CN102818943B - Quick measuring probe of dual polarization electric field - Google Patents
Quick measuring probe of dual polarization electric field Download PDFInfo
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- CN102818943B CN102818943B CN201210265078.7A CN201210265078A CN102818943B CN 102818943 B CN102818943 B CN 102818943B CN 201210265078 A CN201210265078 A CN 201210265078A CN 102818943 B CN102818943 B CN 102818943B
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Abstract
The invention relates to a quick measuring probe of a dual polarization electric field, referring to a unit structure taking a resonance rectangular slot structure loaded with PIN diode as probes. PIN switch diodes are loaded on the rectangle slot structure in horizontal and longitudinal directions; the electric field in two polarization directions can be controlled by controlling voltage on the PIN diodes to pass through the slot, therefore, the closing and opening of the slot can be switched. The array probes are arranged between the to-be-measured electric field and a receiving antenna. Each unit on the array is opened one-by-one by electric control method so as to achieve quick measurement of the plane electric field. The quick measuring probe has the advantages of achieving dual polarization quick measurement of the electric field, achieving real-time measurement of the electric field when the array is enough, and deducing far field distribution and electric field distribution of any plane by measured distribution information of the electric field.
Description
Technical field
The invention belongs to Electromagnetic Field and Microwave Technology field, relate to a kind of antenna electric field measurement technology, specifically, be a kind of probe of the dual polarization Quick Measurement that can realize electric field, can carry out real-time Dual-polarized electricity field measurement in certain electric field plane for the electromagnetic wave of certain characteristic frequency.
Background technology
Traditional antenna near-field measuring system expends a large amount of time while doing mechanical scanning with single probe, and the speed of antenna measurement becomes the factor of the development that has restricted antenna subject.
Utilize the electric field multichannel measurement of modulation scattering technology on can implementation space, can also improve measuring accuracy.But traditional modulation scattering technology uses the dipole antenna that loads diode as the probe of antenna measurement, the frequency of operation of this probe is lower, if make two-dimensional array pattern as unit taking the dipole antenna that loads diode, the mutual coupling meeting between unit dipole reduces the sensitivity of system.Have at present a kind of two-dimensional array probe using oval resonant slot antenna as unit, by the switch of the automatically controlled each element antenna of mode control, this probe can be measured the electric field of certain plane very rapidly.But this Electric Field Distribution that can only measure a kind of polarised direction using oval resonant slot antenna as the two-dimensional array probe of unit.
Summary of the invention
The problem existing in order to solve prior art, the present invention proposes a kind of dual polarization electric field rapid measuring probe, adopt the two-dimensional array probe of a kind of rectangle resonant slot as unit, realize the dual-polarized Quick Measurement of electric field, obtain enough electric field informations, thereby by the Electric Field Distribution of Electric Field Distribution information inference far-field distribution and arbitrary plane.
Dual polarization electric field rapid measuring probe of the present invention, comprises substrate, planar conductor plate, and planar conductor plate is fixed on substrate; On planar conductor plate, be designed with horizontal stroke, the vertical two-dimensional array resonance rectangular aperture array that is respectively m, n resonant slot cell formation, m >=2, n >=2.
The concrete structure of described resonant slot unit is: form square gap in the cutting of planar conductor plate surface, on substrate in square gap, paste and be fixed with foursquare paster, square paster is concentric with square gap, and four sides are parallel with four sides in square gap respectively.Between square gap and square paster, be connected with four PIN diode, four PIN diode one end are connected with the central point of four sides of rectangular aperture respectively, and the other end is connected with the central point of four sides of paster respectively; After connecting, four PIN diode need to ensure: wherein two PIN diode are positioned on the axis of pitch of paster, and positive and negative terminal in the same way; Another two PIN diode are positioned on the longitudinal axis of paster, and positive and negative terminal in the same way; The anode of two PIN diode and the side in square gap in four PIN diode is connected simultaneously, now, two adjacent PIN diode and welding one end, square gap must be anode, and another two adjacent PIN diode and welding one end, square gap must be negative terminal.Make thus resonant slot unit have laterally and longitudinal two polarised directions.
On conductor plate, also cutting forms two cut-off rules, and two cut-off rules are all parallel with paster axis of pitch or longitudinal axis, and dual-side relative to square gap is crossing respectively, and are communicated with square gap.When two cut-off rules parallel with paster axis of pitch, and when being positioned at two PIN diode on paster axis of pitch and square slot sides welding one end and being respectively anode or negative terminal, two cut-off rules lay respectively at downside and the upside of axis of pitch, and respectively near two PIN diode and square slot sides weld.In like manner, when two cut-off rules parallel with paster longitudinal axis, and when being positioned at two PIN diode on paster longitudinal axis and square slot sides welding one end and being respectively anode or negative terminal, two cut-off rules lay respectively at right side and the left side of longitudinal axis, and respectively near two PIN diode and square slot sides weld.
Between the planar conductor plate of two cut-off rule both sides, being in series with direct supply DC and resistance R by feed line, is that two groups of diodes load positive voltage by direct supply DC; The resistance of resistance R is not less than 10 megaohms, is used for preventing that the induction current producing in the time of resonant slot cell operation from flowing away along feed line.
The resonant slot unit center point conllinear of each said structure on planar conductor plate laterally and longitudinally, and two polarised directions of each resonant slot unit are identical, formed thus dual polarization electric field rapid measuring probe of the present invention.Dual polarization electric field rapid measuring probe of the present invention is arranged between electric field to be measured and receiving antenna, make planar conductor plate towards electric field to be measured, by automatically controlled mode, the each resonant slot unit on array is successively opened by order thus, receive the electric field signal at each resonant slot unit place by receiving antenna, just can obtain the electric field information at each resonant slot unit place on planar conductor plate.
The invention has the advantages that:
1, dual polarization electric field rapid measuring probe of the present invention, can realize the dual polarization Quick Measurement of electric field, can realize the real-time measurement of electric field when array is enough large, thereby by the Electric Field Distribution of Electric Field Distribution information inference far-field distribution and arbitrary plane;
2, dual polarization electric field rapid measuring probe of the present invention is simple in structure, is easy to processing, and cost is lower, is convenient to realize.
Brief description of the drawings
Fig. 1 is dual polarization electric field rapid measuring probe one-piece construction schematic diagram of the present invention;
Fig. 2 is resonant slot cellular construction schematic diagram in dual polarization electric field rapid measuring probe of the present invention;
Fig. 3 carries out electric field measurement schematic diagram for applying dual polarization electric field rapid measuring probe of the present invention
Fig. 4 is the frequency response simulation result figure of the scattering parameter of application dual polarization electric field rapid measuring probe individual unit of the present invention.
In figure:
1-substrate 2-conductor plate 3-resonant slot unit
Embodiment
Below in conjunction with accompanying drawing, the present invention is further illustrated.
Dual polarization electric field rapid measuring probe of the present invention, as shown in Figure 1, comprises substrate 1 and is fixed on the planar conductor plate 2 on substrate 1 leading flank; Substrate 1 adopts FR-4 copper clad plate, i.e. glass-epoxy copper-clad plate, and relative dielectric constant is 4.9, and thickness is about 0.5mm, and deposited copper thickness is about 0.035mm.On planar conductor plate 2, be designed with horizontal stroke, vertical be respectively the two-dimensional array resonance rectangular aperture array that m, n resonant slot unit 3 forms, m >=2, n >=2, as shown in Figure 1.
The concrete structure of described resonant slot unit 3 is: the square gap that adopts corrosion cutting mode to form on planar conductor plate 2 surfaces, make four, square gap side be respectively a, b, c, d, wherein, limit a, c are respectively upper and lower side, limit b, d are respectively left and right side, on substrate 1 in square gap, paste and be fixed with foursquare paster, paster is concentric with square gap, and the material of paster is all identical with planar conductor plate 2 with thickness; Make four sides of paster be respectively a ', b ', c ', d ', parallel with four, square gap side a, b, c, d respectively.
Between square gap and paster, be connected with four PIN diode, make four PIN diode be respectively the first PIN diode, the second PIN diode, the 3rd PIN diode, the 4th PIN diode.Wherein, the first PIN diode and the 3rd PIN diode are positioned on center patch longitudinal axis, anode, the negative terminal of the first PIN diode are located with limit a, the welding of a ' center, limit respectively, and anode, the negative terminal of the 3rd PIN diode are located with the central point welding of limit c ', limit c respectively; The 3rd PIN diode and the 4th PIN diode are positioned on center patch axis of pitch, and the anode of the 3rd PIN diode, negative terminal are located with the central point welding of limit b, limit b ' respectively; Anode, the negative terminal of the 4th PIN diode are located with the central point welding of limit d ', limit d respectively.By the connected mode of above-mentioned four PIN diode, make resonant slot unit 3 laterally under suitable frequency, all can pass through resonant slot unit 3 with the electric field of longitudinal two polarised directions thus, realize Dual-polarized electricity field measurement.In the present invention, PIN diode can be selected the microwave switching diode of model WK0004, can realize thus transmission and reflection to microwave power.
In order to give four PIN diode on-load voltages, need to cut apart periphery, square gap, therefore the present invention adopts two cut-off rules that corrosion cutting mode forms on the planar conductor plate 2 of periphery, square gap, article two, cut-off rule is parallel with the axis of pitch of paster, and respectively crossing with limit b, the d in square gap and with square gap internal communication.Wherein, the cut-off rule being communicated with limit b is positioned at paster axis of pitch below; The cut-off rule being communicated with limit d is positioned at paster axis of pitch top.The width of cut-off rule and position all can exert an influence to the resonance frequency of resonant slot unit 3, therefore cut-off rule width should be thin as much as possible, and cut-off rule should be tried one's best near rectangular aperture center, therefore the present invention is can be 0.127mm by the width design of cut-off rule in practical range, and the cut-off rule being communicated with limit b, near the weld of the 3rd PIN diode and limit b, engages with the weld of limit b; The cut-off rule being communicated with limit d, near the weld of the 4th PIN diode and limit d, engages with the weld of limit d, reduces as much as possible thus the impact of cut-off rule on resonance frequency.
2 of the planar conductor plates two cut-off rule both sides are in series with direct supply DC and resistance R by feed line, are that two groups of diodes load positive voltage by direct supply DC; The resistance of resistance R is not less than 10 megaohms, and the induction current producing while being used for preventing from working in resonant slot unit 3 flows away along feed line.。For the direct supply DC and the resistance R that make feed line and series connection do not affect power plant by resonant slot unit 3, therefore, in the present invention, by after feed line series direct current power supply DC and resistance R, feed line two ends are penetrated with planar conductor plate 2 and are connected by substrate 1 trailing flank.
In the time carrying out electric field measurement, the resonance frequency of each resonant slot unit 3 in the time that four PIN diode do not load positive voltage all equates with electric field resonance frequency to be measured, make electric field to be measured can pass through in a large number resonant slot unit 3, therefore can adjust the resonance frequency of each resonant slot unit 3 by following manner, it is equated with the resonance frequency of electric field to be measured:
The resonance frequency of I, resonant slot unit 3 is the functions about square gap length, reduces thus or increase the length of side in square gap, can make the resonance frequency of resonant slot unit 3 improve or reduce;
The resonance frequency of II, resonant slot unit 3 is also relevant with square gap spacing with paster, by reducing or increasing, can make the resonance frequency of resonant element improve or reduce.
The resonant slot unit 3 central point conllinear of each said structure on planar conductor plate 2 laterally and longitudinally, and two polarised directions of each resonant slot unit 3 are identical; And because electric field can produce induction current around to each resonant slot unit 3, therefore when the distance of adjacent two resonant slot unit 3 is too near, can produce mutual coupling, cause measuring accuracy to reduce, therefore in the present invention, adjacent two resonant slot unit 3 central point spacing are the length of a wavelength, can reduce thus the mutual coupling between adjacent cells, improve measuring accuracy.
Dual polarization electric field rapid measuring probe of the present invention is arranged between electric field to be measured and receiving antenna, makes planar conductor plate 2 towards electric field to be measured, can carry out thus the electric field measurement at electric field each 3 places, resonant slot unit on planar conductor plate 2, as shown in Figure 3.In the time carrying out electric field measurement, be at first that four PIN diode in each resonant slot unit 3 all load positive voltage by the direct supply DC in each resonant slot unit 3, the resonance frequency of each resonant slot unit 3 is offset, make thus all resonant slots unit 3 all in closed condition, now electric field cannot pass through each resonant slot structure, thereby receiving antenna does not receive any electric field signal.In the time that the direct supply DC in one of them resonant slot unit 3 stops being four PIN diode loading positive voltages, the resonance frequency of this resonant slot unit 3 equates with electric field resonance frequency to be measured, now this resonant slot unit 3 is in opening, other resonant slot unit 3 is still in closed condition, thereby electric field can be passed through by the resonant slot unit 3 in opening, received antenna reception obtains the electric field information at 3 places, resonant slot unit in opening.
By automatically controlled mode, the each resonant slot unit 3 on array is successively opened by order thus, received the electric field signal at each 3 places, resonant slot unit by receiving antenna, just can obtain the electric field information at 3 places, each resonant slot unit on planar conductor plate 2.Because the corresponding time of PIN diode is nanosecond, therefore can within the quite short time, complete by the process of the voltage status of diode in the automatically controlled each slot element of mode control, the electric field information that so just can obtain each 3 places, resonant slot unit in instantaneous time, improves the speed of electric field measurement greatly.
Adopt the dual polarization near field rapid measuring probe of the present invention's design to carry out near field detection, setting electric field to be measured is 8GHz, the rectangular aperture length of side is designed to 5.25mm, the length of side of paster is designed to 2.35mm, make in rectangular aperture structure resonance frequency when four PIN diode do not load positive voltage equate with the resonance frequency of electric field to be measured, simulation result as shown in Figure 4, in figure, cross curve " ++ " and solid line "-" are respectively in resonant slot unit 3 S11(reflection coefficient when four PIN diode do not load positive voltage) with S21 (transmission coefficient) curve, in the time that the resonance frequency of resonant slot unit 3 is 8GHz, S11 is less, S12 is higher, hence one can see that, and electric field passes through from resonant slot unit 3, now resonant slot unit 3 is opening.And dotted line "---" and dot-and-dash line "---" and be respectively in two resonant slot unit 3 S11 and the S21 curve of four PIN diode while loading positive voltage, in the time that the resonance frequency of resonant slot unit 3 is 8GHz, S11 is higher, S21 is lower, hence one can see that, and electric field does not pass through from resonant slot unit 3, but reflect at 3 places, resonant slot unit, now resonant slot unit 3 is closed condition.Can find out that thus whether this resonant slot unit 3 of dual polarization electric field rapid measuring probe of the present invention loads by the positive voltage of PIN diode, whether can control electric field by this resonant slot unit 3, electric field to be measured is modulated.
Claims (9)
1. a dual polarization electric field rapid measuring probe, comprises substrate, planar conductor plate, and planar conductor plate is fixed on substrate leading flank; It is characterized in that: on planar conductor plate, be designed with horizontal stroke, the vertical two-dimensional array resonance rectangular aperture array that is respectively m, n resonant slot cell formation, m >=2, n >=2;
The concrete structure of described resonant slot unit is: form square gap in the cutting of planar conductor plate surface, on substrate in square gap, paste and be fixed with foursquare paster, square paster is concentric with square gap, and four sides are parallel with four sides in square gap respectively; Between square gap and square paster, be connected with four PIN diode, four PIN diode one end are connected with the central point of four sides of rectangular aperture respectively, and the other end is connected with the central point of four sides of paster respectively; After four PIN diode connect, wherein two PIN diode are positioned on the axis of pitch of paster, positive and negative terminal in the same way; Another two PIN diode are positioned on the longitudinal axis of paster, and positive and negative terminal in the same way; The anode of two PIN diode in four PIN diode need be connected with the side in square gap simultaneously; Make thus resonant slot unit have laterally and longitudinal two polarised directions;
On conductor plate, also cutting forms two cut-off rules, and two cut-off rules are all parallel with paster axis of pitch or longitudinal axis, and dual-side relative to square gap is crossing respectively, and are communicated with square gap; When two cut-off rules parallel with paster axis of pitch, and when being positioned at two PIN diode on paster axis of pitch and square slot sides welding one end and being respectively anode or negative terminal, two cut-off rules lay respectively at downside and the upside of axis of pitch, and respectively near two PIN diode and square slot sides junction; When two cut-off rules parallel with paster longitudinal axis, and when being positioned at two PIN diode on paster longitudinal axis and square slot sides welding one end and being respectively anode or negative terminal, two cut-off rules lay respectively at right side and the left side of longitudinal axis, and respectively near two PIN diode and side junction, square gap;
Between the planar conductor plate of two cut-off rule both sides, being in series with direct supply DC and resistance R by feed line, is that four PIN diode load positive voltage by direct supply DC; Resistance R is used for preventing that the induction current producing in the time of resonant slot cell operation from flowing away along feed line.
2. a kind of dual polarization electric field rapid measuring probe as claimed in claim 1, is characterized in that: described square gap and cut-off rule adopt the method for corrosion cutting to form on planar conductor plate.
3. a kind of dual polarization electric field rapid measuring probe as claimed in claim 1, is characterized in that: the resistance of described resistance R is not less than 10 megaohms.
4. a kind of dual polarization electric field rapid measuring probe as claimed in claim 1, is characterized in that: described substrate adopts glass-epoxy copper-clad plate, and relative dielectric constant is 4.9, and thickness is about 0.5mm, and deposited copper thickness is about 0.035mm.
5. a kind of dual polarization electric field rapid measuring probe as claimed in claim 1, is characterized in that: described PIN diode is microwave switching diode, model is WK0004.
6. a kind of dual polarization electric field rapid measuring probe as claimed in claim 1, is characterized in that: the width of described cut-off rule is 0.127mm.
7. a kind of dual polarization electric field rapid measuring probe as claimed in claim 1, is characterized in that: described planar conductor plate is laterally with longitudinally to go up each resonant slot Element Polarization direction identical, and central point conllinear.
8. a kind of dual polarization electric field rapid measuring probe as claimed in claim 7, is characterized in that: adjacent two resonant slot unit center dot spacings are the length of a wavelength.
9. a kind of dual polarization electric field rapid measuring probe as claimed in claim 7, is characterized in that: after described feed line series direct current power supply DC and resistance R, feed line two ends are penetrated with planar conductor plate and are connected by substrate trailing flank.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201210265078.7A CN102818943B (en) | 2012-07-27 | 2012-07-27 | Quick measuring probe of dual polarization electric field |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201210265078.7A CN102818943B (en) | 2012-07-27 | 2012-07-27 | Quick measuring probe of dual polarization electric field |
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| CN102818943A CN102818943A (en) | 2012-12-12 |
| CN102818943B true CN102818943B (en) | 2014-07-30 |
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| CN105490034B (en) * | 2016-02-23 | 2019-05-03 | 深圳承泰科技有限公司 | A kind of antenna system applied to radar 3D scanning |
| CN108493603B (en) * | 2018-04-24 | 2023-10-13 | 南京信息工程大学 | Electromagnetic wave polarization reconfigurable antenna housing |
| US10659175B2 (en) * | 2018-07-16 | 2020-05-19 | Litepoint Corporation | System and method for over-the-air (OTA) testing to detect faulty elements in an active array antenna of an extremely high frequency (EHF) wireless communication device |
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| US5227715A (en) * | 1990-06-11 | 1993-07-13 | Kabushiki Kaisha Toyota Chuo Kenkyusho | Apparatus for measuring electromagnetic field intensity using dual polarized light beams |
| CN1825678A (en) * | 2006-03-21 | 2006-08-30 | 东南大学 | Frequency selecting surface based on substrate integrated waveguide technology |
| CN1937308A (en) * | 2006-10-17 | 2007-03-28 | 东南大学 | Bi-pass band frequency selective surface |
| CN101411026A (en) * | 2006-04-03 | 2009-04-15 | 株式会社王牌天线 | Dual polarization broadband antenna having with single pattern |
| CN101764283A (en) * | 2008-12-23 | 2010-06-30 | 泰勒斯公司 | Planar radiating element with dual polarisation and network antenna comprising such a radiating element |
-
2012
- 2012-07-27 CN CN201210265078.7A patent/CN102818943B/en not_active Expired - Fee Related
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5227715A (en) * | 1990-06-11 | 1993-07-13 | Kabushiki Kaisha Toyota Chuo Kenkyusho | Apparatus for measuring electromagnetic field intensity using dual polarized light beams |
| CN1825678A (en) * | 2006-03-21 | 2006-08-30 | 东南大学 | Frequency selecting surface based on substrate integrated waveguide technology |
| CN101411026A (en) * | 2006-04-03 | 2009-04-15 | 株式会社王牌天线 | Dual polarization broadband antenna having with single pattern |
| CN1937308A (en) * | 2006-10-17 | 2007-03-28 | 东南大学 | Bi-pass band frequency selective surface |
| CN101764283A (en) * | 2008-12-23 | 2010-06-30 | 泰勒斯公司 | Planar radiating element with dual polarisation and network antenna comprising such a radiating element |
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