CN103105459A - High temperature test chamber - Google Patents
High temperature test chamber Download PDFInfo
- Publication number
- CN103105459A CN103105459A CN 201110370226 CN201110370226A CN103105459A CN 103105459 A CN103105459 A CN 103105459A CN 201110370226 CN201110370226 CN 201110370226 CN 201110370226 A CN201110370226 A CN 201110370226A CN 103105459 A CN103105459 A CN 103105459A
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- heat
- electrode
- fan
- high temperature
- test
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- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Abstract
The invention discloses a high temperature test chamber. A heat-resisting protective net is arranged in a shell of the high temperature test chamber, a test object is placed on the heat-resisting protective net, an electrode is arranged under the heat-resisting protective net, a fan is arranged under the electrode, and a circuit board and a power plug are arranged under the fan. When a power supply is switched on, the electrode generates electric arcs, the electric arcs generate a high temperature, meanwhile, the fan under the electrode also starts to rotate, the fan blows the high temperature generated by the electric arcs towards the heat-resisting protective net and the test object placed on the heat-resisting protective net, and the temperature in the chamber rises quickly within short time, so that the temperature required in the test can be realized easily, and the test cost is lowered.
Description
Affiliated technical field
The present invention relates to a kind of device of high-temperature material being tested detection.
Background technology
At present, existing high-temperature test facility adopts heating wire as heater element more, adopt this method not only to increase the volume of testing equipment, and it is slow to heat up, and is not easy to reach desired temperature, has increased experimentation cost.
Summary of the invention
For overcoming in existing situation, existing high-temperature test facility adopts heating wire as heater element more, adopt this method not only to increase the volume of testing equipment, and it is slow to heat up, and is not easy to reach desired temperature, has increased the deficiency of experimentation cost, the invention provides a kind of high-temperature test chamber, its quick heating easily reaches desired temperature, has also reduced the cost of test.
the technical solution adopted for the present invention to solve the technical problems is: the housings at high-temperature test chamber has heat-resisting protection network, be placed with test article above heat-resisting protection network, it is electrode below heat-resisting protection network, it is fan below electrode, wiring board and attaching plug below fan, after switching on power, produce electric arc on electrode, electric arc produces high temperature, fan below electrode also begins to rotate simultaneously, the high temperature that fan produces electric arc blows to the test article that heat-resisting protection network and heat-resisting protection network are placed above up, because can heat up rapidly at short notice in case, so can be easy to reach the temperature of testing requirements, reduced the cost of test.
The invention has the beneficial effects as follows, can heat up rapidly at short notice, be easy to reach the temperature of testing requirements, reduced the cost of test.
Description of drawings
The invention will be further described below in conjunction with drawings and Examples.
Fig. 1 is outward appearance front elevation of the present invention.
Fig. 2 is the elevation cross-sectional view of electrode part in Fig. 1.
Fig. 3 is the vertical view of heat-resisting protection network in Fig. 2.
Fig. 4 is the vertical view of electrode in Fig. 2.
Fig. 5 is circuit connection diagram of the present invention.
1. chamber doors in figure, 2. chamber shell, 3. attaching plug, 4. wiring board, 5. fan, 6. electrode, 7. heat-resisting protection network, 8. diathermanous band, 9. test article, 10. anode, 11. negative electrodes, 12. electrode connecting lines, 13. electrode connecting lines.
Embodiment
In Fig. 1, chamber door (1) on the side of chamber shell (2), the below is attaching plug (3), there is heat-resisting protection network (7) chamber shell (2) the inside, be placed with test article (9) above heat-resisting protection network (7), being electrode (6) below heat-resisting protection network (7), is fan (5) below electrode (6), is wiring board (4) below fan (5).
in Fig. 2, the top of chamber shell (2) is heat-resisting protection network (7), electrode (6) below heat-resisting protection network (7), fan (5) below electrode (6), wiring board (4) and attaching plug (3) below fan (5), after switching on power, the upper electric arc that produces of electrode (6), electric arc produces high temperature, fan (5) below electrode (6) also begins to rotate simultaneously, the high temperature that fan (5) produces electric arc blows to the test article that heat-resisting protection network (7) and heat-resisting protection network (7) are placed above up, because can heat up rapidly at short notice in case, so can be easy to reach the temperature of testing requirements, reduced the cost of test.
In Fig. 3, diathermanous band (8) is arranged above heat-resisting protection network (7), the high temperature that electric arc produces blows to the test article of placing above heat-resisting protection network inside diathermanous band (8), can avoid the people directly to touch high arc temperature again simultaneously accidents caused.
In Fig. 4, between all anodes (10) and all negative electrode (11), very little gap is arranged, they are insulated from each other, and all anodes are connected by electrode connecting line (12), and all negative electrodes are connected by electrode connecting line (13).
in Fig. 5, the maximum input of this circuit is less than 100W, adopt weak current striking technology, can automatically ignite rapidly and be about 5mm～10mm, the stable arc of electric current 1～3A, striking device as the high-temperature test chamber electrode, electric arc is difficult for extinguishing, it is the 1000V pulse voltage of 50Hz that T2 level produces frequency, adjust RP, maximum average current when guaranteeing the T2 secondary short circuited is less than 0.5mA, by C4, C5, VD5, VD6, VD7, R2 forms main circuit, export the approximately direct-flow no load voltage of 80V, at first carry out short-circuit arc during use, then separate the two poles of the earth, air-gap between the high-voltage breakdown both positive and negative polarity that pulsing circuit produces, form ionization channels, energy on C5 discharges to this passage by R2, to keep its ionization, then, main circuit is namely discharged the electric current of 1～3A by this passage, thereby ignite continuous electric arc.
Claims (1)
1. high-temperature test chamber, it is characterized in that: the housings at high-temperature test chamber has heat-resisting protection network, is placed with test article above heat-resisting protection network, is electrode below heat-resisting protection network, being fan below electrode, is wiring board and attaching plug below fan.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201110370226 CN103105459A (en) | 2011-11-11 | 2011-11-11 | High temperature test chamber |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201110370226 CN103105459A (en) | 2011-11-11 | 2011-11-11 | High temperature test chamber |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN103105459A true CN103105459A (en) | 2013-05-15 |
Family
ID=48313469
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201110370226 Pending CN103105459A (en) | 2011-11-11 | 2011-11-11 | High temperature test chamber |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN103105459A (en) |
-
2011
- 2011-11-11 CN CN 201110370226 patent/CN103105459A/en active Pending
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20130515 |