Application of the electrolysis process in ito film is cleaned
Technical field
The present invention relates to ito film, application of more particularly to a kind of electrolysis process in ito film is cleaned.
Background technology
Tin indium oxide (ITO, or tin-doped indium oxide) is a kind of indium(III)Oxide (In2O3) and tin(IV races)Oxidation
Thing (SnO2) mixture, usual mass ratio be 90% In2O3, 10% SnO2.Generally deposited by electron beam evaporation, physical vapour deposition (PVD),
Or the method for some sputter-deposition technologies deposits to surface and obtains indium oxide tin film.
For cleaning for ito film, generally using Chemical cleaning.Conventional Chemical cleaning is usually by component at present(Or claim
For accessory)Clean in being immersed directly in acid solution, in cleaning process, acid solution there are considerable amount of corrosion losses in itself to component mother metal, clearly
Wash and reach certain amount, cost recovery is carried out to liquid medicine of a relatively high.Another mode is gone using high-pressure water knife mode
Film, can cause substantial amounts of recyclable ITO to be lost in.
Therefore, this area needs a kind of new ito film method of cleaning of exploitation, it is to avoid to the corrosion of component and noble metal into
The loss for dividing.
The content of the invention
It is an object of the invention to provide a kind of new ito film method of cleaning, electrochemical process is attached to conventional
In ito film chemistry wash clean process, with cost-effective and improve the component life-span.
The ito film method of cleaning that the present invention is provided, including component is placed in sulfuric acid electrolyte, by being electrolysed ito film
Clean, wherein, the component is covered with the component of the aluminum alloy material of ito film for surface.
According to the present invention, the sulfuric acid electrolyte be aqueous sulfuric acid, concentration range 120g/L~250g/L, temperature range
15~35 DEG C.
According to the present invention, with inert electrode as negative electrode, with component as anode, negative electrode with the area ratio of anode is for the electrolysis
1:1~1:2, voltage is 5~17V.
Electrolysis actual current is determined by the effective area of part.
According to the present invention, the inert electrode is graphite, lead or titanium.
In the present invention, so-called inert electrode is referred to for there is no the material for dissolving as negative electrode under electrolytic condition.
According to the present invention, methods described also includes the step of post-processing to the component after electrolysis, the post processing bag
Include:Sandblasting is molten to penetrate.
The component that electrolytic cleaned is completed, post processing mode are same as Chemical cleaning flow process substantially, and neutralization removes the floating ash in surface, root
According to roughness demand, normally do sandblasting and molten penetrate process.
According to the present invention, methods described also includes the step of post-processing to the sulfuric acid electrolyte after electrolysis, it is described after
Process includes reclaiming the In elements in sulfuric acid electrolyte.
In ito film wash clean process, ITO vitriolizations, wherein can also it is miscellaneous enter aluminium ion, copper ion etc., using graphite sun
Pole, titanium plate are done catholyte and reclaim metal In.
It is according to the present invention, when in the sulfuric acid electrolyte, In constituent contents are more than 20g/L, first to the In in sulfuric acid electrolyte
Element is reclaimed.
The method of the present invention, in ito film course of dissolution, aluminium alloy forms dense oxide in sulfuric acid electrolyte as anode
Film is protected to component mother metal, improves the life-span that component is recycled.The present invention can also be reclaimed to noble metal component, kept away
Exempt from the loss in traditional chemical removal process.
It should be understood that within the scope of the present invention, above-mentioned each technical characteristic of the present invention and have in below (eg embodiment)
Can be combined with each other between each technical characteristic of body description, so as to constitute new or preferred technical scheme.As space is limited, exist
This no longer tires out one by one states.
Specific embodiment
With reference to specific embodiment, the present invention is expanded on further.It should be understood that these embodiments are merely to illustrate the present invention
Rather than limit the scope of the present invention.
Term
Tin indium oxide ITO
Tin indium oxide (ITO, or tin-doped indium oxide) is a kind of indium(III)Oxide (In2O3) and tin(IV races)Oxidation
Thing (SnO2) mixture, usual mass ratio be 90% In2O3, 10% SnO2.It is clear, colorless in film-form.In bulk
During state, it is in yellow grey partially.The main characteristic of tin indium oxide is that its electricity is conducted and optically transparent combination.
Indium tin oxide films are most often deposited by electron beam evaporation, physical vapour deposition (PVD) or some sputter-deposition technologies
Method deposits to surface, using it is most be reactive magnetron sputtering method.Wherein, ITO conducting films are the methods using magnetron sputtering
The height that transparent indium tin oxide (ITO) conductive film coating Jing the high temperature anneals are obtained is sputtered on transparent organic film material
Technical products.
Embodiment 1
The present embodiment is with TFT(Thin film transistor (TFT) production equipment)The color film ITO Sputter of the 6th generation(CF
Carrier coloured silk membrane production equipment substrate carriers)Electrolytic cleaned is carried out as a example by component
Component surface Direct precipitation ito film Jing after sandblasting increases bulk processing during use, its upper and lower plates is aluminum;In operation with
The aqueous sulfuric acid of 150g/L does electrolyte, the titanium plate that 600 square decimeters of the gross area(A kind of inert electrode used by the present invention)
For negative electrode, the upper lower aluminum sheet of 4 pieces of Carrier is loaded every time(Totally 8 pieces, about 600 square decimeters of the gross area)As anode;Operation temperature
At 17 ± 2 DEG C, voltage is in 7V or so for degree control;Electrolysis every time takes about 3 hours;Normally entered with nitre fluoric acid after the completion of electrolytic cleaned
Row neutralization, and wash, sandblasting etc. completes cleaning.
Cleaning performance:Component surface ito film matter cleaning after electrolytic cleaned is complete, the overall slight loss of parts surface, is in
Uniform loss shape;To analyze with groove test piece and the measurement of actual component, the loss of electrolytic cleaned is at 10~15 microns(μm).
Embodiment 2
Using the method cleaning ito film of embodiment 1, when in electrolyte, In contents are 22g/L, reclaimed
With 20dm2Titanium plate be negative electrode, 20dm2Graphite cake is anode, and room temperature condition voltage stabilizing 3V is electrolysed, actual current
About 16A, is electrolysed about 20 hours, and cathode surface deposits thick indium, and indium metal is obtained after refinement.
Embodiment 3-6
The method of embodiment 3-6 is substantially the same manner as Example 1, and difference is:
Embodiment 3:Electrolyte is done using the aqueous sulfuric acid of 225g/L, the component surface ito film matter after electrolytic cleaned is clear
Wash complete, the overall slight loss of parts surface, in uniform loss shape;To analyze with groove test piece and the measurement of actual component, electrolysis
The loss of cleaning is at 10~15 microns(μm).
Embodiment 4:Electrolysis processing temperature is 25 ± 2 DEG C, and voltage is 15V, and the component surface ito film matter after electrolytic cleaned is clear
Wash complete, the overall slight loss of parts surface, in uniform loss shape;To analyze with groove test piece and the measurement of actual component, electrolysis
The loss of cleaning is at 15~25 microns(μm).
Embodiment 5:The upper lower aluminum sheet of 2 pieces of Carrier is loaded every time(Totally 4 pieces, about 300 square decimeters of the gross area), electrolysis
Component surface ito film matter cleaning after cleaning is complete, the overall slight loss of parts surface, in uniform loss shape;With with groove test piece
And the measurement analysis of actual component, the loss of electrolytic cleaned is at 8~12 microns(μm).
Embodiment 6:Using graphite as negative electrode, the component surface ito film matter cleaning after electrolytic cleaned is complete, and parts surface is whole
Body is slightly lost, in uniform loss shape;To analyze with groove test piece and the measurement of actual component, the loss of electrolytic cleaned is 10~15
Micron(μm).
Cleaning performance:Component surface ito film matter cleaning after electrolytic cleaned is complete, the overall slight loss of parts surface, is in
Uniform loss shape;To analyze with groove test piece and the measurement of actual component, the loss of electrolytic cleaned, in 10~15um or lower, is 8
~12 microns(μm).
Comparative example:
Comparative example adopts traditional acid cleaning process, with the component in embodiment 1 as process object, uses 40%(Volume ratio)'s
Aqueous solution of nitric acid soaks.After immersion about 1 hour, surface ito film matter cleaning is complete, and corrosion uneven phenomenon, striping mistake occurs in aluminium sheet
The loss of journey aluminum mother plate is at 50~60 microns(μm).
, compared with conventional method, in ito film course of dissolution, aluminium alloy is as anode in sulfuric acid electrolyte for the method for the present invention
Middle formation dense oxidation film is protected to component mother metal, is improved the life-span that component is recycled, and is saved process time.This
It is bright noble metal component to be reclaimed, it is to avoid the loss in traditional chemical removal process.
The all documents referred in the present invention are all incorporated as reference in this application, independent just as each document
It is incorporated as with reference to such.In addition, it is to be understood that after the above-mentioned instruction content for having read the present invention, those skilled in the art can
To make various changes or modifications to the present invention, these equivalent form of values equally fall within the model limited by the application appended claims
Enclose.