CN103278127A - Method for calculating outline data of element to be measured - Google Patents

Method for calculating outline data of element to be measured Download PDF

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Publication number
CN103278127A
CN103278127A CN2013102464129A CN201310246412A CN103278127A CN 103278127 A CN103278127 A CN 103278127A CN 2013102464129 A CN2013102464129 A CN 2013102464129A CN 201310246412 A CN201310246412 A CN 201310246412A CN 103278127 A CN103278127 A CN 103278127A
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intersection point
measurement mechanism
line
under test
profile
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廖建硕
徐国祥
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AISIDI OPTICAL TECHNOLOGY (SUZHOU) Co Ltd
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AISIDI OPTICAL TECHNOLOGY (SUZHOU) Co Ltd
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Abstract

The invention provides a method for calculating outline data of an element to be measured. An entity of the element to be measured is measured and calculated through a measuring device. The method comprises the steps that a mass center of a first element body and a mass center of a second element body on the element to be measured are obtained through the measuring device; a mass center line is planned and the mass center line passes through the two mass centers; a first datum line perpendicular to the mass center line and passing through the mass center of the first element body is planned; a second datum line perpendicular to the mass center line and passing through the mass center of the second element body is planned; at least one perpendicular line is planned, wherein the perpendicular line is perpendicular to the datum line and at least two points of intersection are generated by the perpendicular line and the periphery of an outline of the first element body; the coordinate positions of the at least two points of intersection are obtained through calculation; the coordinate positions of the at least two points of intersection are recorded. According to the method for calculating the outline data of the element to be measured, the coordinate positions of the points of intersection can be measured through the measuring device, the length between the points of intersection can be calculated through the measuring device, so that the outline data of the element to be measured are obtained. Therefore, assembly is convenient.

Description

Calculate the method for the outline data of element under test
Technical field
The present invention is relevant for a kind of computing method of element under test, and more relevant for a kind of method of outline data of the entity that is used for calculating element under test.
Background technology
In general, assembler on the production line is according to set program, the required a plurality of assembly elements for the treatment of of product are assembled, used being combined into a complete product, for example a product may be made up of three elements such as treating assembly element A, B, C.And above-mentioned each treats assembly element and normally makes in a large number via machine, for example made components identical A in a large number, made components identical B in a large number, made components identical C in a large number by machine C by machine B by machine A.Therefore when assembling, assembler only need be in a plurality of identical the treating in the assembly element of storage, arbitrarily chooses one and assemble and get final product.
Yet, in a large amount of productions above-mentioned treat assembly element the time, may be because of the temperature of having used different batches materials, error that machine itself produces or having controlled production line or even storage environment by different operating personnel factor on an equal basis, make same the same assembly element (for example element A) for the treatment of that produces line or same machine institute output, it may produce a little error on profile.Thus, use the different assembly elements for the treatment of to assemble (for example element A-1, element A-2 etc.), may make product have different packing problem (for example two excesssive gaps for the treatment of between the assembly element are perhaps assembled surface irregularity etc.), and cause the assembling quality of product to descend.
Summary of the invention
Fundamental purpose of the present invention, be to provide a kind of method of calculating the outline data of element under test, can measure and calculate the entity of element under test by measurement mechanism, also be stored with the outline data that draws element under test, be beneficial to the assembling of element under test and other elements by this.
In order to achieve the above object, the invention provides a kind of method of calculating the outline data of element under test, by the computing of measurement mechanism institute, this element under test is made up of one first element and one second element, and this method comprises:
A) this measurement mechanism respectively measurement obtain the barycenter of this first element and the barycenter of this second element;
B) this measurement mechanism is planned a mass center line, and it connects the barycenter of this first element and the barycenter of this second element;
C) this measurement mechanism is planned one first datum line, and wherein this first datum line is perpendicular to this mass center line, and this first datum line is by the barycenter of this first element;
D) this measurement mechanism is planned at least one perpendicular line, wherein this perpendicular line is perpendicular to this first datum line, and this perpendicular line not with any line overlaid perpendicular to this first datum line, wherein the profile periphery of this perpendicular line and this first element produces at least two intersection points, and this measurement mechanism draws the coordinate data of this at least two intersection point as calculated;
E) record the coordinate data of this at least two intersection point; And
F) this measurement mechanism defines the profile of this element under test according to the coordinate data of the position of having a few of recording.
As mentioned above, wherein this first element and this second element protrude from the surface of this element under test, are two ridges that separate on this element under test, and the bottom of this first element and this second element links to each other, and has fixing relative position.
As mentioned above, wherein this measurement mechanism has an image acquisition unit and a microprocessing unit, and this step a more comprises the following steps:
A1) be respectively the entity acquisition corresponding elements image of this first element and this second element by this image acquisition unit; And
A2) by this microprocessing unit this two element image is calculated, use this barycenter by this barycenter of finding out this first element in this two element image and this second element.
As mentioned above, wherein this image acquisition unit is a charge coupled cell, this microprocessing unit by Labview software to the perform calculations calculating of method of this two element image.
As mentioned above, wherein among this step b, the profile periphery of this mass center line and this first element intersects at least one intersection point, and the profile periphery of this mass center line and this second element intersects at least two intersection points, this measurement mechanism draws the coordinate data of this at least three intersection point as calculated, and records the coordinate data of this three intersection point simultaneously.
As mentioned above, wherein among this step c, the profile left side of this first datum line and this first element produces a left intersection point, and the profile right side of this first datum line and this first element produces a right intersection point, this measurement mechanism draws the coordinate data of this left side intersection point and this right side intersection point as calculated, and this measurement mechanism records the coordinate data of this left side intersection point and this right side intersection point simultaneously.
As mentioned above, wherein comprise the following steps: after this step c
C1) this measurement mechanism is sought the mid point of a defective camber line on the profile right side of this first element;
C2) this first datum line is made progress translation makes this first datum line by the mid point of this defective camber line, and keeps vertical with this mass center line;
C3) profile of first datum line after this translation and this first element left side produces a left intersection point, and produce a right intersection point with the profile right side of this first element, this measurement mechanism draws the coordinate data of this left side intersection point and this right side intersection point as calculated, and this measurement mechanism records the coordinate data of this left side intersection point and this right side intersection point simultaneously, should right side intersection point be the mid point of this defective camber line wherein.
As mentioned above, wherein this steps d more comprises the following steps:
D1) calculate the barycenter of this first element and the first nodal point between this left side intersection point;
D2) planning one first perpendicular line, wherein this first perpendicular line is perpendicular to this first datum line and by this first nodal point, and crossing at least two intersection points of the profile periphery of this first perpendicular line and this first element;
D3) calculate the barycenter of this first element and one second central point between this right side intersection point; And
D4) planning one second perpendicular line, wherein this second perpendicular line is perpendicular to this first datum line and by this second central point, and crossing at least two intersection points of the profile periphery of this second perpendicular line and this first element.
As mentioned above, wherein more comprise the following steps: before this step f
G) this measurement mechanism is planned one second datum line, and wherein this second datum line is perpendicular to this mass center line, and this second datum line is by the barycenter of this second element;
H) calculate the left intersection point that intersect in the profile left side of this second datum line and this second element, and a right intersection point that intersects with the profile right side of this second element; And
I) this measurement mechanism records the coordinate data of this left side intersection point and this right side intersection point.
As mentioned above, wherein more comprise the following steps: before this step f
J) length of the have a few position of this barycenter that calculates this first element to the profile periphery of this first element;
K) length of the have a few position of this barycenter that calculates this second element to the profile periphery of this second element;
L) this barycenter that calculates this first element to the profile periphery of this second element this left side intersection point and the length of this right side intersection point; And
M) this measurement mechanism records these length;
Wherein, among this step f, this measurement mechanism is the coordinate data according to the position of having a few of recording, and all length that records, and defines the profile of this element under test.
The technology effect that the present invention can reach against existing technologies is: in advance the entity of this element under test is measured and calculated, to draw the coordinate position of a plurality of positions on the element under test periphery, and the length between the some position, and define the profile of the entity of this element under test by these coordinate positions and length.When this element under test will be assembled with other elements, can by with the comparison of the profile of this element under test, select the assembly an of the best to assemble.Thus, can allow the best assembling thing of assembly line output assembling quality (for example the tolerance minimum between the assembly, joint the tightst etc.).
Description of drawings
Fig. 1 is the measuring system synoptic diagram of first specific embodiment of the present invention;
Fig. 2 is the measuring system calcspar of first specific embodiment of the present invention;
Fig. 3 is that first of first specific embodiment of the present invention is measured process flow diagram;
Fig. 4 is that second of first specific embodiment of the present invention is measured process flow diagram;
Fig. 5 is that the 3rd of first specific embodiment of the present invention is measured process flow diagram;
Fig. 6 is the first profile synoptic diagram of first specific embodiment of the present invention;
Fig. 7 is the second profile synoptic diagram of first specific embodiment of the present invention;
Fig. 8 is the wide synoptic diagram of the third round of first specific embodiment of the present invention;
Fig. 9 is the wide synoptic diagram of the fourth round of first specific embodiment of the present invention;
Figure 10 is that the 4th of first specific embodiment of the present invention is measured process flow diagram;
Figure 11 is the 5th profile synoptic diagram of first specific embodiment of the present invention;
Figure 12 is the profile synoptic diagram of second specific embodiment of the present invention;
Figure 13 is the profile synoptic diagram of the 3rd specific embodiment of the present invention.
Wherein, Reference numeral:
1,8,9 ... element under test; 11,81,91 ... first element;
110 ... the defective radian
111,811,911 ... barycenter; 12,82,92 ... second element;
121,821,921 ... barycenter; 2 ... mass center line;
21,22,23 ... intersection point; 3 ... first datum line;
301 ... first nodal point; 302 ... second central point;
31 ... left side intersection point; 32 ... right intersection point;
4 ... perpendicular line; 41 ... first perpendicular line;
42 ... second perpendicular line;
401,4011,4012,402,4021,4022 ... intersection point;
5 ... second line; 51 ... left side intersection point;
52 ... right intersection point; 6 ... measurement mechanism;
61 ... image acquisition unit; 62 ... microprocessing unit;
7 ... database; 71 ... the element image;
72 ... coordinate data; S10~S36 ... step;
S38~S42 ... step; S50~S54 ... step;
S60~S66 ... step L1~L13 ... length
Embodiment
Head sees also Fig. 1 and Fig. 2, is respectively measuring system synoptic diagram and the calcspar of first specific embodiment of the present invention.The method of the outline data of the disclosed calculating element under test of this case, mainly be to operate among the measurement mechanism 6, as shown in the figure, this measurement mechanism 6 can be arranged on the production line, in order to the entity of an element under test 1 is measured and is calculated, by this, define the profile of the entity of this element under test 1, and be stored in the database 7 that is connected with this measurement mechanism 6.
As shown in Figure 1, sustainablely on the production line provide a plurality of identical appearance, but size, size may have the entity of this element under test 1 of a little error, and transfer to this measurement mechanism 6 and measure and calculate, and are stored by this database 7 and measure and the profile related data of calculating gained.When assembly line will be with the entity of this element under test 1 and other elements (a for example thing to be assembled) when assembling, can be by reading the outline data that all had produced and measured this element under test 1 of finishing in this database 7, and wait that with this profile of assembling thing compares, and then in a plurality of these element under tests 1, take out and the most suitablely wait to assemble this element under test 1 that thing is assembled with this, and assemble with this thing to be assembled.By this technological means, can guarantee to allow the best assembling thing of assembly line output assembling quality (it is the most smooth and do not have an offset that for example this element under test 1 and this wait to assemble joint between the thing).
As shown in Figure 2, mainly have an image acquisition unit 61 and a microprocessing unit 62 in this measurement mechanism 6.This measurement mechanism 6 mainly is to capture the element image 71 of this element under test 1 by this image acquisition unit 61, and is stored in this database 7.And this measurement mechanism 6 is used the profile that defines the entity of this element under test 1 by computing by the perform calculations computing of method of 62 pairs of these element images 71 of this microprocessing unit, and is stored in this database 7 and (holds detailed description).
See also Fig. 3, Fig. 4 and Fig. 5, Fig. 3 is that first of first specific embodiment of the present invention is measured process flow diagram, and Fig. 4 is that second of first specific embodiment of the present invention is measured process flow diagram, and Fig. 5 is that the 3rd of first specific embodiment of the present invention is measured process flow diagram.And please consult Fig. 6, Fig. 7, Fig. 8 and Fig. 9 simultaneously, Fig. 6 is the first profile synoptic diagram of first specific embodiment of the present invention, Fig. 7 is the second profile synoptic diagram of first specific embodiment of the present invention, Fig. 8 is the wide synoptic diagram of the third round of first specific embodiment of the present invention, and Fig. 9 is the wide synoptic diagram of the fourth round of first specific embodiment of the present invention.As shown in Figure 6, in the present embodiment, this element under test 1 mainly is to come in order to explanation, but not limited for example with the apple Logo of Apple (Apple Inc.).Wherein, the entity of this element under test 1 that present embodiment is mentioned namely for example is things such as the label of this apple Logo or paster, and thing is assembled in above-mentioned waiting then can be for example for being installed in the shell (for example casing of computer) outside this apple Logo.Yet the above only is preferred embodiments of the present invention, should be as limit.
As shown in Figure 6, this element under test 1 mainly can be made up of one first element 11 and one second element 12.In the present embodiment, this element under test 1 is for being example with above-mentioned this apple Logo, this first element 11 can for example be the pulp fraction on this apple Logo, and this second element 12 can for example be the leaf part on this apple Logo, and this first element 11 and this second element 12 can be the two element that entity separates.More specifically, as shown in FIG., this first element 11 and this second element 12 protrude from the surface of this element under test 1, and the bottom of this first element 11 and this second element 12 is for linking to each other.In other words, this first element 11 and this second element 12 has fixing relative position because the bottom links to each other, so this microprocessing unit 62 can come the entity of a plurality of different these element under tests 1 is carried out computing by fixing algorithm.Yet above-mentioned only is one of them specific embodiment of the present invention, not as limit.
Consult Fig. 3, and please cooperate Fig. 6 and Fig. 7 to check simultaneously.In the time will measuring, at first need to be captured respectively by this measurement mechanism 6 this element image 71 (step S10) of this first element 11 and this second element 12, more specifically, this measurement mechanism 6 is these element images 71 that capture this first element 11 and this second element 12 by this image acquisition unit 61.Then, come the perform calculations computing of method of this two element image 71 by installed software by this microprocessing unit 62, obtain (the center of mass of a mass centre on this first element 11 with calculating respectively, be designated hereinafter simply as barycenter) 111, and the barycenter 121 (step S12) on this second element 12.What deserves to be mentioned is, in the present embodiment, this image acquisition unit 61 mainly can be with a charge coupled cell (Charge-Coupled Device, CCD) realize, this microprocessing unit 62 then can be installed a Labview software, and by this Labview software this two element image 71 is carried out computing.Yet the above all only is preferred embodiments of the present invention, should be as limit.
After this microprocessing unit 62 takes out these two barycenter 111,121, namely plan one by this two barycenter 111,121 mass center line 2.More specifically, this microprocessing unit 62 is to connect this two barycenter 111,121, to form this mass center line 2 (step S14).Then as shown in Figure 6, this measurement mechanism 6 (by this microprocessing unit 62 of inside) is via calculating at least one intersection point 23 (step S16) that the profile periphery of this mass center line 2 with this first element 11 intersects, and the coordinate data 72 of this measurement mechanism 6 this at least one intersection point 23 that the profile periphery of this mass center line 2 and this first element 11 is intersected is recorded in this database 7 (step S18).
Simultaneously, at least two intersection points 21,22 (step S20) that this measurement mechanism 6 also intersects by the profile periphery that calculates this mass center line 2 and this second element 12, and this measurement mechanism 6 this at least two intersection point 21 that the profile periphery of this mass center line 2 and this second element 12 is intersected, 22 coordinate data 72 are recorded in this database 7 (step S22).
What deserves to be mentioned is that the outline data of this stored element under test 1 in this database 7 of mentioning in the preamble namely refers to the coordinate data 72 of the some position on the profile periphery of this first element 11 and this second element 12.When this measurement mechanism 6 is measured and after calculating obtains the coordinate data 72 of some position of predetermined number, this measurement mechanism 6 just can define the profile of this element under test 1 by these coordinate datas 72, and the profile of this element under test 1 and the thing to be assembled that will assemble (figure does not indicate) are compared.More specifically, when this measurement mechanism 6 is measured and after calculating obtains the coordinate data 72 of some position of predetermined number, can also calculate these some positions to the length between the specific anchor point, and, by these coordinate data 72 and length, define the profile (being detailed later) of this element under test 1 jointly.
As long as after producing informant person's test, just can count the coordinate data 72 that will obtain what some positions at least, just enough allow this measurement mechanism 6 define the profile of this element under test 1.Be default 11 the some positions of obtaining in the present embodiment, and define the profile of this element under test 1 by these 11 some positions, but do not limited.
Get back to Fig. 3, behind this step S22, this measurement mechanism 6 is first datum line 3 of planning further, more specifically, this measurement mechanism 6 is to plan one perpendicular to this mass center line 2, and passes through first datum line 3 (step S24) of this barycenter 111 of this first element 11.Then, this measurement mechanism 6 calculates crossing at least two intersection points (step S26) of profile periphery of this first datum line 3 and this first element 11, wherein this at least two intersection point comprises a left intersection point and a right intersection point, and this measurement mechanism 6 can be recorded in the coordinate data 72 of this two intersection point in this database 7 at least.Then, this measurement mechanism 6 calculates the first nodal point 301 between this barycenter 111 of this left side intersection point and this first element 11, and should right side intersection point and this barycenter 111 of this first element 11 between one second central point 302 (step S28).This first nodal point 301 and this second central point 302 can these allow the preferable profile that defines this element under test 1 (being detailed later) of measurement mechanism 6.
In the present embodiment, this element under test 1 is that the apple Logo with Apple is example, so as shown in Figure 7, the right side of this first element 11 has a defective camber line 110, and this defective camber line 110 makes the right side of this element under test 1 form a breach.Profile for this element under test 1 of preferable definition, this measurement mechanism 6 is behind above-mentioned steps S28, then seek earlier the mid point (step S30) of this defective camber line 110, and, with these first datum line, 3 upwards translations, make this first datum line 3 by the mid point (step S32) of this defective camber line 110, and keep vertical with this mass center line 2.
Then, this measurement mechanism 6 calculates the left intersection point 31 that intersect in this first datum line 3 and the profile left side of this first element 11 after the translation, and the right intersection point 32 (step S34) that intersects of this first datum line 3 and the profile right side of this first element 11.And, this measurement mechanism 6 should left side intersection point 31 and the coordinate data 72 of this right side intersection point 32 be recorded in this database 7 (step S36).What deserves to be mentioned is that this right side intersection point 32 in the present embodiment is the mid point of this defective camber line 110.
Then, this measurement mechanism 6 is the vertical perpendicular line 4 (step S38) of planning at least one and this first datum line 3 further, wherein, this perpendicular line 4 mainly is perpendicular to this first datum line 3, but not with any line (for example this mass center line 2, or other datum line) overlaid of vertical this first datum line 3.Then, this measurement mechanism 6 calculates at least two intersection points 401,402 (the step S40) that the profile periphery of this perpendicular line 4 and this first element 11 intersects, and this measurement mechanism 6 this at least two intersection point 401 that the profile periphery of this perpendicular line 4 and this first element 11 is intersected, 402 coordinate data 72 are recorded in this database 7 (step S42).
What deserves to be mentioned is that for the coordinate data 72 that obtains the better points position, " center line " of this perpendicular line 4 on mainly can this first datum line 3 realized.For instance, this measurement mechanism 6 can be planned this perpendicular line 4 (as first perpendicular line 41 among Fig. 8), and makes this first perpendicular line 41 perpendicular to this first datum line 3, and simultaneously by this above-mentioned first nodal point 301.Then, this measurement mechanism 6 just can be obtained at least two intersection points 4011 that the profile periphery of this first perpendicular line 41 and this first element 11 intersects, 4021 coordinate position.
Simultaneously, this measurement mechanism 6 can also be planned another this perpendicular line 4 (as second perpendicular line 42 among Fig. 8), makes this second perpendicular line 42 perpendicular to this first datum line 3, and simultaneously by this above-mentioned second central point 302.By this, this measurement mechanism 6 just can be obtained other two intersection points 4012 that the profile periphery of this second perpendicular line 42 and this first element 11 intersects, 4022 coordinate position simultaneously.At last, this measurement mechanism 6 is recorded in the coordinate data 72 of these some positions 4011,4021,4012,4022 in this database 7 again.
Consult Fig. 5, and please cooperate Fig. 9 to check simultaneously.In order to obtain the some position of predetermined number, this measurement mechanism 6 is second datum line 5 of planning further, more specifically, this measurement mechanism 6 is to plan one perpendicular to this mass center line 2, and passes through second datum line 5 (step S50) of this barycenter 121 of this second element 12.Then, this measurement mechanism 6 calculates at least two crossing intersection points of profile periphery of this second datum line 5 and this second element 12.In the present embodiment, this measurement mechanism 6 is through calculating, obtain the crossing left intersection point 51 in profile left side of this second datum line 5 and this second element 12, and obtain the crossing right intersection point 52 (step S52) in profile right side of this second datum line 5 and this second element 12.And, record the coordinate data 72 of this left side intersection point 51 and this right side intersection point 52 again in this database 7 (step S54).
What deserves to be mentioned is, as long as obtained the some position (being 11 some positions in the present embodiment) of predetermined number, just be enough to define the profile of this element under test 1, but obtaining in proper order of these some positions do not have certain restriction.In other words, step S42 among the step S24 to Fig. 4 of this measurement mechanism 6 in can first execution graph 3, to obtain intersection point 31,32,401,402 earlier, the step S50 in also can first execution graph 5 is to step S54, to obtain intersection point 51,52 earlier, be not limited with above-mentioned declaration order.
As Fig. 6-shown in Figure 9, this measurement mechanism 6 is main through calculating, and takes out the intersection point 21,22,23 that the profile of this mass center line 2 and this element under test 1 intersects; Take out the crossing intersection point 31,32 of profile of this first datum line 3 and this element under test 1; Take out the crossing intersection point 4011,4021 of profile of this first perpendicular line 41 and this element under test 1; Take out the crossing intersection point 4012,4022 of profile of this second perpendicular line 42 and this element under test 1; Take out the crossing intersection point 51,52 of profile of this second datum line 5 and this element under test 1.This measurement mechanism 6 mainly can pass through above-mentioned 11 some positions, defines the profile of this element under test 1.
Please consult Figure 10 and Figure 11 simultaneously, Figure 10 is that the 4th of first specific embodiment of the present invention is measured process flow diagram, and Figure 11 is the 5th profile synoptic diagram of first specific embodiment of the present invention.In order to calculate the profile of this element under test 1 exactly, therefore except above-mentioned 11 some positions, this measurement mechanism 6 is also further measured these some positions to the length between the specific anchor point in the present embodiment.As shown in Figure 11, at first, this barycenter 111 to the institute on the profile periphery of this first element 11 that this measurement mechanism 6 calculates these first elements 11 has a few 23,31,32,4011,4012,4021,4022 length (step S60).Wherein, comprise that calculating obtains this barycenter 111 to the length L 1 of some position 23; This barycenter 111 is to the length L 2 of some position 31; This barycenter 111 is to the length L 3 of some position 32; This barycenter 111 is to the length L 4 of some position 4011; This barycenter 111 is to the length L 5 of some position 4012; This barycenter 111 is to the length L 6 of some position 4021; This barycenter 111 is to the length L 7 of some position 4022.
Then, this measurement mechanism 6 this barycenter 121 to institute on the profile periphery of this second element 12 of calculating these second elements 12 has a few 21,22,51,52 length (step S62).Wherein, comprise that calculating obtains this barycenter 121 to the length L 8 of some position 21; This barycenter 121 is to the length L 9 of some position 22; This barycenter 121 is to the length L 10 of some position 51; This barycenter 121 is to the length L 11 of some position 52.At last, this measurement mechanism 6 also calculates this barycenter 111 of this first element 11 to the intersection point 51 of the profile left and right sides of this second element 12,52 length (step S64).Wherein, comprise that this barycenter 111 of calculating is to the length L 12 of this left side intersection point 51 in the profile left side of this second element 12; And this barycenter 111 is to the length L 13 of this right side intersection point 52 on the profile right side of this second element 12.
What deserves to be mentioned is that above-mentioned these length L 1 do not have the ordinal relation in the calculating to L13, this measurement mechanism 6 can calculate and obtain these length L 1-L13 with specific order according to setting in fact, is not limited with above-mentioned declaration order.When these length L 1-L13 calculates and obtains and finish this, this measurement mechanism 6 is stored to these length L 1-L13 in this database 7 (step S66).By this, this measurement mechanism 6 can define the profile of this element under test 1 according to these 11 some positions and this 13 length, is beneficial to assembling.
Consult Figure 12, be the profile synoptic diagram of second specific embodiment of the present invention, disclosed another element under test 8 in the present embodiment, this element under test 8 is different with this above-mentioned element under test 1, is not the Logo of Apple.This element under test 8 has one first element 81 and one second element 82, and this first element 81 and this second element 82 have barycenter 811,821 respectively.In order to obtain the some position on the profile periphery, this measurement mechanism 6 same on this element under test 8 planning by two barycenter 811,821 mass center line 2, vertically this mass center line 2 and by first datum line 3 of this barycenter 811, vertically this mass center line 2 and second datum line 5 by this barycenter 821, and vertical first datum line 3 and and this first element 81 produce at least one perpendicular line 4 of at least two intersection points.
Yet because the Logo that this element under test 8 among Figure 12 embodiment is not Apple, so as shown in figure 12, the right side of this first element 81 can not have breach.So, in present embodiment, this measurement mechanism 6 does not need to seek the mid point of defective radian, do not need the make progress action of translation of this first datum line 3 yet, but after cooking up this first datum line 3, directly calculate crossing left intersection point 31 and the right intersection point 32 of profile periphery of this first datum line 3 and this first element 81.
Consult Figure 13, be the profile synoptic diagram of the 3rd specific embodiment of the present invention.Present embodiment has disclosed another element under test 9, and this element under test 1 in this element under test 9 and the previous embodiment, 8 difference are that this element under test 9 is made of one first element 91 that links together and one second element 92.
In an embodiment, this measurement mechanism 6 can capture this element image 71 to this element under test 9 earlier, and again by to the computing of this element image 71, is about to this element under test 9 certainly to be defined as this first element 91 and this second element 92.What deserves to be mentioned is that as described in the text, this first element 91 is the surfaces that protrude from this element under test 9 with this second element 92, and the bottom is continuous, therefore has fixing relative position.
Then, this measurement mechanism 6 is same through calculating, obtaining the barycenter 911 on this first element 91 respectively, and the barycenter 921 on this second element 922.At last, this measurement mechanism 6 is again according to above-mentioned flow process, this mass center line 2 of planning, this datum line 3 and this perpendicular line 4 of at least one on this first element 91 and this second element 92.
In other words, by method of the present invention, this element under test 1,, 8,9 can be two elements that entity separates, also can be single element, and be automatically cut into two elements by this measurement mechanism 6 after as calculated, use and apply mechanically computing method of the present invention.Can find out that thus any element with measurement and assembling demand all can use computing method of the present invention, and reach the purpose of accurate assembling.
For example, before above-mentioned thing to be assembled (as the shell of this apple Logo) will be assembled with this element under test 1,8,9, mainly be in producing line, measure and define the profile that this waits to assemble thing by the computing method of the invention described above earlier.Then, wait to assemble a plurality of positions on the profile of thing according to this, calculate this and wait to assemble the thickness of thing on each some position, and the data such as length between specific two some positions, and a plurality of these element under tests 1,8 that store with this database 7,9 data are compared, and this element under test 1,8,9 that use and this thickness, length of waiting to assemble thing are mated is the most assembled with this thing to be assembled.Thus, just can reach and allow the purpose of the accurate combination of product.
The above only is the present invention's preferred embodiments, be not in order to limiting to claim of the present invention, so the present invention's scope required for protection is as the criterion with claims.

Claims (11)

1. a method of calculating the outline data of element under test by the computing of measurement mechanism institute, is characterized in that, this element under test is made up of one first element and one second element, and this method comprises:
A) this measurement mechanism respectively measurement obtain the barycenter of this first element and the barycenter of this second element;
B) this measurement mechanism is planned a mass center line, and it connects the barycenter of this first element and the barycenter of this second element;
C) this measurement mechanism is planned one first datum line, and wherein this first datum line is perpendicular to this mass center line, and this first datum line is by the barycenter of this first element;
D) this measurement mechanism is planned at least one perpendicular line, wherein this perpendicular line is perpendicular to this first datum line, and this perpendicular line not with any line overlaid perpendicular to this first datum line, wherein the profile periphery of this perpendicular line and this first element produces at least two intersection points, and this measurement mechanism draws the coordinate data of this at least two intersection point as calculated;
E) record the coordinate data of this at least two intersection point; And
F) this measurement mechanism defines the profile of this element under test according to the coordinate data of the position of having a few of recording.
2. the method for the outline data of calculating element under test according to claim 1, it is characterized in that, this first element and this second element protrude from the surface of this element under test, be two ridges that separate on this element under test, the bottom of this first element and this second element links to each other, and has fixing relative position.
3. the method for the outline data of calculating element under test according to claim 1 is characterized in that, this measurement mechanism has an image acquisition unit and a microprocessing unit, and this step a more comprises the following steps:
A1) be respectively the entity acquisition corresponding elements image of this first element and this second element by this image acquisition unit; And
A2) by this microprocessing unit this two element image is calculated, use this barycenter by this barycenter of finding out this first element in this two element image and this second element.
4. the method for the outline data of calculating element under test as claimed in claim 3 is characterized in that, this image acquisition unit is a charge coupled cell, this microprocessing unit by Labview software to the perform calculations calculating of method of this two element image.
5. the method for the outline data of calculating element under test according to claim 3, it is characterized in that, among this step b, the profile periphery of this mass center line and this first element intersects at least one intersection point, and the profile periphery of this mass center line and this second element intersects at least two intersection points, this measurement mechanism draws the coordinate data of this at least three intersection point as calculated, and records the coordinate data of this three intersection point simultaneously.
6. the method for the outline data of calculating element under test according to claim 5, it is characterized in that, among this step c, the profile left side of this first datum line and this first element produces a left intersection point, and the profile right side of this first datum line and this first element produces a right intersection point, this measurement mechanism draws the coordinate data of this left side intersection point and this right side intersection point as calculated, and this measurement mechanism records the coordinate data of this left side intersection point and this right side intersection point simultaneously.
7. the method for the outline data of calculating element under test according to claim 6 is characterized in that, more comprises the following steps: after this step c
C1) calculate the barycenter of this first element and the first nodal point between this left side intersection point; And
C2) calculate the barycenter of this first element and one second central point between this right side intersection point.
8. the method for the outline data of calculating element under test according to claim 7 is characterized in that, comprises the following steps: after this step c
C3) this measurement mechanism is sought the mid point of a defective camber line on the profile right side of this first element;
C4) this first datum line is made progress translation makes this first datum line by the mid point of this defective camber line, and keeps vertical with this mass center line;
C5) profile of first datum line after this translation and this first element left side produces a left intersection point, and produce a right intersection point with the profile right side of this first element, this measurement mechanism draws the coordinate data of this left side intersection point and this right side intersection point as calculated, and this measurement mechanism records the coordinate data of this left side intersection point and this right side intersection point simultaneously, should right side intersection point be the mid point of this defective camber line wherein.
9. the method for the outline data of calculating element under test according to claim 7 is characterized in that, this steps d more comprises the following steps:
D1) planning one first perpendicular line, wherein this first perpendicular line is perpendicular to this first datum line and by this first nodal point, the profile periphery of this first perpendicular line and this first element intersects at least two intersection points, this measurement mechanism draws the coordinate data of this two intersection point as calculated, and this measurement mechanism records the coordinate data of this two intersection point; And
D2) planning one second perpendicular line, wherein this second perpendicular line is perpendicular to this first datum line and by this second central point, the profile periphery of this second perpendicular line and this first element intersects at least two intersection points, this measurement mechanism draws the coordinate data of this two intersection point as calculated, and this measurement mechanism records the coordinate data of this two intersection point.
10. the method for the outline data of calculating element under test according to claim 6 is characterized in that, more comprises the following steps: before this step f
G) this measurement mechanism is planned one second datum line, and wherein this second datum line is perpendicular to this mass center line, and this second datum line is by the barycenter of this second element;
H) calculate the left intersection point that intersect in the profile left side of this second datum line and this second element, and a right intersection point that intersects with the profile right side of this second element; And
I) this measurement mechanism records the coordinate data of this left side intersection point and this right side intersection point.
11. the method for the outline data of calculating element under test according to claim 10 is characterized in that, more comprises the following steps: before this step f
J) length of the have a few position of this barycenter that calculates this first element to the profile periphery of this first element;
K) length of the have a few position of this barycenter that calculates this second element to the profile periphery of this second element;
L) this barycenter that calculates this first element to the profile periphery of this second element this left side intersection point and the length of this right side intersection point; And
M) this measurement mechanism records these length;
Wherein, among this step f, this measurement mechanism is the coordinate data according to the position of having a few of recording, and all length that records, and defines the profile of this element under test.
CN2013102464129A 2013-06-20 2013-06-20 Method for calculating outline data of element to be measured Pending CN103278127A (en)

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