CN102866343A - Forward overload test device - Google Patents
Forward overload test device Download PDFInfo
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- CN102866343A CN102866343A CN201210397771XA CN201210397771A CN102866343A CN 102866343 A CN102866343 A CN 102866343A CN 201210397771X A CN201210397771X A CN 201210397771XA CN 201210397771 A CN201210397771 A CN 201210397771A CN 102866343 A CN102866343 A CN 102866343A
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- constant current
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- rectifier
- transformer
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Abstract
The invention relates to a forward overload test device which comprises an alternating-current power supply, a transformer, a rectifier, an impulse oscillator and a constant current source, wherein the output end of the alternating-current power supply is connected with the input end of the transformer, the output end of the transformer is connected with the input end of the rectifier, the input end and the output end of the rectifier are connected with the input end of the impulse oscillator, the output end of the impulse oscillator is connected with the constant current source through a driving circuit, and the output end of the constant current source is loaded on a high-voltage diode. The forward overload test device is characterized by further comprising a servo circuit and a current fluctuation sampling circuit, wherein the input end of the current fluctuation sampling circuit is connected with the high-voltage diode, and the output end of a current fluctuation driving circuit is connected with the constant current source. The current fluctuation sampling circuit is used for detecting the current loading the high-voltage diode and inputting the signal into the servo circuit, and the servo circuit is used for controlling the constant current source, so that the fluctuation range can be controlled within 5%, and the test accuracy can be guaranteed.
Description
Technical field
The present invention relates to a kind of forward overload test device, particularly a kind of constant current source fluctuation range little forward overload test device.
Background technology
In the process of producing diode, need to carry out the forward overload measurement, its recurrence interval property interval by pulse oscillator is carried in constant current source on the high-voltage diode, and its fluctuation range that requires constant current source is below 10%.Because in the high power device, forward voltage drop, power consumption, forward current are large, and heating is violent, and temperature is high, and conventional constant current source can't satisfy its fluctuation range.
Summary of the invention
The technical problem to be solved in the present invention provide a kind of constant current source fluctuation range little forward overload test device.
For solving the problems of the technologies described above, technical scheme of the present invention is: a kind of forward overload test device, comprise AC power, transformer, rectifier, pulse oscillator and constant current source, the output terminal of AC power is connected with the transformer input end, the output terminal of transformer is connected with the rectifier input end, rectifier is inputted out with the pulse oscillator input end and is connected, the pulse oscillator output terminal is connected with constant current source by driving circuit, the output terminal of constant current source is carried on the high-voltage diode, its innovative point is: also comprise a servo circuit and current fluctuation sample circuit, the input end access high-voltage diode of described current fluctuation sample circuit, current fluctuation driving circuit output terminal access constant current source.
The invention has the advantages that: detect the electric current of load high-voltage diode by the current fluctuation sample circuit, with its signal input servo circuit, utilize servo circuit that constant current source is controlled, its fluctuation range is controlled in 5%, guarantee the accuracy of testing.
Description of drawings
Fig. 1 is forward overload test device working envelope figure of the present invention.
Embodiment
As shown in Figure 1, comprise AC power 1, transformer 2, rectifier 3, pulse oscillator 4, constant current source 5, driving circuit 6, high-voltage diode 7, servo circuit 8 and current fluctuation sample circuit 9.
The output terminal of above-mentioned AC power 1 is connected with transformer 2 input ends, the output terminal of transformer 2 is connected with rectifier 3 input ends, rectifier 3 is inputted out with pulse oscillator 4 input ends and is connected, pulse oscillator 4 output terminals are connected with constant current source 5 by driving circuit 6, and the output terminal of constant current source 5 is carried on the high-voltage diode 7.
Also comprise a servo circuit 8 and current fluctuation sample circuit 9, the input end access high-voltage diode 7 of current fluctuation sample circuit 9, current fluctuation driving circuit 9 output terminals access constant current source 5.
Principle of work: alternating current is rectified into direct current through rectifier 3 again by the transformer transformation, sends the recurrence interval interval by pulse oscillator 4, drives constant current sources 5 by driving circuit 6, with voltage-drop loading on high-voltage diode 7; Simultaneously, detected the current fluctuation of high-voltage diode 7 by current fluctuation sample circuit 9, servo circuit 8 is controlled in 5% its fluctuation range according to its signal controlling constant current source 5.
Claims (1)
1. forward overload test device, comprise AC power, transformer, rectifier, pulse oscillator and constant current source, the output terminal of AC power is connected with the transformer input end, the output terminal of transformer is connected with the rectifier input end, rectifier is inputted out with the pulse oscillator input end and is connected, the pulse oscillator output terminal is connected with constant current source by driving circuit, the output terminal of constant current source is carried on the high-voltage diode, it is characterized in that: also comprise a servo circuit and current fluctuation sample circuit, the input end access high-voltage diode of described current fluctuation sample circuit, current fluctuation driving circuit output terminal access constant current source.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210397771.XA CN102866343B (en) | 2012-10-19 | 2012-10-19 | Forward overload test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210397771.XA CN102866343B (en) | 2012-10-19 | 2012-10-19 | Forward overload test device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102866343A true CN102866343A (en) | 2013-01-09 |
| CN102866343B CN102866343B (en) | 2015-06-10 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201210397771.XA Active CN102866343B (en) | 2012-10-19 | 2012-10-19 | Forward overload test device |
Country Status (1)
| Country | Link |
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| CN (1) | CN102866343B (en) |
Citations (7)
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|---|---|---|---|---|
| JPS5568733A (en) * | 1978-11-17 | 1980-05-23 | Matsushita Electric Ind Co Ltd | Program timer with overcurrent control unit |
| US5962846A (en) * | 1997-08-29 | 1999-10-05 | Lucent Technologies Inc. | Redundant linear detection arrays |
| CN201035059Y (en) * | 2007-04-28 | 2008-03-12 | 申瑞山 | High-pressure signal generating device |
| CN101542305A (en) * | 2006-11-22 | 2009-09-23 | 爱德万测试株式会社 | Test device and test module |
| CN201607513U (en) * | 2010-01-15 | 2010-10-13 | 深圳市瑞凌实业股份有限公司 | Simple circuit for testing reverse recovery time of diode |
| CN101881808A (en) * | 2010-06-28 | 2010-11-10 | 陕西科技大学 | Organic electroluminescent diode service life tester |
| CN102185516A (en) * | 2011-05-16 | 2011-09-14 | 南通皋鑫电子股份有限公司 | High-voltage static generator |
-
2012
- 2012-10-19 CN CN201210397771.XA patent/CN102866343B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5568733A (en) * | 1978-11-17 | 1980-05-23 | Matsushita Electric Ind Co Ltd | Program timer with overcurrent control unit |
| US5962846A (en) * | 1997-08-29 | 1999-10-05 | Lucent Technologies Inc. | Redundant linear detection arrays |
| CN101542305A (en) * | 2006-11-22 | 2009-09-23 | 爱德万测试株式会社 | Test device and test module |
| CN201035059Y (en) * | 2007-04-28 | 2008-03-12 | 申瑞山 | High-pressure signal generating device |
| CN201607513U (en) * | 2010-01-15 | 2010-10-13 | 深圳市瑞凌实业股份有限公司 | Simple circuit for testing reverse recovery time of diode |
| CN101881808A (en) * | 2010-06-28 | 2010-11-10 | 陕西科技大学 | Organic electroluminescent diode service life tester |
| CN102185516A (en) * | 2011-05-16 | 2011-09-14 | 南通皋鑫电子股份有限公司 | High-voltage static generator |
Non-Patent Citations (2)
| Title |
|---|
| L.LORENZ（德）: "用于低压和高压器件的IGBT的额定过载特性", 《交流技术与电力牵引》 * |
| 黄运銮等: "高过载下电子元器件测试方法研究", 《弹箭与制导学报》 * |
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| Publication number | Publication date |
|---|---|
| CN102866343B (en) | 2015-06-10 |
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Effective date of registration: 20210831 Address after: 226503 No. 82, Zhongshan West Road, Rucheng street, Rugao City, Nantong City, Jiangsu Province Patentee after: Jiangsu Gaoxin Electronics Co.,Ltd. Address before: 226500 No.82, Zhongshan West Road, Rucheng, Rugao, Nantong, Jiangsu Province Patentee before: NANTONG GAOXIN ELECTRONICS Co.,Ltd. |