CN103029416A - Backlight material attaching test method - Google Patents
Backlight material attaching test method Download PDFInfo
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- CN103029416A CN103029416A CN2011103046520A CN201110304652A CN103029416A CN 103029416 A CN103029416 A CN 103029416A CN 2011103046520 A CN2011103046520 A CN 2011103046520A CN 201110304652 A CN201110304652 A CN 201110304652A CN 103029416 A CN103029416 A CN 103029416A
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- boss
- brightness enhancement
- enhancement film
- test method
- backlight source
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- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
The invention relates to a backlight material attaching test method which comprises an upper brightness enhancement film (1), a lower brightness enhancement film (2) and a diffusion film (3); and each piece of material is provided with a 'locating buckle' at the same position, and the 'locating buckles' are in boss shapes and have different sizes. The backlight material attaching test method shortens the test time and improves the production efficiency and the product quality.
Description
Technical field:
The present invention relates to a kind of method of inspection, refer more particularly to a kind of backlight source material attachment method of inspection.
Background technology:
Present known material attachment inspection method is to uncover the material of required attaching is a sheet by a sheet, because the film material is very thin, and easily inhales micronic dust, tears off the improper material surface that also can cause and scratches.Thereby in the actual production process, do not tear off this procedure, and only have when serious problems appear in product, could find to lack patch material, cause unstable product quality.
Summary of the invention:
The purpose of this invention is to provide a kind of backlight source material attachment method of inspection.Overcome deficiency in the prior art, to improve the quality of products.
The object of the present invention is achieved like this, and a kind of backlight source material attachment method of inspection comprises brightness enhancement film, lower brightness enhancement film, diffusion barrier, it is characterized in that: every material arranges one section boss shape, " locating fastener " that size is different in same position.
The left side of upper brightness enhancement film of the present invention is arranged at intervals with boss A, boss B.
The left side of lower brightness enhancement film of the present invention is arranged at intervals with boss C, boss D.
The left side of diffusion barrier of the present invention is provided with boss E.
The present invention is easy to operate, has shortened Check-Out Time, has improved production efficiency and product quality.
Description of drawings:
Content of the present invention is easier to be expressly understood in order to make, and the below is according to specific embodiment and by reference to the accompanying drawings, and the present invention is further detailed explanation:
Fig. 1 is the structural representation of this practical upper brightness enhancement film;
Fig. 2 is the structural representation of this practical lower brightness enhancement film;
Fig. 3 is the structural representation of this practical diffusion barrier;
Fig. 4 is the structural representation of this practical overlapped film.
Among the figure: 1, upper brightness enhancement film, 11, boss A, 12 boss B;
2, lower brightness enhancement film, 21, boss C, 22, boss D;
3, diffusion barrier, 31, boss E;
4, overlapped film, 41, step.
The specific embodiment:
The invention will be further described below in conjunction with accompanying drawing:
With reference to accompanying drawing, a kind of backlight source material attachment method of inspection comprises brightness enhancement film 1, lower brightness enhancement film 2, diffusion barrier 3, it is characterized in that: every material arranges one section boss shape, " locating fastener " that size is different in same position.The left side of described upper brightness enhancement film 1 is arranged at intervals with boss A11, boss B12.The left side of described lower brightness enhancement film 2 is arranged at intervals with boss C21, boss D22.The left side of described diffusion barrier 3 is provided with boss E31.During implementation, will whenever put up enclosure material at one section boss shape of same position design, " locating fastener " that size is different.Put into diffusion barrier 3 backlight first, put into again lower brightness enhancement film 2, put at last brightness enhancement film 1, trilaminate material all put into backlight after, can form step 41 in the locator card buckle, namely trilaminate material can both show in the locator card buckle, attaching person can determine whether easily that according to step shape material leaks subsides, remove loaded down with trivial details view procedure from, shortened Check-Out Time, improved production efficiency and product quality.
Should be appreciated that specific embodiment described above only is used for explaining the present invention, be not intended to limit the present invention.The apparent variation of being extended out by spirit of the present invention or change still are among protection scope of the present invention.
Claims (4)
1. a backlight source material attachment method of inspection comprises brightness enhancement film (1), lower brightness enhancement film (2), diffusion barrier (3), it is characterized in that: every material arranges one section boss shape, " locating fastener " that size is different in same position.
2. a kind of backlight source material attachment method of inspection according to claim 1, it is characterized in that: the left side of described upper brightness enhancement film (1) is arranged at intervals with boss A(11), boss B(12).
3. a kind of backlight source material attachment method of inspection according to claim 1, it is characterized in that: the left side of described lower brightness enhancement film (2) is arranged at intervals with boss C(21), boss D(22).
4. a kind of backlight source material attachment method of inspection according to claim 1, it is characterized in that: the left side of described diffusion barrier (3) is provided with boss E(31).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011103046520A CN103029416A (en) | 2011-10-10 | 2011-10-10 | Backlight material attaching test method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011103046520A CN103029416A (en) | 2011-10-10 | 2011-10-10 | Backlight material attaching test method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN103029416A true CN103029416A (en) | 2013-04-10 |
Family
ID=48017049
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2011103046520A Pending CN103029416A (en) | 2011-10-10 | 2011-10-10 | Backlight material attaching test method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN103029416A (en) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101089694A (en) * | 2006-06-13 | 2007-12-19 | 胜华科技股份有限公司 | Light module and optical diaphragm assembly using the light module |
| CN202319220U (en) * | 2011-10-10 | 2012-07-11 | 靖江市永盛光电科技有限公司 | Backlight source material attachment inspection device |
-
2011
- 2011-10-10 CN CN2011103046520A patent/CN103029416A/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101089694A (en) * | 2006-06-13 | 2007-12-19 | 胜华科技股份有限公司 | Light module and optical diaphragm assembly using the light module |
| CN202319220U (en) * | 2011-10-10 | 2012-07-11 | 靖江市永盛光电科技有限公司 | Backlight source material attachment inspection device |
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| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C12 | Rejection of a patent application after its publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20130410 |