CN103246582B - A kind of FPGA fault detection method and device - Google Patents

A kind of FPGA fault detection method and device Download PDF

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Publication number
CN103246582B
CN103246582B CN201210026127.1A CN201210026127A CN103246582B CN 103246582 B CN103246582 B CN 103246582B CN 201210026127 A CN201210026127 A CN 201210026127A CN 103246582 B CN103246582 B CN 103246582B
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input
area
signal
fpga
fault
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CN103246582A (en
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孙继兵
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DINGQIAO COMMUNICATION TECHNOLOGY Co Ltd
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DINGQIAO COMMUNICATION TECHNOLOGY Co Ltd
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Abstract

The invention provides a kind of FPGA fault detection method, the method includes:Load the fpga chip inspection software previously generating;Using described fpga chip inspection software, fault detect is carried out to fpga chip;Obtain the failure detection result to fpga chip for the fpga chip inspection software, the fpga chip testing result according to obtaining determines the hardware circuit of fault in fpga chip.Present invention also offers a kind of FPGA failure detector.The present invention is capable of detecting when the hardware circuit of fpga chip internal fault, and cost is relatively low.

Description

A kind of FPGA fault detection method and device
Technical field
The present invention relates to circuit fault-toleranr technique field, particularly to a kind of field programmable gate array (FPGA) fault Detection method and device.
Background technology
Fpga chip low cost, has the advantages that the motility of overprogram, is widely used in signal processing, control System, the field such as data transfer.In the operative scenario of fpga chip, by external environment high temperature, electromagnetic environment is severe, and chip The factor such as power supply or interface signal overshoot affects, more and more longer with fpga chip run time, the crystal in fpga chip Pipe circuit etc. can be damaged, and then leads to the depositor (reg) in fpga chip, look-up table (lut), random access memory (RAM), multiplier (DSP), phaselocked loop (PLL), serial transceiver (SERDES), the hardware circuit such as signal driver (BUFFER) Faulty resource is so that fpga chip cannot normal work.
After fpga chip internal hardware circuit resource fault, user can not actively perceive, only using this FPGA core Piece, find this fpga chip cannot normal work when, just can determine that the internal hardware circuit resource fault of this fpga chip.And And, after finding fpga chip fault, only the fpga chip of fault is returned to manufacturer, by X is shone to fpga chip Light, just can determine that the hardware circuit resource of fpga chip internal fault, and testing cost is higher.
Content of the invention
In view of this, it is an object of the invention to provide a kind of FPGA fault detection method, the method is capable of detecting when The hardware circuit resource of fpga chip internal fault, and cost is relatively low.
In order to achieve the above object, the invention provides a kind of FPGA fault detection method, the method includes:
Load the fpga chip inspection software previously generating;
Using described fpga chip inspection software, fault detect is carried out to fpga chip;
Obtain the failure detection result to fpga chip for the fpga chip inspection software, according to the fpga chip detection knot obtaining Fruit determines the hardware circuit of fault in fpga chip.
Present invention also offers a kind of FPGA failure detector, this device includes:Software loading unit, fault detect list Unit, fault determining unit;
Described software loading unit, for loading the fpga chip inspection software previously generating;
Described fault detection unit, for carrying out fault detect using described fpga chip inspection software to fpga chip;
Described fault determining unit, for obtaining the failure detection result to fpga chip for the fpga chip inspection software, root Determine the hardware circuit of fault in fpga chip according to the fpga chip testing result obtaining.
From technical scheme above, in the present invention, treated by previously generating fpga chip inspection software being loaded into In the fpga chip of detection, using this fpga chip inspection software, fault is carried out to the hardware circuit in fpga chip to be detected Detection is such that it is able to detect the hardware circuit of fpga chip internal fault, and cost is than relatively low.
Brief description
Fig. 1 is embodiment of the present invention FPGA fault detection method flow chart;
Fig. 2 is the fault detect schematic diagram to DSP for the embodiment of the present invention;
Fig. 3 is the fault detect schematic diagram to RAM for the embodiment of the present invention;
Fig. 4 is the fault detect schematic diagram to PLL for the embodiment of the present invention;
Fig. 5 is the fault detect schematic diagram to BUFFER for the embodiment of the present invention;
Fig. 6 is the fault detect schematic diagram to SERDES for the embodiment of the present invention;
Fig. 7 is the embodiment of the present invention to a line reg in FPGA and lut testing process schematic diagram;
Fig. 8 is the structural representation of embodiment of the present invention FPGA failure detector.
Specific embodiment
In order that the objects, technical solutions and advantages of the present invention become more apparent, develop simultaneously embodiment below in conjunction with the accompanying drawings, Technical scheme is described in detail.
Referring to Fig. 1, Fig. 1 is embodiment of the present invention FPGA fault detection method flow chart, comprises the following steps:
The fpga chip inspection software that step 101, loading previously generate;
Step 102, using described fpga chip inspection software, fault detect is carried out to fpga chip;
Step 103, the acquisition failure detection result to fpga chip for the fpga chip inspection software, according to the FPGA core obtaining Piece testing result determines the hardware circuit of fault in fpga chip.
In the embodiment of the present invention shown in Fig. 1, before step 101 in addition it is also necessary to first examine to the IOBUS interface of FPGA Survey, be specifically as follows:First pass through IOBUS interface and write preset data in arbitrary depositor of FPGA, and arbitrary post to described Data-conversion in storage, then read the data in described arbitrary depositor, the data of reading and preset data are compared, If the read out data identical with preset data value of the inverted it is determined that IOBUS interface is normal, otherwise, it determines IOBUS interface Fault.
In the embodiment of the present invention shown in Fig. 1, using described fpga chip inspection software to fpga chip described in step 102 The method carrying out fault detect is specifically as follows:
FPGA is divided into first area and second area.
Generate input signal for the first area block in first area, this input signal is input in first area Each first area block so that this input signal flow through in this first area block all reg and lut after output signal, according to The input signal of first area block and output signal judge to whether there is reg or lut of fault in this first area block;For In two regions, the other hardware circuits in addition to reg and lut generate input signal, this input signal are input to described other hard Part circuit, judges described other hardware circuit whether fault according to described other input signal of hardware circuits and output signal.
Generate input signal for the first area block in second area, this input signal is input in second area Each first area block so that this input signal flow through in this first area block all reg and lut after output signal, according to The input signal of first area block and output signal judge to whether there is reg or lut of fault in this first area block;For Described other hardware circuit in one region generates input signal, this input signal is input to other hard described in first area Part circuit, judges described other hardware circuit whether fault according to described other input signal of hardware circuits and output signal.
In fact, fault detect is carried out to fpga chip using described fpga chip inspection software described in step 102 Method can also adopt other multiple methods, for example, FPGA is divided into the region of two or more than two, successively to each area Hardware circuit in domain carries out fault detect, and finally realizes the fault detect to all hardware circuit in fpga chip;Or, Select the one or more of regions after dividing, first fault detect is carried out to the hardware circuit in the region selecting, more right Hardware circuit in remaining region carries out fault detect etc..
Described other hardware circuit can include multiplier DSP.To the reg in each the first area block in first area When being tested with lut, fault detect can be carried out by each DSP in second area simultaneously.To each in second area When reg and lut in one region unit is tested, fault detect can be carried out by each DSP in first area simultaneously.
Specifically the embodiment of the present invention shown in Figure 2 to the detection method of each DSP is illustrated to the fault detect of DSP Figure, data (the first data as shown in Figure 2 and the second data, the also as DSP of or random generation set in advance by two Input signal) be input to DSP to be tested, compare the output data (namely output signal) of DSP and taking advantage of of two input datas Long-pending, if identical, illustrate that this DSP is normal, if it is not the same, this DSP fault is then described, the position of this fault DSP can be recorded Confidence ceases.Here, in FPGA, the quantity of DSP and position are related to the model of specific FPGA, can be based on detected FPGA Model determine the position of each DSP therein.In the rear end unbound document for detecting FPGA, DSP can be tied to and treat On the position of test (also will the positional information of each DSP be written in the unbound document of rear end), after being based in detection In the unbound document of end, the positional information of each DSP of record is detected.Due to being to be detected for each DSP, if DSP fault is detected, then can be accurately positioned the position of the DSP of fault.
Described other hardware circuit can also include random access memory ram.To each the first area block in first area In reg and lut when being tested, fault detect can be carried out by each RAM in second area simultaneously.To in second area When reg and lut in each first area block is tested, fault detect can be carried out by each RAM in first area simultaneously.
Wherein, for the detection method of each RAM embodiment of the present invention shown in Figure 3, the fault detect of RAM is shown It is intended to, be first randomly generated or preset a data (as shown in the 3rd data in Fig. 3), this data can be one PN18 data, then according to the order that address is incremented by writes the data to RAM to be tested, this data is being write each RAM full Afterwards, the order being incremented by according still further to address reads data from this RAM, if there is arbitrary address, is written to the data of this address Inconsistent with the data reading from this address, then can determine this RAM fault at described arbitrary address, described appointing can be recorded One address.Detection to RAM can also be pin-pointed to the abort situation of RAM.Here, in FPGA the quantity of RAM and position with The model of specific FPGA is related, can determine the position of each RAM therein, Ke Yi based on the model of detected FPGA For detect in the rear end unbound document of FPGA by RAM be tied to position to be tested (also will each RAM positional information Be written in the unbound document of rear end), in detection can based on rear end unbound document in the positional information of each RAM of record enter Row detection.
Described other hardware circuit can also include phase-locked loop pll.To in each the first area block in first area When reg and lut is tested, fault detect can be carried out by each PLL in second area simultaneously.To each in second area When reg and lut in the block of first area is tested, fault detect can be carried out by each PLL in first area simultaneously.
Wherein, for the detection method of each PLL embodiment of the present invention shown in Figure 4, the fault detect of PLL is shown It is intended to, the pin input clock of this fpga chip is input to PLL to be tested as the reference clock of PLL, when this PLL divides out Clock, drives an enumerator 1 using the clock that PLL divides out, also utilizes the pin input clock of fpga chip to drive another simultaneously One enumerator 2, then compares the value of two enumerators, if identical it is determined that this PLL does not break down, if it is not the same, Then determine this PLL fault, the Position Number of this PLL can be recorded.Here, in FPGA the quantity of PLL and position with specific The model of FPGA is related, can determine the position of each PLL therein based on the model of detected FPGA, can be for examining Survey in the rear end unbound document of FPGA PLL is tied on position to be tested and (also will the positional information of each PLL be written to In the unbound document of rear end), in detection can based on rear end unbound document in the positional information of each PLL of record examined Survey.Due to being to be detected for each PLL, and because the position of each PLL is fixed, if PLL fault is detected, can To be accurately positioned the position of the PLL of fault.
Described other hardware circuit can also include BUFFER.To the reg in each the first area block in first area When being tested with lut, fault detect can be carried out by each BUFFER in second area simultaneously.To each in second area When reg and lut in the block of first area is tested, fault detect can be carried out by each BUFFER in first area simultaneously.
Wherein, the fault to BUFFER for the detection method of each BUFFER embodiment of the present invention shown in Figure 5 Detects schematic diagram, the pin input clock of fpga chip is input to BUFFER to be tested as input signal, using this The output clock of BUFFER drives an enumerator 3, drives another meter using the pin input clock of this fpga chip simultaneously Number devices 4, compare the value of two enumerators, if identical it is determined that this BUFFER does not break down, if it is not the same, then determining This BUFFER fault, records the Position Number of this BUFFER.Here, the quantity of BUFFER and position and specific FPGA in FPGA Model related, the position of each BUFFER therein can be determined based on the model of detected FPGA, can be for examining Survey in the rear end unbound document of FPGA BUFFER be tied on position to be tested (also will each BUFFER positional information Be written in the unbound document of rear end), detection when can based on rear end unbound document in record each BUFFER position letter Breath is detected.Due to being to be detected for each BUFFER, and because the position of each BUFFER is fixed, if detection To BUFFER fault, then can be accurately positioned the position of the BUFFER of fault.
Described other hardware circuit can also include SERDES.To the reg in each the first area block in first area When being tested with lut, fault detect can be carried out by each SERDES in second area simultaneously.To each in second area When reg and lut in the block of first area is tested, fault detect can be carried out by each SERDES in first area simultaneously.
Wherein, the fault to SERDES for the detection method of each SERDES embodiment of the present invention shown in Figure 6 SERDES to be tested is configured to loopback mode by detects schematic diagram in advance, and generates at random or preset a data (such as Shown in the 4th data in Fig. 6), this data can be PN18 data, by this data input to configured good SERDES loopback mould The SERDES of formula, the data of this SERDES loopback output and the data inputting this SERDES is compared, if identical, really This SERDES fixed does not break down, if it is not the same, then determining this SERDES fault, records the Position Number of this SERDES.This In, in FPGA, the quantity of SERDES and position are related to the model of specific FPGA, can model based on detected FPGA Determine the position of each SERDES therein, in practical implementations, can incite somebody to action in the rear end unbound document for detecting FPGA SERDES is tied on position to be tested (also will the positional information of each SERDES be written in the unbound document of rear end), Can be detected based on the positional information of each SERDES of record in the unbound document of rear end during detection.Due to each SERDES Position fix, if BUFFER fault is detected, the position of the BUFFER of fault can be accurately positioned.
Described FPGA is divided into first area and the method for second area is specifically as follows:FPGA is divided into upper and lower two Individual region, corresponds respectively to first area and second area, and wherein, first area includes the 1st row of FPGA to xth row, the Two regions include remaining (x+1)th row to last column of FPGA, and wherein x is more than 0, and of the total line number less than FPGA Individual natural number.FPGA two regions in left and right be can also be divided into, first area and second area corresponded respectively to, wherein, the One region includes the 1st of FPGA and arranges y row, and second area includes the last string that remaining y+1 arranges FPGA, its Middle y is more than 0, and a natural number of the total columns less than FPGA.Here, described row and column, is all basic with FPGA Programmable logic cells are unit, and a line refers to the basic programmable logic cells of a line in FPGA, and string refers to string base This programmable logic cells.Described basic programmable logic cells are made up of reg and lut, according to the difference of FPGA model, base The composition of reg and lut in this programmable logic cells also differs, and the configuration of relatively more classical basic programmable unit is one Individual depositor adds a look-up table.
Wherein, when FPGA is divided into upper and lower two regions, described first area block refers to a line of FPGA;As general When FPGA is divided into two regions in left and right, described first area block refers to the string of FPGA.
It can be seen that, FPGA is divided into behind first area and second area, to the reg in first area and second area and When lut carries out fault detect, it is merely able to detect the row or column that reg or lut fault occurs, but the row that can not specifically position Or the concrete abort situation in row, therefore, in addition it is also necessary to further FPGA is divided into the 3rd region and the 4th area in the present embodiment Domain, and fault detect is carried out to reg and lut in the second area block in the 3rd region and the 4th region, specifically include:
Generate input signal for the second area block in the 3rd region, this input signal is input in the 3rd region Each second area block so that this input signal flow through in this second area block all reg and lut after output signal, according to This input signal and output signal judge to whether there is reg or lut of fault in this second area block;
Generate input signal for the second area block in the 4th region, this input signal is input in the 4th region Each second area block so that this input signal flow through in this second area block all reg and lut after output signal, according to This input signal and output signal judge to whether there is reg or lut of fault in this second area block.
Here, the 3rd region and four-range divide and should cooperate with the division of first area and second area, For example, when first area and second area are according to upper and lower two region divisions, the 3rd region and the 4th region should be according to left sides Right two region divisions, correspondingly, first area block refers to a line in FPGA, and second area block refers to the string in FPGA; When first area and second area are according to upper and lower two region divisions, the 3rd region and the 4th region should be according to left and right two Region division, correspondingly, first area block refers to the string in FPGA, and second area block refers to a line in FPGA.
In the present embodiment, identical with the fault detection method of reg with lut of every string to every a line, below with to a line Illustrate as a example the method that reg and lut is detected.
Referring to Fig. 7, Fig. 7 be the embodiment of the present invention to a line reg in FPGA and lut testing process schematic diagram, as Fig. 7 institute Show, this row reg and lut is together in series, form test row, then, the input of this row is comprised to input set in advance or random Many bit serial data stream of the inclusion 0 and 1 generating, this data flow shifts on reg and lut of this row, and finally from from this row Afterbody reg or lut output stream, then whether the input according to this row and output stream are assured that this row There is reg or lut of fault.
Here, for a set fpga chip, the position of the basic programmable logic cells of every a line or every string Fixing, in basic programmable logic cells, the position of reg and lut is also fixed, and therefore, it can according to reg and lut in this row or column Positional information, in the rear end unbound document for detecting FPGA, reg and lut in this row or column is tied to position to be tested Put (also will in this row or column the positional information of reg and lut be written in the unbound document of rear end), be based on reg in detection With positional information in every row or each column for the lut, the method or existing of series connection reg and lut being provided using fpga chip manufacturer All reg and lut that in technology, the method for other series connection reg and lut is connected in this row or column, then just can be with input traffic Carry out fault test.
Be can determine according to the method for testing of reg and lut to every a line:
When first area block refers to a line of FPGA, and second area block refers to the string of FPGA, correspondingly,
Input signal is input to each the first area block in first area or second area, so that this input signal stream Output signal after all reg and lut in this first area block, judges this firstth area according to this input signal and output signal The method that whether there is reg or lut of fault in the block of domain is specifically as follows:By in the every a line in first area or second area Reg and lut be concatenated, input includes 0 and 1 many bit serial data stream, and this data flow moves on reg and lut of this row Position, judges whether the data flow from afterbody reg or lut of this row output is identical with the data flow inputting, if identical, Determine that reg and lut of this row is normal, otherwise, it determines this row has reg or lut of fault, record the line number of this fault;
Input signal is input to each the second area block in the 3rd region or the 4th region, so that this input signal stream Output signal after all reg and lut in this second area block, judges this secondth area according to this input signal and output signal The method that whether there is reg or lut of fault in the block of domain is specifically as follows:By in the every string in the 3rd region or the 4th region Reg and lut be concatenated, input includes 0 and 1 many bit serial data stream, and this data flow moves on reg and lut of this row Position, judges whether the data flow from the afterbody reg of this row output identical with the data flow inputting, if identical it is determined that Reg and lut of this row is normal, otherwise, it determines this row has reg or lut of fault, records the row number of this fault.
When first area block refers to the string of FPGA, and second area block refers to a line of FPGA, correspondingly,
Input signal is input to each the first area block in first area or second area, so that this input signal stream Output signal after all reg and lut in this first area block, judges this firstth area according to this input signal and output signal The method that whether there is reg or lut of fault in the block of domain is specifically as follows:By in the every string in first area or second area Reg and lut be concatenated, input includes 0 and 1 many bit serial data stream, and this data flow moves on reg and lut of this row Position, judges whether the data flow from afterbody reg or lut of this row output is identical with the data flow inputting, if identical, Determine that reg and lut of this row is normal, otherwise, it determines this row has reg or lut of fault, record the row number of this fault;
Input signal is input to each the second area block in the 3rd region or the 4th region, so that this input signal stream Output signal after all reg and lut in this second area block, judges this secondth area according to this input signal and output signal The method that whether there is reg or lut of fault in the block of domain is specifically as follows:By in the every a line in the 3rd region or the 4th region Reg and lut be concatenated, input includes 0 and 1 many bit serial data stream, and this data flow moves on reg and lut of this row Position, judges whether the data flow from afterbody reg or lut of this row output is identical with the data flow inputting, if identical, Determine that reg and lut of this row is normal, otherwise, it determines this row has reg or lut of fault, record the row number of this fault.
By the fault detect to the first area block in first area and second area, and to the 3rd region and the 4th The fault detect of the second area block in region, and then can be accurately true it may be determined that there is the row and column of reg or lut fault Determine the particular location of reg or lut fault.
Above method of the present invention embodiment is described in detail, present invention also offers a kind of FPGA fault detect Device.
Referring to Fig. 8, Fig. 8 is the structural representation of embodiment of the present invention FPGA failure detector, and this device includes:Software Loading unit 810, fault detection unit 820, fault determining unit 830;Wherein,
Software loading unit 810, for loading the fpga chip inspection software previously generating;
Fault detection unit 820, for carrying out fault detect using described fpga chip inspection software to fpga chip;
Fault determining unit 830, for obtaining the failure detection result to fpga chip for the fpga chip inspection software, according to The fpga chip testing result obtaining determines the hardware circuit of fault in fpga chip.
Described fault detection unit 820 includes:Area division unit 821, signal input unit 822, signal comparing unit 823;Wherein,
Area division unit 821, for being divided into first area and second area by FPGA;
Signal input unit 822, for generating input signal for the first area block in first area, this input is believed Number it is input to each the first area block in first area, so that this input signal flows through all reg in this first area block With output signal after lut;For generating input signal for the other hardware circuits in addition to reg and lut in second area, will This input signal is input to other hardware circuits described in second area, so that described other hardware circuit output signal;For Generate input signal for the first area block in second area, by this input signal be input in second area each first Region unit so that this input signal flow through in this first area block all reg and lut after output signal;For for first Described other hardware circuit in region generates input signal, this input signal is input to described other hard in first area Part circuit, so that described other hardware circuit output signal;
Signal comparing unit 823, for being input to each first area block in first area according to signal input unit 822 Input signal and this first area block output signal judge in this first area block whether there is fault reg or lut;With In be input to according to signal input unit 822 in second area described other hardware circuits input signal and second area in The output signal of described other hardware circuits judge described other hardware circuits in second area whether fault;For basis Signal input unit 822 is input to the output letter of the input signal of each first area block and this first area block in second area Number judge in this first area block, to whether there is reg or lut of fault;For being input to first according to signal input unit 822 The output signal of the described other hardware circuit in the input signal and first area of described other hardware circuit in region is sentenced Described other hardware circuits whether fault in disconnected first area.
Described other hardware circuit includes multiplier DSP;
The input signal that described signal input unit 822 is directed to DSP generation includes the first data and the second data;
Described signal input unit 822, for by described first data and the second data input first area or the secondth area Each DSP in domain;
Described signal comparing unit 823, in signal input unit 822 by described first data and the second data input To after each DSP, the data of this DSP output is compared with the product of described first data and the second data, if identical, Then determining that this DSP does not break down, if it is not the same, then determining this DSP fault, recording the Position Number of this DSP.
Described other hardware circuit includes random access memory ram;
The input signal that described signal input unit 822 is directed to RAM generation is the 3rd data;
Described signal input unit 822, being further used for writing the 3rd data according to the order that address is incremented by expires each RAM;
Described signal comparing unit 823, for counting the 3rd according to the order that address is incremented by signal input unit 822 According to writing after each RAM full, read data according to the order that address is incremented by from this RAM, if there is arbitrary address, be written to this The data of address with from the data that this address reads inconsistent it is determined that this RAM in described arbitrary address at fault, and record institute State arbitrary address.
Described other hardware circuit includes phase-locked loop pll;
The input signal that described signal input unit 822 is directed to PLL generation is the pin input clock of this fpga chip;
Described signal input unit 822, is further used for the pin input clock of this fpga chip as each PLL's Reference clock is input to this PLL, drives an enumerator using the clock that this PLL divides out;
Described signal comparing unit 823, for making the pin input clock of this fpga chip in signal input unit 822 After reference clock for each PLL is input to this PLL, drive another counting using the pin input clock of this fpga chip Device, is compared with clock-driven enumerator and the meter driving using the pin input clock of this fpga chip that PLL divides out Number devices value, if identical it is determined that this PLL does not break down, if it is not the same, then determining this PLL fault, record this PLL Position Number.
Described other hardware circuit includes BUFFER;
When the input signal that described signal input unit 822 is directed to BUFFER generation is the pin input of this fpga chip Clock;
Described signal input unit 822, is further used for the pin input clock of this fpga chip as input signal It is input to each BUFFER, the output clock using this BUFFER drives an enumerator;
Described signal comparing unit 823, for making the pin input clock of this fpga chip in signal input unit 822 It is input to after each BUFFER for input signal, the pin input clock using this fpga chip drives another enumerator, than Relatively utilize BUFFER's to export clock-driven enumerator and the enumerator driving using the pin input clock of this fpga chip Value, if identical it is determined that this BUFFER does not break down, if it is not the same, then determining this BUFFER fault, record should The Position Number of BUFFER.
Described other hardware circuit includes SERDES;
The input signal that described signal input unit 822 is directed to SERDES generation is the 4th data;
Described signal input unit 822, is further used for described 4th data input to configured good SERDES loopback Each SERDES of pattern;
Described signal comparing unit 823, in signal input unit 822 by described 4th data input to configured good After each SERDES of SERDES loopback mode, the data of this SERDES loopback output is compared with described 4th data, If identical it is determined that this SERDES does not break down, if it is not the same, then determining this SERDES fault, record this SERDES Position Number.
Described area division unit, is further used for for FPGA being divided into the 3rd region and the 4th region;
Described signal input unit 822, is further used for generating input signal for the second area block in the 3rd region, This input signal is input to each the second area block in the 3rd region, so that this input signal flows through in this second area block All reg and lut after output signal;It is further used for generating input signal for the second area block in the 4th region, will This input signal is input to each the second area block in the 4th region, so that this input signal flows through in this second area block Output signal after all reg and lut;
Described signal comparing unit 823, is further used for being input to each in the 3rd region according to signal input unit 822 The output signal of the input signal of second area block and this second area block judges to whether there is fault in this second area block Reg or lut;It is further used for being input to the input letter of each second area block in the 4th region according to signal input unit 822 Number and this second area block output signal judge in this second area block whether there is fault reg or lut.
Described first area block is a line in FPGA;Described second area block is the string in FPGA;
To xth row, described second area is that the (x+1)th row of FPGA arrives last to the first row for FPGA for the described first area OK, wherein x is more than 0, and a natural number of the total line number less than FPGA;
Described 3rd region is that the first row of FPGA arranges to y, and described 4th region is that the y+1 of FPGA arranges FPGA's Last string;Wherein y is more than 0, and a natural number of the total columns less than FPGA;
Described signal input unit 822 is in each firstth area being input to input signal in first area or second area Domain block so that this input signal flow through in this first area block all reg and lut after output signal when, be used for:By the firstth area Reg and lut in every a line in domain or second area is concatenated, and input includes 0 and 1 many bit serial data stream, so that This data flow shifts on reg and lut of this row, and the afterbody reg in this row or lut output stream;To input Signal input each second area block in the 3rd region or the 4th region, so that this input signal flows through this second area block In all reg and lut after output signal when, be used for:By reg and lut in the every string in the 3rd region or the 4th region It is concatenated, input includes 0 and 1 many bit serial data stream, so that this data flow shifts on reg and lut of this row, and Afterbody reg or lut output stream in this row;
Described signal comparing unit 823 is being input in first area or second area often according to signal input unit 822 The input signal of individual first area block and the output signal of this first area block judge to whether there is fault in this first area block Reg or lut when, be used for:Judge the data flow of afterbody reg or lut output and the data inputting this row from every a line Whether stream identical, if identical it is determined that reg and lut of this row is normal, otherwise, it determines there is reg or lut of fault in this row, Record the line number of this fault;Each second area in 3rd region or the 4th region is being input to according to signal input unit 822 The output signal of the input signal of block and this second area block judges to whether there is reg or lut of fault in this second area block When, it is used for:Judge whether the data flow from afterbody reg or lut of every string output is identical with the data flow of this row of input, If identical it is determined that reg and lut of this row is normal, otherwise, it determines this row has reg or lut of fault, record this fault Row number.
Described fault detection unit 820 software loading unit 810 load the fpga chip inspection software that previously generates it Before, it is further used for:First pass through IOBUS interface and write preset data in arbitrary depositor of FPGA, and arbitrary post to described Data-conversion in storage, then read the data in described arbitrary depositor, the data of reading and preset data are compared, If the read out data identical with preset data value of the inverted it is determined that IOBUS interface is normal, otherwise, it determines IOBUS interface Fault.
The foregoing is only presently preferred embodiments of the present invention, not in order to limit the present invention, all essences in the present invention Within god and principle, any modification, equivalent substitution and improvement done etc., should be included within the scope of protection of the invention.

Claims (18)

1. a kind of programming logic gate array FPGA fault detection method is it is characterised in that the method includes:
Load the fpga chip inspection software previously generating;
Using described fpga chip inspection software, fault detect is carried out to fpga chip;
Obtain the failure detection result to fpga chip for the fpga chip inspection software, true according to the fpga chip testing result obtaining Determine the hardware circuit of fault in fpga chip;
Wherein, carry out fault detect using described fpga chip inspection software to fpga chip to include:
FPGA is divided into first area and second area;
Generate input signal for the first area block in first area, this input signal is input to each in first area First area block so that this input signal flow through in this first area block all reg and lut after output signal, according to first The input signal of region unit and output signal judge to whether there is reg or lut of fault in this first area block;For the secondth area In domain, the other hardware circuits in addition to reg and lut generate input signal, and this input signal is input to described other hardware electricity Road, judges described other hardware circuit whether fault according to described other input signal of hardware circuits and output signal;
Generate input signal for the first area block in second area, this input signal is input to each in second area First area block so that this input signal flow through in this first area block all reg and lut after output signal, according to first The input signal of region unit and output signal judge to whether there is reg or lut of fault in this first area block;For the firstth area In domain, the other hardware circuits in addition to reg and lut generate input signal, and this input signal is input to described in first area Whether other hardware circuits, the input signal according to described other hardware circuit and output signal judge described other hardware circuit Fault.
2. FPGA fault detection method according to claim 1 is it is characterised in that described other hardware circuit includes multiplication Device DSP;
The input signal generating for DSP includes the first data and the second data;
This input signal is input to other hardware circuits described in first area or second area, according to described other hardware electricity The input signal on road and output signal judge whether fault includes described other hardware circuit:
By each DSP in described first data and the second data input first area or second area, by the number of this DSP output Be compared according to the product with described first data and the second data, if identical it is determined that this DSP does not break down, if Differ it is determined that this DSP fault, record the Position Number of this DSP.
3. FPGA fault detection method according to claim 1 is it is characterised in that described other hardware circuit includes at random Memory RAM;
It is the 3rd data for the input signal that RAM generates;
According to the order that address is incremented by, the 3rd data is written to each RAM, after the 3rd data is write each RAM full, presses The order being incremented by according to address reads data from this RAM, if there is arbitrary address, is written to the data of this address and from this ground Data that location reads inconsistent it is determined that this RAM fault at described arbitrary address, and record described arbitrary address.
4. FPGA fault detection method according to claim 1 is it is characterised in that described other hardware circuit includes locking phase Ring PLL;
The input signal generating for PLL is the pin input clock of this fpga chip;
The pin input clock of this FPGA is input to this PLL as the reference clock of each PLL, this PLL divides out clock, profit Drive an enumerator with the clock that PLL divides out, drive another meter using the pin input clock of this fpga chip simultaneously Number devices, compare the value of two enumerators, if identical it is determined that this PLL does not break down, if it is not the same, then determining this PLL Fault, records the Position Number of this PLL.
5. FPGA fault detection method according to claim 1 is it is characterised in that described other hardware circuit includes signal Driver BUFFER;
The input signal generating for BUFFER is the pin input clock of this fpga chip;
The pin input clock of this FPGA is input to each BUFFER as input signal, using the output clock of this BUFFER Drive an enumerator, drive another enumerator using the pin input clock of this fpga chip simultaneously, compare two countings The value of device, if identical it is determined that this BUFFER does not break down, if it is not the same, then determining this BUFFER fault, record should The Position Number of BUFFER.
6. FPGA fault detection method according to claim 1 is it is characterised in that described other hardware circuit includes serial Transceiver SERDES;
It is the 4th data for the input signal that SERDES generates;
By each SERDES of described 4th data input to configured good SERDES loopback mode, this SERDES loopback is exported Data be compared with described 4th data, if identical it is determined that this SERDES does not break down, if it is not the same, then Determine this SERDES fault, record the Position Number of this SERDES.
7. FPGA fault detection method according to claim 1 is it is characterised in that the method further includes:
FPGA is divided into the 3rd region and the 4th region;
Generate input signal for the second area block in the 3rd region, this input signal is input to each in the 3rd region Second area block so that this input signal flow through in this second area block all reg and lut after output signal, according to second The input signal of region unit and output signal judge to whether there is reg or lut of fault in this second area block;
Generate input signal for the second area block in the 4th region, this input signal is input to each in the 4th region Second area block so that input signal flow through in this second area block all reg and lut after output signal, according to the secondth area The input signal of domain block and output signal judge to whether there is reg or lut of fault in this second area block.
8. FPGA fault detection method according to claim 7 it is characterised in that
Described first area block is a line in FPGA;Described second area block is the string in FPGA;
Described first area be FPGA the first row arrive xth row, described second area for FPGA (x+1)th row to last column, Wherein x is more than 0, and a natural number of the total line number less than FPGA;
Described 3rd region is that the first row of FPGA arranges to y, and described 4th region is that the y+1 of FPGA arranges the last of FPGA String;Wherein y is more than 0, and a natural number of the total columns less than FPGA;
Input signal is input to each the first area block in first area or second area, so that this input signal flows through this Output signal after all reg and lut in the block of first area, the input signal according to this first area block and output signal judge In this first area block, the method for reg or lut with the presence or absence of fault is:By in the every a line in first area or second area Reg and lut be concatenated, input includes 0 and 1 many bit serial data stream, and this data flow moves on reg and lut of this row Position, judges whether the data flow from afterbody reg or lut of this row output is identical with the data flow inputting, if identical, Determine that reg and lut of this row is normal, otherwise, it determines this row has reg or lut of fault, record the line number of this fault;
Input signal is input to each the second area block in the 3rd region or the 4th region, so that this input signal flows through this Output signal after all reg and lut in second area block, the input signal according to this second area block and output signal judge In this second area block, the method for reg or lut with the presence or absence of fault is:By in the every string in the 3rd region or the 4th region Reg and lut be concatenated, input includes 0 and 1 many bit serial data stream, and this data flow moves on reg and lut of this row Position, judges whether the data flow from afterbody reg or lut of this row output is identical with the data flow inputting, if identical, Determine that reg and lut of this row is normal, otherwise, it determines this row has reg or lut of fault, record the row number of this fault.
9. FPGA fault detection method according to claim 1 it is characterised in that
Before loading the fpga chip inspection software previously generating, further include:Fault inspection is carried out to the IOBUS interface of FPGA Survey, specially:First pass through IOBUS interface and write preset data in arbitrary depositor of FPGA, and to described arbitrary depositor In data-conversion, then read the data in described arbitrary depositor, the data of reading and preset data be compared, if The data reading is identical with preset data value of the inverted it is determined that IOBUS interface is normal, otherwise, it determines the event of IOBUS interface Barrier.
10. a kind of programming logic gate array FPGA failure detector is it is characterised in that this device includes:Software loads single Unit, fault detection unit, fault determining unit;
Described software loading unit, for loading the fpga chip inspection software previously generating;
Described fault detection unit, for carrying out fault detect using described fpga chip inspection software to fpga chip;
Described fault determining unit, for obtaining the failure detection result to fpga chip for the fpga chip inspection software, according to obtaining The fpga chip testing result taking determines the hardware circuit of fault in fpga chip;
Wherein, described fault detection unit includes:
Area division unit, for being divided into first area and second area by FPGA;
Signal input unit, for generating input signal for the first area block in first area, this input signal is inputted Each first area block in first area, so that after this input signal flows through all reg and lut in this first area block Output signal;For generating input signal for the other hardware circuits in addition to reg and lut in second area, this is inputted Signal input is to hardware circuits other described in second area, so that described other hardware circuit output signal;For for First area block in two regions generates input signal, this input signal is input to each first area in second area Block so that this input signal flow through in this first area block all reg and lut after output signal;For for first area In described other hardware circuits generate input signals, by this input signal be input in first area described other hardware electricity Road, so that described other hardware circuit output signal;
Signal comparing unit, for being input to the input signal of each first area block in first area according to signal input unit Judge in this first area block, to whether there is reg or lut of fault with the output signal of this first area block;For according to signal Input block is input to described other hard in the input signal and second area of the described other hardware circuit in second area The output signal of part circuit judges the described other hardware circuits whether fault in second area;For according to signal input unit The output signal being input to the input signal of each first area block and this first area block in second area judges this firstth area Whether there is reg or lut of fault in the block of domain;Described other hard in first area for being input to according to signal input unit The output signal of the described other hardware circuit in the input signal and first area of part circuit judges described in first area Other hardware circuits whether fault.
11. FPGA failure detectors according to claim 10 are it is characterised in that described other hardware circuit includes taking advantage of Musical instruments used in a Buddhist or Taoist mass DSP;
The input signal that described signal input unit is directed to DSP generation includes the first data and the second data;
Described signal input unit, for by described first data and the second data input in first area or second area Each DSP;
Described signal comparing unit, in signal input unit by described first data and the second data input to each DSP Afterwards, by this DSP output data be compared with the product of described first data and the second data, if identical it is determined that this DSP does not break down, if it is not the same, then determining this DSP fault, records the Position Number of this DSP.
12. FPGA failure detectors according to claim 10 it is characterised in that described other hardware circuit include with Machine memory RAM;
The input signal that described signal input unit is directed to RAM generation is the 3rd data;
Described signal input unit, is further used for, according to the order that address is incremented by, the 3rd data is write each RAM full;
Described signal comparing unit, expires each for writing the 3rd data according to the order that address is incremented by signal input unit After RAM, read data from this RAM according to the order that address is incremented by, if there is arbitrary address, be written to the data of this address With from the data that this address reads inconsistent it is determined that this RAM in described arbitrary address at fault, and record described arbitraryly Location.
13. FPGA failure detectors according to claim 10 are it is characterised in that described other hardware circuit includes locking Phase ring PLL;
The input signal that described signal input unit is directed to PLL generation is the pin input clock of this FPGA;
Described signal input unit, when being further used for the pin input clock of this fpga chip as the reference of each PLL Clock is input to this PLL, drives an enumerator using the clock that this PLL divides out;
Described signal comparing unit, in signal input unit using the pin input clock of this fpga chip as each PLL Reference clock be input to this PLL after, the pin input clock using this fpga chip drives another enumerator, is compared with Clock-driven enumerator and the value of the enumerator being driven using the pin input clock of this fpga chip that PLL divides out, such as Really identical it is determined that this PLL does not break down, if it is not the same, then determining this PLL fault, record the Position Number of this PLL.
14. FPGA failure detectors according to claim 10 are it is characterised in that described other hardware circuit includes letter Number driver BUFFER;
The input signal that described signal input unit is directed to BUFFER generation is the pin input clock of this FPGA;
Described signal input unit, is further used for being input to often the pin input clock of this fpga chip as input signal Individual BUFFER, the output clock using this BUFFER drives an enumerator;
Described signal comparing unit, in signal input unit using the pin input clock of this fpga chip as input signal After being input to each BUFFER, the pin input clock using this fpga chip drives another enumerator, is compared with The value exporting clock-driven enumerator and the enumerator driving using the pin input clock of this fpga chip of BUFFER, such as Really identical it is determined that this BUFFER does not break down, if it is not the same, then determining this BUFFER fault, record this BUFFER's Position Number.
15. FPGA failure detectors according to claim 10 are it is characterised in that described other hardware circuit includes going here and there Row transceiver SERDES;
The input signal that described signal input unit is directed to SERDES generation is the 4th data;
Described signal input unit, is further used for described 4th data input is every to configured good SERDES loopback mode Individual SERDES;
Described signal comparing unit, in signal input unit by described 4th data input to configured good SERDES loopback After each SERDES of pattern, the data of this SERDES loopback output is compared with described 4th data, if identical, Determining that this SERDES does not break down, if it is not the same, then determining this SERDES fault, recording the Position Number of this SERDES.
16. FPGA failure detectors according to claim 10 it is characterised in that
Described area division unit, is further used for for FPGA being divided into the 3rd region and the 4th region;
Described signal input unit, is further used for generating input signal for the second area block in the 3rd region, and this is defeated Enter signal input each second area block in the 3rd region, so that this input signal flows through owning in this second area block Output signal after reg and lut;It is further used for generating input signal for the second area block in the 4th region, this is inputted Signal input each second area block in the 4th region, so that this input signal flows through owning in this second area block Output signal after reg and lut;
Described signal comparing unit, is further used for being input to each second area block in the 3rd region according to signal input unit Input signal and this second area block output signal judge in this second area block whether there is fault reg or lut;Enter One step is used for being input to the input signal of each second area block and this second area in the 4th region according to signal input unit The output signal of block judges to whether there is reg or lut of fault in this second area block.
17. FPGA failure detectors according to claim 16 it is characterised in that
Described first area block is a line in FPGA;Described second area block is the string in FPGA;
Described first area be FPGA the first row arrive xth row, described second area for FPGA (x+1)th row to last column, Wherein x is more than 0, and a natural number of the total line number less than FPGA;
Described 3rd region is that the first row of FPGA arranges to y, and described 4th region is that the y+1 of FPGA arranges the last of FPGA String;Wherein y is more than 0, and a natural number of the total columns less than FPGA;
Described signal input unit in each the first area block being input to input signal in first area or second area, with When making this input signal flow through output signal after all reg and lut in this first area block, it is used for:By first area or Reg and lut in every a line in two regions is concatenated, and input includes 0 and 1 many bit serial data stream, so that this data Stream shifts on reg and lut of this row, and the afterbody reg in this row or lut output stream;Input signal is defeated Enter each the second area block in the 3rd region or the 4th region, so that this input signal flows through the institute in this second area block When having output signal after reg and lut, it is used for:Reg and lut in every string in 3rd region or the 4th region is contacted Come, input includes 0 and 1 many bit serial data stream, so that this data flow shifts on reg and lut of this row, and in this row Afterbody reg or lut output stream;
Described signal comparing unit is being input to each first area in first area or second area according to signal input unit The output signal of the input signal of block and this first area block judges to whether there is reg and lut of fault in this first area block When, it is used for:Judge whether the data flow from afterbody reg or lut of every a line output is identical with the data flow of this row of input, If identical it is determined that reg and lut of this row is normal, otherwise, it determines this row has reg or lut of fault, record this fault Line number;Be input to according to signal input unit in the 3rd region or the 4th region the input signal of each second area block and When the output signal of this second area block judges reg or lut that whether there is fault in this second area block, it is used for:Judge from Whether the data flow of the afterbody reg or lut output of every string is identical with the data flow inputting this row, if identical, really Reg and lut of this row fixed is normal, otherwise, it determines this row has reg or lut of fault, records the row number of this fault.
18. FPGA failure detectors according to claim 10 it is characterised in that
Before described fault detection unit loads, in software loading unit, the fpga chip inspection software previously generating, use further In:First pass through IOBUS interface and write preset data in arbitrary depositor of FPGA, and to the data in described arbitrary depositor Negate;Read the data in described arbitrary depositor again, the data of reading and preset data be compared, if the read out number According to identical with preset data value of the inverted it is determined that IOBUS interface is normal, otherwise, it determines IOBUS interface fault.
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Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10270709B2 (en) 2015-06-26 2019-04-23 Microsoft Technology Licensing, Llc Allocating acceleration component functionality for supporting services
CN105893191B (en) * 2014-12-19 2019-12-17 伊姆西公司 Computing device and method for obtaining fault-related information
US9652327B2 (en) 2015-04-17 2017-05-16 Microsoft Technology Licensing, Llc Restoring service acceleration
US10296392B2 (en) 2015-04-17 2019-05-21 Microsoft Technology Licensing, Llc Implementing a multi-component service using plural hardware acceleration components
US10198294B2 (en) 2015-04-17 2019-02-05 Microsoft Licensing Technology, LLC Handling tenant requests in a system that uses hardware acceleration components
US9792154B2 (en) 2015-04-17 2017-10-17 Microsoft Technology Licensing, Llc Data processing system having a hardware acceleration plane and a software plane
US10511478B2 (en) 2015-04-17 2019-12-17 Microsoft Technology Licensing, Llc Changing between different roles at acceleration components
US10216555B2 (en) 2015-06-26 2019-02-26 Microsoft Technology Licensing, Llc Partially reconfiguring acceleration components
CN105589772A (en) * 2015-08-07 2016-05-18 杭州华三通信技术有限公司 Method and apparatus for detecting logic crash of FPGA chip
CN106443423B (en) * 2016-08-30 2019-10-11 中国电子科技集团公司第五十八研究所 Two times of line fault test methods of fpga chip based on Virtex framework
CN108600047B (en) * 2018-04-04 2021-04-27 天津芯海创科技有限公司 Serial transmission chip and SERDES circuit testing method
CN109491713B (en) * 2018-11-02 2021-11-26 南京贝伦思网络科技股份有限公司 Detection hang-up recovery method based on network chip
CN109870463B (en) * 2019-04-09 2020-01-14 深圳市阿赛姆电子有限公司 Electronic chip fault detection device

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6966020B1 (en) * 2001-07-03 2005-11-15 Agere Systems Inc. Identifying faulty programmable interconnect resources of field programmable gate arrays
CN101276298A (en) * 2008-04-01 2008-10-01 中国科学院计算技术研究所 FPGA circuit fault detecting apparatus
US7614022B1 (en) * 2006-12-05 2009-11-03 Xilinx, Inc. Testing for bridge faults in the interconnect of programmable integrated circuits
CN101865977A (en) * 2010-05-27 2010-10-20 复旦大学 Traversal test method of configurable logic block (CLB) of field programmable gate array (FPGA) based on look-up table structure
CN101916306A (en) * 2010-07-16 2010-12-15 北京航空航天大学 System and method for positioning FPGA chip sensitive area

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6966020B1 (en) * 2001-07-03 2005-11-15 Agere Systems Inc. Identifying faulty programmable interconnect resources of field programmable gate arrays
US7614022B1 (en) * 2006-12-05 2009-11-03 Xilinx, Inc. Testing for bridge faults in the interconnect of programmable integrated circuits
CN101276298A (en) * 2008-04-01 2008-10-01 中国科学院计算技术研究所 FPGA circuit fault detecting apparatus
CN101865977A (en) * 2010-05-27 2010-10-20 复旦大学 Traversal test method of configurable logic block (CLB) of field programmable gate array (FPGA) based on look-up table structure
CN101916306A (en) * 2010-07-16 2010-12-15 北京航空航天大学 System and method for positioning FPGA chip sensitive area

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
一种FPGA的可编程逻辑单元的全覆盖测试方法;廖永波等;《仪器仪表学报》;20100430;第31卷(第4期);第857-861页 *
一种新颖的FPGA逻辑故障测试定位方法;李文昌等;《微电子学》;20111031;第41卷(第5期);第755-758页 *

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