CN103048595B - A kind of thyristor opens stress test method and device - Google Patents
A kind of thyristor opens stress test method and device Download PDFInfo
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Abstract
The invention provides a kind of thyristor and open stress test method and device, complete function, under meeting the various operating mode of converter valve, thyristor opens stress test requirement.And circuit topological structure is simple and practical, equipment needed thereby capacity is little, and installation cost is low.The method is directly tested single thyristor, namely can verify the ability of inner each thyristor tolerance turning-on voltage electric current, thus improved security and the economy of the converter valve manufacturing before converter valve assembling.In addition, the method regulates test parameters can improve the test intensity of electric heating stress, thus can know that thyristor opens stress limit tolerance value, for the optimal design of converter valve system provides foundation by constantly testing.
Description
Technical field
The invention belongs to electric and electronic technical field, be specifically related to a kind of thyristor and open stress test method and device.
Background technology
Converter valve is the Core equipment of DC transmission system, since the seventies in last century, has been that the converter valve of core switching device is widely applied gradually with thyristor.Converter valve is opening moment, and its inner thyristor can pour in very large surge current, and too high electric current and di/dt may cause thyristor to damage.Therefore, for the converter valve system designed, can be tolerated by research technique verification thyristor and open current stress, for ensureing that the long-term stability of converter valve is run significant.According to IEC60700 standard, thyristor opens the important performance assessment criteria that stress is converter valve type approval test and routine test, but it is all consider based on the one-piece construction of valve module, lacks the test examination of single thyristor being opened to stress.And if certain thyristor breaks down in test or burns, then may damage whole tested valve and test unit, bring larger economic loss even to cause potential safety hazard.
Summary of the invention
In order to overcome above-mentioned the deficiencies in the prior art, the invention provides a kind of thyristor and opening stress test method and device, complete function, under meeting the various operating mode of converter valve, thyristor opens stress test requirement.And circuit topological structure is simple and practical, equipment needed thereby capacity is little, and installation cost is low.The method is directly tested single thyristor, namely can verify the ability of inner each thyristor tolerance turning-on voltage electric current, thus improved security and the economy of the converter valve manufacturing before converter valve assembling.In addition, the method regulates test parameters can improve the test intensity of electric heating stress, thus can know that thyristor opens stress limit tolerance value, for the optimal design of converter valve system provides foundation by constantly testing.
In order to realize foregoing invention object, the present invention takes following technical scheme:
There is provided a kind of thyristor to open stress test method, said method comprising the steps of:
Step 1: test product thyristor is carried out the equivalent junction temperature be heated under converter valve operation conditions;
Step 2: adjustable condenser C is charged;
Step 3: trigger test product thyristor, adjustable condenser C is released energy, completes test product thyristor and once open stress test;
Step 4: repeat step 2 and step 3, carry out next test period, circulation is until test terminates.
In described step 1, Closing Switch Kr, controls direct voltage source E, by resistance r test product thyristor is heated to the equivalent junction temperature under converter valve operation conditions.
In described step 2, Closing Switch K
g, the DC current controlling variable ratio frequency changer high-voltage constant current source G output amplitude fixed frequency adjustable is charged to capacitor C, charges to variable ratio frequency changer high-voltage constant current source G automatic blocking after trial voltage.
In described step 3, send test product thyristor triggering impulse, after making the conducting of test product IGBT group, adjustable condenser C releases energy, and its electric discharge produces test current with REgulatable reactor L resonance, completes test product thyristor and once opens stress test.
In described step 4, after having tested, close variable ratio frequency changer high-voltage constant current source G, cut-off switch K
g; Closing Switch K
cby complete for remaining for adjustable condenser C fault offset; Close direct voltage source E, Closing Switch Kr, stop heating.
The present invention provides a kind of thyristor to open stress test device simultaneously, and described device comprises variable ratio frequency changer high-voltage constant current source G, test main circuit unit, heating circuit unit and protective loop unit; Described variable ratio frequency changer high-voltage constant current source G exports the adjustable condenser C of DC current to test main circuit unit and charges; The G locking of variable ratio frequency changer high-voltage constant current source also sends test product thyristor triggering impulse, after the conducting of test product IGBT group adjustable condenser C discharge produce test current, complete test product thyristor under various operating conditions open stress test; Described heating circuit unit is heated to test junction temperature to test product thyristor; Described protective loop unit prevents test from damaging test product thyristor.
Described different operating condition comprises different voltage, different frequency, different trigger pip, different junction temperature, different current peak and di/dt.
Described test main circuit unit comprises R-D branch road, the K switch that adjustable condenser C, damping resistance R and diode D are in series
c, resistance r2 and saturable reactor L; Described K switch
cbe connected in parallel on described adjustable condenser C two ends after connecting with resistance r2, described R-D branch road is connected with described saturable reactor L with after described adjustable condenser C parallel connection.
Described R-D branch road provides inverse current path for the adjustable condenser C back-pressure occurred of vibrating, and consumes the energy on adjustable condenser C by damping resistance R, makes test product thyristor opening shutoff naturally in the stress test cycle.
Described heating circuit unit comprises insulating heat-conductive plate A, K switch r, resistance r, direct voltage source E and insulating heat-conductive plate B, after described insulating heat-conductive plate A, K switch r, resistance r, direct voltage source E and insulating heat-conductive plate B connect successively, be connected in parallel on test product thyristor two ends, realize the electrical isolation of test main circuit unit and heating circuit unit.
Described protective loop unit comprises damping resistance Rd, damping capacitor Cd and equalizing resistance R
w; Wherein damping resistance Rd and damping capacitor Cd Rd-Cd series arm in series, after described Rd-Cd series arm is in parallel with described equalizing resistance Rw, is connected in parallel on test product thyristor two ends.
Compared with prior art, beneficial effect of the present invention is:
1, the method complete function, can provide heat and the loss intensity of transient voltage that same converter valve actual condition is suitable, transient current, transient state, under meeting the various operating mode of converter valve, thyristor opens stress test requirement;
2, topological structure is simple and easy to realize, and equipment needed thereby capacity is little, and installation cost is low;
3, the back-pressure that the R-D branch road that damping resistance R and diode D is in series occurs for adjustable condenser C vibrates provides inverse current path, and consume the energy on adjustable condenser C by damping resistance R, test product thyristor is turned off naturally opening in the stress test cycle, not only eliminate its cut-off signals circuit, simplify test unit, and eliminate to be forced shutdown and the influence factor that performance may bring is opened to thyristor, improve test accuracy;
4, directly stress test is opened to single test product thyristor, namely can verify the ability of inner each thyristor tolerance converter valve turning-on voltage electric current before converter valve assembling, thus improve security and the economy of the converter valve manufacturing;
5, the test intensity of electric heating stress can be improved, thus can know that tested thyristor opens stress limit tolerance value, for the optimal design of converter valve system provides foundation by constantly testing.
Accompanying drawing explanation
Fig. 1 is that in the embodiment of the present invention, thyristor opens stress test device topology diagram;
Fig. 2 is the trial voltage oscillogram that thyristor opens when stress test device carries out commissioning to test product thyristor;
Fig. 3 is the test current oscillogram that thyristor opens when stress test device carries out commissioning to test product thyristor.
Embodiment
Below in conjunction with accompanying drawing, the present invention is described in further detail.
As Fig. 1-Fig. 3, provide a kind of thyristor to open stress test method, said method comprising the steps of:
Step 1: test product thyristor is carried out the equivalent junction temperature be heated under converter valve operation conditions;
Step 2: adjustable condenser C is charged;
Step 3: trigger test product thyristor, adjustable condenser C is released energy, completes test product thyristor and once open stress test;
Step 4: repeat step 2 and step 3, carry out next test period, circulation is until test terminates.
In described step 1, Closing Switch Kr, controls direct voltage source E, by resistance r test product thyristor is heated to the equivalent junction temperature under converter valve operation conditions.
In described step 2, Closing Switch K
g, the DC current controlling variable ratio frequency changer high-voltage constant current source G output amplitude fixed frequency adjustable is charged to capacitor C, charges to variable ratio frequency changer high-voltage constant current source G automatic blocking after trial voltage.
In described step 3, send test product thyristor triggering impulse, after making the conducting of test product IGBT group, adjustable condenser C releases energy, and its electric discharge produces test current with REgulatable reactor L resonance, completes test product thyristor and once opens stress test.
In described step 4, after having tested, close variable ratio frequency changer high-voltage constant current source G, cut-off switch K
g; Closing Switch K
cby complete for remaining for adjustable condenser C fault offset; Close direct voltage source E, Closing Switch Kr, stop heating.
The present invention provides a kind of thyristor to open stress test device simultaneously, and described device comprises variable ratio frequency changer high-voltage constant current source G, test main circuit unit, heating circuit unit and protective loop unit; Described variable ratio frequency changer high-voltage constant current source G exports the adjustable condenser C of DC current to test main circuit unit and charges; The G locking of variable ratio frequency changer high-voltage constant current source also sends test product thyristor triggering impulse, after the conducting of test product IGBT group adjustable condenser C discharge produce test current, complete test product thyristor under various operating conditions open stress test; Described heating circuit unit is heated to test junction temperature to test product thyristor; Described protective loop unit prevents test from damaging test product thyristor.
Described different operating condition comprises different voltage, different frequency, different trigger pip, different junction temperature, different current peak and di/dt.
Described test main circuit unit comprises R-D branch road, the K switch that adjustable condenser C, damping resistance R and diode D are in series
c, resistance r2 and saturable reactor L; Described K switch
cbe connected in parallel on described adjustable condenser C two ends after connecting with resistance r2, described R-D branch road is connected with described saturable reactor L with after described adjustable condenser C parallel connection.
Described R-D branch road provides inverse current path for the adjustable condenser C back-pressure occurred of vibrating, and consumes the energy on adjustable condenser C by damping resistance R, makes test product thyristor opening shutoff naturally in the stress test cycle.
Described heating circuit unit comprises insulating heat-conductive plate A, K switch r, resistance r, direct voltage source E and insulating heat-conductive plate B, after described insulating heat-conductive plate A, K switch r, resistance r, direct voltage source E and insulating heat-conductive plate B connect successively, be connected in parallel on test product thyristor two ends, realize the electrical isolation of test main circuit unit and heating circuit unit.
Described protective loop unit comprises damping resistance Rd, damping capacitor Cd and equalizing resistance R
w; Wherein damping resistance Rd and damping capacitor Cd Rd-Cd series arm in series, described Rd-Cd series arm and described equalizing resistance R
wafter parallel connection, be connected in parallel on test product thyristor two ends.
During test, test product thyristor is heated to the equivalent junction temperature under converter valve operation conditions by heating circuit unit in advance, is then charged to adjustable condenser C by variable ratio frequency changer high-voltage constant current source G, and the locking constant current source when its voltage reaches predetermined value also triggers thyristor.The size of choose reasonable adjustable condenser C and trial voltage value, tested thyristor can be made to tolerate heat with the suitable transient voltage of converter valve actual condition, transient current, transient state and loss intensity, thus the test realized opening stress under the various valve operating mode of single thyristor is examined.。Increase adjustable condenser C, increase trial voltage, raise junction temperature and reduce saturable reactor parameter, then can improve the test intensity of electric heating stress, thus can know that test product thyristor opens stress limit tolerance value, for the optimal design of converter valve system provides foundation by constantly testing.Finally should be noted that: above embodiment is only in order to illustrate that technical scheme of the present invention is not intended to limit, although with reference to above-described embodiment to invention has been detailed description, those of ordinary skill in the field are to be understood that: still can modify to the specific embodiment of the present invention or equivalent replacement, and not departing from any amendment of spirit and scope of the invention or equivalent replacement, it all should be encompassed in the middle of right of the present invention.
Claims (1)
1. thyristor opens a stress test method, it is characterized in that: said method comprising the steps of:
Step 1: test product thyristor is carried out the equivalent junction temperature be heated under converter valve operation conditions;
Step 2: adjustable condenser C is charged;
Step 3: trigger test product thyristor, adjustable condenser C is released energy, completes test product thyristor and once open stress test;
Step 4: repeat step 2 and step 3, carry out next test period, circulation is until test terminates;
In described step 1, Closing Switch Kr, controls direct voltage source E, by resistance r test product thyristor is heated to the equivalent junction temperature under converter valve operation conditions;
In described step 2, Closing Switch K
g, the DC current controlling variable ratio frequency changer high-voltage constant current source G output amplitude fixed frequency adjustable is charged to capacitor C, charges to variable ratio frequency changer high-voltage constant current source G automatic blocking after trial voltage;
In described step 3, send test product thyristor triggering impulse, after making the conducting of test product IGBT group, adjustable condenser C releases energy, and its electric discharge produces test current with REgulatable reactor L resonance, completes test product thyristor and once opens stress test;
In described step 4, after having tested, close variable ratio frequency changer high-voltage constant current source G, cut-off switch K
g; Closing Switch K
cby complete for remaining for adjustable condenser C fault offset; Close direct voltage source E, Closing Switch Kr, stop heating;
Described method is opened stress test device by thyristor and is realized, and described thyristor is opened stress test device and comprised variable ratio frequency changer high-voltage constant current source G, test main circuit unit, heating circuit unit and protective loop unit; Described variable ratio frequency changer high-voltage constant current source G exports the adjustable condenser C of DC current to test main circuit unit and charges; The G locking of variable ratio frequency changer high-voltage constant current source also sends test product thyristor triggering impulse, after the conducting of test product IGBT group adjustable condenser C discharge produce test current, complete test product thyristor under various operating conditions open stress test; Described heating circuit unit is heated to test junction temperature to test product thyristor; Described protective loop unit prevents test from damaging test product thyristor;
Described different operating condition comprises different voltage, different frequency, different trigger pip, different junction temperature, different current peak and di/dt;
Described test main circuit unit comprise R that adjustable condenser C, damping resistance R and diode D be in series ?D branch road, K switch
c, resistance r2 and saturable reactor L; Described K switch
cwith resistance r2 connect after be connected in parallel on described adjustable condenser C two ends, described R ?D branch road connect with described saturable reactor L with after described adjustable condenser C parallel connection;
Described R ?D branch road provide inverse current path for the adjustable condenser C back-pressure occurred of vibrating, and consume the energy on adjustable condenser C by damping resistance R, make test product thyristor opening shutoff naturally in the stress test cycle;
Described heating circuit unit comprises insulating heat-conductive plate A, K switch r, resistance r, direct voltage source E and insulating heat-conductive plate B, after described insulating heat-conductive plate A, K switch r, resistance r, direct voltage source E and insulating heat-conductive plate B connect successively, be connected in parallel on test product thyristor two ends, realize the electrical isolation of test main circuit unit and heating circuit unit;
Described protective loop unit comprises damping resistance Rd, damping capacitor Cd and equalizing resistance R
w; Wherein damping resistance Rd and damping capacitor Cd Rd in series ?Cd series arm, described Rd ?Cd series arm and described equalizing resistance R
wafter parallel connection, be connected in parallel on test product thyristor two ends.
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| CN201210541033.8A CN103048595B (en) | 2012-12-13 | 2012-12-13 | A kind of thyristor opens stress test method and device |
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Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN103278758B (en) * | 2013-04-19 | 2016-01-20 | 国家电网公司 | A kind of high-power thyristor turn-off characteristic test method and proving installation thereof |
| CN105470160B (en) * | 2015-11-19 | 2018-06-08 | 中冶南方工程技术有限公司 | A kind of high-pressure thyristor trigger board test platform |
| CN108712058B (en) * | 2017-04-12 | 2021-10-01 | 全球能源互联网研究院有限公司 | Shielding type voltage-sharing circuit |
| CN109782150A (en) * | 2019-03-13 | 2019-05-21 | 南京南瑞继保电气有限公司 | A kind of thyristor electric heating experimental rig and its test method |
| CN110763970B (en) * | 2019-09-19 | 2021-06-22 | 中国南方电网有限责任公司超高压输电公司检修试验中心 | Method for testing breakover voltage of protection thyristor of MMC power module |
| CN110927551B (en) * | 2019-12-03 | 2023-02-03 | 西安西电电力系统有限公司 | Short-circuit current test loop of thyristor converter valve component |
| CN111337814B (en) * | 2020-04-21 | 2022-02-25 | 吉林华微电子股份有限公司 | Tolerance test device and method for semiconductor device |
| CN111579981B (en) * | 2020-06-05 | 2022-07-19 | 全球能源互联网研究院有限公司 | Circuit and method for simulating switching-on and switching-off voltage of converter valve |
| CN112269114A (en) * | 2020-10-15 | 2021-01-26 | 许继集团有限公司 | Converter valve thyristor level high-low voltage function testing device |
| CN113162099B (en) * | 2021-03-22 | 2023-01-13 | 清华大学 | Thyristor on-line on-state voltage monitoring system and method |
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| CN101980035A (en) * | 2010-09-10 | 2011-02-23 | 中国电力科学研究院 | Experiment design and analysis method for most severe current stress born by thyristor used for converter valve |
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Address after: 102211 Beijing city Changping District Xiaotangshan town big East Village Road No. 270 (future technology city) Co-patentee after: CHINA-EPRI ELECTRIC POWER ENGINEERING Co.,Ltd. Patentee after: STATE GRID SMART GRID Research Institute Co-patentee after: STATE GRID SHANDONG ELECTRIC POWER Co. Co-patentee after: State Grid Corporation of China Address before: 102211 Beijing city Changping District Xiaotangshan town big East Village Road No. 270 (future technology city) Co-patentee before: CHINA-EPRI ELECTRIC POWER ENGINEERING Co.,Ltd. Patentee before: STATE GRID SMART GRID Research Institute Co-patentee before: SHANDONG ELECTRIC POWER Corp. Co-patentee before: State Grid Corporation of China |
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Effective date of registration: 20170615 Address after: 102200 Beijing city Changping District South Shao Zhen Nan Road No. 16 Co-patentee after: STATE GRID SHANDONG ELECTRIC POWER Co. Patentee after: CHINA-EPRI ELECTRIC POWER ENGINEERING Co.,Ltd. Co-patentee after: State Grid Corporation of China Address before: 102211 Beijing city Changping District Xiaotangshan town big East Village Road No. 270 (future technology city) Co-patentee before: CHINA-EPRI ELECTRIC POWER ENGINEERING Co.,Ltd. Patentee before: STATE GRID SMART GRID Research Institute Co-patentee before: STATE GRID SHANDONG ELECTRIC POWER Co. Co-patentee before: State Grid Corporation of China |