CN102866312B - Intelligent card reader-writer power failure test capturing method based on current mutation and reader-writer - Google Patents
Intelligent card reader-writer power failure test capturing method based on current mutation and reader-writer Download PDFInfo
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- CN102866312B CN102866312B CN201210314741.8A CN201210314741A CN102866312B CN 102866312 B CN102866312 B CN 102866312B CN 201210314741 A CN201210314741 A CN 201210314741A CN 102866312 B CN102866312 B CN 102866312B
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Abstract
The invention provides an intelligent card reader-writer power failure test capturing method based on current mutation and reader-writer. The method comprises following steps of firstly setting a designated instruction list to be inputted to the reader-writer, then receiving an operation instruction, comparing the received operation instruction with a designated instruction on the designated instruction list and making judgment, adopting the reader-writer to transmit the operation instruction which is subject to the designated instruction to an intelligent card, simultaneously monitoring the current of the intelligent card after partial bytes of the operation instruction is transmitted, judging whether mutation happens or not and whether the uprush quantity reaches a set value, finally judging the power supply of the intelligent card according to the monitoring and judgment result, and stopping the monitoring to complete the power failure test. The current mutation on the intelligent card VCC (voltage-to-current converter) when the designated instruction is executed can be monitored by the reader-writer, erasing moment of the intelligent card FLASH or EEPROM can be timely, accurately and easily captured within a short time, the power failure test of the intelligent card can be realized, the power failure test speed of the intelligent card can be greatly improved, and the test efficiency is high.
Description
[technical field]
The invention belongs to smart card measuring technology and intelligent card read/write device technical field, relate in particular to a kind of intelligent card read/write device power-off test catching method based on current break.
[background technology]
Current smart card power-off test read write line, it is all the moment of catching the erasable FLASH of smart card or EERPOM by power off periods is set, conventionally need user to pre-estimate the erasable time of FLASH or the EEPROM of tested smart card, and instruction time, then corresponding power-off scope is set, estimated value has certain deviation, the given capture range of user is conventionally larger, cause power-off test very slow, completing power-off test needs a day or two sometimes, efficiency is very low, especially in FLASH or the shorter test of erasable time of EEPROM, it is very difficult capturing erasable moment, very consuming time, make power-off test speed very slow, testing efficiency is extremely low.
[summary of the invention]
In order to solve the above-mentioned technical matters existing in prior art, the invention provides one and catch erasable moment in time, accurately, easily, test speed is fast, efficiency is high intelligent card read/write device power-off test catching method and read write line based on current break.
The present invention solves the technical scheme that prior art problem adopts:
A kind of intelligent card read/write device power-off test catching method based on current break, include and first set designated order table and input to read write line, then receive operational order and contrast with the designated order on designated order table, judgement, then the operational order that belongs to designated order is sent to smart card by read write line, after the partial bytes of transmit operation instruction, start the electric current of smart card to monitor simultaneously, judge whether to uprush and whether the amount of uprushing reaches setting value, finally according to monitoring, judged result is cut off smart card power supply and is stopped monitoring, complete power-off test.
Further, described read write line sends this operational order to smart card, then the operational order that belongs to designated order is sent to smart card by read write line, after the partial bytes of transmit operation instruction, start the electric current of smart card to monitor simultaneously, judge whether to uprush and whether the amount of uprushing reaches setting value, be specially: described read write line first sends a part of byte of this operational order to smart card, then starting current monitoring module is monitored the electric current on the Vcc pin of smart card, then again the remainder byte of this operational order is dealt on smart card, last current monitoring module monitors smart card while carrying out designated order continues the electric current on Vcc pin to monitor, judge whether electric current uprushes and whether the amount of uprushing reaches setting value.
Further, this power-off test catching method, includes following steps:
A. set designated order table and input read write line;
B. read write line resets to the smart card inserting in it;
C. read write line receives the smart card operating instruction sending over from PC;
D. read write line contrasts, judges whether to belong to designated order by the designated order on the operational order receiving and designated order table;
E. read write line first sends to smart card by front 4 bytes of the operational order that belongs to designated order;
F. read write line starting current monitoring module is monitored the Vcc pin of smart card;
G. this operational order remainder bytes is all sent to smart card by read write line;
H. whether read write line uprushes to the monitoring result of current monitoring module and whether the amount of uprushing reaches setting value and judge;
I. read write line cuts off smart card power supply or again accepts operational order according to result of determination;
J. close current monitoring module after read write line cut-out smart card power supply.
Further, the setting value of the electric current amount of uprushing of described smart card is 2mA or 3mA.
A kind of intelligent card read/write device, include smart card read-write control module, also include one and be connected with the Vcc pin of smart card and for monitoring current monitoring module, the instruction monitoring module for the reception of policer operation instruction and the transmission of designated order of its electric current, described current monitoring module is all connected with the conducting of described smart card read-write control module with instruction monitoring module.
Beneficial effect of the present invention is as follows:
The present invention passes through technique scheme, read write line can be monitored the current break (uprushing) on the smart card VCC in the time carrying out designated order, within this extremely short time, catch in time, accurately, easily erasable moment of smart card FLASH or EEPROM, realize the power-off test to smart card, improved widely the power-off test speed to smart card, testing efficiency is very high.
[brief description of the drawings]
Fig. 1 is the schematic flow sheet of the intelligent card read/write device power-off test catching method embodiment based on current break of the present invention;
Fig. 2 is the structural principle schematic block diagram of read write line embodiment of the present invention.
[embodiment]
In order to make object of the present invention, technical scheme and advantage clearer, below in conjunction with drawings and Examples, the present invention is further elaborated.Should be appreciated that specific embodiment described herein, only in order to explain the present invention, is not intended to limit the present invention.
A kind of intelligent card read/write device power-off test catching method based on current break of the present invention, include: first set designated order table and input to read write line, then receive operational order and contrast with the designated order on designated order table, judgement, then the operational order that belongs to designated order is sent to smart card by read write line, after the partial bytes of transmit operation instruction, start the electric current of smart card to monitor simultaneously, judge whether to uprush and whether the amount of uprushing reaches setting value, finally according to monitoring, judged result is cut off smart card power supply and is stopped monitoring, or again accept operational order, complete power-off test.
Wherein, described read write line sends this operational order to smart card, then the operational order that belongs to designated order is sent to smart card by read write line, after the partial bytes of transmit operation instruction, start the electric current of smart card to monitor simultaneously, judge whether to uprush and whether the amount of uprushing reaches setting value, be specifically as follows: described read write line first sends a part of byte of this operational order to smart card, then starting current monitoring module is monitored the electric current on the Vcc pin of smart card, then again the remainder byte of this operational order is dealt on smart card, last current monitoring module monitors smart card while carrying out designated order continues the electric current on Vcc pin to monitor, judge whether electric current uprushes and whether the amount of uprushing reaches setting value.
As shown in fig. 1:
A kind of intelligent card read/write device power-off test catching method based on current break that the invention process row are described, includes following steps:
Steps A. set designated order table and input read write line;
Step B. read write line resets to the smart card inserting in it;
Step C. read write line receives the smart card operating instruction sending over from PC;
Step D. read write line contrasts, judges whether to belong to designated order by the designated order on the operational order receiving and designated order table, in the time being designated order, carry out next step E, in the time being not designated order, return to execution step C after operational order being once sent to smart card;
Step e. read write line first sends to smart card by front 4 bytes of the operational order that belongs to designated order;
Step F. read write line starting current monitoring module is monitored the Vcc pin of smart card;
This operational order remainder bytes is all sent to smart card by step G. read write line;
Whether step H. read write line uprushes to the monitoring result of current monitoring module and whether the amount of uprushing reaches setting value and judge, when monitoring result is to uprush and when the amount of uprushing reaches setting value, carry out next step I, when monitoring result is not do not uprush or when the amount of uprushing does not reach setting value, return and perform step C;
Step I. read write line cuts off smart card power supply or again accepts operational order according to result of determination;
Close current monitoring module after step J. read write line cut-out smart card power supply.
And the setting value of the electric current amount of uprushing of described smart card is 2mA or 3mA, described designated order relates to the instruction of the erasable FLASH of smart card or EEPROM operation, can comprise many erasable instructions.
Like this, by power-off test catching method of the present invention, read write line can be monitored the current break (uprushing) on the smart card VCC in the time carrying out designated order, within this extremely short time, catch in time, accurately, easily erasable moment of smart card FLASH or EEPROM, realize the power-off test to smart card, improved widely the power-off test speed to smart card, testing efficiency is very high.
As shown in Figure 2:
A kind of intelligent card read/write device of the present invention, includes smart card read-write control module 1, current monitoring module 2 and instruction monitoring module 3, and described current monitoring module 2 is all connected with 1 conducting of smart card read-write control module with instruction monitoring module 3, wherein, described smart card read-write control module 1 is a single-chip microcomputer, described current monitoring module 2 mainly by one for current conversion being become to (1 ohm of the resistance of voltage, in figure, do not show) and an ADC module (analog-to-digital conversion module of being located in single-chip microcomputer (smart card read-write control module 1), in figure, do not show) composition, current monitoring module 2 is connected on the Vcc pin of smart card, being mainly used in monitoring intelligent is stuck in and carries out designated order and start charge pump and when erasable logical circuit carries out erasable FLASH or EEPROM, the electric current amount of uprushing (2mA or 3mA) of this Vcc pin, and notify the read-write control module 1 of read write line to cut off the power supply of smart card, to realize power-off test, described instruction monitoring module 3 is mainly used in the reception of policer operation instruction and the transmission of designated order.By increasing current monitoring module 2 and instruction monitoring module 3 in power-off test read write line inside, can monitor the current break on the smart card VCC in the time carrying out designated order, make it catch in time, exactly erasable moment of smart card FLASH or EEPROM, complete power-off test.
Above content is in conjunction with concrete optimal technical scheme further description made for the present invention, can not assert that specific embodiment of the invention is confined to these explanations.For general technical staff of the technical field of the invention, without departing from the inventive concept of the premise, can also make some simple deduction or replace, all should be considered as belonging to protection scope of the present invention.
Claims (4)
1. the intelligent card read/write device power-off test catching method based on current break, it is characterized in that, include: first set designated order table and input to read write line, then receive operational order and contrast with the designated order on designated order table, judgement, then the operational order that belongs to designated order is sent to smart card by read write line, after the partial bytes of transmit operation instruction, start the electric current of smart card to monitor simultaneously, judge whether to uprush and whether the amount of uprushing reaches setting value, finally according to monitoring, judged result is cut off smart card power supply and is stopped monitoring, complete power-off test.
2. the intelligent card read/write device power-off test catching method based on current break according to claim 1, it is characterized in that, the operational order that belongs to designated order is sent to smart card by described then read write line, after the partial bytes of transmit operation instruction, start the electric current of smart card to monitor simultaneously, judge whether to uprush and whether the amount of uprushing reaches setting value, be specially: described read write line first sends a part of byte of this operational order to smart card, then starting current monitoring module is monitored the electric current on the Vcc pin of smart card, then again the remainder byte of this operational order is dealt on smart card, last current monitoring module monitors smart card while carrying out designated order continues the electric current on Vcc pin to monitor, judge whether electric current uprushes and whether the amount of uprushing reaches setting value.
3. the intelligent card read/write device power-off test catching method based on current break according to claim 2, is characterized in that, includes following steps:
A. set designated order table and input read write line;
B. read write line resets to the smart card inserting in it;
C. read write line receives the smart card operating instruction sending over from PC;
D. read write line contrasts, judges whether to belong to designated order by the designated order on the operational order receiving and designated order table;
E. read write line first sends to smart card by front 4 bytes of the operational order that belongs to designated order;
F. read write line starting current monitoring module is monitored the Vcc pin of smart card;
G. this operational order remainder bytes is all sent to smart card by read write line;
H. whether read write line uprushes to the monitoring result of current monitoring module and whether the amount of uprushing reaches setting value and judge;
I. read write line cuts off smart card power supply or again accepts operational order according to result of determination;
J. close current monitoring module after read write line cut-out smart card power supply.
4. according to the intelligent card read/write device power-off test catching method based on current break described in any one in claims 1 to 3, it is characterized in that, the setting value of the electric current amount of uprushing of described smart card is 2mA or 3mA.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201210314741.8A CN102866312B (en) | 2012-08-30 | 2012-08-30 | Intelligent card reader-writer power failure test capturing method based on current mutation and reader-writer |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201210314741.8A CN102866312B (en) | 2012-08-30 | 2012-08-30 | Intelligent card reader-writer power failure test capturing method based on current mutation and reader-writer |
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| CN102866312A CN102866312A (en) | 2013-01-09 |
| CN102866312B true CN102866312B (en) | 2014-08-20 |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN106021088A (en) * | 2015-07-10 | 2016-10-12 | 北京中电华大电子设计有限责任公司 | Method and device for atomicity test on JAVA card |
| CN107179446B (en) * | 2017-05-18 | 2020-03-24 | 珠海艾派克微电子有限公司 | Capacitance detection method and device |
| CN113590393B (en) * | 2021-07-08 | 2024-03-12 | 深圳Tcl新技术有限公司 | Intelligent device testing method and device, electronic device and storage medium |
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| CN1553327A (en) * | 2003-05-30 | 2004-12-08 | 上海华园微电子技术有限公司 | Circuit for testing EEPROM and testing method thereof |
| CN1791258A (en) * | 2005-12-29 | 2006-06-21 | 北京握奇数据系统有限公司 | Smart card testing method |
| CN101587458A (en) * | 2009-06-30 | 2009-11-25 | 北京握奇数据系统有限公司 | Operation method and device for intelligent storing card |
| CN101902513A (en) * | 2010-06-01 | 2010-12-01 | 深圳市中兴移动通信有限公司 | Mobile terminal and method thereof for realizing hot plug of UIM card |
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- 2012-08-30 CN CN201210314741.8A patent/CN102866312B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1553327A (en) * | 2003-05-30 | 2004-12-08 | 上海华园微电子技术有限公司 | Circuit for testing EEPROM and testing method thereof |
| CN1791258A (en) * | 2005-12-29 | 2006-06-21 | 北京握奇数据系统有限公司 | Smart card testing method |
| CN101587458A (en) * | 2009-06-30 | 2009-11-25 | 北京握奇数据系统有限公司 | Operation method and device for intelligent storing card |
| CN101902513A (en) * | 2010-06-01 | 2010-12-01 | 深圳市中兴移动通信有限公司 | Mobile terminal and method thereof for realizing hot plug of UIM card |
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