CN102886574A - Novel sampling circuit for linear cutting - Google Patents

Novel sampling circuit for linear cutting Download PDF

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Publication number
CN102886574A
CN102886574A CN201210239399XA CN201210239399A CN102886574A CN 102886574 A CN102886574 A CN 102886574A CN 201210239399X A CN201210239399X A CN 201210239399XA CN 201210239399 A CN201210239399 A CN 201210239399A CN 102886574 A CN102886574 A CN 102886574A
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CN
China
Prior art keywords
sampling circuit
chip
cutting
pin
sample circuit
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Pending
Application number
CN201210239399XA
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Chinese (zh)
Inventor
王松虎
王松海
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NINGBO HUXING NUMERICAL CONTROL TECHNOLOGY Co Ltd
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NINGBO HUXING NUMERICAL CONTROL TECHNOLOGY Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by NINGBO HUXING NUMERICAL CONTROL TECHNOLOGY Co Ltd filed Critical NINGBO HUXING NUMERICAL CONTROL TECHNOLOGY Co Ltd
Priority to CN201210239399XA priority Critical patent/CN102886574A/en
Publication of CN102886574A publication Critical patent/CN102886574A/en
Pending legal-status Critical Current

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Abstract

The invention discloses a novel sampling circuit for linear cutting. The novel sampling circuit is characterized by comprising an analogue-to-digital (AD) sampling circuit unit and a parameter regulation unit, wherein the AD sampling circuit unit is used for sampling an input signal, and converting the sampled analogue signal into a digital signal for the processing of digital equipment and the operation and control output of a singlechip; and the parameter regulation unit is used for regulating the frequency and voltage of the digital signal and the working state of the whole circuit to be adapted to material cutting at different heights and the cutting of various special materials. The novel AD sampling circuit can be adapted to the material cutting at different heights and the cutting of various special materials; and particularly, by the novel sampling circuit, a silicon material which cannot be continuously cut by using the conventional sampling circuit can be stably cut, so that the problem of difficulty in tracking regulation when various materials are machined by a sampling circuit for a high-speed wire electrical discharge machining tool and the thickness range of a workpiece is wide is well solved, and the high-efficiency operation of each company is ensured.

Description

A kind of line cutting novel sampling circuit
Technical field
The invention belongs to the circuit engineering field, relate in particular to a kind of line cutting novel sampling circuit.
Background technology
At present the quick-wire-moving linear cutting machine sample circuit mainly is the mean value of getting gap voltage, follows the tracks of being difficult to adjust when the various different materials of processing and thickness of workpiece scope are very large, must remove to change original hardware circuit.Impossible realize for common operating personnel.
Summary of the invention
The present invention follows the tracks of the problem that is difficult to adjustment in view of present quick-wire-moving linear cutting machine sample circuit exists, and a kind of line cutting novel sampling circuit is provided.
The embodiment of the invention is achieved in that a kind of line cutting novel sampling circuit, and described sample circuit comprises:
AD sample circuit unit is used for the signal of input is sampled first, and the analog signal conversion of sampling is become data signal, just can be convenient to digital device and process, and then single-chip microcomputer could be to its operation and control output;
The state of work of frequency, voltage and the whole circuit of data signal be used for to be adjusted in the parameter adjustment unit, with the material cutting that adapts to differing heights and the cutting of various special materials.
Further, AD sample circuit unit is take single-chip microcomputer U1 with AD translation function as core, wherein pin P13-P17 meets button K1-K5, and P11-P13 receives respectively the pin C that latchs chip U2-U4, and P30-P37 is connected respectively to the pin 1D-8D that latchs chip U2-U4.
Further, the concrete connection of parameter adjustment unit is: by latching chip U2-U4, button K1-K5, chip L1-L3 consists of, wherein L1-L3 is connected on the pin 1Q-8Q that latchs chip U2-U4, latch chip U2-U4 and be connected with the P3 mouth of single-chip microcomputer U1, button K1-K5 meets the pin P13-P17 of single-chip microcomputer U1.
New A D sample circuit provided by the invention can adapt to the material cutting of differing heights and the cutting of various special materials.Particularly silicon materials can't cut with original sample circuit at all continuously, and cut highly stable with our this cover new A D sample circuit.When the various different materials of processing and thickness of workpiece scope are very large, follow the tracks of the problem adjusted of being difficult to regard to the good quick-wire-moving linear cutting machine sample circuit that solved like this, guaranteed the operation of each company's high efficiency, high benefit, played good effect.
Description of drawings
Fig. 1 is the structured flowchart of the line cutting novel sampling circuit that provides of the embodiment of the invention;
Fig. 2 is the circuit diagram of the line cutting novel sampling circuit that provides of the embodiment of the invention;
Fig. 3 is the circuit diagram of the parameter adjustment unit that provides of the embodiment of the invention.
The specific embodiment
In order to make purpose of the present invention, technical scheme and advantage clearer, below in conjunction with drawings and Examples, the present invention is further elaborated.Should be appreciated that specific embodiment described herein only in order to explain the present invention, is not intended to limit the present invention.
The structure that the line that Fig. 1-3 shows the embodiment of the invention to be provided cuts the novel sampling circuit.Comprise AD sample circuit unit 1, parameter adjustment unit 2 two parts.Sampled signal is input to AD sample circuit unit 1, after 2 effects of parameter adjustment unit, by AD sample circuit unit 1 output signal.
AD sample circuit unit is used for the signal of input is sampled first, and after a period of time, the analog signal conversion of sampling becomes data signal, just can be convenient to digital device and process, and then single-chip microcomputer could be to its operation and control output.
The state (sky is walked or machining state) of work of frequency, voltage and the whole circuit of data signal be used for to be adjusted in the parameter adjustment unit, with the material cutting that adapts to differing heights and the cutting of various special materials.
The concrete connection of AD sample circuit unit is: be made of the single-chip microcomputer U1 with AD translation function.Wherein pin P13-P17 meets button K1-K5, and P11-P13 receives respectively the pin C that latchs chip U2-U4, and P30-P37 is connected respectively to the pin 1D-8D that latchs chip U2-U4.
The concrete connection of parameter adjustment unit is: by latching chip U2-U4, button K1-K5, chip L1-L3 formation.Wherein L1-L3 is connected on the pin 1Q-8Q that latchs chip U2-U4, latchs chip U2-U4 and is connected with the P3 mouth of single-chip microcomputer U1, and button K1-K5 meets the pin P13-P17 of single-chip microcomputer U1.
The positive pole of sampled signal is through resistance R 1, and the R2 dividing potential drop is again through the P1.0 mouth input of Zener diode V6 voltage stabilizing to single-chip microcomputer U1, single-chip microcomputer U1 brings into operation, and is connected with the P3 mouth of single-chip microcomputer and latchs chip U2, U3, U4, and two charactrons show threshold voltage, a charactron shows the frequency conversion parameter, button K1, and K2 regulates the threshold magnitude of voltage, K3, K4 regulates the frequency conversion value, and K5 is used for changing that sky is walked and machining state, through after the parameter adjustment, frequency conversion is from the P01 mouth output of U1, output signal.
Through testing at lathe, this cover new A D sample circuit can adapt to the material cutting of differing heights and the cutting of various special materials.Particularly silicon materials can't cut with original sample circuit at all continuously, and cut highly stable with our this cover new A D sample circuit.When the various different materials of processing and thickness of workpiece scope are very large, follow the tracks of the problem adjusted of being difficult to regard to the good quick-wire-moving linear cutting machine sample circuit that solved like this, guaranteed the operation of each company's high efficiency, high benefit, played good effect
The above only is preferred embodiment of the present invention, not in order to limiting the present invention, all any modifications of doing within the spirit and principles in the present invention, is equal to and replaces and improvement etc., all should be included within protection scope of the present invention.

Claims (3)

1. a line cutting novel sampling circuit is characterized in that, described sample circuit comprises:
AD sample circuit unit is used for the signal of input is sampled first, and the analog signal conversion of sampling is become data signal, just can be convenient to digital device and process, and then single-chip microcomputer could be to its operation and control output;
The state of work of frequency, voltage and the whole circuit of data signal be used for to be adjusted in the parameter adjustment unit, with the material cutting that adapts to differing heights and the cutting of various special materials.
2. sample circuit as claimed in claim 1, it is characterized in that, AD sample circuit unit is take single-chip microcomputer U1 with AD translation function as core, wherein pin P13-P17 meets button K1-K5, P11-P13 receives respectively the pin C that latchs chip U2-U4, and P30-P37 is connected respectively to the pin 1D-8D that latchs chip U2-U4.
3. sample circuit as claimed in claim 1, it is characterized in that, the concrete connection of parameter adjustment unit is: by latching chip U2-U4, button K1-K5, chip L1-L3 consists of, wherein L1-L3 is connected on the pin 1Q-8Q that latchs chip U2-U4, latchs chip U2-U4 and is connected with the P3 mouth of single-chip microcomputer U1, and button K1-K5 meets the pin P13-P17 of single-chip microcomputer U1.
CN201210239399XA 2012-07-05 2012-07-05 Novel sampling circuit for linear cutting Pending CN102886574A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201210239399XA CN102886574A (en) 2012-07-05 2012-07-05 Novel sampling circuit for linear cutting

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201210239399XA CN102886574A (en) 2012-07-05 2012-07-05 Novel sampling circuit for linear cutting

Publications (1)

Publication Number Publication Date
CN102886574A true CN102886574A (en) 2013-01-23

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN201210239399XA Pending CN102886574A (en) 2012-07-05 2012-07-05 Novel sampling circuit for linear cutting

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CN (1) CN102886574A (en)

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6125725A (en) * 1984-07-12 1986-02-04 Mitsubishi Electric Corp Wire-cut electric discharge processing machine
JPH05177438A (en) * 1991-12-26 1993-07-20 Brother Ind Ltd Wire-cut electric discharge machine
CN101318243A (en) * 2008-06-27 2008-12-10 江苏科技大学 Asymmetric cutting method for electrospark wire-electrode cutting
CN101941104A (en) * 2009-07-07 2011-01-12 发那科株式会社 Wire-cut electric discharge machine
CN102248235A (en) * 2011-05-23 2011-11-23 哈尔滨工业大学 Device and method for detecting discharge state in electric spark linear cutting work gap
CN202780116U (en) * 2012-07-03 2013-03-13 宁波虎兴数控科技有限公司 Linear cutting novel sampling circuit

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6125725A (en) * 1984-07-12 1986-02-04 Mitsubishi Electric Corp Wire-cut electric discharge processing machine
JPH05177438A (en) * 1991-12-26 1993-07-20 Brother Ind Ltd Wire-cut electric discharge machine
CN101318243A (en) * 2008-06-27 2008-12-10 江苏科技大学 Asymmetric cutting method for electrospark wire-electrode cutting
CN101941104A (en) * 2009-07-07 2011-01-12 发那科株式会社 Wire-cut electric discharge machine
CN102248235A (en) * 2011-05-23 2011-11-23 哈尔滨工业大学 Device and method for detecting discharge state in electric spark linear cutting work gap
CN202780116U (en) * 2012-07-03 2013-03-13 宁波虎兴数控科技有限公司 Linear cutting novel sampling circuit

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Application publication date: 20130123