CN103167076A - Test method and test device for testing function of electronic device - Google Patents
Test method and test device for testing function of electronic device Download PDFInfo
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- CN103167076A CN103167076A CN2011104090855A CN201110409085A CN103167076A CN 103167076 A CN103167076 A CN 103167076A CN 2011104090855 A CN2011104090855 A CN 2011104090855A CN 201110409085 A CN201110409085 A CN 201110409085A CN 103167076 A CN103167076 A CN 103167076A
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Abstract
The invention relates to a test method used for testing a function of an electronic device. The test method comprises the steps: (a) searching a position corresponding to the to-be-tested function, (b) transmitting a instruction to perform the function according to the position, and (c) judging whether the function is wrong or not according to the response of the function to the instruction.
Description
Technical field
The present invention is relevant for method of testing and test macro, is particularly to method of testing and test macro applicable to different user's interfaces and different hardware state.
Background technology
Along with the progress of technology, electronic installation has increasing function, and therefore accurate these numerous functions of test become considerable work of manufacturer to guarantee its correctness.Generally speaking, be all to utilize test program (being commonly referred to test script, test script) to test.For instance, if the function that the wish test is made a phone call, can send an instruction to the electronic installation of wish test, order it to transfer to a phone (also might really not transfer to, just simulate dialing action), electronic installation can send a response according to tested function practice condition, and then testing apparatus can respond to judge this function correct execution of having no idea according to it.
Yet method of testing now all only can be used on fixing user's interface usually.Please refer to Fig. 1, it has illustrated the schematic diagram of the user's interface on a mobile phone.As shown in Figure 1, the screen 101 of mobile phone 100 has shown user's interface, and on this user's interface, icon (icon) 103,105,107 and 109 has represented respectively the function of message, calendar, photo and instrument.
User's interface shown in Figure 1 and the function that comprises thereof can extensible making type language (Extensible Markup Language, XML) or similar making type language descriptions.As shown in Figure 2, it has illustrated one and has treated the function how measuring program uses extensible making type language description one user's interface and this user's interface to comprise.Each form all has an exclusive Window ID, has those functions to be defined within this form in order to judgement, and can describe now that form is that class form.For instance, if the form of telephone directory may have " according to the phonebook function of group classification ", " according to phonebook function of SIM card classification etc.The feature list in this form described in program language in program area block 200, that is have which function in this form, and program area block 201 has been described the action of each function in this form.Other detailed contents in Fig. 2 are known by knowing this skill person, therefore do not repeat them here.
In test process, each function has corresponding test program.Yet, in known method of testing, the test program of writing for interface shown in Figure 1, the tram owing to can't dynamically learning the icon that each function on this interface is corresponding only can be applied to interface shown in Figure 1 statically.For instance, icon 103 has represented the function of message, and icon 109 has represented the function of instrument, if the position of icon 103 and icon 109 is exchanged, tests making an amendment that the test program of message and testing tool must be corresponding, otherwise mistake can occur during test.
On the other hand, known method of testing is not considered dynamic hardware state usually.Fig. 3 has illustrated in the known technology one and has treated how measuring program uses the schematic diagram of the hardware state of the tested electronic installation of extensible making type language description.Program area block 300 has represented the hardware state of tested electronic installation, and capable of dynamic upgrades in test process.For instance, if Touch_screen " Yes " represents that tested electronic installation has touch controllable function, and if Key_Pad " Yes " represents that tested electronic installation has keypad function.In addition, the accessory or the periphery that are connected to mobile phone are equipped with as mobile phone user's identification (Subscriber Identity Module, SIM) card, and storage card, earphone etc. also can define its state by program area block 300.
Yet known method of testing is not considered hardware state usually, thereby often produces unnecessary mistake.Take the mobile phone of Fig. 1 as example, it can insert some extra hardware such as user identification cards of mobile phones or storage cards etc. usually, so the tester may need mobile phone is also done some tests for the access of hardware or other functions.Yet, if in the situation that in these hardware are not present in, still send test instruction, may produce error messages because can not get responding always, even cause the stagnation of testing apparatus or work as machine.In addition, storage device such as storage card etc., the distribution situation of its interior archives or the distribution of information kit change are quite large, and therefore known method of testing may need successively to distribute to change test program for these different archives or information kit.
In sum, known method of testing and testing apparatus can need constantly change test program under the situation of user's interface or the normal change of hardware state, therefore can waste considerable time or cost.
Summary of the invention
Therefore, a purpose of the present invention is for providing a kind of method of testing and a kind of testing apparatus, can be used in the test of different user's interfaces and different hardware state.
One embodiment of the invention have disclosed a kind of method of testing, in order to test the function that in an electronic installation, a program comprises, this program makes this function corresponding to an icon of user's interface, and this method of testing comprises: (a) seek wish and test this function in a position of this program; (b) transmit an instruction according to this position and carry out this function; And (c) judge for the response of this instruction whether this function is wrong according to this function.Wherein, this instruction comprises and moves to a sub-instructions of this icon corresponding to a user in this user's interface.
Another embodiment of the present invention has disclosed a kind of method of testing, and in order to test the function that in an electronic installation, a program comprises, this method of testing comprises: (a) this electronic installation is obtained an index information of all functions in user's interface certainly; (b) obtain according to this index information the position that wish is tested this function, and transmit an instruction to carry out this function; And (c) judge for the response of this instruction whether this function is wrong according to this function.
Another embodiment of the present invention has disclosed a kind of testing apparatus, in order to test the function that in an electronic installation, a program comprises, this program makes this function corresponding to an icon of user's interface, and this testing apparatus comprises: a storage device stores a test program; One control unit is carried out above-listed method of testing in order to carry out this test program.
According to aforesaid embodiment, can constantly change test program and coordinate different user's interface and hardware state, and can carry out the test of automation and need not manually constantly control.
Description of drawings
Fig. 1 has illustrated the schematic diagram of the user's interface on a mobile phone.
Fig. 2 has illustrated in the known technology one and has treated how measuring program uses the schematic diagram of the function that extensible making type language description one user's interface and this user's interface comprise.
Fig. 3 has illustrated in the known technology one and has treated how measuring program uses the schematic diagram of the hardware state of the tested electronic installation of extensible making type language description.
Fig. 4 has illustrated the calcspar according to the testing apparatus of one embodiment of the invention.
Fig. 5 has illustrated the test program function mode according to one embodiment of the invention.
Fig. 6 (a) and Fig. 6 (b) have illustrated and have not existed maybe can't use the time when hardware, do not show or change the schematic diagram of its display mode.
Fig. 7 has illustrated the schematic diagram of dynamic instruction according to an embodiment of the invention.
Fig. 8 has disclosed the sub-program code of the index information that how to obtain electronic installation.
Fig. 9 has disclosed the flow chart of method of testing according to an embodiment of the invention.
The main element symbol description
100 mobile phones
101 screens
103,105,107,109,203 icons
200,201,300,301,500,501,700 program area blocks
401 testing apparatuss
402 control units
403 test programs
406 storage devices
405 electronic installations
407 test response procedure
Embodiment
Used some vocabulary to censure specific element in the middle of specification and follow-up claim.The person with usual knowledge in their respective areas should understand, and hardware manufacturer may be called same element with different nouns.This specification and follow-up claim are not used as distinguishing the mode of element with the difference of title, but the criterion that the difference on function is used as distinguishing with element.In specification and follow-up claims, be an open term mentioned " comprising " in the whole text, therefore should be construed to " comprise but be not limited to ".In addition, " couple " word and comprise any means that indirectly are electrically connected that directly reach at this.Therefore, be coupled to one second device if describe a first device in literary composition, represent that this first device can directly be electrically connected in this second device, or indirectly be electrically connected to this second device through other devices or connection means.
Fig. 4 has illustrated the calcspar according to the testing apparatus of one embodiment of the invention.As shown in Figure 4, testing apparatus 401 has a test program 403, can send an instruction and test the function of wish test to electronic installation 405.Test program 403 can be stored in a storage device 406.Electronic installation 405 has a test response procedure 407, can send one response to testing apparatus 401 to the reaction of instruction according to tested function, and then test program 403 can judge whether tested function is normal according to this response.Test program 403 has respectively program area block 500,501 and 700, and the content of these program area blocks will be in beneath explanation respectively.What must be careful is, though beneathly do example explanation with extensible making type language archives, other functional archives also can apply to the disclosed content of the present invention.Testing apparatus 401 has a control unit 402 and carries out test program 403.Control unit 402 can be by firmware arrange in pairs or groups hardware such as processor etc., or independent hardware is realized.Testing apparatus 401 and electronic installation 405 are linked up by transmission interface 409, and transmission interface 409 can be wireless or wired interface.
Fig. 5 has illustrated the test program function mode according to one embodiment of the invention.Program area block 500 in Fig. 5 has defined its hardware that needs, if this hardware state does not meet the defined state of program area block 300, stops testing the function of wish test.For instance, if read the function of telephone directory in wish test SIM1 card, can need the existence of SIM1 card, if therefore in program area block 300, the state of SIM1 card is not " Yes ", namely the SIM1 card is not present among tested electronic installation, can stop testing the function that reads telephone directory in the SIM1 card.If have any meeting to cause can't to test the situation of the function of wish test, for example the SIM1 card is present in electronic installation, but the junction that contacts with the SIM1 card damages to some extent, equally can stop SIM1 card correlation function.That is to say, the present invention utilizes the hardware state of the original tested electronic installation of a program to be measured, and dynamically whether decision stops the relevant functional test of this hardware in test process.In addition, in an embodiment, not in electronic installation, do not show this icon corresponding with hardware when the corresponding hardware of the function that wish test detected.As the Fig. 6 in Fig. 6 (a), compare with Fig. 2, just do not show the icon 203 that represents the SIM1 card.In addition, test the corresponding hardware of this function not in this electronic installation if wish detected, also the available form different with other those icons shows this icon corresponding with hardware.As the Fig. 6 in Fig. 6 (b), just it shows the SIM1 card with dotted line.
The program area block 501 of Fig. 5 has been described in an embodiment of the present invention, and how the test instruction in test program operates, and its main content is: treat that in this form is corresponding in measuring program, the searching wish is tested a position of this function; Then transmit an instruction according to this position and carry out the wish test function.For instance, shown in Figure 2 in measuring program during the phonebook function of SIM1 card when testing, test program can go to seek this phonebook function corresponding position in treating measuring program, then send an instruction with in defined user's interface in Fig. 2 according to this position, elder generation is past moves to right twice, then reads the telephone directory of SIM1 card.It should be noted to have the character that can describe simultaneously the function that user's interface and this user's interface comprise due to extensible making type language archives, it can close the specific icon that is connected on user's interface with some function.Accordingly, when test program during in the position found out until brake, can learn simultaneously that this treats brake corresponding icon position on user's interface in measuring program.When test program is obtained the icon position, can add when essence is same as a user and operates this user's interface the sub-instructions from position movement now to this icon position in test instruction.That is to say, this test instruction is tested this except reality and is treated brake, still comprises the behavior that utilizes sub-instructions simulation user to move to this icon position and click this icon.
Disclosed test program except can for test be positioned at can the general instruction of static user's interface of describing, separately can be positioned at the function of user's interface that can change for test, for example: be arranged in a dynamic instruction of storage device function.As previously mentioned, the arrangement of its data change can be quite large in some storage devices, and when therefore testing same function, stratum and the form of this function institute all can be different each time, therefore referred to here as dynamic instruction.Fig. 7 has illustrated the schematic diagram of dynamic instruction according to an embodiment of the invention.Refer again to Fig. 4, in one embodiment of this invention, because can not utilizing extensible making type language, writes the storage device in electronic installation, therefore can utilize the procedure code that is included in test response procedure 407 by electronic installation 405, the index information that will be positioned at a storage device (for example storage card) all functions of electronic installation 405 sends testing apparatus 401 to.By this, testing apparatus 401 just can be learnt the position of wanting test function.Take Fig. 7 as example, if the function of the imaging application of storage card in wish test read electric device, first allow electronic installation 405 that the index information of storage card is informed testing apparatus 401, so can learn just that it is positioned at the 3rd layer of certain picture, therefore in the time will testing this function, just transmit an instruction and carry out this function toward moving down three times in a certain picture.700 of program area blocks have represented how dynamic instruction operates.It should be noted, dynamic instruction is not limited to be arranged in the instruction of the outer storage device of electronic installation, can't describe so that the function archives such as extensible making type language archives are static and make a general reference all, and can along with the state of electronic installation at that time, dynamically change the position person of the corresponding icon of this function.For example, the functional menu in cell phone address book can be along with there being non-avaible in address list, and change to some extent.Therefore, the instruction in this functional menu is dynamic instruction.This is a suitable example of the dynamic instruction that is positioned at electronic installation inside.
Fig. 8 has disclosed sub-program code how to obtain the index information of electronic installation in the test program.It is noted that, only disclosed a part of program in Fig. 8, and these test program procedure codes are not to limit the present invention only in order to for example, be familiar with the art person and reach identical effect when revising arbitrarily the sub-program code, it also should be within the scope of the present invention.In Fig. 8, the procedure code of A part represents " obtain the number of the project in this user's interface ", and the program representation of B part " analyze the relevent information of those projects ", these information can be returned to testing apparatus 401 after having analyzed, so testing apparatus 401 just can be learnt the position of wanting test function.
Fig. 9 has disclosed the flow chart of method of testing according to an embodiment of the invention, and it has comprised the following step:
Beginning.
Obtain defined good one and treat measuring program.This step also can comprise and obtains a picture (Window ID), and as previously mentioned, specific window can correspond to specific function, therefore obtains the correctness that Window ID helps move instruction.For instance, if wanting test function, judgement do not meet electronic installation this function that has of form now, not move instruction.
Begin to carry out according to method of testing of the present invention, it can be and automatically performs, but does not limit.
Do you judge that one's own profession treats that measuring program is a dynamic instruction? if arrive step 923, arrive if not step 909.
Seek the position of wanting test function.
Transmit relevant instruction according to this position of wanting test function.
The test response procedure sends back should.
The response that the test program comparison is received and the response of expection.
Whether comparative result correct? represent that if not tested function has problem, finish testing process to step 929, also can allow testing apparatus show an error messages.If represent that tested function is normal, to step 919.
Carry out next instruction? if get back to step 907, arrive if not step 921.
Step 921
Finish.
Step 923
Allow electronic installation transmit the index information to testing apparatus.
Step 925
Obtain the position of wanting test function according to the index information.
Obtain correct position? if, get back to step 911, if not, arrive step 929 and finish method of testing.
According to aforesaid embodiment, can constantly change test program and coordinate different user's interface and hardware state, and can carry out the test of automation and need not manually constantly monitor.
The above is only preferred embodiment of the present invention, and all equalizations of doing according to the present patent application the scope of the claims change and modify, and all should belong to covering scope of the present invention.
Claims (21)
1. method of testing, in order to test the function that in an electronic installation, a program comprises, this program is relevant to this function one icon of one user's interface, and this method of testing comprises:
(a) seek institute's wish and test this function in a position of this program;
(b) transmit an instruction according to this position and carry out this function; And
(c) judge for the response of this instruction whether this function is wrong according to this function;
Wherein, this instruction comprises and moves to a sub-instructions of this icon corresponding to a user in this user's interface.
2. method of testing as claimed in claim 1, is characterized in that, this step (a) is gone back the corresponding hardware state of this function of inclusion test, and when one erroneous condition occurs this hardware state, stop testing this function.
3. method of testing as claimed in claim 2, is characterized in that, shows this icon when this program is performed on this electronic installation, and this method of testing more comprises:
When this erroneous condition occurs this hardware state, do not show this corresponding icon.
4. method of testing as claimed in claim 2, is characterized in that, comprises:
When this erroneous condition be the corresponding hardware of this function not in this electronic installation, do not show an icon corresponding with this hardware.
5. method of testing as claimed in claim 2, is characterized in that, comprises:
When this erroneous condition is that the corresponding hardware of this function is not in this electronic installation, with different form demonstration icons corresponding with this hardware.
6. method of testing as claimed in claim 1, is characterized in that, this program is extensible making type language archives.
7. method of testing as claimed in claim 1, is characterized in that, this step (a) comprises:
(a1) whether judge this function corresponding to a dynamic instruction, to produce a judged result;
(a2) if this judgment result is that is, this electronic installation is obtained the index information of all functions in this user's interface certainly, and obtains this position of this function according to this index information;
(a3) if should the determination result is NO, treat that according to this measuring program obtains this position of this function.
8. method of testing as claimed in claim 7, is characterized in that, this index information is provided by a storage device that is relevant to this electronic installation.
9. method of testing as claimed in claim 7, is characterized in that, should (a2) step comprise:
(d1) obtain the number of a plurality of projects in this user's interface;
(d2) analyze many relevent informations of those projects;
(d3) according to this number and those relevent informations, obtain this position of this function.
10. method of testing as claimed in claim 1, is characterized in that, should (b) step also comprise:
Judge the function that this user's interface is corresponding, if this function does not belong to this user's interface, stop transmitting this instruction.
11. a method of testing, in order to test the function that in an electronic installation, a program comprises, this method of testing comprises:
(a) this electronic installation is obtained an index information of all functions in user's interface certainly;
(b) obtain according to this index information the position that wish is tested this function, and transmit an instruction to carry out this function; And
(c) judge for the response of this instruction whether this function is wrong according to this function.
12. method of testing as claimed in claim 11 is characterized in that, this index information is provided by a storage device that is relevant to this electronic installation.
13. method of testing as claimed in claim 11 is characterized in that, should (a) step comprise:
(a1) obtain the number of a plurality of projects in this user's interface; And
(a2) analyze many relevent informations of those projects;
Wherein should (b) step according to this number of should (a1) step obtaining and those relevent informations that should (a2) step, obtain this position of this function.
14. a testing apparatus, in order to test the function that in an electronic installation, a program comprises, this program makes this function corresponding to an icon of user's interface, and this testing apparatus comprises:
One storage device stores a test program;
One control unit, carry out the following step in order to carry out this test program:
(a) seek wish and test this function in a position of this program;
(b) transmit an instruction according to this position and carry out this function; And
(c) judge for the response of this instruction whether this function is wrong according to this function;
Wherein, this instruction comprises and moves to a sub-instructions of this icon corresponding to a user in this user's interface.
15. testing apparatus as claimed in claim 14 is characterized in that, this control unit more detects the corresponding hardware state of this function, and when one erroneous condition occurs this hardware state, stops testing this function.
16. testing apparatus as claimed in claim 15 is characterized in that, shows this icon when this program is performed on this electronic installation, this control unit is also carried out:
When this erroneous condition occurs this hardware state, do not show this corresponding icon.
17. testing apparatus as claimed in claim 15 is characterized in that, this control unit is carried out:
When this erroneous condition is that the corresponding hardware of this function is not in this electronic installation, with different form demonstration this icons corresponding with this hardware.
18. testing apparatus as claimed in claim 14 is characterized in that, this program is extensible making type language archives.
19. testing apparatus as claimed in claim 14 is characterized in that, this control unit is sought this function when this position of this program, carries out the following step:
(a1) whether judge this function corresponding to a dynamic instruction, to produce a judged result;
(a2) if this judgment result is that is, this electronic installation is obtained the index information of all functions in this user's interface certainly, and obtains this position of this function according to this index information;
(a3) the determination result is NO if be somebody's turn to do, and obtains this position of this function according to this program.
20. testing apparatus as claimed in claim 19 is characterized in that, should (a2) step comprise:
(d1) obtain the number of a plurality of projects in this user's interface; And
(d2) analyze many relevent informations of those projects;
(d3) according to this number and those relevent informations, obtain this position of this function.
21. testing apparatus as claimed in claim 14 is characterized in that, should (b) step also comprise:
Judge the function that this user's interface is corresponding, if this function does not belong to this picture, stop transmitting this instruction.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201110409085.5A CN103167076B (en) | 2011-12-09 | 2011-12-09 | The method of testing of the function of test electronic installation and test device |
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| CN201110409085.5A CN103167076B (en) | 2011-12-09 | 2011-12-09 | The method of testing of the function of test electronic installation and test device |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN103746760A (en) * | 2014-01-21 | 2014-04-23 | 加弘科技咨询(上海)有限公司 | Universal test method and production method of data communication product |
| CN105138456A (en) * | 2015-08-28 | 2015-12-09 | 上海斐讯数据通信技术有限公司 | Testing method and system |
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| CN101506765A (en) * | 2006-11-10 | 2009-08-12 | 松下电器产业株式会社 | Target estimation device and target estimation method |
| US20100026642A1 (en) * | 2008-07-31 | 2010-02-04 | Samsung Electronics Co., Ltd. | User interface apparatus and method using pattern recognition in handy terminal |
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Patent Citations (3)
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| CN1731353A (en) * | 2004-08-04 | 2006-02-08 | 英业达股份有限公司 | Method for real-time presentation of solution for error condition of computer device |
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| US20100026642A1 (en) * | 2008-07-31 | 2010-02-04 | Samsung Electronics Co., Ltd. | User interface apparatus and method using pattern recognition in handy terminal |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN103746760A (en) * | 2014-01-21 | 2014-04-23 | 加弘科技咨询(上海)有限公司 | Universal test method and production method of data communication product |
| CN105138456A (en) * | 2015-08-28 | 2015-12-09 | 上海斐讯数据通信技术有限公司 | Testing method and system |
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| CN103167076B (en) | 2016-09-14 |
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