CN103187025A - Working circuit used for organic electroluminescence display (OLED) device, relative device, relative equipment and relative method - Google Patents

Working circuit used for organic electroluminescence display (OLED) device, relative device, relative equipment and relative method Download PDF

Info

Publication number
CN103187025A
CN103187025A CN2011104560441A CN201110456044A CN103187025A CN 103187025 A CN103187025 A CN 103187025A CN 2011104560441 A CN2011104560441 A CN 2011104560441A CN 201110456044 A CN201110456044 A CN 201110456044A CN 103187025 A CN103187025 A CN 103187025A
Authority
CN
China
Prior art keywords
oled
voltage
supply terminal
screen body
voltage supply
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN2011104560441A
Other languages
Chinese (zh)
Other versions
CN103187025B (en
Inventor
邱勇
张国辉
董艳波
李艳蕊
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tsinghua University
Suzhou Qingyue Optoelectronics Technology Co Ltd
Original Assignee
Tsinghua University
Beijing Visionox Technology Co Ltd
Kunshan Visionox Display Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tsinghua University, Beijing Visionox Technology Co Ltd, Kunshan Visionox Display Co Ltd filed Critical Tsinghua University
Priority to CN201110456044.1A priority Critical patent/CN103187025B/en
Publication of CN103187025A publication Critical patent/CN103187025A/en
Application granted granted Critical
Publication of CN103187025B publication Critical patent/CN103187025B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Abstract

The invention provides a working circuit used for an organic electroluminescence display (OLED) device. Further provided is the OLED device. The OLED device comprises an OLED screen body and the working circuit used for the OLED device. Further provided is display equipment. Further provided is lighting equipment. Further provided is a method. The method is used for repairing the OLED screen body.

Description

The operating circuit and related device, equipment and the method that are used for the OLED device
Technical field
The present invention relates in general to ORGANIC ELECTROLUMINESCENCE DISPLAYS (OLED, Organic Electroluminescence Display) and lighting field, is specifically related to the reparation field of OLED device.
Background technology
In recent years, the organic electroluminescent technology more and more is subjected to people's attention because of its plurality of advantages, and the OLED device is used for showing and illumination more and more widely.
Typical OLED screen body comprise anode, negative electrode and be arranged in negative electrode and anode between organic layer.In the work of OLED device, OLED screen body is applied in forward voltage, makes and injects electronics from negative electrode to organic layer, and to the organic layer injected hole, electronics and hole are compounded to form exciton in organic layer from anode, and organic layer is luminous when exciton releases energy.
Present OLED device comprises two kinds of active-matrix (active matrix) OLED device and passive-matrix (passive matrix) OLED devices.In passive-matrix OLED device, comprise one or more negative electrodes (they are parallel to each other usually when a plurality of) and one or more anode (they are parallel to each other usually when a plurality of), described negative electrode and described anode are generally the right angle at an angle.Between device cathodes and anode, there is organic layer.In the work of passive-matrix OLED device, each negative electrode and each anode can be applied voltage separately, and when having forward voltage between the negative electrode of overlapping region and anode, the organic layer in this overlapping region is luminous.
Summary of the invention
Usually there are defect points such as dust granule, burr, pin hole, crackle inevitably in the OLED screen body, and the anode of OLED screen body and the interval between the negative electrode very little (being generally the hundreds of nanometer) usually.As a result, at this defect point place, anode may directly contact with negative electrode, and perhaps the organic layer between anode and the negative electrode can become thinner than other positions.When the OLED device was worked, electric current more was tending towards passing through from this defect point rather than from other positions.Make heat in this defect point place accumulation (often showing as bright spot).If things go on like this, not only can cause single pixel not luminous, also can have influence on the pixel of whole piece file or horizontally-arranged, damage quality and the reliability of whole OLED device.This defect point is called as short dot in this article.
Generally speaking, under the identical situation of other conditions, the light-emitting area of OLED screen body is more big, and the possibility that short dot occurs is also more big.In addition, for the OLED device with big pixel (for example be used for the OLED device of illumination, it often only has a few pixels even only has a pixel), if short dot development of defects to a pixel, with regard to the function of the whole OLED device of entail dangers to.
Might reduce short dot by the thickness that increases organic layer, thereby but this requires the OLED device to adopt higher driving voltage to influence device efficiency, and can not eliminate short dot fully.May solve the short dot problem by adding protective layer, but this requires also the OLED device to adopt higher driving voltage, and can increase the complexity of preparation.
OLED screen body has the electrical specification of light emitting diode: when OLED screen body was applied forward voltage, the electric current by OLED screen body was along with the index that increases to of this forward voltage increases, and for example shown in Figure 1 (horizontal ordinate is represented voltage, and unit is V; Ordinate is represented current density, and unit is A/m 2); When OLED screen body was applied reverse voltage, OLED screen body was cut-off state, and no current passes through.If the OLED screen body that has short dot is applied reverse voltage, then the position except short-circuit point is cut-off state, and electric current concentrates on short-circuit point to be passed through, and namely there is leakage current in short-circuit point.When leakage current reaches a certain threshold value, short dot can be breakdown, and after this defective no longer develops.In this article, " forward " voltage refers to, and the voltage that puts on anode is higher than the voltage that puts on negative electrode, and " oppositely " voltage refers to, and the voltage that puts on negative electrode is higher than the voltage that puts on anode.Correspondingly, " oppositely " electric current refers to the electric current that flows to anode from negative electrode.
No doubt short dot is no longer luminous after breakdown, thereby shows as dim spot, but compares with the light-emitting area of whole OLED screen body when very little when this dim spot, and is also very little to the influence of overall demonstration or illuminating effect, even can ignore.Therefore, before the short dot development of defects, even before short dot was by human eye or checkout equipment discovery, it was favourable repairing early.
One aspect of the present invention provides a kind of operating circuit for the OLED device, comprising:
Repair circuit, comprising:
The first voltage supply terminal is used for being connected to the anode that OLED shields body; And
The second voltage supply terminal is used for being connected to the negative electrode that described OLED shields body,
Be used for by the described first voltage supply terminal and the described second voltage supply terminal described OLED screen body being applied reverse reparation voltage.
In one embodiment, above-mentioned operating circuit for the OLED device also comprises:
Testing circuit comprises:
The 3rd voltage supply terminal is used for being connected to the anode that described OLED shields body; And
The 4th voltage supply terminal is used for being connected to the negative electrode that described OLED shields body,
Be used for by described the 3rd voltage supply terminal and described the 4th voltage supply terminal described OLED screen body being applied inverse detection voltage, and monitor the size of the inverse detection electric current that is caused by described inverse detection voltage.
In one embodiment, described the 3rd voltage supply terminal and the described first voltage supply terminal be same end in, and/or described the 4th voltage supply terminal and the described second voltage supply terminal be same terminal.Use this embodiment can simplify circuit.
In one embodiment, above-mentioned operating circuit for the OLED device also comprises:
The driven circuit comprises:
The 5th voltage supply terminal is used for being connected to the anode that described OLED shields body; And
The 6th voltage supply terminal is used for being connected to the negative electrode that described OLED shields body,
Be used for by described the 5th voltage supply terminal and described the 6th voltage supply terminal described OLED screen body being applied normal drive voltage.
In one embodiment, described the 5th voltage supply terminal and the described first voltage supply terminal are same terminals, and/or described the 6th voltage supply terminal and the described second voltage supply terminal are same terminals.Use this embodiment can simplify circuit.
In one embodiment, above-mentioned operating circuit for the OLED device also comprises control module, is used for enabling and/or forbidding of the described reparation circuit of control.
In one embodiment, above-mentioned operating circuit for the OLED device also comprises control module, is used for whether judging described inverse detection electric current greater than threshold value, and carries out:
If described inverse detection electric current greater than described threshold value, is then enabled described reparation circuit; And
If described inverse detection electric current is not more than described threshold value, then forbid described reparation circuit.
In one embodiment, described control module also is used for carrying out:
If described inverse detection electric current greater than described threshold value, is then forbidden described OLED screen body is applied normal drive voltage; And
If described inverse detection electric current is not more than described threshold value, then allow described OLED screen body is applied normal drive voltage.
Another aspect of the present invention provides a kind of OLED device, comprising:
OLED shields body, comprising:
Anode;
Negative electrode; With
Organic layer, it is between described anode and described negative electrode; And
According to the described operating circuit for the OLED device of one of previous embodiments.The OLED device that uses this embodiment to access self to have repair function.On the one hand, this has simplified the reparation operation of OLED device, and permission needn't just can be repaired the OLED device by external reparation circuit, and allows the user who does not possess corresponding expertise the OLED device to be repaired at home.On the other hand, the timely reparation that this is conducive to the OLED device for example allows short dot to obtain early repairing before by human eye or checkout equipment discovery, thereby prolongs the serviceable life of OLED device.
In one embodiment, above-mentioned OLED device is passive-matrix OLED device.
Another aspect of the present invention provides a kind of display device, comprises according to the described OLED device of one of previous embodiments.
Another aspect of the present invention provides a kind of light fixture, comprises according to the described OLED device of one of previous embodiments.
It is a kind of for the method for repairing OLED screen body that another aspect of the present invention provides, and comprising:
Described OLED screen body is applied reverse reparation voltage.
In one embodiment, this method is to use and carries out according to the described operating circuit for the OLED device of one of previous embodiments.
It is a kind of for the method for repairing OLED screen body that another aspect of the present invention provides, and comprising:
OLED screen body is applied inverse detection voltage;
The size of the inverse detection electric current that monitoring is caused by described inverse detection voltage; And
If described inverse detection electric current greater than threshold value, then applies reverse reparation voltage to described OLED screen body.
In one embodiment, above-mentioned method for reparation OLED screen body also comprises:
After described OLED screen body is applied reverse reparation voltage, again described OLED screen body is applied inverse detection voltage, so repeat, till described inverse detection electric current is not more than described threshold value.
In one embodiment, this method is to use and carries out according to the described operating circuit for the OLED device of one of previous embodiments.
Description of drawings
By hereinafter by reference to the accompanying drawings detailed description, will understand the present invention better.In the accompanying drawings:
Fig. 1 illustration the voltage-to-current curve map of OLED screen body when applying forward voltage.
Fig. 2 is the exemplary cross sectional view that has the OLED screen body of short dot.
Fig. 3 is that the operating circuit and the OLED that are used for repairing circuit having of OLED device according to one embodiment of the invention shields the synoptic diagram that body is in connection status
Fig. 4 is that the operating circuit and the OLED that are used for repairing circuit having of OLED device according to another embodiment of the invention shields the synoptic diagram that body is in connection status.
The process flow diagram of the operation of Fig. 5 is illustration operating circuit shown in Figure 4.
Fig. 6 is the synoptic diagram according to an embodiment for the voltage of repairing OLED screen body of the present invention.
Should be understood that these accompanying drawings only for illustrative purposes, and may not draw in proportion.
Embodiment
Describe the specific embodiment of the present invention hereinafter with reference to the accompanying drawings.
Fig. 2 is the exemplary cross sectional view that has the OLED screen body 20 of short dot.OLED screen body 20 comprises: substrate 200, anode 210, organic layer 220 and negative electrode 230.In OLED screen body 20, there is a short dot 240.Although the interface place that short dot 240 is shown in anode 210 and organic layer 220 in Fig. 2 is from anode 210 protruding burrs to organic layer 220, short dot can occur with other forms in practice.
Fig. 3 is that the operating circuit 30 that is used for repairing circuit having of OLED device according to one embodiment of the invention shields the synoptic diagram that body 300 is in connection status with OLED.Operating circuit 30 comprises: driven gauge tap S1; Repair gauge tap S2; Power switch Q1, Q2, Q 3 and Q4 (in Fig. 3, being shown MOS transistor); The first voltage supply terminal 310 is used for being connected to the anode that OLED shields body; And the second voltage supply terminal 320, be used for being connected to the negative electrode of OLED screen body.
For operating circuit 30, normal drive voltage VCC is through the path of power switch Q1 to the first voltage supply terminal 310, and ground voltage GND belongs to the driven circuit through power switch Q3 to the path of the second voltage supply terminal 320; Repair voltage VCOMH through the path of power switch Q2 to the second voltage supply terminal 320, and ground voltage GND belongs to the reparation circuit through power switch Q4 to the path of the first voltage supply terminal 310.In operating circuit 30, driven circuit and reparation circuit share the first voltage supply terminal 310 and the second voltage supply terminal 320.
Operation under the situation that operating circuit 30 and OLED screen body 300 is connected is described below.
When driven gauge tap S1 is closed and repairs gauge tap S2 for disconnection, power switch Q1 and Q3 conducting and power switch Q2 and not conducting of Q4, make the voltage supply terminal 310 of winning provide normal drive voltage VCC to the anode that OLED shields body 300, and the second voltage supply terminal 320 provides ground voltage GND to the negative electrode of OLED screen body 300, thus OLED screen body 300 operate as normal.When to repair gauge tap S2 be closure and driven gauge tap S1 when disconnecting, power switch Q2 and Q4 conducting and power switch Q1 and not conducting of Q3, make the second voltage supply terminal 320 provide reparation voltage VCOMH to the negative electrode of OLED screen body 300, and the first voltage supply terminal 310 provides ground voltage GND to the anode of OLED screen body 300, wherein repair voltage VCOMH and comprise the voltage part of voltage GND above Ground, this part applies reverse reparation voltage to OLED screen body 300, thereby OLED screen body 300 is repaired.
For operating circuit 30, repairing voltage VCOMH can be the pulse that one or more voltages are higher than GND, also can be alternately (the playing the pulse that voltage is higher than GND that is still of puncture short point effect) that one or more voltages are higher than the pulse of GND and the pulse that one or more voltage is lower than GND, decide on actual needs.
The closed and disconnected of repairing gauge tap S2 can trigger or manual triggers automatically.In addition, can add holding circuit for operating circuit 30, be closure to avoid driven gauge tap S1 and to repair gauge tap S2 simultaneously.
Should be understood that and to apply reparation voltage on any desired opportunity.In a situation, can be when the each end-of-job of OLED device, for example when the display device shutdown that has the OLED device, the closed gauge tap S2 that repairs is to apply reparation voltage, the short dot that may exist puncture.In another situation, can when finding short dot (for example bright spot), disconnect driven gauge tap S1 in OLED device normal work period, closed restoration switch S2 to apply reparation voltage, punctures short dot then.
Fig. 4 is that the operating circuit 40 that is used for repairing circuit having of OLED device according to another embodiment of the invention shields the synoptic diagram that body 400 is in connection status with OLED.Operating circuit 40 comprises: total control switch S1; Power switch Q1, Q2, Q3 and Q4 (in Fig. 4, being shown MOS transistor); The first voltage supply terminal 410 is used for being connected to the anode that OLED shields body; The second voltage supply terminal 420 is used for being connected to the negative electrode that OLED shields body; Overhead control unit 430, it has input end IO_1 and IO_3 and output terminal IO_2 and IO_4; Detecting unit 440; And selected cell 450 (not shown).
For operating circuit 40, normal drive voltage VCC is through the path of power switch Q1 to the first voltage supply terminal 410, and ground voltage GND belongs to the driven circuit through power switch Q3 to the path of the second voltage supply terminal 420; Detect voltage VTEST through the path of power switch Q2 to the second voltage supply terminal 420, and ground voltage GND belongs to testing circuit through power switch Q4 to the path of the first voltage supply terminal 410; Repair voltage VCOMH through the path of power switch Q2 to the second voltage supply terminal 420, and ground voltage GND belongs to the reparation circuit through power switch Q4 to the path of the first voltage supply terminal 410.In operating circuit 40, driven circuit, testing circuit and reparation circuit share the first voltage supply terminal 410 and the second voltage supply terminal 420.Because operating circuit 40 all automatically performed detection and automatically performed reparation according to testing result before each execution driven, the reparation circuit among Fig. 4 can be called as " self-repair circuit ".
Operation under the situation that operating circuit 40 and OLED screen body 400 is connected is described below.
When total control switch S1 is disconnection, power switch Q1, Q2, Q3 and not conductings of Q4.When total control switch S1 switches to closure by disconnection, overhead control unit 430 receives voltage VDD by input end IO_1, and make power switch Q2 and Q4 conducting by output terminal IO_2 output signal, and selected cell 450 selects to detect voltage VTEST, make the second voltage supply terminal 420 provide detection voltage VTEST to the negative electrode of OLED screen body 400, and the first voltage supply terminal 410 provides ground voltage GND to the anode of OLED screen body 400, wherein detect voltage VTEST and comprise the voltage part of voltage GND above Ground, this part applies inverse detection voltage to OLED screen body 400.At this moment, detecting unit 440 is monitored the size of the inverse current (inverse detection electric current) that is caused by detection voltage VTEST, and the output valve of the size of this inverse current of output reflection is given input end IO_3 and the selected cell 450 of overhead control unit 430.If this output valve shows this inverse current and is not more than threshold value (for example 0A), overhead control unit 430 makes power switch Q2 and not conducting of Q4 by output terminal IO_2 output signal so, make power switch Q1 and Q3 conducting by output terminal IO_4 output signal then, make the voltage supply terminal 410 of winning provide normal drive voltage VCC to the anode that OLED shields body 400, and the second voltage supply terminal 420 provides ground voltage GND to the negative electrode of OLED screen body 400, thus OLED screen body 400 operate as normal.If this output valve shows that this inverse current is greater than described threshold value, selected cell 450 selects to repair voltage VCOMH, make the second voltage supply terminal 420 provide reparation voltage VCOMH to the negative electrode of OLED screen body 400, and the first voltage supply terminal 410 provides ground voltage GND to the anode of OLED screen body 400, wherein repair voltage VCOMH and comprise the voltage part of voltage GND above Ground, this part applies reverse reparation voltage to OLED screen body 400, thereby OLED screen body 400 is repaired; Selected cell 450 is selected to detect voltage VTEST again then, till inverse current is not more than described threshold value.
For operating circuit 40, detecting voltage VTEST can be the voltage that is higher than GND that continues for some time, and its size is not enough to the puncture short point usually; Repairing voltage VCOMH can be the pulse that one or more voltages are higher than GND, also can be alternately (the playing the pulse that voltage is higher than GND that is still of puncture short point effect) that one or more voltages are higher than the pulse of GND and the pulse that one or more voltage is lower than GND, decide on actual needs.
Should be understood that and to omit detecting unit 440 and selected cell 450, and apply the time of repairing voltage by 430 controls of overhead control unit.
Operating circuit 30 and operating circuit 40, and overhead control unit 430, detecting unit 440 and selected cell 450 can use discrete component form, integrated circuit form, discrete component and integrated circuit combining form or any other suitable form to realize.
Although Fig. 3 and Fig. 4 show the reparation circuit and the driven circuit is global design, should be understood that reparation circuit and driven circuit also can be discrete each other.Shield body via same delivery pathways to OLED although detection voltage has been shown among Fig. 4 and has repaired voltage, should be understood that also and can shield body to OLED via discrete each other delivery pathways.
The process flow diagram of the operation of Fig. 5 is illustration operating circuit 40 shown in Figure 4.
Fig. 6 is the synoptic diagram according to an embodiment for the voltage of repairing OLED screen body of the present invention.In Fig. 6, horizontal ordinate is represented the time, and unit is ms; Ordinate is represented voltage, and unit is V; Repairing voltage is illustrated as on the occasion of-square-wave pulse sequence that null value-negative value-null value replaces, ordinate on the occasion of pulse (direct impulse) expression OLED screen body is applied forward voltage, ordinate is that pulse (reverse impulse) expression of negative value applies reverse voltage to OLED screen body.In pulse train shown in Figure 6, what play the effect of puncture short point is reverse impulse, and the pulse that applies positive and negative alternate can be in repair-deficiency be carried out seasoned to OLED screen body.In Fig. 6, the width of each direct impulse is 0.1ms, and the width of each reverse impulse is 5ms, and between each direct impulse and the next reverse impulse is 0.1ms (not mark) at interval, and between each reverse impulse and the next direct impulse is 8ms at interval.For example, want to realize pulse train shown in Figure 6 by operating circuit shown in Figure 3 30 or operating circuit 40 shown in Figure 4, suppose that GND remains 0V, so as VCOMH can alternately import-width of 21V is that the pulse of 0.1ms and the width of 10V are the pulse of 5ms.
Should be understood that the reparation voltage that can use other types according to actual conditions: for example, the height of pulse, width and interval can be decided on actual needs; For example, can adopt and have only negative loop and not on the occasion of the pulse train of part.
Should be understood that herein embodiment and embodiment only for illustrative purposes, those skilled in the art can make many variants on the basis of this paper instruction, and scope of the present invention is defined by the claims.

Claims (10)

1. operating circuit that is used for the OLED device comprises:
Repair circuit, comprising:
The first voltage supply terminal is used for being connected to the anode that OLED shields body; And
The second voltage supply terminal is used for being connected to the negative electrode that described OLED shields body,
Be used for by the described first voltage supply terminal and the described second voltage supply terminal described OLED screen body being applied reverse reparation voltage.
2. the operating circuit for the OLED device according to claim 1 also comprises:
Testing circuit comprises:
The 3rd voltage supply terminal is used for being connected to the anode that described OLED shields body; And
The 4th voltage supply terminal is used for being connected to the negative electrode that described OLED shields body,
Be used for by described the 3rd voltage supply terminal and described the 4th voltage supply terminal described OLED screen body being applied inverse detection voltage, and monitor the size of the inverse detection electric current that is caused by described inverse detection voltage.
3. the operating circuit for the OLED device according to claim 2 also comprises control module, is used for whether judging described inverse detection electric current greater than threshold value, and carries out:
If described inverse detection electric current greater than described threshold value, is then enabled described reparation circuit; And
If described inverse detection electric current is not more than described threshold value, then forbid described reparation circuit.
4. OLED device comprises:
OLED shields body, comprising:
Anode;
Negative electrode; With
Organic layer, it is between described anode and described negative electrode; And
According to the described operating circuit for the OLED device of arbitrary claim in the claim 1 to 3.
5. OLED device according to claim 4, it is passive-matrix OLED device.
6. a display device or light fixture comprise according to claim 4 or 5 described OLED devices.
7. one kind is used for repairing the method that OLED shields body, comprising:
Described OLED screen body is applied reverse reparation voltage.
8. one kind is used for repairing the method that OLED shields body, comprising:
OLED screen body is applied inverse detection voltage;
The size of the inverse detection electric current that monitoring is caused by described inverse detection voltage; And
If described inverse detection electric current greater than threshold value, then applies reverse reparation voltage to described OLED screen body.
9. according to claim 8 for the method for repairing OLED screen body, also comprise:
After described OLED screen body is applied reverse reparation voltage, again described OLED screen body is applied inverse detection voltage, so repeat, till described inverse detection electric current is not more than described threshold value.
10. according to Claim 8 or 9 described for the methods of repairing OLED screen body, it is to use and according to claim 3ly carries out for the operating circuit of OLED device.
CN201110456044.1A 2011-12-30 2011-12-30 Operating circuit and related device, equipment and method for OLED Active CN103187025B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201110456044.1A CN103187025B (en) 2011-12-30 2011-12-30 Operating circuit and related device, equipment and method for OLED

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201110456044.1A CN103187025B (en) 2011-12-30 2011-12-30 Operating circuit and related device, equipment and method for OLED

Publications (2)

Publication Number Publication Date
CN103187025A true CN103187025A (en) 2013-07-03
CN103187025B CN103187025B (en) 2016-08-03

Family

ID=48678169

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201110456044.1A Active CN103187025B (en) 2011-12-30 2011-12-30 Operating circuit and related device, equipment and method for OLED

Country Status (1)

Country Link
CN (1) CN103187025B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109545135A (en) * 2018-12-06 2019-03-29 固安翌光科技有限公司 A kind of driving method and device of OLED lighting screen body

Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001022504A1 (en) * 1999-09-22 2001-03-29 Koninklijke Philips Electronics N.V. Organic electroluminescent device
CN1350417A (en) * 2000-10-10 2002-05-22 株式会社半导体能源研究所 Method for manufacturing and/or repairing lighting equipment
CN1462371A (en) * 2001-05-15 2003-12-17 皇家菲利浦电子有限公司 Display device comprising plurality of LEDS
CN1622172A (en) * 2003-11-25 2005-06-01 日本东北先锋公司 Organic EL display apparatus and method of driving the same
CN1636145A (en) * 2001-12-19 2005-07-06 皇家飞利浦电子股份有限公司 Method of healing of low-ohmic defects in a flat display
CN1648978A (en) * 2004-01-26 2005-08-03 株式会社半导体能源研究所 Display device and driving method of the same
CN1677469A (en) * 2004-03-29 2005-10-05 东北先锋电子股份有限公司 Drive unit for light-emitting display panel, and electronic device mounted therewith
CN1711479A (en) * 2002-11-06 2005-12-21 皇家飞利浦电子股份有限公司 Inspecting method and apparatus for a LED matrix display
CN101236738A (en) * 2008-03-03 2008-08-06 上海广电光电子有限公司 LCD device repairing line operation amplification circuit and its drive method
CN101465322A (en) * 2007-12-21 2009-06-24 索尼株式会社 Method of manufacturing organic light-emitting device
CN101710601A (en) * 2009-10-30 2010-05-19 浙江正泰太阳能科技有限公司 Method and equipment for repairing thin film solar cell

Patent Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001022504A1 (en) * 1999-09-22 2001-03-29 Koninklijke Philips Electronics N.V. Organic electroluminescent device
CN1350417A (en) * 2000-10-10 2002-05-22 株式会社半导体能源研究所 Method for manufacturing and/or repairing lighting equipment
CN1462371A (en) * 2001-05-15 2003-12-17 皇家菲利浦电子有限公司 Display device comprising plurality of LEDS
CN1636145A (en) * 2001-12-19 2005-07-06 皇家飞利浦电子股份有限公司 Method of healing of low-ohmic defects in a flat display
CN1711479A (en) * 2002-11-06 2005-12-21 皇家飞利浦电子股份有限公司 Inspecting method and apparatus for a LED matrix display
CN1622172A (en) * 2003-11-25 2005-06-01 日本东北先锋公司 Organic EL display apparatus and method of driving the same
CN1648978A (en) * 2004-01-26 2005-08-03 株式会社半导体能源研究所 Display device and driving method of the same
CN1677469A (en) * 2004-03-29 2005-10-05 东北先锋电子股份有限公司 Drive unit for light-emitting display panel, and electronic device mounted therewith
CN101465322A (en) * 2007-12-21 2009-06-24 索尼株式会社 Method of manufacturing organic light-emitting device
CN101236738A (en) * 2008-03-03 2008-08-06 上海广电光电子有限公司 LCD device repairing line operation amplification circuit and its drive method
CN101710601A (en) * 2009-10-30 2010-05-19 浙江正泰太阳能科技有限公司 Method and equipment for repairing thin film solar cell

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109545135A (en) * 2018-12-06 2019-03-29 固安翌光科技有限公司 A kind of driving method and device of OLED lighting screen body
CN109545135B (en) * 2018-12-06 2021-07-20 固安翌光科技有限公司 Driving method and device of OLED (organic light emitting diode) illuminating screen body

Also Published As

Publication number Publication date
CN103187025B (en) 2016-08-03

Similar Documents

Publication Publication Date Title
CN106531079B (en) Pixel circuit, driving method thereof and display device
US9640097B2 (en) OLED pixel driving circuit, electrostatic discharge protection circuit and detection method
US10679911B2 (en) Redundant pixel architecture in ILED displays
US9881544B2 (en) Pixel circuit for AC driving, driving method and display apparatus
CN102257547B (en) Active matrix substrate, display panel, and inspection method therefor
CN103000132B (en) Pixel driving circuit and display panel
US10580360B2 (en) Pixel circuit and driving method thereof, display device
US9595226B2 (en) Pixel circuit for AC driving, driving method and display apparatus
US9460655B2 (en) Pixel circuit for AC driving, driving method and display apparatus
CN104167181A (en) Display and sub-pixel driving method thereof
CN105679219B (en) AMOLED display panel testing method and detection device
CN106941135B (en) A kind of method for repairing and mending and organic light emitting display panel of organic light emitting display panel
US20200027944A1 (en) Array Substrate And Method For Repairing Array Substrate
CN103943064A (en) Shut-down control method and circuit, driving circuit and AMOLED display device
CN105321459A (en) Organic light emitting display device and method of driving the same
TWI462081B (en) Pixel circuit
CN108122519A (en) AMOLED pixel method for repairing and mending
JP2006222015A (en) Light-emitting display panel and inspection method of the same
KR20100079095A (en) Organic electroluminescent device and method of repairing with using the same
CN105513540A (en) Pixel compensation circuit used for active organic light-emitting diode display
CN103187025A (en) Working circuit used for organic electroluminescence display (OLED) device, relative device, relative equipment and relative method
CN208488960U (en) Pixel circuit, display panel, display device
CN108230974A (en) A kind of luminescent device defect detection circuit and method, display drive apparatus, display device and its detection method
KR101243159B1 (en) Aging circuit for oled panel
WO2022156195A1 (en) Test board

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
ASS Succession or assignment of patent right

Owner name: TSINGHUA UNIVERSITY

Free format text: FORMER OWNER: TSINGHUA UNIVERSITY WEIXINNUO SCIENCE AND TECHNOLOGY CO., LTD., BEIJING

Effective date: 20140410

Owner name: KUNSHAN VISIONOX TECHNOLOGY CO., LTD.

Free format text: FORMER OWNER: WEIXINNUO DISPLAY TECH CO., LTD.

Effective date: 20140410

C41 Transfer of patent application or patent right or utility model
TA01 Transfer of patent application right

Effective date of registration: 20140410

Address after: 215300 Kunshan high tech Zone, Jiangsu Province, Feng Feng Road, No. 188, No.

Applicant after: KUNSHAN VISIONOX TECHNOLOGY CO., LTD.

Applicant after: Tsinghua University

Address before: 215300 Kunshan high tech Zone, Jiangsu Province, Feng Feng Road, No. 188, No.

Applicant before: Weixinnuo Display Tech Co., Ltd.

Applicant before: Tsinghua University

Applicant before: Weixinnuo Science and Technology Co., Ltd., Beijing

C14 Grant of patent or utility model
GR01 Patent grant
CP01 Change in the name or title of a patent holder
CP01 Change in the name or title of a patent holder

Address after: 215300 No. 188 Feng Feng Road, Kunshan hi tech Zone, Jiangsu, Kunshan

Patentee after: Suzhou Qingyue Photoelectric Technology Co., Ltd

Patentee after: TSINGHUA University

Address before: 215300 No. 188 Feng Feng Road, Kunshan hi tech Zone, Jiangsu, Kunshan

Patentee before: Kunshan Visionox Technology Co.,Ltd.

Patentee before: TSINGHUA University