CN102785029A - Laser anti-counterfeit marking method for product with complex profile - Google Patents
Laser anti-counterfeit marking method for product with complex profile Download PDFInfo
- Publication number
- CN102785029A CN102785029A CN2012102875526A CN201210287552A CN102785029A CN 102785029 A CN102785029 A CN 102785029A CN 2012102875526 A CN2012102875526 A CN 2012102875526A CN 201210287552 A CN201210287552 A CN 201210287552A CN 102785029 A CN102785029 A CN 102785029A
- Authority
- CN
- China
- Prior art keywords
- laser
- complex
- short line
- product
- fake mark
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title claims abstract description 51
- 238000012545 processing Methods 0.000 claims description 25
- 238000004519 manufacturing process Methods 0.000 claims description 13
- 238000013461 design Methods 0.000 claims description 12
- 239000011521 glass Substances 0.000 claims description 3
- 238000009434 installation Methods 0.000 claims description 3
- 230000008569 process Effects 0.000 abstract description 18
- 230000000694 effects Effects 0.000 abstract description 11
- 238000003754 machining Methods 0.000 abstract 2
- 238000005516 engineering process Methods 0.000 description 34
- 230000004888 barrier function Effects 0.000 description 10
- 239000000463 material Substances 0.000 description 10
- 238000005194 fractionation Methods 0.000 description 5
- 238000010330 laser marking Methods 0.000 description 4
- 230000001788 irregular Effects 0.000 description 3
- 229910001220 stainless steel Inorganic materials 0.000 description 3
- 239000010935 stainless steel Substances 0.000 description 3
- 230000009471 action Effects 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000005034 decoration Methods 0.000 description 2
- 230000007812 deficiency Effects 0.000 description 2
- 230000006872 improvement Effects 0.000 description 2
- 238000001459 lithography Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000007639 printing Methods 0.000 description 2
- 230000001105 regulatory effect Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000013499 data model Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000004069 differentiation Effects 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 238000001093 holography Methods 0.000 description 1
- 238000010329 laser etching Methods 0.000 description 1
- 239000003550 marker Substances 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 230000006855 networking Effects 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 238000012856 packing Methods 0.000 description 1
- 238000013139 quantization Methods 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Landscapes
- Laser Beam Processing (AREA)
Abstract
The invention relates to a laser anti-counterfeit marking method for a product with a complex profile. An anti-counterfeit mark pattern is designed in a specific anti-counterfeit zone, a vector pattern of an anti-counterfeit mark is split and a process reference point is selected by a specific splitting algorithm, short segments are scanned and machined according to specific process parameters, and finally the anti-counterfeit mark pattern can be marked on the surface of the product with the complex profile. Since position information, splitting information and machining process parameter information are carried in the anti-counterfeit mark pattern, counterfeiters need to obtain the accurate curved surface model of the complete profile, the accurate contour and position of the anti-counterfeit marking zone, the specific algorithm for splitting of the vector pattern of the anti-counterfeit mark, the specific algorithm for selection of the process reference point, laser process parameters of the short segments and the like for counterfeiting in addition to a laser machining device, all the information is key to counterfeiting, and thus technical difficulties in counterfeiting are improved. Therefore, the laser anti-counterfeit marking method has good anti-counterfeiting effects.
Description
Technical field
The invention belongs to the Laser Processing application, particularly a kind of laser anti-counterfeit marking method of complex profile product.
Background technology
Anti-counterfeiting technology is meant the measure of taking in order to reach false proof purpose, and it can accurately be discerned the false from the genuine within the specific limits, is product is difficult for by technology imitated and that duplicate.The anti-counterfeiting technology kind is a lot, mainly contains digital false-proof technology, bar codes technique, planar bar code technology, antiforge laser holographic technology, latent image anti-counterfeiting technology, security version line technology, micro anti-counterfeiting technology, refractive power latent-image anti-counterfeiting technology, decryption technology and RF identification anti-counterfeiting technology etc. by stages.Especially the antiforge laser holographic technical application very extensively; Its false proof principle mainly is based on the necessary former figure information of production source holographic product, equipment and technology and is difficult to obtain; The trade mark of holographic product and printing appears to have very big difference; And the instrument that adulterator's tradition is used to forge (camera and printing machine) is to not effect of holography, thereby hologram pattern is difficult to be replicated.The anti-counterfeiting mark that present various antiforge laser holographic technology is used basically all is arranged in the external packing of product, with product itself be independently, and anti-counterfeiting mark just no longer includes use value after the true and false is differentiated.Therefore, development product self anti-counterfeiting technology has very important practical applications value.
Generally speaking, contoured surface is that the machine-building product of curved surface mainly contains two types: one type is the ruled surface of only being made up of elementary analytic surface such as plane, the face of cylinder, taper seat, sphere, anchor ring etc.; Another kind of is curved surface irregular, non-rotating type, can not combine by elementary analytic surface, but with fitting surfaces such as NURBS form complex-curved, corresponding product can be described as complex profile product.Owing to have fine artistic impression and product differentiation characteristic, meet the increasingly high esthetic sentiment of consumer, the modern high end brand product has adopted the complex profile design means more and more.
Laser index carving is the common name of laser marking, engraving; Be to utilize laser beam to make permanent mark at various material surface; Its process principle is through being exposed the deep layer material by the evaporation of marking material surface material; Or through luminous energy cause the Chemical Physics of entry material to change and " quarter " go out vestige, or burn the part material through luminous energy, show figure, the literal of required marking.Current, the general laser index carving processed and applied that adopts so-called " 3+2 axle " technical scheme realization large format, wherein, 3 is XYZ rectangular coordinate system motion, 2 deflection scanning axles that refer to the laser galvanometer." 3+2 axle " Laser mark technology scheme treats that with large format marked area is divided into the plurality of sub piece according to the laser galvanometer scanning scope; The marking figure of treating in each sub-piece is machined by laser galvanometer scanning; Drive the laser galvanometer by XYZ three-axis moving mechanism and navigate to each sub-piece center; Start this sub-piece of laser galvanometer scanning processing then, machine until all sub-pieces.The laser galvanometer system generally comprises two laser plane speculums and scanning focused lens; Its operation principle is through expanding bundle with the laser of from laser resonant cavity, deriving; Through vertical install, by the reflection of the foldback mirror (being called X, Y axle laser plane speculum respectively) of driven by servomotor, focus on the back output action on object to be processed by scanning focused lens (F-theta object lens or telecentric lens).The rotation of X, Y axle laser plane speculum is moved the laser focal beam spot on the working face respectively on X, Y axle; Two minute surface co-operatings make the laser focal beam spot can on working face, accomplish moving of straightway and various curves; Facula position on beam incident angle and the image planes satisfies linear relationship, thereby controls the position of hot spot on image planes through the scan angle of control incident beam.Complex profile product is processed; Mainly contain following two kinds of solutions: the one, the patent No. is 201010115968.0, denomination of invention is the Chinese patent of " method for projection-type laser etching on a kind of free form surface "; It is based on the system of processing of three axis numerically controlled machine+two a deflection galvanometer; Employing is divided sub-piece to the complex-curved parts of discrete point cloud model description; Graphics processing is carried out parallel projection and by sub-piece fractionation, utilized each sub-piece Working position of three axis numerically controlled machine location, and each sub-piece adopts laser galvanometer scanning to machine.This method has been utilized the Laser Processing characteristics that processing characteristics such as light spot shape size, Energy distribution remain unchanged in the focus lamp focal depth range; Add man-hour at piecemeal; The main high-velocity scanning that relies on the high speed rotary motion drive laser beam of two level crossings in the galvanometer realizes accurate etching processing.But should invention adopt laser galvanometer projection processing mode, exist the limitation that there is the processing dead angle in the whole projection of single coordinate system and relies on the discrete point cloud data model fully based on " 3+2 axle " form.The 2nd, application number is 201110048935.3, denomination of invention is the Chinese patent of " a kind of complex-curved laser processing and device of being applicable to "; Then through adopting complex-curved division patch and setting up the treatment step and the 5-shaft linkage numerical control lathe of each patch coordinate system; Adopt " 3+2 axle " form laser galvanometer projection process technology before efficiently solving in a kind of scheme; Owing to have only a fixing ray cast direction, can only adopt single coordinate system to carry out the limitation of whole projection.
The Laser mark technology effect mainly is that delineation is very meticulous, to the wide adaptability of material, can produce very fine mark on the surface of multiple material, and durability is very good simultaneously; The mark that adopts Laser mark technology to make is copied and change all is difficult to, and has good anti-fake effect to a certain extent.Traditional laser anti-counterfeit marking often need be adopted expensive laser marking device; And the counterfeiter is unwilling to invest expensive equipment in order to gain high profits; So the mark of fake products generally can not have vestige clearly as laser index carving, therefore traditional laser anti-counterfeit marking can realize antiforge function to a certain extent.But, if the expensive laser marking device of the genuine acquisition price of counterfeiter comes the marking product, laser index carving vestige clearly also can appear on the fake products, make hard to tell whether it is true or falsely, and regular product can not get effective false proof protection.For this reason; It is technological that people such as Qin Yingxiong, Zheng Qiguang (research of anti-fake index carving system, " laser journal, 2002 the 23rd the 3rd phases of volume) has proposed a kind of laser anti-counterfeit marking of combining with the information network anti-counterfeiting technology; Promptly produce specific anti-counterfeiting information through certain vector marking data; And with the marking of marking data on product, utilize database technology, computer networking technology that marking data and anti-counterfeiting information are kept on the database server simultaneously, supply the client to differentiate through network.But; The combination of this information network anti-counterfeiting technology and laser vector marking technology; Still have two deficiencies: 1) this technology is just on the basis of original laser anti-counterfeit marking method; Added anti-counterfeiting characteristic pattern and these two kinds of anti-counterfeiting information enhancements of follow-up network anti-counterfeit discriminating of producing at random simply, laser anti-counterfeit marking technology itself has not been had improvement, as long as obvious counterfeiter has obtained the algorithm of generation at random of anti-counterfeiting characteristic pattern or anti-counterfeiting characteristic pattern; Still can carve positive board marker at the fake products subscript through purchasing laser marking device, make false proof inefficacy; What 2) this technology adopted is the two-dimensional vector laser index carving system, can't on complex profile product, use laser anti-counterfeit marking means.
Summary of the invention
The present invention is directed to the deficiency of above-mentioned existing antiforge laser holographic and two-dimensional laser anti-counterfeiting label lithography; A kind of laser anti-counterfeit marking method of complex profile product is provided; The anti-fake mark that adopts this laser anti-counterfeit marking method marking to come out has product self anti-counterfeiting and multiple anti-fake barrier; Imitation difficulty is high, has concurrently false proof and multi-functionals such as artistic decoration, brand recognition.
The present invention realizes through following technical scheme:
A kind of laser anti-counterfeit marking method of complex profile product is characterized in that, may further comprise the steps:
(1) sets up the surperficial complex-curved threedimensional model of complex profile product;
(2) optional position on complex-curved threedimensional model selects a zone as false proof zone, and the false proof zone of the shape in false proof zone and size requirements can fall in the sweep limits of laser galvanometer system to be used fully;
(3) in false proof zone, selecting any as initial point arbitrarily, is Z-direction with complex-curved normal direction at initial point, sets up complex-curved XYZ rectangular coordinate system;
(4) anti-fake mark figure of design in false proof zone carries out match with the anti-fake mark figure with straightway, obtains the anti-fake mark vector graphics;
(5) the anti-fake mark vector graphics is split into some short line segments, the Z coordinate difference of two end points of every short line segment is all less than 5 times of the laser beam depth of focus value of laser galvanometer system to be used output;
(6) the relative installation position of adjusting laser galvanometer system and complex profile product to be processed; Make the normal direction of its scanning focused lens minute surface center parallel, make the false proof zone of complex profile product be positioned at the sweep limits of laser galvanometer system fully with Z-direction;
(7) select a unprocessed short line segment, on this short line segment, select a bit arbitrarily, regulate scanning focused lens, make the technological datum point and the difference of the Z coordinate of scanning focused lens minute surface center equal the focal length of scanning focused lens as the technological datum point;
(8) according to the technological parameter of design in advance, the laser beam that laser instrument is launched is through light-conducting system and laser galvanometer system, is scanned up to the another one end points from an end points of short line segment, accomplishes the processing of this short line segment;
(9) according to the step of (7)-(8), travel through all short line segments, machine until all short line segments;
(10) through differentiating the marking quality of anti-fake mark figure on the complex profile product, judge the true and false of product.
Further, the method for the true and false of the judgement product described in the step (10) comprises:
(10.1) preliminary contrast; Through the line edge quality and the surface smoothness of laser index carving vestige on the identification anti-fake mark figure, the text description or the certified products picture that provide with legal production firm compare, and find inconsistently can think fakement;
(10.2) depth correlation; Observe or the digital camera microspur is taken pictures and amplified identification and measure through magnifying glass; Live width and line length with the ad-hoc location in the anti-fake mark figure; The text description or the certified products picture that provide with legal production firm compare, and find inconsistently can think fakement.
The beneficial effect of the laser anti-counterfeit marking method of complex profile product of the present invention is:
One, with existing antiforge laser holographic, bar code is false proof or coating scrapes that inquiry is false proof etc. to place the method on the product external packaging to compare anti-fake mark off; The laser anti-counterfeit marking method of complex profile product of the present invention is produced on anti-fake mark on the surface of product own, has the effect of product self anti-counterfeiting.
Two, compare with the existing two-dimensional laser anti-counterfeiting label lithography that adopts random anti-counterfeit characteristic pattern and follow-up network anti-counterfeit to differentiate; The present invention is through being provided with the multiple anti-fake barrier; Realized the independence of anti-counterfeiting information and anti-fake mark Graphics Design; Thereby need not differentiate that the anti-fake mark figure can design arbitrarily by the follow-up network anti-counterfeit, have concurrently false proof and multi-functionals such as artistic decoration, brand recognition.
Three, compare with the laser index carving process of existing complex-curved (free form surface); The present invention is having important improvement aspect procedure of processing and the equipment needed thereby; It at first is practical application situation according to anti-fake mark; (sweep limits of laser galvanometer system can reach 250mm * 250mm at present in the sweep limits of laser galvanometer system to be used to limit size and the shape in false proof zone; Can satisfy false proof demand fully), in process, only adopted laser galvanometer system and supporting with it Z direction adjustment movement axle, the existing relatively method necessary three or the system of processing scheme of 5-shaft linkage numerical control lathe+two a deflection galvanometer are simplified greatly; Next is to have saved in the processing technology planning step complex-curved molecule piece, the figure of carrying out split, calculates steps such as sub-piece processing focal length by sub-piece; The short line segment of adopt simplifying split, select arbitrarily technological datum point method (with average among the patent CN201110048935.3 " a kind of complex-curved laser processing and device of being applicable to " different; Value mode has strengthened confidentiality arbitrarily); Therefore, the amount of calculation of processing technology planning is little, and work flow is simple; The flexibility of working process parameter control is big, is more suitable for the requirement of anti-counterfeiting technology.
Four, with existing two dimensional surface laser anti-counterfeit marking compared with techniques, the present invention has realized the false proof of complex profile product, has the high characteristics of multiple anti-fake barrier and imitation difficulty;
The false proof barrier in first road is that barrier is selected in false proof zone; The present invention selects a zone as false proof zone arbitrarily on complex-curved threedimensional model, and in false proof zone, designs an anti-fake mark figure; This anti-fake mark figure also is a complex-curved figure, and it can be brand identity or decorative pattern of product etc.Owing to complex-curvedly have non-rotating and irregular characteristic, so the anti-fake mark figure only is that curve form with false proof location fits like a glove; Any relativity shift in anti-fake mark figure and false proof zone all possibly make the anti-fake mark figure deformation, thereby is differentiated out by the consumer.And the particular location in false proof zone confirms also have only legal production firm to know by legal production firm, and this position can only be inferred through indirect means such as measurements by personation manufacturer.Because complex-curved complexity itself, personation manufacturer will accomplish that the anti-fake mark position is accurate, the anti-fake mark figure clear indeformable be difficulty very, therefore false proof zone is selected to the false proof barrier in first road of the present invention.
The false proof barrier in second road is that vector graphics splits and short line segment technological datum point selection algorithm barrier; The present invention splits into some short line segments with the anti-fake mark vector graphics afterwards at first with the anti-fake mark pattern vectorization, and the Z coordinate difference of two end points of every short line segment is all less than 5 times of the laser beam depth of focus value of laser galvanometer system to be used output.Because as far as laser index carving technology, the processing defocusing amount has direct influence to laser index carving technological effect (degree of depth, the width of delineation lines), if the laser beam out of focus of every short line segment apart from difference, the lines degree of depth, the width delineated are different.Because concerning every short line segment; The Z coordinate difference of its two end points specifically is several times (0～5.0 is optional) of laser beam depth of focus value; Therefore on short line segment, having only technological datum point place defocusing amount is 0; The defocusing amount of other positions on the short line segment (being 0～5.0 times of laser beam depth of focus value, by the space length and the decision of end points coordinate of short line segment) inequality is so each position of this short line segment is different by the lines degree of depth, the width of laser grooving and scribing; In other words, the position of technological datum point is selected directly to determine short line segment by the technological effect of laser index carving on the short line segment.And the anti-fake mark vector graphics splits and the specific algorithm of technological datum point selection; Selected by legal production firm; Also have only legal production firm to know; Personation manufacturer can't obtain the specific algorithm of the technological datum point selection of vector graphics fractionation and each short line segment accurately, thereby can't obtain and the on all four laser index carving technological effect of certified products.It is thus clear that vector graphics splits and short line segment technological datum point selection algorithm is a kind of extremely desirable implicit anti-counterfeiting information, and through behind the laser index carving on the anti-fake mark figure dominance represent, become the anti-counterfeiting characteristic that the consumer can differentiate.
The false proof barrier in the 3rd road is a laser index carving technological parameter barrier; The laser processing technology of any material, Any shape all has certain process parameter permissible range, promptly adopts the interior any technological parameter of this technological parameter permissible range all to satisfy processing quality and requires.Therefore; We can to the short line segment of some ad-hoc location in the anti-fake mark figure, select multiple specific laser technical parameters for use in the technological parameter permissible range; Both satisfied the processing quality requirement; Utilize the different laser technological parameter to create special technological effect rightly again, like the meticulous difference of delineation live width, the delineation degree of depth, this difference just becomes the true and false discriminating means that the consumer can discern.In other words; Laser technical parameters is an implicity, grasps in legal manufacturer hand, and the consumer has no way of learning; The counterfeiter also has no way of learning; But the consumer can manifest means through amplifying identification, measurement etc., and with live width, the line length of some ad-hoc location in the anti-fake mark figure, text description that provides with legal production firm or certified products picture compare discerns the false from the genuine.
In sum; The laser anti-counterfeit marking method of complex profile product of the present invention; Through at specific false proof zone design anti-fake mark figure; Split the anti-fake mark vector graphics and select the technological datum point according to specific fractionation algorithm, carry out short line segment scanning processing, finally realized the marking of anti-fake mark figure in the surface of complex profile product according to the special process parameter.Because the free form surface of complex profile product can't accurately reappear, and is characterized as the anti-fake mark figure that the basis processes with free form surface, can't reappear more; Anti-fake mark figure itself carries positional information, fractionation information and working process parameter information simultaneously.The fake producer wants the imitated anti-fake mark that adopts laser anti-counterfeit marking method of the present invention marking to come out; Except will possessing the laser process equipment that is applicable to complex-curved marking; Also must obtain the precise curved surface model of complex profile, the accurate outline position in anti-fake mark zone, the specific algorithm that the anti-fake mark vector graphics splits, the specific algorithm of technological datum point selection, the laser technical parameters of each short line segment etc.; Indispensable; Therefore the imitated technical difficulty of false making is very high, and therefore the antifalse effect of laser anti-counterfeit marking method of the present invention is fabulous.
The specific embodiment
Below in conjunction with the specific embodiment the present invention is done further detailed explanation.
Adopt the laser anti-counterfeit marking method of complex profile product of the present invention, at the complex-curved tap product surface marking anti-fake mark of stainless steel, detailed process is described below:
At first, select laser galvanometer system to be used; The present invention is a stainless steel according to the material of complex curved face product to be processed; Select the Q-switched pulse laser of wavelength 355nm, power output 10W for use; It is that 50mm*50mm, focal length are the laser galvanometer system of 60mm that correspondence is selected sweep limits for use, and it is 40 μ m that laser beam focuses on depth of focus;
Afterwards, carry out the marking of anti-fake mark according to concrete steps of the present invention;
(1) sets up the complex-curved threedimensional model of tap product surface; Set up complex-curved three-dimensional CAD model such as softwares such as can adopting UG, ProE, complex profile can be used fitting surface formal representations such as NURBS, Bezier.
(2) on complex-curved threedimensional model, select a zone as false proof zone arbitrarily, the false proof zone of the shape in false proof zone and size requirements can fall in the sweep limits of laser galvanometer system fully; In the handle position of stainless steel faucet with complex-curved moulding, the square area that to select a size be 20mm*20mm is as false proof zone in the present embodiment.
(3) in false proof zone, selecting any as initial point arbitrarily, is Z-direction with complex-curved normal direction at initial point, sets up complex-curved XYZ rectangular coordinate system by right hand principle;
(4) anti-fake mark figure of design in false proof zone carries out match with the anti-fake mark figure with straightway, obtains the anti-fake mark vector graphics.
Because false proof zone is positioned at the ad-hoc location of the complex-curved profile of product, and complex-curved non-rotating, irregular characteristic, obviously, the anti-fake mark figure only is to fit fully with the curve form of false proof location.Brand identity that this anti-fake mark figure can be a product or decorative pattern etc.The English alphabet " M " of selecting brand in the present embodiment can adopt graceful symbol vector fonts design as the anti-fake mark figure.
When the anti-fake mark figure is carried out match with straightway; If original anti-fake mark figure is a bitmap form, then need convert the bitmap raster data of original anti-fake mark figure to describe false proof figure with the vector data of straightway, circular arc or smooth curve match; Then the anti-fake mark figure is carried out straightway match vector quantization, the circular arc or the smooth curve that are about in the anti-fake mark figure all carry out match with straightway, obtain the anti-fake mark vector graphics.If original anti-fake mark figure is a polar plot, then only need circular arc in the anti-fake mark figure or smooth curve are carried out match with straightway, can obtain the anti-fake mark vector graphics.
(5) the anti-fake mark vector graphics is split into some short line segments, the Z coordinate difference of two end points of every short line segment is all less than 5 times of the laser beam depth of focus value of laser galvanometer system to be used output;
Method for splitting can be that any one of algorithm such as randomized, lines method of formation, grid method etc. cut apart/split to existing vector graphics, as long as configure the Changing Pattern of the Z coordinate difference of two end points of each short line segment after the fractionation;
In the present embodiment; Adopt the lines method of formation to split, with the symbol vector fonts " M " of anti-fake mark figure, according to the english writing order of strokes observed in calligraphy; Begin from the order of strokes observed in calligraphy starting point of " M "; The Z coordinate difference of setting two end points that split the back short line segment is 1 to 5 times (order according to 1,1.5,2,2.5,3,3.5,4,4.5,5, reciprocation cycle) of laser beam depth of focus value (40 μ m), tries to achieve each successively and splits short line segment.
(6) the relative installation position of adjusting laser galvanometer system and complex profile product to be processed; Make the normal direction of its scanning focused lens minute surface center parallel, make the false proof zone of complex profile product be positioned at the sweep limits of laser galvanometer system fully with Z-direction;
In the laser index carving process; Can lay attitude through the clamping of regulating complex profile product to be processed; Make Z-direction consistent, make the false proof zone of complex profile product be positioned at the sweep limits of laser galvanometer system fully with the direction of motion that the laser galvanometer system moves up and down; Specifically be to make the normal direction of the scanning focused lens minute surface center in the laser galvanometer parallel with Z-direction; Promptly can be through regulating the position of laser galvanometer system in Z-direction; Adjust the focus Z coordinate of the focussed laser beam of laser galvanometer system output; This is that the technology that realizes laser index carving guarantees, makes energy density can't realize good laser index carving effect inadequately because out of focus is crossed senior general.
(7) select a unprocessed short line segment, on this short line segment, select a bit arbitrarily, regulate scanning focused lens, make the technological datum point and the difference of the Z coordinate of scanning focused lens minute surface center equal the focal length of scanning focused lens as the technological datum point;
The selection algorithm of technological datum point can be any one of methods such as randomized, ordered series of numbers method; Adopt randomized to select in the present embodiment, at first generate a random number x between (0,1); I.e. 0≤x≤1; Any end points with short line segment is a starting point then, calculates the technological datum point of short line segment, and basis is that the ratio of length and the total length of this short line segment of the start point distance separating process datum mark of requirement short line segment equals x.
(8) according to the technological parameter of design in advance, the laser beam that laser instrument is launched is through light-conducting system and laser galvanometer system, is scanned up to the another one end points from an end points of short line segment, accomplishes the processing of this short line segment; Said technological parameter comprises laser output power, repetition rate, pulse width, sweep speed etc., and laser technical parameters should satisfy the requirement of marking processing quality, draw a clear at once clear, the edge is smooth attractive in appearance;
The principle of laser scanning manufacturing is: after laser beam gets into the laser galvanometer system; Reflection through two X, Y axle laser plane speculum; Get into scanning focused lens and focus on the short line segment; The collaborative deflection action of X, Y axle laser plane speculum can move the laser focal beam spot on short line segment, the track that the laser focal beam spot moves on short line segment is the marking figure.
Each short line segment can adopt different working process parameters among the present invention, and present embodiment is in order to simplify, and the scanning machined parameters of setting all short line segments is: laser power 6W, pulse frequency 50KHz, pulse width 35ns, sweep speed 1000mm/s.
(9) according to the step of (7)-(8), travel through all short line segments, machine until all short line segments;
(10) through differentiating the marking quality of anti-fake mark figure on the complex profile product, judge the true and false of product.
At first tentatively contrast; Through the definition of laser index carving vestige on the identification anti-fake mark figure, i.e. line edge quality and surface smoothness, the text description or the certified products picture that provide with legal production firm compare, and find inconsistently can think fakement;
Carry out depth correlation afterwards; Observe or the digital camera microspur is taken pictures and amplified identification and measure through magnifying glass; Live width and line length with the ad-hoc location in the anti-fake mark figure; The text description or the certified products picture that provide with legal production firm compare, and find inconsistently can think fakement.
Claims (2)
1. the laser anti-counterfeit marking method of a complex profile product is characterized in that, may further comprise the steps:
(1) sets up the surperficial complex-curved threedimensional model of complex profile product;
(2) optional position on complex-curved threedimensional model selects a zone as false proof zone, and the false proof zone of the shape in false proof zone and size requirements can fall in the sweep limits of laser galvanometer system to be used fully;
(3) in false proof zone, selecting any as initial point arbitrarily, is Z-direction with complex-curved normal direction at initial point, sets up complex-curved XYZ rectangular coordinate system;
(4) anti-fake mark figure of design in false proof zone carries out match with the anti-fake mark figure with straightway, obtains the anti-fake mark vector graphics;
(5) the anti-fake mark vector graphics is split into some short line segments, the Z coordinate difference of two end points of every short line segment is all less than 5 times of the laser beam depth of focus value of laser galvanometer system to be used output;
(6) the relative installation position of adjusting laser galvanometer system and complex profile product to be processed; Make the normal direction of its scanning focused lens minute surface center parallel, make the false proof zone of complex profile product be positioned at the sweep limits of laser galvanometer system fully with Z-direction;
(7) select a unprocessed short line segment, on this short line segment, select a bit arbitrarily, regulate scanning focused lens, make the technological datum point and the difference of the Z coordinate of scanning focused lens minute surface center equal the focal length of scanning focused lens as the technological datum point;
(8) according to the technological parameter of design in advance, the laser beam that laser instrument is launched is through light-conducting system and laser galvanometer system, is scanned up to the another one end points from an end points of short line segment, accomplishes the processing of this short line segment;
(9) according to the step of (7)-(8), travel through all short line segments, machine until all short line segments.
(10) through differentiating the marking quality of anti-fake mark figure on the complex profile product, judge the true and false of product.
2. the laser anti-counterfeit marking method of complex profile product according to claim 1 is characterized in that, judges described in the step (10) that the method for the true and false of product comprises following substep:
(10.1) preliminary contrast; Through the line edge quality and the surface smoothness of laser index carving vestige on the identification anti-fake mark figure, the text description or the certified products picture that provide with legal production firm compare, and find inconsistently can think fakement;
(10.2) depth correlation; Observe or the digital camera microspur is taken pictures and amplified identification and measure through magnifying glass; Live width and line length with the ad-hoc location in the anti-fake mark figure; The text description or the certified products picture that provide with legal production firm compare, and find inconsistently can think fakement.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210287552.6A CN102785029B (en) | 2012-08-05 | 2012-08-05 | Laser anti-counterfeit marking method for product with complex profile |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210287552.6A CN102785029B (en) | 2012-08-05 | 2012-08-05 | Laser anti-counterfeit marking method for product with complex profile |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102785029A true CN102785029A (en) | 2012-11-21 |
| CN102785029B CN102785029B (en) | 2014-08-06 |
Family
ID=47150723
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201210287552.6A Expired - Fee Related CN102785029B (en) | 2012-08-05 | 2012-08-05 | Laser anti-counterfeit marking method for product with complex profile |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102785029B (en) |
Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104143144A (en) * | 2013-05-07 | 2014-11-12 | 王铁 | Coordinate positioning type compressive anti-fake method based on information network |
| CN104475984A (en) * | 2014-11-21 | 2015-04-01 | 苏州米氪激光技术服务有限公司 | Preprocessing method and preprocessing device of three dimension (3D) mould laser engraving |
| CN105855722A (en) * | 2016-05-06 | 2016-08-17 | 微刻（北京）科技有限公司 | Laser polarization system-based processing method for target pattern on surface of curved-surface part |
| CN107205218A (en) * | 2017-07-19 | 2017-09-26 | 歌尔股份有限公司 | The matching method and system of bluetooth equipment |
| CN108031981A (en) * | 2017-12-18 | 2018-05-15 | 中国科学院西安光学精密机械研究所 | Laser etching method and device for forming curved surface structure |
| CN109794687A (en) * | 2017-11-15 | 2019-05-24 | Ati株式会社 | The laser patterning device and method thereof of three-dimensional object to be processed |
| CN110125551A (en) * | 2019-05-22 | 2019-08-16 | 武汉华工激光工程有限责任公司 | The 3D laser mark printing device and method of wall circular mark in a kind of big radian depth |
| CN110465742A (en) * | 2018-05-10 | 2019-11-19 | 大族激光科技产业集团股份有限公司 | The processing method and system of processing of vision security pattern |
| CN110769968A (en) * | 2017-06-20 | 2020-02-07 | 株式会社天田控股集团 | Laser processing machine |
| CN111805101A (en) * | 2019-04-11 | 2020-10-23 | 中国科学院上海光学精密机械研究所 | Method for preparing luminous anti-counterfeiting pattern in hydroxyl-containing glass |
| CN112091436A (en) * | 2020-08-27 | 2020-12-18 | 深圳市昆业激光设备科技有限公司 | Laser marking method |
| CN117260002A (en) * | 2023-11-20 | 2023-12-22 | 西安精谐科技有限责任公司 | Hemispherical resonant gyro electrode based on laser processing and processing method and system |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1171358A (en) * | 1996-07-22 | 1998-01-28 | 中国科学技术大学 | Anti-forger laser marking machine and its marking method |
| JP2000202655A (en) * | 1999-01-08 | 2000-07-25 | Toray Eng Co Ltd | Laser marking device |
| CN2582900Y (en) * | 2002-09-29 | 2003-10-29 | 武汉楚天激光（集团）股份有限公司 | 2D scanning structure of laser carving machine |
| US20070100492A1 (en) * | 2005-10-21 | 2007-05-03 | Mamoru Idaka | Three dimensional processing data setting system, method for setting three-dimensional processing data, computer program for setting three-dimensional processing data, medium with three-dimensional processing data stored therein that is readable by computer and laser processing equipment operated by the three-dimensional data |
| US20080023455A1 (en) * | 2006-07-27 | 2008-01-31 | Keyence Corporation | Method Of and System For Setting Laser Processing Conditions, Laser Processing System, Computer Program For Setting Laser Processing Conditions, Computer Readable Medium and Recording Device On Which Laser Processing Conditions Are Recorded |
| CN101200022A (en) * | 2007-11-16 | 2008-06-18 | 江苏大学 | Method and device based on micro-nano laser-induced shock wave three dimensional lossless makr |
| JP4187472B2 (en) * | 2002-07-15 | 2008-11-26 | 株式会社キーエンス | Optical information reader and operating method thereof |
| JP4281292B2 (en) * | 2002-04-23 | 2009-06-17 | パナソニック電工株式会社 | Three-dimensional laser machining data creation method, data creation program, medium recording the data creation program, and machining method and apparatus |
| CN101488215A (en) * | 2009-01-04 | 2009-07-22 | 清华大学 | Arc-shaped anti-fake method and arc-shaped anti-fake element |
-
2012
- 2012-08-05 CN CN201210287552.6A patent/CN102785029B/en not_active Expired - Fee Related
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1171358A (en) * | 1996-07-22 | 1998-01-28 | 中国科学技术大学 | Anti-forger laser marking machine and its marking method |
| JP2000202655A (en) * | 1999-01-08 | 2000-07-25 | Toray Eng Co Ltd | Laser marking device |
| JP4281292B2 (en) * | 2002-04-23 | 2009-06-17 | パナソニック電工株式会社 | Three-dimensional laser machining data creation method, data creation program, medium recording the data creation program, and machining method and apparatus |
| JP4187472B2 (en) * | 2002-07-15 | 2008-11-26 | 株式会社キーエンス | Optical information reader and operating method thereof |
| CN2582900Y (en) * | 2002-09-29 | 2003-10-29 | 武汉楚天激光（集团）股份有限公司 | 2D scanning structure of laser carving machine |
| US20070100492A1 (en) * | 2005-10-21 | 2007-05-03 | Mamoru Idaka | Three dimensional processing data setting system, method for setting three-dimensional processing data, computer program for setting three-dimensional processing data, medium with three-dimensional processing data stored therein that is readable by computer and laser processing equipment operated by the three-dimensional data |
| US20080023455A1 (en) * | 2006-07-27 | 2008-01-31 | Keyence Corporation | Method Of and System For Setting Laser Processing Conditions, Laser Processing System, Computer Program For Setting Laser Processing Conditions, Computer Readable Medium and Recording Device On Which Laser Processing Conditions Are Recorded |
| CN101200022A (en) * | 2007-11-16 | 2008-06-18 | 江苏大学 | Method and device based on micro-nano laser-induced shock wave three dimensional lossless makr |
| CN101488215A (en) * | 2009-01-04 | 2009-07-22 | 清华大学 | Arc-shaped anti-fake method and arc-shaped anti-fake element |
Non-Patent Citations (2)
| Title |
|---|
| 王耀松: "证件信息的激光雕刻及其防伪性能", 《警察技术》, no. 04, 15 October 2000 (2000-10-15), pages 32 - 33 * |
| 臧冬娟等: "雕刻防伪技术", 《包装工程》, no. 01, 15 February 2007 (2007-02-15), pages 53 - 55 * |
Cited By (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104143144A (en) * | 2013-05-07 | 2014-11-12 | 王铁 | Coordinate positioning type compressive anti-fake method based on information network |
| CN104475984A (en) * | 2014-11-21 | 2015-04-01 | 苏州米氪激光技术服务有限公司 | Preprocessing method and preprocessing device of three dimension (3D) mould laser engraving |
| CN104475984B (en) * | 2014-11-21 | 2016-02-24 | 苏州米氪激光技术服务有限公司 | A kind of preprocess method of 3D mould laser engraving and pretreatment unit |
| CN105855722A (en) * | 2016-05-06 | 2016-08-17 | 微刻（北京）科技有限公司 | Laser polarization system-based processing method for target pattern on surface of curved-surface part |
| CN110769968A (en) * | 2017-06-20 | 2020-02-07 | 株式会社天田控股集团 | Laser processing machine |
| CN107205218A (en) * | 2017-07-19 | 2017-09-26 | 歌尔股份有限公司 | The matching method and system of bluetooth equipment |
| CN107205218B (en) * | 2017-07-19 | 2020-03-20 | 歌尔股份有限公司 | Pairing method and system of Bluetooth equipment |
| CN109794687A (en) * | 2017-11-15 | 2019-05-24 | Ati株式会社 | The laser patterning device and method thereof of three-dimensional object to be processed |
| CN108031981A (en) * | 2017-12-18 | 2018-05-15 | 中国科学院西安光学精密机械研究所 | Laser etching method and device for forming curved surface structure |
| CN110465742A (en) * | 2018-05-10 | 2019-11-19 | 大族激光科技产业集团股份有限公司 | The processing method and system of processing of vision security pattern |
| CN111805101A (en) * | 2019-04-11 | 2020-10-23 | 中国科学院上海光学精密机械研究所 | Method for preparing luminous anti-counterfeiting pattern in hydroxyl-containing glass |
| CN110125551A (en) * | 2019-05-22 | 2019-08-16 | 武汉华工激光工程有限责任公司 | The 3D laser mark printing device and method of wall circular mark in a kind of big radian depth |
| CN112091436A (en) * | 2020-08-27 | 2020-12-18 | 深圳市昆业激光设备科技有限公司 | Laser marking method |
| CN117260002A (en) * | 2023-11-20 | 2023-12-22 | 西安精谐科技有限责任公司 | Hemispherical resonant gyro electrode based on laser processing and processing method and system |
| CN117260002B (en) * | 2023-11-20 | 2024-02-09 | 西安精谐科技有限责任公司 | Hemispherical resonant gyro electrode based on laser processing and processing method and system |
Also Published As
| Publication number | Publication date |
|---|---|
| CN102785029B (en) | 2014-08-06 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN102785029B (en) | Laser anti-counterfeit marking method for product with complex profile | |
| CN102151984B (en) | Laser machining method and device applicable for complicated curved surface | |
| KR101374520B1 (en) | Hidden Image Identification System, Products, Identification Device and Producing Method | |
| TWI660863B (en) | Laser ablation method with patch optimization | |
| CN100578289C (en) | Diffraction color changing laser marking method and apparatus thereof | |
| CN101496533B (en) | Method for burning and carving body surface of livestock and poultry with laser beam | |
| CN109671146B (en) | 3D pattern laser carving spraying process | |
| Huang et al. | Ultra-precision machining of grayscale pixelated micro images on metal surface | |
| US6630644B2 (en) | Method creating damage arrangement for production of 3D laser-induced damage portraits inside transparent materials | |
| CN107225331A (en) | The method that mobile phone aluminum alloy casing 3D decorative patterns are carved using laser stack mode | |
| CN102183878B (en) | Microstructural stereoscopic anaglyph image-text platemaking method | |
| EP3098000B1 (en) | Additive manufacturing method of a component and a related identication pattern, a kit of parts comprising a component having an obfuscation pattern | |
| CN105710369B (en) | Device for successively manufacturing three-dimension object | |
| CN106132723A (en) | There is the Security element of lenticular image | |
| CN114178686A (en) | Femtosecond laser processed double titanium dioxide nanometer grating anti-counterfeiting structure and application thereof | |
| CN101907825A (en) | Photoetching encrypted anti-counterfeiting method | |
| EP4177057A1 (en) | Method for engraving code patterns in a solid piece's tool surface | |
| CN109703227A (en) | It is a kind of to emboss production dark line, latent image and unwind the method for anti-counterfeit that lock integrally combines | |
| CN110355476A (en) | A kind of three-dimensional marking device and method based on two-dimensional laser marking machine | |
| CN203973056U (en) | Laser instrument single argument making color marker system | |
| KR20110067563A (en) | 3d design patterning method using by 3d scanner and 3-axis laser marking head | |
| CN202317449U (en) | Device for treating pearl surfaces by using laser | |
| Furlan et al. | A new approach to Direct Laser Interference Patterning with scanner optics for high productivity | |
| CN114571087A (en) | Laser engraving method capable of editing curved surface 3D texture | |
| CN103240528B (en) | A kind of anti-fake mark producing device and preparation method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C53 | Correction of patent of invention or patent application | ||
| CB02 | Change of applicant information |
Address after: 325000 Zhejiang, Ouhai, South East Road, No. 38, Wenzhou National University Science Park Incubator Applicant after: Wenzhou University Address before: 325035 Zhejiang province Chashan Wenzhou Higher Education Park of Wenzhou University Applicant before: Wenzhou University |
|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20140806 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |