CN103197272A - System and method of measuring performance of partial discharge transient state ground voltage detector - Google Patents

System and method of measuring performance of partial discharge transient state ground voltage detector Download PDF

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CN103197272A
CN103197272A CN2013100846237A CN201310084623A CN103197272A CN 103197272 A CN103197272 A CN 103197272A CN 2013100846237 A CN2013100846237 A CN 2013100846237A CN 201310084623 A CN201310084623 A CN 201310084623A CN 103197272 A CN103197272 A CN 103197272A
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ground voltage
transient state
voltage detector
state ground
signal generator
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CN103197272B (en
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袁帅
阎春雨
毕建刚
是艳杰
杨宁
吴立远
王峰
杨圆
弓艳朋
邓彦国
孟楠
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State Grid Corp of China SGCC
China Electric Power Research Institute Co Ltd CEPRI
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State Grid Corp of China SGCC
China Electric Power Research Institute Co Ltd CEPRI
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Abstract

The invention provides a system and a method of measuring performance of a partial discharge transient state ground voltage detector. The system comprises a signal generator, a coaxial cable 2, a metal board, a matched resistor 4, a TEV (Transient earth voltage, transient state ground voltage) sensor 5, the transient state ground voltage detector 6 and a signal cable 7, wherein the signal generator is a sinusoidal signal generator 1 or a pulse signal generator 8, and the signal generator is connected with the metal board through the coaxial cable 2. The transient state ground voltage detector 6 is connected with the TEV sensor 5 through the signal cable 7, the TEV sensor 5 is tightly attached to the surface of the metal board which is grounded through the matched resistor 4, and the signal generator and the grounded end of the transient state ground voltage detector 6 are directed grounded. According to the fact that types or amplitudes or sizes of signals generated by the signal generator are regulated, linearity errors, pulse counting testing errors, stability errors and location functions of the transient state ground voltage detector 6 are tested. The test method is easy to achieve and simple and rapid to debug, and achieves process digitization.

Description

A kind of system and method for testing shelf depreciation transient state ground voltage detector performance
Technical field
The present invention relates to high-tension power transmission and transformation equipment discharge fault detection technique field, be specifically related to a kind of system and method for testing shelf depreciation transient state ground voltage detector performance.
Background technology
Shelf depreciation transient state ground voltage detection method has advantages such as easy to use, with strong points as a kind of charged detection technique, and progressively transformer station promotes the use of at home.Shelf depreciation transient state ground voltage detector generally is used for ac metal closing switch gear (abbreviation switch cubicle) is carried out the charged detection of shelf depreciation or shelf depreciation status monitoring.The inner shelf depreciation of switch cubicle can generate electromagnetic waves, and propagates in metallic walls formation skin effect and along the metal surface, produces the transient state ground voltage simultaneously in the metal surface.There is direct relation the size of the transient state ground voltage signal that shelf depreciation produces and the intensity of shelf depreciation and the position of point of discharge.Therefore, can utilize special sensor that transient state ground voltage signal is detected, to judge the shelf depreciation defective of switch cubicle inside, mistiming or difference in magnitude that the transient state ground voltage signal that can utilize same discharge source to produce simultaneously arrives the diverse location sensor position Partial Discharge Sources.
At present, transient state ground voltage detector lacks standardization, unified consistent method of testing and test macro, has influenced manufacturing and the check of instrument, and the technology that hindered further develops.Therefore, the research of carrying out transient state ground voltage detector test macro and detection method has important actual directive significance.
Summary of the invention
The present invention relates to a kind of system and method for testing shelf depreciation transient state ground voltage detector performance, described system comprises signal generator, concentric cable 2, sheet metal, build-out resistor 4, TEV sensor 5, transient state ground voltage detector 6 and signal cable 7;
Described signal generator is sinusoidal signal generator 1 or pulse signal generator 8, described signal generator is connected by described concentric cable 2 with described sheet metal, described transient state ground voltage detector 6 is connected by described signal cable 7 with described TEV sensor 5, described TEV sensor 5 is close on the surface of described sheet metal, described sheet metal is by described build-out resistor 4 ground connection, and described signal generator directly links to each other with ground with the earth terminal of described transient state ground voltage detector 6;
By regulating type, amplitude or the size of the signal that described signal generator sends, frequency band, linearity error, step-by-step counting measuring error, stability error and the positioning function of testing described transient state ground voltage detector 6 according to the output valve of described tested transient state ground voltage detector 6.
In first preferred embodiment provided by the invention: described signal generator is sinusoidal signal generator 1;
Described sheet metal is performance test sheet metal 3, and described performance test sheet metal 3 carries out the galvanized iron sheet that circular arc is handled for the thick 3mm of the wide 300mm of long 300mm corner;
The quantity of described TEV sensor 5 is one, is close on the surface of described performance test sheet metal 3 of vertical placement.
In second preferred embodiment provided by the invention: described signal generator is pulse signal generator 8;
Described sheet metal is performance test sheet metal 3, and described performance test sheet metal 3 carries out the galvanized iron sheet that circular arc is handled for the thick 3mm of the wide 300mm of long 300mm corner;
The quantity of described TEV sensor 5 is one, is close on the surface of described performance test sheet metal 3 of vertical placement.
In the 3rd preferred embodiment provided by the invention: described signal generator is pulse signal generator 8;
Described sheet metal is assignment test sheet metal 9, and described assignment test sheet metal 9 carries out the galvanized iron sheet that circular arc is handled for the thick 3mm of the wide 150mm of long 2000mm corner;
The quantity of described TEV sensor 5 is two, and described two TEV sensors 5 all are close on the surface of described assignment test sheet metal 9 of horizontal positioned.
In the 4th preferred embodiment provided by the invention: the model of described signal generator is Agilent 33250.
In the 5th preferred embodiment provided by the invention: the size of described build-out resistor 4 is 50 Ω.
The 6th preferred embodiment provided by the invention provides a kind of method of testing shelf depreciation transient state ground voltage detector performance, and described method is tested the frequency band of described transient state ground voltage detector 6 based on the system that first preferred embodiment provides, and comprising:
Step S101, the amplitude of sine wave signal of regulating 1 output of described sinusoidal signal generator arbitrary value and remaining unchanged to the 2V-5V scope;
Step S102, between the bound cutoff frequency of described tested transient state ground voltage detector 6 regulations, change the described sinusoidal wave frequency of the output of described sinusoidal signal generator 1, detect the centre frequency f in the described tested transient state ground voltage detector 6 output signal substantially constant zones c
Step S103 is f with described tested transient state ground voltage detector 6 output signal frequencies cThe sine wave output signal frequency of Shi Suoshu sinusoidal signal generator 1 is initial value, reduce the frequency of described sine wave signal with the 1MHz step-length, and guarantee that described sine wave signal voltage magnitude is constant, find out described tested transient state ground voltage detector 6 normalization output and drop to 0.501 o'clock Frequency point, it is the lower-cut-off frequency f of the actual measurement of described tested transient state ground voltage detector that described output drops to 0.501 o'clock Frequency point Down
Step S104 is f with described tested transient state ground voltage detector 6 output signal frequencies cThe sine wave output signal frequency of Shi Suoshu sinusoidal signal generator 1 is initial value, with the raise frequency of described sine wave signal of 1MHz step-length, and guarantee that described sine wave signal voltage magnitude is constant, find out described tested transient state ground voltage detector 6 normalization output and change to 0.501 o'clock Frequency point, it is the upper cut-off frequency f of the actual measurement of described tested transient state ground voltage detector 6 that described output changes to 0.501 o'clock Frequency point On
Step S105, the upper cut-off frequency f of the described actual measurement of the described tested transient state ground voltage detector 6 that obtains according to described step S103 and step S104 OnWith lower-cut-off frequency f Down, try to achieve the frequency band of described tested transient state ground voltage detector 6, calculate described tested transient state ground voltage detector 6 upper cut-off frequency f OnWith lower-cut-off frequency f DownError delta f OnWith Δ f DownBe respectively Δ f On=[(f On-f B)/f] * 100%, Δ f Down=[(f Down-f B)/f] * 100%;
Wherein: f BBe the nominal cutoff frequency of described tested transient state ground voltage detector, f On, f DownAnd f BUnit be Hz.
The 7th preferred embodiment provided by the invention provides a kind of method of testing shelf depreciation transient state ground voltage detector performance, and described method is tested the linearity error of described transient state ground voltage detector 6 based on the system that first preferred embodiment provides; Comprise:
S201, the sinusoidal signal frequency that 1 output of described sinusoidal signal generator is set is fixed as a certain frequency values between 3MHz~50MHz;
S202, regulate response that the amplitude of the described sine wave signal of described sinusoidal signal generator 1 output makes described transient state ground voltage detector 6 more than or equal to 30dB, and record crest voltage U and the described transient state ground voltage detector 6 full scale value A of described sinusoidal signal generator 1;
S203 reduces described sinusoidal signal generator 1 amplitude successively to λ U, and λ=0.8,0.6,0.4,0.2 is recorded the corresponding indicating value A λ of described transient state ground voltage detector 6 outputs respectively;
S204 calculates the linearity error of λ=0.8,0.6,0.4, each measurement point of 0.2
Figure BDA00002924333500031
The 8th preferred embodiment provided by the invention provides a kind of method of testing shelf depreciation transient state ground voltage detector performance, the system that described method provides based on second preferred embodiment, test the step-by-step counting measuring error of described transient state ground voltage detector 6, comprising:
S301 arranges described pulse signal generator 8 output pulse signals, changes the voltage magnitude of the pulse signal of described output, makes the reading of described transient state ground voltage detector 6 more than or equal to 20dB;
S302, the repetition frequency of regulating the described pulse signal of described pulse signal generator 1 output is one or more the optional value among 0.5kHz~10kHz, observes and record the counted number of pulses reading n of described transient state ground voltage detector 6 simultaneously xCount n with described pulse signal generator 1 set actual pulse;
S303 calculates step-by-step counting the measuring error δ=[(n of described tested transient state ground voltage detector 6 x-n)/n] * 100%.
The 9th preferred embodiment provided by the invention provides a kind of method of testing shelf depreciation transient state ground voltage detector performance, and described method is tested the stability error of described transient state ground voltage detector 6 based on the system that second preferred embodiment provides, and comprising:
S401 arranges the square-wave signal that described pulse signal generator 8 is exported constant amplitude, frequency;
S402, described transient state ground voltage detector 6 start continuous workings 1 hour, record described transient state ground voltage detector 6 from firm start to continuous working the response after 1 hour;
S403 calculates the stability error of described tested transient state ground voltage detector 6
Figure BDA00002924333500032
Wherein: x 1Response during for the start just of described tested transient state ground voltage detector 6, x 2Be the response of described tested transient state ground voltage detector 6 continuous workings after 1 hour,
Figure BDA00002924333500041
Arrive the mean value of the response of continuous working after 1 hour for the start just of described tested transient state ground voltage detector 6.
The tenth preferred embodiment provided by the invention provides a kind of method of testing shelf depreciation transient state ground voltage detector performance, and described method is tested the positioning function of described transient state ground voltage detector 6 based on the system that the 3rd preferred embodiment provides, and comprising:
S501 arranges described two the TEV sensors 5 on the described transient state ground voltage detector 6, makes the distance of described two sensors 5 greater than the detection and localization distance of described transient state ground voltage detector 6 regulations;
S502 arranges the pulse signal that described pulse signal generator 8 is exported constant amplitude, and the pulse repetition frequency of regulating described output is a certain value between 50Hz~10kHz;
S503 checks whether be triggered from described pulse signal generator 8 nearer described TEV sensors 5.
A kind of beneficial effect of testing the system and method for shelf depreciation transient state ground voltage detector performance provided by the invention comprises:
A kind of system and method for testing shelf depreciation transient state ground voltage detector performance provided by the invention, the project that detects transient state ground voltage detector performance comprises frequency band, linearity error, stability error, step-by-step counting sum of errors positioning function, advantages such as method of testing realizes easily, debugs simply fast, test process digitizing are suitable for power industry and carry out occasions such as routine maintenance, test, correction in the processes of using transient state ground voltage detector.
Description of drawings
Be illustrated in figure 1 as the structured flowchart of the embodiment one of a kind of system that tests shelf depreciation transient state ground voltage detector performance provided by the invention;
Be illustrated in figure 2 as the structured flowchart of the embodiment two of a kind of system that tests shelf depreciation transient state ground voltage detector performance provided by the invention;
Be illustrated in figure 3 as the structured flowchart of the embodiment three of a kind of system that tests shelf depreciation transient state ground voltage detector performance provided by the invention;
Among the figure: 1 is sinusoidal signal generator; 2 is concentric cable; 3 are the performance test sheet metal; 4 is build-out resistor; 5 is the TEV sensor; 6 is transient state ground voltage detector; 7 is signal cable; 8 is pulse signal generator; 9 is the assignment test sheet metal.
Embodiment
With reference to the accompanying drawings the specific embodiment of the present invention is described in further detail below.
The invention provides a kind of system and method for testing shelf depreciation transient state ground voltage detector performance, this system comprises signal generator, concentric cable 2, sheet metal, build-out resistor 4, TEV sensor 5, transient state ground voltage detector 6 and signal cable 7.
Signal generator is sinusoidal signal generator 1 or pulse signal generator 8, signal generator is connected by concentric cable 2 with sheet metal, transient state ground voltage detector 6 is connected by signal cable 7 with TEV sensor 5, TEV sensor 5 is close on the surface of sheet metal, sheet metal is by build-out resistor 4 ground connection, and signal generator directly links to each other with ground with the earth terminal of transient state ground voltage detector 6.
Type, amplitude or the size of the signal that sends by the conditioning signal generator, frequency band, linearity error, step-by-step counting measuring error, stability error and the positioning function of testing this transient state ground voltage detector 6 according to the output valve of tested transient state ground voltage detector 6.
Embodiment one:
Embodiment one provided by the invention is a kind of embodiment one that tests the system of shelf depreciation transient state ground voltage detector performance, its structured flowchart as shown in Figure 1, as shown in Figure 1, among the embodiment one of the system of this test shelf depreciation transient state ground voltage detector performance, signal generator is sinusoidal signal generator 1, and the model of sinusoidal signal generator 1 can be Agilent33250.Sheet metal is performance test sheet metal 3, can adopt the thick 3mm galvanized iron sheet of the wide 300mm of long 300mm, and the circular arc processing is carried out in the corner.The size of build-out resistor 4 can be 50 Ω.The quantity of TEV sensor 5 is one, and this TEV sensor 5 is close on the surface of performance test sheet metal 3 of vertical placement.
Embodiment two:
Embodiment two provided by the invention is a kind of embodiment one that tests the method for shelf depreciation transient state ground voltage detector performance, the embodiment one of the method for test shelf depreciation transient state ground voltage detector performance is based on the embodiment one of the system of as shown in Figure 1 test shelf depreciation transient state ground voltage detector performance, the frequency band of test transient state ground voltage detector 6, this method comprises:
Step S101, the amplitude of sine wave signal of output of regulating sinusoidal signal generator 1 arbitrary value and remaining unchanged to the 2V-5V scope.
Step S102, the sinusoidal wave frequency of the output of change sinusoidal signal generator 1 detects the centre frequency f in the tested transient state ground voltage detector 6 output signal substantially constant zones between the bound cutoff frequency of tested transient state ground voltage detector 6 regulations c
Step S103 is f with tested transient state ground voltage detector 6 output signal frequencies cThe time sinusoidal signal generator 1 the sine wave output signal frequency be initial value, reduce the frequency of sine wave signal with the 1MHz step-length, and guarantee that this sine wave signal voltage magnitude is constant, find out tested transient state ground voltage detector 6 normalization output and drop to 0.501 o'clock Frequency point (6dB point), this point is the lower-cut-off frequency f of actual measurement Down
Step S104 is f with tested transient state ground voltage detector 6 output signal frequencies cThe time sinusoidal signal generator 1 the sine wave output signal frequency be initial value, frequency with 1MHz step-length rising sine wave signal, and guarantee that this sine wave signal voltage magnitude is constant, find out tested transient state ground voltage detector 6 normalization output and change to 0.501 o'clock Frequency point (6dB point), this point is the upper cut-off frequency f of the actual measurement of tested transient state ground voltage detector 6 On
Step S105, the upper cut-off frequency f of the actual measurement of the tested transient state ground voltage detector 6 that obtains according to step S103 and step S104 OnWith lower-cut-off frequency f Down, can be in the hope of the frequency band of tested transient state ground voltage detector 6, and calculate tested transient state ground voltage detector 6 upper cut-off frequency f OnWith lower-cut-off frequency f DownError delta f OnWith Δ f DownBe respectively Δ f On=[(f On-f B)/f] * 100%, Δ f Down=[(f Down-f B)/f] * 100%.
In the formula: f BBe the nominal cutoff frequency of tested transient state ground voltage detector, f On, f DownAnd f BUnit be Hz.
General, cutoff frequency error delta f OnWith Δ f DownShould be in-10% to+10% scope.
Embodiment three:
Embodiment three provided by the invention is a kind of embodiment two that tests the method for shelf depreciation transient state ground voltage detector performance, the embodiment two of the method for test shelf depreciation transient state ground voltage detector performance is based on the embodiment one of the system of as shown in Figure 1 test shelf depreciation transient state ground voltage detector performance, the linearity error of test transient state ground voltage detector 6, this method comprises:
S201, the sine wave signal fixed-frequency that sinusoidal signal generator 1 output is set is a certain frequency values between 3MHz~50MHz.
S202, the response that the amplitude of the sine wave signal of adjusting sinusoidal signal generator 1 output makes transient state ground voltage detector 6 is more than or equal to 30dB, and crest voltage U and the transient state ground voltage detector 6 full scale value A of record sinusoidal signal generator 1.
S203 reduces sinusoidal signal generator 1 amplitude successively to λ U, and λ=0.8,0.6,0.4,0.2 is recorded the corresponding indicating value A λ of transient state ground voltage detector 6 outputs respectively.
S204 calculates the linearity error of λ=0.8,0.6,0.4, each measurement point of 0.2
Figure BDA00002924333500061
General, linearity error ε lShould be in-20% to+20% scope.
Embodiment four:
Embodiment four provided by the invention is a kind of embodiment four that tests the system of shelf depreciation transient state ground voltage detector performance, its structured flowchart as shown in Figure 2, as shown in Figure 2, among the embodiment two of the system of this test shelf depreciation transient state ground voltage detector performance, signal generator is pulse signal generator 8, and the model of pulse signal generator 8 can be Agilent33250.Sheet metal is performance test sheet metal 3, can adopt the thick 3mm galvanized iron sheet of the wide 300mm of long 300mm, and the circular arc processing is carried out in the corner.The size of build-out resistor 4 can be 50 Ω.The quantity of TEV sensor 5 is one, and this TEV sensor 5 is close on the surface of performance test sheet metal 3 of vertical placement.
Embodiment five:
Embodiment five provided by the invention is a kind of embodiment three that tests the method for shelf depreciation transient state ground voltage detector performance, the embodiment three of the method for test shelf depreciation transient state ground voltage detector performance is based on the embodiment two of the system of as shown in Figure 2 test shelf depreciation transient state ground voltage detector performance, the step-by-step counting measuring error of test transient state ground voltage detector 6, this method comprises:
S301 arranges pulse signal generator 8 output pulse signals, changes the voltage magnitude of the pulse signal of output, makes the reading of transient state ground voltage detector 6 more than or equal to 20dB.
S302, the repetition frequency of the pulse signal of regulating impulse signal generator 1 output is one or more the optional value among 0.5kHz~10kHz, observes and record the counted number of pulses reading n of transient state ground voltage detector 6 simultaneously xCount n with pulse signal generator 1 set actual pulse.
S303 calculates tested transient state ground voltage detector 6 step-by-step counting measuring error δ=[(n x-n)/n] * 100%.
General, step-by-step counting measuring error δ should be in-10% to+10% scope.
Embodiment six:
Embodiment six provided by the invention is a kind of embodiment four that tests the method for shelf depreciation transient state ground voltage detector performance, the embodiment four of the method for test shelf depreciation transient state ground voltage detector performance is based on the embodiment two of the system of as shown in Figure 2 test shelf depreciation transient state ground voltage detector performance, the stability error of test transient state ground voltage detector 6, this method comprises:
S401 arranges the square-wave signal that pulse signal generator 8 is exported constant amplitude, frequency.
S402, transient state ground voltage detector 6 start continuous workings 1 hour, record this transient state ground voltage detector 6 from firm start to continuous working the response after 1 hour.
S403 calculates the stability error of tested transient state ground voltage detector 6
Figure BDA00002924333500071
In the formula: x 1Response during for the start just of tested transient state ground voltage detector 6, x 2Be the response of tested transient state ground voltage detector 6 continuous workings after 1 hour,
Figure BDA00002924333500072
Arrive the mean value of the response of continuous working after 1 hour for the start just of tested transient state ground voltage detector 6.
General, stability error δ ' should be in-20% to+20% scope.
Embodiment seven:
Embodiment seven provided by the invention is a kind of embodiment three that tests the system of shelf depreciation transient state ground voltage detector performance, its structured flowchart as shown in Figure 3, as shown in Figure 3, among the embodiment three of the system of this test shelf depreciation transient state ground voltage detector performance, signal generator is pulse signal generator 8, and the model of pulse signal generator 8 can be Agilent33250.Sheet metal is assignment test sheet metal 9, can adopt the thick 3mm galvanized iron sheet of the wide 150mm of long 2000mm, and the circular arc processing is carried out in the corner.The size of build-out resistor 4 can be 50 Ω.The quantity of TEV sensor 5 is two, and two TEV sensors 5 all are close on the surface of assignment test sheet metal 9 of horizontal positioned.
Embodiment eight:
Embodiment eight provided by the invention is a kind of embodiment five that tests the method for shelf depreciation transient state ground voltage detector performance, the embodiment five of the method for test shelf depreciation transient state ground voltage detector performance is based on the embodiment three of the system of as shown in Figure 3 test shelf depreciation transient state ground voltage detector performance, the positioning function of test transient state ground voltage detector 6, this method comprises:
S501 arranges two TEV sensors 5 on the transient state ground voltage detector 6, makes the distance of two sensors 5 greater than the detection and localization distance of transient state ground voltage detector 6 regulations.
S502 arranges the pulse signal that pulse signal generator 8 is exported constant amplitude, and the pulse repetition frequency of regulating output is a certain value between 50Hz~10kHz.
S503 checks whether be triggered from pulse signal generator 8 nearer TEV sensors 5.
Whether the positioning function of detector 6 is to realize according to the sequencing and the signal time difference that detect TEV signal arrival sensor, therefore observe and trigger from the nearer TEV sensor of signal source, can judge whether the positioning function of detector 6 is normal.
Should be noted that at last: above embodiment is only in order to illustrate that technical scheme of the present invention is not intended to limit, although with reference to above-described embodiment the present invention is had been described in detail, those of ordinary skill in the field are to be understood that: still can make amendment or be equal to replacement the specific embodiment of the present invention, and do not break away from any modification of spirit and scope of the invention or be equal to replacement, it all should be encompassed in the middle of the claim scope of the present invention.

Claims (11)

1. system that tests shelf depreciation transient state ground voltage detector performance, it is characterized in that described system comprises signal generator, concentric cable (2), sheet metal, build-out resistor (4), TEV sensor (5), transient state ground voltage detector (6) and signal cable (7);
Described signal generator is sinusoidal signal generator (1) or pulse signal generator (8), described signal generator is connected by described concentric cable (2) with described sheet metal, described transient state ground voltage detector (6) is connected by described signal cable (7) with described TEV sensor (5), described TEV sensor (5) is close on the surface of described sheet metal, described sheet metal is by described build-out resistor (4) ground connection, and described signal generator directly links to each other with ground with the earth terminal of described transient state ground voltage detector (6);
By regulating type, amplitude or the size of the signal that described signal generator sends, frequency band, linearity error, step-by-step counting measuring error, stability error and the positioning function of testing described transient state ground voltage detector (6) according to the output valve of described tested transient state ground voltage detector (6).
2. the system as claimed in claim 1 is characterized in that, described signal generator is sinusoidal signal generator (1);
Described sheet metal is performance test sheet metal (3), and described performance test sheet metal (3) carries out the galvanized iron sheet that circular arc is handled for the thick 3mm of the wide 300mm of long 300mm corner;
The quantity of described TEV sensor (5) is one, is close on the surface of described performance test sheet metal (3) of vertical placement.
3. the system as claimed in claim 1 is characterized in that, described signal generator is pulse signal generator (8);
Described sheet metal is performance test sheet metal (3), and described performance test sheet metal (3) carries out the galvanized iron sheet that circular arc is handled for the thick 3mm of the wide 300mm of long 300mm corner;
The quantity of described TEV sensor (5) is one, is close on the surface of described performance test sheet metal (3) of vertical placement.
4. the system as claimed in claim 1 is characterized in that, described signal generator is pulse signal generator (8);
Described sheet metal is assignment test sheet metal (9), and described assignment test sheet metal (9) carries out the galvanized iron sheet that circular arc is handled for the thick 3mm of the wide 150mm of long 2000mm corner;
The quantity of described TEV sensor (5) is two, and described two TEV sensors (5) all are close on the surface of described assignment test sheet metal (9) of horizontal positioned.
5. the system as claimed in claim 1 is characterized in that, the model of described signal generator is Agilent33250.
6. the system as claimed in claim 1 is characterized in that, the size of described build-out resistor (4) is 50 Ω.
7. a method of testing shelf depreciation transient state ground voltage detector performance is characterized in that, described method is tested the frequency band of described transient state ground voltage detector (6) based on system as claimed in claim 2, comprising:
Step S101, the amplitude of sine wave signal of regulating described sinusoidal signal generator (1) output arbitrary value and remaining unchanged to the 2V-5V scope;
Step S102, between the bound cutoff frequency of described tested transient state ground voltage detector (6) regulation, change the described sinusoidal wave frequency of the output of described sinusoidal signal generator (1), detect the centre frequency f in described tested transient state ground voltage detector (6) the output signal substantially constant zone c
Step S103 is f with described tested transient state ground voltage detector (6) output signal frequency cThe sine wave output signal frequency of Shi Suoshu sinusoidal signal generator (1) is initial value, reduce the frequency of described sine wave signal with the 1MHz step-length, and guarantee that described sine wave signal voltage magnitude is constant, find out the Frequency point that described tested transient state ground voltage detector (6) normalization output drops at 0.501 o'clock, it is the lower-cut-off frequency f of the actual measurement of described tested transient state ground voltage detector that described output drops to 0.501 o'clock Frequency point Down
Step S104 is f with described tested transient state ground voltage detector (6) output signal frequency cThe sine wave output signal frequency of Shi Suoshu sinusoidal signal generator (1) is initial value, with the raise frequency of described sine wave signal of 1MHz step-length, and guarantee that described sine wave signal voltage magnitude is constant, find out the Frequency point that described tested transient state ground voltage detector (6) normalization output changes at 0.501 o'clock, it is the upper cut-off frequency f of the actual measurement of described tested transient state ground voltage detector (6) that described output changes to 0.501 o'clock Frequency point On
Step S105, the upper cut-off frequency f of the described actual measurement of the described tested transient state ground voltage detector (6) that obtains according to described step S103 and step S104 OnWith lower-cut-off frequency f Down, try to achieve the frequency band of described tested transient state ground voltage detector (6), calculate described tested transient state ground voltage detector (6) upper cut-off frequency f OnWith lower-cut-off frequency f DownError delta f OnWith Δ f DownBe respectively Δ f On=[(f On-f B)/f] * 100%, Δ f Down=[(f Down-f B)/f] * 100%;
Wherein: f BBe the nominal cutoff frequency of described tested transient state ground voltage detector, f On, f DownAnd f BUnit be Hz.
8. a method of testing shelf depreciation transient state ground voltage detector performance is characterized in that, described method is tested the linearity error of described transient state ground voltage detector (6) based on system as claimed in claim 2; Comprise:
S201, the sinusoidal signal frequency that described sinusoidal signal generator (1) output is set is fixed as a certain frequency values between 3MHz~50MHz;
S202, regulate response that the amplitude of the described sine wave signal of described sinusoidal signal generator (1) output makes described transient state ground voltage detector (6) more than or equal to 30dB, and record crest voltage U and described transient state ground voltage detector (6) the full scale value A of described sinusoidal signal generator (1);
S203 reduces described sinusoidal signal generator (1) amplitude successively to λ U, and λ=0.8,0.6,0.4,0.2 is recorded the corresponding indicating value A λ of described transient state ground voltage detector (6) output respectively;
S204 calculates the linearity error of λ=0.8,0.6,0.4, each measurement point of 0.2
9. a method of testing shelf depreciation transient state ground voltage detector performance is characterized in that, described method is tested the step-by-step counting measuring error of described transient state ground voltage detector (6) based on system as claimed in claim 3, comprising:
S301 arranges described pulse signal generator (8) output pulse signal, changes the voltage magnitude of the pulse signal of described output, makes the reading of described transient state ground voltage detector (6) more than or equal to 20dB;
S302, the repetition frequency of regulating the described pulse signal of described pulse signal generator (1) output is one or more the optional value among 0.5kHz~10kHz, observes and record the counted number of pulses reading n of described transient state ground voltage detector (6) simultaneously xCount n with the set actual pulse of described pulse signal generator (1);
S303 calculates step-by-step counting the measuring error δ=[(n of described tested transient state ground voltage detector (6) x-n)/n] * 100%.
10. a method of testing shelf depreciation transient state ground voltage detector performance is characterized in that, described method is tested the stability error of described transient state ground voltage detector (6) based on system as claimed in claim 3, comprising:
S401 arranges the square-wave signal that described pulse signal generator (8) is exported constant amplitude, frequency;
S402, described transient state ground voltage detector (6) start continuous working 1 hour, record described transient state ground voltage detector (6) from firm start to continuous working the response after 1 hour;
S403 calculates the stability error of described tested transient state ground voltage detector (6)
Figure FDA00002924333400031
Wherein: x 1Be the response of described tested transient state ground voltage detector (6) when just starting shooting, x 2Be the response of described tested transient state ground voltage detector (6) continuous working after 1 hour, Arrive the mean value of the response of continuous working after 1 hour for described tested transient state ground voltage detector (6) start just.
11. a method of testing shelf depreciation transient state ground voltage detector performance is characterized in that, described method is tested the positioning function of described transient state ground voltage detector (6) based on system as claimed in claim 4, comprising:
S501 arranges described two the TEV sensors (5) on the described transient state ground voltage detector (6), makes the distance of described two sensors (5) greater than the detection and localization distance of described transient state ground voltage detector (6) regulation;
S502 arranges the pulse signal that described pulse signal generator (8) is exported constant amplitude, and the pulse repetition frequency of regulating described output is a certain value between 50Hz~10kHz;
S503 checks whether be triggered from the nearer described TEV sensor (5) of described pulse signal generator (8).
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