CN103115640A - Datum positioner - Google Patents
Datum positioner Download PDFInfo
- Publication number
- CN103115640A CN103115640A CN2013100286803A CN201310028680A CN103115640A CN 103115640 A CN103115640 A CN 103115640A CN 2013100286803 A CN2013100286803 A CN 2013100286803A CN 201310028680 A CN201310028680 A CN 201310028680A CN 103115640 A CN103115640 A CN 103115640A
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- sucker
- dish
- connecting disc
- positioning
- datum
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Abstract
A datum positioner comprises a positioning connecting disc A, a positioning connecting disc B, a sucker A and a sucker B. A sucker handle A and a sucker handle B are arranged on the sucker A and the sucker B respectively, the positioning connecting disc A and the positioning connecting disc B are connected through an arc-shaped connecting bridge, and an arc-shaped space area formed by the arc-shaped connecting bridge is a probe holding area. A through hole A is arranged at the center of the positioning connecting disc A, and the sucker A is arranged below the positioning connecting disc A. A through hole B is arranged at the center of the positioning connecting disc B, and the sucker B is arranged below the positioning connecting disc B. A datum edge A is arranged on the positioning connecting disc A, and a datum edge B is arranged on the positioning connecting disc B. The datum positioner is capable of positioning a datum point and a whole test direction, providing a positioning datum and a connecting device for a peripheral testing device, achieving quick positioning and improving testing work efficiency, and is low in cost, simple in structure and convenient to carry.
Description
Technical field
The present invention relates to a kind of steady arm, especially relate to a kind of with the reference edge static fixing, can affixed peripheral test system or the reference positioner of device; It can determine this reference plane build-in test summit and test orientation according to test zone two reference edges, and can be connected and fixed space testing jig or outer testing system, and the steady arm of benchmark is provided for the peripheral test system.
Background technology
At present, the proving installation in the laboratory is substantially take tripod as brace foundation, and the proving installation of complexity or system also has the polarization of controlling or highly waits the change of part.But putting on problem of the reference point initial position of test zone, major part is all to adjust the position of testing jig or whole test platform by the mode of moved by hand, make the initialized benchmark of whole test macro be difficult to ensure, and then just there is a very important test uncertainty factor in a series of test data.
Summary of the invention
The technical problem to be solved in the present invention is to provide a kind of reference positioner; This reference positioner has solved following some problem: 1) decide reference edge, 2) decide reference point, 3) location survey examination direction, 4) fix 5 with the reference field relative position) can coordinate docking with the peripheral test device; The problem of testing jig reference position precision be can solve, can this reference plane build-in test summit and test orientation be being determined according to the datum line of definite area; Can be connected and fixed space testing jig or outer testing system, system provides reference for installation for peripheral test; Improve the bearing accuracy of integrated testability device, thereby improved whole measuring accuracy.
For solving the problems of the technologies described above, the present invention adopts following technical scheme:
A kind of reference positioner comprises the dish A that is located by connecting, is located by connecting and coils B, sucker A and sucker B;
Respectively establish a Handle of sucking disc A on sucker A; Be used for fixing and unclamp sucker A;
Respectively establish a Handle of sucking disc B on sucker B; Be used for fixing and unclamp sucker B;
The described dish A and being located by connecting of being located by connecting connects by the arc connecting bridge between dish B, and this arc connecting bridge forms arc space zone is the probe placement district; Be used to probe that zone and the particular location of placement are provided;
The described center that is located by connecting dish A is provided with a through hole A, and sucker A is established in the below of the dish A that is located by connecting, and the center of this sucker A establishes that joint pin passes through hole A and sucking disc handle A is connected and fixed;
The described center that is located by connecting dish B is provided with a through hole B, and sucker B is established in the below of the dish B that is located by connecting, and the center of this sucker B establishes that joint pin passes through hole B and sucking disc handle B is connected and fixed;
The described dish A that is located by connecting is provided with reference edge A; The described dish B that is located by connecting is provided with reference edge B; Angle between described reference edge A and reference edge B is 90 degree.
The dish A that is located by connecting can locate by two reference edges with the dish B that is located by connecting, and can coordinate docking with external test arrangements.
Sucker A and sucker B play the role of positioning respectively, by sucker A and sucker B, steady arm and ground are fixed together, and no longer include with benchmark the relation of relatively moving.
The present invention has following beneficial effect:
1. the invention solves test zone reference point initial position and put the problem of precision: can carry out the location in reference point and whole test orientation by reference edge, fix whole steady arm and reference field relative position by Double-sucker; Terminal pad can be the peripheral test device positioning datum and coupling arrangement is provided;
2. can locate fast, improve the efficient of test job;
3. cost is low, and is simple in structure, easy to carry.
Description of drawings
Below in conjunction with accompanying drawing, the specific embodiment of the present invention is described in further detail
Fig. 1 is structural representation of the present invention;
Fig. 2 is specific embodiment of the invention schematic diagram;
Fig. 3 is the structural representation that removes after sucking disc handle;
Fig. 4 be of the present invention and the peripheral test device between the design sketch that is connected.
Embodiment
Embodiment 1
Shown in Fig. 1-4, a kind of reference positioner comprises the dish A1 that is located by connecting, is located by connecting and coils B2, sucker A3 and sucker B4;
The angle that is located by connecting dish A1 and is located by connecting between dish B2 is 90 degree; This dish A1 that is located by connecting can locate by two reference edges with the dish B2 that is located by connecting, and can coordinate docking with external test arrangements 5;
Sucker A3 and sucker B4 play the role of positioning respectively, by sucker A3 and sucker B4, steady arm and ground are fixed together, and no longer include with benchmark the relation of relatively moving;
Respectively establish a Handle of sucking disc A31 on sucker A3; Be used for fixing and unclamp sucker A3;
Respectively establish a Handle of sucking disc B41 on sucker B4; Be used for fixing and unclamp sucker B4;
The described dish A1 and being located by connecting of being located by connecting connects by arc connecting bridge 6 between dish B2, and this arc connecting bridge 6 forms arc space zone is probe placement district 7; Be used to probe that zone and the particular location of placement are provided;
Shown in Figure 3, the described center that is located by connecting dish A1 is provided with a through hole A11, and sucker A3 is established in the below of the dish A1 that is located by connecting, and the center of this sucker A3 establishes that joint pin passes through hole A11 and sucking disc handle A31 is connected and fixed;
Shown in Figure 3, the described center that is located by connecting dish B2 is provided with a through hole B21, and sucker B4 is established in the below of the dish B21 that is located by connecting, and the center of this sucker B4 establishes that joint pin passes through hole B21 and sucking disc handle B41 is connected and fixed;
Shown in Fig. 1-3, the described dish A1 that is located by connecting is provided with reference edge A12; The described dish B2 that is located by connecting is provided with reference edge B22; Angle between described reference edge A12 and reference edge B22 is 90 degree.
The reference positioner principle of work: align with the reference edge 12,22 of the dish that is located by connecting respectively in two of the arbitrary neighborhoods of test zone benchmark sideline, two reference edges 12 after alignment, 22 just definite with the relative position on summit 8 namely find one of them summit 8 of test zone in steady arm.This summit 8 is a probe test point in the test test zone.After determining the position of steady arm by two reference edges 12,22, utilize sucker 3,4 that whole steady arm is fixed on the reference plane place, by flatten Handle of sucking disc 31,41 sucker 3,4 and ground hold, play the effect of location; Sucker 3, the 4th, a kind of rubber suction pad, flattening Handle of sucking disc 31,41 can be pulled upwardly rubber pad, makes air pressure between ground and rubber pad less than the air pressure of sucker space outerpace, thereby whole steady arm fixation.Again by recovering Handle of sucking disc 31,41, can reduce the position of rubber gasket, namely unclamp sucker, can move or dismantle steady arm.Two suckers 3,4 of placing by symmetry can make whole device stiff end stressed more even, and whole device is more stable; Dish 1,2 second effect that be located by connecting is with the peripheral test system or installs 5 and be connected and fixed, the dish 1,2 that is located by connecting this moment namely plays the function of origin reference location, coordinate docking by the dish 1,2 that is located by connecting with peripheral test device 5, thereby can carry out the test of other test zones of space; Fig. 4 is a kind of example of form wherein, and the design sketch that is connected between peripheral test device 9.
The word in the description orientation that adopts herein " on ", D score, " left side ", " right side " etc. be all for the convenience that illustrates based on the orientation shown in drawing in accompanying drawing, these orientation may be different due to the disposing way of device in actual device.
Obviously, the above embodiment of the present invention is only for example of the present invention clearly is described, and is not to be restriction to embodiments of the present invention.For those of ordinary skill in the field, can also make other changes in different forms on the basis of the above description.Here can't give all embodiments exhaustive.Everyly belong to the row that apparent variation that technical scheme of the present invention extends out or change still are in protection scope of the present invention.
Claims (1)
1. reference positioner is characterized in that: comprising the dish A(1 that is located by connecting), dish B(2 is located by connecting), sucker A(3) and sucker B(4);
Sucker A(3) establish a Handle of sucking disc A(31 on);
Sucker B(4) establish a Handle of sucking disc B(41 on);
The described dish A(1 that is located by connecting) and the dish B(2 that is located by connecting) between connect by arc connecting bridge (6), the arc space zone of this arc connecting bridge (6) formation is probe placement district (7);
The described dish A(1 that is located by connecting) center is provided with a through hole A(11), dish A(1 is located by connecting) the below establish sucker A(3), this sucker A(3) the center establish joint pin and pass through hole A(11) be connected and fixed with sucking disc handle A;
The described dish B(2 that is located by connecting) center is provided with a through hole B(21), dish B(2 is located by connecting) the below establish sucker B(4), this sucker B(4) the center establish joint pin and pass through hole B(21) with sucking disc handle B(41) be connected and fixed;
The described dish A(1 that is located by connecting) be provided with reference edge A(12); The described dish B(2 that is located by connecting) be provided with reference edge B(22); Described reference edge A(12) and reference edge B(22) between angle be 90 the degree.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310028680.3A CN103115640B (en) | 2013-01-25 | 2013-01-25 | Datum positioner |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310028680.3A CN103115640B (en) | 2013-01-25 | 2013-01-25 | Datum positioner |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103115640A true CN103115640A (en) | 2013-05-22 |
| CN103115640B CN103115640B (en) | 2015-05-13 |
Family
ID=48414061
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201310028680.3A Expired - Fee Related CN103115640B (en) | 2013-01-25 | 2013-01-25 | Datum positioner |
Country Status (1)
| Country | Link |
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| CN (1) | CN103115640B (en) |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1721783A1 (en) * | 2005-05-12 | 2006-11-15 | Silicon Pyramid Electron Ltd. | Suction fixture |
| CN201010083Y (en) * | 2007-03-28 | 2008-01-23 | 纬创资通股份有限公司 | Label locating tool |
| CN201751666U (en) * | 2010-06-09 | 2011-02-23 | 蔡文峰 | Bracing arm support provided with multiple sucking disc type foot rests |
| CN201992293U (en) * | 2010-12-09 | 2011-09-28 | 武昌船舶重工有限责任公司 | Universal measurement apparatus positioning device |
| CN102841263A (en) * | 2012-08-27 | 2012-12-26 | 北京无线电计量测试研究所 | Device for calibrating uniformity of transient electromagnetic field |
| CN203083595U (en) * | 2013-01-25 | 2013-07-24 | 北京无线电计量测试研究所 | Reference positioner |
-
2013
- 2013-01-25 CN CN201310028680.3A patent/CN103115640B/en not_active Expired - Fee Related
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1721783A1 (en) * | 2005-05-12 | 2006-11-15 | Silicon Pyramid Electron Ltd. | Suction fixture |
| CN201010083Y (en) * | 2007-03-28 | 2008-01-23 | 纬创资通股份有限公司 | Label locating tool |
| CN201751666U (en) * | 2010-06-09 | 2011-02-23 | 蔡文峰 | Bracing arm support provided with multiple sucking disc type foot rests |
| CN201992293U (en) * | 2010-12-09 | 2011-09-28 | 武昌船舶重工有限责任公司 | Universal measurement apparatus positioning device |
| CN102841263A (en) * | 2012-08-27 | 2012-12-26 | 北京无线电计量测试研究所 | Device for calibrating uniformity of transient electromagnetic field |
| CN203083595U (en) * | 2013-01-25 | 2013-07-24 | 北京无线电计量测试研究所 | Reference positioner |
Also Published As
| Publication number | Publication date |
|---|---|
| CN103115640B (en) | 2015-05-13 |
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Granted publication date: 20150513 Termination date: 20160125 |
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