranges the unit and comprises time relay 1SJ, 2SJ, intermediate relay ZJ coil, time relay 1SJ transfer contact 1SJ
1, time relay 2SJ transfer contact 2SJ
1, intermediate relay ZJ transfer contact ZJ
1, current relay 1DJ transfer contact 1DJ
1, current relay 1DJ ' transfer contact 1DJ
1', current relay 1DJ 〞 transfer contact 1DJ
1〞, current relay 2DJ transfer contact 2DJ
1, current relay 3DJ transfer contact 3DJ
1, voltage relay YJ transfer contact YJ
1Described time relay 1SJ transfer contact 1SJ
1Common and described time relay 2SJ transfer contact 2SJ
1Common connect the common port of described control switch ZK, described time relay 1SJ transfer contact 1SJ jointly
1Normally opened contact and described time relay 2SJ transfer contact 2SJ
1Normally opened contact connect an end of described intermediate relay ZJ coil, the zero line of the described control power supply of another termination of described intermediate relay ZJ coil jointly; Described current relay 1DJ transfer contact 1DJ
1, described current relay 1DJ ' transfer contact 1DJ
1', described current relay 1DJ 〞 transfer contact 1DJ
1〞, described current relay 2DJ transfer contact 2DJ
1, described current relay 3DJ transfer contact 3DJ
1Common connect the common port of described control switch ZK, described current relay 1DJ transfer contact 1DJ jointly
1, described current relay 1DJ ' transfer contact 1DJ
1', described current relay 1DJ 〞 transfer contact 1DJ
1〞, current relay 2DJ transfer contact 2DJ
1, current relay 3DJ transfer contact 3DJ
1Normally opened contact connect an end of described time relay 1SJ coil, the zero line of the described control power supply of another termination of described time relay 1SJ coil jointly; Described voltage relay YJ transfer contact YJ
1Common connect the common port of described control switch ZK, described voltage relay YJ transfer contact YJ
1Normally opened contact connect an end of described time relay 2SJ coil, the zero line of the described control power supply of another termination of described time relay 2SJ coil.
As shown in figure 11, described excess current, short-circuit current and overvoltage signal display unit comprise signal relay 1XJ, 2XJ, 3XJ, 4XJ, current relay 1DJ transfer contact 1DJ
2, current relay 1DJ ' transfer contact 1DJ
2', current relay 1DJ 〞 transfer contact 1DJ
2〞, current relay 2DJ transfer contact 2DJ
2, current relay 3DJ transfer contact 3DJ
2, voltage relay YJ transfer contact YJ
2Described current relay 1DJ transfer contact 1DJ
2, described current relay 1DJ ' transfer contact 1DJ
2', described current relay 1DJ 〞 transfer contact 1DJ
2The common of 〞 is connected with the common of described control switch ZK, described current relay 1DJ transfer contact 1DJ
2, described current relay 1DJ ' transfer contact 1DJ
2', described current relay 1DJ 〞 transfer contact 1DJ
2The normally opened contact of 〞 is connected with an end of described signal relay 1XJ coil, and the other end of described signal relay 1XJ coil is connected with the zero line of described control power supply; Described current relay 2DJ transfer contact 2DJ
2Normally opened contact be connected with an end of described signal relay 2XJ coil, the other end of described signal relay 2XJ coil is connected with the zero line of described control power supply; Described current relay 3DJ transfer contact 3DJ
2Normally opened contact be connected with an end of described signal relay 3XJ coil, the other end of described signal relay 3XJ coil is connected with the zero line of described control power supply; Described current relay YJ transfer contact YJ
2Normally opened contact be connected with an end of described signal relay 4XJ coil, the other end of described signal relay 4XJ coil is connected with the zero line of described control power supply.
Described excess current, short-circuit current and superpotential indicating member carry out fault to total current excess current, reactor excess current, capacitor excess current, short-circuit current and overvoltage of capacitor fault by signal relay respectively and show, are conducive to detection and processing when device broken down.
Described baking oven 4 is used for providing the stationary temperature environment in process of the test, and described detected metallization power capacitor is arranged in the described baking oven.
Described control module 3 is used for the control entire test.
Described control module 3 comprises operation control module, baking oven control module and work indicating member.As shown in Figures 2 and 3, described operation control module comprises air-break DK transfer contact DK
1, A.C. contactor 1QC, A.C. contactor 1QC transfer contact 1QC
1, 1QC
2, 1QC
4, current relay 4DJ transfer contact 4DJ
1, start button QA, stop button TA, control switch ZK, timer JSQ transfer contact JSQ
1, intermediate relay ZJ transfer contact ZJ
1Described baking oven control module comprises A.C. contactor 2QC, A.C. contactor 2QC transfer contact 2QC
1, A.C. contactor 1QC transfer contact 1QC
4Described air-break DK Chang Kaiduan is connected with described electrical source of power terminals, described air-break DK common and described A.C. contactor 1QC transfer contact 1QC
1Connect, the Chang Kaiduan of described control switch ZK is connected with the live wire of control power supply, the common of described stop button TA is connected with the common port of described control switch ZK, the common of the normally closed contact of described stop button TA and described start button QA and described A.C. contactor 1QC
2Common connect the normally opened contact of described start button QA and described A.C. contactor 1QC transfer contact 1QC jointly
2Normally opened contact be connected the other end of described A.C. contactor 1QC coil and described A.C. contactor 4DJ transfer contact 4DJ jointly with an end of described A.C. contactor 1QC coil
1Common connect described A.C. contactor 4DJ transfer contact 4DJ
1Normally closed contact and described timer JSQ transfer contact JSQ
1Common connect described timer JSQ transfer contact JSQ
1Normally closed contact and described A.C. contactor ZJ transfer contact ZJ
1Common connect described A.C. contactor ZJ
1The normally closed contact of transfer contact is connected with the zero line of described control power supply; Described A.C. contactor 2QC transfer contact 2QC
1Normally opened contact be connected described A.C. contactor 1QC transfer contact 1QC with the supply terminals of described constant temperature oven
4Common be connected described A.C. contactor 1QC transfer contact 1QC with the common port of described control switch ZK
4Normally opened contact be connected with an end of described A.C. contactor 2QC coil, the other end of described A.C. contactor 2QC coil is connected with the zero line of described control power supply.
As shown in figure 10, described work indicating member comprises signal lamp 1XD, 2XD, 3XD, described A.C. contactor 1QC transfer contact 1QC
5, described A.C. contactor 2QC transfer contact 2QC
2The end of described signal lamp 1XD is connected with the positive pole of control power supply, and the other end of described signal lamp 1XD is connected described A.C. contactor 1QC transfer contact 1QC with the negative pole of control power supply
5Common connect the positive pole of described control power supply, described A.C. contactor 1QC transfer contact 1QC
5Normally opened contact connect the end of described signal lamp 2XD, the negative pole of the described control power supply of another termination of described signal lamp 2XD, described A.C. contactor 2QC transfer contact 2QC
2Common connect the positive pole of described control power supply, described A.C. contactor 2QC transfer contact 2QC
2Normally opened contact connect the end of described signal lamp 3XD, the negative pole of the described control power supply of another termination of described signal lamp 3XD.Described work indicating member comprises power supply operation, capacitor run indicator and baking oven run indicator, and the duty of power supply, capacitor and baking oven is come into plain view.
The excess current delay protection is the A to total current; B; the C three-phase; the B of reactor protects mutually with the B of capacitor mutually; in case excess current appears in any one of these five electric currents; corresponding current transformer 1LHa; 1LHb; 1LHc; 2LHb and 3LHb all can make corresponding current relay 1DJ; 1DJ '; 1DJ 〞; 2DJ and 3DJ(action current threshold value setting value are 1.3 times of rated current) action; thereby make time relay 1SJ coil motion; delay time through 2 seconds (hiding the combined floodgate moment excess current of surge current and the capacitor of electrical network); the normally opened contact closure of time relay 1SJ; the intermediate relay ZJ coil electricity; described intermediate relay ZJ coil is charged, the transfer contact ZJ of described intermediate relay ZJ
1Switch to normally opened contact, described A.C. contactor 1QC coil losing electricity, the transfer contact 1QC of described A.C. contactor 1QC
1Switch to normally opened contact, whole device operation is withdrawed from, and finishes protection.
The short-circuit current transient protection be located at total current B mutually in; in a single day short circuit appears in described total current B phase current mutual inductor 1LHb; described current relay 4DJ(action current threshold value setting value is 3 times of rated current) coil is charged, described current relay 4DJ transfer contact 4DJ
1Switch to normally opened contact, described A.C. contactor 1QC coil losing electricity, the transfer contact 1QC of described A.C. contactor 1QC
1Switch to normally opened contact, whole device operation is withdrawed from, and finishes protection.
The superpotential delay protection is located at the secondary side of described transformer 1YH; in case superpotential appears in described trial voltage; the voltage of voltage transformer (VT) 2YH output is 1.1 times of rated voltages with voltage relay YJ(operation voltage threshold value setting value) coil connect; make the time relay 2SJ in the superpotential timing circuit move; through 10 seconds (hiding the surge voltage of electrical network) time-delay, the transfer contact 2SJ of time relay 2SJ
1Switch to normally opened contact, the intermediate relay ZJ coil electricity, described intermediate relay ZJ coil is charged, the transfer contact ZJ of described intermediate relay ZJ
1Switch to normally opened contact, described A.C. contactor 1QC coil losing electricity, the transfer contact 1QC of described A.C. contactor 1QC
1Switch to normally opened contact, whole device operation is withdrawed from, and finishes protection.
Obviously, above-described embodiment only is for example clearly is described, and is not the restriction to embodiment.For those of ordinary skill in the field, can also make other changes in different forms on the basis of the above description.Here need not also can't give all embodiments exhaustive.And the apparent variation of being extended out thus or change still are among the protection domain of the invention.
Claims (9)
1. a metallization power capacitor quick aging test method is characterized in that, comprises the steps:
S1: capacitance and the loss tangent of measuring and record detected metallization power capacitor;
S2: according to the rated voltage U of above-mentioned detected metallization power capacitor
NCalculate trial voltage U, U=kU
N, wherein k is the trial voltage coefficient, 1.5≤k≤1.75;
S3: closed test unit control power switch, regulate pressure regulator and make condenser voltage transfer to described trial voltage U;
S4: described detected metallization power capacitor is placed in the baking oven, described temperature of oven is transferred to preset temperature T, wherein 60 ℃≤T≤75 ℃;
S5: set the operation voltage of overvoltage protection according to described trial voltage, and set the action current of overcurrent protection according to the capacity of described detected metallization power capacitor;
S6: set default test period t, begin test;
S7: finish when presetting test period t, described test unit stops automatically, when treating that temperature of oven is down to normal temperature, take out described detected metallization power capacitor, or detected metallization power capacitor is damaged in default described test period t or during equipment failure, described test unit stops automatically, and shows failure cause, when treating that temperature of oven is down to normal temperature, take out described detected metallization power capacitor;
S8: capacitance and the loss tangent of measuring the described detected metallization power capacitor in test back, be analyzed with the data before the experiment, dissect described detected metallization power capacitor, observe the shelf depreciation of described detected power capacitor metalized film and the situation of self-healing.
2. metallization power capacitor quick aging test method according to claim 1, it is characterized in that: the span of described voltage coefficient k is 1.6≤k≤1.65.
3. metallization power capacitor quick aging test method according to claim 1 and 2 is characterized in that: the span of described preset temperature T is 65 ℃≤T≤70 ℃.
4. according to claim 2 or 3 described metallization power capacitor quick aging test methods, it is characterized in that: the span of described default test period t is 45≤t≤50 hour.
5. according to the arbitrary described metallization power capacitor quick aging test method of claim 1-3, it is characterized in that: described trial voltage coefficient k=1.625, described preset temperature T=65 ℃.
6. metallization power capacitor quick aging test method according to claim 5, it is characterized in that: described default test period t is 48 hours.
7. according to the arbitrary described metallization power capacitor quick aging test method of claim 1-6; it is characterized in that: among the described test procedure S2; described overvoltage protection also comprises the superpotential delay protection, and described overcurrent protection also comprises the excess current delay protection.
8. according to the arbitrary described metallization power capacitor quick aging test method of claim 1-7, it is characterized in that: described excess current delay protection comprises total current excess current delay protection, reactor excess current delay protection and capacitor excess current delay protection; Described superpotential delay protection is the overvoltage of capacitor delay protection.
9. according to the arbitrary described metallization power capacitor quick aging test method of claim 1-8, it is characterized in that described test unit comprises:
The transformation module comprises transformer and pressure regulator, makes condenser voltage transfer to described trial voltage U by regulating pressure regulator;
Measurement metering protection module comprises that test period t metering units, access voltage measurement unit, condenser voltage measurement protected location, total current measurement protected location, reactor current measurement protected location, capacitor electrode flow measurement protected location, delay protection arrange unit and excess current, short-circuit current and superpotential indicating member;
Baking oven is used for providing the stationary temperature environment in process of the test, and metallization power capacitor to be measured is arranged in the described baking oven;
Control module is used for the control entire test.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310267249.4A CN103293425B (en) | 2013-06-28 | 2013-06-28 | A kind of Metallized power capacitor Accelarated aging test method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310267249.4A CN103293425B (en) | 2013-06-28 | 2013-06-28 | A kind of Metallized power capacitor Accelarated aging test method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103293425A true CN103293425A (en) | 2013-09-11 |
| CN103293425B CN103293425B (en) | 2016-03-30 |
Family
ID=49094635
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201310267249.4A Active CN103293425B (en) | 2013-06-28 | 2013-06-28 | A kind of Metallized power capacitor Accelarated aging test method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN103293425B (en) |
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103743965A (en) * | 2013-11-15 | 2014-04-23 | 南通大学 | Aluminum electrolytic capacitor batch aging process real-time monitoring and measuring apparatus |
| CN105372524A (en) * | 2015-11-04 | 2016-03-02 | 南通新三能电子有限公司 | Large soldering pin type aging method |
| CN106771715A (en) * | 2016-11-24 | 2017-05-31 | 中车永济电机有限公司 | A kind of electric transmission DC support electric capacity life-span checking test method |
| CN106855596A (en) * | 2016-12-27 | 2017-06-16 | 深圳市汇北川电子技术有限公司 | A kind of life test method of new-energy automobile metallic film capacitor |
| CN112731033A (en) * | 2020-12-25 | 2021-04-30 | 潘佳佳 | Intelligent high-temperature-resistant film capacitor detection system |
| CN113203924A (en) * | 2021-04-29 | 2021-08-03 | 国网四川省电力公司电力科学研究院 | Capacitor impact aging degree prediction method based on partial discharge detection |
| CN113358159A (en) * | 2021-07-08 | 2021-09-07 | 无锡市电力滤波有限公司 | Method for inspecting metallized polypropylene film for direct-current support capacitor |
| CN113447779A (en) * | 2021-07-15 | 2021-09-28 | 桂林电力电容器有限责任公司 | Direct-current support capacitor aging accelerated tolerance test circuit and test method |
| CN113917291A (en) * | 2021-09-03 | 2022-01-11 | 国网电力科学研究院武汉南瑞有限责任公司 | Device and method for withstand voltage test and performance measurement of capacitor element |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03241804A (en) * | 1990-02-20 | 1991-10-29 | Matsushita Electric Ind Co Ltd | Chip type metallized film capacitor |
| JPH08102427A (en) * | 1994-09-30 | 1996-04-16 | Matsushita Electric Ind Co Ltd | Film capacitor |
| JP2013069830A (en) * | 2011-09-22 | 2013-04-18 | Kojima Press Industry Co Ltd | Aging device for film capacitor |
-
2013
- 2013-06-28 CN CN201310267249.4A patent/CN103293425B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03241804A (en) * | 1990-02-20 | 1991-10-29 | Matsushita Electric Ind Co Ltd | Chip type metallized film capacitor |
| JPH08102427A (en) * | 1994-09-30 | 1996-04-16 | Matsushita Electric Ind Co Ltd | Film capacitor |
| JP2013069830A (en) * | 2011-09-22 | 2013-04-18 | Kojima Press Industry Co Ltd | Aging device for film capacitor |
Non-Patent Citations (5)
| Title |
|---|
| 严璋: "金属化膜电容器老化判据的选择", 《电力电容器》, no. 2, 31 December 1994 (1994-12-31), pages 1 - 5 * |
| 代新 等: "金属化聚丙烯膜脉冲电容器端部接触老化研究", 《中国电机工程学报》, vol. 21, no. 8, 31 August 2001 (2001-08-31), pages 51 - 54 * |
| 吴集 等: "金属化电容器产品的可靠性研究", 《电力电容器》, no. 3, 31 December 2001 (2001-12-31), pages 10 - 13 * |
| 国家质量技术监督局: "《中华人民共和国国家标准 GB/T17886.2-1999》", 10 October 1999, article "标称电压1kV及以下交流电力系统用非自愈式并联电容器 第2部分:老化试验和破坏试验", pages: 1-4 * |
| 金玲 等: "金属化电容器老化试验1000次充放电试验过程中容量损耗监测的探讨", 《电力电容器》, no. 3, 31 December 1996 (1996-12-31), pages 22 - 24 * |
Cited By (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103743965B (en) * | 2013-11-15 | 2016-06-08 | 南通大学 | A kind of aluminium electrolutic capacitor batch aging real-time process monitoring and measurement apparatus |
| CN103743965A (en) * | 2013-11-15 | 2014-04-23 | 南通大学 | Aluminum electrolytic capacitor batch aging process real-time monitoring and measuring apparatus |
| CN105372524B (en) * | 2015-11-04 | 2018-03-16 | 南通新三能电子有限公司 | A kind of aging method of large-scale welding needle type capacitor |
| CN105372524A (en) * | 2015-11-04 | 2016-03-02 | 南通新三能电子有限公司 | Large soldering pin type aging method |
| CN106771715B (en) * | 2016-11-24 | 2019-03-08 | 中车永济电机有限公司 | A kind of electric transmission DC support capacitor service life checking test method |
| CN106771715A (en) * | 2016-11-24 | 2017-05-31 | 中车永济电机有限公司 | A kind of electric transmission DC support electric capacity life-span checking test method |
| CN106855596A (en) * | 2016-12-27 | 2017-06-16 | 深圳市汇北川电子技术有限公司 | A kind of life test method of new-energy automobile metallic film capacitor |
| CN106855596B (en) * | 2016-12-27 | 2019-05-28 | 深圳市汇北川电子技术有限公司 | A kind of life test method of new-energy automobile metallic film capacitor |
| CN112731033A (en) * | 2020-12-25 | 2021-04-30 | 潘佳佳 | Intelligent high-temperature-resistant film capacitor detection system |
| CN112731033B (en) * | 2020-12-25 | 2022-07-19 | 山东胜利通海集团东营天蓝节能科技有限公司 | Intelligent high-temperature-resistant film capacitor detection system |
| CN113203924A (en) * | 2021-04-29 | 2021-08-03 | 国网四川省电力公司电力科学研究院 | Capacitor impact aging degree prediction method based on partial discharge detection |
| CN113358159A (en) * | 2021-07-08 | 2021-09-07 | 无锡市电力滤波有限公司 | Method for inspecting metallized polypropylene film for direct-current support capacitor |
| WO2022083798A1 (en) * | 2021-07-08 | 2022-04-28 | 无锡市电力滤波有限公司 | Inspection method for metallized polypropylene film for dc link capacitor |
| CN113447779A (en) * | 2021-07-15 | 2021-09-28 | 桂林电力电容器有限责任公司 | Direct-current support capacitor aging accelerated tolerance test circuit and test method |
| CN113917291A (en) * | 2021-09-03 | 2022-01-11 | 国网电力科学研究院武汉南瑞有限责任公司 | Device and method for withstand voltage test and performance measurement of capacitor element |
Also Published As
| Publication number | Publication date |
|---|---|
| CN103293425B (en) | 2016-03-30 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN103293425B (en) | A kind of Metallized power capacitor Accelarated aging test method | |
| CN103344861B (en) | A kind of Metallized power capacitor Accelarated aging test device | |
| CN202210109U (en) | Metering box capable of electrically replacing electric meter and current transformer | |
| CN203117319U (en) | Combination waveform generator | |
| CN205027865U (en) | Dry -type air -core reactor interturn insulation electrical ageing test system | |
| CN105467239A (en) | Voltage transformer excitation characteristic test system | |
| CN203385805U (en) | Metalized power capacitor rapid aging testing device | |
| CN103616581B (en) | The method of without disconnecting power lead test reactive power compensator | |
| CN205643677U (en) | Hand -held type current transformer voltage -current characteristic tester | |
| CN104330650A (en) | Total current based live-line test method of zinc oxide lightning arrester group | |
| CN204155513U (en) | Electric shock experience device | |
| CN206339637U (en) | A kind of power detecting system | |
| CN202268244U (en) | Current transformer | |
| CN109581156A (en) | A kind of high-voltage mutual inductor pressure test method for semi-automatically detecting | |
| Chen et al. | Fault detection and analysis of voltage transformer secondary terminal based on infrared temperature measurement technology | |
| CN201378184Y (en) | Triphase four-wire system high voltage electric energy meter | |
| CN204359884U (en) | A kind of Power Transformer in Field load testing apparatus | |
| CN203504192U (en) | High-voltage step voltage and capacitance regulating reactive compensation complete equipment | |
| CN203502551U (en) | Circuit capable of testing overloading tolerance capability of capacitors connected in series | |
| CN203519775U (en) | Circuit for testing series capacitor overload tolerance capacity | |
| CN203491912U (en) | Power supply device of extra high voltage alternate current and direct current pollution tests | |
| CN202102079U (en) | Extra-high voltage direct current-alternating current testing equipment | |
| Zhang et al. | Research on the implementation scheme of shunt capacitor protection and monitoring | |
| CN105137311A (en) | Dry-type air-core reactor turn-to-turn insulation electrical aging test system and test method thereof | |
| CN201584672U (en) | Novel power distribution and transformation device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |